Resistivity measuring clamp and resistivity measuring device

Abstract

The utility model provides a resistivity measurement clamp and a resistivity measurement device, and relates to the technical field of resistivity measurement. The resistivity measurement clamp comprises a base, and the base is provided with a first groove and a second groove. The mobile control unit is arranged on the base through the first groove; the sample placing unit is longitudinally arranged above the mobile control unit and is connected with the base, and a first voltage measuring module and a second voltage measuring module are arranged on the sample placing unit in parallel; the first stroke control module is movably arranged on the movement control unit and is arranged on one side of the sample placing unit, and a first current applying module is arranged on the first stroke control module; the second stroke control module is movably arranged on the movement control unit, the second stroke control module and the first stroke control module are oppositely arranged on the other side of the sample placing unit, and a second current applying module is arranged on the second stroke control module; wherein the first stroke control module and the second stroke control module move under the action of the movement control unit, so that the first current applying and measuring module and the second current applying module are in contact with a to-be-measured sample on the sample placing unit; and the guide control unit is arranged on the base through the second groove, is connected with the sample to be measured, and controls the position of the sample to be measured in a thrust form, so that the first voltage measurement module and the second voltage measurement module are in contact with the sample to be measured.

Description

Technical Field

[0001] The present application relates to the technical field of resistivity measurement. Specifically, it relates to a resistivity measurement fixture and a resistivity measurement device. Background Art

[0002] The Kelvin method is a method for measuring resistivity. Based on the working principle of a double-arm bridge (also known as a Kelvin bridge), it improves the measurement accuracy by eliminating the influence of additional resistance. The Kelvin method is more suitable for measuring medium-value resistances, such as the resistance of metal materials and the wire-wound resistance of transformers.

[0003] Figure 1 The schematic diagram showing the measurement of resistivity by the Kelvin method is as follows. Figure 1 As shown, based on the working principle of measuring resistivity by the Kelvin method, a current I is passed through both ends of the sample to be measured, the voltage value V of the sample to be measured under a fixed gauge length L is measured, and the resistivity can be obtained by calculation using a specific formula based on the dimensions of the sample to be measured (such as width W and height H, etc.).

[0004] In practical applications, a resistivity measurement fixture is required to hold the sample to be measured during resistivity measurement. However, the inventor found that the existing resistivity measurement fixtures in the current art have at least the following problems:

[0005] 1. The sample to be measured needs to be placed in the middle of the sample stage of the resistivity measurement fixture. When the sample to be measured is subjected to forces on both the left and right sides, it is likely to deviate from the center of the sample stage. Therefore, it is necessary to manually mark the gauge length on the sample to be measured additionally to ensure the centering effect during the process of closing the current terminals.

[0006] 2. During the clamping process of the sample to be measured, it is necessary to manually push the current terminals at both ends to clamp the sample to be measured, and also to manually maintain the position of the push block during data reading to avoid problems such as poor contact or disconnection of the current terminals.

[0007] 3. During the tightening process of the voltage terminal, since the thimble of the micrometer will rotate, when the sample to be measured comes into contact with it, the sample to be measured will be subjected to a rotational force, resulting in damage to the probe of the voltage terminal due to friction and the problem that the position of the sample needs to be manually intervened because one end of the sample to be measured is lifted.

[0008] 4. When the pressure at the probe of the voltage terminal is too high, the probe of the voltage terminal is easily damaged and deformed, causing the gauge length to change, resulting in measurement deviation and reducing the accuracy of resistivity measurement.

[0009] The inventor believes that the existing resistivity measurement fixtures in the current art have the problems of inconvenient operation and low accuracy of resistivity measurement. Summary of the Utility Model

[0010] The present application provides a resistivity measurement fixture and a resistivity measurement device, which are used to solve the problems of inconvenient operation and low accuracy of resistivity measurement existing in the current resistivity measurement fixtures in the prior art.

[0011] According to one aspect of the present application, a resistivity measurement fixture is provided, including a base, on which a first groove and a second groove are provided; a movement control unit, which is arranged on the base through the first groove; a sample placement unit, which is longitudinally arranged above the movement control unit and is connected to the base, and a first voltage measurement module and a second voltage measurement module are arranged in parallel on the sample placement unit; a first stroke control module, which is movably arranged on the movement control unit and is arranged on one side of the sample placement unit, and a first current application module is arranged on the first stroke control module; a second stroke control module, which is movably arranged on the movement control unit and is arranged opposite to the first stroke control module on the other side of the sample placement unit, and a second current application module is arranged on the second stroke control module; wherein, the first stroke control module and the second stroke control module move under the action of the movement control unit, so that the first current application module and the second current application module are in contact with the sample to be measured on the sample placement unit; a guiding control unit, which is arranged on the base through the second groove and is connected to the sample to be measured, and controls the position of the sample to be measured in the form of a thrust force, so that the first voltage measurement module and the second voltage measurement module are in contact with the sample to be measured.

[0012] According to some embodiments of the present application, the movement control unit includes: a movement controller, which is connected to the base; a movement guide rail, which is arranged on the movement controller; at least two movement sliders, which are movably arranged at both ends of the movement guide rail, and the at least two movement sliders move on the movement guide rail under the action of the movement controller.

[0013] According to some embodiments of the present application, the sample placement unit includes: a guiding through hole, which is arranged on one side of the sample placement unit, and the first voltage measurement module and the second voltage measurement module are arranged opposite to the guiding through hole on the other side of the sample placement unit; a sample placement groove, which is arranged between the guiding through hole, the first voltage measurement module and the second voltage measurement module; a bottom groove, which is arranged at the bottom of the sample placement unit for passing through the movement control unit; wherein, the guiding control unit is connected to the sample to be measured through the guiding through hole, so that the sample to be measured is in contact with the first voltage measurement module and the second voltage measurement module under the action of the thrust force of the guiding control unit.

[0014] According to some embodiments of the present application, the first stroke control module includes: a first fixed base connected to one of at least two moving sliders; a first support base disposed on the first fixed base, the interior of the first support base being a hollow cavity, and a first current application module being partially embedded in the first support base; the second stroke control module includes: a second fixed base connected to the other of at least two moving sliders; a second support base disposed on the second fixed base, the interior of the second support base being a hollow cavity, and a second current application module being partially embedded in the second support base.

[0015] According to some embodiments of the present application, the first stroke control module further includes: a first elastic member disposed in the first support base and connected to the first current application module; the second stroke control module further includes: a second elastic member disposed in the second support base and connected to the second current application module.

[0016] According to some embodiments of the present application, a first opening is provided on one side of the first support base, and a first current application line of the first current application module is connected to a first contact point on the first voltage measurement module through the first opening to apply current to the first current application module; a second opening is provided on one side of the second support base, and a second current application line of the second current application module is connected to a second contact point on the second current application module through the second opening to apply current to the second current application module.

[0017] According to some embodiments of the present application, the guiding control unit includes: a guiding base, the interior of the guiding base being a hollow structure; a guiding slider movably disposed inside the guiding base; a rotating guiding module connected to the guiding slider; a guiding rod, one end of the guiding rod being connected to the guiding slider and the other end of the guiding rod being connected to the sample to be measured; wherein, the rotating guiding module controls the movement of the guiding slider under the action of a rotating force, and the guiding rod moves synchronously with the guiding slider.

[0018] According to some embodiments of the present application, the rotating guiding module includes a ratchet structure; wherein, after the rotating force of the ratchet structure reaches a preset threshold, the rotating guiding module no longer provides a thrust force to the guiding slider.

[0019] According to some embodiments of the present application, the base further includes: at least two current application line through holes, and the current application lines of the first current application module and the second current application module are connected to an external resistivity measuring device through the current application line through holes; at least two voltage measurement line through holes, and the voltage measurement lines of the first voltage measurement module and the second voltage measurement module are connected to an external resistivity measuring device through the voltage measurement line through holes.

[0020] According to another aspect of the present application, the present application provides a resistivity measurement device, which includes the resistivity measurement fixture as described above.

[0021] The present application controls the positions of the first stroke control module and the second stroke control module through the movement control unit, so that the first current application module and the second current application module can accurately contact the sample to be measured; and provides a thrust to the sample to be measured through the guiding control unit, so that the first voltage measurement module and the second voltage measurement module can accurately contact the sample to be measured, and the resistivity measurement fixture can clamp the sample to be measured in the lateral and longitudinal directions. With such a setting, the centering effect of the sample to be measured can be ensured and the accurate acquisition of the resistivity measurement signal can be guaranteed, avoiding manual operation. The present application has the characteristics of simple operation and accurate acquisition of resistivity measurement signals. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following will briefly introduce the drawings required for the description of the embodiments. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0023] Figure 1 Showing the schematic diagram of measuring resistivity by the Kelvin method;

[0024] Figure 2 Showing the schematic diagram of the resistivity measurement fixture according to the embodiment of the present application;

[0025] Figure 3 Showing the schematic diagram of the base according to the embodiment of the present application.

[0026] Figure 4 Showing the enlarged schematic diagram of the movement control unit according to the embodiment of the present application;

[0027] Figure 5 Showing the bottom view of the base according to the embodiment of the present application;

[0028] Figure 6 Showing the enlarged schematic diagram of the sample placement unit according to the embodiment of the present application;

[0029] Figure 7 Showing the enlarged schematic diagram of the first stroke control module according to the embodiment of the present application;

[0030] Figure 8 Showing the enlarged schematic diagram of the second stroke control module according to the embodiment of the present application;

[0031] Figure 9 Showing the enlarged schematic diagram of the guiding control unit according to the embodiment of the present application.

[0032] Description of Reference Numerals of the Drawings:

[0033] Base 10; Movement Control Unit 20; Sample Placement Unit 30; First Stroke Control Module 40; Second Stroke Control Module 50; Guide Control Unit 60.

[0034] First Groove 11; Second Groove 12.

[0035] First Voltage Measurement Module 31; Second Voltage Measurement Module 32; First Current Application Module 41; Second Current Application Module 51.

[0036] Movement Controller 21; Movement Guide Rail 22; Movement Slide Block 23.

[0037] Guide Through-Hole 33; Sample Placement Groove 34; Bottom Groove 35; First Mounting Through-Hole 36.

[0038] First Fixed Base 42; First Support Base 43; Second Mounting Through-Hole 44; First Elastic Member 45.

[0039] Second Fixed Base 52; Second Support Base 53; Third Mounting Through-Hole 54; Second Elastic Member 55.

[0040] First Opening 431; First Contact Point 411; Second Opening 531; Second Contact Point 511.

[0041] Guide Base 61; Guide Slide Block 62; Rotary Guide Module 63; Guide Rod 64; Fourth Mounting Through-Hole 65. Detailed Implementation Manner

[0042] Example embodiments will now be described more fully with reference to the accompanying drawings. However, the example embodiments can be implemented in various forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided so that this application will be thorough and complete, and will fully convey the concept of the example embodiments to those skilled in the art. Like reference numerals in the figures denote the same or similar parts, and thus their repeated description will be omitted.

[0043] The described features, structures, or characteristics can be combined in any suitable manner in one or more embodiments. In the following description, numerous specific details are provided to give a thorough understanding of the embodiments of the present disclosure. However, those skilled in the art will realize that the technical solutions of the present disclosure can be practiced without one or more of these specific details, or can be implemented in other ways, components, materials, devices, etc. In these cases, well-known structures, methods, devices, implementations, materials, or operations will not be shown or described in detail.

[0044] In addition, the terms "comprising" and "having" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product or device that includes a series of steps or units is not limited to the listed steps or units, but may optionally further include steps or units not listed, or may optionally further include other steps or units inherent to these processes, methods, products or devices.

[0045] The terms "first", "second", etc. in the description and claims of this application and the above-mentioned drawings are used to distinguish different objects, rather than to describe a specific order.

[0046] The technical solutions of this application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of this application. Obviously, the described embodiments are part of the embodiments of this application, rather than all embodiments. All other embodiments obtained by those skilled in the art based on the embodiments of this application without creative efforts belong to the scope of protection of this application.

[0047] According to one aspect of this application, this application provides a resistivity measurement fixture. Figure 2 A schematic diagram showing the resistivity measurement fixture of the embodiment of this application; Figure 3 A schematic diagram showing the base of the embodiment of this application.

[0048] According to an example embodiment, as Figure 2 shown, the resistivity measurement fixture may include a base 10, a movement control unit 20, a sample placement unit 30, a first stroke control module 40, a second stroke control module 50, and a guiding control unit 60.

[0049] As Figure 3 shown, a first groove 11 and a second groove 12 are provided on the base 10.

[0050] As Figure 2 shown, the movement control unit 20 is provided on the base 10 through the first groove 11. For example, the movement control unit 20 passes through the first groove 11 and is provided on the base 10 by means of bolt fixation.

[0051] The sample placement unit 30 is longitudinally provided above the movement control unit 20 and is connected to the base 10. A first voltage measurement module 31 and a second voltage measurement module 32 are provided in parallel on the sample placement unit 30.

[0052] For example, the sample placement unit 30 is used to place the sample to be measured. The sample placement unit 30 is longitudinally provided on both sides of the movement control unit 20 and can be fixed to the base 10 by means of bolts. The first voltage measurement module 31 and the second voltage measurement module 32 can be used to measure the voltage information of the sample to be measured.

[0053] Exemplarily, the sample to be measured can be a sample for which resistivity measurement is required, and the sample to be measured can be a metallic material (such as neodymium iron boron, etc.).

[0054] According to the exemplary embodiment, the first stroke control module 40 is movably arranged on the movement control unit 20 and is arranged on one side of the sample placement unit 30. A first current application module 41 is arranged on the first stroke control module 40.

[0055] For example, as Figure 2 shown, the first stroke control module 40 is arranged on the movement control unit 20 and can move correspondingly under the action of the movement control unit 20. The first current application module 41 can be used to apply current to the sample to be measured.

[0056] The second stroke control module 50 is movably arranged on the movement control unit 20 and is arranged opposite to the first stroke control module 40 on the other side of the sample placement unit 30. A second current application module 51 is arranged on the second stroke control module 50.

[0057] For example, as Figure 2 shown, the second stroke control module 50 is correspondingly arranged on the movement control unit 20 with the first stroke control module 40 and can move correspondingly under the action of the movement control unit 20. The second current application module 51 can be used to apply current to the sample to be measured.

[0058] Exemplarily, the first current application module 41 and the second current application module 51 can be copper blocks, and the preset size of the copper blocks can be 20mm * 10mm * 10mm.

[0059] The first stroke control module 40 and the second stroke control module 50 move under the action of the movement control unit 20 so that the first current application module 41 and the second current application module 51 are in contact with the sample to be measured on the sample placement unit 30.

[0060] For example, the movement control unit 20 can move in response to a user instruction, and the movement control unit 20 drives the first stroke control module 40 and the second stroke control module 50 to move correspondingly. When the first stroke control module 40 and the second stroke control module 50 move to a certain position, the first current application module 41 and the second current application module 51 can be brought into contact with the sample to be measured to achieve the purpose of clamping the sample to be measured, and further a constant current can be applied to the sample to be measured.

[0061] According to the exemplary embodiment, as Figure 2As shown, the guiding control unit 60 is arranged on the base 10 through the second groove 12, is connected to the sample to be measured, and controls the position of the sample to be measured in the form of a thrust force, so that the first voltage measurement module 31 and the second voltage measurement module 32 are in contact with the sample to be measured.

[0062] For example, the guiding control unit 60 passes through the second groove 12 and is arranged on the base 10 by being fixed with bolts.

[0063] The guiding control unit 60 is connected to the sample to be measured. By providing a thrust force to the sample to be measured, the position of the sample to be measured on the sample placement unit 30 can be changed. When the sample to be measured moves to a certain position, the first voltage measurement module 31 and the second voltage measurement module 32 can be made to be in contact with the sample to be measured, so as to achieve the purpose of clamping the sample to be measured, and further, the voltage information of the sample to be measured can be measured.

[0064] In this application, the position of the first stroke control module and the second stroke control module is controlled by the movement control unit, so that the first current application module and the second current application module can be in precise contact with the sample to be measured; and a thrust force is provided to the sample to be measured through the guiding control unit, so that the first voltage measurement module and the second voltage measurement module are in precise contact with the sample to be measured, and the clamping of the sample to be measured in the lateral direction and the longitudinal direction by the resistivity measurement fixture can be realized. With such a setting, the centering effect of the sample to be measured can be ensured and the precise acquisition of the resistivity measurement signal can be ensured, avoiding manual operation. This application has the characteristics of simple operation and accurate acquisition of the resistivity measurement signal.

[0065] Figure 4 An enlarged schematic diagram showing the movement control unit according to an embodiment of the present application; Figure 5 A bottom view showing the base according to an embodiment of the present application.

[0066] Optionally, as Figure 4 shown, the movement control unit 20 includes a movement controller 21, a movement guide rail 22, and at least two movement sliders 23.

[0067] As Figure 4 and Figure 5 shown, the movement controller 21 is connected to the base 10 and is arranged at the bottom of the base 10. For example, the movement controller 21 can be fixed to the bottom of the base 10 by bolts.

[0068] Exemplarily, the movement controller 21 can be a cylinder.

[0069] As Figure 4 shown, the movement guide rail 22 is arranged on the movement controller 21. For example, the movement guide rail 22 is fixed to the movement controller 21 by bolts. Exemplarily, the length of the movement guide rail 22 can be 150 mm.

[0070] At least two moving sliders 23 are movably arranged at both ends of the moving guide rail 22, and under the action of the moving controller 21, the at least two moving sliders 23 move on the moving guide rail 22.

[0071] Through the above embodiments, the present application can realize the movement control of the first stroke control module and the second stroke control module by setting a moving controller, a moving guide rail and at least two moving sliders.

[0072] Figure 6 An enlarged schematic diagram of the sample placement unit showing an embodiment of the present application.

[0073] Optionally, as Figure 6 shown, the sample placement unit 30 may include a guiding through hole 33, a sample placement groove 34 and a bottom groove 35.

[0074] The guiding through hole 33 is arranged on one side of the sample placement unit 30, and the first voltage measurement module 31 and the second voltage measurement module 32 are arranged opposite to the guiding through hole 33 on the other side of the sample placement unit 30.

[0075] The guiding control unit 60 is connected to the sample to be measured through the guiding through hole 33, so that the sample to be measured contacts the first voltage measurement module 31 and the second voltage measurement module 32 under the action of the thrust of the guiding control unit 60.

[0076] As Figure 6 shown, the sample placement groove 34 is arranged between the guiding through hole 33, the first voltage measurement module 31 and the second voltage measurement module 32.

[0077] For example, the sample to be measured is placed in the sample placement groove 34, the guiding control unit 60 passes through the guiding through hole 33 and is connected to the sample to be measured, and the guiding control unit 60 provides a thrust for the sample to be measured in a preset manner (such as a tightening manner or a straight-back manner). The sample to be measured moves in the sample placement groove 34 towards the first voltage measurement module 31 and the second voltage measurement module 32 under the action of the thrust. When the thrust reaches a certain degree, the sample to be measured contacts the first voltage measurement module 31 and the second voltage measurement module 32, so that the first voltage measurement module 31 and the second voltage measurement module 32 can collect the voltage information of the sample to be measured.

[0078] As Figure 6 shown, the bottom groove 35 is arranged at the bottom of the sample placement unit 30 for passing through the movement control unit 20.

[0079] As Figure 2 and Figure 6 shown, the sample placement unit 30 is arranged across above the movement control unit 20, and the movement control unit 20 laterally passes through the bottom groove 35.

[0080] Through the above embodiments, the present application sets a guiding through hole, a sample placement groove, and a bottom groove, enabling the guiding control unit to be connected to the sample to be measured through the guiding through hole, achieving precise control of the longitudinal position of the sample to be measured, so that the sample to be measured can be precisely contacted with the first voltage measurement module and the second voltage measurement module.

[0081] Optionally, the sample placement unit 30 may further include a first mounting through hole 36.

[0082] For example, as Figure 6 shown, at least two mounting through holes 36 are respectively provided on both sides of the sample placement unit 30. The sample placement unit 30 can be mounted on the base 10 in a bolted manner through the first mounting through holes 36.

[0083] Figure 7 An enlarged schematic diagram of the first stroke control module according to an embodiment of the present application is shown; Figure 8 An enlarged schematic diagram of the second stroke control module according to an embodiment of the present application is shown.

[0084] Optionally, as Figure 7 shown, the first stroke control module 40 may include a first fixed base 42 and a first support base 43.

[0085] The first fixed base 42 is connected to one of the at least two moving sliders 23.

[0086] For example, the first fixed base 42 can be fixedly connected to the moving slider 23 in a bolted manner. While the moving slider 23 moves, it can drive the first fixed base 42 to move accordingly.

[0087] The first support base 43 is disposed on the first fixed base 42. The interior of the first support base 43 is a hollow cavity, and a part of the first current application module 41 is embedded in the first support base 43.

[0088] For example, as Figure 7 shown, a part of the first current application module 41 is embedded in the first support base 43, and another part of the first current application module 41 protrudes outside the first support base 43 for contacting the sample to be measured.

[0089] As Figure 7 shown, the first stroke control module 40 may further include a second mounting through hole 44. The first fixed base 42 can be mounted on the moving slider 23 in a bolted manner through the second mounting through hole 44.

[0090] Optionally, as Figure 8 shown, the second stroke control module 50 may include a second fixed base 52 and a second support base 53.

[0091] The second fixed base 52 is connected to another one of the at least two moving sliders 23.

[0092] For example, the second fixed base 52 can be fixedly connected to the moving slider 23 by bolts. While the moving slider 23 is moving, it can drive the second fixed base 52 to move accordingly.

[0093] The second support base 53 is arranged on the second fixed base 52. The inside of the second support base 53 is a hollow cavity, and a part of the second current application module 51 is embedded and arranged inside the second support base 53.

[0094] For example, as Figure 8 shown, a part of the second current application module 51 is embedded and arranged inside the second support base 53, and another part of the second current application module 51 protrudes outside the second support base 53 to contact the sample to be measured.

[0095] As Figure 8 shown, the second stroke control module 50 may further include a third mounting through hole 54. The second fixed base 52 can be mounted on the moving slider 23 by bolts through the third mounting through hole 54.

[0096] Through the above exemplary embodiments, by setting the first stroke control module and the second stroke control module in the present application, precise control of the lateral position of the sample to be measured can be achieved, so that the sample to be measured can be accurately contacted with the first current application module and the second current application module.

[0097] Optionally, as Figure 7 shown, the first stroke control module 40 further includes a first elastic member 45. The first elastic member 45 is arranged inside the first support base 43 and is connected to the first current application module 41.

[0098] For example, the first elastic member 45 is elastically connected to the first current application module 41 and is used to provide a buffering force for the first current application module 41.

[0099] Exemplarily, the first elastic member 45 can be a spring.

[0100] Optionally, as Figure 8 shown, the second stroke control module 50 further includes a second elastic member 55. The second elastic member 55 is arranged inside the second support base 53 and is connected to the second current application module 51.

[0101] For example, the second elastic member 55 is elastically connected to the second current application module 51 and is used to provide a buffering force for the second current application module 51.

[0102] Exemplarily, the second elastic member 55 can be a spring.

[0103] Through the above exemplary embodiments, in the present application, by providing the first elastic member and the second elastic member, a certain movement space can be provided for the first current application module and the second current application module, so that the first current application module and the second current application module can be in full contact with the sample to be measured. And through the elastic characteristics of the first elastic member and the second elastic member, the pressure at the sample to be measured can be buffered, avoiding damage or deformation of the sample to be measured due to excessive pressure.

[0104] Optionally, as Figure 7 shown, a first opening 431 is provided on one side of the first support seat 43, and the first current application line of the first current application 41 is connected to the first contact point 411 on the first current application module 41 through the first opening 431 to apply current to the first current application module 41.

[0105] For example, the first current application line can be a terminal line connected to the first current application module 41, and the first contact point 411 can be a screw provided on the first current application module 41.

[0106] Optionally, as Figure 8 shown, a second opening 531 is provided on one side of the second support seat 53, and the second current application line of the second current application module 51 is connected to the second contact point 511 on the second current application module 51 through the second opening 531 to apply current to the second current application module 51.

[0107] For example, the second current application line can be a terminal line connected to the second current application module 51, and the second contact point 511 can be a screw provided on the second current application module 51.

[0108] Figure 9 An enlarged schematic diagram of the guiding control unit according to an embodiment of the present application is shown.

[0109] Optionally, as Figure 9 shown, the guiding control unit 60 can include a guiding seat 61, a guiding slider 62, a rotary guiding module 63 and a guiding rod 64.

[0110] According to the exemplary embodiment, the interior of the guiding seat 61 is a hollow structure. The guiding slider 62 is movably arranged inside the guiding seat 61. The rotary guiding module 63 is arranged on the guiding seat 61 and is connected to the guiding slider 62.

[0111] For example, as Figure 9 shown, the guiding slider 62 is connected to the rotary guiding module 63 through a lead screw, and the rotary guiding module 63 can move the guiding slider 62 correspondingly by rotating a knob.

[0112] One end of the guide rod 64 is connected to the guide slider 62, and the other end of the guide rod 64 is connected to the sample to be measured. The rotary guide module 63 controls the movement of the guide slider 62 under the action of a rotational force, and the guide rod 64 moves synchronously with the guide slider 62.

[0113] For example, the other end of the guide rod 64 passes through the guide through-hole 33 and is connected to the sample to be measured in the sample placement groove 34.

[0114] As Figure 9 shown, when the rotary guide module 63 is subjected to an external rotational force, a thrust is generated to push the guide slider 62 to move inside the guide seat 61, and the movement of the guide slider 62 drives the movement of the guide rod 64. Since the other end of the guide rod 64 is connected to the sample to be measured, the movement of the sample to be measured can be driven in this way.

[0115] When the guide rod 64 moves to a certain extent, the sample to be measured can be brought into contact with the first voltage measurement module 31 and the second voltage measurement module 32, so that the voltage information of the sample to be measured can be measured.

[0116] As Figure 9 shown, the guide control unit 60 may further include a fourth mounting through-hole 65. The guide seat 61 can be mounted on the base 10 by bolts through the fourth mounting through-hole 65.

[0117] Optionally, third elastic members are provided at both ends of the guide slider 62.

[0118] For example, both ends of the guide slider 62 are elastically connected to the inner wall of the guide seat 61 through third elastic members. With such a setting, the problem of jamming of the guide rod 64 can be avoided, and the pressure exerted by the guide rod 64 on the sample to be measured can be reduced, so as to avoid damage or deformation of the sample to be measured due to excessive pressure.

[0119] Optionally, the rotary guide module 63 includes a ratchet structure. When the rotational force of the ratchet structure of the rotary guide module 63 reaches a preset threshold value, the rotary guide module 63 no longer provides a thrust to the guide slider 62.

[0120] For example, the ratchet structure in the rotary guide module 63 causes the rotary guide module 63 to start idling and no longer generate a thrust when the rotational force reaches a certain threshold value (for example, 4 N), so that the guide slider no longer moves. With such a setting, the pressure applied to the sample to be measured can be controlled accordingly, and the measurement probes of the first voltage measurement module 31 and the second voltage measurement module 32 at the sample to be measured can be prevented from deforming due to excessive pressure, and the accuracy of resistivity measurement can be ensured.

[0121] Optionally, as Figure 3As shown, the base 10 further includes at least two voltage measurement line vias 13 and at least two current application line vias 14.

[0122] The voltage measurement lines of the first voltage measurement module 31 and the second voltage measurement module 32 are connected to an external resistivity measurement device through the voltage measurement line vias 13.

[0123] The current application lines of the first current application module 41 and the second current application module 51 are connected to an external resistivity measurement device through the current application line vias 14.

[0124] With such an arrangement, the current application lines and voltage measurement lines of the resistivity measurement fixture can be integrally arranged, facilitating the measurement operation of the resistivity measurement fixture.

[0125] According to another aspect of the present application, the present application further provides a resistivity measurement device. The resistivity measurement device includes the resistivity measurement fixture as described above.

[0126] Finally, it should be noted that the above are only the preferred embodiments of the present application and are not used to limit the present application. Although the present application has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions of the foregoing embodiments or perform equivalent replacements on some of the technical features. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present application shall be included within the protection scope of the present application.

Claims

1. A resistivity measurement fixture, characterized in that: include: A base, wherein a first groove and a second groove are provided on the base; A mobile control unit is arranged on the base through the first groove; A sample placement unit is longitudinally arranged above the mobile control unit and connected to the base, and a first voltage measurement module and a second voltage measurement module are arranged in parallel on the sample placement unit; A first stroke control module is movably arranged on the movement control unit and is arranged on one side of the sample placement unit, and a first current application module is arranged on the first stroke control module; A second stroke control module is movably arranged on the mobile control unit and is arranged on the other side of the sample placement unit opposite to the first stroke control module, and a second current application module is arranged on the second stroke control module; wherein the first stroke control module and the second stroke control module move under the action of the mobile control unit so that the first current application module and the second current application module contact the sample to be tested on the sample placement unit; A guide control unit is disposed on the base through the second groove and connected to the sample to be tested, and controls the position of the sample to be tested in the form of thrust so that the first voltage measurement module and the second voltage measurement module are in contact with the sample to be tested.

2. The resistivity measurement fixture according to claim 1, characterized in that: The mobile control unit comprises: A mobile controller connected to the base; A movable guide rail, arranged on the movable controller; At least two movable sliders are movably arranged at two ends of the movable guide rail. The at least two movable sliders move on the movable guide rail under the action of the movable controller.

3. The resistivity measurement fixture according to claim 1, characterized in that: The sample placement unit comprises: A guide through hole is arranged on one side of the sample placement unit, and the first voltage measurement module and the second voltage measurement module are arranged on the other side of the sample placement unit opposite to the guide through hole; A sample placement groove, arranged between the guide through hole, the first voltage measurement module and the second voltage measurement module; A bottom groove, arranged at the bottom of the sample placement unit, for passing the movement control unit; The guide control unit is connected to the sample to be tested through the guide through hole, so that the sample to be tested is in contact with the first voltage measurement module and the second voltage measurement module under the thrust of the guide control unit.

4. The resistivity measurement fixture according to claim 2, characterized in that: The first stroke control module includes: A first fixed base connected to one of the at least two movable sliders; A first support seat, which is arranged on the first fixed base, wherein the interior of the first support seat is a hollow cavity, and the first current application module is partially embedded in the first support seat; The second stroke control module includes: A second fixed base connected to another movable slider of the at least two movable sliders; The second support base is arranged on the second fixed base. The interior of the second support base is a hollow cavity. The second current application module is partially embedded in the second support base.

5. The resistivity measurement fixture according to claim 4, characterized in that: The first stroke control module also includes: A first elastic component, disposed in the first support seat and connected to the first current applying module; The second stroke control module further includes: The second elastic component is arranged in the second supporting seat and connected to the second current applying module.

6. The resistivity measurement fixture according to claim 4, characterized in that: A first opening is provided on one side of the first support seat, and a first current applying circuit of the first current applying module is connected to a first contact point on the first current applying module through the first opening to apply current to the first current applying module; A second opening is provided on one side of the second support seat, and a second current applying circuit of the second current applying module is connected to a second contact point on the second current applying module through the second opening to apply current to the second current applying module.

7. The resistivity measurement fixture according to claim 1, characterized in that: The guidance control unit comprises: A guide seat, wherein the interior of the guide seat is a hollow structure; A guide slider, movably arranged inside the guide seat; A rotary guide module connected to the guide slider; A guide rod, one end of which is connected to the guide slider, and the other end of which is connected to the sample to be tested; Wherein, the rotary guide module controls the movement of the guide slider under the action of the rotational force, and the guide rod moves synchronously with the guide slider.

8. The resistivity measurement fixture according to claim 7, characterized in that: The rotary steering module includes a ratchet structure; Among them, after the ratchet structure makes the rotational force of the rotational steering module reach a preset threshold, the rotational steering module no longer provides thrust to the guide slider.

9. The resistivity measurement fixture according to claim 1, characterized in that: The base also includes: at least two current application circuit through holes, through which the current application circuits of the first current application module and the second current application module are connected to an external resistivity measurement device; At least two voltage measurement circuit through holes, through which the voltage measurement circuits of the first voltage measurement module and the second voltage measurement module are connected to an external resistivity measurement device.

10. A resistivity measuring device, characterized in that: It comprises the resistivity measuring fixture as described in any one of claims 1-9.

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