Nand Flash storage chip test fixture
By designing a NAND Flash storage chip test fixture including detection slots, detection contacts, placement plates, outer tooth sleeves and pressing plates, the inconvenient and laborious problems of existing test fixtures during docking and removal are solved, and higher connection accuracy and detection efficiency are achieved.
Patent Information
- Application Number
- CN202421540501.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-07-02
- Publication Date
- 2025-06-17
- Estimated Expiration
- 2034-07-02
AI Technical Summary
The existing NAND Flash memory chip test fixtures are inconvenient and laborious during docking and removal, which affects the detection efficiency.
A NAND Flash storage chip test fixture including a detection slot, detection contact, a placement board, an outer tooth sleeve and a pressing board is designed. Through the coordination of the cogging belt and the steering tooth column, the pin and the detection contact are accurately positioned and intimately contacted, ensuring the stability and accuracy of the NAND Flash chip during vertical installation and removal.
Through precise positioning and stable clamping, the connection accuracy and detection efficiency of the test fixture are significantly improved, pin deformation is avoided, and the chip is simplified.
Smart Images
Figure CN222995102U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field, and particularly relates to a test fixture for a Nand Flash storage chip. Background Art
[0002] The NAND Flash memory chip is an efficient non-volatile storage solution, especially suitable for large data volume storage requirements. Compared with NOR Flash, the NAND chip achieves higher storage capacity and lower cost through a high-density storage array. Its data access is performed in units of blocks rather than single bytes, which makes NAND faster in sequential read and write operations and suitable for storing large amounts of continuous data such as music, pictures, and videos. The internal structure of the NAND Flash chip contains multiple dies, and each die includes multiple planes, such a design supports its large-capacity characteristics. NAND Flash is widely used in solid-state drives (SSDs), memory cards, embedded systems, etc., and is one of the indispensable technologies in the contemporary digital storage field. The fixture for the NAND Flash memory chip is a precision tool specifically designed for testing, programming, or processing NAND Flash chips. When detecting the NAND Flash memory chip, it is inconvenient and laborious to dock and remove the chip from the fixture. Therefore, this application provides a test fixture for a Nand Flash storage chip. Content of the Utility Model
[0003] To solve the above technical problems, the utility model proposes a test fixture for a Nand Flash storage chip that can mutually position the pins and the detection contacts and can vertically load and unload the NandFlash chip.
[0004] The technical solution of the utility model is realized as follows:
[0005] A test fixture for a Nand Flash storage chip includes a device main body, a connection slot, and a pressing plate. Among them, a detection slot is opened inside the device main body, detection contacts are fixedly connected inside the detection slot, a movable slot is opened inside the device main body, a connection base is fixedly connected to the outside of the device main body, a toothed belt is movably connected inside the movable slot, the connection slot is fixedly connected to the outside of the toothed belt, an outer toothed sleeve is movably connected to the outside of the connection base, a central rotating shaft is movably connected inside the outer toothed sleeve, an extension plate is fixedly connected to the outside of the central rotating shaft, the pressing plate is movably connected to the outside of the extension plate, a NandFlash chip is movably connected inside the detection slot, pins are fixedly connected to the outside of the NandFlash chip, and a placement plate is movably connected inside the detection slot.
[0006] Furthermore, symmetric racks are fixedly connected inside the movable slot. The symmetric racks are meshed with the toothed groove belt. There are two groups of symmetric racks symmetrically distributed inside the movable slot, and there is a blank in the middle of the toothed groove belt.
[0007] Furthermore, an inner layer toothed shaft is fixedly connected to the outside of the central rotating shaft. The inner layer toothed shaft is movably connected to the inside of the outer layer toothed sleeve. A connecting column is fixedly connected to the outside of the extension plate, and a parallel limiting convex is fixedly connected to the outside of the extension plate.
[0008] Furthermore, a steering toothed column is meshed between the inner layer toothed shaft and the outer layer toothed sleeve. There are multiple groups of steering toothed columns evenly distributed on the outside of the inner layer toothed shaft.
[0009] Furthermore, the connecting column is movably connected to the pressing plate, and the parallel limiting convex is movably connected to the pressing plate. A pressing platform is fixedly connected to the outside of the pressing plate, and the pressing platforms are mutually clamped to form a circle.
[0010] Furthermore, the outer layer toothed sleeve is meshed with the toothed groove belt, and the placement plate is fixedly connected to both sides of the toothed groove belt at the same time.
[0011] Furthermore, there are multiple groups of pins symmetrically distributed on the outside of the NandFlash chip. The pins are movably connected to the detection contacts. There are multiple groups of detection contacts symmetrically distributed inside the detection slot. Connecting grooves are formed on the outside of the placement plate. There are multiple groups of connecting grooves symmetrically distributed on the outside of the connecting grooves. The connecting grooves are movably connected to the detection contacts, and the placement plate is movably connected to the NandFlash chip.
[0012] Furthermore, there are two groups of movable slots symmetrically distributed inside the device body, and there are two groups of connecting bases symmetrically distributed outside the movable slots.
[0013] The utility model has the following beneficial effects:
[0014] 1. By setting the detection slot, the detection contacts and the placement plate, the device can position the pins and the detection contacts with each other and make them contact tightly correspondingly, and then the path detection can be carried out, greatly improving the connection accuracy of the device.
[0015] 2. By setting the placement plate, the outer layer toothed sleeve and the pressing plate, during the loading and unloading process of the NandFlash chip, it is controlled by the placement plate, and the contact degree between the pins and the detection contacts is controlled by the connecting groove, preventing the pins from deforming due to excessive contact between the two. At the same time, the NandFlash chip can be vertically loaded and unloaded, which is convenient for detection and replacement, greatly improving the detection efficiency of the device. Description of the Drawings
[0016] Figure 1It is a schematic diagram of the overall structure of the present utility model;
[0017] Figure 2 It is an anatomical diagram of the internal structure of the present utility model;
[0018] Figure 3 It is a schematic diagram of the internal structure of the present utility model;
[0019] Figure 4 It is a schematic diagram of a partial structure of the present utility model;
[0020] Figure 5 It is of the present utility model Figure 3 a partial structure schematic diagram in;
[0021] Figure 6 It is of the present utility model Figure 5 a partial structure explosion diagram in;
[0022] Figure 7 It is of the present utility model Figure 5 a partial structure enlarged diagram in;
[0023] Wherein: 1. Equipment main body; 2. Detection groove; 3. Activity groove; 4. Detection contact; 5. Connection base; 6. Symmetric rack; 7. Tooth groove belt; 8. Placement plate; 9. Connection groove; 10. Central rotating shaft; 11. Inner layer tooth shaft; 12. Outer layer tooth sleeve; 13. Steering tooth column; 14. Extension plate; 15. Connection column; 16. Parallel limit convex; 17. NandFlash chip; 18. Pin; 19. Pressing plate; 20. Pressing table. Specific implementation manner
[0024] Next, the technical solutions in the embodiments of the present utility model will be described clearly and completely. Obviously, the described embodiments are only a part of the embodiments of the present utility model, rather than all the embodiments. Based on the embodiments in the present utility model, all other embodiments obtained by those of ordinary skill in the art without making creative efforts belong to the scope of protection of the present utility model.
[0025] Please refer to Figures 1 to 7As shown in the figure, a test fixture for a Nand Flash storage chip provided by the present utility model includes a device main body 1, a connection slot 9, and a pressing plate 19. A detection slot 2 is provided inside the device main body 1, and detection contacts 4 are fixedly connected inside the detection slot 2. An activity slot 3 is provided inside the device main body 1, and a connection base 5 is fixedly connected to the outside of the device main body 1. A toothed belt 7 is movably connected inside the activity slot 3, and the connection slot 9 is fixedly connected to the outside of the toothed belt 7. An outer toothed sleeve 12 is movably connected to the outside of the connection base 5, and a central rotating shaft 10 is movably connected inside the outer toothed sleeve 12. An extension plate 14 is fixedly connected to the outside of the central rotating shaft 10, and the pressing plate 19 is movably connected to the outside of the extension plate 14. A NandFlash chip 17 is movably connected inside the detection slot 2, and pins 18 are fixedly connected to the outside of the NandFlash chip 17. An installation plate 8 is movably connected inside the detection slot 2;
[0026] Symmetric toothed rods 6 are fixedly connected inside the activity slot 3. The symmetric toothed rods 6 are meshed with the toothed belt 7. There are two groups of symmetric toothed rods 6 and they are symmetrically distributed inside the activity slot 3. There is a blank in the middle of the toothed belt 7. An inner toothed shaft 11 is fixedly connected to the outside of the central rotating shaft 10. The inner toothed shaft 11 is movably connected inside the outer toothed sleeve 12. A connecting column 15 is fixedly connected to the outside of the extension plate 14. A parallel limiting convex 16 is fixedly connected to the outside of the extension plate 14. A steering toothed column 13 is meshed between the inner toothed shaft 11 and the outer toothed sleeve 12. There are multiple groups of steering toothed columns 13 and they are evenly distributed on the outside of the inner toothed shaft 11.
[0027] Specifically, before detecting the Nand Flash storage chip, hold the pressing platform 20 and drive the pressing plate 19 to move horizontally and expand to both sides of the device main body 1. During the movement of the pressing plate 19, the central rotating shaft 10 outside the extension plate 14 is driven to rotate. The rotation of the central rotating shaft 10 drives the rotation of the inner toothed shaft 11. The inner toothed shaft 11 drives the rotation of the steering toothed column 13. By means of the steering toothed column 13, the outer toothed sleeve 12 is driven to rotate in the same direction as the inner toothed shaft 11. The rotation of the outer toothed sleeve 12 drives the toothed belt 7 to move vertically upward. The movement of the toothed belt 7 drives the installation plate 8 to lift. During the above process, ensure that the installation plate 8 moves in the same direction and synchronously with the pressing plate 19. When repeating the above operation to close the device, force can be applied to the pressing plate 19 through the pressing platform 20, thereby pressing and fixing the NandFlash chip 17, greatly improving the connection accuracy of the device.
[0028] Furthermore, the connecting column 15 is movably connected to the pressing plate 19, the parallel limiting convex 16 is movably connected to the pressing plate 19, an external fixing connection of the pressing plate 19 is provided with a pressing platform 20, the pressing platforms 20 are snap-connected to form a circle, the outer layer gear sleeve 12 is meshed and connected with the tooth groove belt 7, the placement plate 8 is fixedly connected to both sides of the tooth groove belt 7 at the same time, the number of the pins 18 is multiple groups and symmetrically distributed outside the NandFlash chip 17, the pins 18 are movably connected to the detection contacts 4, the number of the detection contacts 4 is multiple groups and symmetrically distributed inside the detection groove 2, a connection groove 9 is provided outside the placement plate 8, the number of the connection grooves 9 is multiple groups and symmetrically distributed outside the connection groove 9, the connection groove 9 is movably connected to the detection contacts 4, the placement plate 8 is movably connected to the NandFlash chip 17, the number of the movable grooves 3 is two groups and symmetrically distributed inside the device body 1, and the number of the connection bases 5 is two groups and symmetrically distributed outside the movable grooves 3.
[0029] By making the above settings, after the device is unfolded oppositely, the Nand Flash storage chip to be detected is placed outside the placement plate 8. During this process, it is necessary to ensure that the orientation of the pins 18 is aligned with the detection contacts 4, and then repeating the above operation can send the NandFlash chip 17 back into the detection groove 2. During the descending process of the placement plate 8, the detection contacts 4 protrude through the connection groove 9, and the pins 18 are in corresponding contact with the detection contacts 4 for path detection. Under the positioning and clamping of the detection groove 2 and the pressing plate 19, it is ensured that the pins 18 and the detection contacts 4 can be accurately docked, greatly improving the connection accuracy of the device.
[0030] The above are only the preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present invention shall be included within the protection scope of the present invention.
Claims
1. A Nand Flash storage chip test fixture, characterized in that: The device comprises a device body (1), a connection slot (9) and a pressing plate (19), wherein a detection slot (2) is provided inside the device body (1), a detection contact (4) is fixedly connected inside the detection slot (2), a movable slot (3) is provided inside the device body (1), a connection base (5) is fixedly connected to the outside of the device body (1), a toothed belt (7) is movably connected inside the movable slot (3), the connection slot (9) is fixedly connected to the outside of the toothed belt (7), and the outside of the connection base (5) is fixedly connected to the outside of the toothed belt (7). An outer gear sleeve (12) is movably connected, the outer gear sleeve (12) is internally movably connected to a central shaft (10), the central shaft (10) is externally fixedly connected to an extension plate (14), the pressing plate (19) is movably connected to the outside of the extension plate (14), the detection slot (2) is internally movably connected to a NandFlash chip (17), the NandFlash chip (17) is externally fixedly connected to a pin (18), and the detection slot (2) is internally movably connected to a placement plate (8).
2. A Nand Flash storage chip test fixture according to claim 1, characterized in that: A symmetrical toothed rod (6) is fixedly connected inside the movable groove (3), and the symmetrical toothed rod (6) is meshedly connected with a toothed belt (7). There are two groups of symmetrical toothed rods (6) which are symmetrically distributed inside the movable groove (3), and a blank is left in the middle of the toothed belt (7).
3. A Nand Flash storage chip test fixture according to claim 1, characterized in that: The inner gear shaft (11) is fixedly connected to the outside of the central shaft (10), and the inner gear shaft (11) is movably connected to the inside of the outer gear sleeve (12). The extension plate (14) is fixedly connected to the outside of the connecting column (15), and the extension plate (14) is fixedly connected to the outside of the parallel limiting protrusion (16).
4. A Nand Flash storage chip test fixture according to claim 3, characterized in that: A steering gear column (13) is meshedly connected between the inner gear shaft (11) and the outer gear sleeve (12), and the steering gear columns (13) are provided in multiple groups and are evenly distributed outside the inner gear shaft (11).
5. A Nand Flash storage chip test fixture according to claim 3, characterized in that: The connecting column (15) is movably connected to the pressing plate (19), the parallel limiting protrusion (16) is movably connected to the pressing plate (19), the pressing plate (19) is externally fixedly connected to a pressing platform (20), and the pressing platforms (20) are mutually clamped into a circle.
6. A Nand Flash storage chip test fixture according to claim 5, characterized in that: The outer gear sleeve (12) is meshedly connected to the toothed belt (7), and the placement plate (8) is fixedly connected to the toothed belts (7) on both sides at the same time.
7. A Nand Flash storage chip test fixture according to claim 5, characterized in that: The pins (18) are provided in a plurality of groups and are symmetrically distributed outside the NandFlash chip (17); the pins (18) are movably connected to the detection contacts (4); the detection contacts (4) are provided in a plurality of groups and are symmetrically distributed inside the detection slot (2); a connection slot (9) is provided outside the placement plate (8); the connection slots (9) are provided in a plurality of groups and are symmetrically distributed outside the connection slot (9); the connection slots (9) are movably connected to the detection contacts (4); and the placement plate (8) is movably connected to the NandFlash chip (17).
8. A Nand Flash storage chip test fixture according to claim 7, characterized in that: The movable grooves (3) are in two groups and are symmetrically distributed inside the device body (1); the connecting bases (5) are in two groups and are symmetrically distributed outside the movable grooves (3).