Wire harness loop internal resistance testing device and wire harness electric detection table

Abstract

The utility model relates to the field of batteries, in particular to a wire harness loop internal resistance testing device and a wire harness electric detection platform, the device comprises a micro-resistance tester, a first connecting module and a second connecting module, the first connecting module is provided with a first probe and a second probe, one end of the first probe is connected with the output end of the micro-resistance tester, and the other end of the first probe is connected with the output end of the micro-resistance tester; the other end of the first probe can be connected with one end of the first line; one end of the second probe can be connected with one end of a second line, and the other end of the second probe is connected with the input end of the micro-resistance tester; the second connection module is provided with a third probe and a fourth probe, and one end of the third probe can be connected with the other end of the first line; the other end of the third probe is connected with one end of the fourth probe, and the other end of the fourth probe can be connected with the other end of the second line. Through the first connection module and the second connection module, the to-be-tested wire harness and the micro-resistance tester form a complete loop, so that the internal resistance of a special loop with sensitive resistance can be precisely tested in batches.

Description

Technical Field

[0001] This application relates to the technical field of batteries, and particularly to a harness loop internal resistance testing device and a harness electrical inspection station. Background Art

[0002] As an energy storage and power output device, the power battery of new energy vehicles is a core component of electric vehicles. Therefore, the safety performance of the power battery has a very important impact on the overall safety performance of electric vehicles. The main control harness is an indispensable part of the current battery pack. Whether it can be normally connected is the most basic guarantee for the normal operation of the entire system. And the harness continuity test is the most basic and important part of the harness electrical performance test. Using a harness tester to detect the continuity of the harness can detect the fundamental faults of the harness at an early stage, and timely eliminate unqualified products to prevent them from flowing into the vehicle end and causing safety problems.

[0003] Currently, the most widely used and common harness electrical inspection station only has the function of testing whether it is conductive, and cannot test whether the internal resistance of the harness is too large. For some ordinary circuits that are not sensitive to internal resistance, this device can meet the product quality requirements. However, for some circuits that are more sensitive to internal resistance, such as the collision signal circuit, a too large internal resistance of the harness may cause the signal not to be normally transmitted to the BMS (Battery Management System) when the vehicle collides, resulting in the airbag not being able to pop up or the battery pack not being able to cut off the high voltage, thus triggering a safety accident. And the existing harness electrical inspection stations cannot batch detect harness loops with too large internal resistance. Summary of the Utility Model

[0004] This application provides a harness loop internal resistance testing device and a harness electrical inspection station to solve the problem that the existing harness electrical inspection stations in the prior art cannot batch detect harness loops with too large internal resistance.

[0005] On the one hand, this application provides a harness loop internal resistance testing device. The harness at least includes a first line and a second line. The testing device includes:

[0006] A micro-resistance tester;

[0007] A first connection module. The first connection module has a first probe and a second probe. One end of the first probe is connected to the output end of the micro-resistance tester, and the other end of the first probe can be connected to one end of the first line; one end of the second probe can be connected to one end of the second line, and the other end of the second probe is connected to the input end of the micro-resistance tester;

[0008] The second connection module, which has a third probe and a fourth probe. One end of the third probe can be connected to the other end of the first circuit; the other end of the third probe is connected to one end of the fourth probe, and the other end of the fourth probe can be connected to the other end of the second circuit.

[0009] In a possible design, the first connection module and the second connection module respectively include:

[0010] A fixed seat;

[0011] A probe assembly disposed on the fixed seat. The probe assembly includes a plurality of connection probes, one of the connection probes being the first probe and the other being the second probe.

[0012] In a possible design, each connection probe respectively includes:

[0013] A probe post, with a column hole formed inside. The column hole extends inward along the axial direction of the probe post from the end face of the probe post;

[0014] A probe head, with part of the probe head disposed inside the column hole;

[0015] A buffer spring disposed inside the column hole, with one end abutted against the inner bottom wall of the column hole and the other end abutted against the outer wall of the probe head. The buffer spring adjusts the length of the probe head exposed outside the column hole by telescoping along the axial direction of the probe post.

[0016] In a possible design, the column hole is a stepped hole, which includes a first hole section, a second hole section and a third hole section that are interconnected. The diameter of the first hole section is equal to that of the third hole section and less than that of the second hole section, and the buffer spring is disposed in the second hole section.

[0017] In a possible design, a first blocking ring is sleeved on the outer wall of the probe head located in the second hole section. The buffer spring is sleeved on the outer wall of the probe head, with one end abutted against the first blocking ring and the other end abutted against the inner bottom wall of the second hole section.

[0018] In a possible design, a second blocking ring is sleeved on the outer wall of the probe head located outside the column hole.

[0019] In a possible design, a profiling hole is formed on the fixed seat, and the connection probe is disposed in the profiling hole.

[0020] In a possible design, locking blocks are provided on the inner wall of the profiling hole. A guiding inclined surface is formed on the side of the locking block away from the probe head, and a locking surface is formed on the side of the locking block close to the probe head.

[0021] In a possible design, the device further includes an electric test bench processor, which is electrically connected to the micro-resistance tester.

[0022] On the other hand, the present application also provides a wire harness electrical inspection station, including the wire harness loop internal resistance testing device as described above.

[0023] The beneficial effects of the present application are as follows:

[0024] The wire harness loop internal resistance testing device of the present application forms a complete loop between the wire harness to be tested and the micro resistance tester through the first connection module and the second connection module, so that the internal resistance of a special loop sensitive to resistance values can be batch-precisely tested by the micro resistance tester, avoiding applying a wire harness loop with a large internal resistance to a special loop sensitive to internal resistance, and improving safety.

[0025] Specifically, by connecting one end of the first probe to the output end of the micro resistance tester, the other end of the first probe to one end of the first line, the other end of the first line to one end of the third probe, the other end of the third probe to one end of the fourth probe, the other end of the fourth probe to one end of the second line, the other end of the second line to one end of the second probe, and the other end of the second probe to the input end of the micro resistance tester, a complete test loop of "micro resistance tester - first probe - first line - third probe - fourth probe - second line - second probe - micro resistance tester" is formed. Through this loop, the internal resistance of the specific loop formed by the first line and the second line in the wire harness can be tested, so that batch-precise testing of the internal resistance of the specific loop can be achieved at a low cost.

[0026] The wire harness electrical inspection station provided by the present application includes all the above advantages of the wire harness loop internal resistance testing device because it includes the wire harness loop internal resistance testing device of the present application. Description of the Drawings

[0027] In order to more clearly illustrate the specific embodiments of the present application or the technical solutions in the prior art, the following will briefly introduce the drawings required for use in the description of the specific embodiments or the prior art. Obviously, the drawings in the following description are some embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0028] Figure 1 It is a schematic diagram of the principle of the wire harness loop internal resistance testing device provided by the embodiment of the present application;

[0029] Figure 2 It is a schematic diagram of the structures of the first connection module and the second connection module of the wire harness loop internal resistance testing device provided by the embodiment of the present application;

[0030] Figure 3 It is a schematic diagram of the structure of the connection probe of the wire harness loop internal resistance testing device provided by the embodiment of the present application;

[0031] Figure 4 It is a schematic internal structure diagram of the connection probe of the wire harness loop internal resistance test device provided by the embodiment of the present application.

[0032] Reference numerals:

[0033] 100, micro resistance tester; 200, first connection module; 210, first probe; 220, second probe; 300, second connection module; 310, third probe; 320, fourth probe; 410, first circuit; 420, second circuit; 510, fixing base; 511, profiling hole; 520, connection probe; 521, probe post; 5211, first hole section; 5212, second hole section; 5213, third hole section; 522, probe head; 523, buffer spring; 610, first blocking ring; 620, second blocking ring; 700, locking block; 710, guiding inclined surface; 720, locking surface; 800, electro-test bench processor. Specific embodiments

[0034] Next, the technical solutions of the present application will be described clearly and completely in conjunction with the embodiments. Obviously, the described embodiments are part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present application.

[0035] An automotive wire harness is the network main body of an automotive circuit, including a main wire harness and branch wire harnesses. The wire harness is composed of wires, connectors, and wrapping tapes. Automotive wires are all copper multi-core wires, and multi-core wires are formed by arranging or bundling multiple wires together and can transmit multiple circuits simultaneously. The wire harness is subjected to a conduction test through an electro-test bench. Generally, the wire harness after passing the conduction test can meet the requirements of ordinary circuits. However, for some circuits that are sensitive to internal resistance, such as the collision signal circuit, a relatively large internal resistance of the wire harness may cause the signal not to be transmitted to the BMS normally when the vehicle collides, resulting in the airbag not being able to pop out or the battery pack not being able to cut off the high voltage, thus triggering a safety accident. Therefore, the embodiment of the present application provides a wire harness loop internal resistance test device that can measure the internal resistance value of circuits that are sensitive to internal resistance.

[0036] Next, in conjunction with Figures 1 - 4 , the wire harness loop internal resistance test device provided in the embodiment of the present application will be described.

[0037] Refer to Figure 1As shown, in some embodiments provided by the present application, the wire harness at least includes a first circuit 410 and a second circuit 420. It should be noted that the circuits where the first circuit 410 and the second circuit 420 are located are special circuits that are sensitive to internal resistance. The wire harness circuit internal resistance testing device includes a micro-resistance tester 100, a first connection module 200, and a second connection module 300. The first connection module 200 has a first probe 210 and a second probe 220. One end of the first probe 210 is connected to the output end of the micro-resistance tester 100, and the other end of the first probe 210 can be connected to one end of the first circuit 410; one end of the second probe 220 can be connected to one end of the second circuit 420, and the other end of the second probe 220 is connected to the input end of the micro-resistance tester 100; the second connection module 300 has a third probe 310 and a fourth probe 320. One end of the third probe 310 can be connected to the other end of the first circuit 410; the other end of the third probe 310 is connected to one end of the fourth probe 320, and the other end of the fourth probe 320 can be connected to the other end of the second circuit 420. In some specific embodiments, the first probe 210 and the second probe 220 can be electrically connected to the output end of the micro-resistance tester 100 by wires; the third probe 310 and the fourth probe 320 can be electrically connected by conductor contact.

[0038] Using the technical solution of the above embodiments of the present application, the wire harness to be tested and the micro-resistance tester 100 form a complete circuit through the first connection module 200 and the second connection module 300. Specifically, by connecting one end of the first probe 210 to the output end of the micro-resistance tester 100, the other end of the first probe 210 to one end of the first circuit 410, the other end of the first circuit 410 to one end of the third probe 310, the other end of the third probe 310 to one end of the fourth probe 320, the other end of the fourth probe 320 to one end of the second circuit 420, the other end of the second circuit 420 to one end of the second probe 220, and the other end of the second probe 220 to the input end of the micro-resistance tester 100, a complete test circuit of "micro-resistance tester 100 - first probe 210 - first circuit 410 - third probe 310 - fourth probe 320 - second circuit 420 - second probe 220 - micro-resistance tester 100" is formed. The micro-resistance tester 100 can test the internal resistance of the specific circuit formed by the first circuit 410 and the second circuit 420 in the wire harness through this test circuit, so as to realize batch precision testing of the internal resistance of the specific circuit at a low cost, avoid applying the wire harness circuit with a large internal resistance to a special circuit that is sensitive to internal resistance, and improve safety.

[0039] Refer to Figure 2As shown, in some embodiments provided by the present application, the first connection module 200 and the second connection module 300 respectively include a fixed seat 510 and a probe assembly. The probe assembly is disposed on the fixed seat 510. The probe assembly includes a plurality of connection probes 520. One of the connection probes 520 is the first probe 210, and the other connection probe 520 is the second probe 220. By arranging a plurality of connection probes 520 on the fixed seat 510, the plurality of connection probes 520 are arranged on the fixed seat 510 along a specific path, so that the plurality of connection probes 520 can be matched with the wire harness connector, and thus each circuit of the wire harness can be connected to the corresponding connection probe 520. In this way, by taking two connection probes 520 at different positions of the first connection module 200 as the first probe 210 and the second probe 220 respectively, and correspondingly, taking two connection probes 520 at the corresponding positions of the second connection module 300 as the third probe 310 and the fourth probe 320 respectively, the internal resistance of different circuits of the wire harness can be measured.

[0040] Referring to Figure 3 , Figure 4 As shown, in some embodiments provided by the present application, each connection probe 520 respectively includes a probe post 521 and a probe head 522. A column hole is formed inside the probe post 521, and the column hole extends inward along the axial direction of the probe post 521 from the end face of the probe post 521; part of the probe head 522 is disposed in the column hole; a buffer spring 523 is disposed in the column hole. One end of the buffer spring 523 abuts against the inner bottom wall of the column hole, and the other end of the buffer spring 523 abuts against the outer wall of the probe head 522. The buffer spring 523 adjusts the length of the probe head 522 exposed outside the column hole by telescoping along the axial direction of the probe post 521. In this way, the probe head 522 is slidably connected to the inner wall of the column hole, and the buffer spring 523 changes the length of the probe head 522 exposed outside the column hole by telescoping along the axial direction; when the connector of the wire harness to be measured abuts against the probe head 522, by compressing the buffer spring 523, the connector of the wire harness to be measured can be elastically abutted against the probe head 522, which can avoid damage to the connector caused by hard abutment between the connector and the probe head 522. In addition, the buffer spring 523 can also apply a compressive elastic force to the probe head 522, so that the probe head 522 and the connector can always maintain an abutting state during the test.

[0041] Referring to Figure 4As shown, in some embodiments provided by the present application, the column hole is a stepped hole. The column hole includes a first hole section 5211, a second hole section 5212, and a third hole section 5213 that are in communication with each other. The diameter of the first hole section 5211 is equal to the diameter of the third hole section 5213 and less than the diameter of the second hole section 5212. The buffer spring 523 is disposed in the second hole section 5212. Specifically, the diameters of the first hole section 5211 and the third hole section 5213 are slightly larger than the diameter of the probe 522, so that the outer wall of the probe 522 can slide along the inner walls of the first hole section 5211 and the third hole section 5213. In some specific embodiments, a first blocking ring 610 is sleeved on the outer wall of the probe 522 located in the second hole section 5212. The buffer spring 523 is sleeved on the outer wall of the probe 522. One end of the buffer spring 523 abuts against the first blocking ring 610, and the other end abuts against the inner bottom wall of the second hole section 5212. In this way, when the connector of the wire harness to be tested presses the probe 522, when the probe 522 is pressed and moves into the column hole, the first blocking ring 610 can press the buffer spring 523, causing the buffer spring 523 to compress. Thus, the connector of the wire harness to be tested is elastically abutted against the probe 522, which can avoid damage to the connector caused by hard abutment between the connector and the probe 522. In addition, the buffer spring 523 can also apply a compressive elastic force to the probe 522, so that the probe 522 and the connector can always maintain an abutting state during the test.

[0042] Referring to Figure 4 As shown, in some embodiments provided by the present application, a second blocking ring 620 is sleeved on the outer wall of the probe 522 located outside the column hole. This can prevent the first blocking ring 610 from excessively squeezing the buffer spring 523.

[0043] Referring to Figure 2 As shown, in some embodiments provided by the present application, a profiling hole 511 is formed in the fixing base 510, and the connection probe 520 is disposed in the profiling hole 511. Specifically, the shape of the profiling hole 511 is the same as the shape of the connector of the wire harness to be tested. By inserting the connector of the wire harness to be tested into the profiling hole 511, the connector of the wire harness to be tested can be elastically abutted against the probe 522, so that the probe 522 and the connector can always maintain an abutting state during the test.

[0044] Referring to Figure 2As shown, in some embodiments provided by the present application, a locking block 700 is provided on the inner wall of the profiling hole 511. A guiding inclined surface 710 is formed on the side of the locking block 700 away from the probe 522, and a locking surface 720 is formed on the side of the locking block 700 close to the probe 522. Specifically, the guiding inclined surface 710 is inclined towards the direction close to the probe 522. When the guiding inclined surface 710 is squeezed, the locking block 700 can produce a slight deformation. Thus, during the process of inserting the connector of the wire harness to be tested into the profiling hole 511, the connector slides on the guiding inclined surface 710 until the connector is blocked at the locking surface 720. At this time, the connector of the wire harness to be tested is stably abutted against the probe 522, and the internal resistance test can be carried out. When it is necessary to pull out the connector of the wire harness to be tested after the test is completed, by pressing the tab on the connector, the locking between the connector and the locking surface 720 can be released, and the connector of the wire harness to be tested can be taken out from the profiling hole 511.

[0045] Referring to Figure 1 As shown, in some embodiments provided by the present application, the wire harness loop internal resistance test device further includes an electrical test bench processor 800, and the electrical test bench processor 800 is electrically connected to the micro resistance tester 100. After the micro resistance tester 100 collects the specific loop resistance value, it transmits the data to the electrical test bench processor 800. The electrical test bench processor 800 determines whether the resistance value of the specific loop is qualified, and through MES linkage, if it is qualified, the shipping label is automatically printed, and if it is unqualified, it shows unqualified and does not print the shipping label.

[0046] The working process of the wire harness loop internal resistance test device provided by the embodiments of the present application:

[0047] Insert the connector at one end of the wire harness to be tested into the profiling hole 511 of the first connection module 200, so that the probe 522 of the first connection module 200 can always be in an abutting state with the connector during the test;

[0048] Insert the connector at the other end of the wire harness to be tested into the profiling hole 511 of the first connection module 200, so that the probe 522 of the second connection module 300 can always be in an abutting state with the connector during the test;

[0049] The micro resistance tester 100 collects the specific loop resistance value and transmits the resistance value data to the electrical test bench processor 800. The electrical test bench processor 800 determines whether the resistance value of the specific loop is qualified, and through MES linkage, if it is qualified, the shipping label is automatically printed, and if it is unqualified, it shows unqualified and does not print the shipping label.

[0050] In the embodiments of the present application, a wire harness electrical inspection bench is further provided, including the wire harness loop internal resistance test device in the above embodiments. After the electrical inspection bench conducts a conduction test on the wire harness, the wire harness loop internal resistance test device conducts an accurate resistance value test on the wire harness that has passed the conduction test.

[0051] It should be noted that the wire harness electrical inspection table includes a wire harness loop internal resistance testing device, and thus includes all the above advantages of the wire harness loop internal resistance testing device, which will not be elaborated here.

[0052] In the description of the present application, it should be understood that the orientation or positional relationship indicated by the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc. is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as a limitation to the present application.

[0053] In addition, the terms "first" and "second" are only used for descriptive purposes and should not be construed as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include at least one of such features. In the description of the present application, the meaning of "a plurality" is at least two, such as two, three, etc., unless otherwise specifically and clearly defined.

[0054] In the present application, unless otherwise clearly specified and limited, the terms "mounted", "connected", "connected to", "fixed", etc. should be understood in a broad sense. For example, it may be a fixed connection, a detachable connection, or integrated; it may be a mechanical connection, an electrical connection, or communicable with each other; it may be directly connected, or indirectly connected through an intermediate medium, and may be the internal communication of two elements or the interaction relationship between two elements, unless otherwise clearly limited. For those of ordinary skill in the art, the specific meanings of the above terms in the present application can be understood according to specific circumstances.

[0055] In the present application, the terms "one embodiment", "some embodiments", "example", "specific example", or "some examples", etc. mean that the specific features, structures, materials, or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic expressions of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described can be combined in a suitable manner in any one or more embodiments or examples. In addition, without contradiction, those skilled in the art can combine and combine the different embodiments or examples described in this specification and the features of different embodiments or examples.

[0056] Although the embodiments of the present application have been shown and described above, it can be understood that the above embodiments are exemplary and should not be construed as limiting the present application. Those of ordinary skill in the art can make changes, modifications, substitutions, and variations to the above embodiments within the scope of the present application.

Claims

1. A harness circuit internal resistance testing device, characterized in that, The wire harness includes at least a first circuit and a second circuit, and the testing device includes: A micro-resistance tester; A first connection module, the first connection module has a first probe and a second probe, one end of the first probe is connected to the output end of the micro-resistance tester, and the other end of the first probe can be connected to one end of the first circuit; one end of the second probe can be connected to one end of the second circuit, and the other end of the second probe is connected to the input end of the micro-resistance tester; A second connection module, the second connection module has a third probe and a fourth probe, one end of the third probe can be connected to the other end of the first circuit; the other end of the third probe is connected to one end of the fourth probe, and the other end of the fourth probe can be connected to the other end of the second circuit.

2. The internal resistance test device for the wire harness circuit according to claim 1, wherein The first connection module and the second connection module respectively include: A fixed seat; A probe assembly, arranged on the fixed seat, the probe assembly includes a plurality of connection probes, one of the connection probes is the first probe, and another one of the connection probes is the second probe.

3. The harness loop internal resistance testing device according to claim 2, characterized in that, Each of the connection probes respectively includes: A probe post, a column hole is formed inside the probe post, and the column hole extends inward along the axial direction of the probe post from the end face of the probe post; A probe head, part of the probe head is arranged inside the column hole; A buffer spring, arranged inside the column hole, one end abuts against the inner bottom wall of the column hole, and the other end abuts against the outer wall of the probe head, and the buffer spring adjusts the length of the probe head exposed outside the column hole by telescoping along the axial direction of the probe post.

4. The harness loop internal resistance testing device according to claim 3, wherein: The column hole is a stepped hole, the column hole includes a first hole section, a second hole section and a third hole section that are communicated with each other, the diameter of the first hole section is equal to the diameter of the third hole section and less than the diameter of the second hole section, and the buffer spring is arranged in the second hole section.

5. The harness loop internal resistance testing device according to claim 4, characterized in that: A first blocking ring is sleeved on the outer wall of the probe head located in the second hole section, the buffer spring is sleeved on the outer wall of the probe head, one end of the buffer spring abuts against the first blocking ring, and the other end abuts against the inner bottom wall of the second hole section.

6. The harness loop internal resistance testing device according to claim 3, characterized in that: A second blocking ring is sleeved on the outer wall of the probe head located outside the column hole.

7. The harness circuit internal resistance testing device according to any one of claims 3-6, characterized in that: A profiling hole is formed on the fixed seat, and the connection probe is arranged in the profiling hole.

8. The harness loop internal resistance testing device according to claim 7, characterized in that: A locking block is arranged on the inner wall of the profiling hole, a guiding inclined surface is formed on the side of the locking block away from the probe head, and a locking surface is formed on the side of the locking block close to the probe head.

9. The harness loop internal resistance testing device according to claim 1, wherein: It further includes an electric test bench processor, and the electric test bench processor is electrically connected to the micro-resistance tester.

10. A wire harness electrical inspection table, characterized in that, It includes the wire harness loop internal resistance testing device according to any one of claims 1-9.

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