Multi-channel transistor array test auxiliary device

Abstract

The utility model discloses a multipath transistor array test auxiliary device, which comprises a placing assembly, a clamping assembly and a rotating assembly, when the device is used, a plurality of pins of a transistor array are respectively inserted into pin holes, at the moment, the transistor array is lapped on the surface of a placing seat, then a driving motor is started to drive a threaded rod to rotate, and the rotating assembly is driven to rotate. The threaded cylinder and the pressing plate are driven to move downwards, so that the pressing plate is pressed on the top surface of the transistor array, the transistor array is fixed on the placing seat, and then pins and transistors are convenient to check; and during testing, the electric push rod can be started to drive the rack to move and drive the gear and the rotating shaft to rotate, so that the placement seat and the transistor array are driven to rotate together, and the transistor array can be conveniently tested from different angles.

Description

Technical Field

[0001] The utility model relates to the technical field of transistor arrays, in particular to a multi-channel transistor array test auxiliary device. Background Technique

[0002] With the improvement of the production process level of modern electronic components and the requirements of miniaturization and low cost of model products, transistor arrays are designed and produced and widely used in signal control circuits. A transistor array generally encapsulates two or more than two triodes of the same polarity (both NPN or both PNP) or different polarities (NPN or PNP respectively) in a dual-in-line straight-through package, so as to realize multi-channel signal transmission and achieve the purpose of reducing volume and cost.

[0003] Before a transistor array is put into use, in order to judge its reliability, parameter detection must be carried out. However, it is much more difficult to test than a single transistor, especially for transistor arrays of different polarities, and the screening difficulty is greater. At present, when developing and verifying programs for transistor types that cannot achieve multi-channel automatic testing, test clips are generally used to test individual devices. However, in order to ensure good contact, the test clips usually have a large clamping force, and the pins of the transistor array are relatively fragile, and the pins of the device are easily damaged during operation. Content of the Utility Model

[0004] The purpose of this part is to outline some aspects of the embodiments of the utility model and briefly introduce some preferred embodiments. Simplifications or omissions may be made in this part, as well as in the abstract and title of the specification of this application, to avoid obscuring the purpose of this part, the abstract of the specification, and the title of the utility model, and such simplifications or omissions shall not be used to limit the scope of the utility model.

[0005] In view of the above and / or problems existing in the prior art of a multi-channel transistor array test auxiliary device, the present utility model is proposed.

[0006] Therefore, the purpose of the present utility model is to provide a multi-channel transistor array test auxiliary device. When using this device, first insert the multiple pins of the transistor array into the pin holes respectively. At this time, the transistor array is placed on the surface of the placement seat. Then start the driving motor to drive the threaded rod to rotate, drive the threaded cylinder and the pressing plate to move downward, so that the pressing plate presses on the top surface of the transistor array, thereby fixing the transistor array on the placement seat, and then it is convenient to check the pins and the transistor; when testing, the electric push rod can also be started to drive the rack to move, drive the gear and the rotating shaft to rotate, so as to drive the placement seat and the transistor array to rotate together, which is convenient to test the transistor array from different angles.

[0007] To solve the above technical problems, according to one aspect of the present utility model, the following technical solutions are provided:

[0008] A multi-channel transistor array test auxiliary device, comprising:

[0009] A placement component, including a test bench, a mounting groove opened at the top of the test bench, rotating shafts symmetrically and rotatably mounted on the inner wall of the mounting groove, a placement table fixed on the rotating shafts, placement seats symmetrically fixed on the placement table, and pin holes uniformly penetrating through the placement seats;

[0010] A clamping component, including a motor frame fixed at the bottom of the placement table, a driving motor mounted on the motor frame, a threaded rod coaxially connected to the driving motor and rotatably mounted on the placement table, a threaded barrel engaged with the threaded rod, a guiding barrel fixed on the outer wall of the threaded barrel, a guiding rod inserted into the guiding barrel and fixed on the placement table, and a pressing plate fixed at the top end of the threaded barrel;

[0011] A rotating component, arranged on the outer wall of the test bench, capable of driving the rotating shaft to rotate.

[0012] As a preferred solution of the multi-channel transistor array test auxiliary device described in the present invention, wherein, the rotating component includes a fixing plate fixed on the outer wall of the test bench, an electric push rod fixed on the fixing plate, a rack fixed on the electric push rod, and a gear fixed on the rotating shaft and engaged with the rack.

[0013] As a preferred solution of the multi-channel transistor array test auxiliary device described in the present invention, wherein, a limiting hole is opened on the rack, a limiting rod is inserted into the limiting hole, and the limiting rod is fixed on the outer wall of the test bench.

[0014] As a preferred solution of the multi-channel transistor array test auxiliary device described in the present invention, wherein, rollers are symmetrically and rotatably mounted on the test bench, and brake pads are mounted on the rollers.

[0015] As a preferred solution of the multi-channel transistor array test auxiliary device described in the present invention, wherein, an elastic pad is fixed on the inner wall of the pressing plate.

[0016] Compared with the prior art, the beneficial effects of the present invention are:

[0017] (1) When using this device, first insert the multiple pins of the transistor array into the pin holes respectively. At this time, the transistor array is placed on the surface of the placement seat. Then start the driving motor to drive the threaded rod to rotate, drive the threaded barrel and the pressing plate to move downward, so that the pressing plate presses on the top surface of the transistor array, thereby fixing the transistor array on the placement seat, and then it is convenient to check the pins and the transistors;

[0018] (2) When testing, the electric push rod can also be activated to drive the rack to move, driving the gear and the rotating shaft to rotate, thereby driving the placement seat and the transistor array to rotate together, facilitating the testing of the transistor array from different angles. Description of the Drawings

[0019] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the present invention will be described in detail below in conjunction with the drawings and detailed embodiments. Obviously, the drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings. Among them:

[0020] Figure 1 is the overall structural schematic diagram of a multi-channel transistor array test auxiliary device of the present invention;

[0021] Figure 2 is the sectional view of a multi-channel transistor array test auxiliary device of the present invention;

[0022] Figure 3 is a multi-channel transistor array test auxiliary device of the present invention Figure 1 The partial enlarged view of A in. Detailed Embodiments

[0023] In order to make the above objects, features, and advantages of the present invention more obvious and understandable, the specific embodiments of the present invention will be described in detail below with reference to the drawings.

[0024] Secondly, the present invention will be described in detail in conjunction with the schematic diagrams. When describing the embodiments of the present invention in detail, for the convenience of explanation, the sectional views showing the device structure will be enlarged locally out of the general proportion, and the schematic diagrams are only examples, which should not limit the scope of protection of the present invention herein. In addition, in actual production, three-dimensional spatial dimensions including length, width, and depth should be included.

[0025] In order to make the purpose, technical solutions, and advantages of the present invention clearer, the embodiments of the present invention will be further described in detail below with reference to the drawings.

[0026] The utility model provides a multi-channel transistor array test auxiliary device. When using this device, first insert multiple pins of the transistor array into the pin holes respectively. At this time, the transistor array is placed on the surface of the placement seat. Then start the driving motor to drive the threaded rod to rotate, driving the threaded cylinder and the pressing plate to move downward, so that the pressing plate presses on the top surface of the transistor array, thereby fixing the transistor array on the placement seat, and then facilitating the inspection of the pins and the transistors. When testing, the electric push rod can also be started to drive the rack to move, driving the gear and the rotating shaft to rotate, so as to drive the placement seat and the transistor array to rotate together, facilitating the testing of the transistor array from different angles.

[0027] Figures 1 - 3 Shown is a schematic diagram of the overall structure of an embodiment of a multi-channel transistor array test auxiliary device of the utility model. Please refer to Figures 1 - 3 For a multi-channel transistor array test auxiliary device in this embodiment, its main part includes a placement component 100, a clamping component 200, and a rotating component 300.

[0028] The placement component 100 includes a test bench 110, a mounting groove 120 opened at the top end of the test bench 110, rotating shafts 130 symmetrically and rotatably mounted on the inner wall of the mounting groove 120, a placement table 140 fixed on the rotating shafts 130, placement seats 150 symmetrically fixed on the placement table 140, and pin holes 150a uniformly penetrating through the placement seats 150. On the test bench 110, rollers 110a are symmetrically and rotatably mounted, and brake pads are mounted on the rollers 110a, making it convenient for the device to move and the rollers 110a can be locked using the brake pads.

[0029] The clamping component 200 includes a motor bracket 210 fixed at the bottom of the placement table 140, a driving motor 220 mounted on the motor bracket 210, a threaded rod 230 coaxially connected to the driving motor 220 and rotatably mounted on the placement table 140, a threaded cylinder 240 engaged with the threaded rod 230, a guide cylinder 250 fixed on the outer wall of the threaded cylinder 240, a guide rod 260 inserted into the guide cylinder 250 and fixed on the placement table 140, and a pressing plate 270 fixed at the top end of the threaded cylinder 240. An elastic pad is fixed on the inner wall of the pressing plate 270, so that when the pressing plate 270 presses on the transistor array, the elastic pad deforms slightly, reducing the pressing force on the transistor array.

[0030] The rotating assembly 300 is arranged on the outer wall of the test bench 110 and can drive the rotating shaft 130 to rotate; the rotating assembly 300 includes a fixing plate 310 fixed on the outer wall of the test bench 110, an electric push rod 320 fixed on the fixing plate 310, a rack 330 fixed on the electric push rod 320, and a gear 340 fixed on the rotating shaft 130 and meshing with the rack 330; a limiting hole 330a is formed in the rack 330, a limiting rod 350 is inserted into the limiting hole 330a, and the limiting rod 350 is fixed on the outer wall of the test bench 110.

[0031] Combined Figures 1 - 3 , a multi-channel transistor array test auxiliary device according to this embodiment is specifically used as follows: when using this device, first insert the multiple pins of the transistor array into the pin holes 150a respectively. At this time, the transistor array is placed on the surface of the placing seat 150. Then start the driving motor 220 to drive the threaded rod 230 to rotate, drive the threaded barrel 240 and the pressing plate 270 to move downward, so that the pressing plate 270 presses on the top surface of the transistor array, thereby fixing the transistor array on the placing seat 150, and then it is convenient to check the pins and the transistors; when testing, the electric push rod 320 can also be started to drive the rack 330 to move, drive the gear 340 and the rotating shaft 130 to rotate, so as to drive the placing seat 150 and the transistor array to rotate together, which is convenient to test the transistor array from different angles.

[0032] Although the present invention has been described above with reference to the embodiments, various improvements can be made to it and components therein can be replaced with equivalents without departing from the scope of the present invention. In particular, as long as there is no structural conflict, the various features in the embodiments disclosed by the present invention can be combined with each other in any way. The exhaustive description of these combinations is not given in this specification only for the sake of saving space and resources. Therefore, the present invention is not limited to the specific embodiments disclosed in the text, but includes all technical solutions falling within the scope of the claims.

Claims

1. A test auxiliary device for a multi-channel transistor array, characterized in that, Comprising: A placement component (100), including a test bench (110), a mounting groove (120) opened at the top of the test bench (110), rotating shafts (130) symmetrically and rotatably mounted on the inner wall of the mounting groove (120), a placement table (140) fixed on the rotating shafts (130), placement seats (150) symmetrically fixed on the placement table (140), and pin holes (150a) uniformly penetrating through the placement seats (150); A clamping component (200), including a motor bracket (210) fixed at the bottom of the placement table (140), a driving motor (220) mounted on the motor bracket (210), a threaded rod (230) coaxially connected to the driving motor (220) and rotatably mounted on the placement table (140), a threaded cylinder (240) engaged with the threaded rod (230), a guiding cylinder (250) fixed on the outer wall of the threaded cylinder (240), a guiding rod (260) inserted into the guiding cylinder (250) and fixed on the placement table (140), and a pressing plate (270) fixed at the top of the threaded cylinder (240); A rotating component (300), arranged on the outer wall of the test bench (110), capable of driving the rotating shaft (130) to rotate.

2. The test auxiliary device for a multi-channel transistor array according to claim 1, characterized in that, The rotating component (300) includes a fixing plate (310) fixed on the outer wall of the test bench (110), an electric push rod (320) fixed on the fixing plate (310), a rack (330) fixed on the electric push rod (320), and a gear (340) fixed on the rotating shaft (130) and engaged with the rack (330).

3. The test auxiliary device for a multi-channel transistor array according to claim 2, characterized in that A limiting hole (330a) is opened on the rack (330), and a limiting rod (350) is inserted into the limiting hole (330a), and the limiting rod (350) is fixed on the outer wall of the test bench (110).

4. The test auxiliary device for a multi-channel transistor array according to claim 1, wherein Rollers (110a) are symmetrically and rotatably mounted on the test bench (110), and brake pads are mounted on the rollers (110a).

5. The test auxiliary device for a multi-channel transistor array according to claim 1, wherein An elastic pad is fixed on the inner wall of the pressing plate (270).

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