LSPR (Local Surface Plasmon Resonance) imaging measurement assembly and LSPR imaging measurement device

Abstract

The utility model provides an LSPR imaging measurement assembly and an LSPR imaging measurement device.The LSPR imaging measurement assembly comprises an incident light module, a polarized light cube optical splitter, a polarization assembly and an imaging measurement assembly, a halogen tungsten lamp light source is used for outputting white light, the white light passes through a first diaphragm and is restrained by the first diaphragm, and beam light output by the first diaphragm passes through a band-pass optical filter and is restrained by the first diaphragm; a light beam with a specific wavelength is formed; the light beam with the specific wavelength passes through the aspherical lens to form a collimated light beam; the transmission grating receives the light reflected by the chip and generates light with different wavelengths, and the light with different wavelengths is separated at different diffraction angles and is focused on the third plano-convex cylindrical lens to form a focused light beam; the CMOS sensor receives the focused light beam at the focus position to generate an image signal, so that real-time and rapid imaging measurement of the LSPR signal is realized, and the measurement effect of the LSPR imaging measurement device is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of LSPR imaging measurement devices, and in particular, to an LSPR imaging measurement component and an LSPR imaging measurement device. Background Art

[0002] With the development of display screen technology, the measurement and analysis of the brightness, chromaticity, and uniformity of display screens have become increasingly important. LSPR imaging measurement devices can quickly analyze the brightness and chromaticity uniformity of the entire display screen, and can be integrated into production lines for rapid measurement, which has more advantages and gradually becomes the mainstream choice.

[0003] In the prior art, the existing LSPR imaging measurement device includes a tungsten halogen light source, a first aperture, an aspherical lens, a polarization component, and a CMOS sensor; the tungsten halogen light source, the first aperture, the aspherical lens, a transmission grating, a plano-convex cylindrical lens, and the CMOS sensor are arranged in sequence from left to right. The tungsten halogen light source is used to output white light, which passes through the first aperture and is restricted by the first aperture. The light beam output from the first aperture forms a collimated beam after passing through the aspherical lens. The polarization component includes a rotating table and a linear polarizer; the linear polarizer changes its angle as the rotating table rotates. The linear polarizer receives the collimated beam output from the aspherical lens and conducts it to the chip. The CMOS sensor collects the light reflected by the chip and generates an image signal. It is impossible to measure different incident lights, resulting in poor measurement effects of the existing LSPR imaging measurement device. Summary of the Invention

[0004] The object of the present invention is to provide an LSPR imaging measurement component and an LSPR imaging measurement device. The incident light module includes a tungsten halogen light source, a first aperture, a band-pass filter, and an aspherical lens. The tungsten halogen light source is used to output white light, which passes through the first aperture and is constrained by the first aperture. The light beam output from the first aperture passes through the band-pass filter and forms a light beam with a specific wavelength. The light beam with the specific wavelength passes through the aspherical lens and forms a collimated light beam. The polarization cube beam splitter receives the collimated light beam output from the aspherical lens and generates P-polarized light and S-polarized light. The polarization component includes a rotating stage and a linear polarizer. The linear polarizer changes its angle as the rotating stage rotates. The linear polarizer receives the P-polarized light and conducts it to the chip. The imaging measurement component is arranged on one side of the polarization component and includes a transmission grating, a third plano-convex cylindrical lens, and a CMOS sensor. The transmission grating receives the light reflected by the chip and generates lights with different wavelengths. The lights with different wavelengths will be separated at different diffraction angles and focused by the third plano-convex cylindrical lens to form a focused light beam. The CMOS sensor receives the focused light beam at the focal position, generates an image signal, and realizes the measurement of different incident lights through the band-pass filter. By using the transmission grating, the third plano-convex cylindrical lens, and the CMOS sensor, the reflection spectrum with a specific range of wavelengths and incident angles can be obtained. While the wavelength of the light source is adjustable, the real-time and rapid imaging measurement of the LSPR signal is realized, and the measurement effect of the LSPR imaging measurement device is improved.

[0005] To achieve the above object, the present invention provides the following technical solutions:

[0006] An LSPR imaging measurement component is applied to an LSPR imaging measurement device. The LSPR imaging measurement component includes:

[0007] An incident light module, including a tungsten halogen light source, a first aperture, a band-pass filter, and an aspherical lens. The tungsten halogen light source is used to output white light, which passes through the first aperture and is constrained by the first aperture. The light beam output from the first aperture passes through the band-pass filter and forms a light beam with a specific wavelength. The light beam with the specific wavelength passes through the aspherical lens and forms a collimated light beam.

[0008] A polarization cube beam splitter, which receives the collimated light beam output from the aspherical lens and generates P-polarized light and S-polarized light.

[0009] A polarization component, including a rotating stage and a linear polarizer. The linear polarizer changes its angle as the rotating stage rotates. The linear polarizer receives the P-polarized light and conducts it to the chip.

[0010] An imaging measurement component is arranged on one side of the polarization component. The imaging measurement component includes a transmission grating, a third plano-convex cylindrical lens, and a CMOS sensor. The transmission grating receives the light reflected by the chip and generates light of different wavelengths. The light of different wavelengths will be separated at different diffraction angles and focused by the third plano-convex cylindrical lens to form a focused light beam. The CMOS sensor receives the focused light beam at the focal position and generates an image signal.

[0011] Optionally, the tungsten halogen light source serves as the light source component and continuously emits white light.

[0012] Optionally, the tungsten halogen light source, the first aperture, and the band-pass filter are arranged in sequence.

[0013] The first aperture constrains the white light output by the tungsten halogen light source and outputs a beam of light.

[0014] The beam of light is conducted from the first aperture to the band-pass filter and outputs a beam of light with a specific wavelength through the band-pass filter.

[0015] Optionally, the aspherical lens is arranged on the side of the band-pass filter facing away from the first aperture and receives the beam of light with a specific wavelength output by the band-pass filter. The beam of light with a specific wavelength becomes a collimated beam after passing through the aspherical lens.

[0016] The lens end of the aspherical lens faces the polarization cube beam splitter.

[0017] Optionally, the polarization cube beam splitter outputs P-polarized light and S-polarized light in different directions.

[0018] The P-polarized light is conducted from the polarization cube beam splitter to the linear polarizer.

[0019] The rotation stage can change the angle θ between the fast axis of the linear polarizer and the X-axis, and the polarization direction of the P-polarized light after passing through the linear polarizer is related to θ.

[0020] Optionally, a first plano-convex cylindrical lens and a prism are provided between the linear polarizer and the chip. The beam of light output by the linear polarizer passes through the first plano-convex cylindrical lens, the prism, and the chip in sequence.

[0021] Optionally, the prism is arranged on one side of the chip and covers the conduction end of the chip.

[0022] Optionally, a second plano-convex cylindrical lens is provided between the chip and the transmission grating.

[0023] The second plano-convex cylindrical lens is used to receive the beam of light reflected by the prism and the chip and form a collimated beam.

[0024] The collimated light beam emitted from the second plano-convex cylindrical lens is incident on the surface of the transmission grating;

[0025] According to the characteristics of the transmission grating, lights of different wavelengths will be separated at different diffraction angles.

[0026] Optionally, the ruling direction of the transmission grating is consistent with the polarization direction of the incident light.

[0027] An LSPR imaging measurement device includes the LSPR imaging measurement assembly described above.

[0028] Compared with the prior art, the beneficial effects of the present invention are as follows:

[0029] The present invention provides an LSPR imaging measurement assembly and an LSPR imaging measurement device. The incident light module includes a tungsten halogen light source, a first aperture, a band-pass filter, and an aspherical lens. The tungsten halogen light source is used to output white light, which passes through the first aperture and is constrained by the first aperture. The light beam output from the first aperture passes through the band-pass filter and forms a light beam with a specific wavelength. The light beam with a specific wavelength passes through the aspherical lens and is formed into a collimated light beam. The polarization cube beam splitter receives the collimated light beam output from the aspherical lens and generates P-polarized light and S-polarized light. The polarization assembly includes a rotating stage and a linear polarizer. The linear polarizer changes its angle as the rotating stage rotates. The linear polarizer receives the P-polarized light and conducts it to the chip. The imaging measurement assembly is arranged on one side of the polarization assembly. The imaging measurement assembly includes a transmission grating, a third plano-convex cylindrical lens, and a CMOS sensor. The transmission grating receives the light reflected by the chip and generates lights of different wavelengths. The lights of different wavelengths will be separated at different diffraction angles and are focused by the third plano-convex cylindrical lens to form a focused light beam. The CMOS sensor receives the focused light beam at the focal position, generates an image signal, and realizes the measurement of different incident lights through the band-pass filter. By using the transmission grating, the third plano-convex cylindrical lens, and the CMOS sensor, the reflection spectrum with a specific range of wavelengths and incident angles can be obtained. While the wavelength of the light source is adjustable, the real-time and rapid imaging measurement of the LSPR signal is realized, and the measurement effect of the LSPR imaging measurement device is improved. Description of the Drawings

[0030] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following will briefly introduce the drawings required for the description of the embodiments. Obviously, the following drawings are only some embodiments of the present application. For those skilled in the art, other drawings can be obtained based on these drawings without creative efforts.

[0031] In order to more completely understand the present application and its beneficial effects, the following will be described in conjunction with the drawings. Among them, the same reference numerals represent the same parts in the following description.

[0032] Figure 1 The figure shows a schematic diagram of an LSPR imaging measurement component according to an embodiment of the present application.

[0033] Figure 2 The figure shows a schematic diagram of an incident light module of an LSPR imaging measurement component according to an embodiment of the present application.

[0034] Figure 3 The figure shows a schematic diagram of a polarization cube beam splitter of an LSPR imaging measurement component according to an embodiment of the present application.

[0035] Figure 4 The figure shows a schematic diagram of a polarization component of an LSPR imaging measurement component according to an embodiment of the present application.

[0036] Figure 5 The figure shows a schematic diagram of an imaging measurement component of an LSPR imaging measurement component according to an embodiment of the present application.

[0037] Reference numerals

[0038] 100, LSPR imaging measurement component;

[0039] 10, incident light module; 11, tungsten halogen light source; 12, first aperture; 13, band-pass filter; 14, aspherical lens;

[0040] 20, polarization cube beam splitter;

[0041] 30, polarization component; 31, rotating stage; 32, linear polarizer; 33, first plano-convex cylindrical lens; 34, prism;

[0042] 40, imaging measurement component; 41, transmission grating; 42, third plano-convex cylindrical lens; 43, CMOS sensor; 44, second plano-convex cylindrical lens. Detailed implementation manners

[0043] Next, the technical solutions in the embodiments of the present application will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative efforts shall fall within the protection scope of the present application.

[0044] Figures 1 to 5, an embodiment of the present application provides an LSPR imaging measurement component 100. As a part of the LSPR imaging measurement device, the LSPR imaging measurement component 100 can quickly analyze the brightness and chromaticity uniformity of the entire display screen and can be integrated into the production line for rapid measurement. The LSPR imaging measurement component 100 includes an incident light module 10, a polarization cube beam splitter 20, a polarization component 30, and an imaging measurement component 40, which are arranged in sequence.

[0045] In the embodiment of the present application, the incident light module 10 includes a tungsten halogen light source 11, a first aperture 12, a band-pass filter 13, and an aspherical lens 14. The tungsten halogen light source 11 is used to output white light, which passes through the first aperture 12 and is constrained by the first aperture 12. The beam of light output from the first aperture 12 passes through the band-pass filter 13 and forms a light beam with a specific wavelength. The light beam with a specific wavelength passes through the aspherical lens 14 and forms a collimated light beam. Different incident light measurements can be achieved by passing through the band-pass filter 13. Optionally, the tungsten halogen light source 11 serves as a light source component and continuously emits white light.

[0046] At this time, the tungsten halogen light source 11, the first aperture 12, and the band-pass filter 13 are arranged from left to right in sequence. The first aperture 12 constrains the white light output by the tungsten halogen light source 11 and outputs a beam of light. The beam of light is conducted by the first aperture 12 to the band-pass filter 13, and a light beam with a specific wavelength is output through the band-pass filter 13 to achieve different incident light measurements.

[0047] Among them, the aspherical lens 14 is disposed on the side of the band-pass filter 13 facing away from the first aperture 12 and receives the light beam with a specific wavelength output by the band-pass filter 13. The light beam with a specific wavelength becomes a collimated light beam after passing through the aspherical lens 14. The lens end of the aspherical lens 14 faces the polarization cube beam splitter 20, so as to adjust the light beam with a specific wavelength into a collimated light beam, thereby facilitating the collimated light beam to irradiate the polarization cube beam splitter 20.

[0048] In the embodiment of the present application, the polarization cube beam splitter 20 is disposed on the right side of the aspherical lens 14. The polarization cube beam splitter 20 receives the collimated light beam output by the aspherical lens 14 and generates P-polarized light and S-polarized light, so as to generate P-polarized light and S-polarized light by passing the collimated light beam output by the aspherical lens 14 through the polarization cube beam splitter 20.

[0049] In the embodiment of the present application, the polarization component 30 includes a rotating stage 31 and a linear polarizer 32; the linear polarizer 32 is disposed on the right side of the polarization cube beam splitter 20, and the linear polarizer 32 changes its angle as the rotating stage 31 rotates, so as to adjust the position of the linear polarizer 32 relative to the polarization cube beam splitter 20. The linear polarizer 32 receives P-polarized light or S-polarized light and conducts it to the chip, so that the P-polarized light or S-polarized light is conducted to the chip through the polarizer.

[0050] The polarization cube beam splitter 20 outputs P-polarized light and S-polarized light along different directions; the P-polarized light is conducted from the polarization cube beam splitter 20 to the linear polarizer 32; the rotating stage 31 can change the angle θ between the fast axis of the linear polarizer 32 and the X-axis, and the polarization direction of the P-polarized light after passing through the linear polarizer 32 is related to θ, so that the P-polarized light and S-polarized light output by the polarization cube beam splitter 20 are conducted to the chip through the linear polarizer 32, thereby improving the resonance intensity of the chip.

[0051] A first plano-convex cylindrical lens 33 and a prism 34 are provided between the linear polarizer 32 and the chip; the linear polarizer 32, the first plano-convex cylindrical lens 33, the prism 34 and the chip are arranged in sequence from left to right, and the light beam output from the linear polarizer 32 passes through the first plano-convex cylindrical lens 33, the prism 34 and the chip in sequence, so that the light beam output from the linear polarizer 32 is adjusted from a collimated beam to a focused beam, thereby facilitating the conduction of the focused beam to the chip.

[0052] The prism 34 is disposed on one side of the chip and covers the conduction end of the chip, so as to facilitate the conduction of the light beam passing through the prism 34 to the chip.

[0053] In the embodiment of the present application, the imaging measurement component 40 is disposed below the polarization component 30. The imaging measurement component 40 includes a transmission grating 41, a third plano-convex cylindrical lens 42, and a CMOS sensor 43; the transmission grating 41 receives the light reflected by the chip and generates lights of different wavelengths. The lights of different wavelengths will be separated at different diffraction angles and focused by the third plano-convex cylindrical lens 42 to form a focused beam; the CMOS sensor 43 receives the focused beam at the focal position and generates an image signal. By using the transmission grating 41, the third plano-convex cylindrical lens 42 and the CMOS sensor 43, a reflection spectrum with a specific range of wavelengths and incident angles can be obtained. While the wavelength of the light source is adjustable, real-time and fast imaging measurement of the LSPR signal is realized, and the measurement effect of the LSPR imaging measurement device is improved.

[0054] A second plano-convex cylindrical lens 44 is provided between the chip and the transmissive grating 41; the second plano-convex cylindrical lens 44 is used to receive the light beam reflected by the prism 34 and the chip and form a collimated light beam, so that the focused light beam reflected by the prism 34 and the chip can be adjusted into a collimated light beam through the second plano-convex cylindrical lens 44; the collimated light beam emitted from the second plano-convex cylindrical lens 44 is incident on the surface of the transmissive grating 41, so that the collimated light beam can be conducted to the surface of the transmissive grating 41; according to the characteristics of the transmissive grating 41, lights of different wavelengths will be separated at different diffraction angles. Optionally, the ruling direction of the transmissive grating 41 is consistent with the polarization direction of the incident light.

[0055] In another embodiment, an LSPR imaging measurement device includes an LSPR imaging measurement assembly 100. The LSPR imaging measurement assembly 100 is a part of the LSPR imaging measurement device. The LSPR imaging measurement device can quickly analyze the brightness and chromaticity uniformity of the entire display screen and can be integrated into the production line for rapid measurement.

[0056] Compared with the prior art, the beneficial effects of the present invention are:

[0057] The present invention provides an LSPR imaging measurement assembly 100 and an LSPR imaging measurement device. The incident light module 10 includes a tungsten halogen light source 11, a first aperture 12, a band-pass filter 13, and an aspherical lens 14; the tungsten halogen light source 11 is used to output white light, and the white light passes through the first aperture 12 and is constrained by the first aperture 12. The light beam output from the first aperture 12 passes through the band-pass filter 13 and forms a light beam with a specific wavelength; the light beam with a specific wavelength passes through the aspherical lens 14 and is formed into a collimated light beam; the polarization cube beam splitter 20 receives the collimated light beam output from the aspherical lens 14 and generates P-polarized light and S-polarized light; the polarization assembly 30 includes a rotating table 31 and a linear polarizer 32; the linear polarizer 32 changes its angle as the rotating table 31 rotates. The linear polarizer 32 receives the P-polarized light and conducts it to the chip; the imaging measurement assembly 40 is arranged on one side of the polarization assembly 30. The imaging measurement assembly 40 includes a transmissive grating 41, a third plano-convex cylindrical lens 42, and a CMOS sensor 43; the transmissive grating 41 receives the light reflected by the chip and generates lights of different wavelengths. The lights of different wavelengths will be separated at different diffraction angles and are focused by the third plano-convex cylindrical lens 42 to form a focused light beam; the CMOS sensor 43 receives the focused light beam at the focal position, generates an image signal, and realizes the measurement of different incident lights through the band-pass filter 13. By using the transmissive grating 41, the third plano-convex cylindrical lens 42, and the CMOS sensor 43, a reflection spectrum with a specific range of wavelengths and incident angles can be obtained. While the wavelength of the light source is adjustable, the real-time and rapid imaging measurement of the LSPR signal is realized, and the measurement effect of the LSPR imaging measurement device is improved.

[0058] In the above embodiments, the descriptions of the respective embodiments have their own emphases. For parts not elaborated in a certain embodiment, reference may be made to the relevant descriptions of other embodiments.

[0059] In the description of the present application, the terms "first" and "second" are only used for descriptive purposes and cannot be construed as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, features defined with "first" and "second" may explicitly or implicitly include one or more features.

[0060] Specific examples are used herein to elaborate on the principles and implementation manners of the present application. The descriptions of the above embodiments are only used to help understand the method of the present application and its core idea; at the same time, for those skilled in the art, according to the idea of the present application, there will be changes in the specific implementation manners and application scopes. In summary, the content of this specification should not be construed as a limitation to the present application.

Claims

1. An LSPR imaging measurement component, characterized in that: Applicable to LSPR imaging measurement device; the LSPR imaging measurement component comprises: The incident light module comprises a tungsten-halogen lamp light source, a first aperture, a bandpass filter, and an aspheric lens; the tungsten-halogen lamp light source is used to output white light, the white light passes through the first aperture and is constrained by the first aperture, the light beam output through the first aperture passes through the bandpass filter and forms a light beam of a specific wavelength; the light beam of the specific wavelength passes through the aspheric lens and forms a collimated light beam; A polarizing cube beam splitter receives the collimated light beam outputted by the aspheric lens and generates P-polarized light and S-polarized light; A polarization component, comprising a rotating stage and a linear polarizer; the linear polarizer changes its angle as the rotating stage rotates, and the linear polarizer receives P polarized light and transmits it to the chip; An imaging measurement component is arranged on one side of the polarization component, and includes a transmission grating, a third plano-convex cylindrical lens, and a CMOS sensor; the transmission grating receives the light reflected by the chip and generates light of different wavelengths, and the light of different wavelengths is separated at different diffraction angles and focused at the third plano-convex cylindrical lens to form a focused light beam; the CMOS sensor receives the focused light beam at a focal position and generates an image signal.

2. The LSPR imaging measurement assembly according to claim 1, characterized in that: The tungsten halogen lamp light source is used as a light source and continuously emits white light.

3. The LSPR imaging measurement assembly according to claim 2, characterized in that: The tungsten halogen light source, the first aperture, and the bandpass filter are arranged in sequence; The first aperture constrains the white light output by the halogen tungsten lamp light source and outputs a beam of light; The light beam is transmitted from the first aperture to the bandpass filter, and outputs a light beam of a specific wavelength through the bandpass filter.

4. The LSPR imaging measurement assembly according to claim 3, characterized in that: The aspheric lens is arranged on a side of the bandpass filter facing away from the first aperture, and receives the light beam of a specific wavelength outputted by the bandpass filter; the light beam of a specific wavelength becomes a collimated light beam after passing through the aspheric lens; The lens end of the aspheric lens faces the polarizing cube beam splitter.

5. The LSPR imaging measurement assembly according to claim 3, characterized in that: The polarizing cube beam splitter outputs P polarized light and S polarized light along different directions; The P-polarized light is transmitted from the polarizing cube beam splitter to the linear polarizer; The rotating stage can change the angle θ between the fast axis and the X axis in the linear polarizer, and the polarization direction of the P polarized light after passing through the linear polarizer is related to θ.

6. The LSPR imaging measurement assembly according to claim 5, characterized in that: A first plano-convex cylindrical lens and a prism are arranged between the linear polarizer and the chip; the light beam outputted from the linear polarizer passes through the first plano-convex cylindrical lens, the prism and the chip in sequence.

7. The LSPR imaging measurement assembly according to claim 6, characterized in that: The prism is arranged on one side of the chip and covers the conductive end of the chip.

8. The LSPR imaging measurement assembly according to claim 7, characterized in that: A second plano-convex cylindrical lens is provided between the chip and the transmission grating; The second plano-convex cylindrical lens is used to receive the light beam reflected by the prism and the chip and form a collimated light beam; The collimated light beam emitted from the second plano-convex cylindrical lens is incident on the surface of the transmission grating; Depending on the characteristics of the transmission grating, light of different wavelengths will be separated at different diffraction angles.

9. The LSPR imaging measurement assembly according to claim 8, characterized in that: The direction of the lines of the transmission grating is consistent with the polarization direction of the incident light.

10. A LSPR imaging measurement device, characterized in that: The method comprises the LSPR imaging measurement component as claimed in any one of claims 1 to 9.

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