High-flexibility carrier plate for testing integrated circuit

Abstract

The utility model relates to the technical field of integrated circuit testing devices, in particular to a high-flexibility integrated circuit testing carrier plate which comprises a testing carrier plate body, a carrier plate inner cavity is formed in the testing carrier plate body, an adjusting structure is arranged on the testing carrier plate body, and the adjusting structure comprises a driving motor fixedly installed on one side of the testing carrier plate body. A connecting block is fixedly installed on the other side of the test carrier plate body, a lead screw connected with the connecting block is installed at the output end of the driving motor, a plurality of connecting plates are movably installed on the lead screw, and a plurality of supporting frames are fixedly installed at one end of each connecting plate. According to the utility model, through the arrangement of the adjusting structure, the bearing area of the test carrier plate main body can be expanded, the test requirements of integrated circuit boards with different sizes and specifications can be met without using different carrier plates, the test efficiency is effectively improved, the test cost is reduced, and the practicability is relatively high.

Description

Technical Field

[0001] The utility model relates to a carrier board for integrated circuit testing, in particular to a carrier board for integrated circuit testing with high flexibility, belonging to the technical field of integrated circuit testing devices. Background Art

[0002] An integrated circuit is a microelectronic device or component. It uses a certain process to interconnect transistors, resistors, capacitors, inductors and other components and wirings required in the circuit, integrates them on a small piece or several small pieces of semiconductor wafers or dielectric substrates, and then packages them in a tube shell to form a micro-structure with specific circuit functions. All components in the integrated circuit have been integrated into a whole in structure, making the electronic components have the properties of miniaturization, low power consumption, intelligence and high reliability. After the integrated circuit is manufactured, it needs to be tested, usually by fixing it on a test carrier board.

[0003] The existing carrier board for integrated circuit testing has a fixed structure and cannot expand the load-bearing area of the carrier board. Since the sizes and specifications of integrated circuits are diverse, different carrier boards are required during testing, which not only wastes testing time but also increases the expenditure on equipment costs, and has low practicability. Summary of the Utility Model

[0004] Aiming at the deficiencies of the prior art, the utility model provides a carrier board for integrated circuit testing with high flexibility that can expand the load-bearing area of the main body of the test carrier board to be applicable to the testing of integrated circuit boards of different sizes and specifications.

[0005] The technical solution adopted by the utility model to solve the above technical problems is as follows:

[0006] A carrier board for integrated circuit testing with high flexibility includes a main body of the test carrier board. A carrier board inner cavity is opened on the main body of the test carrier board. An adjusting structure is arranged on the main body of the test carrier board. The adjusting structure includes a driving motor fixedly installed on one side of the main body of the test carrier board. A connecting block is fixedly installed on the other side of the main body of the test carrier board. The output end of the driving motor is installed with a lead screw connected to the connecting block. A plurality of connecting plates are movably installed on the lead screw. One end of each connecting plate is fixedly installed with a plurality of support frames.

[0007] Further, a sliding groove is opened on the support frame, and a slider connected to the main body of the test carrier board is movably installed inside the sliding groove.

[0008] Further, a bolt is movably installed on the support frame, and a pressing block is installed at the bottom of the bolt.

[0009] Further, a plurality of mounting holes are formed in the bolt, a spring is fixedly installed inside the mounting hole, a clamping block is fixedly installed at one end of the spring, a groove is formed in the pressing block, and a plurality of clamping holes for cooperating with the clamping block are formed inside the groove.

[0010] Further, one end of the clamping block is arranged in an arc shape.

[0011] Further, a plurality of insertion rods are fixedly installed at one end of the bolt, and anti-slip lines are arranged at the bottom of the pressing block.

[0012] Further, a protective pad is arranged above the main body of the test carrier plate, and a plurality of screws connected to the main body of the test carrier plate are installed on the protective pad.

[0013] Compared with the prior art, the beneficial effects of the present utility model at least lie in:

[0014] Through the setting of the adjusting structure in this application, the bearing area of the main body of the test carrier plate can be expanded, and integrated circuit boards of different sizes and specifications can be tested without using different carrier plates. When the integrated circuit board to be tested is larger than the main body of the test carrier plate, start the driving motor to run and drive the lead screw to rotate. While the lead screw rotates, drive a plurality of connecting plates to move away from each other, so that a plurality of support frames move away from each other. Therefore, a larger integrated circuit board can be placed on the main body of the test carrier plate for testing; using the same carrier plate not only saves the testing time but also reduces the expenditure on equipment costs, greatly improving the practicability of the device. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 is a schematic diagram of the overall structure of the present utility model;

[0016] Figure 2 is a schematic diagram of the inside of the main body of the test carrier plate of the present utility model;

[0017] Figure 3 is of the present utility model Figure 1 enlarged view at A in;

[0018] Figure 4 is a schematic diagram of the clamping hole of the present utility model;

[0019] Figure 5 is of the present utility model Figure 4 enlarged view at B in.

[0020] In the figure, 1 is the main body of the test carrier board; 2 is the inner cavity of the carrier board; 3 is the adjustment structure; 4 is the driving motor; 5 is the connecting block; 6 is the lead screw; 7 is the connecting plate; 8 is the support frame; 9 is the chute; 10 is the slider; 11 is the bolt; 12 is the pressing block; 13 is the mounting hole; 14 is the spring; 15 is the clamping block; 16 is the clamping hole; 17 is the insertion rod; 18 is the protective pad; 19 is the screw. Detailed implementation mode

[0021] Next, the technical solutions of the present utility model will be clearly and completely described in conjunction with the accompanying drawings and specific embodiments.

[0022] As Figures 1 - 5 Shown is a carrier board for integrated circuit testing with high flexibility, which includes a main body 1 of the test carrier board. A carrier board inner cavity 2 is provided on the main body 1 of the test carrier board. An adjustment structure 3 is provided on the main body 1 of the test carrier board. The adjustment structure 3 includes a driving motor 4 fixedly installed on one side of the main body 1 of the test carrier board. A connecting block 5 is fixedly installed on the other side of the main body 1 of the test carrier board. The output end of the driving motor 4 is installed with a lead screw 6 connected to the connecting block 5. A plurality of connecting plates 7 are movably installed on the lead screw 6. One end of the connecting plate 7 is fixedly installed with a plurality of support frames 8. Through the setting of the adjustment structure 3, the bearing area of the main body 1 of the test carrier board can be expanded, and different carrier boards do not need to be used for integrated circuit boards of different sizes and specifications; when the integrated circuit board to be tested is larger than the main body 1 of the test carrier board, start the driving motor 4 to drive the lead screw 6 to rotate. While the lead screw 6 rotates, it drives a plurality of connecting plates 7 to move away from each other, so that a plurality of support frames 8 move away from each other. Therefore, a larger integrated circuit board can be placed on the main body 1 of the test carrier board for testing.

[0023] As Figure 3 Shown, a chute 9 is provided on the support frame 8. A slider 10 connected to the main body 1 of the test carrier board is movably installed inside the chute 9; the settings of the chute 9 and the slider 10 can reduce the friction between the main body 1 of the test carrier board and the support frame 8, improve the movement efficiency of the support frame 8, reduce energy loss, wear between objects, and power loss of the driving motor 4, and extend the service life of the main body 1 of the test carrier board and the support frame 8.

[0024] As Figure 1 Shown, a bolt 11 is movably installed on the support frame 8. A pressing block 12 is installed at the bottom of the bolt 11; after the integrated circuit board is placed on the main body 1 of the test carrier board, screw down the bolt 11 until the pressing block 12 touches the circuit board, which can press the circuit board to prevent it from sliding and improve the stability and accuracy of the test.

[0025] As Figure 4As shown, a plurality of mounting holes 13 are formed in the bolt 11, a spring 14 is fixedly installed inside the mounting hole 13, a clamping block 15 is fixedly installed at one end of the spring 14, a groove is formed in the pressing block 12, and a plurality of clamping holes 16 for cooperating with the clamping block 15 are formed inside the groove; the clamping block 15 is clamped with the clamping hole 16 under the elastic action of the spring 14, so that the pressing block 12 can be fixed on the bolt 11. When the pressing block 12 is pulled, the clamping block 15 is squeezed and contracted into the mounting hole 13. After the clamping block 15 disengages from the clamping hole 16, the pressing block 12 can be disassembled, which is convenient for disassembly and replacement when the pressing block 12 is damaged.

[0026] As Figure 5 shown, one end of the clamping block 15 is set to be arc-shaped to reduce the friction force at one end of the clamping block 15, so that the clamping block 15 can slide more easily inside the groove, which is convenient for the disassembly and installation of the pressing block 12.

[0027] As Figure 4 shown, a plurality of insertion rods 17 are fixedly installed at one end of the bolt 11, and anti-slip lines are provided at the bottom of the pressing block 12 to increase the stress area at one end of the bolt 11. When a person turns the bolt 11, the hand is not easy to slip, which is convenient for turning the bolt 11. The anti-slip lines at the bottom of the pressing block 12 can increase the friction force at its bottom, so that the pressing block 12 is more stable when pressing the circuit board.

[0028] As Figure 3 shown, a protective pad 18 is arranged above the test carrier board main body 1, and a plurality of screws 19 connected to the test carrier board main body 1 are installed on the protective pad 18; since the protective pad 18 has certain softness and elasticity, the circuit board placed on the protective pad 18 will not be damaged due to being knocked. The plurality of screws 19 can fix the protective pad 18 on the test carrier board main body 1 to prevent it from falling, and can also facilitate the disassembly and replacement of the protective pad 18 when it is damaged.

[0029] The working process of the highly flexible integrated circuit test carrier board provided in this embodiment is as follows:

[0030] When the integrated circuit board to be tested is larger than the test carrier board main body 1, start the driving motor 4 to run and drive the lead screw 6 to rotate. While the lead screw 6 rotates, it drives a plurality of connecting plates 7 to move away from each other, so that a plurality of support frames 8 move away from each other. Therefore, a larger integrated circuit board can be placed on the test carrier board main body 1 for testing. Using the same carrier board not only saves the test time but also reduces the expenditure on equipment costs, greatly improving the practicability of the device.

[0031] The above description shows and describes the preferred embodiments of the present utility model. It should be understood that the present utility model is not limited to the forms disclosed herein, and any modifications and variations made by those skilled in the art without departing from the spirit and scope of the present utility model shall fall within the protection scope of the appended claims of the present utility model.

Claims

1. A carrier board for integrated circuit testing with high flexibility, comprising a main body of the test carrier board (1), and a carrier board inner cavity (2) is formed on the main body of the test carrier board (1), and it is characterized in that: An adjustment structure (3) is provided on the test carrier board main body (1). The adjustment structure (3) includes a driving motor (4) fixedly installed on one side of the test carrier board main body (1). A connecting block (5) is fixedly installed on the other side of the test carrier board main body (1). The output end of the driving motor (4) is installed with a lead screw (6) connected to the connecting block (5). A plurality of connecting plates (7) are movably installed on the lead screw (6). One end of the connecting plate (7) is fixedly installed with a plurality of support frames (8).

2. The carrier board for integrated circuit testing with high flexibility according to claim 1, characterized in that: A chute (9) is formed on the support frame (8). A slider (10) connected to the test carrier board main body (1) is movably installed inside the chute (9).

3. A carrier board for integrated circuit testing with high flexibility according to claim 1, characterized in that: A bolt (11) is movably installed on the support frame (8). A pressing block (12) is installed at the bottom of the bolt (11).

4. A carrier board for integrated circuit testing with high flexibility according to claim 3, characterized in that: A plurality of mounting holes (13) are formed in the bolt (11). A spring (14) is fixedly installed inside the mounting hole (13). One end of the spring (14) is fixedly installed with a locking block (15). A groove is formed in the pressing block (12), and a plurality of locking holes (16) cooperating with the locking block (15) are formed inside the groove.

5. A carrier board for integrated circuit testing with high flexibility according to claim 4, characterized in that: One end of the locking block (15) is arc-shaped.

6. The carrier board for integrated circuit testing with high flexibility according to claim 4, characterized in that: A plurality of insertion rods (17) are fixedly installed at one end of the bolt (11). The bottom of the pressing block (12) is provided with anti-slip lines.

7. A carrier board for integrated circuit testing with high flexibility according to claim 1, characterized in that: A protective pad (18) is arranged above the test carrier board main body (1). A plurality of screws (19) connected to the test carrier board main body (1) are installed on the protective pad (18).

Images