Test needle bed and circuit board test system

Abstract

The utility model provides a test needle bed and a circuit board test system. The test needle bed comprises a tool circuit board; a plurality of probes and sockets are arranged on the tool circuit board; one end of each probe is connected with a tested circuit board; one end of each probe is in one-to-one correspondence with each detected point on a detected circuit board; the other ends of the plurality of probes are correspondingly connected to corresponding jacks on the socket through PCB wiring on the tool circuit board; each jack on the socket is used for plugging power supply equipment or measuring equipment. The utility model can simplify the welding process and improve the test effectiveness.

Description

Technical Field

[0001] The utility model relates to the technical field of automatic testing, in particular to a test pin bed and a circuit board testing system. Background Art

[0002] In the related art, when performing performance testing on a circuit board, one end of a probe is usually directly set on the measured point of the circuit board to be measured, and a wire harness is welded to the other end of the probe, and the other end of the wire harness is connected to a corresponding power supply device or measuring device to realize the performance testing of the circuit board to be measured.

[0003] However, as the use time increases, the welded wire harness sometimes falls off, which requires re-welding and detecting the welding quality. After ensuring that the measured point can be correctly connected to the corresponding power supply device or measuring device, it can be put into use. It can be seen that the above method of welding the wire harness on the probe is inconvenient to operate and has poor stability, and cannot guarantee effective testing. Summary of the Utility Model

[0004] Embodiments of the utility model provide a test pin bed and a circuit board testing system to solve the problems that the existing testing device is inconvenient to operate, has poor stability, and cannot guarantee effective testing.

[0005] In a first aspect, embodiments of the utility model provide a test pin bed, including: a tooling circuit board;

[0006] A plurality of probes and sockets are provided on the tooling circuit board;

[0007] One end of the plurality of probes is connected to the circuit board to be measured; one end of each probe corresponds to each measured point on the circuit board to be measured one by one;

[0008] The other ends of the plurality of probes are correspondingly connected to the corresponding sockets on the socket via PCB wiring on the tooling circuit board;

[0009] Each socket on the socket is used for plugging in a power supply device or a measuring device.

[0010] In a possible implementation manner, it further includes a terminal block provided between the socket and the power supply device or the measuring device;

[0011] One end of each socket on the socket is plugged and unplugged with the corresponding interface on the terminal block, and the other ends of the interfaces on the terminal block are fixedly connected to the power supply device or the measuring device.

[0012] In a possible implementation manner, the measured point includes: a power supply point; the probe includes: a power supply probe; the socket includes: a power supply socket;

[0013] One end of the power supply probe corresponds to the power supply point one by one;

[0014] The other end of the power supply probe is correspondingly connected to the corresponding socket on the power supply socket via the PCB wiring on the tooling circuit board;

[0015] Each socket on the power supply socket is used to plug in a power supply device.

[0016] In a possible implementation, the measured points include: measurement points; the probes include: measurement probes; the sockets include: measurement sockets;

[0017] One end of the measurement probe corresponds to the measurement point one by one;

[0018] The other end of the measurement probe is correspondingly connected to the corresponding socket on the measurement socket via the PCB wiring on the tooling circuit board;

[0019] Each socket on the measurement socket is used to plug in a measurement device.

[0020] In a possible implementation, the power supply voltages required by the power supply points are the same, and the power supply probes corresponding to the power supply points are connected to the same socket on the power supply socket via the PCB wiring on the tooling circuit board;

[0021] The same socket is used to connect a power supply device that provides the power supply voltage.

[0022] In a possible implementation, the power supply voltages required by the power supply points are different, and the power supply probes corresponding to the power supply points are respectively connected to different sockets on the power supply socket via the PCB wiring on the tooling circuit board;

[0023] The different sockets are respectively used to connect power supply devices that provide corresponding power supply voltages.

[0024] In a possible implementation, test positioning holes are provided on the measured circuit board; positioning posts are provided on the tooling circuit board;

[0025] The positioning posts correspond to the test positioning holes one by one;

[0026] The tooling circuit board is arranged at a preset position above the measured circuit board via the positioning posts.

[0027] In a possible implementation, the probe is an elastic probe, and the maximum height of the elastic probe is greater than or equal to the height of the positioning post.

[0028] In a possible implementation, the multiple probes and the positioning posts are disposed on the lower surface of the tooling circuit board; the socket is disposed on the upper surface of the tooling circuit board;

[0029] The tooling circuit board is fixedly disposed at a preset position above the circuit board under test via the positioning posts, and is electrically connected to the circuit board under test via the multiple probes.

[0030] In a second aspect, an embodiment of the present invention provides a circuit board testing system, including the test pin bed according to any one of the first aspects, and a power supply device and / or a measuring device connected to the test pin bed.

[0031] An embodiment of the present invention provides a test pin bed and a circuit board testing system. By using a tooling circuit board provided with multiple probes and sockets, performance testing of the circuit board under test can be achieved. Among them, one end of each of the multiple probes on the tooling circuit board corresponds to each measured point on the circuit board under test, and the other ends of the multiple probes are correspondingly connected to the corresponding sockets on the socket via PCB wiring on the tooling circuit board. Each socket on the socket is used for plugging and unplugging connection to a power supply device or a measuring device, so as to connect each measured point on the circuit board under test to the corresponding power supply device or measuring device for performance testing. Compared with the method of welding wire harnesses on the probes, the test pin bed provided in this application can effectively simplify the welding process, and at the same time, can also avoid the phenomenon of wire harness detachment and improve the test stability. Description of the Drawings

[0032] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following will briefly introduce the drawings required for use in the embodiments or the description of the prior art. Obviously, the following drawings are only some embodiments of the present invention. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0033] Figure 1 is a schematic structural diagram of a test pin bed provided by an embodiment of the present invention;

[0034] Figure 2 is a schematic structural diagram of a socket and a terminal provided by an embodiment of the present invention;

[0035] Figure 3 is a schematic structural diagram of a test pin bed provided by another embodiment of the present invention. Detailed Embodiments

[0036] To enable those skilled in the art to better understand this solution, the following will clearly describe the technical solution in the embodiments of this solution in combination with the accompanying drawings in the embodiments of this solution. Obviously, the described embodiments are part of the embodiments of this solution, rather than all of the embodiments. Based on the embodiments in this solution, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the scope of protection of this solution.

[0037] The terms "including" and any other variations in the specification, claims, and above-mentioned accompanying drawings of this solution mean "including but not limited to", intending to cover non-exclusive inclusion and not limited to the examples listed in the text. In addition, terms such as "first" and "second" are used to distinguish different objects, rather than to describe a specific order.

[0038] In the related art, when performing performance testing on a circuit board, the method of welding wire harnesses on the probes is usually adopted to achieve the performance testing of the circuit board to be tested. However, as the use time increases, the welded wire harnesses sometimes fall off, which requires re-welding and corresponding detection of the welding quality to ensure that the measured points can be correctly connected to the corresponding power supply equipment or measuring equipment before being put into use. It can be seen that the above method of welding wire harnesses on the probes is inconvenient to operate and has poor stability, and cannot guarantee effective testing.

[0039] For the idea of simplifying the welding process and improving the testing stability, in the specific implementation of this application, a tooling circuit board provided with multiple probes and sockets is used as a test bed for performing performance testing on the circuit board to be tested. Among them, one end of the multiple probes on the tooling circuit board corresponds to each measured point on the circuit board to be tested one by one, and the other ends of the multiple probes are correspondingly connected to the corresponding sockets on the socket via the PCB wiring on the tooling circuit board. Each socket on the socket is used for plugging and unplugging connection to the power supply equipment or measuring equipment, so as to connect each measured point on the circuit board to be tested to the corresponding power supply equipment or measuring equipment for performance testing. Compared with the method of welding wire harnesses on the probes, the test bed provided by this application can effectively simplify the welding process, and at the same time, can also avoid the phenomenon of wire harness falling off and improve the testing stability.

[0040] The following will describe the implementation of the present invention in detail in combination with specific drawings:

[0041] Figure 1 It is a schematic structural diagram of a test bed provided for an embodiment of the present invention. Refer to Figure 1 This test bed includes: a tooling circuit board 11;

[0042] Multiple probes 12 and sockets 13 are provided on the tooling circuit board 11;

[0043] One end of multiple probes 12 is connected to the circuit board 14 to be measured; one end of each probe corresponds to each measured point on the circuit board 14 to be measured one by one;

[0044] The other ends of multiple probes 12 are correspondingly connected to the corresponding sockets on the socket 13 via the PCB wiring on the tooling circuit board 11;

[0045] Each socket on the socket 13 is used to plug in a power supply device or a measuring device.

[0046] In the embodiment of the present utility model, the tooling circuit board 11 is connected to the circuit board 14 to be measured through one end of multiple probes 12, and the other ends of multiple probes 12 are connected to the corresponding sockets on the socket 13 via the PCB wiring on the tooling circuit board 11, so as to connect each measured point on the circuit board 14 to be measured to the corresponding socket on the socket 13. On this basis, by plugging in a power supply device or a measuring device at each socket on the socket 13, the performance test of the circuit board to be measured is realized.

[0047] Compared with the method of welding wire harnesses on the probes, the test probe bed provided by the embodiment of the present utility model only needs to weld the probes and the socket to the tooling circuit board, and there is no need to weld wire harnesses on the probes separately, which can effectively simplify the welding process, and at the same time can also avoid the situation of wire harness detachment and improve the test stability.

[0048] In some embodiments, see Figure 2 that the above test probe bed further includes: a terminal 21 arranged between the socket and the power supply device or the measuring device.

[0049] Each socket on the socket 13 is plugged and connected to one end of the corresponding interface on the terminal 21, and the other end of each interface on the terminal 21 is fixedly connected to the power supply device or the measuring device.

[0050] In the embodiment of the present utility model, one end of the terminal 21 is plugged and connected to the socket 13, and the other end of the terminal 21 is fixedly connected to the wire harness of the power supply device or the measuring device, so as to realize the plug-and-play connection between the power supply device or the measuring device and the tooling circuit board, and there is no need to weld wire harnesses, which can effectively simplify the welding process.

[0051] In some embodiments, the measured points include: power supply points; the probes include: power supply probes; the sockets include: power supply sockets.

[0052] One end of the power supply probe corresponds to the power supply point one by one;

[0053] The other end of the power supply probe is correspondingly connected to the corresponding socket on the power supply socket via the PCB wiring on the tooling circuit board;

[0054] Each socket on the power supply socket is used to plug in a power supply device.

[0055] Here, the point to be measured on the circuit board under test can be a power supply point. When the point to be measured is a power supply point, correspondingly, the corresponding probe is a power supply probe, and the corresponding socket is a power supply socket.

[0056] In some embodiments, the power supply voltages required by the power supply points are the same. The power supply probes corresponding to the power supply points are connected to the same socket on the power supply socket via the PCB wiring on the tooling circuit board;

[0057] The same socket is used to connect to a power supply device that provides the power supply voltage.

[0058] In some embodiments, the power supply voltages required by the power supply points are different. The power supply probes corresponding to the power supply points are respectively connected to different sockets on the power supply socket via the PCB wiring on the tooling circuit board;

[0059] The different sockets are respectively used to connect to power supply devices that provide corresponding power supply voltages.

[0060] That is to say, each socket on the power supply socket is respectively used to provide different power supply voltages. If the power supply voltages required by different power supply points are the same, then different power supply points can be connected to the same socket on the power supply socket via the PCB wiring on the tooling circuit board. If the power supply voltages required by each power supply point are different, then each power supply point can be respectively connected to the socket corresponding to the power supply voltage.

[0061] In some embodiments, the point to be measured includes: a measurement point; the probe includes: a measurement probe; the socket includes: a measurement socket.

[0062] One end of the measurement probe corresponds to the measurement point one by one;

[0063] The other end of the measurement probe is correspondingly connected to the corresponding socket on the measurement socket via the PCB wiring on the tooling circuit board;

[0064] Each socket on the measurement socket is used to plug in a measurement device.

[0065] Here, the point to be measured on the circuit board under test can be a measurement point. When the point to be measured is a measurement point, correspondingly, the corresponding probe is a measurement probe, and the corresponding socket is a measurement socket.

[0066] In the embodiments of the present utility model, the sockets are divided into two categories, one is a power supply socket, and the other is a measurement socket. Each socket on the power supply socket is used to connect a power supply probe and a power supply device, and each socket on the measurement socket is used to connect a measurement probe and a measurement device.

[0067] In some embodiments, referring to Figure 3 , test positioning holes 31 are provided on the circuit board 14 under test; positioning posts 32 are provided on the tooling circuit board 11;

[0068] The positioning posts 32 correspond to the test positioning holes 31 one by one;

[0069] The tooling circuit board 11 is disposed at a preset position above the circuit board 14 to be tested via the positioning posts 32.

[0070] In an embodiment of the present invention, the positioning posts 32 on the tooling circuit board 11 are fixedly corresponding to the test positioning holes 31 on the circuit board 14 to be tested. Through the positioning posts 32, the tooling circuit board 11 can be disposed at a preset position above the circuit board 14 to be tested, so that each probe 12 on the tooling circuit board 11 corresponds to the position of each point to be tested on the circuit board 14 to be tested one by one.

[0071] In some embodiments, the probe is an elastic probe, and the maximum height of the elastic probe is greater than or equal to the height of the positioning post.

[0072] In an embodiment of the present invention, the maximum height of the elastic probe is greater than or equal to the height of the positioning post, so that when the tooling circuit board is fixedly disposed above the circuit board to be tested via the positioning post, each probe on the tooling circuit board can effectively contact each point to be tested on the circuit board to be tested, thereby effectively transmitting the electrical signals in the power supply device or the measuring device to each point to be tested to ensure effective testing and improve the testing stability.

[0073] In some embodiments, a plurality of probes and positioning posts are disposed on the lower surface of the tooling circuit board; the socket is disposed on the upper surface of the tooling circuit board;

[0074] The tooling circuit board is fixedly disposed at a preset position above the circuit board to be tested via the positioning post and is electrically connected to the circuit board to be tested via a plurality of probes.

[0075] When the tooling circuit board is fixedly disposed at a preset position above the circuit board to be tested via the positioning post, the probe can be disposed on the lower surface of the tooling circuit board to facilitate connecting each point to be tested on the circuit board to be tested. The socket can be disposed on the upper surface of the tooling circuit board to facilitate plugging and unplugging the power supply device and / or the measuring device.

[0076] Based on the above test probe bed, an embodiment of the present invention further provides a circuit board test system, including the above test probe bed, and a power supply device and / or a measuring device connected to the above test probe bed.

[0077] The above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: they can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements for some of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A test bed of needles, characterized in that, Comprising: A tooling circuit board; Multiple probes and sockets are provided on the tooling circuit board; One end of the multiple probes is connected to the circuit board under test; One end of each probe corresponds one-to-one with each measured point on the circuit board under test; The other ends of the multiple probes are correspondingly connected to the corresponding sockets on the socket via PCB wiring on the tooling circuit board; Each socket on the socket is used to plug in a power supply device or a measuring device.

2. The test probe bed according to claim 1, wherein It further includes a terminal block provided between the socket and the power supply device or the measuring device; One end of each socket on the socket is plugged and unplugged with the corresponding interface on the terminal block, and the other ends of the interfaces on the terminal block are fixedly connected to the power supply device or the measuring device.

3. The test probe bed according to claim 1 or 2, characterized in that, The measured points include: power supply points; the probes include: power supply probes; the sockets include: power supply sockets; One end of the power supply probe corresponds one-to-one with the power supply point; The other end of the power supply probe is correspondingly connected to the corresponding socket on the power supply socket via PCB wiring on the tooling circuit board; Each socket on the power supply socket is used to plug in a power supply device.

4. The test probe bed according to claim 1 or 2, characterized in that, The measured points include: measurement points; the probes include: measurement probes; the sockets include: measurement sockets; One end of the measurement probe corresponds one-to-one with the measurement point; The other end of the measurement probe is correspondingly connected to the corresponding socket on the measurement socket via PCB wiring on the tooling circuit board; Each socket on the measurement socket is used to plug in a measuring device.

5. The test probe bed according to claim 3, wherein, The required supply voltages of the power supply points are the same, and the power supply probes corresponding to the power supply points are connected to the same socket on the power supply socket via PCB wiring on the tooling circuit board; The same socket is used to connect a power supply device that provides the supply voltage.

6. The test probe bed according to claim 3, wherein, The required supply voltages of the power supply points are different, and the power supply probes corresponding to the power supply points are respectively connected to different sockets on the power supply socket via PCB wiring on the tooling circuit board; The different sockets are respectively used to connect power supply devices that provide corresponding supply voltages.

7. The test probe bed according to claim 1 or 2, characterized in that, Test positioning holes are provided on the circuit board under test; positioning posts are provided on the tooling circuit board; The positioning posts correspond one-to-one with the test positioning holes; The tooling circuit board is arranged at a preset position above the circuit board under test via the positioning posts.

8. The test probe bed according to claim 7, characterized in that, The probe is an elastic probe, and the maximum height of the elastic probe is greater than or equal to the height of the positioning post.

9. The test probe bed according to claim 7, wherein The multiple probes and the positioning posts are arranged on the lower surface of the tooling circuit board; the socket is arranged on the upper surface of the tooling circuit board; The tooling circuit board is fixedly arranged at a preset position above the circuit board under test via the positioning posts, and is electrically connected to the circuit board under test via the multiple probes.

10. A circuit board testing system, characterized in that, It includes the test pin bed according to any one of claims 1 to 9, and a power supply device and / or a measuring device connected to the test pin bed.

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