Leaf spring test probe

Abstract

The utility model relates to a test probe for a leaf spring. The probe comprises a U-shaped part and an extension part, the extending part is arranged at one end of the U-shaped part and extends in the direction away from the other end of the U-shaped part, an elastic supporting piece is arranged between the two ends of the U-shaped part, a groove extending from one end of the U-shaped part to the other end of the U-shaped part is formed in the U-shaped part, and the bottom face of the groove is parallel to the same plane where two arms of the U-shaped part are located; a first contact part and a second contact part are arranged at the ends, deviating from each other, of the extension part and the U-shaped part respectively; the utility model has a simple integral structure, can be integrally processed and manufactured, is convenient to process and manufacture, greatly reduces the number of parts, simplifies the assembly process, and further reduces the production cost.

Description

Technical Field

[0001] The utility model relates to the technical field of test probes, and particularly relates to a chip spring test probe. Background Art

[0002] Most of the existing test probes are composed of a probe sleeve, a spring, and a probe head. The spring is arranged between the probe sleeve and the probe head. During testing, the probe sleeve is pressed down, and the probe head is driven by the probe sleeve to press down and contact the workpiece to be detected, and it is in close contact under the thrust of the spring. The current and voltage signals are transmitted to the computer through the test probe head and the connecting wire. The spring plays a role of pushing and buffering.

[0003] However, the current traditional test probes need to assemble each component, and the product precision and production cost requirements are relatively high. It is easy to get stuck between the probe head and the probe sleeve. In addition, the connection between the probe head and the probe sleeve is a sliding connection method. Long-term wear will cause poor contact, resulting in unstable test data and affecting the test accuracy. In addition, there are also disadvantages that the spring is easy to burn out and interfere with the test results. Therefore, it is necessary to develop a new type of test probe to solve the current problems. Summary of the Utility Model

[0004] The purpose of the utility model is to provide a chip spring test probe aiming at the deficiencies of the prior art, which can well solve the above problems.

[0005] To achieve the above requirements, the technical solution adopted by the utility model to solve its technical problems is:

[0006] Provide a chip spring test probe, which includes a U-shaped part and an extension part; the extension part is arranged at one end of the U-shaped part and extends in a direction away from the other end of the U-shaped part. An elastic support is arranged between the two ends of the U-shaped part. A groove extending from one end to the other end is arranged on the U-shaped part, and the bottom surface of the groove is parallel to the plane where the two arms of the U-shaped part are located; a first contact part and a second contact part are respectively arranged at the ends of the extension part and the U-shaped part that are away from each other.

[0007] In the chip spring test probe of the utility model, the U-shaped part and the extension part are both of a thin sheet structure and are arranged coplanarly.

[0008] In the chip spring test probe of the utility model, the elastic support is coaxial with the extension part.

[0009] In the chip spring test probe of the utility model, the elastic support is a spring, and the two ends of the elastic support are respectively detachably connected to the two ends of the U-shaped part.

[0010] The leaf spring test probe described in the utility model, wherein positioning protrusions are provided on the opposite side walls at both ends of the U-shaped portion, and sleeve portions are provided at both ends of the elastic support member corresponding to the positioning protrusions. When assembled in place, the sleeve portions are sleeved on the positioning protrusions.

[0011] In the leaf spring test probe of the utility model, two grooves are provided and are respectively located on the left and right side walls of the U-shaped portion.

[0012] The sheet spring test probe of the utility model, wherein one end of the groove close to the extension part extends onto the extension part.

[0013] In the sheet spring test probe of the utility model, the sum of the depths of the two grooves is smaller than the thickness of the U-shaped portion.

[0014] The leaf spring test probe described in the utility model, wherein a V-shaped groove is provided on the end surface of the extension portion which faces away from the U-shaped portion, and inclined surfaces are provided on both sides of the extension portion located at the V-shaped groove, and the two inclined surfaces are arranged in an eight-shaped shape; the two inclined surfaces and the V-shaped groove together form the first contact portion.

[0015] The leaf spring test probe described in the utility model, wherein a conical protrusion is provided on a side wall of the U-shaped portion away from the extension portion, the conical protrusion is provided in plurality and at least one of the conical protrusions is colinear with the extension portion; the plurality of conical protrusions together form the second contact portion.

[0016] The beneficial effects of the utility model are as follows: the certain elastic properties of the U-shaped part can achieve the purpose of soft contact during the test process, and the overall structure is simple. The integrated structure is more convenient to manufacture, greatly reducing the number of parts, simplifying the assembly process, further reducing the production cost, and can carry a larger current. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the embodiments of the utility model or the technical solutions in the prior art, the utility model will be further described below in conjunction with the accompanying drawings and embodiments. The drawings described below are only some embodiments of the utility model. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work:

[0018] Figure 1 It is a front view of the sheet spring test probe of the utility model.

[0019] Figure 2 It is a cross-sectional view of the U-shaped portion of the leaf spring test probe of the utility model.

[0020] Figure 3 This is a side view of the chip spring test probe of the present utility model. Specific embodiments

[0021] In the description of the present invention, the terms "first", "second", "third", "fourth", etc. in the specification, claims and drawings are used to distinguish different objects, rather than to describe a specific order. In addition, the terms "comprising" and "having" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product or device that comprises a series of steps or units is not limited to the listed steps or units, but optionally further comprises steps or units not listed, or optionally further comprises other steps or units inherent to these processes, methods, products or devices.

[0022] Reference to "embodiment" herein means that a particular feature, structure or characteristic described in connection with the embodiment can be included in at least one embodiment of the present invention. The phrase appears in various places in the specification and does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment mutually exclusive with other embodiments. Those skilled in the art will explicitly and implicitly understand that the embodiments described herein can be combined with other embodiments.

[0023] "Plurality" means two or more. "And / or" describes the association relationship of associated objects and indicates that there can be three relationships. For example, A and / or B can represent: A exists alone, A and B exist simultaneously, and B exists alone. The character " / " generally represents an "or" relationship between the associated objects before and after.

[0024] Moreover, terms indicating directions such as "upper", "lower", "left", "right", "upper end", "lower end", "longitudinal", etc. are all referenced based on the attitude position of the device or equipment described in this solution during normal use.

[0025] In order to make the objectives, technical solutions and advantages of the embodiments of the present utility model clearer, the technical solutions in the embodiments of the present utility model will be clearly and completely described below. Obviously, the described embodiments are partial embodiments of the present utility model, rather than all embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present utility model without creative efforts shall fall within the protection scope of the present utility model.

[0026] The chip spring test probe of the preferred embodiment of the present utility model is used for testing the connector 100, such as Figures 1-3As shown, the probe 10 includes an integrally arranged U-shaped portion 101 and an extension portion 102; the extension portion 102 is arranged on one end of the U-shaped portion 101 and extends in a direction away from the other end of the U-shaped portion 101, and the extension portion 102 is located at the end of the corresponding end of the U-shaped portion 101; an elastic support member 20 is arranged between the two ends of the U-shaped portion 101 to only strengthen the elastic performance of the U-shaped portion 101; a groove 30 extending from one end to the other end is arranged on the U-shaped portion 101, and the bottom surface of the groove 30 is aligned with the two ends / arms of the U-shaped portion 101. The U-shaped portion 101 is parallel to the same plane, thereby improving the deformation resistance of the U-shaped portion 101 along the direction perpendicular to the arrangement direction of its two ends, and increasing the stability of the structure; the first contact portion 40 and the second contact portion 50 are respectively provided on the end opposite to the extension portion 102 and the U-shaped portion 101, so as to facilitate contact and conduction with the workpiece to be tested and the test equipment; the overall structure of the probe 10 is simple, and the integrated structure is more convenient to manufacture, which greatly reduces the number of parts, simplifies the assembly process, and further reduces the production cost, and can carry a larger current.

[0027] In this embodiment, the U-shaped portion 101 and the extension portion 102 are both thin-sheet structures and are arranged on the same plane, so as to further improve the bearing performance of the probe 10 in the longitudinal direction and improve the stability of the elastic support.

[0028] In this embodiment, the elastic support member 20 is coaxial with the extension portion 102 to ensure that the pressure of the extension portion 102 on the U-shaped portion 101 is coaxially transmitted from one end thereof to the corresponding position at the other end, thereby maximizing the elastic performance of the U-shaped portion 101; further, the elastic support member 20 is a spring, and the two ends of the elastic support member 20 are respectively detachably connected to the two ends of the U-shaped portion 101 to facilitate assembly or disassembly.

[0029] In this embodiment, positioning protrusions 60 are provided on the opposite side walls at both ends of the U-shaped portion 101, and sleeve portions 21 are provided at both ends of the elastic support member 20 corresponding to the positioning protrusions 60. When assembled in place, the sleeve portions 21 are tightly sleeved on the positioning protrusions 60 to realize a detachable connection between the spring and the U-shaped portion 101.

[0030] In this embodiment, two grooves 30 are provided and are respectively located on the left and right side walls of the U-shaped portion 101 to form an I-shaped cross-section structure to further enhance the longitudinal structural strength of the U-shaped portion 101, enhance the elastic performance, and increase the deformation resistance of the U-shaped portion 101 in the lateral direction.

[0031] In this embodiment, one end of the groove 30 close to the extension portion 102 extends onto the extension portion 102 , while the other end of the groove 30 only extends to the middle of the other end of the U-shaped portion 101 to further enhance the lateral anti-deformation capability.

[0032] In this embodiment, the sum of the depths of the two grooves 30 is less than the thickness of the U-shaped portion 101 to ensure that the thickness of the U-shaped portion 101 between the bottom surfaces of the two grooves 30 is sufficient.

[0033] In this embodiment, a V-shaped groove 70 is provided on the end surface of the extension portion 102 facing away from the U-shaped portion 101. Bevels 80 are provided on both sides of the V-shaped groove 70 on the extension portion 102, and the two bevels 80 are arranged in a V shape; the two bevels 80 and the V-shaped groove 70 together form a first contact portion 40 to facilitate connection with the detection device.

[0034] In this embodiment, a conical protrusion 90 is provided on the side wall of the U-shaped portion 101 away from the extension portion 102, that is, a conical protrusion 90 is provided on the lower end surface of the probe 10. There are a plurality of the conical protrusions 90 and at least one of the conical protrusions 90 is collinear with the extension portion 102. The plurality of conical protrusions 90 together form a second contact portion 50. Specifically, there are two conical protrusions 90 adjacent to each other directly below the spring, and there is a conical protrusion 90 on the other side of the two conical protrusions 90 away from the spring. The two rows of gold fingers on the connector can be respectively contacted through the three conical protrusions 90.

[0035] It should be understood that those of ordinary skill in the art can make improvements or transformations according to the above description, and all such improvements and transformations should fall within the protection scope of the appended claims of the present invention.

Claims

1. A leaf spring test probe, characterized in that: The probe comprises a U-shaped portion and an extension portion; the extension portion is arranged on one end of the U-shaped portion and extends in a direction away from the other end of the U-shaped portion, an elastic support member is arranged between the two ends of the U-shaped portion, the U-shaped portion is provided with a groove extending from one end to the other end, and the bottom surface of the groove is parallel to the same plane where the two ends of the U-shaped portion are located; the first contact portion and the second contact portion are respectively arranged on the ends of the extension portion and the U-shaped portion that are away from each other.

2. The leaf spring test probe according to claim 1, characterized in that: The U-shaped portion and the extension portion are both sheet-like structures and are arranged on the same plane.

3. The leaf spring test probe according to claim 2, characterized in that: The elastic supporting member is coaxial with the extending portion.

4. The leaf spring test probe according to claim 3, characterized in that: The elastic support member is a spring, and two ends of the elastic support member are detachably connected to two ends of the U-shaped portion respectively.

5. The leaf spring test probe according to claim 4, characterized in that: Positioning protrusions are provided on the opposite side walls at both ends of the U-shaped portion, and sleeve portions are provided at both ends of the elastic support member corresponding to the positioning protrusions. When assembled in place, the sleeve portions are sleeved on the positioning protrusions.

6. The leaf spring test probe according to claim 2, characterized in that: The grooves are provided with two and are respectively located on the left and right side walls of the U-shaped portion.

7. The leaf spring test probe according to claim 6, characterized in that: One end of the groove close to the extending portion extends onto the extending portion.

8. The leaf spring test probe according to claim 7, characterized in that: The sum of the depths of the two grooves is less than the thickness of the U-shaped portion.

9. The leaf spring test probe according to claim 1, characterized in that: A V-shaped groove is provided on the end surface of the extension portion facing away from the U-shaped portion, and inclined surfaces are provided on both sides of the extension portion, and the two inclined surfaces are arranged in an eight-shaped shape; the two inclined surfaces and the V-shaped groove together form the first contact portion.

10. The leaf spring test probe according to claim 1, characterized in that: A conical protrusion is provided on a side wall of the U-shaped portion away from the extension portion. There are multiple conical protrusions and at least one of the conical protrusions is colinear with the extension portion; the multiple conical protrusions together form the second contact portion.

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