Reading head test platform
By designing a reading head test platform, the synchronous testing of multiple reading heads is achieved using the fastening system and the grating scale, the problem of inefficiency of traditional testing methods is solved and efficient and accurate reading head test is achieved.
Patent Information
- Application Number
- CN202422260412.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-14
- Publication Date
- 2025-07-08
- Estimated Expiration
- 2034-09-14
AI Technical Summary
Traditional reading head testing methods are inefficient, the installation and replacement of reading heads are complicated, and it is difficult to ensure that the spatial position of the test system remains unchanged, affecting the accuracy of the test results.
A reading head test platform is designed, including a fastening system and a grating scale, which can fix multiple reading heads at the same time, and synchronous testing of multiple reading heads through the movement of the grating scale, combining lifting mechanism and spring-type contact probes to achieve automatic compression and communication connection, and is equipped with a hardware board for signal processing and configuration.
It improves the efficiency and accuracy of reading head testing, simplifies the installation and replacement process of reading heads, ensures the reliability and consistency of test results, and enhances the versatility and adaptability of the test platform.
Smart Images

Figure CN223077614U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of read head testing, in particular to a read head testing platform. Background Art
[0002] In the production process of read heads, various tests need to be carried out on the read heads to ensure their performance and quality. The traditional method for testing read heads is that one read head corresponds to one test system. This method is inefficient, and the installation and replacement processes of the read heads are complex and time-consuming. Moreover, when replacing the read head, it is difficult to ensure the relative position of the entire test system in space remains unchanged, thus affecting the accuracy of the test results. Therefore, it is necessary to improve the existing technology.
[0003] The above information is given as background information only to assist in understanding the present disclosure, and does not determine or admit whether any of the above content can be used as the prior art relative to the present disclosure. Summary of the Utility Model
[0004] The utility model provides a read head testing platform to solve the problems existing in the prior art.
[0005] To achieve the above object, the utility model provides the following technical solutions:
[0006] A read head testing platform includes a base, and further includes:
[0007] A fastening system, including a fixed seat provided on the base, the fixed seat is provided with a plurality of read head workstations for placing read heads, and a pressing assembly for pressing the read head against the read head workstation;
[0008] A grating scale, the grating scale is arranged opposite to the fixed seat and is movably connected to the base, and the grating scale can be driven to move in a first direction to approach or move away from the fixed seat.
[0009] Optionally, the pressing assembly includes:
[0010] A lifting mechanism, including a lifting guide rail provided on the fixed seat, and a lifting seat slidably connected to the lifting guide rail, the lifting seat can be driven to perform a lifting movement relative to the fixed seat;
[0011] A spring-type contact probe is provided on the lifting seat, and the spring-type contact probe is used to press the read head and simultaneously establish a communication connection with the read head when descending with the lifting seat to contact the read head.
[0012] Optionally, the pressing assembly further includes a force control valve, and the force control valve is connected between the lifting seat and the spring-type contact probe for controlling the pressure exerted by the spring-type contact probe on the read head within a predetermined range.
[0013] Optionally, the reading head test platform further includes a toggle switch, which is used to be electrically or mechanically connected to the lifting seat to control the lifting movement of the lifting seat.
[0014] Optionally, a transverse guide rail is provided on the fixed seat, the transverse guide rail is arranged in a second direction perpendicular to the first direction, and a sliding seat is slidably connected to the transverse guide rail, and the fixed seat is arranged on the sliding seat.
[0015] Optionally, a bubble level for detecting and adjusting the levelness is respectively installed on the fixed seat and the grating scale.
[0016] Optionally, the lifting seat is connected with a first driving member; the reading head test platform further includes a hardware board, and the hardware board includes a first driving control circuit connected to the first driving member, and the first driving control circuit is used to control the first driving member to drive the lifting seat to perform a lifting movement.
[0017] Optionally, the grating scale is connected with a second driving member; the hardware board further includes a second driving control circuit connected to the second driving member, and the second driving control circuit is used to control the second driving member to drive the grating scale to move along the first direction.
[0018] Optionally, the hardware board further includes a host computer interaction circuit, and the host computer interaction circuit is electrically connected to both the host computer and the spring contact probe, and is used to connect to the reading head through the spring contact probe to receive the communication signal and pulse output signal from the reading head.
[0019] Optionally, the hardware board further includes a configuration parameter communication circuit, and the configuration parameter communication circuit is used to write the default configuration to the reading head through the spring contact probe in a polling manner.
[0020] Compared with the prior art, the present utility model has the following beneficial effects:
[0021] A reading head test platform provided by the present utility model fixes a plurality of reading heads by setting a fastening system, eliminating the disassembly, installation and replacement actions of the reading heads; by enabling the grating scale to move relative to the reading heads, multiple reading heads can be simultaneously tested for the same movement, which is beneficial to ensuring the accuracy of the test results.
[0022] The present utility model has other characteristics and advantages, which will be obvious from the accompanying drawings incorporated herein and the subsequent detailed description, or will be described in detail in the accompanying drawings incorporated herein and the subsequent detailed description, and these accompanying drawings and detailed description are used together to explain the specific principles of the present utility model. Description of the Drawings
[0023] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for the description of the embodiments or the prior art. Obviously, the drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained based on these drawings.
[0024] Figure 1 It is a schematic structural diagram of a reading head test platform provided by the present invention;
[0025] Figure 2 It is a schematic circuit connection diagram of a reading head test platform provided by the present invention;
[0026] Figure 3 It is another schematic structural diagram of a reading head test platform provided by the present invention;
[0027] Figure 4 It is yet another schematic structural diagram of a reading head test platform provided by the present invention;
[0028] Figure 5 It is another schematic circuit connection diagram of a reading head test platform provided by the present invention.
[0029] Reference numerals: 10, base; 20, fixed seat; 21, reading head station; 221, lifting guide rail; 222, lifting seat; 223, spring contact probe; 23, transverse guide rail; 231, sliding seat; 30, grating scale; 50, hardware board; 51, first drive control circuit; 52, second drive control circuit; 53, host computer interaction circuit; 54, configuration parameter communication circuit; 55, pulse output reading module. Detailed implementation manners
[0030] To elaborate in detail on the possible application scenarios, technical principles, implementable specific solutions, achievable objectives and effects, etc. of the present application, the following will be described in detail in conjunction with the specific embodiments listed and the accompanying drawings. The embodiments recorded herein are only used to more clearly illustrate the technical solutions of the present application, so they are only examples and cannot be used to limit the protection scope of the present application.
[0031] Reference to "embodiment" in this document means that the specific features, structures, or characteristics described in connection with the embodiment may be included in at least one embodiment of this application. The term "embodiment" appearing in various positions in the specification does not necessarily refer to the same embodiment, nor does it particularly define its independence or relevance to other embodiments. In principle, in this application, as long as there is no technical contradiction or conflict, the various technical features mentioned in each embodiment can be combined in any way to form corresponding implementable technical solutions.
[0032] Unless otherwise defined, the meanings of the technical terms used in this document are the same as those commonly understood by those skilled in the technical field to which this application belongs; the use of the relevant terms in this document is only for describing specific embodiments and is not intended to limit this application.
[0033] In the description of this application, the term "and / or" is an expression used to describe the logical relationship between objects, indicating that three relationships can exist. For example, A and / or B means: the existence of A, the existence of B, and the simultaneous existence of both A and B. In addition, the character " / " in this document generally represents an "or" logical relationship between the associated objects before and after.
[0034] In this application, terms such as "first" and "second" are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual quantitative, primary-secondary, or sequential relationship between these entities or operations.
[0035] Without further limitation, in this application, the expressions "include", "comprise", "have", or other similar expressions used in a statement are intended to cover non-exclusive inclusion. These expressions do not exclude the possibility that there may be additional elements in the process, method, or product that includes the said elements. Thus, a process, method, or product that includes a series of elements may include not only those defined elements, but also other elements not explicitly listed, or elements inherent to such a process, method, or product.
[0036] Similar to the understanding in the Examination Guidelines, in this application, expressions such as "greater than", "less than", "exceeding", etc. are understood not to include the number itself; expressions such as "above", "below", "within", etc. are understood to include the number itself. In addition, in the description of the embodiments of this application, the meaning of "multiple" is two or more (including two), and similar expressions related to "many", such as "multiple groups", "multiple times", etc., are understood in the same way, unless otherwise specifically defined.
[0037] In the description of the embodiments of the present application, the spatially related expressions used, such as "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "perpendicular", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc., the indicated orientation or positional relationship is based on the orientation or positional relationship shown in the specific embodiment or the drawings, and is only for the convenience of describing the specific embodiments of the present application or facilitating the understanding of the reader, rather than indicating or implying that the device or component referred to must have a specific position, a specific orientation, or be constructed or operated in a specific orientation. Therefore, it should not be construed as a limitation to the embodiments of the present application.
[0038] Unless otherwise clearly specified or limited, in the description of the embodiments of the present application, the terms such as "installed", "connected", "coupled", "fixed", "set", etc. shall be understood in a broad sense. For example, the "connection" may be a fixed connection, a detachable connection, or an integral setting; it may be a mechanical connection, an electrical connection, or a communication connection; it may be directly connected, or indirectly connected through an intermediate medium; it may be the communication inside two elements or the interaction relationship between two elements. For those skilled in the art to which the present application pertains, the specific meanings of the above terms in the embodiments of the present application can be understood according to specific circumstances.
[0039] Please refer to Figures 1 to 5 , an embodiment of the present invention provides a reading head test platform, including a base 10, and the base 10 provides stable support for the entire test platform.
[0040] Specifically, the reading head test platform further includes a fastening system, including a fixing seat 20 provided on the base 10, a plurality of reading head stations 21 for placing reading heads are provided on the fixing seat 20, and a pressing assembly for pressing the reading head onto the reading head station 21; by providing a plurality of reading head stations 21 on the fixing seat 20, a plurality of reading heads can be tested simultaneously, thereby greatly improving the test efficiency. Specifically, each reading head station 21 is constituted by a fixing groove opened on the fixing seat 20, and this fixing groove is used to realize the positioning and placement of the reading head.
[0041] Furthermore, a grating scale 30 is further provided on the base 10, the grating scale 30 is disposed opposite to the fixing seat 20, and is movably connected to the base 10, and the grating scale 30 can be driven to move in a first direction to approach or move away from the fixing seat 20.
[0042] By movably connecting the grating scale 30 to the base 10, the relative position between the grating scale 30 and the reading head can be flexibly adjusted, enabling multiple reading heads to test the same movement of the grating scale 30. At the same time, it is also possible to switch between different test scenarios, enhancing the versatility and adaptability of the test platform.
[0043] Further, the pressing assembly includes a lifting mechanism. The lifting mechanism includes a lifting guide rail 221 provided on the fixed seat 20, and a lifting seat 222 slidably connected to the lifting guide rail 221. The lifting seat 222 can be driven to move up and down relative to the fixed seat 20.
[0044] The pressing assembly further includes a spring-type contact probe 223. The reading head test platform includes a hardware board 50. The hardware board 50 is connected to each spring-type contact probe 223 through ABZ signal lines. The spring-type contact probe 223 is provided on the lifting seat 222. When the lifting seat 222 descends, the spring-type contact probe 223 contacts the reading head. On the one hand, it is used to press the reading head, and on the other hand, it is used to connect the test points reserved on the PCB of the reading head to establish a communication connection with the reading head.
[0045] Among them, the lifting seat 222 is connected to a first driving member. The hardware board 50 includes a first driving control circuit 51. The first driving control circuit 51 is used to control the first driving member to drive the lifting seat 222 to move up and down.
[0046] In this embodiment, the lifting movement of the lifting seat 222 is accurately controlled by the first driving control circuit 51, improving the automation degree and accuracy of the operation. The pressing assembly can flexibly adjust the height to adapt to the pressing requirements of reading heads of different sizes, enhancing the versatility of the test platform. It can also accurately control the pressing force, ensuring that the reading head is stably fixed at the working position while avoiding damaging the reading head due to excessive pressure. Further, the pressing assembly further includes a force control valve. The force control valve is connected between the lifting seat 222 and the spring-type contact probe 223, and is used to control the pressure exerted by the spring-type contact probe 223 on the reading head within a predetermined range, ensuring that the reading head can be firmly pressed without damaging the PCB of the reading head.
[0047] Specifically, the force control valve is arranged at the position where the lifting seat 222 is connected to the spring-type contact probe 223. When the lifting seat 222 drives the spring-type contact probe 223 to descend, the force control valve can move together with the spring-type contact probe 223. When the spring-type contact probe 223 contacts and presses the reading head, the force control valve can play a role in a timely manner to ensure that the spring-type contact probe 223 can effectively press the test points reserved on the PCB of the reading head without damaging the test points.
[0048] Furthermore, the reading head test platform further includes a toggle switch, which is used to be electrically or mechanically connected to the lifting seat 222 to control the lifting movement of the lifting seat 222.
[0049] Specifically, in one implementation, the toggle switch is connected through a mechanical transmission structure. When the toggle switch is operated, the acting force is transmitted to the lifting seat 222 through the mechanical transmission structure, thereby controlling the lifting movement of the lifting seat 222. It can be understood that the mechanical transmission structure can be a transmission structure such as a combination of a gear and a rack or a pulley and rope system.
[0050] In another implementation, the toggle switch is electrically connected to the first driving member that drives the lifting seat 222 to move through a circuit. When the toggle switch is operated, a corresponding electrical signal can be triggered, and the electrical signal is transmitted to the first driving member through the circuit, thereby driving the lifting seat 222 to perform a lifting movement.
[0051] Furthermore, in this embodiment, a transverse guide rail 23 is provided on the fixed seat 20, and the transverse guide rail 23 is arranged in a second direction perpendicular to the first direction. A sliding seat 231 is slidably connected to the transverse guide rail 23, and the fixed seat 20 is arranged on the sliding seat 231. By providing the transverse guide rail 23, the offset position of the reading head relative to the grating scale 30 in the transverse direction can be adjusted as needed, eliminating the offset error, so as to meet the precise requirements for the relative position between the reading head and the grating scale 30 in different test scenarios.
[0052] In this embodiment, the grating scale 30 is placed below the reading head station 21. In order to install more reading head stations 21, a longer grating scale 30 can be selected, and the grating scale 30 has as wide a ruled line as possible to reduce the influence of the horizontal offset error on the test.
[0053] Furthermore, the grating scale 30 is connected to a second driving member, and the second driving control circuit 52 in the hardware board 50 is used to control the second driving member to drive the grating scale 30 to move in the first direction, thereby realizing relative movement with the reading head.
[0054] In this embodiment, bubble levels are respectively installed on the fixed seat 20 and the grating scale 30, and the bubble levels are used to detect and adjust their respective levels.
[0055] Based on the foregoing structure, the vertical distance between the grating scale 30 and the reading head station 21 is adjusted by moving the grating scale 30, and the horizontal offset between the grating scale 30 and the reading head is adjusted by moving the fastening system along the transverse guide rail 23. In addition, the fixed seat 20 can be rotatably connected to the base 10, and the inclination angle between the reading head and the grating scale 30 can be adjusted by rotating the fixed seat 20, so that the relative angle between the reading head and the grating scale 30 reaches the optimal test state, ensuring the accuracy and reliability of the test results.
[0056] Furthermore, the hardware board 50 further includes a host computer interaction circuit 53, which is electrically connected to each spring contact probe 223 and is used to connect to the reading head through the spring contact probe 223 to receive the communication signal and pulse output signal from the reading head.
[0057] It can be understood that the host computer interaction circuit 53 establishes a data transmission channel through the electrical connection with the host computer and the spring contact probe 223. When the spring contact probe 223 contacts the reading head, the signal of the reading head is transmitted to the host computer interaction circuit 53, and then this circuit transmits the signal to the host computer for processing and analysis. Based on this, the host computer interaction circuit 53 realizes the efficient communication connection between the hardware board 50, the host computer and the reading head, improves the intelligence level and data processing ability of the test platform, can quickly receive the communication signal and pulse output signal of the reading head, and provides an accurate data source for subsequent data analysis and processing. At the same time, after being pressed tightly, the host computer interaction circuit 53 automatically tests the communication connection with the reading head, confirms whether the reading head is installed correctly, and feedbacks the abnormality through prompt information such as indicator lights or sounds in case of abnormality.
[0058] The hardware board 50 further includes a configuration parameter communication circuit 54, which is used to write the default configuration to the reading head through the spring contact probe 223 in a polling manner. It can be understood that the configuration parameter communication circuit 54 is connected to the reading head through the spring contact probe 223 and configures each reading head one by one in a polling manner to ensure that each reading head can obtain the correct default configuration parameters, can quickly configure multiple reading heads uniformly, and improves the versatility and operability of the test platform.
[0059] Furthermore, the hardware board 50 further includes: a pulse output reading module 55, which is used to send instructions to the servo or linear motor driver to make the motor drive the grating scale 30 to move relative to the reading head group. It can be understood that the pulse output reading module 55 reads the optical signal input quality information of each reading head and judges three situations: normal signal, self-tuning is required due to production consistency problems, and abnormal and cannot be tuned; furthermore, the pulse output reading module 55 reads and records the pulse output of the reading head in parallel and synchronously, and compares it with the preset value to identify abnormal outputs such as phase loss and step loss. When input signal abnormalities occur in batches, such as relatively consistent signal offsets occurring simultaneously in multiple reading heads, the pulse output reading module 55 will alarm and prompt to stop working, so as to facilitate the execution of self-check operations to confirm whether system abnormalities have occurred, such as level errors, pollution of the grating scale 30, etc.
[0060] Although terms such as read head test platform are used more frequently in this application, the possibility of using other terms is not excluded. The use of these terms is only for the convenience of describing and explaining the essence of the present utility model; interpreting them as any additional limitation is contrary to the spirit of the present utility model.
[0061] Finally, it should be noted that although the above embodiments have been described in the text of the specification and the drawings of this application, the patent protection scope of this application cannot be limited thereby. Any technical solutions obtained by equivalent structure or equivalent process substitution or modification based on the essential concept of this application and using the content recorded in the text of the specification and the drawings of this application, as well as those directly or indirectly implementing the technical solutions of the above embodiments in other related technical fields, are all included in the patent protection scope of this application.
Claims
1. A reading head test platform, characterized in that It includes a base, and further includes: A fastening system, including a fixed seat provided on the base, multiple reading head stations provided on the fixed seat for placing reading heads, and a pressing component for pressing the reading head against the reading head station; A grating scale, which is arranged opposite to the fixed seat and is movably connected to the base, and the grating scale can be driven to move in a first direction to approach or move away from the fixed seat.
2. The reading head test platform according to claim 1, characterized in that, The pressing component includes: A lifting mechanism, including a lifting guide rail provided on the fixed seat, and a lifting seat slidably connected to the lifting guide rail, and the lifting seat can be driven to perform a lifting motion relative to the fixed seat; A spring-type contact probe, which is provided on the lifting seat, and the spring-type contact probe is used for pressing the reading head and simultaneously establishing a communication connection with the reading head when descending with the lifting seat to contact the reading head.
3. The read head test platform according to claim 2, characterized in that, The pressing component further includes a force control valve, and the force control valve is connected between the lifting seat and the spring-type contact probe for controlling the pressure exerted by the spring-type contact probe on the reading head within a predetermined range.
4. The reading head test platform according to claim 2, characterized in that, It further includes a toggle switch, and the toggle switch is used for electrically or mechanically connecting to the lifting seat to control the lifting motion of the lifting seat.
5. The reading head test platform according to claim 2, characterized in that, A transverse guide rail is provided on the fixed seat, the transverse guide rail is arranged in a second direction perpendicular to the first direction, and a sliding seat is slidably connected to the transverse guide rail, and the fixed seat is arranged on the sliding seat.
6. The reading head test platform according to claim 2, characterized in that, Bubble spirit levels for detecting and adjusting the levelness are respectively installed on the fixed seat and the grating scale.
7. The reading head testing platform according to claim 2, characterized in that, The lifting seat is connected to a first driving member; the reading head test platform further includes a hardware board, and the hardware board includes a first driving control circuit connected to the first driving member, and the first driving control circuit is used for controlling the first driving member to drive the lifting seat to perform a lifting motion.
8. The read head test platform according to claim 7, characterized in that The grating scale is connected to a second driving member; the hardware board further includes a second driving control circuit connected to the second driving member, and the second driving control circuit is used for controlling the second driving member to drive the grating scale to move in the first direction.
9. The reading head test platform according to claim 8, characterized in that The hardware board further includes a host computer interaction circuit, and the host computer interaction circuit is electrically connected to both the host computer and the spring-type contact probe, and is used for connecting to the reading head through the spring-type contact probe to receive communication signals and pulse output signals from the reading head.
10. The reading head test platform according to claim 9, characterized in that, The hardware board further includes a configuration parameter communication circuit, and the configuration parameter communication circuit is used for writing default configurations to the reading head in a polling manner through the spring-type contact probe.