Integrated circuit aging test device

Abstract

The utility model relates to the technical field of integrated circuit quality inspection equipment, and discloses an integrated circuit aging test device which comprises a base mechanism, the base mechanism comprises a workbench, a mounting groove is formed between the upper side wall and the lower side wall of one end of the workbench, and an elastic abutting mechanism is arranged at one end of the workbench. A testing mechanism is arranged at the top end of the workbench and matched with the elastic abutting mechanism, and the elastic abutting mechanism comprises connecting bases fixedly connected to the outer side walls of the front end and the rear end of the workbench in a front-back symmetry mode. According to the utility model, the working table is arranged, the elastic abutting mechanisms are arranged at the front end and the rear end of the working table, each elastic abutting mechanism comprises an elastic lifting sliding rod structure, and a pressing block is arranged on one side, corresponding to the working table, of each sliding rod, so that to-be-tested integrated circuit boards with different thicknesses and shapes, which are placed on the working table, can be pressed down and fixed; the to-be-tested integrated circuit board is good in installation adaptability and relatively convenient to disassemble and assemble.

Description

Technical Field

[0001] The utility model relates to the technical field of integrated circuit quality inspection equipment, in particular to an integrated circuit aging test device. Background Technique

[0002] An integrated circuit is a microelectronic device or component that integrates elements such as transistors, resistors, capacitors, and inductors required in a circuit, as well as the wiring, and fabricates them on a small piece or several small pieces of semiconductor wafers or dielectric substrates. Currently, an aging test device is required for integrated circuit manufacturing quality inspection.

[0003] The existing integrated circuit aging test device still has the following problems when in use: when fixing integrated circuit boards to be tested with different thicknesses and shapes, it often needs to be fixed by cooperating with corresponding fixing structures, and the disassembly and assembly of the integrated circuit boards to be tested are relatively inconvenient, and it is also difficult to adapt to integrated circuit boards to be tested with different thicknesses and shapes. Summary of the Utility Model

[0004] (1) Technical Problems to be Solved

[0005] In view of the deficiencies of the prior art, the utility model provides an integrated circuit aging test device, which solves the problems raised in the background technique.

[0006] (2) Technical Solutions

[0007] To achieve the above object, the utility model provides the following technical solution: an integrated circuit aging test device, including a base mechanism, the base mechanism includes a workbench, an installation groove is opened between the upper and lower side walls at one end of the workbench, an elastic pressing mechanism is arranged at one end of the workbench, a test mechanism is arranged at the top of the workbench and cooperates with the elastic pressing mechanism, the elastic pressing mechanism includes connecting seats fixedly connected to the outer side walls at the front and rear ends of the workbench in a front-back symmetric manner, two sliding grooves are symmetrically opened between the upper and lower side walls of the connecting seat, a sliding rod is slidably connected in the sliding groove, a pressing block is fixedly connected to the outer side wall above the sliding rod towards one end of the workbench, a blocking block is fixedly connected to the bottom end of the sliding rod, and a spring is fixedly connected between the top wall of the blocking block and the bottom wall of the upper connecting seat.

[0008] As a further scheme of the utility model: a protective pad is fixedly connected to each of the front and rear ends of the top wall of the workbench and located at both ends of the installation groove, a support rod is fixedly connected to each of the four corners of the bottom wall of the workbench, and a same handle is fixedly connected between the top walls of two sliding rods on the same front side or rear side.

[0009] As a further solution of the present utility model: The testing mechanism includes a data processing host fixedly connected to the other end of the top wall of the workbench. A touch screen is arranged on the top of the data processing host. One second connecting wire is fixedly connected to each of the two data ports at one end of the data processing host. The end of the second connecting wire far from the data processing host is fixedly connected with a voltage detection connector.

[0010] As a further solution of the present utility model: One first connecting wire is fixedly connected to the data port at the other end of the data processing host. The end of the first connecting wire far from the data processing host is fixedly connected with a detector. The detector is fixedly installed on the inner side wall of the lower opening of the installation groove. Temperature sensors and humidity sensors are symmetrically arranged at the top of the detector.

[0011] Compared with the prior art, the beneficial effects of the present utility model are as follows:

[0012] 1. In the present utility model, by providing a workbench, elastic pressing mechanisms are arranged at the front and rear ends of the workbench. The elastic pressing mechanisms include a sliding rod structure that elastically lifts and lowers. A pressing block is arranged on the side of the sliding rod corresponding to the workbench, which can press and fix the integrated circuit boards with different thicknesses and shapes placed on the workbench for testing. The integrated circuit boards to be tested have good installation adaptability and are relatively convenient to disassemble and assemble.

[0013] 2. In the present utility model, a data processing host is arranged at the other end of the workbench. Two voltage detection connectors are provided, which can detect the voltage of the integrated circuit board during aging testing. At the same time, a detector is arranged at one end of the workbench corresponding to the two elastic pressing mechanisms. Temperature sensors and humidity sensors are arranged at the top of the detector. The overall device can quickly detect the circuit voltage, temperature, and humidity, and analyze and process them through the data processing host, and feed back the integrated circuit aging test data through the touch screen above. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 is the overall three-dimensional view of the present utility model Figure 1 ;

[0015] Figure 2 is the overall three-dimensional view of the present utility model Figure 2 ;

[0016] Figure 3 is the three-dimensional view of the base mechanism and the elastic pressing mechanism of the present utility model;

[0017] Figure 4 is the three-dimensional view of the testing mechanism of the present utility model.

[0018] In the figure: 1. Base mechanism; 2. Elastic pressing mechanism; 3. Testing mechanism; 11. Workbench; 12. Installation groove; 13. Protective pad; 14. Support rod; 21. Connecting seat; 22. Chute; 23. Slide bar; 24. Stopper; 25. Spring; 26. Pressing block; 27. Handle; 31. Data processing host; 32. Detector; 33. Temperature sensor; 34. Humidity sensor; 35. First connecting wire; 36. Second connecting wire; 37. Voltage detection joint; 38. Touch screen. Detailed implementation manner

[0019] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0020] Please refer to Figures 1 to 4 , in the embodiment of the present invention, an integrated circuit aging test device includes a base mechanism 1. The base mechanism 1 includes a workbench 11. An installation groove 12 is opened between the upper and lower side walls at one end of the workbench 11. An elastic pressing mechanism 2 is arranged at one end of the workbench 11. A testing mechanism 3 is arranged at the top of the workbench 11 and is matched with the elastic pressing mechanism 2. The elastic pressing mechanism 2 includes connecting seats 21 fixedly connected to the outer side walls of the front and rear ends of the workbench 11 in a front-back symmetric manner. Two chutes 22 are symmetrically opened between the upper and lower side walls of the connecting seats 21. A slide bar 23 is slidably connected in the chutes 22. A pressing block 26 is fixedly connected to the outer side wall of the upper end of the slide bar 23 towards one end of the workbench 11. A stopper 24 is fixedly connected to the bottom end of the slide bar 23. A spring 25 is fixedly connected between the top wall of the stopper 24 and the bottom wall of the upper connecting seat 21. There is an overall workbench 11, and elastic pressing mechanisms 2 are arranged at the front and rear ends of the workbench 11. The elastic pressing mechanism 2 includes a slide bar 23 structure with elastic lifting. A pressing block 26 is arranged on one side of the slide bar 23 corresponding to the workbench 11, which can press and fix different thickness and shape integrated circuit boards to be tested placed on the workbench 11. The installation adaptability of the integrated circuit board to be tested is good, and the disassembly and assembly are relatively convenient.

[0021] A protective pad 13 is fixedly connected to each of the front and rear ends of the top wall of the workbench 11 and located at both ends of the installation groove 12. A support rod 14 is fixedly connected to each of the four corners of the bottom wall of the workbench 11. The overall device can be supported and placed through the four support rods 14. A same handle 27 is fixedly connected between the top walls of the two slide bars 23 on the same front side or rear side, and the slide bar 23 can be pulled to move by holding the handle 27.

[0022] The testing mechanism 3 includes a data processing host 31 fixedly connected to the other end of the top wall of the workbench 11. A touch screen 38 is arranged at the top of the data processing host 31. At each of the two data ports at one end of the data processing host 31, a second connecting wire 36 is fixedly connected. The end of the second connecting wire 36 far from the data processing host 31 is fixedly connected with a voltage detection connector 37, and the voltage detection connector 37 can be connected to the voltage detection end of the integrated circuit board to be tested.

[0023] A first connecting wire 35 is fixedly connected to the data port at the other end of the data processing host 31. The end of the first connecting wire 35 far from the data processing host 31 is fixedly connected with a detector 32. The detector 32 is fixedly installed on the inner side wall of the lower opening of the installation groove 12. Temperature sensors 33 and humidity sensors 34 are symmetrically arranged at the top of the detector 32. Overall, the data processing host 31 is arranged at the other end of the workbench 11. It is provided with two voltage detection connectors 37, which can detect the voltage of the integrated circuit board during the aging test. At the same time, a detector 32 is arranged at one end of the workbench 11 corresponding to the two elastic pressing mechanisms 2. Temperature sensors 33 and humidity sensors 34 are arranged at the top of the detector 32. The overall device can quickly detect the circuit voltage, temperature and humidity, and perform analysis and processing through the data processing host 31, and feed back the integrated circuit aging test data through the upper touch screen 38.

[0024] The working principle of the present utility model is as follows: There is a workbench 11 as a whole. Elastic pressing mechanisms 2 are arranged at the front and rear ends of the workbench 11. The elastic pressing mechanism 2 includes a sliding rod 23 structure that can elastically lift. A pressing block 26 is arranged on one side of the sliding rod 23 corresponding to the workbench 11, which can press and fix different thickness and shape integrated circuit boards to be tested placed on the workbench 11. The integrated circuit boards to be tested have good installation adaptability and are relatively convenient to disassemble and assemble. In addition, the data processing host 31 is arranged at the other end of the workbench 11 as a whole. It is provided with two voltage detection connectors 37, which can detect the voltage of the integrated circuit board during the aging test. At the same time, a detector 32 is arranged at one end of the workbench 11 corresponding to the two elastic pressing mechanisms 2. Temperature sensors 33 and humidity sensors 34 are arranged at the top of the detector 32. The overall device can quickly detect the circuit voltage, temperature and humidity, and perform analysis and processing through the data processing host 31, and feed back the integrated circuit aging test data through the upper touch screen 38.

[0025] The above is only a preferred specific embodiment of the present utility model, but the protection scope of the present utility model is not limited thereto. Any person skilled in the art within the technical scope disclosed by the present utility model, according to the technical solution of the present utility model and its inventive concept, makes equivalent substitutions or changes, and all should be covered within the protection scope of the present utility model.

Claims

1. An integrated circuit aging test device, comprising a base mechanism (1), the base mechanism (1) comprising a workbench (11), a mounting groove (12) being provided between upper and lower side walls at one end of the workbench (11); Features: An elastic pressing mechanism (2) is provided at one end of the workbench (11), and a testing mechanism (3) is provided at the top of the workbench (11) and in coordination with the elastic pressing mechanism (2); The elastic pressing mechanism (2) comprises a connecting seat (21) fixedly connected to the outer side walls of the front and rear ends of the workbench (11) in a front-to-back symmetrical manner, and two sliding grooves (22) are symmetrically arranged between the upper and lower side walls of the connecting seat (21); A slide rod (23) is slidably connected in the slide groove (22); a pressure block (26) is fixedly connected to one end of the upper outer wall of the slide rod (23) facing the workbench (11); a stopper (24) is fixedly connected to the bottom end of the slide rod (23); and a spring (25) is fixedly connected between the top wall of the stopper (24) and the bottom wall of the upper connecting seat (21).

2. The integrated circuit aging test device according to claim 1, characterized in that: A common handle (27) is fixedly connected between the top walls of the two slide bars (23) on the front side or the rear side.

3. The integrated circuit aging test device according to claim 1, characterized in that: A protective pad (13) is fixedly connected to the top wall of the workbench (11) and located at the front and rear ends of the installation groove (12), and a support rod (14) is fixedly connected to each of the four corners of the bottom wall of the workbench (11).

4. The integrated circuit aging test device according to claim 1, characterized in that: The testing mechanism (3) comprises a data processing host (31) fixedly connected to the other end of the top wall of the workbench (11), and a touch screen (38) is arranged on the top of the data processing host (31).

5. The integrated circuit aging test device according to claim 4, characterized in that: Two data ports at one end of the data processing host (31) are each fixedly connected to a second connection line (36), and one end of the second connection line (36) away from the data processing host (31) is fixedly connected to a voltage detection connector (37).

6. The integrated circuit aging test device according to claim 4, characterized in that: A first connection line (35) is fixedly connected to the data port at the other end of the data processing host (31), and a detector (32) is fixedly connected to one end of the first connection line (35) away from the data processing host (31).

7. The integrated circuit aging test device according to claim 6, characterized in that: The detector (32) is fixedly mounted on the inner side wall of the opening below the mounting groove (12), and a temperature sensor (33) and a humidity sensor (34) are symmetrically arranged on the top of the detector (32).

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