Test probe board and test system for main-grid-free back contact battery
By designing the interdigitated negative and positive electrode test plates, the problem of inaccurate test of the back contact battery without main gate is solved, and the full gate line contact acquisition is achieved, ensuring the accuracy of the IV curve test.
Patent Information
- Application Number
- CN202422217709.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-10
- Publication Date
- 2025-07-11
- Estimated Expiration
- 2034-09-10
AI Technical Summary
The existing testing methods cannot accurately test the back contact battery without the main gate, because the back contact battery without the main gate lacks the main gate line, which causes the probe to fail to contact all the fine gates, resulting in inaccurate test results.
The interdigitated negative electrode test plate and positive electrode test plate are designed, separated by an insulating isolation belt, contacting the negative electrode fine gate and positive electrode fine gate of the battery without the main gate back, and outputting current and voltage to achieve full-gate line contact acquisition.
The accuracy of the IV curve test results of the main gate-free back contact battery is achieved, ensuring current and voltage measurement under different conditions.
Smart Images
Figure CN223092028U_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the technical field of solar cells, and in particular, to a test probe board and a test system for a back-contact cell without main grid lines. Background Art
[0002] The negative electrode of a traditional cell is composed of main grid lines and fine grid lines. The general method for testing its IV curve (voltage-current characteristic curve) is to use a probe to contact the main grid line of the negative electrode of the cell on one side, and use a probe to contact the positive electrode of the cell on the other side. The photovoltaic effect is generated by the light irradiated on the cell by a solar xenon lamp simulator, and the data signal is collected through the lead wires connected by the probes, so as to achieve the purpose of testing the IV curve.
[0003] With the emergence of the back-contact cell without main grid lines, the existing test methods are challenged. This is because the back-contact cell without main grid lines has no main grid, and the negative fine grid lines and the positive fine grid lines are alternately distributed in a finger-like pattern on the back of the cell, and there is no main grid to collect the current. The existing probes cannot contact all the fine grid lines, resulting in inaccurate test results and requiring additional compensation for the test results.
[0004] It should be noted that the above content is not necessarily prior art and is not used to limit the scope of patent protection of the present application. Summary of the Utility Model
[0005] Embodiments of the present application provide a test probe board and a test system for a back-contact cell without main grid lines to solve or alleviate one or more of the above-mentioned technical problems.
[0006] The first aspect of the embodiments of the present application provides a test probe board for a back-contact cell without main grid lines, including:
[0007] A negative test board and a positive test board arranged in a finger-like pattern, and the materials of the negative test board and the positive test board are both conductors;
[0008] An insulating isolation strip, which is arranged between the negative test board and the positive test board;
[0009] The negative test board is used to contact the negative fine grid lines of the back-contact cell without main grid lines and output a negative current and a negative voltage;
[0010] The positive test board is used to contact the positive fine grid lines of the back-contact cell without main grid lines and output a positive current and a positive voltage.
[0011] In the embodiment of the present application, the negative test board and the positive test board are arranged in an interdigital shape, and are respectively used to correspond to the negative fine grid and the positive fine grid of the back-contact battery without main grid. The test probe board of the back-contact battery without main grid can be attached to the back-contact battery without main grid to be tested for electrical contact. Thus, contact collection of all grid lines can be achieved, and the negative current, negative voltage, positive current, and positive voltage are output. Thus, the IV curve of the back-contact battery without main grid under different conditions can be accurately measured.
[0012] In the second aspect of the embodiment of the present application, a test system for a back-contact battery without main grid is provided, including: a light source, a voltage and current tester, a transparent glass plate, and the test probe board of the back-contact battery without main grid as described above;
[0013] During the test, the back-contact battery without main grid is placed between the transparent glass plate and the test probe board of the back-contact battery without main grid as described above. The negative test board contacts the negative fine grid of the back-contact battery without main grid, and the positive test board contacts the positive fine grid of the back-contact battery without main grid;
[0014] The negative voltage connection line and the positive voltage connection line of the test probe board of the back-contact battery without main grid are externally connected to the voltage test terminal of the voltage and current tester;
[0015] The negative current collecting line and the positive current collecting line of the test probe board of the back-contact battery without main grid are externally connected to the current test terminal of the voltage and current tester.
[0016] In the second aspect of the embodiment of the present application, the test probe board of the back-contact battery without main grid is used to contact the back-contact battery without main grid to be tested, so that full contact of the grid lines can be achieved. Relying on this test system for IV testing, the test results are more accurate. Description of the Drawings
[0017] In the drawings, unless otherwise specified, the same reference numerals throughout the drawings represent the same or similar components or elements. These drawings are not necessarily drawn to scale. It should be understood that these drawings only depict some embodiments disclosed in the present application and should not be regarded as limiting the scope of the present application.
[0018] Figure 1 It is a top view of the test probe board of the back-contact battery without main grid provided by the embodiment of the present application;
[0019] Figure 2 It is a plan view of the test probe board of the back-contact battery without main grid provided by the embodiment of the present application;
[0020] Figure 3 It is a schematic structural diagram of the test system for the back-contact battery without main grid provided by the embodiment of the present application;
[0021] Figure 4 It is a schematic structural diagram of the grid line electrode of a passivated emitter rear contact (PERC) cell.
[0022] Description of the reference numerals in the drawings:
[0023] 100 - Test circuit board; 101 - Negative test board; 102 - Positive test board; 103 - Insulating isolation strip; 104 - Negative current probe; 105 - Negative voltage probe; 106 - Positive current probe; 107 - Positive voltage probe; 108 - Negative current collector line; 109 - Positive current collector line; 110 - Negative voltage connection line; 111 - Positive voltage connection line. Detailed implementation manners
[0024] Embodiments of the present application will be described in detail below. Examples of the embodiments are shown in the drawings. In the drawings, for clarity, the dimensions of layers, regions, elements and their relative dimensions may be exaggerated. Wherever the same or similar reference numerals are used throughout, they denote the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the drawings are exemplary only for explaining the present application and should not be construed as limiting the present application. It should be noted that, without conflict, the embodiments in the present application and the features in the embodiments may be combined with each other.
[0025] It should be understood that when an element or layer is referred to as "on", "adjacent to", "connected to" or "coupled to" another element or layer, it can be directly on, adjacent to, connected or coupled to the other element or layer, or there may be intervening elements or layers. In contrast, when an element is referred to as "directly on", "directly adjacent to", "directly connected to" or "directly coupled to" another element or layer, there are no intervening elements or layers. It should be understood that although the terms first, second, third, etc. may be used to describe various elements, components, regions, layers and / or parts, these elements, components, regions, layers and / or parts should not be limited by these terms. These terms are only used to distinguish one element, component, region, layer or part from another element, component, region, layer or part. Thus, without departing from the teachings of the present application, the first element, component, region, layer or part discussed below may be referred to as the second element, component, region, layer or part. And when discussing the second element, component, region, layer or part, it does not necessarily mean that there is a first element, component, region, layer or part in the present application.
[0026] In this application, unless otherwise clearly defined or limited, terms such as "installed", "connected", "linked", "fixed", etc. shall be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or integrated; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, and it can be the internal communication of two components or the interaction relationship between two components, unless otherwise clearly defined. For those of ordinary skill in the art, the specific meanings of the above terms in this application can be understood according to specific circumstances.
[0027] It should be noted that the terms "first", "second", etc. in the description, claims and the above-mentioned drawings of this application are used to distinguish similar objects and do not necessarily describe a specific order or sequence. It should be understood that these terms can be interchanged under appropriate circumstances so that the embodiments of this application described here can be implemented in an order other than those illustrated or described here. In addition, the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product or device that includes a series of steps or units does not necessarily have to be limited to those steps or units clearly listed, but may include other steps or units not clearly listed or inherent to these processes, methods, products or devices.
[0028] In this application, when it comes to numerical intervals (i.e., numerical ranges), unless otherwise specified, the distribution of the optional numerical values within this numerical interval is considered continuous, and includes the two numerical endpoints of this numerical interval (i.e., the minimum value and the maximum value), as well as each numerical value between these two numerical endpoints. Unless otherwise specified, when the numerical interval only refers to the integers within this numerical interval, it includes the two endpoint integers of this numerical range, as well as each integer between the two endpoints, which is equivalent to directly listing each integer. When multiple numerical ranges are provided to describe features or characteristics, these numerical ranges can be combined. In other words, unless otherwise specified, the numerical ranges disclosed in this application should be understood to include any and all sub-ranges subsumed therein. The "numerical value" in this numerical interval can be any quantitative value, such as a number, a percentage, a ratio, etc. The "numerical interval" allows for a broad inclusion of quantitative intervals such as percentage intervals, ratio intervals, ratio value intervals, etc.
[0029] See Figure 4 , Figure 4 is a schematic structural diagram of the grid line electrode of a back-contact battery without a main grid. As can be seen from Figure 4 it that the negative fine grids and the positive fine grids are alternately distributed. There are several welding points on each negative fine grid, and each positive fine grid has several welding points. The welding points are arranged in rows in the direction perpendicular to the fine grids.
[0030] An embodiment of the present application provides a test probe board for a passivated emitter rear contact (PERC) cell. Based on this, it is convenient to accurately test the IV curve of the PERC cell. Details will be described later.
[0031] Hereinafter, exemplary embodiments according to the present application will be described in more detail with reference to the accompanying drawings. It should be noted that these exemplary embodiments can be implemented in various different forms and should not be construed as being limited only to the embodiments described herein.
[0032] As Figure 1 and 2 shown, an embodiment of the present application provides a test probe board for a passivated emitter rear contact (PERC) cell. The test probe board 100 for the PERC cell may include:
[0033] A finger-shaped negative test board 101 and a positive test board 102, and the materials of the negative test board 101 and the positive test board 102 are both conductors;
[0034] An insulating isolation strip 103, which is arranged between the negative test board 101 and the positive test board 102;
[0035] The negative test board 101 is used to contact the negative fine grid of the PERC cell and output the negative current and the negative voltage output;
[0036] The positive test board 102 is used to contact the positive fine grid of the PERC cell and output the positive current and the positive voltage.
[0037] An embodiment of the present application provides a test probe board for a passivated emitter rear contact (PERC) cell. The negative test board 101 and the positive test board 102 are arranged in a finger shape and are respectively used to correspond to the negative fine grid and the positive fine grid of the PERC cell. The test probe board for the PERC cell can be attached to the PERC cell to be tested for electrical contact, and output the negative current, the negative voltage, the positive current, and the positive voltage. Thus, the IV (current-voltage) curve of the PERC cell under different conditions is measured.
[0038] In an alternative embodiment, the negative test board 101 and the positive test board 102 may be made of a conductive metal. For example, the negative test board 101 and the positive test board 102 are respectively independently made of aluminum, iron, copper, silver, and their alloys.
[0039] In an alternative embodiment, the insulating isolation strip 103 may be made of an insulating polymer material, such as polyethylene, polypropylene, polystyrene, etc.
[0040] In an alternative embodiment, the negative electrode test board 101 includes a finger-shaped conductive substrate and a connection area connecting the finger-shaped conductive substrate. Each finger-shaped conductive substrate is provided with rows of probes. One of each row of probes is a negative electrode voltage probe 105, and the remaining ones are negative electrode current probes 104. The negative electrode voltage probe 105 is independently connected to a negative electrode voltage connection line 110, and the connection area of the negative electrode test board 101 is provided with a negative electrode current collecting line 108. At this time, when the negative electrode test board 101 contacts the negative electrode fine grid, the voltage and current are collected by the negative electrode current probe 104 and the negative electrode voltage probe 105 respectively. Specifically, in combination with Figure 1 looking, each negative electrode voltage probe 105 is connected to the negative voltage interface of the voltage test terminal of an external test instrument through the wire connected to it, and all the wires are gathered together. After each row of negative electrode current probes 104 collect the current, through the self-conduction of the negative electrode test board 101, they are gathered to the negative electrode current collecting line 108 for output, and finally connected to the negative electrode current interface of the current test terminal of the test instrument.
[0041] Furthermore, the negative electrode voltage probe 105 is independently connected to the negative electrode voltage connection line 110, that is, the negative electrode voltage probe 105 is only electrically connected to the negative electrode voltage connection line 110. Specifically, a first insulating layer for isolating the finger-shaped conductive substrate is provided around the negative electrode voltage probe 105.
[0042] In an alternative embodiment, the positive electrode test board 102 includes a finger-shaped conductive substrate and a connection area connecting the finger-shaped conductive substrate. Each finger-shaped conductive substrate is provided with rows of probes. One of each row of probes is a positive electrode voltage probe 107, and the remaining ones are positive electrode current probes 106; the positive electrode voltage probe 107 is independently connected to a positive electrode voltage connection line 111; the connection area of the positive electrode test board 102 is provided with a positive electrode current collecting line 109. At this time, when the positive electrode test board 102 contacts the negative electrode fine grid, the voltage and current are collected by the positive electrode voltage probe 107 and the positive electrode current probe 106 respectively. Specifically, in combination with Figure 1 looking, each positive electrode voltage probe 107 is connected to the positive voltage interface of the voltage test terminal of an external test instrument through the wire connected to it, and all the wires are gathered together. After each row of positive electrode current probes 106 collect the current, through the self-conduction of the positive electrode test board 102, they are gathered to the positive electrode current collecting line 109 for output, and finally connected to the positive electrode current interface of the current test terminal of the test instrument.
[0043] Furthermore, the positive electrode voltage probe 107 is independently connected to the positive electrode voltage connection line 111, that is, the positive electrode voltage probe 107 is only electrically connected to the positive electrode voltage connection line 111. Specifically, referring to Figure 2 , a second insulating layer for isolating the finger-shaped conductive substrate is provided around the positive electrode voltage probe 107.
[0044] In an alternative embodiment, the probe includes a protruding cylindrical base and a contact portion located on the cylindrical base, and the contact portion is correspondingly arranged with the welding point on the fine grid electrode. Preferably, the contact portion can adopt a concave design. Thus, the contact portion has a larger contact area with the fine grid, making the contact more stable.
[0045] In an alternative embodiment, in the test probe board of the main-gridless back-contact battery, the negative voltage connection line 110 and the positive voltage connection line 111 are used to connect to the voltage test terminals of an external voltage-current tester; the negative current converging line 108 and the positive current converging line 109 are used to connect to the current test terminals of an external voltage-current tester. Thus, the IV curve test is completed by using a voltage-current tester.
[0046] Exemplarily, the voltage-current tester can be a Keithley 2400 type source measure unit (SMU) instrument.
[0047] A second aspect of the embodiments of the present application provides a test system for a main-gridless back-contact battery. In some embodiments, referring to Figure 3 , the test system for a main-gridless back-contact battery may include a transparent glass plate, a light source, a voltage-current tester, and the test probe board of the main-gridless back-contact battery in the first aspect;
[0048] When performing a test, the main-gridless back-contact battery is placed between the transparent glass plate and the test probe board of the main-gridless back-contact battery in the first aspect, the negative test board 101 contacts the negative fine grid of the main-gridless back-contact battery, and the positive test board 102 contacts the positive fine grid of the main-gridless back-contact battery;
[0049] The negative voltage connection line 110 and the positive voltage connection line 111 of the test probe board of the main-gridless back-contact battery are externally connected to the voltage test terminals of a voltage-current tester; the negative current converging line 108 and the positive current converging line 109 of the test probe board of the main-gridless back-contact battery are externally connected to the current test terminals of a voltage-current tester;
[0050] The incident route of the light source is: the transparent glass plate, the main-gridless back-contact battery, and the test probe board of the main-gridless back-contact battery in the first aspect.
[0051] In the second aspect of the embodiments of the present application, relying on the light source to provide illumination, the main-gridless back-contact battery generates current under illumination, the test probe board of the main-gridless back-contact battery is attached to it for voltage and current tests, and the IV curve is obtained through an external instrument.
[0052] Further, the voltage and current tester can be a Keithley 2400 Source Measure Unit (SMU) instrument. Thus, the IV curve is measured.
[0053] Preferably, the light source includes a xenon lamp. Thus, low-cost simulated sunlight can be obtained.
[0054] Preferably, the transparent glass plate includes ultra-clear low-e glass (ultra-clear low-emissivity glass) with a thickness of 3 mm to 10 mm, such as 3 mm, 5 mm, 8 mm, 10 mm, etc. Thus, the visible light transmittance ratio can reach more than 91%.
[0055] It should be noted that the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc. are only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus cannot be construed as a limitation to the present application. The orientation terms "inner" and "outer" refer to the inside and outside relative to the contour of each component itself. For example, if the device in the drawing is inverted, the device described as "above other devices or structures" or "on other devices or structures" will be positioned as "below other devices or structures" or "under other devices or structures" afterwards. Thus, the exemplary term "above..." can include both the orientations of "above..." and "below...". The device can also be positioned in other different ways (rotated 90 degrees or in other orientations), and corresponding explanations should be made for the relative spatial descriptions used here.
[0056] It should also be noted that the "one embodiment", "another embodiment", "embodiment", etc. mentioned in the present application refer to the specific features, structures or characteristics described in connection with that embodiment being included in at least one embodiment generally described in the present application. The same expression appearing in multiple places in the specification does not necessarily refer to the same embodiment. Further, when describing a specific feature, structure or characteristic in connection with any one embodiment, it is intended that implementing such feature, structure or characteristic in combination with other embodiments also falls within the scope of the present application.
[0057] In the above embodiments, the descriptions of each embodiment have their own emphases. For the parts not detailed in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.
[0058] It should also be noted that the above are only the preferred embodiments of the present application, and do not limit the patent protection scope of the present application. Any equivalent structural or equivalent process transformation made by using the content of the specification and drawings of the present application, or directly or indirectly applied in other related technical fields, is similarly included in the patent protection scope of the present application.
Claims
1. A test probe board for a back-contact cell without main grid, characterized in that, Comprising: Interdigitated negative test board (101) and positive test board (102), both the negative test board (101) and the positive test board (102) are made of conductors; Insulating isolation strip (103), which is arranged between the negative test board (101) and the positive test board (102); The negative test board (101) is used to contact the negative fine grid of the main-gridless back-contact battery and output negative current and negative voltage; The positive test board (102) is used to contact the positive fine grid of the main-gridless back-contact battery and output positive current and positive voltage.
2. The test probe board for the back-contact cell without main grid according to claim 1, wherein, The negative test board (101) includes a finger-shaped conductive substrate and a connection area connecting the finger-shaped conductive substrate. Each finger-shaped conductive substrate is provided with rows of probes. One of each row of probes is a negative voltage probe (105), and the remaining ones are negative current probes (104). The negative voltage probe (105) is independently connected to a negative voltage connection line (110), and the connection area of the negative test board (101) is provided with a negative current collecting line (108).
3. The test probe board for the back-contact cell without main grid according to claim 2, characterized in that, The positive test board (102) includes a finger-shaped conductive substrate and a connection area connecting the finger-shaped conductive substrate. Each finger-shaped conductive substrate is provided with rows of probes. One of each row of probes is a positive voltage probe (107), and the remaining ones are positive current probes (106); the positive voltage probe (107) is independently connected to a positive voltage connection line (111); the connection area of the positive test board (102) is provided with a positive current collecting line (109).
4. The test probe board for the back-contact cell without main grid according to claim 3, characterized in that, The probe includes a protruding cylindrical base and a contact part located on the cylindrical base, and the contact part is correspondingly arranged with the welding point on the fine grid electrode.
5. The test probe board for the back-contact cell without main grid according to claim 4, characterized in that, The contact part adopts a concave design.
6. The test probe board for the back-contact battery without main grid according to claim 4, characterized in that, The negative voltage probe (105) being independently connected to a negative voltage connection line (110) includes: A first insulating layer for isolating the finger-shaped conductive substrate is provided around the negative voltage probe (105).
7. The test probe board for the passivated emitter and rear contact cell according to claim 4, wherein The positive voltage probe (107) being independently connected to a positive voltage connection line (111) includes: A second insulating layer for isolating the finger-shaped conductive substrate is provided around the positive voltage probe (107).
8. The test probe board for the passivated emitter and rear cell without main grid according to claim 4, characterized in that, The negative voltage connection line (110) and the positive voltage connection line (111) are used to externally connect to the voltage test terminal of a voltage-current tester; The negative current collecting line (108) and the positive current collecting line (109) are used to externally connect to the current test terminal of a voltage-current tester.
9. A test system for a back-contact battery without main grid, characterized in that, Comprising a light source, a voltage-current tester, a transparent glass plate, and a test probe board for the main-gridless back-contact battery according to any one of claims 1 to 8; During testing, the main-gridless back-contact battery is placed between the transparent glass plate and the test probe board for the main-gridless back-contact battery according to any one of claims 1 to 8. The negative test board (101) contacts the negative fine grid of the main-gridless back-contact battery, and the positive test board (102) contacts the positive fine grid of the main-gridless back-contact battery; The voltage and current tester is used to receive and measure the negative current and negative voltage output by the negative test board (101), as well as the positive current and positive voltage output by the positive test board (102).
10. The test system for the ownerless grid back-contact battery according to claim 9, characterized in that, The light source includes a xenon lamp; and / or The transparent glass plate includes ultra-clear low-e glass with a thickness of 3 mm to 10 mm.