Short-circuit protection testing device

Abstract

The application discloses a short circuit protection testing device, the short circuit protection testing device is connected to a first terminal and a second terminal of a chip to be tested, the short circuit protection testing device comprises a first clamping jaw, a second clamping jaw and a driving assembly, the first clamping jaw is used for fixing the first terminal, and the second clamping jaw is used for fixing the second terminal; and the driving assembly is used for driving the first clamping jaw and / or the second clamping jaw to move, so that the first clamping jaw and the second clamping jaw are close to each other, and the first terminal and the second terminal are in contact. The first terminal can be a positive terminal, the second terminal can be a negative terminal, the first terminal and the second terminal are in contact after electrification and then are short-circuited, and a short-circuit protection system of the chip can be tested. According to the short-circuit protection testing device, a testing environment is easy to build, operation is convenient, and the occupied equipment space is small.

Description

Technical Field

[0001] This application relates to the technical field of server testing, and particularly to a short-circuit protection testing device. Background Art

[0002] Currently, the method for detecting the short-circuit protection of a low-voltage high-current power chip is usually to connect the load line at the chip output end to an electronic load, and use the electronic load device to simulate the short-circuit state.

[0003] When a short-circuit protection test is required for a low-voltage high-current power chip after power-on, such as a DrMos chip in multi-phase parallel connection, the maximum normal operating current is usually several tens of amperes. At this time, only a single-channel electronic load can complete most of the output performance tests, such as power-on with load, ripple, dynamic, etc. However, when simulating a short circuit at the load end, a short-circuit current of up to hundreds of amperes will be generated. The power of a single electronic load is small. If only a single-channel electronic load is used, it will exceed its power limit, and exceeding the power limit of the electronic load may also cause inaccurate test results of the short-circuit current value. At the same time, repeated experiments also have the risk of damaging the electronic load. To avoid the above problems, multiple electronic loads need to be connected in parallel to reach the required power. However, connecting multiple electronic loads in parallel requires welding multiple load lines to the output capacitor of the power chip, which occupies a large amount of equipment space, and the test environment setup is complex and time-consuming, resulting in low test efficiency. Summary of the Utility Model

[0004] The short-circuit protection testing device provided by this application has a simple test environment setup and occupies less equipment space.

[0005] An embodiment of this application provides a short-circuit protection testing device, which is connected to the first terminal and the second terminal of the chip under test. The short-circuit protection testing device includes a first jaw, a second jaw, and a driving component. The first jaw is used to fix the first terminal, and the second jaw is used to fix the second terminal; the driving component is used to drive the first jaw and / or the second jaw to move, so that the first jaw and the second jaw approach each other, and the first terminal and the second terminal are in contact.

[0006] In the above embodiments, the driving assembly drives the first jaw to move, or drives the second jaw to move, or drives the first jaw and the second jaw to move simultaneously, so that the first jaw and the second jaw approach each other, enabling the first terminal and the second terminal to contact. The above first terminal and second terminal are the two metal terminals of the two load lines of the chip under test. The two load lines are respectively connected to the output capacitance of the chip under test and serve as the output terminals of the chip under test. Among them, the first terminal can be the positive terminal, and the second terminal can be the negative terminal. The jaws drive the metal terminals to slide, so that the two metal terminals contact each other, realizing a short circuit after the chip output terminal is powered on, thereby testing whether the short circuit protection system of the chip can work properly. Through external devices such as current probes and oscilloscopes, the short circuit current value and the short circuit current waveform can be detected. The short circuit protection test device of the present application is used to short-circuit the output terminal of the chip, thereby testing whether the short circuit protection system of the chip can work properly. Instead of using multiple parallel electronic loads to simulate a short circuit, its structure is simple, the test environment setup is simple, and the test efficiency is improved.

[0007] In a feasible embodiment, the driving assembly includes at least one electromagnetic induction mechanism. The electromagnetic induction mechanism includes an iron core, a coil, and a power source. The coil is wound around the outer wall of the iron core, and the coil is connected in series with the power source. The power source is used to supply power to the coil. The at least one electromagnetic induction mechanism is located between the first jaw and the second jaw. The driving assembly drives the jaws to move based on the principle of electromagnetic induction, with a simple structure and easy operation.

[0008] In a feasible embodiment, the short circuit protection test device further includes a base and a bracket. The bracket is fixedly installed on the base, the electromagnetic induction mechanism is installed on the bracket, the first jaw is slidably installed on the base, and the driving assembly further includes an attracting member. The attracting member is arranged on the side of the first jaw facing the electromagnetic induction mechanism. When the coil is energized, the electromagnetic induction mechanism attracts the attracting member, so that the first jaw approaches the second jaw. After the electromagnetic induction mechanism is powered on, a magnetic field is generated around the coil to attract the attracting member to approach it, thereby driving the first jaw to move.

[0009] In a feasible embodiment, the attracting member is a silicon steel sheet. The silicon steel material has strong magnetic conductivity, and the current in the coil can be appropriately reduced, which can reduce the power consumption of the device. Moreover, the silicon steel material is lighter in weight. Preparing the attracting member into a sheet further reduces the weight and can reduce the sliding resistance of the first jaw.

[0010] In a feasible embodiment, the base is provided with a first chute, and the bottom of the first jaw is provided with a first slider. The first slider is slidably installed in the first chute. The first slider is clamped in the first chute, which can prevent the first jaw from tilting or toppling during movement.

[0011] In a feasible implementation, the short - circuit protection test device further includes an elastic member. The elastic member is installed in the first chute and is located between the first jaw and the second jaw. When the electromagnetic induction mechanism is powered off, the spring is used to drive the first jaw away from the second jaw. After the short - circuit protection test is completed, the electromagnetic induction mechanism is powered off, and the elastic member can automatically separate the first jaw and the second jaw, improving the usability of the device.

[0012] In a feasible implementation, the driving device includes two electromagnetic induction mechanisms. The two electromagnetic induction mechanisms are arranged in mirror symmetry and are located between the first jaw and the second jaw. The two electromagnetic induction mechanisms can simultaneously drive the first jaw and the second jaw to move towards each other, thereby realizing the contact between the first terminal and the second terminal. The symmetrically arranged electromagnetic induction mechanisms make the forces on both sides of the device balanced and it is not easy to tip over.

[0013] In a feasible implementation, the short - circuit protection test device further includes a base. The second jaw is arranged in mirror symmetry with the first jaw on the base, making the device structure stable and the forces on the left and right sides balanced.

[0014] In a feasible implementation, both the first jaw and the second jaw have clamping portions. The clamping portion includes two side plates arranged oppositely, and the first terminal and the second terminal are clamped between the two side plates. The structure of the clamping portion is simple and easy to process. During operation, the first terminal and the second terminal can be slid between the two side plates to fix the metal terminals, which is convenient to operate.

[0015] In a feasible implementation, the first jaw is provided with a first groove, and the adsorbent is embedded in the first groove. The first groove provides an installation position for the adsorbent, reducing the situation of the adsorbent falling off and improving the reliability of the device. Description of the Drawings

[0016] Figure 1 Structural schematic diagram of the short - circuit protection test device provided by an embodiment of the present application;

[0017] Figure 2 Structural schematic diagram of the short - circuit protection test device provided by another embodiment of the present application;

[0018] Figure 3 Side view of the assembly of the first jaw and the base provided by an embodiment of the present application;

[0019] Figure 4 Side view of the assembly of the first jaw and the base provided by another embodiment of the present application;

[0020] Figure 5 Assembly diagram of the first chute, the first sliding rod, the elastic member and the first jaw provided by an embodiment of the present application;

[0021] Figure 6 Structural schematic diagram of a short - circuit protection test device provided by another embodiment of the present application.

[0022] Reference numerals:

[0023] 1 - First jaw; 2 - Second jaw; 01 - First terminal; 02 - Second terminal; 3 - Driving assembly; 31 - Iron core; 32 - Coil; 33 - Power supply; 4 - Base; 5 - Bracket; 34 - Adsorbing member; 41 - First chute; 411 - First sliding rod; 11 - First slider; 111 - Groove; 112 - Ball; 12 - Clamping portion; 121 - Side plate; 6 - Elastic member; 42 - Second chute; 7 - Switch. Detailed implementation manners

[0024] To make the objectives, technical solutions and advantages of the present application clearer, the following describes the present application in further detail with reference to the accompanying drawings by way of examples.

[0025] In the context of the increasing computing power requirements, the power of core computing devices such as GPUs / CPUs is also getting higher and higher. In order to ensure the reliable and stable operation of such devices, the application of low - voltage and high - current power chips on server motherboards is becoming more and more widespread. Low - voltage and high - current chips refer to power chips on server motherboards with an output voltage not exceeding 5V and a maximum load current that can reach hundreds of amperes, such as multi - phase power chips for powering CPUs, etc. The short - circuit protection ability of low - voltage and high - current power chips is one of the key indicators to ensure the reliable operation of the server, and it is also a key aspect focused on during the R & D and testing processes. The short - circuit protection ability after power - on is an important test index of the power chip, mainly used to judge whether the chip can be turned off in time to protect the backend circuit when a sudden load short - circuit occurs after the server is powered on. An electronic load is a common power chip test device, which can be used to simulate the backend load of the chip, can draw different magnitudes of current, and can also simulate a load short - circuit.

[0026] The specific method of using an electronic load to simulate a short - circuit state is as follows: After welding two load lines to the chip output capacitor terminal, connect the metal terminals of the load lines to the electronic load, then power on the server motherboard. During the test, short - circuit the electronic load, and then use a current clamp to detect the current value in the load line and display it on an oscilloscope. This method has the advantages of high safety factor and accurate test values.

[0027] However, when simulating a short circuit at the load end, a short-circuit current of hundreds of amperes will be generated. The power of a single electronic load is relatively small, and the short-circuit current it can usually withstand is about 20A. While the current of a multi-phase parallel power supply chip or protection chip during a short circuit can usually reach about 500A. If only a single-channel electronic load is used, it will exceed its power limit. Therefore, multiple electronic loads need to be connected in parallel to achieve the required power. Connecting multiple electronic loads in parallel requires welding multiple load lines to the output capacitor of the power supply chip, which occupies a large amount of device space, and the test environment setup is complex and time-consuming, resulting in low test efficiency. To solve the above problems, this application provides a short-circuit protection test device to replace multiple parallel-connected electronic loads in the prior art to achieve a short circuit at the output end of the chip, occupying less device space and enabling a quick setup of the test environment.

[0028] Figure 1 The structural schematic diagram of the short-circuit protection test device provided by an embodiment of this application is shown as Figure 1 shown. The short-circuit protection test device provided by the embodiment of this application is connected to the first terminal 01 and the second terminal 02 of the chip under test. The short-circuit protection test device includes a first jaw 1, a second jaw 2, and a driving component 3. Among them, the first jaw 1 is used to fix the first terminal 01, and the second jaw 2 is used to fix the second terminal 02. The driving module is used to drive the first jaw 1 and / or the second jaw 2 to move, so that the first jaw 1 and the second jaw 2 approach each other, enabling the first terminal 01 and the second terminal 02 to contact.

[0029] In the above embodiment, the driving component 3 drives the first jaw 1 to move, or drives the second jaw 2 to move, or drives the first jaw 1 and the second jaw 2 to move simultaneously, so that the first jaw 1 and the second jaw 2 approach each other, enabling the first terminal 01 and the second terminal 02 to contact. The above first terminal 01 and second terminal 02 are the two metal terminals of two load lines. The two load lines are respectively connected to the output capacitor of the chip under test and serve as the output end of the chip under test. Among them, the first terminal 01 can be the positive terminal, and the second terminal 02 can be the negative terminal. The jaws drive the metal terminals to slide, so that the two metal terminals contact, to achieve a short circuit after the chip output end is powered on, thereby testing whether the short-circuit protection system of the chip works properly. Through external devices such as current probes and oscilloscopes, the short-circuit current value and short-circuit current waveform can be detected. The short-circuit protection test device of this application can short-circuit the output end of the chip, thereby testing whether the short-circuit protection system of the chip can work properly. It replaces multiple parallel-connected electronic loads to simulate a short circuit, with a simple structure and a simple test environment setup, improving the test efficiency.

[0030] Figure 2 The structural schematic diagram of the short-circuit protection test device provided by another embodiment of this application is shown as Figure 2As shown, in one embodiment, the above-mentioned driving assembly includes at least one electromagnetic induction mechanism, which includes an iron core 31, a coil 32, and a power source 33. The coil 32 is wound around the outer wall of the iron core 31, and the coil 32 is connected in series with the power source 33. The power source 33 is used to supply power to the coil 32 so that the energized coil 32 generates a magnetic field.

[0031] In one embodiment, the short-circuit protection test device further includes a base 4 and a bracket 5. The bracket 5 is fixedly installed on the base 4, and the electromagnetic induction mechanism is installed on the bracket 5. Specifically, the above-mentioned iron core 31 is a cylindrical ferrite, and the iron core 31 is fixedly connected to the bracket 5. Its length direction is parallel to the base 4 and extends towards the first jaw 1. The iron core 31 is spaced from the base 4 by a preset distance. The first jaw 1 is slidably installed on the base 4. The driving assembly further includes an adsorbent 34, which is arranged on the side of the first jaw 1 facing the electromagnetic induction mechanism and is opposite to the electromagnetic induction mechanism in the horizontal direction. When the coil 32 is energized, the electromagnetic induction mechanism generates a magnetic field to attract the adsorbent 34, so that the first jaw 1 moves towards the electromagnetic induction mechanism, realizing the mutual approach of the first jaw 1 and the second jaw 2. The driving assembly of the present application drives the jaw to move based on the principle of electromagnetic induction. Specifically, after the coil 32 is energized, an electromagnetic field is generated around the coil 32, and the iron core 31 is used to enhance the magnetic field, so that the first jaw 1 approaches the coil 32.

[0032] In one embodiment, the above-mentioned adsorbent 34 can be a silicon steel sheet, and the silicon steel material has strong magnetic conductivity. And the adsorbent 34 is prepared into a sheet shape, which can reduce the overall weight of the first jaw 1, thereby reducing the friction between the first jaw 1 and the base 4. The adsorbent 34 can also be made of other ferromagnetic materials, and the present application does not make specific limitations.

[0033] The above-mentioned base 4 can be made of non-magnetic materials such as epoxy resin and nylon. The specific cylindrical ferrite can be made of magnetite, which is used to enhance the magnetic field of the coil 32, so that the electromagnetic induction mechanism can generate a strong adsorption force on the silicon steel sheet with a small current. The magnetite material has a high magnetic permeability and is easily magnetized. Of course, other types of ferromagnetic materials can also be used to replace magnetite, and the present application does not make specific limitations. The above-mentioned coil 32 is a copper enameled wire, and the two ends of the coil 32 are respectively connected to the positive and negative electrodes of the power source 33.

[0034] Figure 3 It is a side view of the assembly of the first jaw and the base provided by an embodiment of the present application. Please combine Figure 2 and Figure 3, in one embodiment, the base 4 is provided with a first chute 41, and the bottom of the first jaw 1 is provided with a first slider 11 which is slidably mounted in the first chute 41. The first chute 41 serves as a guide. When the electromagnetic induction mechanism is energized to attract the adsorbent 34, the first jaw 1 can move along the first chute 41. The first slider 11 is clamped in the first chute 41 to prevent the first jaw 1 from tilting or toppling during movement.

[0035] Figure 4 The side view of the assembly of the first jaw and the base provided by another embodiment of the present application. To reduce the sliding friction between the first jaw 1 and the base 4, as Figure 4 shown, in one embodiment, rollers or balls 112 may further be provided at the bottom of the first slider 11, and the rollers or balls 112 are located between the first chute 41 and the first slider 11. Specifically, when preparing the first slider 11, a groove 111 may be provided at the bottom of the first slider 11 so that the rollers or balls 112 are embedded in the groove 111, converting the sliding friction between the first slider 11 and the first chute 41 into rolling friction, thereby reducing the resistance. The above-mentioned rollers or balls may be made of non-ferromagnetic materials, such as copper, aluminum, etc.

[0036] Please continue to refer to Figure 2 , after the short-circuit protection test is completed, in order to automatically separate the first jaw 1 and the second jaw 2, the short-circuit protection test device may further include an elastic member 6, and the elastic member 6 may be a spring. The spring is installed in the first chute 41 and is located between the first jaw 1 and the second jaw 2. When the electromagnetic induction mechanism is energized, the first jaw 1 moves along the first chute 41 and approaches the second jaw 2. During this process, the spring is continuously compressed by the first slider 11 to generate a pre-tightening force. When the electromagnetic induction mechanism is de-energized, the suction force of the electromagnetic induction mechanism on the adsorbent 34 disappears. At this time, the spring is released and pushes the first jaw 1 away from the second jaw 2, so that the first jaw 1 is separated from the second jaw 2, and further the first terminal 01 is separated from the second terminal 02.

[0037] It should be noted that the above-mentioned pre-tightening force is less than the suction force. The elastic member 6 is made of non-ferromagnetic materials, such as copper, to avoid being adsorbed by the electromagnetic induction mechanism.

[0038] Figure 5 The assembly drawing of the first chute, the first slide bar, the elastic member and the first jaw provided by an embodiment of the present application, as Figure 5 shown, in one embodiment, a first slide bar 411 may further be provided in the first chute 41, and the elastic member 6 is sleeved on the outer periphery of the first slide bar 411. A through hole is drilled in the first slider 11 at the bottom of the first jaw 1, and the first slider 11 is sleeved on the outer wall of the first slide bar 411. The first slide bar 411 can provide guidance for both the first slider 11 and the elastic member 6 at the same time.

[0039] In some of the above embodiments, the second jaw 2 can be fixedly installed on the base 4. The driving assembly includes an electromagnetic induction mechanism, and this electromagnetic induction mechanism only drives the first jaw 1 to slide along the first chute 41, so that the first jaw 1 approaches the second jaw 2, thereby making the first terminal 01 gradually approach the second terminal 02 until they contact to form a short circuit.

[0040] Figure 6 The structural schematic diagram of the short-circuit protection test device provided by another embodiment of the present application. As Figure 6 shown, in other embodiments, the short-circuit test protection device may further include two electromagnetic induction mechanisms, and the two electromagnetic induction mechanisms are arranged in mirror symmetry. Two coils 32 are symmetrically wound around two iron cores 31, so that the two electromagnetic induction mechanisms generate magnetic fields with opposite directions. The second jaw 2 is slidably installed on the base. The two electromagnetic induction mechanisms respectively drive the first jaw 1 and the second jaw 2 to move towards each other.

[0041] It should be noted that the above two electromagnetic induction mechanisms can share a coil 32. This coil 32 can be divided into two segments, and the winding directions of the two segments are different to generate magnetic fields with different directions. The two electromagnetic induction mechanisms can also share an iron core 31 and share a power supply 33 to simplify the structure.

[0042] In one embodiment, the base 4 is further provided with a second chute 42, and the second jaw 2 is slidably arranged in the second chute 42. The second jaw 2 has the same structure as the first jaw 1, and the second jaw 2 and the first jaw 1 are arranged in mirror symmetry on the base 4. After the device is powered on, the two jaws move towards each other, so that the first terminal 01 and the second terminal 02 are in contact.

[0043] In one embodiment, both the above-mentioned first jaw 1 and second jaw 2 have a clamping portion 12, and this clamping portion 12 includes two side plates 121 arranged oppositely, and the metal terminal is clamped between the two side plates 121.

[0044] In one embodiment, a first groove (not shown in the figure) is provided on one side of the above-mentioned first jaw 1 facing the second jaw 2, and the adsorbent 34 is embedded in the first groove. A second groove (not shown in the figure) is provided on one side of the second jaw 2 facing the first jaw 1, and the adsorbent 34 is also provided in the second groove.

[0045] In one embodiment, the above-mentioned power supply 33 may include a battery compartment and a battery. The battery compartment is made of epoxy resin material, and the positive and negative plates are installed inside.

[0046] In one embodiment, the short-circuit protection test device further includes a switch 7. The switch 7 is connected in series with the coil 32 and the power supply 33 and is used to control the start and stop of the short-circuit protection test device, improving the usability of the short-circuit protection test device. Closing the switch 7 energizes the coil 32. After the first terminal 01 and the second terminal 02 come into contact, a short circuit is triggered. After the short circuit is triggered, a large current is generated. The current clamp is clamped on the load line and the waveform of the short-circuit current is displayed on the oscilloscope.

[0047] In other embodiments, in addition to being an electromagnetic induction mechanism, the above-mentioned driving assembly 3 can also be other forms of mechanisms, such as: a ball screw mechanism driven by a motor, a lead screw mechanism driven by a motor, etc., to drive the first jaw 1 and / or the second jaw 2 to move. The lead screw or the lead rod (not shown in the figure) can be installed on the base and connected to the output shaft of the motor. The first slider 11 at the bottom of the first jaw 1 is sleeved on the outer wall of the lead screw or the lead rod. The motor drives the lead screw or the lead rod to rotate to drive the first slider 11 to perform linear movement, thereby driving the first jaw 1 to move. The above-mentioned ball screw and lead rod are prior arts, and their specific structures are not described in detail in this application.

[0048] Compared with the electronic load used in the existing short-circuit protection test device for server low-voltage high-current power supply chips, the short-circuit protection test device of the present application can replace multiple parallel electronic loads in the short-circuit protection test, accurately and safely achieve chip short circuit and complete the short-circuit protection performance test, without using a multi-channel electronic load or welding multiple load lines, greatly reducing the space occupied by the device and optimizing and improving the test efficiency.

[0049] In the description of the present application, it should be noted that the orientation or positional relationship indicated by the terms "upper", "lower", "left", "right", etc. is based on the orientation or positional relationship shown in the drawings. It is only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation to the present application.

[0050] Obviously, those skilled in the art can make various changes and modifications to the present application without departing from the spirit and scope of the present application. Thus, if these modifications and variations of the present application fall within the scope of the claims of the present application and their equivalent technologies, the present application is also intended to include these changes and modifications.

Claims

1. A short circuit protection test device, connected to a first terminal and a second terminal of a chip to be tested, characterized in that: The invention comprises a first clamping jaw, a second clamping jaw and a driving assembly, wherein the first clamping jaw is used to fix a first terminal, and the second clamping jaw is used to fix a second terminal; the driving assembly is used to drive the first clamping jaw and / or the second clamping jaw to move, so that the first clamping jaw and the second clamping jaw are close to each other, so that the first terminal and the second terminal are in contact.

2. The short circuit protection test device according to claim 1, characterized in that: The driving component includes at least one electromagnetic induction mechanism, which includes an iron core, a coil and a power supply. The coil is wound around the outer wall of the iron core, and the coil is connected in series with the power supply. The power supply is used to power the coil. The at least one electromagnetic induction mechanism is located between the first clamp and the second clamp.

3. The short circuit protection test device according to claim 2, characterized in that: It also includes a base and a bracket, the bracket is fixedly installed on the base, the electromagnetic induction mechanism is installed on the bracket, the first clamp is slidably installed on the base, and the driving component also includes an adsorption component, which is arranged on the side of the first clamp facing the electromagnetic induction mechanism. When the coil is energized, the electromagnetic induction mechanism attracts the adsorption component.

4. The short circuit protection test device according to claim 3, characterized in that: The adsorption member is a silicon steel sheet.

5. The short circuit protection test device according to claim 3, characterized in that: The base is provided with a first slide groove, the bottom of the first clamping jaw is provided with a first sliding block, and the first sliding block is slidably installed in the first slide groove.

6. The short circuit protection test device according to claim 5, characterized in that: It also includes an elastic member, which is installed in the first sliding groove and located between the first clamping jaw and the second clamping jaw. When the electromagnetic induction mechanism is powered off, the elastic member is used to drive the first clamping jaw away from the second clamping jaw.

7. The short circuit protection test device according to claim 2, characterized in that: The driving device comprises two electromagnetic induction mechanisms, which are arranged in a mirror-symmetrical manner and are located between the first clamping jaw and the second clamping jaw.

8. The short circuit protection test device according to any one of claims 1 to 7, characterized in that: It also includes a base, and the second clamping jaw is arranged on the base in a mirror-symmetrical manner with the first clamping jaw.

9. The short circuit protection test device according to claim 1, characterized in that: The first clamping claw has a clamping portion, and the clamping portion includes two side plates arranged opposite to each other, and the first terminal is clamped between the two side plates.

10. The short circuit protection test device according to claim 3, characterized in that: The first clamping jaw is provided with a first groove, and the adsorption component is embedded in the first groove.

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