Detection mechanism and sorting machine

Abstract

The utility model provides a detection mechanism and a sorting machine, and relates to the technical field of detection equipment, the detection mechanism provided by the utility model comprises a supporting assembly, a probe assembly and a linear driving assembly, the supporting assembly comprises a carrying table with a supporting surface; the probe assembly and the side wall of the carrying table are oppositely arranged at intervals, and the probe assembly comprises a plurality of elastic probes which are distributed along the side edge of the supporting surface at intervals; the linear driving assembly comprises a pushing block and a linear driving piece, and the pushing block is located on the side, away from the carrying table, of the probe and connected with the driving end of the linear driving piece; the linear driving piece is arranged on the supporting assembly and used for driving the pushing block to move towards the probe so that the pushing block can push the probe to be close to the supporting face. According to the detection mechanism provided by the utility model, the technical problem in the prior art that the diameter of the probe guide hole is increased due to the fact that the pin abrades the probe pin hole along with the increase of the number of times of testing, so that a product is easily detected mistakenly is solved.

Description

Technical Field

[0001] The utility model relates to the technical field of detection equipment, in particular to a detection mechanism and a sorting machine. Background Art

[0002] In the prior art, for the detection structures of electronic components with different packages in a sorting machine, the methods mainly adopted are clamping detection or pressing detection. The chip is placed in the detection area by means of gravity or translational material taking, and the pins of the chip are subjected to pressing detection or clamping detection. Especially for DIP (dual in-line package) packaged components with straight pins, the traditional method is basically to drill holes according to the positions of the pins of the electronic components, and the pins of the electronic components are put into the corresponding holes for partial testing; the semiconductor components are detected by using test probes corresponding to the probe guiding holes on the probe guide plate one by one. With the increase of the number of tests, the pins will wear the probe guiding holes, increasing the diameter of the probe guiding holes, thus easily causing misdetection of products. Content of the Utility Model

[0003] The purpose of the utility model is to provide a detection mechanism and a sorting machine, so as to alleviate the technical problem that with the increase of the number of tests in the related art, the pins will wear the probe pin holes, increasing the diameter of the probe guiding holes, thus easily causing misdetection of products.

[0004] In the first aspect, the detection mechanism provided by the utility model includes: a support assembly, a probe assembly and a linear drive assembly. The support assembly includes a stage with a support surface. The probe assembly is arranged at a relative interval with the side wall of the stage and includes a plurality of elastic probes. The plurality of probes are distributed at intervals along the side of the support surface.

[0005] The linear drive assembly includes a push block and a linear drive member. The push block is located on the side of the probe away from the stage and is connected to the drive end of the linear drive member. The linear drive member is arranged on the support assembly and is used to drive the push block to move towards the probe, so that the push block pushes the probe towards the support surface.

[0006] Optionally, the detection mechanism further includes a limit assembly. The limit assembly is arranged on the support assembly, and the limit assembly is located on the side of the push block facing the probe. The limit assembly is used to limit the moving distance of the push block towards the probe.

[0007] Optionally, the limit assembly includes a limit pin arranged on the support assembly. The limit pin is located between the push block and the probe, and the limit pin can be in abutting cooperation with the push block to prevent the push block from moving towards the probe.

[0008] Optionally, the linear drive assembly includes a cylinder disposed on the support assembly, and a piston rod of the cylinder is in driving connection with the push block.

[0009] Optionally, the support assembly further includes a fixed seat and a mounting seat. The stage is mounted on the fixed seat, the linear drive assembly is mounted on the mounting seat, and the probe assembly is clamped between the fixed seat and the mounting seat.

[0010] Optionally, the probe assembly further includes a reinforcing plate, and the reinforcing plates are provided on both opposite sides of the plurality of probe positions relative to the fixed seat and the mounting seat.

[0011] Optionally, the reinforcing plate is provided as an insulating plate;

[0012] The side surface of the push block opposite to the probe is provided as an arc surface, and the arc surface extends along the arrangement direction of the plurality of probes and protrudes towards the direction close to the probes.

[0013] Optionally, the detection mechanism further includes a guiding assembly, and the guiding assembly is respectively connected to the push block and the mounting seat;

[0014] And / or, the detection mechanism further includes a positioning assembly, the positioning assembly is mounted on the mounting seat, and the positioning assembly is used to cooperate with the pressing mechanism in the sorting mechanism.

[0015] Optionally, the supporting surface is provided with a plurality of limiting protrusions, and the plurality of limiting protrusions enclose a limiting space for placing electronic components;

[0016] Among two relatively arranged limiting protrusions, one of the limiting protrusions is provided with a photoelectric sensor, and the other limiting protrusion is provided with a detection hole.

[0017] In a second aspect, the sorting machine provided by the present utility model includes the above-mentioned detection mechanism.

[0018] The sorting machine provided by the present utility model includes a detection mechanism. The detection mechanism includes a support assembly, a probe assembly, and a linear drive assembly. The support assembly includes a stage with a support surface. The probe assembly is disposed at a relative interval from the side wall of the stage and includes a plurality of elastic probes. The plurality of probes are spaced apart along the side of the support surface. The linear drive assembly includes a push block and a linear drive member. The push block is located on the side of the probe away from the stage and is connected to the drive end of the linear drive member. The linear drive member is disposed on the support assembly and is used to drive the push block to move towards the probe, so that the push block pushes the probe towards the support surface. When using the detection mechanism provided by the present utility model to detect an electronic component, the electronic component is placed on the support surface. The pins of the electronic component are opposite to the probes and extend out of the stage. The linear drive assembly drives the push block to push the probe to tilt towards the stage, so that the probe contacts the pin. After the detection is completed, the linear drive assembly drives the push block to move away from the stage, and the probe returns to its original position under the action of its own restoring force, so as to separate from the pin.

[0019] The detection mechanism provided by the present utility model realizes the contact or separation between the probe and the pin by pushing the probe with the push block, without the need for the pin to cooperate with the corresponding hole, and no wear of the hole wall will occur. Therefore, compared with the structure in the prior art where the pin is placed into the corresponding hole for sectional testing, it can prevent misdetection of the product caused by wear. In addition, the electrical connection between the probe and the pin is realized by contact, which can be applied not only to vertical-pin electronic components but also to oblique-pin electronic components, and has better applicability. Description of the Drawings

[0020] In order to more clearly illustrate the specific embodiments of the present utility model or the technical solutions in the related art, the following will briefly introduce the drawings required to be used in the description of the specific embodiments or the related art. Obviously, the drawings in the following description are some embodiments of the present utility model. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0021] Figure 1 It is a schematic structural diagram of the detection mechanism provided by the embodiment of the present utility model;

[0022] Figure 2 It is Figure 1 a partial enlarged view of part A in

[0023] Figure 3 It is a schematic bottom structural diagram of the detection mechanism provided by the embodiment of the present utility model

[0024] Figure 4 It is a schematic installation diagram of the stage in the detection mechanism provided by the embodiment of the present utility model;

[0025] Figure 5Schematic diagram of the installation of the push block in the detection mechanism provided by the embodiment of the present utility model.

[0026] Icon: 110 - carrier; 111 - support surface; 120 - fixed seat; 130 - mounting seat; 131 - connecting part; 132 - mounting part; 133 - positioning part; 140 - first limiting projection; 150 - second limiting projection; 200 - probe assembly; 210 - probe; 220 - reinforcing plate; 300 - linear drive assembly; 310 - push block; 311 - arc surface; 320 - cylinder; 410 - limit pin; 500 - guiding assembly; 510 - guide rail; 520 - slider; 610 - positioning pin. Detailed implementation manners

[0027] The technical solutions of the present utility model will be described clearly and completely below with reference to the accompanying drawings. Obviously, the described embodiments are some but not all of the embodiments of the present utility model. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present utility model without creative efforts shall fall within the protection scope of the present utility model.

[0028] In the description of the present utility model, it should be noted that the orientation or positional relationship indicated by the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present utility model and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of the present utility model. In addition, the terms "first", "second", "third" are only used for descriptive purposes and cannot be construed as indicating or implying relative importance.

[0029] In the description of the present utility model, it should be noted that unless otherwise clearly defined and limited, the terms "installation", "connection", "connected" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, and it can be the communication inside two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present utility model can be understood according to specific situations.

[0030] Such as Figure 1 and Figure 2As shown, the detection mechanism provided by the embodiment of the utility model includes: a support assembly, a probe assembly 200 and a linear drive assembly 300, the support assembly includes a carrier 110 with a support surface 111; the probe assembly 200 is arranged relative to the side wall of the carrier 110, and includes a plurality of elastic probes 210, and the plurality of probes 210 are distributed along the side of the support surface 111; the linear drive assembly 300 includes a push block 310 and a linear drive member, the push block 310 is located on the side of the probe 210 away from the carrier 110, and is connected to the driving end of the linear drive member; the linear drive member is arranged in the support assembly, and is used to drive the push block 310 to move toward the probe 210, so that the push block 310 pushes the probe 210 to approach the support surface 111.

[0031] Specifically, the detection mechanism provided by the embodiment of the utility model also includes a circuit board, and the carrier 110, the probe assembly 200 and the linear drive assembly 300 are all arranged above the circuit board, and the plurality of probes 210 are electrically connected to the circuit board. The carrier 110 is used to support the electronic component to be detected, and the linear drive member is used to drive the push block 310 to move toward the probe 210, so that the push block 310 pushes the probe 210 to approach the support surface 111, and the probe 210 contacts the pin of the electronic component, so as to realize the electrical connection between the electronic component and the circuit board.

[0032] When using the detection mechanism provided by the embodiment of the utility model to detect electronic components, the electronic components are placed on the support surface 111, and the pins of the electronic components are opposite to the probe 210 and extend out of the carrier 110; the linear drive component 300 drives the push block 310 to push the probe 210 to tilt in the direction close to the carrier 110, so that the probe 210 contacts the pins. After the detection is completed, the linear drive component 300 drives the push block 310 to move in the direction away from the carrier 110, and the probe 210 returns to its original position under the action of its own restoring force, thereby separating from the pins. The detection mechanism provided by the embodiment of the utility model pushes the probe 210 through the push block 310 to achieve contact or separation between the probe 210 and the pins, without the need for the pins to cooperate with the corresponding holes, and no wear on the hole wall will occur; therefore, compared with the structure in the prior art in which the pins are placed in the corresponding holes for partial testing, it can prevent the product from being misdetected due to wear; in addition, the electrical connection between the probe 210 and the pins is achieved by contact, which is not only applicable to vertical pin electronic components, but also to oblique pin electronic components, and has better applicability.

[0033] The stage 110 can be set in the shape of a cuboid or a cube, and the probe assembly 200 and the linear drive assembly 300 can be arranged at one side of the stage 110, or the probe assembly 200 and the linear drive assembly 300 are arranged at at least two sides of the stage 110, and the arrangement manners of the probe assembly 200 and the linear drive assembly 300 at each side are the same. Specifically, the probe assembly 200 and the linear drive assembly 300 can be arranged according to the pin positions of the electronic components to be detected. In this embodiment, the stage 110 is in the shape of a cuboid, and the probe assembly 200 and the linear drive assembly 300 are arranged on both sides of the long side of the stage 110, and the arrangement manners of the probe assembly 200 and the linear drive assembly 300 on both sides are the same. The following takes one side as an example for specific description.

[0034] The detection mechanism further includes a limiting component. The limiting component is arranged on the support component. The limiting component is located on the side of the push block 310 facing the probe 210. The limiting component is used to limit the moving distance of the push block 310 towards the probe 210. When the linear driving member drives the push block 310 to push the probe 210, and the probe 210 contacts the pin and deforms to the limit position, the limiting component restricts the push block 310 from moving, so that the push block 310 stops pushing the probe 210, preventing the probe 210 from excessively squeezing the pin.

[0035] As a setting manner of the limiting component, as Figure 1 shown, the limiting component includes a limiting pin 410 arranged on the support component. The limiting pin 410 is located between the push block 310 and the probe 210, and the limiting pin 410 can be in abutting cooperation with the push block 310 to prevent the push block 310 from moving towards the probe 210.

[0036] Specifically, the limiting pin 410 is arranged in parallel and at an interval with the probe 210, and is fixedly installed on the corresponding support structure. In different detection mechanisms, the installation position of the limiting pin 410 can be set according to the pin conditions of the electronic components to be detected, so as to limit the deformation limit position of the probe 210 and prevent the probe 210 from excessively squeezing the pin. When the push block 310 is in the initial position, the push block 310 is arranged at an interval with the limiting pin 410. During the process of the push block 310 pushing the probe 210 to contact the pin, when the push block 310 abuts against the limiting pin 410, the limiting pin 410 restricts the push block 310 from continuing to push the probe 210, thereby preventing the probe 210 from excessively squeezing the pin.

[0037] As another way of setting the limiting component, the limiting component includes a first limiting block and a second limiting block. The first limiting block is located below the pushing block 310 and is arranged on the corresponding supporting structure. The second limiting block is arranged on the lower surface of the pushing block 310 and is located on the side of the first limiting block away from the probe component 200. When the pushing block 310 is in the initial position, the second limiting block is spaced from the first limiting block. During the process of the pushing block 310 pushing the probe 210 into contact with the pin, when the second limiting block abuts against the first limiting block, the second limiting block restricts the pushing block 310 from continuing to push the probe 210, so that the pushing block 310 stops pushing the probe 210.

[0038] The linear driving member can be set as a cylinder 320, a hydraulic cylinder or a structure of a motor cooperating with a lead screw nut. In this embodiment, the linear driving assembly 300 includes a cylinder 320 arranged on the supporting assembly, and the piston rod of the cylinder 320 is in transmission connection with the pushing block 310.

[0039] As Figure 1 shown, the cylinder 320 is arranged along the direction perpendicular to the side wall of the stage 110. The cylinder body position of the cylinder 320 is fixed, and the piston rod of the cylinder 320 is fixedly connected to the side wall of the pushing block 310 away from the stage 110. When the piston rod of the cylinder 320 extends out of the cylinder body, it drives the pushing block 310 to move towards the stage 110. When the piston rod retracts into the cylinder body, it drives the pushing block 310 to move away from the pushing block 310. By driving the pushing block 310 to move towards or away from the stage 110 through the cylinder 320, the pushing block 310 can push the probe 210 or separate from the probe 210, which is convenient for operation.

[0040] As Figure 1 shown, the supporting assembly further includes a fixed seat 120 and a mounting seat 130 that abut against each other. The stage 110 is mounted on the fixed seat 120, the linear driving assembly 300 is mounted on the mounting seat 130, and the probe assembly 200 is clamped between the fixed seat 120 and the mounting seat 130.

[0041] Specifically, the fixed seat 120 is in the shape of a cuboid and is arranged above the circuit board. Two mounting pins are provided on the upper surface of the fixed seat 120, and the two mounting pins are spaced apart along the length direction of the fixed seat 120. Two mounting holes are provided on the lower surface (the surface away from the supporting surface 111) of the stage 110, and the two mounting holes are spaced apart along the length direction of the stage 110, and the positions of the two mounting holes correspond to the positions of the two mounting pins one by one. The two mounting pins are respectively inserted into the two mounting holes, so as to mount the stage 110 on the fixed seat 120. When mounting the fixed seat 120 on the circuit board, the connecting bolts pass through the circuit board from the side of the circuit board away from the fixed seat 120 and cooperate with the bolt holes on the fixed seat 120, so as to fixedly mount the fixed seat 120 and the stage 110 on the circuit board, which is convenient for installation.

[0042] The number of mounting seats 130 is the same as the number of probe assemblies 200 and linear drive assemblies 300, and the positions of the plurality of mounting seats 130 correspond one-to-one to the positions of the plurality of linear drive assemblies 300. Figure 3 As shown, the lower ends of the multiple probes 210 in the probe assembly 200 extend from the gap between the fixing seat 120 and the mounting seat 130 and are connected to the circuit board. The multiple probes 210 can be clamped by the fixing seat 120 and the mounting seat 130 to achieve the fixation of the multiple probes 210, or the multiple probes 210 can be directly fixed to the fixing seat 120 or the mounting seat 130 to achieve the fixation of the multiple probes 210. In this embodiment, a mounting seat 130 is provided on both sides of the long side of the fixing seat 120, and each mounting seat 130 includes a connecting portion 131 and a mounting portion 132, wherein the connecting portion 131 is in a rectangular parallelepiped shape, and the length of the connecting portion 131 is the same as the length of the fixing seat 120, and a side wall of the connecting portion 131 in the length direction cooperates with the side wall of the fixing seat 120 to clamp the probe 210. The mounting portion 132 is spaced apart from the side wall of the platform 110 and is mounted to the edge of the connecting portion 131 away from the platform 110 by bolts, and the push block 310 is located between the platform 110 and the mounting portion 132. The cylinder body of the cylinder 320 is located on the side of the mounting portion 132 away from the platform 110 and is mounted to the mounting portion 132 by bolts, and the piston rod of the cylinder 320 passes through the mounting portion 132 and is connected to the push block 310. During assembly, the mounting base 130 equipped with the cylinder 320 and the push block 310 is placed on one side of the fixed base 120, and the bolt passes through the connecting portion 131 from the side of the connecting portion 131 away from the fixed base 120 and is threadedly connected to the fixed base 120, thereby realizing the installation of the mounting base 130, the cylinder 320 and the push block 310 above the circuit board, which is convenient for operation. In addition, the connection between the mounting base 130 and the fixed base 120 can indirectly limit the position between the push block 310 and the carrier 110, thereby improving the matching accuracy of the detection mechanism.

[0043] In addition to being connected by bolts, the fixing base 120 and the mounting base 130 can also be connected by means of a snap-in protrusion and a snap-in slot, or the fixing base 120 and the mounting base 130 can be respectively installed on the circuit board by bolts, thereby achieving fixation of the relative position of the fixing base 120 and the mounting base 130.

[0044] The detection mechanism further includes a guide assembly 500, which is connected to the push block 310 and the mounting seat 130 respectively; and / or the detection mechanism further includes a positioning assembly, which is mounted on the mounting seat 130, and the positioning assembly is used to cooperate with the pressing mechanism in the sorting mechanism. Specifically, only the guide assembly 500 can be provided, or only the positioning assembly can be provided, or both the guide assembly 500 and the positioning assembly can be provided. In this embodiment, both the guide assembly 500 and the positioning assembly are provided.

[0045] The guiding component 500 may include a guiding groove and a guiding projection slidably engaged with the guiding groove, or include a guide rail 510 and a slider 520 slidably engaged with each other. In this embodiment, as Figure 5 shown, the guiding component 500 includes a guide rail 510 and a slider 520 slidably engaged with the guide rail 510. Specifically, each pusher block 310 is slidably engaged with the mounting base 130 through two guiding components 500. The two guiding components 500 are both located below the pusher block 310, and the guide rails 510 in the two guiding components 500 are parallel and spaced apart in a direction perpendicular to the cylinder 320. The sliders 520 in the two guiding components 500 are fixedly installed on the bottom surface of the pusher block 310 and are slidably engaged with the two guide rails 510 one by one. When the cylinder 320 pushes the pusher block 310 to move, the slider 520 cooperates with the guide rail 510 to guide and limit the pusher block 310, improving the stability of the pusher block 310 during movement.

[0046] The mounting base 130 further includes positioning portions 133. Positioning portions 133 are fixedly installed at both ends in the length direction of the upper surface of the connecting portion 131, and the positioning portions 133 are arranged close to the edge where the connecting portion 131 abuts against the fixed base 120. The positioning portion 133 is in the shape of a cuboid, and the length direction is arranged along the direction perpendicular to the upper surface of the connecting portion 131. The positioning component is fixedly installed on the upper surface of the positioning portion 133. The positioning component includes a positioning groove or a positioning pin 610, etc. In this embodiment, the positioning component includes a positioning pin 610, and the positioning pin 610 is fixedly installed on the upper surface of the positioning portion 133. Specifically, in each mounting base 130, a positioning pin 610 is installed on one of the positioning portions 133, and the positioning pins 610 on the two mounting bases 130 are diagonally distributed and have different diameters. When the pressing mechanism presses the electronic component, the two positioning pins 610 cooperate with the pressing mechanism to position the pressing mechanism, and the two positioning pins 610 with different diameters can play an anti-misoperation role.

[0047] As Figure 2As shown, the probe assembly 200 further includes a reinforcing plate 220. Reinforcing plates 220 are provided on both opposite sides of the plurality of probes 210 relative to the fixed seat 120 and the mounting seat 130. Specifically, the probe assembly 200 includes two rows of probes 210. The two rows of probes 210 are distributed in a direction perpendicular to the side wall of the stage 110, and the probes 210 in the two rows are arranged in a staggered manner so that each probe 210 can contact the corresponding pin on the electronic component. The reinforcing plate 220 is in the shape of a flat plate. Along the direction perpendicular to the side wall of the stage 110, one reinforcing plate 220 is provided on each side of each row of probes 210, and each reinforcing plate 220 is arranged parallel to the side wall of the stage 110. The spaced-apart reinforcing plates 220 play a role in fixing and limiting the probes 210. The push block 310 tilts the probes 210 in the direction close to the support surface 111 by pushing the reinforcing plate 220, and when the push block 310 moves away from the stage 110, the restoring force of the reinforcing plate 220 can also make the plurality of probes 210 return to their original positions.

[0048] The reinforcing plate 220 is provided as an insulating plate; specifically, the insulating plate is made of an insulating material. Insulating plates are provided on both opposite sides of the plurality of probes 210 relative to the fixed seat 120 and the mounting seat 130, and between adjacent two rows of probes 210. The upper ends of the plurality of probes 210 protrude above the upper edge of the insulating plate for contacting the electronic component to be detected, and the lower ends of the plurality of probes protrude below the lower edge of the insulating plate for connecting to the circuit board. The insulating plate plays an insulating role between the probes 210 and the fixed seat 120 and the mounting seat 130, preventing electrical contact between adjacent two rows of probes 210 and between the probes 210 and the fixed seat 120 and the mounting seat 130, thereby improving the detection accuracy.

[0049] As Figure 2 and Figure 5 shown, the side surface of the push block 310 opposite to the probes 210 is provided as an arc surface 311. The arc surface 311 extends along the arrangement direction of the probes 210 and protrudes in the direction close to the probes 210. When the push block 310 pushes the probes 210, the arc surface 311 contacts the probes 210. Compared with the way of the plane contacting the probes 210, the contact area between the push block 310 and the probes 210 is small, making the pushing distance of the push block 310 on the probes 210 more controllable.

[0050] The support surface 111 is provided with a plurality of limit protrusions. The plurality of limit protrusions enclose a limit space for placing the electronic component; among the two relatively arranged limit protrusions, one of the limit protrusions is provided with a photoelectric sensor, and the other limit protrusion is provided with a detection hole. Specifically, the number and arrangement manner of the limit protrusions can be set according to the structure of the electronic component to be detected. In an embodiment of the present invention, as Figure 4As shown in the figure, four limiting protrusions are provided on the support surface 111. The four limiting protrusions are two first limiting protrusions 140 and two second limiting protrusions 150 respectively. Among them, the two first limiting protrusions 140 are spaced apart along the length direction of the stage 110 and are used to limit the electronic component in the length direction. A photoelectric sensor is provided on one of the first limiting protrusions 140, and a detection hole is provided on the other first limiting protrusion 140. The photoelectric sensor and the detection hole cooperate to detect whether an electronic component is placed between the two first limiting protrusions 140. The two second limiting protrusions 150 are located between the two first limiting protrusions 140 and are arranged in parallel at intervals along the width direction of the support surface 111. The heights of the two second limiting protrusions 150 are lower than the heights of the two first limiting protrusions 140 and are used for the pins of the electronic component to extend out from the side wall of the stage 110. During the detection process, the multiple limiting protrusions cooperate to limit the electronic component and prevent the electronic component from moving and affecting the detection accuracy.

[0051] The sorting machine provided by the embodiment of the present invention includes an upper detection mechanism. Specifically, the sorting machine provided by the embodiment of the present invention further includes a pressing mechanism. The pressing mechanism is arranged above the detection mechanism and is used to press the electronic component to be detected.

[0052] Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: they can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements on some or all of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. A detection mechanism, characterized in that, include: A support assembly, a probe assembly (200) and a linear drive assembly (300), wherein the support assembly comprises a carrier (110) having a support surface (111); the probe assembly (200) is arranged relative to a side wall of the carrier (110) and comprises a plurality of elastic probes (210), wherein the plurality of probes (210) are distributed at intervals along the side edge of the support surface (111); The linear drive assembly (300) comprises a push block (310) and a linear drive member, wherein the push block (310) is located on a side of the probe (210) away from the carrier (110) and is connected to a drive end of the linear drive member; the linear drive member is arranged on the support assembly and is used to drive the push block (310) to move toward the probe (210) so that the push block (310) pushes the probe (210) to approach the support surface (111).

2. The detection mechanism according to claim 1, wherein, The detection mechanism further comprises a limit assembly, which is arranged on the support assembly and located on a side of the push block (310) facing the probe (210), and is used to limit the moving distance of the push block (310) toward the probe (210).

3. The detection mechanism according to claim 2, characterized in that, The limiting assembly comprises a limiting pin (410) arranged on the supporting assembly, wherein the limiting pin (410) is located between the pushing block (310) and the probe (210), and the limiting pin (410) can abut against and cooperate with the pushing block (310) to prevent the pushing block (310) from moving toward the probe (210).

4. The detection mechanism according to claim 1, wherein The linear drive assembly (300) comprises a cylinder (320) arranged on the support assembly, and a piston rod of the cylinder (320) is transmission-connected to the push block (310).

5. The detection mechanism according to claim 1, wherein The support assembly further comprises a fixed seat (120) and a mounting seat (130), the carrier (110) is mounted on the fixed seat (120), the linear drive assembly (300) is mounted on the mounting seat (130), and the probe assembly (200) is clamped between the fixed seat (120) and the mounting seat (130).

6. The detection mechanism according to claim 5, characterized in that The probe assembly (200) further comprises a reinforcing plate (220), and the reinforcing plate (220) is provided on both sides of the plurality of probes (210) that are opposite to the fixing seat (120) and the mounting seat (130).

7. The detection mechanism according to claim 6, characterized in that The reinforcing plate (220) is configured as an insulating plate; The side surface of the push block (310) opposite to the probe (210) is configured as an arc surface (311), and the arc surface (311) extends along the arrangement direction of the plurality of probes (210) and protrudes in a direction close to the probe (210).

8. The detection mechanism according to claim 5, characterized in that, The detection mechanism further comprises a guide assembly (500), wherein the guide assembly (500) is respectively connected to the push block (310) and the mounting seat (130); And / or, the detection mechanism further comprises a positioning component, the positioning component is mounted on the mounting seat (130), and the positioning component is used to cooperate with a pressing mechanism in the sorting mechanism.

9. The detection mechanism according to claim 1, wherein The support surface (111) is provided with a plurality of limiting protrusions, and the plurality of limiting protrusions surround and form a limiting space for placing electronic components; Among the two relatively arranged limiting protrusions, one of the limiting protrusions is provided with a photoelectric sensor, and the other limiting protrusion is provided with a detection hole.

10. A sorting machine, characterized in that, Comprising the detection mechanism according to any one of claims 1-9.

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