Chip testing device

Abstract

The utility model provides a chip testing device which is used for fixing a chip to be tested. The chip testing device comprises a fixing support and a bearing support connected with the fixing support. The chip to be tested is fixed on the bearing support. The bearing support can rotate around the fixed support so as to be switched between a first test state and a second test state. In the first test state, the front surface of the to-be-tested chip faces upwards. And in the second test state, the back surface of the to-be-tested chip faces upwards. According to the chip testing device provided by the invention, the bearing bracket can rotate around the fixed bracket, so that after the front surface of the to-be-tested chip is tested, the to-be-tested chip can be turned over by directly turning over the bearing bracket, the back surface of the to-be-tested chip is tested, and the operation is simpler and more convenient.

Description

Technical Field

[0001] This application relates to the field of chip testing, and particularly to a chip testing device. Background Art

[0002] A chip, also known as an integrated circuit, includes a processor, a memory, sensors, and other electronic components, and is used to control and execute various functions. It is the core component of modern electronic devices. Chip testing is to verify the functions and evaluate the performance of chips during the manufacturing process, with the goal of ensuring the quality and reliability of the chips.

[0003] In the existing chip testing, the chip is usually placed on a workbench, and the tester holds a test probe to test the electronic components integrated on the chip. When it is necessary to test the back side of the chip after the front side has been tested, it is often necessary to manually turn over the chip to be tested and re-place it on the workbench before testing can be carried out. The steps are cumbersome and time-consuming. Summary of the Utility Model

[0004] The purpose of this application is to provide a chip testing device that is more convenient for testing both sides of a chip.

[0005] This application provides a chip testing device for fixing a chip to be tested, including: a fixing bracket and a bearing bracket connected to the fixing bracket; the chip to be tested is fixed on the bearing bracket; the bearing bracket can rotate around the fixing bracket to switch between a first testing state and a second testing state; in the first testing state, the front side of the chip to be tested faces upward; in the second testing state, the back side of the chip to be tested faces upward.

[0006] Further, the bearing bracket includes a bottom plate and a fixing device; the bottom plate is used to carry the chip to be tested, and the fixing device is used to fix the chip to be tested on the bottom plate.

[0007] Further, the fixing device can switch between a fixed state and a non-fixed state; in the fixed state, the fixing device is pressed against the chip to be tested, and the fixing device moves away from the chip to be tested to switch to the non-fixed state.

[0008] Further, the bearing bracket further includes a threaded rod; the threaded rod is located on the bottom plate and is threadedly connected to the fixing device; the threaded rod is used to drive the fixing device to move along the threaded rod by rotation.

[0009] Further, the bearing bracket further includes a side plate, the bottom plate is connected to the side plate, and the side plate is rotatably connected to the fixing bracket; the side plate can rotate around the fixing bracket to enable the bearing bracket to switch between a first testing state and a second testing state.

[0010] Further, a first sliding groove is formed on the side plate; the fixing device includes a connecting portion and a crimping portion connected to the connecting portion; the connecting portion is in threaded connection with the threaded rod and is received in the first sliding groove.

[0011] Further, a first motor is further included; the threaded rod and the fixing device are both provided in a pair; the bearing bracket further includes a pulley, the pulley connects the pair of threaded rods, and the first motor is used to drive the pulley to rotate so as to drive the pair of threaded rods to rotate synchronously.

[0012] Further, a test probe and a mounting bracket are further included; the test probe is arranged on the mounting bracket and can move along a first direction.

[0013] Further, a rotating shaft is provided on the mounting bracket, the rotating shaft is in threaded connection with the test probe; the chip testing device further includes a second motor for driving the rotating shaft to rotate, and the rotating shaft is used to drive the test probe to move along the first direction by rotation.

[0014] Further, a base is further included, the mounting bracket and the fixing bracket are arranged on the base; the mounting bracket can move along a second direction on the base to drive the test probe to move along the second direction; the second direction is perpendicular to the first direction; a plurality of chip portions arranged in a matrix are provided on the chip to be tested, and the test probe tests the plurality of chip portions by moving along the first direction and the second direction.

[0015] For the chip testing device provided in this application, the bearing bracket can rotate around the fixing bracket so that after the front side of the chip to be tested is tested, the chip to be tested can be directly turned over by flipping the bearing bracket to test the back side of the chip to be tested, and the operation is more convenient.

[0016] It should be understood that the above general description and the following detailed description are only exemplary and explanatory, and cannot limit this specification. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The accompanying drawings here are incorporated into the specification and form a part of this specification, showing embodiments consistent with this specification, and are used together with the specification to explain the principles of this specification.

[0018] Figure 1 is a schematic diagram of the chip testing device of this application.

[0019] Figure 2 is Figure 1 a schematic diagram of the chip testing device shown in the first test state.

[0020] Figure 3 is Figure 1 The schematic diagram of the chip testing device shown in the second testing state.

[0021] Figure 4 is Figure 1 The schematic diagram when the chip to be tested shown is fixed on the carrier bracket, where only part of the chip to be tested and the carrier bracket are shown.

[0022] Explanation of reference numerals: 1, fixed bracket; 2, carrier bracket; 21, bottom plate; 22, side plate; 221, first chute; 23, fixing device; 231, connecting part; 232, crimping part; 233, limiting part; 24, threaded rod; 25, pulley; 3, chip to be tested; 31, chip part; 4, first motor; 5, test probe; 51, probe head part; 52, fixing part; 6, mounting bracket; 61, supporting part; 62, middle part; 621, second chute; 63, rotating shaft; 7, second motor; 8, base; 81, third chute; 82, electric push rod; 9, third motor. Detailed implementation manners

[0023] Next, the embodiments of this specification will be described in detail.

[0024] Here, the technical solutions in the embodiments (or "implementation manners") of this application will be clearly and completely described in conjunction with the accompanying drawings. When the following description involves the accompanying drawings, unless otherwise indicated, the same numerals in different drawings represent the same or similar elements.

[0025] If there are terms related to directional indications or positional relationships in the embodiments of this application (such as up, down, left, right, front, back, inside, outside, top, bottom, center, vertical, horizontal, longitudinal, transverse, length, width, counterclockwise, clockwise, axial, radial, circumferential, etc.), then such terms are only used to explain the relative positional relationships and movement conditions between components in a specific posture (as shown in the accompanying drawings); if this specific posture changes, then the directional indication or positional relationship will also change accordingly. In addition, the terms "first", "second", etc. involved in the embodiments of this application are only for the purpose of convenient description and cannot be understood as indicating or implying relative importance.

[0026] Please refer to Figures 1 to 3 As shown, this application provides a chip testing device for fixing the chip to be tested 3. The chip testing device includes: a fixed bracket 1 and a carrier bracket 2 connected to the fixed bracket 1. The chip to be tested 3 is fixed on the carrier bracket 2. The carrier bracket 2 can rotate around the fixed bracket 1 to switch between the first testing state and the second testing state.

[0027] In the first test state, the front side of the chip under test 3 faces upward, so as to test the front part of the chip under test 3. In the second test state, the back side of the chip under test 3 faces upward, so as to test the back part of the chip under test 3.

[0028] The chip testing device provided by the present application further includes a test probe 5. The test probe 5 is used to test the chip under test 3 in the first test state and the second test state.

[0029] The test probe 5 can test the chip under test 3 by means of manual operation or by means of program control, etc., and the present application does not limit this.

[0030] For the chip testing device provided by the present application, the carrier bracket 2 can rotate around the fixed bracket 1 so that after the front side of the chip under test 3 is tested, the chip under test 3 can be directly turned over by flipping the carrier bracket 2 to test the back side of the chip under test 3, and the operation is more convenient.

[0031] The chip testing device provided by the present application further includes a third motor 9. The third motor 9 is installed on the fixed bracket 1. The fixed bracket 1 is rotatably connected to the carrier bracket 2. The third motor 9 is used to drive the carrier bracket 2 to rotate around the fixed bracket 1.

[0032] In other embodiments, the third motor 9 can be replaced with a knob (not shown in the figure), and the carrier bracket 2 is rotated by manually turning the knob; the third motor 9 can also be replaced with other devices for driving the carrier bracket 2 to rotate, and the present application does not limit this.

[0033] Please refer Figure 1 and Figure 4 As shown, the carrier bracket 2 includes a bottom plate 21 and a fixing device 23. The bottom plate 21 is used to carry the chip under test 3, and the fixing device 23 is used to fix the chip under test 3 on the bottom plate 21.

[0034] The fixing device 23 can be switched between a fixed state and a non-fixed state. In the fixed state, the fixing device 23 is pressed against the chip under test 3, and the fixing device 23 moves away from the chip under test 3 to switch to the non-fixed state.

[0035] The carrier bracket 2 further includes a threaded rod 24. The threaded rod 24 is located on the bottom plate 21 and is threadedly connected to the fixing device 23. The threaded rod 24 is used to drive the fixing device 23 to move along the threaded rod 24 by rotation, so that the fixing device 23 is switched between the fixed state and the non-fixed state.

[0036] In other embodiments, the fixing device 23 can be detachably connected to the bottom plate 21. In the fixed state, part of the fixing device 23 is connected to the bottom plate 21, and part of the fixing device 23 is crimped on the chip 3 to be tested. In the non-fixed state, the fixing device 23 is detached from the bottom plate 21, thereby releasing the fixation of the chip 3 to be tested and the carrier bracket 2.

[0037] The chip testing device provided by the present application further includes a first motor 4, and the first motor 4 is used to drive the threaded rod 24 to rotate.

[0038] In other embodiments, the threaded rod 24 can also be driven manually or rotated by other means, and the present application does not limit this.

[0039] The carrier bracket 2 further includes a side plate 22. The bottom plate 21 is connected to the side plate 22, and the side plate 22 is rotatably connected to the fixed bracket 1. The side plate 22 can rotate around the fixed bracket 1 so that the carrier bracket 2 can be switched between the first test state and the second test state. A third motor 9 is used to drive the side plate 22 to rotate.

[0040] In other embodiments, the side plate 22 can also be driven manually to rotate, and the present application does not limit this.

[0041] A first chute 221 is formed on the side plate 22. Part of the fixing device 23 is received in the first chute 221 and can move along the first chute 221 driven by the threaded rod 24, so as to ensure that the fixing device 23 can move along a predetermined path when moving, prevent deviation or swing, and improve the stability of movement.

[0042] The fixing device 23 includes a connecting portion 231, a crimping portion 232 connected to the connecting portion 231, and a limiting portion 233 extending from the crimping portion 232. The connecting portion 231 is threadedly connected to the threaded rod 24 and is received in the first chute 221. One side of the chip 3 to be tested is in contact with the bottom plate 21, and the opposite side is crimped by the crimping portion 232. One side of the chip 3 to be tested sandwiched between the side in contact with the bottom plate 21 and the side crimped by the crimping portion 232 is limited by the limiting portion 233 to prevent the chip 3 to be tested from detaching from the carrier bracket 2.

[0043] The limiting portion 233 of the fixing device 23 and the crimping portion 232 are in an L shape. Four fixing devices 23 are provided, so as to respectively crimp and fix and limit the four corners of the chip 3 to be tested, thereby fixing the chip 3 to be tested on the receiving bracket 2.

[0044] In other embodiments, the limiting portion 233 extends from both ends of the crimping portion 232 (not shown in the figure). Two fixing devices 23 are provided, so as to respectively crimp and fix and limit the two sides of the chip 3 to be tested, thereby fixing the chip 3 to be tested on the receiving bracket 2.

[0045] Both the threaded rod 24 and the fixing device 23 are provided in a pair. The bearing bracket 2 further includes a pulley 25. The pulley 25 is connected to the pair of threaded rods 24. The first motor 4 is used to drive the pulley 25 to rotate so as to drive the pair of threaded rods 24 to rotate synchronously, so that the fixing device 23 can also move up and down synchronously, ensuring the consistency when pressing the chip under test 3, and being able to apply uniform pressure to the chip under test 3 to avoid damaging the chip under test 3.

[0046] There are two side plates 22, which are respectively located on both sides of the bottom plate 21. A pair of threaded rods 24 and a pair of fixing devices 23 are arranged on the same side plate. Correspondingly, a pair of threaded rods 24 and a pair of fixing devices 23 are also provided on the other side plate.

[0047] Both the bottom plate 21 and the fixing bracket 1 are provided in a pair. The pair of bottom plates 21 are respectively connected to the two side plates 22 to form two L-shaped structures. The pair of bottom plates 21 are respectively connected to the pair of fixing brackets 1. The chip under test 3 is provided with a plurality of chip parts 31 arranged in a matrix. When the chip under test 3 is fixed on the bearing bracket 2, the chip parts 31 on the front surface of the chip under test 3 and the back test area on the back surface of the chip under test 3 and opposite to the chip parts 31 are not blocked, so as to facilitate the tester to use a test pen for testing.

[0048] The chip testing device provided by the present application further includes a mounting bracket 6. The test probe 5 is arranged on the mounting bracket 6 and can move along the first direction X.

[0049] A rotating shaft 63 is provided on the mounting bracket 6. The rotating shaft 63 is threadedly connected to the test probe 5. The rotating shaft 63 is used to drive the test probe 5 to move along the first direction X by rotation. The chip testing device further includes a second motor 7 for driving the rotating shaft 63 to rotate.

[0050] A second chute 621 is formed on the mounting bracket 6. The rotating shaft 63 is received in the second chute 621. Part of the test probe 5 is received in the second chute 621 and can move along the length direction of the second chute 621 through the rotation of the rotating shaft 63, so as to ensure that the test probe 5 can move along a predetermined path when moving, prevent deviation or swing, and improve the stability of movement.

[0051] In other embodiments, the mounting bracket 6 may not be provided with the second chute 621, and the rotating shaft 63 is directly fixed between the two ends of the mounting bracket 6. The present application does not limit this.

[0052] In other embodiments, the test probe 5 can also be driven manually or by other means to move along the first direction X. The present application does not limit this.

[0053] The chip testing device provided by the present application further includes a base 8. The mounting bracket 6 and the fixing bracket 1 are arranged on the base 8.

[0054] The mounting bracket 6 can move along a second direction on the base 8 to drive the test probe 5 to move along the second direction Y. The mounting bracket 6 includes a pair of support portions 61 and an intermediate portion 62 located between the pair of support portions 61. A second sliding groove 621 is provided in the intermediate portion 62. The test probe 5 includes a probe head portion 51 and a fixing portion 52 connected to the probe head portion 51. The probe head portion 51 is used to test the chip portion 31. The fixing portion 52 is received in the third sliding groove 81 and connected to the rotating shaft 63.

[0055] The base 8 is provided with a third sliding groove 81. The support portions 61 are partially received in the third sliding groove 81 and can move along the third sliding groove 81, thereby ensuring the smoothness when the support portions 61 move, and being not easily offset or swung, improving the stability during movement.

[0056] In other embodiments, a guide rail (not shown in the figure) or other structures can also be provided on the base 8 to replace the third sliding groove 81 so that the support portions 61 can move on the base 8. The present application does not limit this.

[0057] The base 8 further includes an electric push rod 82. The electric push rod 82 is connected to the mounting bracket 6 to drive the mounting bracket 6 to move along the third sliding groove 81. The electric push rod 82 includes a push rod body (not shown) and a driving motor (not shown in the figure). The push rod body is connected to the mounting bracket 6, and the driving motor is used to drive the push rod body to move linearly to drive the mounting bracket 6 to move.

[0058] In other embodiments, the mounting bracket 6 can also be directly pushed by manpower or driven to move in other ways. The present application does not limit this.

[0059] The first direction X is along the length direction of the second sliding groove 621. The second direction Y is along the length direction of the third sliding groove 81. The third sliding groove 81 is perpendicular to the second sliding groove 621, and the second direction Y is perpendicular to the first direction X. The test probe 5 can test a plurality of chip portions 31 and a to-be-tested area on the back of the to-be-tested chip 3 in the first test state and the second test state by moving along the first direction and the second direction, realizing the automation of chip testing and saving labor costs.

[0060] It should be noted that the technical solutions or technical features described in the above embodiments can be combined or supplemented with each other without conflict. The scope of protection of the present application is not limited to the precise structures described in the above embodiments and shown in the drawings; all modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present application shall be included within the scope of protection of the present application.

Claims

1. A chip testing device for fixing a chip to be tested, characterized in that, Including: A fixed bracket and a carrying bracket connected to the fixed bracket; the chip to be tested is fixed to the carrying bracket; The carrying bracket can rotate around the fixed bracket to switch between a first test state and a second test state; In the first test state, the front side of the chip to be tested faces upward; in the second test state, the back side of the chip to be tested faces upward.

2. The chip testing device according to claim 1, characterized in that, The carrying bracket includes a bottom plate and a fixing device; the bottom plate is used to carry the chip to be tested, and the fixing device is used to fix the chip to be tested on the bottom plate.

3. The chip testing device according to claim 2, wherein, The fixing device can switch between a fixed state and a non-fixed state; in the fixed state, the fixing device is crimped on the chip to be tested, and the fixing device moves away from the chip to be tested to switch to the non-fixed state.

4. The chip testing device according to claim 3, wherein The carrying bracket further includes a threaded rod; the threaded rod is located on the bottom plate and is threadedly connected to the fixing device; the threaded rod is used to drive the fixing device to move along the threaded rod by rotation.

5. The chip testing device according to claim 4, wherein The carrying bracket further includes a side plate, the bottom plate is connected to the side plate, and the side plate is rotatably connected to the fixed bracket; the side plate can rotate around the fixed bracket to enable the carrying bracket to switch between a first test state and a second test state.

6. The chip testing device according to claim 5, wherein, A first chute is formed on the side plate; the fixing device includes a connecting portion and a crimping portion connected to the connecting portion; the connecting portion is threadedly connected to the threaded rod and is received in the first chute.

7. The chip testing device according to claim 6, wherein It further includes a first motor; the threaded rod and the fixing device are both provided in a pair; the carrying bracket further includes a pulley, the pulley connects the pair of threaded rods, and the first motor is used to drive the pulley to rotate so as to drive the pair of threaded rods to rotate synchronously.

8. The chip testing device according to any one of claims 1-7, characterized in that, It further includes a test probe and a mounting bracket; the test probe is arranged on the mounting bracket and can move in a first direction.

9. The chip testing device according to claim 8, wherein A rotating shaft is provided on the mounting bracket, and the rotating shaft is threadedly connected to the test probe; the chip testing device further includes a second motor for driving the rotating shaft to rotate, and the rotating shaft is used to drive the test probe to move in the first direction by rotation.

10. The chip testing device according to claim 8, wherein, It further includes a base, the mounting bracket and the fixed bracket are arranged on the base; the mounting bracket can move on the base in a second direction to drive the test probe to move in the second direction; the second direction is perpendicular to the first direction; a plurality of chip portions arranged in a matrix are provided on the chip to be tested, and the test probe tests the plurality of chip portions by moving in the first direction and the second direction.

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