Capacitor size expansion test sorting device

By designing a test sorting device suitable for large-size capacitors, the problem that ESI tester cannot detect large-size capacitors is solved, and automated testing is realized, reducing material dropout and material pickup rate, improving production efficiency and saving labor costs.

CN223069960UActive Publication Date: 2025-07-08YUANLIU HONGYUAN (SUZHOU) ELECTRONIC TECH CO LTD
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Patent Information

Application Number
CN202422141257.0
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-09-02
Publication Date
2025-07-08
Estimated Expiration
2034-09-02

AI Technical Summary

Technical Problem

The existing ESI allego3500 series test machines cannot detect capacitor products with thickness of 0805E and size of 1206, resulting in high material dropout rate and material closure of large-sized products during the test.

Method used

A capacitor size extension test sorting device is designed, including a test plate, a feeding assembly and a blowing plate. A capacitor implantation ring and an implantation hole are installed on the test plate. The feeding assembly is connected to the feeding hose through an arc-shaped metal tube. The blowing plate is equipped with a blowing hole. The fiber detection hole is used to detect abnormalities and meets the testing needs of large-sized capacitors.

Benefits of technology

It realizes automated testing of large-size capacitor products on ESI testing machines, reducing material dropout and material pick-up rate, improving production efficiency and saving labor costs.

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Abstract

The utility model discloses a capacitor size expansion testing and sorting device which comprises a testing disc, a material receiving assembly and an air blowing plate. The peripheral side of the surface of the test disc is provided with a plurality of circles of capacitor implanting rings which take the center point of the test disc as the center of a circle and are arranged at equal intervals in a circular ring shape, and each capacitor implanting ring is provided with capacitor implanting holes with the same number. The capacitor implanting holes in the adjacent capacitor implanting rings are radially arranged from inside to outside by taking the center point of the test disc as a circle center; the material receiving assembly is arranged above the test disc and comprises a plurality of material receiving joints which are linearly arranged and are arranged corresponding to the capacitor implanting holes, and a plurality of material receiving hoses which are connected with the tail ends of the material receiving joints in a one-to-one correspondence manner; the air blowing plate is arranged below the test disc, and a plurality of air blowing holes corresponding to the capacitor implanting holes are formed in the air blowing plate; the device has the advantages that the problems that a large-size product cannot be tested on an ESI testing machine, the material falling rate is high, and the material is blocked by the material receiving pipe are solved.
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Description

Technical Field

[0001] The utility model belongs to the technical field of capacitance testing, and particularly relates to a capacitance size expansion test and sorting device. Background Art

[0002] A multilayer ceramic chip capacitor is formed by laminating printed electrode ceramic dielectric films in a staggered manner, sintering them at high temperature once to form a ceramic chip, and then sealing metal layers (outer electrodes) at both ends of the chip, thus forming a monolithic-like structure, so it is also called a monolithic capacitor. Currently, during the production process of monolithic capacitors, a testing machine is required to test their performance, and a test tray is used during the testing process to accommodate and fix the position of the capacitors.

[0003] However, the existing ESI allego3500 series testing machines cannot detect capacitor products with a thickness of 0805E and a size of 1206. The main problem is that the size of 0805E and 1206 products has become larger, and the positions, sizes, and quantities of the holes on the test tray of the existing ESI testing machine, the positions and sizes of the air holes on the air blowing plate, and the material receiving method at the material receiving port cannot be compatible, resulting in problems such as large-size products being unable to complete implantation testing on the ESI testing machine, a high dropping rate, and material jamming in the material receiving tube. Summary of the Invention

[0004] The purpose of the utility model is to provide a capacitance size expansion test and sorting device to solve the problems that large-size products cannot be tested on the ESI testing machine, have a high dropping rate, and the material receiving tube is jammed.

[0005] The technical solution of the utility model is: A capacitance size expansion test and sorting device, comprising:

[0006] A test tray, on the outer peripheral side of the surface of the test tray, there are several circles of capacitance implantation rings arranged at equal intervals in a circular ring shape with the center point of the test tray as the center of the circle, and on each capacitance implantation ring, there are the same number of capacitance implantation holes, and the capacitance implantation holes on adjacent capacitance implantation rings are arranged radially from the inside to the outside with the center point of the test tray as the center of the circle;

[0007] A material receiving assembly, the material receiving assembly is arranged above the test tray, and it includes several linearly arranged material receiving connectors corresponding to the capacitance implantation holes, and several material receiving hoses respectively connected to the ends of the material receiving connectors;

[0008] And an air blowing plate, the air blowing plate is arranged below the test tray, and several air holes corresponding to the capacitance implantation holes are arranged on the air blowing plate.

[0009] As a preferred technical solution, a number of fiber optic detection holes are provided at equal intervals on each capacitor implantation ring and between adjacent capacitor implantation holes.

[0010] As a preferred technical solution, a circular mounting hole is provided at the center point of the test disc, and two square positioning holes are provided on the test disc and symmetrically arranged on both sides of the circular mounting hole.

[0011] As a preferred technical solution, 8 rings of capacitor implantation rings are provided on the outer peripheral side of the surface of the test disc, and 25 capacitor implantation holes are provided at equal intervals on each ring of capacitor implantation rings.

[0012] As a preferred technical solution, the material receiving joint is an arc-shaped metal tube, and a metal connecting seat integrally formed therewith is provided at the material receiving port of the material receiving joint.

[0013] As a preferred technical solution, the material receiving port of the arc-shaped metal tube is an oval hole, and the short axis length of the oval hole is 5 mm and the long axis length is 11 mm.

[0014] As a preferred technical solution, the air blowing hole is a first circular hole, and the aperture of the first circular hole is 0.6 mm.

[0015] As a preferred technical solution, the fiber optic detection hole is a second circular hole, and the aperture of the second circular hole is 2 mm.

[0016] As a preferred technical solution, the test disc is a circular epoxy resin board.

[0017] The advantages of the present utility model are as follows:

[0018] 1. The present utility model mainly solves the bottleneck that the original equipment cannot produce large-size products, enabling large-size products to be tested by machines instead of manually, which not only improves efficiency but also saves manual time and reduces production costs.

[0019] 2. The design of the material receiving port of the material receiving joint of the present utility model improves the situation of high material jamming, blockage, and dropping rate, thereby reducing the porcelain damage caused by the collision of the product inside the material receiving joint. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the technical solutions of the embodiments of the present utility model, the drawings required for the description of the embodiments will be briefly introduced below. The drawings in the following description are only some embodiments of the present utility model. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0021] The present utility model will be further described below in conjunction with the drawings and embodiments:

[0022] Figure 1 This is an assembly schematic diagram of the test plate, the material receiving component and the air blowing plate of the present utility model;

[0023] Figure 2 This is a structural schematic diagram of the test plate of the present utility model;

[0024] Figure 3 This is a structural schematic diagram of the material receiving component of the present utility model;

[0025] Figure 4 This is a structural schematic diagram of the air blowing plate of the present utility model;

[0026] Figure 5 is Figure 2 a partial enlarged schematic diagram of A in

[0027] Wherein: 1 is the test plate, 11 is the capacitor implantation ring, 12 is the capacitor implantation hole, 13 is the optical fiber detection hole, 14 is the circular mounting hole, 15 is the square positioning hole;

[0028] 2 is the material receiving component, 21 is the material receiving joint, 22 is the metal connection seat, 23 is the oval hole;

[0029] 3 is the air blowing plate, 31 is the air blowing hole. Specific embodiments

[0030] The above solution will be further described below in conjunction with specific embodiments. It should be understood that these embodiments are used to illustrate the present utility model and are not limited to restricting the scope of the present utility model. The implementation conditions adopted in the embodiments can be further adjusted according to the conditions of specific manufacturers, and the implementation conditions not specified are usually the conditions in conventional experiments.

[0031] Embodiment: Refer to Figures 1 to 5 As shown, a capacitance size expansion test and sorting device includes a test plate 1, a material receiving component 2, and an air blowing plate 3; a plurality of circles of capacitor implantation rings 11 are arranged at equal intervals in a circular shape with the center point of the test plate 1 as the center on the peripheral side of the surface of the test plate 1, and the same number of capacitor implantation holes 12 are provided on each capacitor implantation ring 11, and the capacitor implantation holes 12 on adjacent capacitor implantation rings 11 are arranged radially from the inside to the outside with the center point of the test plate 1 as the center; the material receiving component 2 is arranged above the test plate 1, and it includes a plurality of linearly arranged material receiving joints 21 corresponding to the capacitor implantation holes 12, and a plurality of material receiving hoses (the material receiving hoses are made of transparent material and are not drawn in the figure) connected to the ends of the material receiving joints 21 one by one; the air blowing plate 3 is arranged below the test plate 1, and a plurality of air blowing holes 31 corresponding to the capacitor implantation holes 12 are provided on the air blowing plate 3.

[0032] Refer to Figure 1 , Figure 2, Figure 5 As shown in Figure 5 , in this embodiment, a plurality of fiber optic detection holes 13 are provided on each capacitor implantation ring 11 and are equally spaced between adjacent capacitor implantation holes 12. The fiber optic detection holes 13 are used in conjunction with a fiber optic detector, that is, a light beam is allowed to pass through the fiber optic detection holes 13 to ensure that the rotation of the test disk 1 can be smoothly detected for any abnormalities.

[0033] Refer to Figure 1 , Figure 2 As shown in Figure 2 , in this embodiment, a circular mounting hole 14 is provided at the center point of the test disk 1, and two square positioning holes 15 are provided on the test disk 1 and are symmetrically arranged on both sides of the circular mounting hole 14. The test disk 1 is fixedly connected to the output shaft end of the rotation drive and rotates around its center point.

[0034] Refer to Figure 1 , Figure 2 As shown in Figure 2 , in this embodiment, 8 rings of capacitor implantation rings 11 are provided on the outer peripheral side of the surface of the test disk 1, and 25 equally spaced capacitor implantation holes 12 are provided on each ring of capacitor implantation rings 11. That is, the capacitor implantation holes 12 on the test disk 1 are changed from the original 800 square holes to 200 square holes, and the size of each square hole matches the capacitor to be detected.

[0035] Refer to Figure 3 As shown in Figure 3 , in this embodiment, the material receiving joint 21 is an arc-shaped metal tube, and a metal connecting seat 22 integrally formed therewith is provided at the material receiving port of the material receiving joint 21; the material receiving port of the arc-shaped metal tube is an elliptical hole 23, the short axis length of the elliptical hole 23 is 5 mm, and the long axis length is 11 mm. After the improvement, the material dropping rate is reduced to less than 1%.

[0036] Refer to Figure 4 , Figure 5 As shown in Figure 5 , in this embodiment, the air blowing hole 31 is a first circular hole with a hole diameter of 0.6 mm; the fiber optic detection hole 13 is a second circular hole with a hole diameter of 2 mm.

[0037] In this embodiment, the test disk 1 is a circular epoxy resin plate, which has good dimensional stability and durability to improve the service life of the test disk 1.

[0038] The above embodiments are only used to illustrate the technical concept and characteristics of the present invention. The purpose is to enable those skilled in the art to understand the content of the present invention and implement it accordingly, and it cannot be used to limit the protection scope of the present invention. Any equivalent changes or modifications made according to the spirit and essence of the present invention should be covered within the protection scope of the present invention.

Claims

1. A capacitance size expansion test and sorting device, characterized in that Including: A test plate, on the peripheral side of the surface of the test plate, there are several rings of capacitance implantation rings arranged at equal intervals in a circular shape with the center point of the test plate as the center of the circle. On each capacitance implantation ring, the same number of capacitance implantation holes are provided, and the capacitance implantation holes on adjacent capacitance implantation rings are arranged radially from the inside to the outside with the center point of the test plate as the center of the circle; A material receiving component, the material receiving component is arranged above the test plate, and it includes several linearly arranged material receiving connectors corresponding to the capacitance implantation holes, and several material receiving hoses respectively and correspondingly connected to the ends of the material receiving connectors; And a blowing plate, the blowing plate is arranged below the test plate, and several blowing holes corresponding to the capacitance implantation holes are provided on the blowing plate.

2. The capacitance size expansion test and sorting device according to claim 1, wherein On each capacitance implantation ring and between adjacent capacitance implantation holes, several fiber optic detection holes are arranged at equal intervals.

3. The capacitance size expansion test and sorting device according to claim 1, characterized in that At the center point of the test plate, a circular mounting hole is provided, and on the test plate and on both sides of the circular mounting hole, two square positioning holes symmetrically arranged left and right are provided.

4. The capacitance size expansion test and sorting device according to claim 1, wherein On the peripheral side of the surface of the test plate, 8 rings of capacitance implantation rings are provided, and on each ring of capacitance implantation rings, 25 capacitance implantation holes arranged at equal intervals are provided.

5. The capacitance size expansion test and sorting device according to claim 1, wherein The material receiving connector is an arc-shaped metal tube, and a metal connection seat integrally formed with it is provided at the material receiving port of the material receiving connector.

6. The capacitance size expansion test and sorting device according to claim 5, characterized in that The material receiving port of the arc-shaped metal tube is an oval hole, the short axis length of the oval hole is 5 mm, and the long axis length is 11 mm.

7. The capacitance size expansion test and sorting device according to claim 1, characterized in that The blowing hole is a first circular hole, and the aperture of the first circular hole is 0.6 mm.

8. The capacitance size expansion test and sorting device according to claim 2, characterized in that, The fiber optic detection hole is a second circular hole, and the aperture of the second circular hole is 2 mm.

9. The capacitance size expansion test and sorting device according to claim 1, wherein The test plate is a circular epoxy resin plate.