Semiconductor laser strong current test tool

Abstract

The utility model provides a semiconductor laser strong current test tool, which belongs to the technical field of semiconductor lasers and comprises a platform. The positioning seat is provided with a step groove for positioning a plurality of lasers; the bottom of the positioning seat is fixedly connected with the top of the platform; the sliding plate is slidably arranged at the top of the positioning seat and located on the front side of the step groove; the toggle clamp is fixedly arranged at the top of the platform and located on the rear side of the positioning seat; a telescopic rod of the toggle clamp penetrates through the positioning seat and is fixedly connected with the sliding plate; the telescopic rod is in sliding fit with the positioning seat; two probes form a group, and the probes are arranged at the top of the sliding plate; the adjacent probes in different groups are electrically connected through circuit bridging lines; the outmost probes are respectively connected with the positive and negative electrodes of an external power supply through circuit bridging lines; and when the sliding plate moves, each group of probes are driven to be respectively crimped with positive and negative power supplies of the laser. The testing tool can test lasers in batches, and is accurate in positioning and simple and convenient to operate during testing.

Description

Technical Field

[0001] The utility model relates to the technical field of semiconductor lasers, and particularly relates to a high-voltage test tooling for semiconductor lasers. Background Art

[0002] With the continuous improvement of living standards, people's requirements for beauty are also getting higher and higher. The hair removal industry has gradually emerged, and the demand for high-power lasers in beauty salons has continued to increase. However, people's thinking is still in a conservative stage, and only large-area hair is treated in beauty salons. However, due to conceptual reasons, the hair in the private parts and some places will not be removed in beauty salons. Therefore, handheld household air-cooled hair removal low-power lasers have emerged, and painless hair removal can be achieved at home.

[0003] The demand for lasers is also increasing year by year. However, when producing household lasers, it is necessary to conduct high-voltage tests, energy tests, heat dissipation tests, etc. However, if individual tests are used, it is a waste of time and the production efficiency is low. Summary of the Utility Model

[0004] To solve the above technical problems, the utility model provides a high-voltage test tooling for semiconductor lasers, which can test lasers in batches with accurate positioning and simple operation during the test.

[0005] The utility model provides the following technical solutions:

[0006] A high-voltage test tooling for semiconductor lasers, comprising:

[0007] A platform;

[0008] A positioning seat having a stepped groove for positioning a plurality of lasers; the bottom of the positioning seat is fixedly connected to the top of the platform;

[0009] A sliding plate slidably disposed on the top of the positioning seat and located on the front side of the stepped groove;

[0010] An elbow clamp fixedly disposed on the top of the platform and located on the rear side of the positioning seat; the telescopic rod of the elbow clamp passes through the positioning seat and is fixedly connected to the sliding plate; the telescopic rod is slidably matched with the positioning seat;

[0011] A plurality of probes, two in a group, are disposed on the top of the sliding plate; the probes in different groups and adjacent to each other are electrically connected by a circuit bridge wire; the outermost probes are respectively connected to the positive and negative poles of an external power supply by circuit bridge wires; when the sliding plate moves, each group of probes is driven to press against the positive and negative power supply points of the laser respectively.

[0012] Preferably, a plurality of baffles are provided, each of which is provided with a groove and is fixedly connected to the lower step surface of the positioning seat; the groove of the baffle cooperates with one of the lasers for limiting.

[0013] Preferably, slide rails are provided on both sides of the top of the platform, and guide rail sliders that are slidably matched with the guide rails are respectively fixed at both ends of the bottom of the sliding plate.

[0014] Preferably, the probe is a spring probe.

[0015] Preferably, a plurality of fans are provided on the upper groove wall of the step groove of the positioning seat and cooperate with the radiators of the plurality of lasers respectively.

[0016] Preferably, a stop bar is further included; the stop bar is arranged on the front side of the sliding plate, and when performing energy testing, the energy meter is close to the stop bar to test the laser.

[0017] Advantages of the present utility model:

[0018] The present utility model provides a high-voltage test tooling for semiconductor lasers. The test tooling is provided with test stations for a plurality of semiconductor lasers. The elbow clamp drives the sliding plate to simultaneously press the series-connected probes against the positive and negative probes of the lasers for high-voltage testing, effectively improving the overall production efficiency; in addition, the test tooling has accurate positioning and is easy to operate, can be lengthened according to the number of products, and can test more products at one time, which is quite practical. Description of the drawings

[0019] Figure 1 is a perspective view of the high-voltage test tooling for semiconductor lasers according to an embodiment of the present utility model;

[0020] Figure 2 is a top view of the high-voltage test tooling for semiconductor lasers according to an embodiment of the present utility model;

[0021] Figure 3 is a front view of the high-voltage test tooling for semiconductor lasers according to an embodiment of the present utility model;

[0022] Figure 4 is a side view of the high-voltage test tooling for semiconductor lasers according to an embodiment of the present utility model;

[0023] Figure 5 is a partial structural view of the high-voltage test tooling for semiconductor lasers according to an embodiment of the present utility model.

[0024] In the figure, 01, platform; 02, elbow clamp; 03, sliding plate; 04, positioning seat; 05, guide rail slider; 06, energy meter; 07, stop bar; 08, laser; 09, probe; 10, circuit bridge wiring; 11, baffle. Detailed implementation manners

[0025] In order to make the objectives, technical solutions and advantages of the present utility model more clear and understandable, the present utility model will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present utility model and are not used to limit the present utility model.

[0026] In the description of the present utility model, it should be understood that the orientation or positional relationship indicated by the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc. is based on the orientation or positional relationship shown in the accompanying drawings. It is only for the convenience of describing the present utility model and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of the present utility model.

[0027] The terms "first" and "second" are only used for descriptive purposes and cannot be construed as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include one or more of such features; in the description of the present utility model, unless otherwise specified, the meaning of "plurality" is two or more.

[0028] Embodiment 1

[0029] The demand for lasers is also increasing year by year. However, when producing household lasers, it is necessary to conduct high-voltage tests, energy tests, heat dissipation tests, etc. If individual tests are used, it is time-consuming and the production efficiency is low. For this reason, this embodiment proposes a high-voltage test tooling for semiconductor lasers, as Figures 1-5 shown, which are a perspective view, three-view drawings and a partial structural view respectively.

[0030] In terms of clamping, the laser 08 is positioned on the base 04, and then the baffle 11 is used for positioning to ensure the consistent positioning accuracy of the laser 08.

[0031] Set an elbow clamp 02 on the platform 01. When manually turning the elbow clamp 02 to the limit position, the elbow clamp 02, the telescopic rod 13 and the sliding plate 03 are locked together, and the sliding plate 03 is synchronously pulled forward. A guide rail slider 05 is installed below the sliding plate 03 for linkage, and its function is to position the sliding plate 03 without yaw. A probe 09 is installed above the sliding plate 03 and is directly pressed against the positive and negative power supplies of the laser 08 to conduct on-off. Preferably, the probe 09 is a spring probe, which is elastic and will not damage or injure the laser 08 due to excessive pressing force. A series circuit is formed between the two sets of lasers 08, and the connection medium of the circuit is the circuit bridge wiring 10 for pairwise connection. The positive lead and the negative lead are respectively connected to the positive and negative poles of the external power supply for power-on.

[0032] In terms of the normal heat dissipation test of the laser 08, a fan 12 is set on the positioning seat 04. The fan 12 is powered on and works simultaneously during the test of the laser 08 to blow and cool the radiator of the laser 08 to ensure that the laser 08 has a good heat dissipation system, and the radiator is also one-to-one.

[0033] In terms of energy testing, energy detection is required for each laser 08. Therefore, a stop bar 07 is set on the platform 01, and the energy meter 06 is positioned close to the stop bar 07 in turn to ensure that the distance between the energy meter 06 and each laser is the same, and the test results are more comparable.

[0034] This test fixture is designed for the convenience and accuracy of testing. It can be lengthened according to the number of products, and more products can be tested at one time, which is quite practical.

[0035] This test fixture is provided with test stations for multiple semiconductor lasers. The elbow clamp drives the sliding plate, and the series-connected probes are synchronously pressed against the positive and negative probes of the laser for high-voltage testing, effectively improving the overall production efficiency. In addition, this test fixture has accurate positioning and is easy to operate.

[0036] The above are only the preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent replacements, and improvements made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A high-voltage test tooling for semiconductor lasers, characterized in that, Comprising: Platform (01); Positioning seat (04), having a stepped groove for positioning a plurality of lasers (08); The bottom of the positioning seat (04) is fixedly connected to the top of the platform (01); Sliding plate (03), slidably arranged on the top of the positioning seat (04) and located on the front side of the stepped groove; Elbow clamp (02), fixedly arranged on the top of the platform (01) and located on the rear side of the positioning seat (04); the telescopic rod (13) of the elbow clamp (02) passes through the positioning seat (04) and is fixedly connected to the sliding plate (03); the telescopic rod (13) is slidably matched with the positioning seat (04); A plurality of probes (09), two in a group, are arranged on the top of the sliding plate (03); the probes (09) in different groups and adjacent to each other are electrically connected by a circuit bridge wire (10); the outermost probes (09) are respectively connected to the positive and negative poles of an external power supply through the circuit bridge wire (10); when the sliding plate (03) moves, it drives each group of probes (09) to be respectively crimped with the positive and negative power supply points of the laser (08).

2. The semiconductor laser high-voltage test tooling according to claim 1, wherein A plurality of baffles (11), each of which is provided with a groove body and is fixedly connected to the lower stepped surface of the positioning seat (04); the groove body of the baffle (11) cooperates with one of the lasers (08) for limiting.

3. The semiconductor laser high-power test tooling according to claim 1, wherein Sliding rails are arranged on both sides of the top of the platform (01), and guide rail sliders (05) slidably matched with the sliding rails are respectively fixed at both ends of the bottom of the sliding plate (03).

4. The high-voltage test tooling for semiconductor lasers according to claim 1, characterized in that, The probe (09) is a spring probe.

5. The high-voltage test tooling for semiconductor lasers according to claim 1, wherein A plurality of fans (12) are arranged on the upper groove wall of the stepped groove of the positioning seat (04) and respectively cooperate with the radiators of the plurality of lasers (08).

6. The semiconductor laser high-voltage test tooling according to claim 1, characterized in that It further includes a stop bar (07); the stop bar (07) is arranged on the front side of the sliding plate (03), wherein, when performing energy testing, the energy meter (06) is close to the stop bar (07) to test the laser (08).

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