Bit error rate testing structure
By designing a bit error rate testing structure including pulse mode generator and bit error detector, the problems of slow testing speed and limited bit error capture in the existing test methods are solved, and more accurate bit error rate statistics and more in-depth bit error analysis are achieved, which improves system performance and development efficiency.
Patent Information
- Application Number
- CN202422697241.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-06
- Publication Date
- 2025-06-17
- Estimated Expiration
- 2034-11-06
AI Technical Summary
The existing bit error rate testing methods have problems such as slow testing speed, limited error capture, inadequate adaptation to dynamic environments and inaccurate error statistics.
A bit error rate testing structure is designed, including a pulse mode generator, transmitter, receiver, oscilloscope and error detector, which realizes an automated and efficient testing process by generating specific data modes and using high-precision detectors.
It improves the accuracy of bit error rate statistics and the depth of bit error analysis, shortens the test time, improves development efficiency, optimizes system performance, and improves statistical accuracy at low bit error rate.
Smart Images
Figure CN222996565U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of bit error rate testing, in particular to a bit error rate testing structure. Background Art
[0002] The bit error rate is a key indicator for measuring the number of error bits in a digital communication system. It represents the proportion of error bits among the total number of bits transmitted within a certain period of time. The bit error rate is also one of the important indicators for measuring the transmission accuracy and reliability of a data communication system. By understanding the knowledge of the definition, calculation formula, influencing factors, applications and significance of the bit error rate, we can better understand and evaluate the performance and quality of a communication system.
[0003] Currently, during the bit error rate testing process:
[0004] 1. Slow testing speed: Traditional testing methods require long-time data transmission to detect bit errors;
[0005] 2. Limited bit error capture: Bit errors or special defects of the system under extreme conditions;
[0006] 3. Inadaptability to dynamic environments: Testing is usually carried out in an ideal laboratory environment, ignoring the influence of the actual environment;
[0007] 4. Inaccurate bit error statistics: Especially in the case of extremely low bit error rates, the statistical accuracy is poor. Content of the Utility Model
[0008] The purpose of the utility model is to solve the disadvantages existing in the prior art, and to propose a bit error rate testing structure.
[0009] In order to achieve the above purpose, the utility model adopts the following technical scheme:
[0010] A bit error rate testing structure includes a host computer, a pulse pattern generator PPG is connected to one side of the host computer, a transmitting end is connected to one side of the pulse pattern generator PPG, a receiving end is fiber-connected to one side of the transmitting end, an oscilloscope is connected to the DATA+ end of the receiving end, and an error detector ED is connected to the DATA- end of the receiving end.
[0011] Preferably, the pulse pattern generator PPG is connected to the transmitter through an adapter and a coaxial cable.
[0012] Preferably, the anode of the receiving end is connected to the oscilloscope through an adapter and a coaxial cable, and the cathode of the receiving end is connected to the error detector ED through an adapter and a coaxial cable.
[0013] Preferably, the transmitting end includes a light source and a modulator, and the receiving end includes a photodetector and a signal processor.
[0014] Preferably, the pulse pattern generator PPG can generate specific data patterns such as PRBS, pseudo-random binary sequence.
[0015] Preferably, the error detector ED detects the error codes in the received optical signal.
[0016] The beneficial effects of the present utility model are as follows:
[0017] In this solution, the bit error rate statistics is more accurate, the bit error analysis is more in-depth, and the performance evaluation of the system is more accurate. Through the automated and efficient test process, the time required for testing is shortened, the development efficiency is improved. Under the test conditions simulating the actual environment, the system performance is optimized, and the failure rate of the product in actual use is reduced.
[0018] In this solution, by optimizing the preparation, data pattern and transmission process, the test time is significantly reduced, and the test efficiency is improved. Using data patterns and more accurate detectors can capture more types of bit errors, enhancing the bit error detection ability. By simulating the interference factors in the real environment, it is ensured that the experimental results can better reflect the actual performance of the system, making the test closer to the actual application. At low bit error rates, the statistical accuracy is improved, ensuring that even in high-speed or long-distance transmissions, the system performance can be accurately evaluated, making the statistics more accurate. Through real-time analysis and in-depth data interpretation, the cause of the bit error can be quickly found, reducing the debugging time and achieving the effect of more rapid problem location. Description of the Drawings
[0019] Figure 1 It is a block diagram of a bit error rate test structure proposed by the present utility model. Detailed Embodiment
[0020] Next, the technical solutions in the embodiments of the present utility model will be clearly and completely described in conjunction with the drawings in the embodiments of the present utility model. Obviously, the described embodiments are only a part of the embodiments of the present utility model, rather than all the embodiments.
[0021] Embodiment: Refer to Figure 1 , a bit error rate test structure, including a host computer. One side of the host computer is connected to a pulse pattern generator PPG. One side of the pulse pattern generator PPG is connected to a transmitter. The transmitter is fiber-connected to a receiver on one side. An oscilloscope is connected to the DATA+ terminal of the receiver. The oscilloscope is mainly used for eye diagram testing, which can help analyze signal jitter, noise and signal integrity, judge signal quality and detect problems in transmission. An error detector ED is connected to the DATA- terminal of the receiver.
[0022] Specifically, the pulse pattern generator PPG is connected to the transmitter through an adapter and a coaxial cable.
[0023] Further, the anode of the receiving end is connected to an oscilloscope through an adapter and a coaxial cable, and the cathode of the receiving end is connected to an error detector ED through an adapter and a coaxial cable.
[0024] Moreover, the transmitting end includes a light source and a modulator, and the receiving end includes a photodetector and a signal processor.
[0025] In this embodiment, the pulse pattern generator PPG can generate a specific data pattern such as PRBS, pseudo-random binary sequence, for testing the response of the system. The error detector ED detects the error codes in the received optical signal. By comparing the received data with the original data at the transmitting end, the bit error rate BER is statistically calculated, so as to evaluate the transmission performance and signal quality of the system.
[0026] The adapter is connected by a female-to-female K-type 2.92 mm connector, and the coaxial cable is connected by a male-to-male K-type 2.92 mm connector.
[0027] The data pattern generator generates a test data stream such as PRBS for simulating communication signals. The optical eye diagram test graphically displays the transmission quality of the data stream, revealing problems such as jitter and noise. The error detector monitors the error codes in the transmission. The combination of the eye diagram and error detection analyzes the root cause of the signal problems. In the solution, these three cooperate with each other: generating a complex data stream, detecting error codes and intuitively analyzing the signal quality through the eye diagram to optimize the system performance.
[0028] Working principle:
[0029] 1. Preparation stage:
[0030] Set up the test environment, including a light source, an optical fiber, a photodetector, and a bit error rate tester.
[0031] Calibrate the equipment to ensure that all instruments are operating normally.
[0032] 2. Set the data pattern:
[0033] Use the data pattern generator to generate the data pattern required for testing, such as the PRBS pseudo-random binary sequence.
[0034] Send the generated data pattern to the system under test.
[0035] 3. Signal transmission:
[0036] Transmit the data pattern to the receiving end through the optical fiber.
[0037] The photodetector at the receiving end converts the optical signal into an electrical signal.
[0038] 4. Signal reception and processing:
[0039] Receive the converted electrical signal using an error detector;
[0040] The error detector compares the received signal with the original data pattern and calculates the number of error bits;
[0041] 5. Calculate the bit error rate:
[0042] Record the total number of bits transmitted and the number of error bits.
[0043] Calculate the bit error rate using the formula BER = (number of error bits / total number of bits);
[0044] 6. Analyze the results:
[0045] Evaluate the system performance based on the calculated bit error rate;
[0046] If necessary, adjust the system parameters and repeat the test.
[0047] The content not described in detail in this specification belongs to the prior art well known to those skilled in the art.
[0048] The standard parts used in the present utility model can all be purchased from the market. The special-shaped parts can be customized according to the description in the specification and the drawings. The specific connection methods of each part all adopt conventional means such as bolts, rivets, and welding that are mature in the prior art. The machines, parts, and equipment all adopt conventional models in the prior art. Coupled with the circuit connection adopting the conventional connection method in the prior art, it will not be elaborated here.
[0049] The above is only the preferred specific embodiment of the present utility model, but the protection scope of the present utility model is not limited thereto. Any person skilled in the art within the technical scope disclosed by the present utility model, according to the technical solution of the present utility model and its inventive concept, makes equivalent substitutions or changes, and all should be covered within the protection scope of the present utility model.
Claims
1. A bit error rate test structure, characterized in that: include: A host computer, one side of the host computer is connected to a pulse pattern generator PPG, one side of the pulse pattern generator PPG is connected to a transmitter, one side of the transmitter is connected to a receiving end by an optical fiber, an oscilloscope is connected to the DATA+ end of the receiving end, and an error detector ED is connected to the DATA- end of the receiving end.
2. A bit error rate test structure according to claim 1, characterized in that: The pulse pattern generator PPG is connected to the transmitter through an adapter and a coaxial cable.
3. A bit error rate test structure according to claim 1, characterized in that: The anode of the receiving end is connected to the oscilloscope through an adapter and a coaxial cable, and the cathode of the receiving end is connected to the error detector ED through an adapter and a coaxial cable.
4. A bit error rate test structure according to claim 1, characterized in that: The transmitting end includes a light source and a modulator, and the receiving end includes a photodetector and a signal processor.
5. A bit error rate test structure according to claim 1, characterized in that: The pulse pattern generator PPG can generate a specific data pattern such as PRBS, a pseudo-random binary sequence.
6. A bit error rate test structure according to claim 1, characterized in that: The bit error detector ED detects bit errors in the received optical signal.