Test equipment
By introducing structures such as support seats, rotating parts and guide pins into the test equipment, the problem of inconsistent force and angle when manually pressing the chip is solved, the test accuracy and protection equipment are improved, and the stable positioning and heat dissipation effect of the chip is achieved.
Patent Information
- Application Number
- CN202421831903.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-07-31
- Publication Date
- 2025-07-25
- Estimated Expiration
- 2034-07-31
AI Technical Summary
In the prior art, it is difficult to ensure that the force and angle are consistent when pressing the chip with the test board, resulting in low accuracy of the test results.
A test equipment is designed, including a test board assembly, a pressing assembly and a processing display unit. By setting a support seat and through holes on the test board assembly, the rotating parts and pressing blocks in the pressing assembly are used to ensure that the pressing angle and force of the chip are consistent, and the positioning and guidance functions are provided in combination with the guide pin and the guide column to ensure that the chip is adapted to the probe.
The chip pressing angle and force are unified, the test accuracy is improved, the probe and chip are protected from damage, and overheating is prevented through the heat dissipation holes and vents, simplifying the operation process.
Smart Images
Figure CN223155152U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of chip testing, in particular to a testing device. Background Art
[0002] A test board (usually called an evaluation board or EVB board) is a specially designed circuit board for providing an analog working environment for a chip to be tested. External interfaces, power supplies, signal conditioning circuits, etc. required by the chip are integrated on the test board so as to comprehensively evaluate the performance and functions of the chip.
[0003] In the prior art, the chip is often manually pressed to abut against the test board for testing. Although it is very convenient, it is difficult to ensure the same force and angle by manual pressing, and the accuracy of the test result is low. Therefore, the prior art needs to be improved. Summary of the Utility Model
[0004] The purpose of the utility model is to provide a testing device to solve the technical problem that it is difficult to ensure the same force and angle by manually pressing the chip in the prior art, resulting in low accuracy of the test result.
[0005] To achieve the above purpose, the utility model provides the following technical solutions:
[0006] A testing device includes a test board assembly, a pressing assembly and a processing and display unit. A first elastic member on the test board assembly is connected to a supporting seat. The supporting seat is provided with a through hole and a receiving groove. The size of the receiving groove is the same as that of the chip. The chip is limited in the receiving groove. All test points of the chip are located in the through hole and correspond to the probes on the test board assembly one by one. The pressing assembly includes a fixed seat, a rotating member, a second elastic member and a pressing block member. The fixed seat is provided with a receiving cavity. The pressing block member is located in the receiving cavity. Two ends of the second elastic member are connected to the bottom of the receiving cavity and the pressing block member respectively. The pressing block member is provided with an inclined surface. The rotating member penetrates through the fixed seat and abuts against the inclined surface. The rotating member is driven to move along the inclined surface to a first position, and the chip pushed by the pressing block member will abut against the test board assembly. The processing and display unit is electrically connected to the test board assembly for processing the data collected by the test board assembly and displaying the data.
[0007] Preferably, the test board assembly includes a test board and a base connecting the test board. The base is provided with an opening. The probes are located in the opening. Two ends of the first elastic member are respectively connected to the base and the supporting seat.
[0008] Preferably, the testing device further includes a guiding pin. The guiding pin is connected to the base and penetrates through the supporting seat.
[0009] Preferably, the pressing block member includes a first pressing block, a second pressing block, and a third elastic member. The first pressing block is provided with the inclined surface. The second pressing block is close to the supporting seat. Two ends of the third elastic member are respectively connected to the second pressing block and the first pressing block. Two ends of the second elastic member are connected to the bottom of the accommodating cavity and the second pressing block.
[0010] Preferably, the testing device further includes a first guiding column and a second guiding column. The first guiding column is connected to the fixing seat and penetrates through the second pressing block. The second guiding column is connected to the second pressing block and penetrates through the first pressing block.
[0011] Preferably, the second pressing block is provided with a plurality of heat dissipation holes, and the fixing seat is provided with ventilation openings corresponding to the positions of the heat dissipation holes.
[0012] Preferably, the testing device further includes a handle, and the handle is connected to the rotating member.
[0013] Preferably, the testing device further includes a first identification member and a second identification member. Both the first identification member and the second identification member are adhered to the fixing seat. When the rotating member rotates to a position facing the first identification member, the pressing block member presses the chip against the test board. When the rotating member rotates to a position facing the second identification member, the pressing block member disengages from the chip.
[0014] Preferably, the testing device further includes a hook. The fixing seat is rotatably connected to the hook, and the hook is used for clamping the base.
[0015] Preferably, the testing device further includes a third guiding column. The third guiding column is connected to the base, and the fixing seat is provided with a guiding hole matching the third guiding column at a position corresponding to the third guiding column.
[0016] Compared with the prior art, the present utility model has the following beneficial effects:
[0017] The utility model designs a testing device, which includes a test board assembly, a pressing assembly and a processing and display unit. A first elastic member on the test board assembly is connected to a supporting seat. The supporting seat is provided with a through hole and a receiving groove. The size of the receiving groove is the same as that of the chip. The chip is limited in the receiving groove to ensure that the chip will not shift. All test points of the chip are located in the through hole and correspond to the probes on the test board assembly one by one. The pressing assembly includes a fixed seat, a rotating member, a second elastic member and a pressing block member. The fixed seat is provided with a receiving cavity. The pressing block member is located in the receiving cavity. Two ends of the second elastic member are connected to the bottom of the receiving cavity and the pressing block member. The pressing block member is provided with an inclined surface. The rotating member penetrates the fixed seat and abuts against the inclined surface. The rotating member is driven to move along the inclined surface to a first position, and the chip pushed by the pressing block member will abut against the test board assembly, which ensures that the pressing angle and force are consistent and greatly improves the test accuracy. The processing and display unit is electrically connected to the test board assembly. BRIEF DESCRIPTION OF THE DRAWINGS
[0018] In order to more clearly illustrate the technical solutions in the embodiments of the present utility model or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the drawings in the following description are only some embodiments of the present utility model. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.
[0019] Figure 1 is a schematic structural diagram of the testing device of the present utility model;
[0020] Figure 2 is a schematic structural diagram of the handle and the rotating member of the present utility model;
[0021] Figure 3 is a schematic combined structural diagram of the first pressing block and the second pressing block of the present utility model;
[0022] Figure 4 is a schematic combined structural diagram of the test board, the base and the supporting seat of the present utility model.
[0023] Reference numerals: 1, handle; 2, fixed seat; 3, rotating member; 4, hook; 5, first guiding column; 6, second elastic member; 7, second pressing block; 8, heat dissipation hole; 9, second guiding column; 10, first pressing block; 11, inclined surface; 12, supporting seat; 13, base; 14, test board; 15, first identification member; 16, second identification member; 17, third elastic member. DETAILED DESCRIPTION OF THE EMBODIMENTS
[0024] To make the objectives, features, and advantages of the present utility model more obvious and understandable, the following will clearly and completely describe the technical solutions in the embodiments of the present utility model with reference to the accompanying drawings in the embodiments of the present utility model. Obviously, the embodiments described below are only a part of the embodiments of the present utility model, rather than all the embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present utility model.
[0025] In the description of the present utility model, it should be understood that when a component is considered to be "connected" to another component, it can be directly connected to the other component or there may be an intermediate component. When a component is considered to be "disposed on" another component, it can be directly disposed on the other component or there may be an intermediate component.
[0026] In addition, the terms "long", "short", "inner", "outer", etc. indicating the orientation or positional relationship are based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing the present utility model, rather than indicating or implying that the device or component referred to must have this specific orientation or be constructed and operated in this specific orientation. Therefore, it should not be construed as a limitation of the present utility model.
[0027] The following further illustrates the technical solutions of the present utility model with reference to the accompanying drawings and specific embodiments.
[0028] Please refer to Figures 1-4 , the present utility model provides a testing device, which includes a test board assembly, a pressing assembly, and a processing and display unit. A first elastic member on the test board assembly is connected to a supporting seat 12. The supporting seat 12 is provided with a through hole and a receiving groove. The size of the receiving groove is the same as the size of the chip. The chip is limited in the receiving groove, and all the test points of the chip are located in the through hole. The pressing assembly includes a fixed seat 2, a rotating member 3, a second elastic member 6, and a pressing block member. The fixed seat 2 is provided with a receiving cavity. The pressing block member is located in the receiving cavity. Two ends of the second elastic member 6 are connected to the bottom of the receiving cavity and the pressing block member. The pressing block member is provided with an inclined surface 11. The rotating member 3 penetrates the fixed seat 2 and abuts against the inclined surface 11. The rotating member 3 is driven to move along the inclined surface 11, and the pressing block member presses down the chip so that the chip abuts against the test board assembly. The processing and display unit is electrically connected to the test board assembly and is used for processing the data collected by the test board assembly and displaying the data.
[0029] It should be noted that the elastic force provided by the second elastic member 6 of the utility model to the pressing block makes the pressing block abut against the rotating member 3. In the initial state, the rotating member 3 is located at the lowest point of the inclined surface 11, and the rotating member 3 is driven to move along the inclined surface 11, which can push the pressing block to press the chip down. The rotating member 3 is driven to move along the inclined surface 11 to the first position, and the chip pushed by the pressing block will abut against the test board assembly, which ensures that the pressing angle and force are consistent, and the test accuracy is greatly improved. The size of the accommodating groove is consistent with the chip size, and the chip is limited in the accommodating groove to ensure that the chip will not shift.
[0030] Specifically, the test board assembly includes a test board 14 and a base 13 connected to the test board 14 , the base 13 is provided with an opening, the probe assembly of the test board 14 is located in the opening, and two ends of the first elastic member are respectively connected to the base 13 and the supporting seat 12 .
[0031] Specifically, the testing device further includes a guide pin, which is connected to the base 13 and passes through the supporting seat 12 .
[0032] The first elastic member of the present invention is located between the supporting seat 12 and the base 13. When the supporting seat 12 is pressed down, it can provide a certain buffering effect for the test board 14 to protect the probe and the test board 14 from damage.
[0033] After the test is completed, the first elastic member can also help the support seat 12 and the chip return to their initial positions. The guide pins can provide positioning and guiding functions, which ensure that the support seat 12 can maintain the correct position and direction during the movement process, and ensure that the test points on the chip can abut against the corresponding probes, thereby improving the accuracy and reliability of the test.
[0034] Specifically, the pressing block assembly includes a first pressing block 10, a second pressing block 7 and a third elastic member 17. The first pressing block 10 is provided with an inclined surface 11. The second pressing block 7 is close to the supporting seat 12. The two ends of the third elastic member 17 are respectively connected to the second pressing block 7 and the first pressing block 10. The two ends of the second elastic member 6 are connected to the bottom of the accommodating cavity and the second pressing block 7.
[0035] Specifically, the testing device further includes a first guide column 5 and a second guide column 9 . The first guide column 5 is connected to the fixing seat 2 and passes through the second pressing block 7 . The second guide column 9 is connected to the second pressing block 7 and passes through the first pressing block 10 .
[0036] The second elastic member 6 and the third elastic member 17 of the utility model play a buffering role when the second pressing block 7 presses down the chip, protecting the chip from damage. The first guide column 5 provides guidance for the second pressing block 7, ensuring that the second pressing block 7 can maintain a stable path and direction when subjected to force. The second guide column 9 provides a stable guide for the first pressing block 10, ensuring that it will not deviate from the predetermined path when subjected to force or moving.
[0037] Specifically, a number of heat dissipation holes 8 are provided in the second pressing block 7, and ventilation openings are provided in the fixing base 2 at positions corresponding to the heat dissipation holes 8. The heat dissipation holes 8 help to dissipate the generated heat during the test, preventing overheating from damaging the test equipment and the chip under test. Ventilation openings are provided in the fixing base 2 at positions corresponding to the heat dissipation holes 8, which further enhances the heat dissipation effect and allows air to circulate to carry away the heat.
[0038] Specifically, the test equipment further includes a handle 1, and the handle 1 is connected to the rotating member 3. The handle 1 provides a convenient operating point for the staff, enabling the staff to easily rotate the rotating member 3, thereby controlling the movement of the chip.
[0039] Specifically, the test equipment further includes a first identification member 15 and a second identification member 16. Both the first identification member 15 and the second identification member 16 are adhered to the fixing base 2. When the rotating member 3 rotates to a position facing the first identification member 15, the pressing member presses the chip against the test board 14. When the rotating member 3 rotates to a position facing the second identification member 16, the pressing member disengages from the chip.
[0040] The first identification member 15 and the second identification member 16 play an indicating role to help the staff determine the position of the chip. When the rotating member 3 rotates to a position facing the first identification member 15, at this time, the rotating member 3 is at the first position of the inclined surface 11, and the pressing member will press the chip against the test board 14, and the chip is in the test state. When the rotating member 3 rotates to a position facing the second identification member 16, the pressing member will disengage from the chip, which is the end or preparation stage of the test, allowing the staff to take out or replace the chip.
[0041] Specifically, the test equipment further includes a hook 4, and the fixing base 2 is rotatably connected to the hook 4. The hook 4 is used for clamping the base 13.
[0042] Specifically, the test equipment further includes a third guiding post. The third guiding post is connected to the base 13, and guiding holes matching the third guiding post are provided in the fixing base 2 at positions corresponding to the third guiding post.
[0043] The third guiding post and the hook 4 of the present utility model make the fixing base 2 and the base 13 form an integral body, enabling the fixing base 2 to maintain a stable position and preventing the fixing base 2 from moving.
[0044] Specifically, the test equipment further includes a motor. The driving end of the motor is connected to the handle 1. By starting the motor, the motor can drive the handle 1, and then drive the rotating member 3 to rotate, eliminating the need for the staff to rotate the handle 1 and saving the working intensity of the staff.
[0045] Specifically, the testing device further includes a tray, a first manipulator, a second manipulator, a good product trough, and a defective product trough. There are several chips to be tested on the tray. The first manipulator and the second manipulator are respectively arranged on both sides of the testing device. The first manipulator is used to pick up the chips on the tray to the carrier 12. The second manipulator is electrically connected to the processing and display unit and is connected with a suction cup. The second manipulator and the suction cup are used to suck the chips that pass the test on the carrier 12 into the good product trough, and the second manipulator and the suction cup are used to suck the chips that fail the test on the carrier 12 into the defective product trough.
[0046] So far, the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: they can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements on some of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.
Claims
1. A test device, characterized in that: It includes a test board assembly, a pressing assembly, and a processing and display unit. A first elastic member on the test board assembly is connected to a supporting seat. The supporting seat is provided with a through hole and a receiving groove. The size of the receiving groove is the same as that of the chip. The chip is limited in the receiving groove. All test points of the chip are located in the through hole and correspond one by one to the probes on the test board assembly. The pressing assembly includes a fixed seat, a rotating member, a second elastic member, and a pressing block member. The fixed seat is provided with a receiving cavity. The pressing block member is located in the receiving cavity. Two ends of the second elastic member are connected to the bottom of the receiving cavity and the pressing block member. The pressing block member is provided with an inclined surface. The rotating member penetrates the fixed seat and abuts against the inclined surface. The rotating member is driven to move along the inclined surface to a first position, and the chip pushed by the pressing block member will abut against the test board assembly. The processing and display unit is electrically connected to the test board assembly, and is used for processing the data collected by the test board assembly and displaying the data.
2. The test device according to claim 1, wherein: The test board assembly includes a test board and a base connecting the test board. The base is provided with an opening. The probes are located in the opening. Two ends of the first elastic member are respectively connected to the base and the supporting seat.
3. The testing device according to claim 2, wherein: It further includes a guiding pin. The guiding pin is connected to the base and penetrates the supporting seat.
4. The test device according to claim 1, wherein: The pressing block member includes a first pressing block, a second pressing block, and a third elastic member. The first pressing block is provided with the inclined surface. The second pressing block is close to the supporting seat. Two ends of the third elastic member are respectively connected to the second pressing block and the first pressing block. Two ends of the second elastic member are connected to the bottom of the receiving cavity and the second pressing block.
5. The testing device according to claim 4, characterized in that: It further includes a first guiding post and a second guiding post. The first guiding post is connected to the fixed seat and penetrates the second pressing block. The second guiding post is connected to the second pressing block and penetrates the first pressing block.
6. The test device according to claim 4, characterized in that: The second pressing block is provided with a plurality of heat dissipation holes. The fixed seat is provided with ventilation openings at positions corresponding to the heat dissipation holes.
7. The test device according to claim 1, wherein: It further includes a handle. The handle is connected to the rotating member.
8. The test device according to claim 1, wherein: It further includes a first identification member and a second identification member. Both the first identification member and the second identification member are adhered to the fixed seat. When the rotating member rotates to a position facing the first identification member, the pressing block member presses the chip to abut against the test board. When the rotating member rotates to a position facing the second identification member, the pressing block member disengages from the chip.
9. The testing device according to claim 2, wherein: It further includes a catch. The fixed seat is rotatably connected to the catch. The catch is used for clamping the base.
10. The testing device according to claim 2, wherein: It further includes a third guiding post. The third guiding post is connected to the base. The fixed seat is provided with a guiding hole matching the third guiding post at a position corresponding to the third guiding post.