Flash memory chip test equipment

Abstract

The utility model relates to the technical field of flash memory chip testing equipment, and particularly discloses flash memory chip testing equipment, which comprises a bottom plate, a testing seat is fixedly connected to the upper end face of the bottom plate, an upper cover is arranged above the testing seat, a pressing head is connected to the lower end face of the upper cover, and the pressing head is connected with the testing seat. Guide rods are fixedly connected to the two sides of the upper end face of the bottom plate, guide sleeves are fixedly connected to the two sides of the upper cover, the guide sleeves are slidably connected with the guide rods in a sleeving mode, the testing seat comprises a seat body, a testing groove is formed in the inner side of the upper end face of the seat body, a lifting-out assembly is arranged in the testing groove, and the lifting-out assembly comprises a frame. Connecting frames are fixedly connected to the two sides of the frame. According to the utility model, the lifting-out assembly is arranged, so that the chip pins can be accurately contacted with the pin hole sites in the test groove, the test effect is ensured, the chip is convenient to take and place, and the use is more convenient.

Description

Technical Field

[0001] The utility model relates to the technical field of flash memory chip testing equipment, in particular to flash memory chip testing equipment. Background Technique

[0002] A flash memory chip is a non-volatile memory chip that can retain data storage even when powered off. It can store a large amount of data in a relatively small physical space, has relatively fast data reading and writing speeds, and is small in size and light in weight, making it convenient to be integrated into various electronic devices.

[0003] During the production of flash memory chips, to ensure quality, various performances of the chips need to be tested. During the test, the chips need to be placed in a test socket, and the test socket serves as a carrier for various tests. However, due to the small size of flash memory chips, it is inconvenient to pick up and place the chips in the test socket, which is likely to affect the test efficiency. Therefore, those skilled in the art have provided flash memory chip testing equipment to solve the problems raised in the above background technique. Content of the Utility Model

[0004] The purpose of the utility model is to provide flash memory chip testing equipment to solve the following technical problems:

[0005] How to improve the convenience of picking up and placing flash memory chips during the test and improve the test efficiency.

[0006] The purpose of the utility model can be achieved by the following technical solutions:

[0007] The flash memory chip testing equipment includes a bottom plate. The upper end surface of the bottom plate is fixedly connected with a test socket. Above the test socket is provided an upper cover. The lower end surface of the upper cover is connected with a pressure head. Both sides of the upper end surface of the bottom plate are fixedly connected with guide rods. Both sides of the upper cover are fixedly connected with guide sleeves, and the guide sleeves are slidably sleeved on the guide rods;

[0008] The test socket includes a socket body. The inner side of the upper end surface of the socket body is provided with a test groove, and a lifting component is arranged inside the test groove;

[0009] The lifting component includes a frame. Both sides of the frame are fixedly connected with connecting frames. The connecting frames extend into the socket body and are slidably connected with the socket body. A spring piece is fixedly connected between the lower end of the connecting frame and the inner bottom of the socket body.

[0010] Further, the upper end surface of the upper cover is connected with a locking component. The locking component includes a connecting seat fixedly connected with the upper cover. The inner sides of both sides of the connecting seat are alternately slidably connected with racks. One end of each of the two racks extends out of the connecting seat and is fixedly connected with an inclined locking head. Lock holes are respectively arranged on the lower sides of the two guide rods, and the two lock holes correspond to the positions of the two inclined locking heads respectively;

[0011] Further, a rotary knob is rotatably connected to the upper end surface of the connecting seat. The lower end of the rotary knob extends into the connecting seat and is fixedly connected to a gear, and the gear is meshed with two racks;

[0012] Further, an outward convex rod extending out of the seat body is fixedly connected to the upper end of the connecting frame. Pressing rods are fixedly connected to the four corners of the lower end of the upper cover, and the positions of the pressing rods correspond to the positions of the outward convex rods one by one;

[0013] Further, a cavity is formed inside the lower end surface of the upper cover. The upper end of the pressing head extends into the cavity and is slidably connected to the cavity. A plurality of second springs are fixedly connected between the upper end of the upper cover and the inner wall of the cavity;

[0014] Further, a through groove is formed at the lower end of the guide rod. A buffer sleeve is slidably sleeved at the outer end of the through groove, and a first spring is fixedly connected between the lower end surface of the buffer sleeve and the bottom plate;

[0015] Further, a mating groove is formed on the outer side of the bottom surface of the test slot, and the size of the mating groove matches that of the frame;

[0016] Advantages of the present utility model:

[0017] The flash memory storage chip testing device proposed by the present utility model, by setting a test seat, an upper cover, and a lifting-out component, when the device is in use, the frame of the lifting-out component is in a popped-up state. The flash memory chip to be tested is clamped in the groove of the frame, and then the lower cover is pressed down. Through the contact between the pressing rod and the outward convex rod, the frame is driven to move downward, so that the chip pins can accurately contact the pin holes in the test slot, ensuring the test effect and not easily damaging the pins. In addition, after the test is completed, when the upper cover is opened, the frame of the lifted-out component can rise through the elastic force of the internal elastic sheet, thereby lifting the chip out of the test slot, making it convenient to pick up and place the chip and more convenient to use. Description of the Drawings

[0018] The following further describes the present utility model with reference to the drawings.

[0019] Figure 1 is a perspective view of the flash memory storage chip testing device proposed by the present utility model;

[0020] Figure 2 is a structural diagram of the test seat of the flash memory storage chip testing device proposed by the present utility model;

[0021] Figure 3 is a structural diagram of the bottom surface of the upper cover of the flash memory storage chip testing device proposed by the present utility model;

[0022] Figure 4It is a structural diagram of the lifting component of the flash memory chip testing device proposed by the present utility model;

[0023] Figure 5 It is an internal structural diagram of the connection base of the flash memory chip testing device proposed by the present utility model;

[0024] Figure 6 It is a connection structural diagram of the indenter of the flash memory chip testing device proposed by the present utility model.

[0025] Reference numerals:

[0026] 1. Bottom plate; 2. Test seat; 21. Seat body; 22. Test groove; 23. Fitting groove; 3. Lifting component; 31. Frame; 32. Connecting frame; 33. Outer convex rod; 34. Elastic sheet; 4. Upper cover; 5. Locking component; 51. Connection base; 52. Rotating knob; 53. Rack; 54. Oblique angle lock head; 55. Gear; 6. Guide rod; 7. Lock hole; 8. Through groove; 9. Buffer sleeve; 10. First spring; 11. Guide sleeve; 12. Indenter; 13. Lower pressing rod; 14. Cavity; 15. Second spring. Detailed implementation manners

[0027] Next, the technical solutions in the embodiments of the present utility model will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present utility model. Obviously, the described embodiments are only a part of the embodiments of the present utility model, rather than all the embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without making creative efforts belong to the protection scope of the present utility model.

[0028] Please refer to the attached Figures 1 to 6 As shown, the flash memory chip testing device in the embodiment of the present utility model includes a bottom plate 1. A test seat 2 is fixedly connected to the upper end surface of the bottom plate 1. An upper cover 4 is arranged above the test seat 2. An indenter 12 is connected to the lower end surface of the upper cover 4. Guide rods 6 are fixedly connected to both sides of the upper end surface of the bottom plate 1. Guide sleeves 11 are fixedly connected to both sides of the upper cover 4. The guide sleeves 11 are slidably sleeved on the guide rods 6. When in use, the upper cover 4 can move stably along the guide rods 6, so as to accurately cooperate with the test seat 2.

[0029] The test seat 2 includes a seat body 21. A test groove 22 is opened inside the upper end surface of the seat body 21. A lifting component 3 is arranged inside the test groove 22. The arranged lifting component 3 facilitates the taking and placing of the chip.

[0030] The lifting component 3 includes a frame 31. Connecting brackets 32 are fixedly connected to both sides of the frame 31. The connecting brackets 32 extend into the interior of the base body 21 and are slidably connected to the base body 21. A spring piece 34 is fixedly connected between the lower end of the connecting bracket 32 and the inner bottom of the base body 21. Before testing, the frame 31 of the lifting component 3 is in a popped-up state. A stepped groove is formed on the inner side of the frame 31. The flash memory chip to be tested is clamped in the groove of the frame 31. Then, the upper cover 4 is pressed down. Through the contact between the pressing rod 13 and the protruding rod 33, the frame 31 is driven to move downward, so that the chip pins can accurately contact the pin holes in the test slot 22, ensuring the test effect and not easily damaging the pins. In addition, after the test is completed, when the upper cover 4 is opened, the frame 31 of the lifting component 3 can rise through the elastic force of the internal spring piece 34, thereby lifting the chip out of the test slot 22, making it convenient to pick up and place the chip and more convenient to use.

[0031] A locking component 5 is connected to the upper end surface of the upper cover 4. The locking component 5 includes a connecting seat 51 fixedly connected to the upper cover 4. Rack bars 53 are alternately slidably connected to both sides inside the connecting seat 51. One ends of the two rack bars 53 both extend out of the connecting seat 51 and are fixedly connected with bevel lock heads 54. Lock holes 7 are formed on the lower sides of the two guide rods 6. The two lock holes 7 correspond to the positions of the two bevel lock heads 54 respectively. A rotary knob 52 is rotatably connected to the upper end surface of the connecting seat 51. The lower end of the rotary knob 52 extends into the interior of the connecting seat 51 and is fixedly connected with a gear 55. The gear 55 is meshed with the two rack bars 53. The provided locking component 5 is used to stably press the upper cover 4 against the test base 2. Specifically, the upper cover 4 is pressed down on the test base 2. Then, the rotary knob 52 is rotated, so as to drive the two rack bars 53 to move through the gear 55, making the two bevel lock heads 54 insert into the lock holes 7. Since the end of the bevel lock head 54 is beveled, the more the bevel lock head 54 extends into the lock hole 7, the closer the upper cover 4 is pressed against the test base 2.

[0032] The upper end of the connecting bracket 32 is fixedly connected with a protruding rod 33 that extends out of the base body 21. Pressing rods 13 are fixedly connected to the four corners of the lower end of the upper cover 4. The positions of the pressing rods 13 correspond to the positions of the protruding rods 33 one by one. By setting the contact between the pressing rods 13 and the protruding rods 33, the frame 31 is driven to press down. In addition, when the upper cover 4 is opened, before the protruding rod 33 rises to the highest point, the pressing rod 13 will always be in contact with the protruding rod 33, thereby preventing the chip from being bounced up due to the rapid popping of the spring piece 34.

[0033] A cavity 14 is formed inside the lower end surface of the upper cover 4. The upper end of the pressing head 12 extends into the cavity 14 and is slidably connected to the cavity 14. A plurality of second springs 15 are fixedly connected between the upper end of the upper cover 4 and the inner wall of the cavity 14. By setting the second springs 15, the pressing head 12 can stretch within a certain range. When in use, the pressing head 12 can closely fit with the chip, ensuring that the chip is stably in contact with the test slot 22 during testing.

[0034] A through groove 8 is formed at the lower end of the guide rod 6. A buffer sleeve 9 is slidably sleeved on the outer end of the through groove 8. A first spring 10 is fixedly connected between the lower end surface of the buffer sleeve 9 and the bottom plate 1. When the upper cover 4 is pressed down, the guide sleeve 11 will contact the buffer sleeve 9 and then contact the first spring 10. The elastic force of the first spring 10 plays a buffering role, which can prevent the upper cover 4 from closing too quickly and colliding with the test base 2.

[0035] A mating groove 23 is formed on the outer side of the bottom surface of the test groove 22. The size of the mating groove 23 is matched with that of the frame 31. By providing the mating groove 23, after the frame 31 descends, it can be received into the mating groove 23, so that the chip can be stably connected to the pin holes of the test groove 22.

[0036] The above has described in detail an embodiment of the present invention, but the described content is only the preferred embodiment of the present invention and cannot be considered as limiting the scope of implementation of the present invention. All equivalent changes and improvements made according to the scope of the present invention application shall still fall within the scope covered by the patent of the present invention.

Claims

1. Flash memory storage chip testing device, including a bottom plate (1), characterized in that: The upper end face of the bottom plate (1) is fixedly connected with a test seat (2). Above the test seat (2), there is an upper cover (4). The lower end face of the upper cover (4) is connected with a pressure head (12). On both sides of the upper end face of the bottom plate (1), there are guide rods (6) fixedly connected. On both sides of the upper cover (4), there are guide sleeves (11) fixedly connected. The guide sleeves (11) are slidably sleeved on the guide rods (6). The test seat (2) includes a seat body (21). Inside the upper end face of the seat body (21), there is a test groove (22). Inside the test groove (22), there is a lifting-out assembly (3). The lifting-out assembly (3) includes a frame (31). On both sides of the frame (31), there are connecting frames (32) fixedly connected. The connecting frames (32) extend into the seat body (21) and are slidably connected with the seat body (21). Between the lower end of the connecting frame (32) and the inner bottom of the seat body (21), there is a spring plate (34) fixedly connected.

2. The flash memory storage chip testing device according to claim 1, wherein: The upper end face of the upper cover (4) is connected with a locking assembly (5). The locking assembly (5) includes a connecting seat (51) fixedly connected with the upper cover (4). Inside the connecting seat (51), on both sides, there are racks (53) slidably connected in a staggered manner. One end of each of the two racks (53) extends out of the connecting seat (51) and is fixedly connected with an angled lock head (54). On the lower sides of the two guide rods (6), there are lock holes (7). The two lock holes (7) correspond to the positions of the two angled lock heads (54) respectively.

3. The flash memory storage chip testing device according to claim 2, wherein: The upper end face of the connecting seat (51) is rotatably connected with a rotary knob (52). The lower end of the rotary knob (52) extends into the connecting seat (51) and is fixedly connected with a gear (55). The gear (55) is meshed with the two racks (53).

4. The flash memory storage chip testing device according to claim 1, wherein: The upper end of the connecting frame (32) is fixedly connected with an outer convex rod (33) extending out of the seat body (21). At the four corners of the lower end of the upper cover (4), there are pressing rods (13) fixedly connected. The positions of the pressing rods (13) correspond to the positions of the outer convex rods (33) one by one.

5. The flash memory storage chip testing device according to claim 1, characterized in that: Inside the lower end face of the upper cover (4), there is a cavity (14). The upper end of the pressure head (12) extends into the cavity (14) and is slidably connected with the cavity (14). Between the upper end of the upper cover (4) and the inner wall of the cavity (14), there are multiple second springs (15) fixedly connected.

6. The flash memory storage chip testing device according to claim 1, characterized in that: At the lower end of the guide rod (6), there is a through groove (8). The outer end of the through groove (8) is slidably sleeved with a buffer sleeve (9). Between the lower end face of the buffer sleeve (9) and the bottom plate (1), there is a first spring (10) fixedly connected.

7. The flash memory storage chip testing device according to claim 1, wherein: Outside the bottom surface of the test groove (22), there is a mating groove (23). The size of the mating groove (23) matches that of the frame (31).

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