Aperture detection device

Abstract

The utility model discloses an aperture detection device. The aperture detection device comprises a guide block, the guide block is provided with a guide hole extending in the front-back direction, and the front end face of the guide block serves as a reference surface abutting against a to-be-detected device; the probe is arranged in the guide hole in a penetrating manner and can slide back and forth, the front end of the probe protrudes out of the reference surface, the size of the front end of the probe is gradually increased from front to back, and the front end of the probe extends into a to-be-detected hole of the to-be-detected device during detection; the end plate covers the rear end of the guide block; the front end of the elastic piece abuts against the probe, and the rear end of the elastic piece abuts against the end plate, so that the probe abuts against the hole to be detected. As the size of the front end of the probe is gradually increased from front to back, when the probe extends into the to-be-detected holes with different hole diameters, the extending distances are different, whether the hole diameters of the to-be-detected holes are qualified or not is detected by using the principle, and the detection mode is simple and convenient. And a plurality of holes can be detected at the same time by arranging a plurality of probes, so that the detection efficiency is improved.

Description

Technical Field

[0001] The present application belongs to the technical field of aperture detection, and in particular, relates to an aperture detection device. Background Art

[0002] When manufacturing Mini FAKRA connectors, it is necessary to detect whether the aperture on the connector casting (which can be understood as the connector shell) is qualified. Generally, a two-dimensional detection device is used to detect the aperture. However, the use of a two-dimensional detection device requires the measurement of each hole one by one, and both sides need to be measured. There are many holes on the casting, so the measurement takes a long time. At the same time, the use of two-dimensional detection requires a high level of operation of the detection personnel. Utility Model Content

[0003] The purpose of this application is to provide an aperture detection device to solve the deficiencies of the prior art.

[0004] To achieve the above objectives, this application provides the following technical solutions:

[0005] An aperture detection device, comprising:

[0006] A guide block, wherein the guide block is provided with a guide hole extending in the front-to-back direction, and the front end surface of the guide block serves as a reference surface abutting against the device under test;

[0007] A probe is inserted into the guide hole and can slide forward and backward, the front end of the probe protrudes from the reference surface, and the size of the front end of the probe gradually increases from front to back. During detection, the front end of the probe extends into the hole to be tested of the device to be tested;

[0008] An end plate, which is covered at the rear end of the guide block;

[0009] The elastic member has a front end abutting against the probe and a rear end abutting against the end plate, thereby pushing the probe toward the hole to be measured.

[0010] In some embodiments, the rear end of the probe is inserted into the end plate;

[0011] During the test, if the rear end of the probe is flush with the end plate, the aperture of the hole to be tested is qualified; and / or

[0012] During the test, if the front end of the probe is flush with the rear end surface of the device to be tested, the aperture of the hole to be tested is qualified.

[0013] In some embodiments, a mounting groove is provided at the rear end of the guide block, the mounting groove is communicated with the guide hole, and the end plate closes the notch of the mounting groove;

[0014] The rear end of the probe is provided with a first small-diameter portion, a large-diameter portion, and a second small-diameter portion arranged in sequence from back to front. The diameter of the large-diameter portion is greater than the diameter of the guiding hole, and the large-diameter portion is located in the mounting groove. The front end of the elastic member abuts against the rear end face of the large-diameter portion, and the rear end of the elastic member abuts against the end plate.

[0015] In some embodiments, the diameter of the rear end of the guiding hole is greater than the diameter of the front end of the guiding hole. The rear end of the probe includes a first small-diameter portion, a large-diameter portion, and a second small-diameter portion arranged in sequence from back to front. The large-diameter portion is provided at the rear end of the guiding hole.

[0016] In some embodiments, the elastic member is a spring. The spring is sleeved on the first small-diameter portion, and the front end of the spring abuts against the rear end face of the large-diameter portion.

[0017] In some embodiments, the front end of the probe is stepped or tapered.

[0018] In some embodiments, a first detection hole is provided in a portion of the probe located in the guiding hole and arranged radially along the probe. A second detection hole is provided on the guiding block, and a light sensor is provided in the second detection hole. The positions of the first detection hole and the second detection hole are set such that when the aperture of the to-be-tested hole is qualified, the first detection hole is aligned with the second detection hole. Thus, it can be determined whether the aperture of the to-be-tested hole is qualified by detecting whether the first detection hole and the second detection hole are aligned through the light sensor.

[0019] In some embodiments, a first cutting surface is provided on the outer periphery of the probe, and a second cutting surface that cooperates with the first cutting surface is provided on the inner wall of the guiding hole to prevent the probe from rotating.

[0020] In some embodiments, the probe and the guiding hole are in clearance fit.

[0021] In some embodiments, there are multiple to-be-tested holes and multiple probes, and the probes correspond to the to-be-tested holes one by one.

[0022] The beneficial effects of the present application are as follows:

[0023] In the aperture detection device of the present application, a probe is inserted into the hole to be measured, and the aperture of the hole to be measured is judged by observing the insertion degree of the probe into the hole to be measured. The front end of the probe gradually increases in size from front to back. Therefore, when the probe is inserted into holes to be measured with different apertures, the insertion distances are different. Using this principle, it is determined whether the hole to be measured is qualified by observing whether the front end of the probe is flush with the rear end of the device to be measured or observing whether the rear end of the probe is flush with the end plate. It can also be judged synchronously by a light sensor. The above detection structure is simple, the detection method is convenient, and the proficiency requirement for the detection personnel is relatively low. Moreover, multiple probes can be set to detect multiple holes simultaneously, and the detection efficiency is high. Description of the Drawings

[0024] The drawings in the following description are only some embodiments. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts. In the drawings:

[0025] Figure 1 is a schematic diagram of the overall structure of the aperture detection device in the embodiment of the present application;

[0026] Figure 2 is a schematic diagram of the structure of the aperture detection device in another perspective in the embodiment of the present application;

[0027] Figure 3 is a schematic cross-sectional structure diagram of the aperture detection device in the embodiment of the present application;

[0028] Figure 4 is a schematic exploded structure diagram of the aperture detection device in the embodiment of the present application;

[0029] Figure 5 is a schematic diagram of the structure of the guide block in the embodiment of the present application;

[0030] Figure 6 is a schematic cross-sectional structure diagram of the guide block in the embodiment of the present application;

[0031] Figure 7 is a schematic diagram of the structure of the probe in the embodiment of the present application;

[0032] Figure 8 is a schematic cross-sectional structure diagram of the probe in the embodiment of the present application;

[0033] Figure 9 is a schematic diagram of the structure of the assembly of the aperture detection device and the device to be measured in the embodiment of the present application;

[0034] Figure 10 is a schematic cross-sectional structure diagram of the assembly of the aperture detection device and the device to be measured in the embodiment of the present application;

[0035] Figure 11This is a schematic structural diagram of the device under test in the embodiments of the present application.

[0036] In the accompanying drawings, the list of components represented by each reference numeral is as follows:

[0037] 10. Aperture detection device; 101. Device under test; 1011. Hole to be measured.

[0038] 110. Guide block; 111. Guide hole; 1111. Second cutting surface; 112. Second detection hole; 113. Installation groove.

[0039] 120. Probe; 121. First detection section; 122. Second detection section; 123. First detection hole; 124. First small-diameter part; 125. Large-diameter part; 126. Second small-diameter part; 127. First cutting surface.

[0040] 130. End plate.

[0041] 140. Elastic member.

[0042] 150. Optical sensor.

[0043] 20. Device under test; 201. Hole to be measured. Detailed implementation manners

[0044] Next, the technical solutions in the embodiments of the present application will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present application without creative efforts shall fall within the protection scope of the present application.

[0045] The embodiments of the present application provide an aperture detection device. As Figures 1 to 4 shown, the aperture detection device 10 includes a guide block 110, a probe 120, an end plate 130, and an elastic member 140. As Figure 4 shown, a guide hole 111 is provided on the guide block 110, and the guide hole 111 extends in the front-rear direction, and the front-rear direction is the Figure 4 shown X direction. As Figure 9 shown, the front end face A of the guide block 110 serves as a reference face for abutting against the device under test 20.

[0046] As Figure 3 shown, the probe 120 is inserted into the guide hole 111, and the probe 120 can slide back and forth in the guide hole 111. The front end of the probe 120 protrudes from the reference face A. As Figure 10As shown, the front end of the probe 120 can extend into the to-be-tested hole 201 of the device 20 to be tested. The front end of the probe 120 gradually increases in size from front to back, so that when the diameters of the to-be-tested holes 201 on the device 20 to be tested are different, the lengths of the probe 120 extending into the to-be-tested holes 201 are different, thereby realizing the detection of the hole diameter. As Figure 7 In the embodiment shown, the front end of the probe 120 is stepped, including a first detection section 121 with a smaller diameter and a second detection section 122 with a larger diameter. When the diameter of the to-be-tested hole 201 is small, only the first detection section 121 can extend into the to-be-tested hole 201, and when the diameter of the to-be-tested hole 201 is large, both the first detection section 121 and the second detection section 122 can extend into the to-be-tested hole 201. In other embodiments, the front end of the probe 120 can also be set to be conical, which can also make the lengths of the probe 120 extending into the to-be-tested holes 201 with different diameters different. The front end of the probe 120 refers to the end of the probe 120 close to the device 20 to be tested, and the end of the probe 120 far from the device 20 to be tested is the rear end of the probe 120.

[0047] As Figure 2 shown, the end plate 130 is covered on the rear end of the guiding block 110. As Figure 3 shown, the front end of the elastic member 140 abuts against the probe 120, and the rear end of the elastic member 140 abuts against the end plate 130, so that the elastic member 140 can push the probe 120 towards the to-be-tested hole 201 of the device 20 to be tested.

[0048] In an embodiment, as Figure 3 shown, the rear end of the probe 120 passes through the end plate 130. When detecting the hole diameter, refer to Figure 9 and Figure 10 , if the rear end of the probe 120 is flush with the end plate 130, it is determined that the diameter of the to-be-tested hole 201 is qualified; and / or if the front end of the probe 120 is flush with the rear end face B of the device 20 to be tested, it is determined that the diameter of the to-be-tested hole 201 is qualified. That is to say, it can be observed whether the hole diameter is qualified through the rear end face B of the device 20 to be tested and the end face C of the end plate 130. If the diameter of the to-be-tested hole 201 is qualified, as Figure 10 shown, the front end of the probe 120 is flush with the rear end face B of the device 20 to be tested, and the rear end of the probe 120 is flush with the end face C of the end plate 130. If the diameter of the to-be-tested hole 201 is small, the front end of the probe 120 will be stuck in the to-be-tested hole 201 and cannot expose the end face B of the device 20 to be tested, and the rear end of the probe 120 will protrude from the end plate 130; while if the diameter of the to-be-tested hole 201 is large, the front end of the probe 120 will pass through the to-be-tested hole 201 and protrude from the rear end face B of the device 20 to be tested, and the rear end of the probe 120 will not be able to expose the end plate 130.

[0049] It can also be determined through one of the end face B of the device under test 20 and the end plate 130. If the rear end of the probe 120 is not inserted into the end plate 130, it can be determined only through the end face B of the device under test 20; if the test hole 201 of the device under test 20 is not a through hole and the probe 120 cannot penetrate to the end face of the device under test 20, it is determined only through the end plate 130.

[0050] In addition, it is also possible to use the optical sensor 150 to detect whether the aperture of the test hole 201 is qualified. Combining Figure 3 and Figure 7 , a first detection hole 123 is provided in the portion of the probe 120 located in the guiding hole 111. As Figure 8 shown, the first detection hole 123 is arranged along the radial direction of the probe 120. Combining Figure 3 and Figure 6 , a second detection hole 112 is provided on the guiding block 110. The optical sensor 150 is arranged in the second detection hole 112. As Figure 10 shown, the positions of the first detection hole 123 and the second detection hole 112 are set such that when the aperture of the test hole 201 is qualified, the first detection hole 123 is aligned with the second detection hole 112. Thus, it can be determined whether the aperture of the test hole 201 is qualified by detecting whether the first detection hole 123 is aligned with the second detection hole 112 through the optical sensor 150. As Figure 10 shown, the optical sensor 150 is a pair of opposed optical fibers. The optical fibers passing through the second detection hole 112 and the first detection hole 123 convert the light into a value to judge the detection result. If the aperture of the test hole 201 is unqualified, either too large or too small, then the first detection hole 123 and the second detection hole 112 will be misaligned, and the light emitted from the emitting end of the opposed optical fibers cannot pass through, and the receiving end of the opposed optical fibers cannot receive the light. Then the detection system will prompt that the aperture is unqualified. Figure 10 shown, both the first detection hole 123 and the second detection hole 112 are through holes extending in the up and down direction (Z direction), and the two ends of the opposed optical fibers are respectively installed at the upper and lower ends of the second detection hole 112 of the guiding block 110.

[0051] When the above aperture detection device 10 is detecting, it is only necessary to hold the aperture detection device 10 and insert the probe 120 into the test hole 201. As Figure 10 shown, pressing the reference surface A of the guiding block 110 against the device under test 20 tightly, it is possible to determine whether the aperture is qualified by observing the rear end face B of the device under test 20 or observing the end face C of the end plate 130. The optical sensor 150 can also perform detection synchronously. The detection method is simple, the cost is low, and the operation is convenient. It is also possible to detect multiple test holes 201 at one time, and the detection efficiency is high.

[0052] As Figure 5As shown, an installation groove 113 is provided at the rear end of the guiding block 110, and the installation groove 113 communicates with the guiding hole 111. As Figure 2 shown, the end plate 130 closes the notch of the installation groove 113. As Figure 7 shown, at the rear end of the probe 120, a first small-diameter portion 124, a large-diameter portion 125, and a second small-diameter portion 126 are successively arranged from the rear to the front. The diameter of the large-diameter portion 125 is larger than that of the first small-diameter portion 124 and the second small-diameter portion 126, and the diameter of the large-diameter portion 125 is larger than the diameter of the guiding hole 111. As Figure 3 shown, the large-diameter portion 125 is located in the installation groove 113. The front end of the elastic member 140 abuts against the rear end face E of the large-diameter portion 125, and the rear end of the elastic member 140 abuts against the end plate 130. The provision of the installation groove 113 provides a space for the probe 120 to move back and forth. And the structure of arranging the installation groove 113 to install the probe 120 and cooperate with the end plate 130 to fix the probe 120 makes the installation of the probe 120 more convenient. The large-diameter portion 125 is provided on the probe 120 and the diameter of the large-diameter portion 125 is larger than the diameter of the guiding hole 111, so that the front end face D and the rear end face E of the large-diameter portion 125 can be used as limiting faces. As Figure 3 shown, the front end face D of the large-diameter portion 125 can prevent the probe 120 from being pushed out too far forward by the spring 140 and coming out of the guiding hole 111. The rear end face E can be used as an abutting face for abutting against the spring 140 and can also be used to prevent the probe 120 from moving too far backward.

[0053] In addition, continuing to refer to Figure 2 , setting the installation groove 113 can also install multiple probes 120 in one installation groove 113 at the same time. It only needs to set the installation groove 113 wider and communicate it with the guiding holes 111 of each probe 120.

[0054] In other alternative embodiments, the installation groove 113 may not be provided, and the large-diameter portion 125 of the probe 120 may not be accommodated through the installation groove 113. Instead, cancel the installation groove 113 on the guiding block and extend the guiding hole 111 backward to the rear end face of the guiding block 110, and make the diameter of the rear end of the guiding hole 111 larger to accommodate the large-diameter portion 125 of the probe 120. Set the diameter of the rear end of the guiding hole 111 to be larger than the diameter of the front end of the guiding hole 111. The large-diameter portion 125 of the probe 120 is accommodated at the rear end of the guiding hole 111. The diameter of the rear end of the guiding hole 111 is larger and can accommodate the large-diameter portion 125 of the probe 120. And a stepped surface will be formed at the place where the diameter of the guiding hole 111 changes to abut against and limit the front end face D of the large-diameter portion 125 of the probe 120.

[0055] As Figure 3As shown, since the gap between the large-diameter portions 125 of the two probes 120 in the Z direction is small, it is not suitable to adopt the solution of making the rear end of the guiding hole 111 larger and extending it to the rear end face of the guiding block 110 to accommodate the large-diameter portions 125 of the probes. Therefore, in the embodiment of the present application, as Figure 3 shown, a mounting groove 113 is selected to be provided to accommodate the large-diameter portions 125 of the probes 120.

[0056] Continuing to refer to Figure 3 , in the embodiment of the present application, the elastic member 140 is a spring. The spring 140 is sleeved on the first small-diameter portion 124 of the probe 120. The front end of the spring 140 abuts against the rear end face E of the large-diameter portion 125 of the probe 120, and the rear end of the spring 140 abuts against the end plate 130.

[0057] As Figure 7 shown, there is only one step in the stepped shape at the front end of the probe 120, which only includes a first detection section 121 and a second detection section 122 with different diameters. In other alternative embodiments, multiple steps can also be provided, including multiple detection sections.

[0058] In one embodiment, as Figure 7 shown, a first cut surface 127 is provided on the outer periphery of the probe 120. As Figure 5 shown, a second cut surface 1111 that cooperates with the first cut surface 127 is provided on the inner wall of the guiding hole 111. After the probe 120 penetrates into the guiding hole 111, the first cut surface 127 of the probe 120 cooperates with the second cut surface 1111 on the inner wall of the guiding hole 111, thereby preventing the probe 120 from rotating. If there is no cut surface, since the probe 120 is cylindrical, it will rotate. After the probe 120 rotates, the first detection hole 123 on the probe 120 will be misaligned with the second detection hole 112 on the guiding block 110, resulting in inaccurate detection results of the optical sensor 150.

[0059] In one embodiment, the probe 120 is in clearance fit with the guiding hole 111. Having a gap between the probe 120 and the guiding hole 111 can enable the probe 120 to have a floating space in the guiding hole 111. When there is a slight deviation in the position of the test hole 201 on the device under test 20, the probe 120 can also be inserted into the test hole 201.

[0060] In the embodiment of the present application, as Figure 9 shown, there are multiple test holes 201 on the device under test 20. Correspondingly, as Figure 9 shown, multiple probes 120 are also provided on the aperture detection device 10, and the probes 120 correspond to the test holes 201 one by one, so that multiple test holes 201 can be detected simultaneously.

[0061] Referring to Figure 10 , the detection steps of the aperture detection device 10 in the embodiment of the present application are as follows:

[0062] The inspector holds the aperture detection device 10 and takes 20 devices to be tested. Align the probe 120 with the hole 201 to be tested on the device 20 to be tested, and make the reference plane A of the guide block 110 of the aperture detection device 10 closely adhere to the device 20 to be tested;

[0063] Determination method 1: Observe whether the probe 120 completely passes through the guide hole 111 and the head of the probe 120 (the front end of the probe 120) is flush with the rear end face B of the device 20 to be tested. If the head of the probe 120 (the front end of the probe 120) is flush with the rear end face B of the device 20 to be tested, the aperture is qualified; if the head of the probe 120 (the front end of the probe 120) is not completely exposed to the flush state, it is determined that the aperture exceeds the lower limit size; if the head of the probe 120 (the front end of the probe 120) is completely exposed and exceeds the flush state, it is determined that the aperture exceeds the upper limit size;

[0064] Determination method 2: Observe whether the tail of the detection probe 120 (the rear end of the probe 120) is flush with the end face C of the end plate 130. If the tail of the probe 120 (the rear end of the probe 120) is flush with the end face C of the end plate 130, the aperture of the hole 201 to be tested is qualified; if the tail of the probe 120 (the rear end of the probe 120) is not completely exposed to the flush state, it is determined that the aperture exceeds the upper limit size; if the tail of the probe 120 (the rear end of the probe 120) is completely exposed and exceeds the flush state, it is determined that the aperture exceeds the lower limit size;

[0065] The above detection method can detect the apertures of multiple holes at the same time. For example, Figure 9 As shown, the sizes of 4 holes can be detected at the same time. For example, Figure 9 As shown, there are a total of 16 holes in four castings to be tested on a row of products, and they can be measured in 4 times.

[0066] In the description of the present application, unless otherwise clearly specified and limited, the terms "connected" and "connected" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or integrated; it can be directly connected, or indirectly connected through an intermediate medium. For those of ordinary skill in the art, the meanings of the above terms in the present application can be understood according to specific circumstances.

[0067] In the description of this embodiment, the orientation or positional relationship terms such as "upper", "lower", "front", "rear", etc. are based on the orientation or positional relationship shown in the drawings, and are only for the convenience of description and simplifying the operation, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation to the present application. The terms "first" and "second" are only used for distinction in description and have no special meaning.

[0068] The above-described embodiments merely represent the implementation manners of the present application. The description is relatively specific and detailed, but it should not be construed as a limitation on the scope of the invention patent. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present application, several modifications and improvements can still be made, and these all fall within the protection scope of the present application. Therefore, the protection scope of the patent of the present application shall be subject to the appended claims.

Claims

1. An aperture detection device, characterized in that: include: A guide block, wherein the guide block is provided with a guide hole extending in the front-to-back direction, and the front end surface of the guide block serves as a reference surface abutting against the device under test; A probe is inserted into the guide hole and can slide forward and backward, the front end of the probe protrudes from the reference surface, and the size of the front end of the probe gradually increases from front to back. During detection, the front end of the probe extends into the hole to be tested of the device to be tested; An end plate, which is covered at the rear end of the guide block; The elastic member has a front end abutting against the probe and a rear end abutting against the end plate, thereby pushing the probe toward the hole to be measured.

2. The aperture detection device according to claim 1, characterized in that: The rear end of the probe is inserted into the end plate; During the test, if the rear end of the probe is flush with the end plate, the aperture of the hole to be tested is qualified; and / or During the test, if the front end of the probe is flush with the rear end surface of the device to be tested, the aperture of the hole to be tested is qualified.

3. The aperture detection device according to claim 1, characterized in that: A mounting groove is provided at the rear end of the guide block, the mounting groove is communicated with the guide hole, and the end plate closes the notch of the mounting groove; The rear end of the probe is provided with a first small diameter portion, a large diameter portion and a second small diameter portion which are arranged in sequence from back to front, the diameter of the large diameter portion is larger than the diameter of the guide hole, and the large diameter portion is located in the mounting groove, the front end of the elastic member abuts against the rear end surface of the large diameter portion, and the rear end of the elastic member abuts against the end plate.

4. The aperture detection device according to claim 1, characterized in that: The diameter of the rear end of the guide hole is larger than the diameter of the front end of the guide hole. The rear end of the probe includes a first small diameter portion, a large diameter portion and a second small diameter portion arranged in sequence from back to front. The large diameter portion is arranged at the rear end of the guide hole.

5. The aperture detection device according to any one of claims 3 to 4, characterized in that: The elastic member is a spring, the spring is sleeved on the first small-diameter portion, and the front end of the spring abuts against the rear end surface of the large-diameter portion.

6. The aperture detection device according to claim 1, characterized in that: The front end of the probe is stepped or tapered.

7. The aperture detection device according to claim 1, characterized in that: The portion of the probe located in the guide hole is provided with a first detection hole arranged along the radial direction of the probe, the guide block is provided with a second detection hole, and the second detection hole is provided with a light sensor; the positions of the first detection hole and the second detection hole are set so that when the aperture of the hole to be measured is qualified, the first detection hole is aligned with the second detection hole, so that whether the aperture of the hole to be measured is qualified can be determined by detecting by the light sensor whether the first detection hole is aligned with the second detection hole.

8. The aperture detection device according to claim 7, characterized in that: The outer periphery of the probe is provided with a first cut surface, and the inner wall of the guide hole is provided with a second cut surface matching the first cut surface to prevent the probe from rotating.

9. The aperture detection device according to claim 1, characterized in that: The probe is loosely matched with the guide hole.

10. The aperture detection device according to claim 1, characterized in that: There are a plurality of holes to be measured and a plurality of probes, and the probes correspond to the holes to be measured one by one.

Images