Probe device for high-frequency test of chip

Abstract

The utility model relates to the technical field of semiconductor testing, and discloses a probe device for high-frequency testing of a chip, which comprises a protective shell, an inclined limiting groove is arranged on one side in the protective shell, a first spring is fixedly arranged at the bottom end in the protective shell, and a probe body is sleeved in the middle of the first spring. And a probe head is fixedly arranged in the middle of the bottom end of the probe main body. According to the utility model, the internal probe main body and the probe head can be protected through the protective shell, the probe head can be exposed by directly pushing the control panel towards the front end during use, the clamping block is clamped into the bottom of the inclined limiting groove to realize fixation, and the limiting of the limiting disc can be canceled by pressing the clamping block after use; and the first spring enables the bottom probe head to automatically retract into the protection shell, so that the protection effect is improved, use can be facilitated, the probe can be retracted after use, and a better protection effect is achieved.

Description

Technical Field

[0001] The utility model relates to the technical field of semiconductor testing, in particular to a probe device for high-frequency testing of chips. Background Art

[0002] During the manufacturing process of integrated circuits, chips need to undergo various tests to ensure their performance and quality. The probes for high-frequency chip testing usually transmit high-frequency signals by contacting test points and obtain feedback signals from the chip to evaluate the performance of the chip under high-frequency conditions. These probes are usually made of fine and high-quality materials with good signal transmission performance and stability to ensure the accuracy and reliability of the test.

[0003] Traditional probes are of direct contact type, and the probes are directly held by the staff for detection, which can easily cause damage to the expensive probes and may cause the probes to fall and break. It is not convenient to immediately retract and protect them after use.

[0004] Therefore, those skilled in the art provide a probe device for high-frequency testing of chips to solve the problems raised in the above background technology. Utility Model Content

[0005] The purpose of the utility model is to solve the shortcomings existing in the prior art, and a probe device for high-frequency testing of chips is proposed. The device can protect the internal probe body and the probe head through a protective shell. When in use, the probe head can be leaked out by directly pushing the control disk to the front end, and the card block can be fixed by snapping into the bottom of the oblique limit groove. After use, the card block can be pressed to cancel the limit of the limit disk, and the first spring can automatically retract the bottom probe head into the protective shell, thereby improving the protection effect while also being convenient for use. After use, the probe can be retracted to play a better protective role.

[0006] In order to achieve the above purpose, the utility model provides the following technical solutions:

[0007] A probe device for high-frequency testing of chips, comprising a protective shell, an oblique limiting groove is provided on one side of the interior of the protective shell, a first spring is fixedly arranged at the bottom end of the interior of the protective shell, a probe body is sleeved on the middle of the first spring, a probe head is fixedly arranged in the middle of the bottom end of the probe body, a limiting disk is fixedly arranged on the top of the probe body, a control rod is fixedly arranged in the middle of the top of the limiting disk, a sliding groove is provided inside the limiting disk, a second spring is fixedly arranged on one side of the interior of the sliding groove, a clamping block is slidably arranged inside the sliding groove, and one side of the clamping block is fixedly connected to the second spring.

[0008] Through the above technical solution, when the device is in use, the control rod is pushed forward, and the card block is inserted into the bottom of the oblique limit groove and penetrates the protective shell to achieve fixation. After use, the card block can be pressed to cancel the limit on the limit plate, and the probe head is automatically retracted into the protective shell. After use, it can be retracted in time to protect it without affecting its use.

[0009] Furthermore, side panels are fixedly provided at the tops of both the front and rear ends of the protective shell, and finger fixing holes are opened in the middle of the two side panels;

[0010] Through the above technical solution, finger fixing holes are opened on the side panel. When controlling the probe, the index finger and the middle finger are passed through the two finger fixing holes, which can improve the stability of holding. Even if the palm is opened, it will not fall easily, and it can be easily operated with one hand.

[0011] Furthermore, four reinforcing ribs are evenly and fixedly arranged on the outer wall of the control rod, and a control plate is fixedly arranged on the top of the control rod;

[0012] Through the above technical solution, reinforcing ribs are arranged on the outside of the control rod, which can improve the strength of the control rod and prevent the control rod from bending.

[0013] Furthermore, a guide plate is fixedly arranged on the top of the protective shell, and the guide plate is sleeved with the control rod and four reinforcing ribs;

[0014] Through the above technical solution, the guide plate can limit the control rod and the reinforcing ribs, allowing them to slide up and down in the middle of the guide plate, thereby improving stability.

[0015] Furthermore, a sliding plate is fixedly arranged in the middle of the control rod, and the sliding plate is fixedly connected to four reinforcing ribs;

[0016] Through the above technical solution, the sliding plate plays a role of limiting sliding, further improving the stability during sliding.

[0017] Furthermore, the inner wall of the protective shell is consistent with the outer wall of the sliding plate and the limiting plate;

[0018] Through the above technical solution, the sliding plate and the limiting plate can slide inside the protective shell and fit together, which can improve the stability during sliding.

[0019] The utility model has the following beneficial effects:

[0020] 1. The utility model proposes a probe device for high-frequency testing of chips. The device can protect the internal probe body and the probe head through a protective shell. When in use, the probe head can be ejected by directly pushing the control panel to the front end. The card block can be fixed by inserting it into the bottom of the oblique limit groove. After use, the card block can be pressed to cancel the limit of the limit plate. The first spring automatically retracts the bottom probe head into the protective shell, thereby improving the protection effect while facilitating use. After use, the probe can be retracted to play a better protective role.

[0021] 2. The utility model proposes a probe device for high-frequency chip testing. Side panels are arranged on both sides of the probe. Finger fixing holes are provided on the two side panels. When in use, the staff can pass the index finger and the middle finger through the finger fixing holes for control, so that it is convenient to perform one-handed holding operation, making the holding more stable, and the probe will not fall easily when the palm is opened, thereby improving the anti-slip ability. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 This is a main cross-sectional view of a probe device for high-frequency testing of chips proposed by the utility model;

[0023] Figure 2 This is a left side isometric view of a probe device for high frequency testing of chips proposed by the utility model;

[0024] Figure 3 This is a bottom isometric view of a probe device for high-frequency testing of chips proposed by the utility model;

[0025] Figure 4 This is a diagram showing the internal structure of a limit plate of a probe device for high-frequency chip testing proposed by the utility model.

[0026] Legend:

[0027] 1. Protective shell; 2. Control lever; 3. Guide plate; 4. Slide plate; 5. Control plate; 6. Reinforcement ribs; 7. Side plate; 8. Finger fixing hole; 9. Oblique limit groove; 10. Limit plate; 11. Block; 12. First spring; 13. Probe body; 14. Probe head; 15. Slide groove; 16. Second spring. DETAILED DESCRIPTION

[0028] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model. In the description of this application, it should be noted that the terms used here are only for describing specific implementations, and are not intended to limit the exemplary implementations according to the present application. For ease of description, the sizes of the various parts shown in the drawings are not drawn according to the actual proportional relationship. The techniques, methods and equipment known to ordinary technicians in the relevant fields may not be discussed in detail, but where appropriate, the techniques, methods and equipment should be regarded as part of the authorization specification. In all examples shown and discussed here, any specific value should be interpreted as merely exemplary, not as a limitation. Therefore, other examples of the exemplary embodiments may have different values. It should be noted that similar reference numerals and letters represent similar items in the following drawings, so once an item is defined in one drawing, it does not need to be further discussed in subsequent drawings.

[0029] Reference Figure 1-4 , an embodiment provided by the utility model:

[0030] A probe device for high-frequency testing of chips comprises a protective shell 1, an oblique limiting groove 9 is provided on one side of the protective shell 1, a first spring 12 is fixedly provided at the bottom end of the protective shell 1, a probe body 13 is sleeved in the middle of the first spring 12, a probe head 14 is fixedly provided at the middle of the bottom end of the probe body 13, a limiting disk 10 is fixedly provided on the top of the probe body 13, a control rod 2 is fixedly provided at the middle of the top end of the limiting disk 10, a slide groove 15 is provided inside the limiting disk 10, a second spring 16 is fixedly provided on one side of the slide groove 15, a card block 11 is slidably provided inside the slide groove 15, and one side of the card block 11 is fixedly connected to the second spring 16. When the device is in use, the control rod 2 is pushed forward, and the card block 11 is inserted into the bottom of the oblique limiting groove 9 and penetrates the protective shell 1 to achieve fixation. After use, the card block 11 can be pressed to cancel the limit of the limiting disk 10, and the probe head 14 is automatically retracted into the protective shell 1. After use, it can be retracted in time to protect it without affecting use.

[0031] The protective shell 1 is fixedly provided with side panels 7 at the top of both front and rear ends, and finger fixing holes 8 are provided in the middle of the two side panels 7. The finger fixing holes 8 are provided on the side panels 7. When controlling the probe, the index finger and the middle finger are passed through the two finger fixing holes 8, which can improve the stability of holding. Even if the palm is opened, it will not fall easily, and it is convenient for one-handed operation. Four reinforcing ribs 6 are evenly fixed on the outer wall of the control rod 2, and a control plate 5 is fixed on the top of the control rod 2. The reinforcing ribs 6 are provided on the outside of the control rod 2, which can improve the strength of the control rod 2 and prevent the control rod 2 from bending. The protective shell A guide plate 3 is fixedly arranged at the top of the control rod 1, and the guide plate 3 is sleeved with the control rod 2 and the four reinforcing ribs 6. The guide plate 3 can limit the control rod 2 and the reinforcing ribs 6, so that they can slide up and down in the middle of the guide plate 3 to improve stability. A sliding plate 4 is fixedly arranged in the middle of the control rod 2, and the sliding plate 4 is fixedly connected with the four reinforcing ribs 6. The sliding plate 4 plays a role of limiting sliding, further improving the stability during sliding. The inner wall of the protective shell 1 is consistent with the outer wall of the sliding plate 4 and the limiting plate 10. The sliding plate 4 and the limiting plate 10 can slide inside the protective shell 1 and are consistent with each other, which can improve the stability during sliding.

[0032] Working principle: When the device is in use, the control rod 2 is pushed forward, and the card block 11 is inserted into the bottom of the oblique limit groove 9 and penetrates the protective shell 1 to achieve fixation. After use, the card block 11 can be pressed to cancel the limit on the limit plate 10, and the probe head 14 is automatically retracted into the protective shell 1. After use, it can be retracted in time to protect it, and it is easy to use. Finger fixing holes 8 are provided on the side panel 7. When controlling the probe, the index finger and the middle finger are passed through the two finger fixing holes 8, which can improve the stability of holding. Even if the palm is opened, it will not fall easily, and it can be easily operated with one hand.

[0033] Finally, it should be noted that the above is only a preferred embodiment of the present invention and is not intended to limit the present invention. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art can still modify the technical solutions described in the aforementioned embodiments or make equivalent substitutions for some of the technical features therein. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A probe device for high-frequency testing of a chip, comprising a protective shell (1), characterized in that: An oblique limiting groove (9) is provided on one side of the interior of the protective shell (1); a first spring (12) is fixedly arranged at the bottom end of the interior of the protective shell (1); a probe body (13) is sleeved in the middle of the first spring (12); a probe head (14) is fixedly arranged in the middle of the bottom end of the probe body (13); a limiting plate (10) is fixedly arranged on the top of the probe body (13); a control rod (2) is fixedly arranged in the middle of the top end of the limiting plate (10); a sliding groove (15) is provided inside the limiting plate (10); a second spring (16) is fixedly arranged on one side of the interior of the sliding groove (15); a clamping block (11) is slidably arranged inside the sliding groove (15); one side of the clamping block (11) is fixedly connected to the second spring (16).

2. A probe device for high-frequency testing of a chip according to claim 1, characterized in that: Side panels (7) are fixedly provided at the tops of both the front and rear ends of the protective shell (1), and finger fixing holes (8) are provided in the middle of the two side panels (7).

3. A probe device for high-frequency testing of a chip according to claim 1, characterized in that: Four reinforcing ribs (6) are evenly and fixedly arranged on the outer wall of the control rod (2), and a control plate (5) is fixedly arranged on the top of the control rod (2).

4. A probe device for high-frequency testing of a chip according to claim 1, characterized in that: A guide plate (3) is fixedly arranged at the top of the protective shell (1), and the guide plate (3) is sleeved with the control rod (2) and four reinforcing ribs (6).

5. The probe device for high-frequency testing of a chip according to claim 1, characterized in that: A sliding plate (4) is fixedly arranged in the middle of the control rod (2), and the sliding plate (4) is fixedly connected to four reinforcing ribs (6).

6. A probe device for high-frequency testing of a chip according to claim 1, characterized in that: The inner wall of the protective shell (1) is consistent with the outer walls of the sliding plate (4) and the limiting plate (10).

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