Circuit board structure with beryllium copper clamping piece

Abstract

The utility model provides a circuit board structure with a beryllium copper clamping piece, which comprises a circuit board, the circuit board is provided with the beryllium copper clamping piece used for connecting a test head, the beryllium copper clamping piece comprises two symmetrically arranged side clamping pieces, and the upper ends of the two side clamping pieces are connected; each side clamping piece comprises a clamping piece unit, a contact pin gap used for allowing a contact pin on the testing head to be inserted is formed between the clamping piece units on the two sides, and a flaring part is arranged on one side of each clamping piece unit. Pins are arranged at the lower ends of the clamping piece units, the pins on the clamping piece units on the two sides are arranged in a one-to-one correspondence mode, every two corresponding pins form a pin set, and jacks used for being connected with the pin set are formed in the circuit board. Compared with a traditional connection mode through a binding post, the beryllium copper clamping piece does not cause jacking deformation to the contact pin, and secondary use of the testing head is not affected.

Description

Technical field

[0001] The utility model relates to the technical field of circuit boards, and particularly relates to a circuit board structure with beryllium copper clips. Background technique

[0002] When the existing circuit board is tested, the test head needs to be connected to the terminal on the circuit board and tested. Among them, the existing terminal uses the method of screwing to fix the pin on the test head. This connection method has the following problems: 1. When the screwing force is too large, the pin on the test head is easily pressed and deformed, affecting the secondary use of the test head; 2. The screw is prone to loosen, so that the pin is easily disconnected from the circuit or the contact between the pin and the terminal is poor. Summary of the invention

[0003] The purpose of the utility model is to solve the deficiencies in the prior art and provide a circuit board structure with beryllium copper clips.

[0004] The purpose of the utility model is achieved by the following technical solutions: A circuit board structure with beryllium copper clips includes a circuit board, on which there are beryllium copper clips for connecting the test head. The beryllium copper clips include two symmetrically arranged side clips, and the upper ends of the two side clips are connected; the side clip includes a clip unit, and an insertion pin gap for inserting the pin on the test head is formed between the clip units on both sides. One side of the clip unit is provided with a flared portion; the lower end of the clip unit is provided with an insertion pin, and the insertion pins on the clip units on both sides are arranged in one-to-one correspondence. The two corresponding insertion pins form an insertion pin group, and the circuit board is provided with a jack for connecting the insertion pin group.

[0005] Preferably, the circuit board is arranged in a housing, and the housing is provided with a connection hole corresponding to the beryllium copper clip; the flared portion is arranged on the side of the clip unit close to the connection hole.

[0006] Preferably, the test head is provided with an external thread, and the inner wall of the connection hole is provided with an internal thread matching the external thread.

[0007] Preferably, the maximum width between the two corresponding insertion pins is 1.1-1.3 mm, and the width of the jack is 0.7-0.9 mm.

[0008] Preferably, the middle width of the insertion pin gap is greater than the widths of both ends of the insertion pin gap.

[0009] Preferably, an outwardly expanding portion is provided on the side of the clip unit away from the flared portion.

[0010] Preferably, the side clip includes two clip units.

[0011] Preferably, the surface of the beryllium copper clip is provided with a nickel-tin coating.

[0012] The beneficial effects of the present utility model are as follows: Compared with the traditional connection method through terminal posts, the beryllium copper clip will not cause the pin to be pressed and deformed, which does not affect the secondary use of the test head; and the clamping force of the beryllium copper clip on the pin is relatively stable, the pin is not likely to become loose, and the pin is not easy to break away from the beryllium copper clip during the test process. Description of the Drawings

[0013] Figure 1 For the circuit board installed in the housing

[0014] Figure 2 It is a schematic diagram when the circuit board is connected to the test head through the beryllium copper clip.

[0015] Figure 3 It is a schematic diagram of the structure of the test head.

[0016] Figure 4 It is a schematic diagram of the structure of the beryllium copper clip.

[0017] Figure 5 It is a front view of the beryllium copper clip.

[0018] Figure 6 It is a schematic diagram when the beryllium copper clip is connected to the circuit board.

[0019] In the figure: 1. Circuit board, 1-1. Jack, 2. Test head, 2-1. Pin, 2-2. External thread, 3. Housing, 4. Beryllium copper clip, 4-1. Clip unit, 4-2. Pin, 4-3. Flared part, 4-4. Outer expansion part, 4-5. Pin gap. Specific Embodiments

[0020] Next, the technical solutions in the embodiments of the present utility model will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present utility model. Obviously, the described embodiments are only a part of the embodiments of the present utility model, rather than all of the embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art belong to the scope of protection of the present utility model.

[0021] Such as Figures 1 to 6As shown in the figure, a circuit board structure with beryllium copper clips includes a circuit board 1. On the circuit board 1, there are beryllium copper clips 4 for connecting the test head 2. The beryllium copper clip 4 includes two symmetrically arranged side clips, and the upper ends of the two side clips are connected; the side clip includes a clip unit 4-1, and an insertion pin gap 4-5 for inserting the insertion pin 2-1 on the test head 2 is formed between the clip units 4-1 on both sides. One side of the clip unit 4-1 is provided with a flared portion 4-3; the lower end of the clip unit 4-1 is provided with an insertion pin 4-2, and the insertion pins 4-2 on the clip units 4-1 on both sides are arranged in one-to-one correspondence. The two corresponding insertion pins form an insertion pin group, and the circuit board 1 is provided with a jack 1-1 for connecting the insertion pin group.

[0022] In the present utility model, the material of the beryllium copper clip 4 is beryllium copper. The beryllium copper clip 4 has a certain elasticity and is used to connect the test head 2. When connecting, the insertion pin 2-1 on the test head 2 is inserted into the insertion pin gap 4-5 on the beryllium copper clip 4. Through the elasticity of the beryllium copper clip 4 itself, the insertion pin 2-1 is clamped, so that the insertion pin 2-1 can be stably connected and contacted with the beryllium copper clip 4, and there is a large contact area between the insertion pin 2-1 and the beryllium copper clip 4, effectively avoiding the situation of poor contact between the insertion pin 2-1 and the beryllium copper clip 4. One side of the clip unit 4-1 is provided with a flared portion 4-3. The existence of the flared portion 4-3 makes one side of the clip unit 4-1 form a flared guiding port. The insertion pin 2-1 on the test head 2 is inserted into the insertion pin gap 4-5 through this guiding port. The existence of the guiding port plays a guiding role in the insertion of the insertion pin 2-1. Compared with the traditional connection method through the terminal post, the beryllium copper clip 4 will not cause the insertion pin 2-1 to be pressed and deformed, and does not affect the secondary use of the test head 2; and the clamping force of the beryllium copper clip 4 on the insertion pin 2-1 is relatively stable, and the insertion pin 2-1 is not easy to loosen, and the insertion pin 2-1 is not easy to separate from the beryllium copper clip 4 during the test process.

[0023] In the actual manufacturing process, the flared portion 4-3 can be formed on the clip unit 4-1 by die stamping.

[0024] In this embodiment, the maximum width H between two corresponding insertion pins 4-2 is 1.1-1.3 mm, and the width D of the jack 1-1 is 0.7-0.9 mm. The maximum width between two corresponding insertion pins 4-2 is greater than the width of the jack 1-1, so that when the insertion pin group is inserted into the jack 1-1, an interference fit is formed between the insertion pin group and the jack 1-1, so that the beryllium copper clip 4 can be stably inserted on the circuit board 1.

[0025] The middle width of the insertion pin gap 4-5 is greater than the widths of both ends of the insertion pin gap 4-5. Among them, the middle width of the insertion pin gap 4-5 is slightly smaller than the diameter of the insertion pin 2-1, so that the insertion pin 2-1 can be firmly clamped by the beryllium copper clip 4 after being inserted.

[0026] Furthermore, an outward expansion portion 4-4 is provided on the side of the clip unit 4-1 away from the flared portion 4-3. The presence of the outward expansion portion 4-4 forms a flared opening on the side of the clip unit 4-1 away from the flared portion 4-3. The existence of this opening ensures that when the pin 2-1 is inserted and removed, the side of the clip unit 4-1 away from the flared portion 4-3 does not come into direct contact with the pin 2-1, thus preventing the surface of the pin 2-1 from being scratched due to defects such as burrs at the edge of this side. During actual manufacturing, the outward expansion portion 4-4 can be formed on the clip unit 4-1 by means of die stamping.

[0027] The side clip includes at least one clip unit 4-1. In this embodiment, the side clip includes two clip units 4-1. The two clip units 4-1 are arranged adjacent to each other.

[0028] The surface of the beryllium copper clip 4 is provided with a nickel-tin coating. By plating a nickel-tin coating on the surface of the beryllium copper clip 4, oxidation of the surface of the beryllium copper clip 4 can be prevented.

[0029] The circuit board 1 is disposed in the housing 3, and the housing 3 is provided with connection holes corresponding to the beryllium copper clips 4; the flared portion 4-3 is provided on the side of the clip unit 4-1 close to the connection holes. The pins 2-1 on the test head 2 extend into the interior of the housing 3 through the connection holes provided on the housing 3 and are connected to the beryllium copper clips 4.

[0030] The test head 2 is provided with an external thread 2-2, and the inner wall of the connection hole is provided with an internal thread matching the external thread 2-2. During testing, the test head 2 is connected to the housing 3 by means of threaded connection, enabling the test head 2 to be relatively fixed with respect to the housing 3.

[0031] The present utility model is not limited to the above-mentioned optimal embodiment, and anyone can obtain other various forms of products under the inspiration of the present utility model. However, no matter what changes are made in its shape or structure, as long as it has a technical solution identical or similar to that of the present application, it falls within the protection scope of the present utility model.

Claims

1. A circuit board structure with beryllium copper clips, characterized in that, It includes a circuit board, on which there are beryllium copper clips for connecting test probes. The beryllium copper clips include two symmetrically arranged side clips, and the upper ends of the two side clips are connected; the side clip includes a clip unit, and an insertion pin gap for inserting the insertion pins on the test probe is formed between the clip units on both sides. One side of the clip unit is provided with a flared portion; the lower end of the clip unit is provided with pins, and the pins on the clip units on both sides are arranged in one-to-one correspondence. Two corresponding pins form a pin group, and there are jacks on the circuit board for connecting the pin groups.

2. The circuit board structure with a beryllium copper clip according to claim 1, characterized in that, The circuit board is arranged in a housing, and there are connection holes corresponding to the beryllium copper clips on the housing; the flared portion is arranged on one side of the clip unit close to the connection hole.

3. The circuit board structure with beryllium copper clips according to claim 2, characterized in that, The test probe is provided with an external thread, and the inner wall of the connection hole is provided with an internal thread matching the external thread.

4. A circuit board structure with beryllium copper clips according to claim 1, characterized in that, The maximum width between the two corresponding pins is 1.1 - 1.3 mm, and the width of the jack is 0.7 - 0.9 mm.

5. A circuit board structure with a beryllium copper clip, characterized in that, The middle width of the insertion pin gap is greater than the widths at both ends of the insertion pin gap.

6. The circuit board structure with a beryllium copper clip according to claim 1, characterized in that, One side of the clip unit away from the flared portion is provided with an outward expansion portion.

7. A circuit board structure with a beryllium copper clip according to claim 1, characterized in that, The side clip includes two clip units.

8. A circuit board structure with a beryllium copper clip according to claim 1, characterized in that, The surface of the beryllium copper clip is provided with a nickel-tin coating.

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