High-voltage driver batch reliability test circuit

Abstract

The utility model discloses a high-voltage driver batch reliability test circuit, and belongs to the technical field of hybrid integrated circuits. The test circuit comprises a frequency conversion signal generator module, an anti-interference module, an input current-limiting protection module, a constant-current voltage-stabilizing unit circuit, a device to be tested, a direct-current voltage-stabilizing power supply, a power supply filtering module, an aging display module, a constant-current load module, a fault display module, an output feedback / sampling module and a load current-limiting protection module. A signal source sequentially passes through the anti-interference module, the input current-limiting protection module and the constant-current voltage-stabilizing unit circuit and then enters a device to be tested. The constant current voltage stabilization unit circuit, the device to be tested, the aging display module, the constant current load module and the fault display module form a unit test circuit, and at least two unit test circuits are connected in parallel to form a batch reliability test circuit. The problem that a high-voltage driver in the prior art is not provided with a batch reliability screening and test-related test circuit is solved. The device is widely applied to the electrical performance test and the reliability test of the high-voltage driver.

Description

Technical Field

[0001] The utility model belongs to the technical field of hybrid integrated circuits, and further relates to the technical field of batch reliability testing of hybrid integrated circuits. Specifically, it relates to a batch reliability test circuit for high-voltage drivers. Background Technique

[0002] With the rapid development of semiconductor technology, various devices and equipment are becoming increasingly intelligent, and the application scenarios are becoming more complex. To ensure the normal operation of complex functions, corresponding functional circuits need to be designed as technical guarantees. To improve the reliability and miniaturization of devices and equipment, modular design of relevant functional circuits and matching reliability test and verification technology design are required. Currently, for application scenarios of high-voltage drive, such as high-voltage sensors, high-voltage motors, high-voltage loads, etc., hybrid integrated circuit technology is usually used to miniaturize, densify, and highly reliably integrate high-voltage drive circuits (including signal input terminals, signal input processing circuits, signal amplification unit circuits, signal power output circuits, signal output terminals, startup unit circuits, etc.) to form a hybrid integrated high-voltage drive circuit module (load voltage greater than 380V) for drive guarantee. However, in the prior art, there is no test evaluation method and its related circuit for batch reliability screening of such high-voltage drive functional circuit modules. To solve such problems, the present utility model is specifically proposed. Summary of the Invention

[0003] The technical problem to be solved by the present utility model is: to solve the problem that there is no relevant test circuit for batch reliability screening of high-voltage drive hybrid integrated circuit functional modules in the prior art.

[0004] Furthermore, the following specific problems need to be solved:

[0005] (1) During the batch burn-in process, the problem of mutual interference between various signals.

[0006] (2) The problem of over-power damage and reduced reliability of the high-voltage driver. The output terminal is a high-voltage power transistor (load voltage greater than 380V). During burn-in, the load current is large, the amplitude fluctuation range of the input control signal is large, and the working frequency is high, which easily causes over-power damage to the driver. After burn-in, it will lead to unstable driver life, resulting in uncontrollable quality.

[0007] (3) The problem of abnormal overvoltage impact protection at the output terminal.

[0008] Therefore, the present utility model provides a batch reliability test circuit for high-voltage drivers, as Figure 2As shown in the figure. The test circuit includes: a variable-frequency signal generator module, an anti-interference module, an input current-limiting protection module, a constant-current and voltage-stabilizing unit circuit, a device under test, a DC regulated power supply, a power supply filtering module, an aging display module, a constant-current load module, a fault display module, an output feedback / sampling module, and a load current-limiting protection module.

[0009] The variable-frequency signal generator module generates a signal source, which successively passes through the anti-interference module, the input current-limiting protection module, and the constant-current and voltage-stabilizing unit circuit, and enters the signal input terminal of the device under test. That is, the signal output terminal of the variable-frequency signal generator module is connected to the input terminal of the anti-interference module, the output terminal of the anti-interference module is connected to the input terminal of the input current-limiting protection module, the output terminal of the input current-limiting protection module is connected to the input terminal of the constant-current and voltage-stabilizing unit circuit, and the output terminal of the constant-current and voltage-stabilizing unit circuit is connected to the signal input terminal of the device under test.

[0010] The output terminal of the DC regulated power supply is filtered by the power supply filtering module and then supplies power to the batch reliability test circuit.

[0011] One end of the start-up unit circuit port of the device under test is connected to one end of the aging display module.

[0012] The output terminal of the device under test is successively connected to the constant-current load module, the fault display module, the other end of the aging display module, and one end of the output feedback / sampling module.

[0013] The other end of the output feedback / sampling module is connected to the DC power supply ground terminal through the load current-limiting protection module.

[0014] The constant-current and voltage-stabilizing unit circuit, the device under test, the aging display module, the constant-current load module, and the fault display module form a unit (single-channel) test circuit, and the batch reliability test circuit is composed of at least two unit (single-channel) test circuits connected in parallel.

[0015] Technical effects of the present utility model:

[0016] (1) Real-time monitoring function during batch production: The evaluation system from the production requirements can be integrated into the entire reliability test production process, perform real-time functional detection on the products during the process, and record the fault situations separately.

[0017] (2) Electrical parameter detection feedback and comparative test function: The drive circuit module product is a hybrid integrated circuit module product with certain electrical functions formed by different discrete devices through a certain circuit design. Its own functional characteristics cause it to be impossible to perform parameter tests on some devices after the module is formed, and only testing the device parameters cannot fully guarantee the normal operation of the overall function of the module. This test system is a comprehensive electrical parameter test system integrating a test circuit, a computer test program, and a test fixture.

[0018] (3)Load current regulation function: In the reliability test circuit, adjust the load resistance to regulate the magnitude of the load current. By adjusting the signal generator, further adjust the voltage across the control signal of the aging circuit, so as to achieve the adjustable function of voltage and current.

[0019] (4)Indicator function: The indicator light is on, indicating that the product is aging normally.

[0020] The reliability test circuit of the high-voltage driver is used to conduct function tests on the driver product and aging screening on the output load of the product. While the product is aging, relevant electrical parameters can be tested immediately to check the aging status of the product.

[0021] The reliability test circuit of the high-voltage driver is used to conduct function tests on the driver product and aging screening on the output load of the product. While the product is aging, relevant electrical parameters can be tested immediately to check the aging status of the product.

[0022] The technical solution of the present utility model designs the test and aging circuit board of the product according to the characteristics of the high-voltage driver, and is widely used in the electrical performance test and reliability test of the high-voltage driver. Description of the Drawings

[0023] Figure 1 It is a schematic diagram of the original aging circuit structure.

[0024] Figure 2 It is a schematic diagram of the topology block diagram structure of the mass reliability aging circuit of the present utility model.

[0025] Figure 3 It is a schematic diagram of the unit aging circuit structure of the present utility model.

[0026] In the figure: U1 is the input control signal source, VCC is the driver startup power supply and the output load power supply, DR1 is the high-voltage driver to be aged, DT1 is the voltage transient suppression diode, DZ1, DZ2, DZ3 are the voltage stabilizing diodes, DO1, DO2, DO3 are the damping diodes, RL1, RL2, RL3 are the loads, C1, C2, C3 are the capacitors, CCSB1, CCSB2, CCSB3 are the input signal source constant current protection modules, CCSE1, CCSE2, CCSE3 are the startup terminal constant current protection modules, and CCSL1, CCSL2, CCSL3 are the output load constant current protection modules. Detailed Implementation Manner

[0027] As Figure 3 shown, for the batch reliability test circuit of a high-voltage driver, taking the single-channel test circuit as an example, the detailed implementation manner is as follows:

[0028] The test circuit includes an input terminal control signal source U1, a DC power supply VCC, a device under test DR1, a voltage transient suppression diode DT1, voltage stabilizing diodes DZ1, DZ2, DZ3, damping diodes DO1, DO2, DO3, loads RL1, RL2, RL3, capacitors C1, C2, C3, input terminal signal source constant current protection modules CCSB1, CCSB2, CCSB3, start terminal constant current protection modules CCSE1, CCSE2, CCSE3, and output terminal load constant current protection modules CCSL1, CCSL2, CCSL3.

[0029] The frequency conversion signal generator module U1 is a frequency adjustable signal source, implemented using a waveform adjustable and frequency conversion signal generator module circuit. It is a power type voltage digital quantity, with a maximum output voltage of 36V required, a signal source current of 1mA required, a voltage of 380V required at the output terminal of the high-voltage driver, and it is a high-voltage device, with a maximum load current of 200mA required.

[0030] The input signal of the test circuit module has two states. One is a pulse signal, with a pulse width adjustable from 100 μs to 20 ms and a duty cycle of 70%. The other is a sine signal, with a frequency less than 500KHz and adjustable.

[0031] The anti-interference module consists of a voltage transient suppression diode DT1. The negative electrode of DT1 is connected to the output terminal of the frequency conversion signal generator module U1, and the positive electrode of DT1 is connected to the ground terminal of the frequency conversion signal generator module U1.

[0032] The input current limiting protection module is constant current sources CCSB1, CCSB2, CCSB3.

[0033] The constant current and voltage stabilizing unit circuit is composed of a voltage stabilizing diode DZ in series with a start terminal constant current protection module CCSE. The negative electrode of DZ is connected to the power supply VCC terminal, and the output terminal of CCSE is connected to the corresponding power supply terminals of the three signal input terminals of the device under test.

[0034] The device under test is three independent channel high-voltage drive circuit modules DR1, which have three signal input terminals and three power output terminals.

[0035] The DC regulated power supply is the DC power supply VCC.

[0036] The power supply filtering module is a capacitor parallel circuit composed of capacitors C1, C2, C3. One end of the capacitor parallel circuit is connected to the positive power supply terminal, and the other end is grounded.

[0037] The burn-in display module is a green light-emitting electrode tube.

[0038] The constant current load module is composed of output terminal load constant current protection modules CCSL1, CCSL2, and CCSL3 connected in series with corresponding load modules as loads RL1, RL2, and RL3. One end of loads RL1, RL2, and RL3 is grounded.

[0039] The fault display module is a yellow light-emitting diode.

[0040] The output feedback / sampling module is composed of a resistor voltage division sampling network and an amplifier circuit.

[0041] The load current limiting protection module is composed of current limiting resistors.

[0042] The damping diodes DO1, DO2, and DO3 are respectively reversely connected across both ends of the three-way output. They are used to protect the output terminal of the driver from the inductive voltage impact of inductive loads.

[0043] Furthermore:

[0044] 1. Selection of signal input channels DT1 and CCSB

[0045] For different drivers, the required control voltage and control current are inconsistent. The breakdown of DT can be changed to adapt to the change of the input control voltage, or the power supply pull bias test voltage can be considered as a whole, and the breakdown voltage of DT can be set to be greater than 1.2 times the pull bias test voltage; CCSB is the input terminal constant current protection module, which mainly plays a role in keeping the current constant in the current, and can be set according to the control current requirement of the driver.

[0046] 2. Selection of power supply channels DZ and CCSE

[0047] DZ is mainly used to adjust the working voltage drop between the CE poles of the output Darlington transistors. It needs to be selected according to the temperature derating of the driver output power, and the power during aging is determined according to the ambient temperature during driver aging. At this time, a small current operation is set, and the regulated voltage value of DZ is determined according to P = U * I; CCSE is mainly used to adjust the starting current of the high-voltage driver. According to the parameters of the driver, the starting current is generally set below 1 mA, which can be directly adjusted by the digital potentiometer in the constant current protection module. At the same time, the selection of all devices in the constant current protection module circuit should ensure that the withstand voltage value is greater than 380V.

[0048] 3. Selection of signal output channel DO

[0049] DO is a damping diode, which is mainly used in the circuit to protect the output terminal of the driver from the inductive voltage impact of inductive loads. Usually, a reverse withstand voltage greater than 380V is selected.

[0050] 4. Selection of load current channel CCSL

[0051] CCSL mainly ensures the stability of the load current during the high-temperature aging of the driver. Modulated by the DZ zener diode, the CCSL current is generally set below 10 mA, and it is also achieved by adjusting the digital potentiometer in the constant-current protection module.

[0052] Finally, it should be noted that the above embodiments are merely examples given for clear illustration. The present utility model includes but is not limited to the above embodiments, and it is not necessary and impossible to list all implementation manners here. For those of ordinary skill in the art, other different forms of changes or modifications can be made based on the above description.

Claims

1. A high voltage driver batch reliability test circuit, characterized in that: The batch reliability test circuit includes: a frequency conversion signal generator module, an anti-interference module, an input current limiting protection module, a constant current voltage stabilization unit circuit, a device to be tested, a DC voltage stabilization power supply, a power supply filter module, an aging display module, a constant current load module, a fault display module, an output feedback / sampling module and a load current limiting protection module; The signal output end of the frequency conversion signal generator module is connected to the input end of the anti-interference module, the output end of the anti-interference module is connected to the input end of the input current limiting protection module, the output end of the input current limiting protection module is connected to the input end of the constant current voltage stabilization unit circuit, and the output end of the constant current voltage stabilization unit circuit is connected to the signal input end of the device under test; The output end of the DC regulated power supply is connected to the input end of the power filter module, and the output end of the power filter module is connected to the power supply end of the batch reliability test circuit; The start-up unit circuit port of the device under test is connected to one end of the aging display module; The output end of the device under test is connected in sequence through the constant current load module, the other end of the fault display module and the aging display module, and one end of the output feedback / sampling module; The other end of the output feedback / sampling module is connected to the ground end of the DC power supply via the load current limiting protection module; The constant current voltage stabilization unit circuit, the device to be tested, the aging display module, the constant current load module and the fault display module constitute a unit test circuit, and at least two unit test circuits are connected in parallel to form a batch reliability test circuit.

2. A high voltage driver batch reliability test circuit as claimed in claim 1, characterized in that: The variable frequency signal generator module U1 is a frequency adjustable signal source, which is composed of a waveform adjustable, variable frequency signal generator module circuit.

3. A high voltage driver batch reliability test circuit as claimed in claim 1, characterized in that: The anti-interference module is composed of a voltage transient suppression diode DT1, the cathode of DT1 is connected to the output end of the frequency conversion signal generator module U1, and the anode of DT1 is connected to the ground end of the frequency conversion signal generator module U1.

4. A high voltage driver batch reliability test circuit as claimed in claim 1, characterized in that: The power supply filter module is composed of capacitors C1, C2, and C3 connected in parallel. One end of the capacitor parallel circuit is connected to the positive power supply end, and the other end is grounded.

5. A high voltage driver batch reliability test circuit as claimed in claim 1, characterized in that: The output feedback / sampling module is composed of a resistor voltage-dividing sampling network and an amplifier circuit.

6. A high voltage driver batch reliability test circuit as claimed in claim 1, characterized in that: The device under test is a three-independent-channel high-voltage driving circuit module DR1 having three signal input terminals and three power output terminals.

7. A high voltage driver batch reliability test circuit as claimed in claim 6, characterized in that: The input current limiting protection module has three paths, which are respectively composed of constant current sources CCSB1, CCSB2, and CCSB3. The output ends of the constant current sources CCSB1, CCSB2, and CCSB3 are correspondingly connected to the three signal input ends of the device under test.

8. A high voltage driver batch reliability test circuit as claimed in claim 6, characterized in that: The constant current voltage stabilizing unit circuit is composed of a voltage stabilizing diode DZ and a startup end constant current protection module CCSE connected in series, the cathode of DZ is connected to the power supply VCC end, and the output end of CCSE is connected to the power supply ends corresponding to the three signal input ends of the device under test.

9. A high voltage driver batch reliability test circuit as claimed in claim 6, characterized in that: The constant current load module is composed of output end load constant current protection modules CCSL1, CCSL2, CCSL3 and corresponding load modules, loads RL1, RL2, RL3, connected in series, and one end of the loads RL1, RL2, RL3 is grounded.

10. A high voltage driver batch reliability test circuit as claimed in claim 6, characterized in that: The three output ends of the device under test are respectively connected in reverse parallel to damping diodes DO1, DO2, and DO3.

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