Nickel plating film plating needle
By plating nickel and coating layers on the probe, the signal interference and low leakage problems of the probe during large-scale use, as well as the softer problems, and the hardness and service life of the probe are improved.
Patent Information
- Application Number
- CN202421190387.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-05-28
- Publication Date
- 2025-06-13
- Estimated Expiration
- 2034-05-28
AI Technical Summary
When existing probes are used in large quantities, the closeness between the needles leads to interference in the test signal and low leakage problems. In addition, ordinary rhenium tungsten probes have problems with softness, which are prone to problems such as burning the needle and curling.
A nickel-plated film-coated needle is adopted. A nickel-plated layer is provided on the needle body and the outside of the needle tip of the probe body, and a coating layer is provided on the end of the needle body near the needle tip, and the coating layer is located on the outside of the nickel-plated layer.
The nickel-plated layer improves the hardness and corrosion resistance of the probe, improves the contact impedance, and extends the service life of the probe; the coating layer solves the signal interference and low leakage caused by too close to the needle.
Smart Images
Figure CN222979663U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of probes, and particularly relates to a nickel-plated and coated needle. Background Art
[0002] A probe card is a test interface mainly used for testing bare chips. By connecting a tester and a chip, the chip parameters are tested by transmitting signals. The probe is used to contact the pads or bumps on the chip to lead out the chip signals, and then cooperate with peripheral test instruments and software control to achieve the purpose of automatic measurement.
[0003] At present, probes are mainly made of materials such as copper, molybdenum, tungsten, and steel, and alloys can also be used. For example, the common rhenium-tungsten probe is made of rhenium-tungsten alloy. With the increase in the number of probes, the distance between needles is too close, which will cause problems such as test signal interference and low leakage current. Moreover, as the test substrates of wafers become more and more diverse, ordinary rhenium-tungsten probes have the problem of being too soft, and problems such as needle burning and curling are likely to occur at the tip of the needle, affecting the detection results of the probe. Summary of the Utility Model
[0004] In order to solve the above problems, the utility model provides a nickel-plated and coated needle, which can improve the hardness of the needle material and avoid the signal interference problem caused by too small needle pitch.
[0005] Therefore, the technical solution of the utility model is: a nickel-plated and coated needle, including a slender probe body, including a needle body part and a needle tip part. Nickel-plated layers are provided on the outer sides of both the needle body part and the needle tip part, and a coating layer is provided at one end of the needle body part close to the needle tip part, and the coating layer is located outside the nickel-plated layer; the boundary line between the needle tip part and the needle body part is flush with the front end of the coating layer.
[0006] On the basis of the above solution and as the preferred solution of the above solution: the nickel-plated layer wraps the entire outer side of the probe body, and the thickness of the nickel-plated layer is 0.6 ± 0.1 um.
[0007] On the basis of the above solution and as the preferred solution of the above solution: the length of the coating layer is 10.0 ± 0.02 mm, and the thickness of the coating layer is 16.5 ± 0.5 um.
[0008] On the basis of the above solution and as the preferred solution of the above solution: the material of the coating layer is an insulating film. The insulating film can be selected from ELECOAT PI or ELECOAT AMG.
[0009] On the basis of the above solution and as the preferred solution of the above solution: the total length of the probe body is 76.2 ± 0.1 um, and the length of the needle tip part is 2.2 ± 0.1 mm.
[0010] Compared with the prior art, the beneficial effects of the present utility model are as follows: A nickel plating layer and a coating layer are added to the La tungsten probe. The nickel plating layer can solve the problems of corrosion resistance and hardness of the probe tip. Nickel plating can not only improve the hardness of the needle material, but also improve the contact impedance problem of the probe. During the automatic needle cleaning process of the machine during testing, the loss can be reduced, indirectly extending the service life of the probe card. The coating layer can solve the problems of increased number of probes, test signal interference and low leakage caused by the proximity between needles, and can be applied to high-pin-count test product projects. BRIEF DESCRIPTION OF THE DRAWINGS
[0011] The following further detailed description will be made in conjunction with the drawings and the embodiments of the present utility model:
[0012] Figure 1 is a schematic structural diagram of the present utility model;
[0013] Figure 2 is a schematic dimensional diagram of the present utility model;
[0014] Figure 3 is a schematic installation diagram of the present utility model.
[0015] The labels in the figure are: probe body 1, needle body part 11, needle tip part 12, coating layer 2, epoxy resin layer 3. SPECIFIC EMBODIMENTS
[0016] In the description of the present utility model, it should be noted that for orientation terms, if there are terms such as "center", "horizontal (X)", "vertical (Y)", "vertical (Z)", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", etc., the indicated orientation and position relationships are based on the orientation or position relationships shown in the drawings. It is only for the convenience of describing the present utility model and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and should not be construed as limiting the specific protection scope of the present utility model.
[0017] In addition, if there are terms "first" and "second", they are only used for descriptive purposes and cannot be understood as indicating or implying relative importance or implicitly specifying the quantity of technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include one or more of such features. In the description of the present utility model, the meanings of "several" and "a number of" are two or more, unless otherwise specifically and clearly defined.
[0018] Refer to the attached drawings. The nickel-plated and coated needle in this embodiment includes an elongated probe body 1, which includes a needle body part 11 and a needle tip part 12. The total length L1 of the probe body 1 is 76.2 ± 0.1 um, and the length L3 of the needle tip part 12 is 2.2 ± 0.1 mm. Nickel plating layers are provided on the outer sides of both the needle body part 11 and the needle tip part 12. The nickel plating layer wraps around the entire outer side of the probe body, and the thickness of the nickel plating layer is 0.6 ± 0.1 um.
[0019] A coating layer 2 is provided at one end of the needle body part 11 close to the needle tip part 12, and the coating layer 2 is located outside the nickel plating layer; the boundary line between the needle tip part 12 and the needle body part 11 is flush with the front end of the coating layer 2, that is, the coating range starts 2.2 ± 0.1 mm backward from the needle tip. The length L2 of the coating layer 2 is 10.0 ± 0.02 mm, and the thickness of the coating layer 2 is 16.5 ± 0.5 um; the material of the coating layer 2 is an insulating film. The insulating film can be selected from ELECOAT PI or ELECOAT AMG. ELECOAT PI is a polyimide coating film with good heat resistance and high acid resistance insulation formed by high-safety electrophoretic coating, and it is the preferred material for the probe. ELECOAT AMG is a precision insulating electrophoretic coating most suitable for small electronic components. It has uniform edge insulation and can obtain a superior and safe performance coating film, and it is an alternative material for the probe.
[0020] This embodiment combines the advantages of the coated needle and the nickel-plated needle; the coating solves the problems of the increase in the number of probes, the test signal interference and low leakage caused by the proximity between needles; nickel plating solves the problems of corrosion resistance and hardness of the probe tip. As the test substrates of wafers become more and more diverse, ordinary rhenium-tungsten probes have the problem of being too soft. Nickel plating can not only improve the hardness of the needle material, but also improve the probe contact impedance problem.
[0021] As Figure 3 shown, when the probe is installed, an epoxy resin layer 3 is used to wrap the probe, and both the front and rear ends of the coating layer 2 on the probe can extend out of the epoxy resin layer 3, that is, the insulating material can extend out before and after the spider epoxy resin. Because only when the insulating material coating reaches this specification and then the probe is wrapped with epoxy resin, the leakage performance can be improved.
[0022] The above are only the preferred embodiments of the present invention. The protection scope of the present invention is not limited to the above embodiments. All technical solutions within the idea of the present invention belong to the protection scope of the present invention. It should be pointed out that for those of ordinary skill in the art, without departing from the principle of the present invention, several improvements and refinements should also be regarded as the protection scope of the present invention.
Claims
1. A nickel-plated film-coated needle, comprising an elongated probe body, including a needle body portion and a needle tip portion, characterized in that: The outer sides of the needle body and the needle tip are both provided with a nickel plating layer, and the needle body is provided with a film coating layer at one end close to the needle tip, and the film coating layer is located outside the nickel plating layer; the boundary line between the needle tip and the needle body is flush with the front end of the film coating layer.
2. A nickel-plated film-coated needle as claimed in claim 1, characterized in that: The nickel-plated layer wraps around the entire outer side of the probe body, and the thickness of the nickel-plated layer is 0.6±0.1 um.
3. A nickel-plated film-coated needle as claimed in claim 1, characterized in that: The length of the coating layer is 10.0±0.02 mm, and the thickness of the coating layer is 16.5±0.5 um.
4. A nickel-plated film-coated needle as claimed in claim 1, characterized in that: The material of the coating layer is an insulating film.
5. A nickel-plated film-coated needle as claimed in claim 1, characterized in that: The total length of the probe body is 76.2±0.1um, and the length of the needle tip is 2.2±0.1mm.