Photovoltaic module hot spot testing device

Abstract

The utility model relates to photovoltaic module detection, and particularly discloses a photovoltaic module hot spot testing device which comprises a testing box, a control system, a bearing structure and a testing system, and the bearing structure and the testing system are arranged in the testing box. The test system comprises a light source assembly and an infrared imaging assembly, and the light source assembly and the infrared imaging assembly are both electrically connected with the control system; the bearing structure is arranged opposite to the light source assembly and the infrared imaging assembly, the bearing structure comprises a bearing surface which does not reflect irradiation light of the light source assembly, and the bearing surface is used for bearing the photovoltaic assembly. According to the device, the light source assembly and the infrared imaging assembly are integrated in the test box, so that battery piece selection and hot spot test of the photovoltaic module can be completed in the same equipment, the operation steps of disassembling, carrying, installing the photovoltaic module and the like are saved, the test efficiency is improved, and the test cost is reduced.

Description

Technical Field

[0001] The present application relates to the technical field of photovoltaic module detection, and particularly to a hot spot test device for photovoltaic modules. Background Art

[0002] The hot spot phenomenon of photovoltaic modules will reduce the output power of photovoltaic modules, and accelerate the aging and decline of the modules, thereby causing the power generated by the photovoltaic power generation system to gradually decay. To avoid the energy generated by normally operating photovoltaic modules being consumed by shaded modules, it is necessary to detect hot spots.

[0003] The conventional hot spot test method is as follows: First, place the module on an I-V machine table and block each cell in turn for testing to find the three cells with the largest leakage current and the one cell with the smallest leakage current, and then place the selected cells in a steady-state simulator for hot spot exposure. The above two tests are carried out independently, the detection process is cumbersome, and it will consume a lot of manpower and material resources. Moreover, it is necessary to purchase an I-V tester and a steady-state simulator separately, which greatly increases the detection cost of photovoltaic modules. Utility Model Content

[0004] Based on this, the present utility model provides a hot spot test device for photovoltaic modules to solve the problems that the existing hot spot test for photovoltaic modules needs to be carried out sequentially using different instruments, resulting in a cumbersome detection process, low detection efficiency, and high cost of detection equipment.

[0005] A hot spot test device for photovoltaic modules provided by the present utility model includes a test chamber, a control system, and a carrying structure and a test system arranged in the test chamber;

[0006] The test system includes a light source assembly and an infrared imaging assembly, and both the light source assembly and the infrared imaging assembly are electrically connected to the control system;

[0007] The carrying structure is arranged opposite to the light source assembly and the infrared imaging assembly. The carrying structure includes a carrying surface that has no reflection on the irradiation light of the light source assembly, and the carrying surface is used to carry the photovoltaic module;

[0008] The carrying structure includes a support plate and a carrying plate fixed on the support plate, and the surface of the carrying plate is the carrying surface;

[0009] Positioning protrusions are arranged on the support plate. The positioning protrusions include support rods. A strip-shaped limiting groove adapted to the support rods is arranged at the bottom of the carrying plate, and the strip-shaped limiting groove is embedded on the support rods. The positioning cooperation between the carrying plate and the support rods can ensure that the carrying plate is directly opposite to the test system. A positioning structure for positioning the photovoltaic module is also arranged on the carrying plate to ensure that the photovoltaic module is directly opposite to the test system.

[0010] In one embodiment, a coating or film made of a non-reflective material is provided on the carrier plate, so that the carrier surface has no reflection on the light irradiated by the light source assembly.

[0011] In one embodiment, the carrier surface has no reflection on light with a wavelength of 300 - 1200 nm.

[0012] In one embodiment, the positioning structure includes a first limiting rod and a second limiting rod. The first limiting rod is parallel to the length direction of the carrier plate, and the second limiting rod is parallel to the width direction of the carrier plate.

[0013] In one embodiment, the light source assembly is used to emit simulated sunlight with an adjustable irradiation intensity of 800 W / ㎡ - 1300 W / ㎡.

[0014] In one embodiment, the light source assembly includes a plurality of lamp tubes disposed in the test chamber.

[0015] In one embodiment, the infrared imaging assembly is disposed in the test chamber and is directly opposite to the horizontal center of the carrier surface, and the imaging area of the infrared imaging assembly covers the carrier surface.

[0016] In one embodiment, the infrared imaging assembly includes an infrared probe with adjustable focal length.

[0017] In one embodiment, the control system at least includes a controller for controlling the light source assembly and the infrared imaging assembly, and an image processing software for processing the hot spot images acquired by the infrared imaging assembly.

[0018] Advantageous effects: In this photovoltaic module hot spot test device, by integrating the light source assembly and the infrared imaging assembly in the test chamber, it is possible to complete the cell selection and hot spot test of the photovoltaic module in the same device, saving the operation steps such as disassembling, transporting, and installing the photovoltaic module, improving the test efficiency, and reducing the test cost. Moreover, the carrier surface of this device for carrying the photovoltaic module has a low reflectivity to the light irradiated by the light source assembly, which can avoid the reflection of the irradiated light by the carrier surface, ensure the singularity of the test conditions, and make the test more accurate. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 It is a schematic structural diagram of a photovoltaic module hot spot test device in one embodiment;

[0020] Figure 2 It is a schematic structural diagram of the top of the inner cavity of the test chamber in one embodiment;

[0021] Figure 3Schematic structural diagram of a photovoltaic module positioned on a carrier plate in an embodiment.

[0022] Reference numerals in the accompanying drawings of the specification include: 1 - test chamber, 101 - chamber door, 2 - carrier structure, 201 - support leg, 202 - support plate, 2021 - support rod, 203 - carrier plate, 2031 - bearing surface, 2032 - first limiting rod, 2033 - second limiting rod, 3 - test system, 301 - light source assembly, 302 - infrared imaging assembly, 4 - photovoltaic module, 5 - equipment controller. Detailed implementation manners

[0023] In order to make the objectives, technical solutions and advantages of the present application clearer and more understandable, the present application will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0024] It should be noted that the diagrams provided in this embodiment only illustrate the basic concept of the present utility model in a schematic manner.

[0025] The structures, ratios, sizes, etc. shown in the drawings of this specification are only used to cooperate with the content disclosed in the specification for those skilled in this technology to understand and read, and are not used to limit the limiting conditions under which the present utility model can be implemented. Any modification of the structure, change in the proportional relationship or adjustment of the size, without affecting the effects that the present utility model can produce and the objectives that can be achieved, should still fall within the scope that can be covered by the technical content disclosed in the present utility model.

[0026] The orientation or positional relationship indicated by terms such as "upper", "lower", "left", "right", "middle", "longitudinal", "transverse", "horizontal", "inner", "outer", "radial", "circumferential", etc. cited in this specification is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation of the present utility model. In addition, the terms "first" and "second" are only used for descriptive purposes and cannot be understood as indicating or implying relative importance.

[0027] The hot spot test of existing photovoltaic modules needs to be tested sequentially using an I-V tester and a steady-state simulator, which not only has a relatively high detection cost, but also has a cumbersome detection process and requires a large amount of manpower and material resources. Based on this, the embodiment of the present utility model provides a hot spot test device for photovoltaic modules. By integrating the light source assembly and the infrared imaging assembly in the test chamber, the wafer selection and hot spot test of the photovoltaic module can be completed in the test chamber, improving the test efficiency and reducing the test cost.

[0028] Specifically, the hot spot test device for photovoltaic modules provided by at least one embodiment of the present utility model includes a test chamber, a control system, a bearing structure and a test system disposed in the test chamber;

[0029] The test system includes a light source assembly and an infrared imaging assembly, and both the light source assembly and the infrared imaging assembly are electrically connected to the control system;

[0030] The bearing structure is disposed opposite to the light source assembly and the infrared imaging assembly. The bearing structure includes a bearing surface with a low reflectivity to the light irradiated by the light source assembly, and the bearing surface is used to bear the photovoltaic module.

[0031] When the hot spot test device for photovoltaic modules provided by the embodiment of the present utility model is in use, it includes the following two steps:

[0032] Step 1: Selection of typical cells

[0033] Short-circuit the photovoltaic module and place it on the bearing surface. At this time, the photovoltaic module is facing the light source assembly and the infrared imaging assembly. Then, control the light source assembly to start irradiation through the control system. After irradiating for a specified time, control the infrared imaging assembly to take a picture of the photovoltaic module to generate an infrared photo. Then, the control system identifies the infrared photo, finds four typical cells and locks the hottest spots of each typical cell, and then turns off the light source assembly.

[0034] Step 2: Hot spot test

[0035] Block each typical cell, and paste a control thermocouple at the corresponding back position of the hottest spot of each typical cell. Then, turn on the light source assembly to simulate sunlight irradiation. After irradiating for a specified time, check the temperature data of the control thermocouple.

[0036] In the hot spot test device for photovoltaic modules of this embodiment, by integrating the light source assembly and the infrared imaging assembly in the test chamber, it is possible to complete the cell selection and hot spot test of the photovoltaic module in the same device, saving the operation steps such as disassembling, transporting, and installing the photovoltaic module, improving the test efficiency, and reducing the test cost. Moreover, the bearing surface of this device for bearing the photovoltaic module has a low reflectivity to the light irradiated by the light source assembly, which can avoid the reflection of the irradiated light by the bearing surface, ensure the singularity of the test conditions, and make the test more accurate.

[0037] The embodiments and examples of the present utility model will be described in detail below with reference to the accompanying drawings. Figure 1 It is a schematic structural diagram of the hot spot test device for photovoltaic modules provided by at least one embodiment of the present utility model.

[0038] As Figure 1 shown, the hot spot test device for photovoltaic modules provided by the embodiment of the present utility model includes a test chamber 1, a control system, a bearing structure 2 and a test system 3.

[0039] Among them, the test chamber 1 is used to accommodate the photovoltaic module 4, the bearing structure 2 and the test system 3, so as to complete the cell sorting and hot spot test of the photovoltaic module 4 in the test chamber 1.

[0040] For example, referring to Figure 1 , in one example, the test chamber 1 is a rectangular box with an accommodation cavity inside, and the accommodation cavity can accommodate the photovoltaic module 4, the bearing structure 2 and the test system 3. And, one side of the test chamber 1 has an openable and closable door 101 to facilitate the loading and unloading of the photovoltaic module 4. During the test, the closed environment inside the test chamber 1 can be achieved by closing the door 101, thereby avoiding interference from the external environment of the test chamber 1 to the hot spot test of the photovoltaic module 4 and improving the accuracy of the hot spot test.

[0041] Referring to Figure 1 and 2 , in this embodiment, both the bearing structure 2 and the test system 3 are installed in the accommodation cavity of the test chamber 1, and the bearing structure 2 and the test system 3 are arranged opposite to each other, so that when the photovoltaic module 4 is carried on the bearing structure 2, the photovoltaic module 4 can be directly opposite to the test system 3, which is convenient for performing the hot spot test.

[0042] For example, referring to Figure 1 and Figure 2 , the bearing structure 2 is arranged at the bottom of the inner cavity of the test chamber 1, and the test system 3 is arranged at the top of the inner cavity of the test chamber 1. In this way, the bearing structure 2 and the test system 3 can be directly opposite up and down. Of course, in other embodiments, the test system 3 and the bearing structure 2 can also be arranged opposite to each other left and right or obliquely.

[0043] Among them, the bearing structure 2 is used to carry the photovoltaic module 4, so that the photovoltaic module 4 can be supported in the test chamber 1 for the hot spot test. For example, referring to Figure 1 , the bearing structure 2 includes a support plate 202 arranged at the bottom of the inner cavity of the test chamber 1 and several support legs 201, and the support plate 202 is supported in the test chamber 1 by several support legs 201. Specifically, in the example of Figure 1 , the support plate 202 is a rectangular plate member, and the support legs 201 have four and are distributed at the four corners of the lower surface of the support plate 202 to achieve stable support for the support plate 202.

[0044] In this embodiment, the bearing structure 2 includes a bearing surface 2031 for carrying the photovoltaic module 4, the bearing surface 2031 is integrally arranged horizontally, and the area of the bearing surface 2031 is larger than the area of the photovoltaic module 4, so that the photovoltaic module 4 can be placed on the bearing surface 2031 and kept in a horizontal state.

[0045] For example, referring to Figure 1, in this embodiment, a carrier plate 203 is fixedly connected to the support plate 202, and the surface of the carrier plate 203 is a bearing surface 2031 for bearing the photovoltaic module 4. Of course, in other embodiments, the carrier plate 203 may not be provided, and the surface of the support plate 202 may be used as the bearing surface 2031.

[0046] In this embodiment, the bearing surface 2031 does not reflect or has a low reflectivity to the simulated sunlight emitted by the test system 3. That is to say, the bearing surface 2031 can absorb all the simulated sunlight irradiated thereon to prevent the bearing surface 2031 from reflecting the simulated sunlight to the photovoltaic module 4, ensuring the singularity of the test conditions and improving the test accuracy.

[0047] For example, in this embodiment, the bearing surface 2031 does not reflect or has a low reflectivity to light with a wavelength of 300 - 1200 nm. Usually, the wavelength of visible light in sunlight is between 400 - 760 nm. In this embodiment, the low-reflection range of the bearing surface 2031 is set to light with a wavelength of 300 - 1200 nm, so that the bearing surface 2031 can basically completely absorb the simulated sunlight emitted by the test system 3, avoid the reflection of the simulated sunlight, and ensure the accuracy of the test results.

[0048] Specifically, in this embodiment, a coating or film made of a non-reflective material is provided on the surface of the carrier plate 203, so that a non-reflective or low-reflectivity bearing surface 2031 is formed on the surface of the carrier plate 203. For example, an existing full-absorbing nano-coating can be provided on the surface of the carrier plate 203.

[0049] When the surface of the support plate 202 is used as the bearing surface 2031, a coating or film made of a non-reflective material can be directly provided on the upper surface of the support plate 202, so that the coating or film forms a non-reflective or low-reflectivity bearing surface 2031 on the surface of the support plate 202.

[0050] See Figure 1 , in some embodiments, positioning protrusions are further provided on the support plate 202. The positioning protrusions include two support rods 2021 protruding from the surface of the support plate 202, and the carrier plate 203 is positioned and installed on the two support rods 2021. For example, the bottom of the carrier plate 203 has two strip-shaped limiting grooves adapted to the support rods 2021, and the two strip-shaped limiting grooves can just be embedded on the two support rods 2021. Through the positioning cooperation between the carrier plate 203 and the support rods 2021, it can be ensured that the carrier plate 203 is directly opposite to the test system 3, providing a basis for the photovoltaic module 4 to be directly opposite to the test system 3.

[0051] Further, in some embodiments, a positioning structure for positioning the photovoltaic module 4 is provided on the carrier plate 203. For example, see Figure 3, The positioning structure includes a first limiting rod 2032 and a second limiting rod 2033 disposed on the carrier plate 203. The first limiting rod 2032 is parallel to the length direction of the carrier plate 203, and the second limiting rod 2033 is parallel to the width direction of the carrier plate 203. When the photovoltaic module 4 is placed on the carrier plate 203, the long side frame of the photovoltaic module 4 is abutted against the first limiting rod 2032, and the short side frame is abutted against the second limiting rod 2033. In this way, the positioning of the photovoltaic module 4 can be completed to ensure that the photovoltaic module 4 is facing the test system 3.

[0052] In this embodiment, the test system 3 is used for cell sorting of the photovoltaic module 4 and hot spot testing of the cells.

[0053] Specifically, referring to Figure 2 , in this embodiment, the test system 3 includes a light source assembly 301 and an infrared imaging assembly 302 disposed on the top of the inner cavity of the test chamber 1. The light source assembly 301 and the infrared imaging assembly 302 are both electrically connected to the control system.

[0054] Among them, the light source assembly 301 is used to emit irradiation light with a specified irradiation intensity to simulate sunlight with different irradiation intensities. For example, in this embodiment, the adjustable irradiation intensity of the simulated sunlight emitted by the light source assembly 301 is 800 W / ㎡ - 1300 W / ㎡. In this way, the light source assembly 301 can simulate sunlight with different radiation intensities, making it closer to the radiation intensity of actual sunlight, simulating a more realistic lighting environment, and improving the accuracy of the test.

[0055] Specifically, in this embodiment, the light source assembly 301 includes a plurality of lamp tubes disposed on the top of the inner cavity of the test chamber 1. For example, referring to Figure 2 , there are six lamp tubes on the top of the inner cavity of the test chamber 1. The six lamp tubes are arranged in a rectangular array on the top of the inner cavity of the test chamber 1, and the six lamp tubes are all facing the bearing structure 2 so that the simulated sunlight emitted by the lamp tubes can irradiate the photovoltaic module 4 supported on the bearing structure 2. More specifically, in this embodiment, the lamp tubes can be xenon lamps with adjustable irradiation intensity.

[0056] Among them, the infrared imaging assembly 302 is used to take pictures of the photovoltaic module 4 and generate infrared photos to obtain the thermal image of the photovoltaic module 4.

[0057] Specifically, referring to Figure 2 , the infrared imaging assembly 302 is disposed on the top of the inner cavity of the test chamber 1 and is directly opposite to the horizontal center of the bearing surface 2031, and the imaging area of the infrared imaging assembly 302 covers the bearing surface 2031. In this way, when the photovoltaic module 4 is placed on the bearing surface 2031, the imaging area of the infrared imaging assembly 302 can cover the entire photovoltaic module 4, enabling the infrared imaging assembly 302 to take pictures of the hot spot area of the photovoltaic module 4.

[0058] In some embodiments, the infrared imaging component 302 includes an infrared probe with adjustable focal length. Thus, by finely adjusting the focal length of the infrared probe, the best shooting effect for the photovoltaic module 4 can be achieved, the captured image is clearer, the imaging effect is better, and the adaptability is stronger. For example, in this embodiment, the infrared imaging component 302 can be an existing infrared thermal imager or infrared camera with adjustable focal length, etc.

[0059] See Figure 1 , in this embodiment, the control system can be the device controller 5 outside the test chamber 1. The control system is electrically connected to the infrared imaging component 302 and the light source component 301, and is used to control the infrared imaging component 302 and the light source component 301, and receive and process the information fed back by the infrared imaging component 302.

[0060] For example, in this embodiment, the control system may specifically include a controller for controlling the on / off of the light source component 301, adjusting the simulated sunlight irradiance intensity, and controlling the infrared imaging component 302 to take pictures, an image processing software for processing the hot spot images and temperature data collected by the infrared imaging component 302, and other common structures / components of the existing control system such as an operation panel and a display screen. Details are not described in this embodiment.

[0061] It should be understood that the photovoltaic module hot spot test device in the above embodiments of the present invention is only illustrated by taking the light source component 301, the infrared imaging component 302, etc. as examples. In actual production / use processes, the photovoltaic module hot spot test device may also include other common structures / components included in existing steady-state solar simulators such as a temperature control system and a power supply system. Details are not described in this embodiment.

[0062] The technical features of the above embodiments can be combined arbitrarily. For the sake of concise description, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as the scope described in this specification.

[0063] The above embodiments only represent several implementation manners of the present application. The description is relatively specific and detailed, but it should not be construed as a limitation on the scope of the utility model patent. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present application, several deformations and improvements can still be made, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application should be subject to the appended claims.

Claims

1. A hot spot test device for a photovoltaic module, characterized in that, it includes a test chamber (1), a control system, and a bearing structure (2) and a test system (3) arranged in the test chamber (1); the test system (3) includes a light source assembly (301) and an infrared imaging assembly (302), and both the light source assembly (301) and the infrared imaging assembly (302) are electrically connected to the control system; the bearing structure (2) is arranged opposite to the light source assembly (301) and the infrared imaging assembly (302), and the bearing structure (2) includes a bearing surface (2031) that has no reflection on the irradiation light of the light source assembly (301), and the bearing surface (2031) is used to bear the photovoltaic module (4); the bearing structure (2) includes a support plate (202) and a bearing plate (203) fixed on the support plate (202), and the surface of the bearing plate (203) is the bearing surface (2031); positioning protrusions are arranged on the support plate (202), the positioning protrusions include support rods (2021), a strip-shaped limiting groove adapted to the support rods (2021) is arranged at the bottom of the bearing plate (203), the strip-shaped limiting groove is embedded on the support rods (2021), and the positioning cooperation between the bearing plate (203) and the support rods (2021) can ensure that the bearing plate (203) is directly opposite to the test system (3). A positioning structure for positioning the photovoltaic module (4) is also arranged on the bearing plate (203) to ensure that the photovoltaic module (4) is directly opposite to the test system (3).

2. The hot spot test device for a photovoltaic module according to claim 1, characterized in that: a coating or film made of a non-reflective material is arranged on the bearing plate (203) so that the bearing surface (2031) has no reflection on the light irradiated by the light source assembly (301).

3. The hot spot test device for a photovoltaic module according to claim 1 or 2, characterized in that: the bearing surface (2031) has no reflection on light with a wavelength of 300 - 1200 nm.

4. The hot spot test device for a photovoltaic module according to claim 1, characterized in that: the positioning structure includes a first limiting rod (2032) and a second limiting rod (2033), the first limiting rod (2032) is parallel to the length direction of the bearing plate (203), and the second limiting rod (2033) is parallel to the width direction of the bearing plate (203).

5. The hot spot test device for a photovoltaic module according to claim 1, characterized in that: the light source assembly (301) is used to emit simulated sunlight with an adjustable irradiation intensity of 800 W / ㎡ - 1300 W / ㎡.

6. The hot spot test device for a photovoltaic module according to claim 5, characterized in that: the light source assembly (301) includes a plurality of lamp tubes arranged in the test chamber (1).

7. The hot spot test device for a photovoltaic module according to claim 1, characterized in that: The infrared imaging component (302) is disposed in the test chamber (1) and is directly opposite to the horizontal center of the bearing surface (2031), and the imaging area of the infrared imaging component (302) covers the bearing surface (2031).

8. The photovoltaic module hot spot test device according to claim 7, wherein: The infrared imaging component (302) includes an infrared probe with adjustable focal length.

9. The photovoltaic module hot spot test device according to claim 1, wherein: The control system at least includes a controller for controlling the light source component (301) and the infrared imaging component (302), and an image processing software for processing the hot spot images acquired by the infrared imaging component (302).

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