Chip test probe seat

Abstract

The utility model discloses a chip test probe seat, which comprises a fixed seat, a mounting seat, a probe, an elastic piece, an adjusting bolt, an adjusting nut and an elastic piece, an assembly cavity is formed in the fixed seat and communicates with one end face of the fixed seat; the mounting seat comprises an assembling part, a connecting part and an abutting part which are connected in sequence, and the connecting part and the abutting part are arranged in the assembling cavity; the probe is mounted on the assembling part; two ends of the elastic sheet are respectively connected with the assembling part and the fixed seat; the adjusting bolt sequentially penetrates through the connecting part and the top wall of the fixed seat and is matched and connected with the adjusting nut; the two ends of the elastic piece abut against the fixing base and the adjusting nut respectively. According to the chip test probe seat, the elastic sheets are utilized to enable the probes on the mounting seat to have a certain buffer space when the probes are in contact with the chip, so that the chip is prevented from being damaged due to overlarge pressure of the probes on the chip. And the adjusting bolt is matched with the adjusting nut to adjust the deformation quantity of the elastic sheet so as to control the downward elastic force, so that the pressure applied to the chip when the probe is in contact with the chip is adjusted, and the contact pressure of the probe is adjustable.

Description

Technical Field

[0001] The utility model relates to the technical field of chip testing, in particular to a chip testing probe socket. Background Art

[0002] During the production and manufacturing process of a chip, it is necessary to power on the chip to detect its performance. In the related art, the pressure exerted by the probe for powering on the chip when contacting the chip is difficult to adjust. If the pressure of the probe on the chip is too large, the chip will be damaged, causing unnecessary losses. Content of the Utility Model

[0003] The technical problem to be solved by the utility model is: to provide a probe holder with buffering ability when contacting the chip to avoid damaging the chip.

[0004] To solve the above technical problem, the technical solution adopted by the utility model is: a chip testing probe socket, including:

[0005] A fixed seat, an assembly cavity is provided on the fixed seat, and the assembly cavity communicates with one end face of the fixed seat;

[0006] An installation seat, the installation seat includes an assembly part, a connection part and an abutting part connected in sequence, the connection part and the abutting part are arranged in the assembly cavity, and the assembly part is exposed outside the fixed seat;

[0007] A probe, the probe is installed on the assembly part;

[0008] A shrapnel, one end of the shrapnel is fixedly connected with the assembly part, and the other end of the shrapnel is fixedly connected with the fixed seat;

[0009] An adjusting bolt and an adjusting nut, the adjusting bolt sequentially penetrates through the connection part and the top wall of the fixed seat and is connected with the adjusting nut in a matching manner;

[0010] An elastic member, both ends of the elastic member respectively abut against the fixed seat and the adjusting nut to drive the adjusting nut to move away from the fixed seat.

[0011] Further, the elastic member is sleeved on the adjusting bolt.

[0012] Further, the elastic member is a spring, a shrapnel or a spring washer.

[0013] Further, an adjusting member is provided on the fixed seat, the adjusting member is liftable relative to the fixed seat, and the adjusting member is arranged above the abutting part.

[0014] Further, the adjusting member is provided with an external thread, and the fixed seat is provided with an internal thread that matches the external thread.

[0015] Further, a detachable top block is provided on the abutting portion, and the top block is used to abut against the adjusting member.

[0016] Further, it further includes a fixing column. One end of the fixing column is connected to the assembling portion. The fixing column is provided with an installation through hole, and the probe is inserted into the installation through hole.

[0017] Further, it further includes a movable block. The movable block is arranged on the fixing column and is slidable relative to the fixing column. One end of the movable block abuts against the probe.

[0018] Further, a groove is provided at one end of the movable block, and the probe is inserted into the groove.

[0019] Further, a receiving hole is provided on the fixing base, and the elastic member is inserted into the receiving hole.

[0020] The beneficial effects of the present utility model are as follows: The chip test probe base of the present utility model uses a spring piece to connect the fixing base and the mounting base, so that the probe on the mounting base has a certain buffer space when contacting the chip, avoiding excessive pressure on the chip by the probe and causing damage to the chip, resulting in unnecessary losses. The adjusting bolt cooperates with the adjusting nut to adjust the deformation amount of the spring piece to control the magnitude of the downward elastic force, thereby achieving the adjustment of the pressure exerted on the chip when the probe contacts the chip, and realizing adjustable probe contact pressure. The abutting portion abuts against the top surface of the assembling cavity to limit the lowest height of the probe when it does not contact the chip. Description of the Drawings

[0021] Figure 1 It is a schematic diagram of the overall structure of the chip test probe base according to Embodiment 1 of the present utility model;

[0022] Figure 2 It is a cross-sectional view of the chip test probe base according to Embodiment 1 of the present utility model.

[0023] Label Description:

[0024] 1. Fixing base; 11. Assembling cavity; 12. Receiving hole;

[0025] 2. Mounting base; 21. Assembling portion; 22. Connecting portion; 23. Abutting portion; 231. Top block;

[0026] 3. Probe;

[0027] 4. Spring piece;

[0028] 51. Adjusting bolt; 52. Adjusting nut;

[0029] 6. Elastic member;

[0030] 7. Adjusting member;

[0031] 8. Fixed column; 81. Installation through hole;

[0032] 9. Movable block; 91. Groove. Detailed implementation manner

[0033] To describe in detail the technical content, achieved purpose and effects of the present utility model, the following is described in conjunction with the implementation manners and with reference to the accompanying drawings.

[0034] Please refer to Figure 1 and Figure 2 , the chip test probe 3 seat, comprising:

[0035] Fixed seat 1, an assembly cavity 11 is provided on the fixed seat 1, and the assembly cavity 11 communicates with one end face of the fixed seat 1;

[0036] Mounting seat 2, the mounting seat 2 includes an assembly portion 21, a connecting portion 22 and an abutting portion 23 connected in sequence, the connecting portion 22 and the abutting portion 23 are arranged in the assembly cavity 11, and the assembly portion 21 is exposed outside the fixed seat 1;

[0037] Probe 3, the probe 3 is mounted on the assembly portion 21;

[0038] Elastic piece 4, one end of the elastic piece 4 is fixedly connected to the assembly portion 21, and the other end of the elastic piece 4 is fixedly connected to the fixed seat 1;

[0039] Adjusting bolt 51 and adjusting nut 52, the adjusting bolt 51 sequentially penetrates through the connecting portion 22 and the top wall of the fixed seat 1 and is in cooperation connection with the adjusting nut 52;

[0040] Elastic member 6, both ends of the elastic member 6 respectively abut against the fixed seat 1 and the adjusting nut 52 to drive the adjusting nut 52 to move away from the fixed seat 1.

[0041] As can be seen from the above description, the beneficial effect of the present utility model is that: the chip test probe 3 seat uses the elastic piece 4 to connect the fixed seat 1 and the mounting seat 2, so that the probe 3 on the mounting seat 2 has a certain buffer space when contacting the chip, avoiding excessive pressure on the chip by the probe 3 and causing damage to the chip and unnecessary losses. The adjusting bolt 51 cooperates with the adjusting nut 52 to adjust the deformation amount of the elastic piece 4 to control the magnitude of the downward elastic force, so as to adjust the pressure applied to the chip when the probe 3 contacts the chip, and realize that the contact pressure of the probe 3 is adjustable. The abutting portion 23 abuts against the top surface of the assembly cavity 11 to limit the lowest height of the probe 3 when it does not contact the chip.

[0042] Furthermore, the elastic member 6 is sleeved on the adjusting bolt 51.

[0043] As can be seen from the above description, the elastic member 6 is sleeved on the adjusting bolt 51, which can limit the position of the elastic member 6 and prevent the elastic member 6 from falling off accidentally or shifting in position.

[0044] Further, the elastic member 6 is a spring, a shrapnel 4 or a spring washer.

[0045] As can be seen from the above description, the type of the elastic member 6 can be selected according to actual usage requirements or production conditions.

[0046] Further, an adjusting member 7 is provided on the fixed seat 1. The adjusting member 7 is vertically movable relative to the fixed seat 1 and is arranged above the abutting portion 23.

[0047] As can be seen from the above description, by changing the height of the adjusting member 7, the lowest height of the probe 3 when it does not contact the chip can be changed.

[0048] Further, the adjusting member 7 is provided with an external thread, and the fixed seat 1 is provided with an internal thread that mates with the external thread.

[0049] As can be seen from the above description, by screwing the adjusting member 7, the relative height between the adjusting member 7 and the fixed seat 1 can be changed.

[0050] Further, a detachable top block 231 is provided on the abutting portion 23, and the top block 231 is used to abut against the adjusting member 7.

[0051] As can be seen from the above description, the top block 231 can be replaced according to usage requirements to avoid wear of the mounting seat 2.

[0052] Further, a fixing column 8 is further included. One end of the fixing column 8 is connected to the assembling portion 21. The fixing column 8 is provided with a mounting through hole 81, and the probe 3 is inserted into the mounting through hole 81.

[0053] As can be seen from the above description, the assembling method of the probe 3 is simple and convenient for disassembly and assembly.

[0054] Further, a movable block 9 is further included. The movable block 9 is arranged on the fixing column 8 and is slidable relative to the fixing column 8. One end of the movable block 9 abuts against the probe 3.

[0055] As can be seen from the above description, the probe 3 is clamped between the side wall of the mounting through hole 81 and the movable block 9, effectively preventing the probe 3 from accidentally detaching from the fixing column 8.

[0056] Further, a groove 91 is provided at one end of the movable block 9, and the probe 3 passes through the groove 91.

[0057] As can be seen from the above description, the groove 91 makes the probe 3 more stable when fixed in the mounting through hole 81 and not prone to movement.

[0058] Furthermore, a receiving hole 12 is provided on the fixed seat 1, and the elastic member 6 is inserted into the receiving hole 12.

[0059] As can be seen from the above description, the receiving hole 12 is used to limit the position of the elastic member 6, and it is not easy for the elastic member 6 to shift in position when the adjusting nut 52 adjusts the spring deformation.

[0060] Please refer to Figure 1 and Figure 2 In the first embodiment of the present utility model, a chip test probe 3 seat includes a fixed seat 1, a mounting seat 2, a probe 3, a shrapnel 4, an adjusting bolt 51, an adjusting nut 52, and an elastic member 6; an assembly cavity 11 is provided on the fixed seat 1, and the assembly cavity 11 communicates with one end face of the fixed seat 1 to form a socket; the mounting seat 2 includes an assembly portion 21, a connecting portion 22, and an abutting portion 23 that are connected in sequence, the connecting portion 22 and the abutting portion 23 pass through the socket and are inserted into the assembly cavity 11, and the assembly portion 21 is exposed outside the fixed seat 1; the probe 3 is installed on the assembly portion 21; one end of the shrapnel 4 is fixedly connected to the assembly portion 21, and the other end of the shrapnel 4 is fixedly connected to the fixed seat 1; the adjusting bolt 51 sequentially passes through the connecting portion 22 and the top wall of the fixed seat 1 and is in cooperation connection with the adjusting nut 52; both ends of the elastic member 6 respectively abut against the fixed seat 1 and the adjusting nut 52 to drive the adjusting nut 52 to move away from the fixed seat 1.

[0061] It is easy to understand that specifically, the shrapnel 4 connects the fixed seat 1 and the mounting seat 2, so that the probe 3 on the mounting seat 2 has a certain buffer space when contacting the chip, avoiding excessive pressure on the chip by the probe 3 and causing damage to the chip and unnecessary losses. The adjusting bolt 51 and the adjusting nut 52 cooperate to adjust the deformation of the shrapnel 4 to control the magnitude of the downward elastic force, thereby achieving the adjustment of the pressure applied to the chip when the probe 3 contacts the chip and realizing the adjustable contact pressure of the probe 3. The abutting portion 23 abuts against the top surface of the assembly cavity 11 to limit the lowest height of the probe 3 when it does not contact the chip.

[0062] In this embodiment, the elastic member 6 is a spring, and the elastic member 6 is sleeved on the adjusting bolt 51. In other embodiments, it is also feasible to set the elastic member 6 as a shrapnel 4 or a spring washer.

[0063] A receiving hole 12 is provided on the fixed seat 1, and the elastic member 6 is inserted into the receiving hole 12. Specifically, a through hole communicating with the assembly cavity 11 is provided at the bottom of the receiving hole 12, and the adjusting screw passes through the through hole.

[0064] An adjusting member 7 is provided on the fixed seat 1, the adjusting member 7 is liftable relative to the fixed seat 1, and the adjusting member 7 is provided above the abutting portion 23. Specifically, an external thread is provided on the adjusting member 7, and an internal thread matching the external thread is provided on the fixed seat 1.

[0065] The abutting part 23 is provided with a detachable top block 231, and the top block 231 is used to abut against the adjusting member 7. Optionally, the top block 231 and the adjusting member 7 are in interference fit or connected by threads. The top block 231 can be replaced according to the usage needs to avoid wear of the mounting seat 2.

[0066] The chip test probe 3 seat further includes a fixing column 8. One end of the fixing column 8 is connected to the assembling part 21. The fixing column 8 is provided with a mounting through hole 81, and the probe 3 is inserted into the mounting through hole 81. Specifically, the fixing column 8 is cylindrical, and the axial direction of the fixing column 8 is horizontally arranged. The axial direction of the mounting through hole 81 forms a certain angle with the vertical direction.

[0067] The chip test probe 3 seat further includes a movable block 9. The movable block 9 is arranged on the fixing column 8 and is slidable relative to the fixing column 8. One end of the movable block 9 abuts against the probe 3. Specifically, the movable block 9 is cylindrical, the movable block 9 is sleeved on the fixing column 8, and one end face of the movable block 9 close to the probe 3 is set as an inclined surface, and the axial direction of the probe 3 is parallel to the inclined surface.

[0068] A groove 91 is arranged at one end of the movable block 9, and the probe 3 is inserted into the groove 91. The groove 91 makes the probe 3 more stable when fixed in the mounting through hole 81 and will not move easily.

[0069] In summary, the chip test probe seat provided by the present invention uses a spring piece to connect the fixed seat and the mounting seat, so that the probe on the mounting seat has a certain buffer space when contacting the chip, avoiding excessive pressure on the chip by the probe and causing unnecessary losses. The adjusting bolt cooperates with the adjusting nut to adjust the deformation amount of the spring piece to control the magnitude of the downward elastic force, so as to adjust the pressure applied to the chip when the probe contacts the chip and realize adjustable probe contact pressure. The abutting part abuts against the top surface of the assembly cavity to limit the lowest height of the probe when it does not contact the chip.

[0070] The above are only the embodiments of the present invention, and do not limit the patent scope of the present invention accordingly. All equivalent transformations made by using the content of the specification and drawings of the present invention, or directly or indirectly applied in related technical fields, are equally included in the patent protection scope of the present invention.

Claims

1. Chip test probe base, characterized in that, Comprising: A fixed seat, on which an assembly cavity is provided, and the assembly cavity communicates with one end face of the fixed seat; A mounting seat, which includes an assembly part, a connecting part and an abutting part connected in sequence. The connecting part and the abutting part are arranged in the assembly cavity, and the assembly part is exposed outside the fixed seat; A probe, which is mounted on the assembly part; A shrapnel, one end of which is fixedly connected to the assembly part, and the other end of which is fixedly connected to the fixed seat; An adjusting bolt and an adjusting nut, the adjusting bolt sequentially penetrates through the connecting part and the top wall of the fixed seat and is in mating connection with the adjusting nut; An elastic member, both ends of which respectively abut against the fixed seat and the adjusting nut to drive the adjusting nut to move away from the fixed seat.

2. The chip test probe base according to claim 1, characterized in that: The elastic member is sleeved on the adjusting bolt.

3. The chip test probe base according to claim 1, characterized in that: The elastic member is a spring, a shrapnel or a spring washer.

4. The chip test probe base according to claim 1, wherein: An adjusting member is provided on the fixed seat, and the adjusting member is vertically movable relative to the fixed seat, and the adjusting member is arranged above the abutting part.

5. The chip test probe base according to claim 4, wherein: External threads are provided on the adjusting member, and internal threads matching the external threads are provided on the fixed seat.

6. The chip test probe base according to claim 4, characterized in that: A detachable top block is provided on the abutting part, and the top block is used for abutting against the adjusting member.

7. The chip test probe base according to claim 1, characterized in that: It further includes a fixing column, one end of the fixing column is connected to the assembly part, the fixing column is provided with a mounting through hole, and the probe is inserted in the mounting through hole.

8. The chip test probe base according to claim 7, wherein: It further includes a movable block, the movable block is arranged on the fixing column and is slidable relative to the fixing column, and one end of the movable block abuts against the probe.

9. The chip test probe base according to claim 8, wherein: A groove is provided at one end of the movable block, and the probe passes through the groove.

10. The chip test probe base according to claim 1, characterized in that: A receiving hole is provided on the fixed seat, and the elastic member is inserted in the receiving hole.

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