Adaptive device for testing digital temperature sensor
By designing an adapter for digital temperature sensors, parallel testing of multiple sensors is realized, solving the problem of time-consuming traditional tests one by one, and significantly improving the testing efficiency.
Patent Information
- Application Number
- CN202421834634.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-07-31
- Publication Date
- 2025-05-23
- Estimated Expiration
- 2034-07-31
AI Technical Summary
When conducting digital temperature sensor function tests, the prior art needs to be tested separately one by one, which takes a long time and is difficult to meet the production task progress requirements of large-scale testing.
An adapter device is designed, including a base plate, standard resistor, socket and tester, which can conduct parallel testing of multiple digital temperature sensors, send power signals and input signals in parallel, and sample the outputs in parallel.
Simultaneous functional testing of more than 24 digital temperature sensors has been achieved, and the time consumption has been reduced to less than 10% of the traditional method, significantly improving work efficiency.
Smart Images
Figure CN222895818U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to sensor testing, in particular to an adaptor for testing a digital temperature sensor. Background Art
[0002] As an important electronic component for real-time monitoring of ambient temperature, digital temperature sensors are increasingly being used in production practice. Digital temperature sensors must pass tests before they are put into use. Their functional tests require testing at least three temperature points in a stable temperature field, and the temperature field needs at least 1 hour to stabilize, so the functional test of digital temperature sensors takes a long time. The existing testing method usually places a single digital temperature sensor in the ambient temperature, waits for the ambient temperature to stabilize after 1 hour, and then tests the current temperature point; after the test is completed, adjust the ambient temperature to the next temperature point to be tested, and wait for the ambient temperature to stabilize before testing again; this cycle repeats, and it takes at least 3 hours for the digital temperature sensor to complete a functional test. When conducting large-scale testing, if the method of testing each one is still used, it will be very time-consuming and it will be difficult to meet the production task progress requirements. Therefore, it is very necessary to design an adapter device for digital temperature sensor testing that has a simple structure, low cost, easy to make, easy to use, and can effectively improve work efficiency. Utility Model Content
[0003] The utility model aims to provide an adapter device for testing a digital temperature sensor which has a simple structure, low cost, is easy to manufacture, convenient to use and can effectively improve work efficiency.
[0004] To achieve the above-mentioned purpose, the utility model adopts the following technical scheme: an adapter device for testing a digital temperature sensor, comprising a base plate, a first standard resistor, a second standard resistor, a third standard resistor and a tester, characterized in that it also comprises a first socket, a second socket and two or more device holders under test, the base plate is a printed circuit board, the first standard resistor, the second standard resistor, the third standard resistor, the first socket, the second socket and the device holder under test are arranged on the base plate, the first socket comprises a ground terminal and a power terminal, the second socket comprises an input terminal, an output terminal and an input / output terminal, the GND terminal of the device holder under test is connected to the ground terminal of the first socket The VDD terminal of the device under test socket is short-circuited with the A0, A1 and A2 terminals and then connected to the power terminal of the first socket. The SCL terminal, TOUT terminal and SDA terminal of the device under test socket are respectively connected to the input terminal, output terminal and input / output terminal of the second socket. The tester includes a first plug, a second plug and a data acquisition module. The first plug includes a system ground terminal and a system power supply. The second plug includes a system input terminal, a system output terminal and a system output / input terminal. The first plug and the second plug are respectively connected to the first socket and the second socket. The first standard resistor, the second standard resistor and the third standard resistor are connected to the data acquisition module.
[0005] Furthermore, the number of the device under test sockets is more than 24.
[0006] Furthermore, the bottom plate is a single-sided PCB board.
[0007] Furthermore, the first standard resistor, the second standard resistor and the third standard resistor are all high-precision standard platinum resistors.
[0008] Furthermore, the number of the device under test seats is 48 and they are arranged in a matrix.
[0009] The working process of the utility model is as follows:
[0010] The digital temperature sensors to be tested are connected to each device socket under test respectively, and then the base plate is placed in the temperature field. After the temperature field is stable, the tester sends power signals and input signals to each device socket under test in parallel, and samples the output end of each device socket under test in parallel, thereby realizing parallel testing of batches of digital temperature sensors under test.
[0011] By adopting the utility model, more than 24 digital temperature sensors can be functionally tested simultaneously, and the time consumption is reduced to less than 10% of the traditional method, the work efficiency is significantly improved, and the problem of functional testing of batch digital temperature sensors is fundamentally solved.
[0012] The utility model has the advantages of simple structure, low cost, easy manufacture and convenient use. BRIEF DESCRIPTION OF THE DRAWINGS
[0013] Figure 1 It is a structural schematic diagram of the utility model;
[0014] Figure 2 It is a schematic diagram of the bottom plate structure of the utility model;
[0015] Figure 3 It is a structural schematic diagram of a device under test seat of the utility model.
[0016] In the figure: 1-base plate; 2.1-first standard resistor; 2.2-second standard resistor; 2.3-third standard resistor; 3-tester; 3.1-first plug; 3.1.1-system ground; 3.1.2-system power; 3.2-second plug; 3.2.1-system input; 3.2.2-system output; 3.2.3-system output / input; 3.3-data acquisition module; 4-first socket; 4.1-ground; 4.2-power; 5-second socket; 5.1-input; 5.2-output; 5.3-input / output; 6-device holder. DETAILED DESCRIPTION
[0017] The present invention will be further described below in conjunction with the accompanying drawings and embodiments, but the embodiments should not be construed as limiting the present invention.
[0018] As shown in the figure, an adapter device for testing a digital temperature sensor includes a base plate 1, a first standard resistor 2.1, a second standard resistor 2.2, a third standard resistor 2.3 and a tester 3, and also includes a first socket 4, a second socket 5 and more than two device holders 6. The base plate 1 is a printed circuit board. The first standard resistor 2.1, the second standard resistor 2.2, the third standard resistor 2.3, the first socket 4, the second socket 5 and the device holder 6 are arranged on the base plate 1. The first socket 4 includes a ground terminal 4.1 and a power terminal 4.2. The second socket 5 includes an input terminal 5.1, an output terminal 5.2 and an input / output terminal 5.3. The GND terminal of the device holder 6 is connected to the ground terminal 4.1 of the first socket 4. The VDD terminal of the device holder 6 is connected to A0, A1 and A2. After the terminals are short-circuited, they are connected to the power terminal 4.2 of the first socket 4. The SCL terminal, TOUT terminal and SDA terminal of the device under test socket 6 are respectively connected to the input terminal 5.1, the output terminal 5.2 and the input / output terminal 5.3 of the second socket. The tester 3 includes a first plug 3.1, a second plug 3.2 and a data acquisition module 3.3. The first plug 3.1 includes a system ground terminal 3.1.1 and a system power supply 3.1.2. The second plug 3.2 includes a system input terminal 3.2.1, a system output terminal 3.2.2 and a system output / input terminal 3.2.3. The first plug 3.1 and the second plug 3.2 are respectively connected to the first socket 4 and the second socket 5. The first standard resistor 2.1, the second standard resistor 2.2 and the third standard resistor 2.3 are connected to the data acquisition module 3.3.
[0019] A preferred embodiment is: in the above solution, the number of the device under test seats 6 is more than 24.
[0020] A preferred embodiment is: in the above solution, the bottom plate 1 is a single-sided PCB board.
[0021] A preferred embodiment is: in the above solution, the first standard resistor 2.1, the second standard resistor 2.2 and the third standard resistor 2.3 are all high-precision standard platinum resistors.
[0022] A preferred embodiment is: in the above scheme, the number of the device under test seats 6 is 48 and they are arranged in a matrix.
[0023] The contents not described in detail in this specification belong to the prior art known to those skilled in the art.
Claims
1. An adapter device for testing a digital temperature sensor, comprising a base plate (1), a first standard resistor (2.1), a second standard resistor (2.2), a third standard resistor (2.3) and a tester (3), characterized in that: The device also comprises a first socket (4), a second socket (5) and two or more device holders (6) under test. The bottom plate (1) is a printed circuit board. The first standard resistor (2.1), the second standard resistor (2.2), the third standard resistor (2.3), the first socket (4), the second socket (5) and the device holder (6) under test are arranged on the bottom plate (1). The first socket (4) comprises a ground terminal (4.1) and a power terminal (4.2). The second socket (5) comprises an input terminal (5.1), an output terminal (5.2) and an input / output terminal (5.3). The GND terminal of the device holder (6) under test is connected to the ground terminal (4.1) of the first socket (4). The VDD terminal of the device holder (6) under test is short-circuited with the A0, A1 and A2 terminals and then connected to the power terminal (4.2) of the first socket (4). The SCL terminal of the device holder (6) under test is connected to the ground terminal (4.1) of the first socket (4). The TOUT terminal, the TOUT terminal and the SDA terminal are respectively connected to the input terminal (5.1), the output terminal (5.2) and the input / output terminal (5.3) of the second socket; the tester (3) comprises a first plug (3.1), a second plug (3.2) and a data acquisition module (3.3); the first plug (3.1) comprises a system ground terminal (3.1.1) and a system power supply (3.1.2); the second plug (3.2) comprises a system input terminal (3.2.1), a system output terminal (3.2.2) and a system output / input terminal (3.2.3); the first plug (3.1) and the second plug (3.2) are respectively connected to the first socket (4) and the second socket (5); the first standard resistor (2.1), the second standard resistor (2.2) and the third standard resistor (2.3) are connected to the data acquisition module (3.3).
2. The adapter device for testing a digital temperature sensor according to claim 1, characterized in that: The number of the device-under-test seats (6) is more than 24.
3. The adapter device for digital temperature sensor testing according to claim 1 or 2, characterized in that: The bottom plate (1) is a single-sided PCB board.
4. The adapter device for testing a digital temperature sensor according to claim 1 or 2, characterized in that: The first standard resistor (2.1), the second standard resistor (2.2) and the third standard resistor (2.3) are all high-precision standard platinum resistors.
5. The adapter device for testing a digital temperature sensor according to claim 3, characterized in that: The first standard resistor (2.1), the second standard resistor (2.2) and the third standard resistor (2.3) are all high-precision standard platinum resistors.
6. The adapter device for digital temperature sensor testing according to claim 1 or 2, characterized in that: The number of the device-under-test seats (6) is 48 and they are arranged in a matrix.
7. The adapter device for testing a digital temperature sensor according to claim 3, characterized in that: The number of the device-under-test seats (6) is 48 and they are arranged in a matrix.
8. The adapter device for digital temperature sensor testing according to claim 4, characterized in that: The number of the device-under-test seats (6) is 48 and they are arranged in a matrix.
9. The adapter device for digital temperature sensor testing according to claim 5, characterized in that: The number of the device-under-test seats (6) is 48 and they are arranged in a matrix.