Microcontroller testing device and testing system

Abstract

The utility model provides a testing device and a testing system for a microcontroller, and relates to the technical field of microcontroller testing, the testing device comprises a host computer and a testing module, the testing module comprises at least one control unit and at least one voltage conversion unit, the host computer is connected with the at least one control unit, and the at least one voltage conversion unit is connected with the host computer. The upper computer sends a test instruction to the control unit and receives a test result fed back by the control unit; the at least one control unit is connected with the at least one voltage conversion unit, the at least one voltage conversion unit is respectively connected with the at least one to-be-tested device, the control unit receives a test instruction for analysis, sets test voltage and test parameters and sends the test voltage and the test parameters to the voltage conversion unit, and the voltage conversion unit performs level conversion according to the test voltage and sends the test parameters to the at least one to-be-tested device. And the test parameters are transmitted to the to-be-tested equipment. According to the utility model, the testing efficiency of the microcontroller is improved, the manufacturing and maintenance cost of the testing device is reduced, and the flexibility and expandability are enhanced.

Description

Technical Field

[0001] The utility model relates to the technical field of microcontroller testing, and particularly relates to a testing device and a testing system for a microcontroller. Background Art

[0002] With the popularization of applications such as the Internet of Things, intelligent devices, and security identification, microcontrollers are becoming increasingly important in modern electronic technology. A microcontroller is a single-chip microcomputer that integrates the main parts of a microcomputer on a single chip. With advantages such as improving system performance, enhancing system reliability and security, and promoting technological progress and application expansion, it has become the core control unit of an embedded system. As microcontrollers are becoming more and more closely related to our lives, the stable operation of microcontrollers is also becoming increasingly important. To test the stability of microcontrollers, a large number of sample quantities and a long testing time are often required. At the same time, as the functions of microcontrollers become more and more powerful, the number of testing items also increases.

[0003] Existing testing platforms mainly adopt a same-test platform with a single function or an automated testing device. The same-test platform with a single function has too single a tested function and cannot comprehensively cover the required testing items and power voltage ranges. It can often only test a specific function or performance parameter of a microcontroller, while ignoring other important testing aspects. The automated testing device realizes the automation of the testing process through programming control and can effectively cover the required testing items. However, if long-term and large-scale stability testing is required, it will lead to the problem of occupying a large amount of device resources. Summary of the Utility Model

[0004] In view of the above deficiencies of the prior art, the utility model provides a testing device and a testing system for a microcontroller, which effectively solve the problem that the automated testing device will occupy a large amount of device resources when long-term and large-scale stability testing is required.

[0005] In the first aspect of the utility model, the utility model provides a testing device for a microcontroller. The testing device includes a host computer and a testing module. The testing module includes at least one control unit and at least one voltage conversion unit, wherein:

[0006] The host computer is connected to at least one control unit. The host computer sends a testing instruction to the control unit and receives the testing result fed back by the control unit;

[0007] At least one of the control units is connected to at least one of the voltage conversion units, and at least one of the voltage conversion units is respectively connected to at least one device to be tested. The control unit receives the test instruction for parsing, sets the test voltage and test parameters, and sends them to the voltage conversion unit. The voltage conversion unit performs level conversion according to the test voltage and transmits the test parameters to the device to be tested.

[0008] Furthermore, the control unit includes a parsing subunit, a parameter setting subunit, and a testing subunit, where:

[0009] The parsing subunit is connected to the host computer. The parsing subunit is configured to receive the test instruction for parsing and obtain the parsing result, which is transmitted to the parameter setting subunit;

[0010] The parameter setting subunit is respectively connected to the parsing subunit and the voltage conversion unit. The parameter setting subunit receives the parsing result, sets the test voltage and test parameters according to the parsing result, and transmits them to the voltage conversion unit;

[0011] The testing subunit is respectively connected to the voltage conversion unit and the host computer. The testing subunit receives the test data returned by the device to be tested through the voltage conversion unit, obtains the test result according to the test data, and sends the test result to the host computer.

[0012] Furthermore, the control unit includes a microcontroller. The microcontroller includes multiple different communication interfaces. The communication interfaces are connected to the voltage conversion unit and / or the device to be tested. The communication interfaces include one or more of an analog-to-digital conversion interface, a universal asynchronous receiver-transmitter interface, an integrated circuit bus interface, a serial peripheral interface, a controller area network interface, and a local area network interface.

[0013] Furthermore, the microcontroller uses an STM32F405R series microcontroller.

[0014] Furthermore, the voltage conversion unit includes a bidirectional level converter.

[0015] Furthermore, the bidirectional level converter uses an LSF0204DPWR level converter.

[0016] Furthermore, the test module further includes a conversion unit. The conversion unit is respectively connected to the host computer and at least one of the control units. The conversion unit is configured to convert the test instruction into a signal type recognizable by the control unit.

[0017] Further, the conversion unit includes a universal serial bus hub, which includes an upstream hub interface and a downstream USB interface. The host computer is connected to the upstream hub interface, and the control unit is connected to the downstream USB interface.

[0018] Further, the conversion unit includes a CH334R controller chip.

[0019] In the second aspect of the present invention, the present invention provides a test system for a microcontroller, and the test system includes the test device for the microcontroller according to the first aspect of the present invention.

[0020] The present invention provides a test device and a test system for a microcontroller. Through optimized design and modular structure, it can test multiple microcontroller devices simultaneously, improve the test efficiency, and reduce the manufacturing cost and maintenance cost at the same time. By using the USB interface, a single host computer can be connected to multiple test modules, which not only improves the parallel processing ability of the test, but also can flexibly increase or decrease the test modules according to the test requirements to adapt to different scales of test scenarios. The task of judging the test results is handed over to the control unit of the test module, which greatly reduces the processing pressure of the host computer, not only improves the response speed of the test, but also enables the host computer to manage more control units simultaneously, further improving the test efficiency. At the same time, the control unit of the test module can be upgraded according to needs to implement various function tests, enhancing the flexibility and scalability of the test device. Description of the Drawings

[0021] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following will briefly introduce the drawings required in the embodiments. It should be understood that the following drawings only show some embodiments of the present invention, and therefore should not be regarded as limiting the scope. For those of ordinary skill in the art, without creative efforts, other related drawings can be obtained based on these drawings.

[0022] Figure 1 is the first schematic diagram of the structure of the test device for a microcontroller provided by the embodiment of the present invention;

[0023] Figure 2 is the schematic diagram of the structure of the control unit in the embodiment of the present invention;

[0024] Figure 3 is the second schematic diagram of the structure of the test device for a microcontroller provided by the embodiment of the present invention;

[0025] Figure 4 is the schematic diagram of the structure of the test system for a microcontroller provided by the embodiment of the present invention.

[0026] Main Component Symbol Description:

[0027] 10. Test system for microcontroller; 100. Test device for microcontroller; 110. Host computer; 120. Test module; 121. Control unit; 1211. Parsing subunit; 1212. Parameter setting subunit; 1213. Test subunit; 122. Voltage conversion unit; 123. Conversion unit; 200. Device to be tested. Detailed implementation manners

[0028] To make the objectives, technical solutions and advantages of the present utility model clearer, the technical solutions of the present utility model will be further described clearly and completely below in conjunction with the accompanying drawings in the embodiments of the present utility model. It should be noted that the described embodiments are only a part of the embodiments of the present utility model, rather than all of the embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present utility model.

[0029] In addition, the terms "first" and "second" are only used for descriptive purposes, and cannot be construed as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include one or more of such features. In the description of the present utility model, "a plurality of" means two or more, unless otherwise specifically defined.

[0030] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those of ordinary skill in the technical field to which this application belongs. The terms used in the description of the present utility model are only for the purpose of describing specific embodiments, and are not intended to limit the present utility model. The term "and / or" used herein includes any and all combinations of one or more of the related listed items.

[0031] With the popularization of applications such as the Internet of Things, intelligent devices, and security identification, microcontrollers are becoming increasingly important in modern electronic technologies. A microcontroller is a single-chip microcomputer that integrates the main parts of a microcomputer on a single chip. With advantages such as improving system performance, enhancing system reliability and security, and promoting technological progress and application expansion, it has become the core control unit of embedded systems. As microcontrollers are becoming more and more closely related to our lives, the stable operation of microcontrollers is also becoming increasingly important. To test the stability of microcontrollers, a large number of sample quantities and long test times are often required. At the same time, as the functions of microcontrollers become more and more powerful, the number of test items also increases.

[0032] Existing test platforms mainly use single - function co - testing platforms or automated test equipment. The single - function co - testing platform has too single a function to comprehensively cover the required test items and power supply voltage range. It can often only test a specific function or performance parameter of the microcontroller, ignoring other important test aspects. The automated test equipment can achieve the automation of the test process through programming control and can effectively cover the required test items. However, if long - term and large - volume stability tests are required, it will cause the problem of occupying a large amount of equipment resources.

[0033] Embodiment 1

[0034] An embodiment of the present utility model provides a test device for a microcontroller, which effectively solves the problem that the automated test equipment will occupy a large amount of equipment resources when long - term and large - volume stability tests are required. Figure 1 It is the first structural schematic diagram of the test device for the microcontroller provided by the embodiment of the present utility model. As Figure 1 shown, the test device 100 for the microcontroller includes a host computer 110 and a test module 120. The host computer 110 includes, but is not limited to, a computer that can directly issue control commands. A supporting software is installed on the host computer 110. Through the supporting software, test instructions can be sent. The test instructions include information on the stability test parameters of the microcontroller to be tested, including, but not limited to, parameters such as the number of tests, test time, test function, and test voltage.

[0035] The test module 120 includes a plurality of control units 121 and a plurality of voltage conversion units 122. The host computer 110 is connected to the plurality of control units 121, and the plurality of voltage conversion units 122 are respectively connected to a plurality of devices to be tested 200. In the embodiment of the present utility model, the device to be tested can be a microcontroller.

[0036] Figure 2 It is the structural schematic diagram of the control unit in the embodiment of the present utility model. As Figure 2 shown, the control unit 121 includes an analysis sub - unit 1211, a parameter setting sub - unit 1212, and a test sub - unit 1213, where:

[0037] The analysis sub - unit 1211 is connected to the host computer 110. The analysis sub - unit 1211 is used to receive the test instructions sent by the host computer 110 for analysis and transmit the analysis result to the parameter setting sub - unit 1212. The analysis result includes, but is not limited to, parameters such as the number of tests, test time, test function, and test voltage.

[0038] The parameter setting subunit 1212 is respectively connected to the parsing subunit 1211 and the voltage conversion unit 122. The parameter setting subunit 1212 receives the parsing result, sets the test voltage and test parameters according to the parsing result, and transmits them to the voltage conversion unit 122.

[0039] The test subunit 1213 is respectively connected to the voltage conversion unit 122 and the host computer 110. The test subunit 1213 receives the test data returned by the device under test 200 through the voltage conversion unit 122, obtains the test result according to the test data, and sends the test result to the host computer 110.

[0040] Optionally, the control unit can be a microcontroller, which includes multiple different communication interfaces. The communication interface is connected to the voltage conversion unit 122 and / or the device under test 200. The communication interface includes one or more of an analog-to-digital conversion ADC interface, a universal asynchronous receiver-transmitter UART interface, an integrated circuit bus I 2 C interface, a serial peripheral interface SPI interface, a controller area network CAN interface, and a local interconnect network LIN interface, so that the data length test under each communication interface configuration can be realized, and at the same time, analog and digital function tests can be carried out: including function tests of an analog-to-digital converter ADC, a digital-to-analog converter DAC, a timer TIM, a clock control RCC, etc., ensuring a comprehensive test of the device under test 200 in terms of analog and digital signal processing.

[0041] In the embodiment of the present utility model, the microcontroller can adopt the STM32F405R series microcontroller, such as the STM32F405RGT6 microcontroller. This microcontroller has powerful data processing capabilities and multiple communication interfaces, including a USB OTG interface, a CAN interface, 3 SPI interfaces, 2 I 2 S interfaces, 3 I 2 C interfaces, and 7 USART / UART serial communication interfaces, and can easily manage multiple communication tasks. At the same time, this microcontroller is equipped with a real-time clock, a 12-bit analog-to-digital converter, a direct memory access controller, as well as multiple timers and counters, and can effectively perform precise time management and implement advanced analog input and output functions.

[0042] The voltage conversion unit 122 is connected to the device under test 200. The voltage conversion unit 122 performs level conversion according to the test voltage, that is, changes the output level of the output port according to the test voltage setting instruction, and realizes the level conversion from 3.3V to 1.2 - 5.5V, so that the output voltage matches the working voltage of the device under test 200.

[0043] Optionally, the voltage conversion unit 122 can be a bidirectional level shifter, which realizes the automatic conversion of levels through an internal circuit. When the input level changes, the converter can detect this change and adjust the output level accordingly, thereby realizing the bidirectional transmission of data.

[0044] In the embodiment of the present utility model, the bidirectional level shifter adopts the LSF0204DPWR level shifter, and the voltage value of the VCCB pin of the LSF0204DPWR level shifter can be directly changed through an adjustable power supply, thereby realizing the change of the output interface voltage. This level shifter adopts low-power technology, which can effectively reduce the power consumption of the chip, enabling it to maintain low-power operation even during long-term operation, and at the same time, it can provide extremely low signal delay, thereby ensuring the high-speed transmission and stability of signals.

[0045] The voltage conversion unit 122 transmits the test parameters to the device under test 200. The device under test 200 performs corresponding functional tests according to the test parameters. After the test is completed or the test fails, the test data is returned to the test sub-unit 1213 of the control unit 121 through the voltage conversion unit 122. The test sub-unit 1213 judges the test data to obtain the test result, and then sends the test result to the host computer 110. The host computer 110 displays the test result of this test according to the test result returned by the test sub-unit 1213, and hands over the task of judging the test result to the control unit 121, effectively reducing the processing pressure of the host computer 110.

[0046] As a preferred implementation manner of the embodiment of the present utility model, Figure 3 is the second schematic diagram of the structure of the test device of the microcontroller provided by the embodiment of the present utility model. As Figure 3 shown, the test module 120 further includes a conversion unit 123. The conversion unit 123 is respectively connected to the host computer 110 and multiple control units 121. The conversion unit 123 is used to convert the test instructions sent by the host computer 110 into a signal type recognizable by the control unit 121.

[0047] Optionally, the conversion unit 123 can be a universal serial bus hub. The universal serial bus hub includes an upstream hub interface and multiple downstream USB interfaces. The host computer 110 is connected to the upstream hub interface, and multiple control units 121 are respectively connected to multiple downstream USB interfaces. The control unit 121 communicates with the host computer 110 using the virtual serial port function of USB, and distinguishes the test instructions sent by the host computer 110 through different serial port numbers, which is convenient for later expansion.

[0048] In the embodiment of the present utility model, the conversion unit 123 adopts a CH334R controller chip. The upstream port of this chip supports USB2.0 high speed and full speed, and the downstream port supports USB2.0 high speed of 480 Mbps, full speed of 12 Mbps, and low speed of 1.5 Mbps. At the same time, it can provide 4 USB2.0 downstream ports, is downward compatible with the USB1.1 protocol specification, supports independent power control for each port and overall overcurrent detection, while reducing the design difficulty of the test device, ensuring that the test device has both high efficiency and stability.

[0049] The test device for microcontrollers provided by the present utility model, through optimized design and modular structure, can test multiple microcontroller devices simultaneously, improving the test efficiency, while reducing the manufacturing cost and maintenance cost. By using a USB interface to connect a single host computer to multiple test modules, it not only improves the parallel processing ability of the test, but also can flexibly increase or decrease the test modules according to the test requirements to adapt to different scales of test scenarios. Assigning the task of judging the test results to the control unit of the test module greatly reduces the processing pressure on the host computer, not only improving the response speed of the test, but also enabling the host computer to manage more control units simultaneously, further enhancing the test efficiency. At the same time, the control unit of the test module can be upgraded as needed to implement various function tests, enhancing the flexibility and scalability of the test device.

[0050] Embodiment 2

[0051] Based on the same technical concept, the embodiment of the present utility model also provides a test system 10 for microcontrollers, Figure 4 which is a schematic structural diagram of the test system for microcontrollers provided by the embodiment of the present utility model. As Figure 4 shown, the test system 10 for microcontrollers includes the test device 100 for microcontrollers in Embodiment 1 above. According to different scales of test scenarios, the test system 10 for microcontrollers can be provided with one or more test devices 100 for microcontrollers.

[0052] The test system for microcontrollers provided by the embodiment of the present utility model, through optimized design and modular structure, can test multiple microcontroller devices simultaneously, improving the test efficiency, while reducing the manufacturing cost and maintenance cost. By using a USB interface to connect a single host computer to multiple test modules, it not only improves the parallel processing ability of the test, but also can flexibly increase or decrease the test modules according to the test requirements to adapt to different scales of test scenarios. Assigning the task of judging the test results to the control unit of the test module greatly reduces the processing pressure on the host computer, not only improving the response speed of the test, but also enabling the host computer to manage more control units simultaneously, further enhancing the test efficiency. At the same time, the control unit of the test module can be upgraded as needed to implement various function tests, enhancing the flexibility and scalability of the test device.

[0053] Reference to "embodiments" in this document means that the specific features, structures, or characteristics described in connection with the embodiments can be included in at least one embodiment of the present application. The phrase appears in various places in the specification and does not necessarily refer to the same embodiment each time, nor is it an independent or alternative embodiment mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0054] The above-described embodiments merely represent several implementation manners of the present utility model. The description thereof is relatively specific and detailed, but it should not be construed as a limitation on the scope of the patent of the present utility model. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present utility model, several modifications and improvements can still be made, and these all fall within the protection scope of the present utility model. Therefore, the protection scope of the patent of the present utility model shall be subject to the appended claims.

[0055] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present utility model and are not intended to limit them; although the present utility model has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions described in the foregoing embodiments, or perform equivalent replacements for some of the technical features; and these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present utility model.

Claims

1. A test device for a microcontroller, characterized in that, The test device includes a host computer and a test module. The test module includes at least one control unit and at least one voltage conversion unit, where: The host computer is connected to at least one control unit. The host computer sends test instructions to the control unit and receives the test results fed back by the control unit. At least one of the control units is connected to at least one of the voltage conversion units, and at least one of the voltage conversion units is respectively connected to at least one device under test. The control unit receives the test instructions for parsing, sets the test voltage and test parameters and sends them to the voltage conversion unit. The voltage conversion unit performs level conversion according to the test voltage and transmits the test parameters to the device under test.

2. The test device for the microcontroller according to claim 1, characterized in that The control unit includes a parsing subunit, a parameter setting subunit and a test subunit, where: The parsing subunit is connected to the host computer. The parsing subunit is configured to receive the test instructions for parsing and obtain the parsing result for transmission to the parameter setting subunit. The parameter setting subunit is respectively connected to the parsing subunit and the voltage conversion unit. The parameter setting subunit receives the parsing result, sets the test voltage and test parameters according to the parsing result and transmits them to the voltage conversion unit. The test subunit is respectively connected to the voltage conversion unit and the host computer. The test subunit receives the test data returned by the device under test through the voltage conversion unit, obtains the test result according to the test data, and sends the test result to the host computer.

3. The test device for the microcontroller according to claim 1, characterized in that, The control unit includes a microcontroller. The microcontroller includes a plurality of different communication interfaces. The communication interfaces are connected to the voltage conversion unit and / or the device under test. The communication interfaces include one or more of an analog-to-digital conversion interface, a universal asynchronous receiver-transmitter interface, an integrated circuit bus interface, a serial peripheral interface, a controller area network interface and a local area network interface.

4. The test device for the microcontroller according to claim 3, characterized in that, The microcontroller adopts an STM32F405R series microcontroller.

5. The test device for the microcontroller according to claim 1, characterized in that, The voltage conversion unit includes a bidirectional level converter.

6. The test device for the microcontroller according to claim 5, characterized in that, The bidirectional level converter adopts an LSF0204DPWR level converter.

7. The test device for the microcontroller according to claim 1, characterized in that, The test module further includes a conversion unit. The conversion unit is respectively connected to the host computer and at least one of the control units. The conversion unit is configured to convert the test instructions into a signal type recognizable by the control unit.

8. The test device for a microcontroller according to claim 7, characterized in that, The conversion unit includes a universal serial bus hub. The universal serial bus hub includes an upstream hub interface and a downstream USB interface. The host computer is connected to the upstream hub interface, and the control unit is connected to the downstream USB interface.

9. The test device for the microcontroller according to claim 8, characterized in that, The conversion unit includes a CH334R controller chip.

10. A test system for a microcontroller, characterized in that, The test system includes the test device of the microcontroller according to any one of claims 1-9.

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