Electric device and EMC testing device
By setting up a communication module and a feed circuit in the power consumption device to connect it with the EMC test device, it moves to detect the EMI signal and transmits electromagnetic interference signals, which solves the problem of tight EMC test site in the power consumption device, and achieves convenient EMC testing and cost reduction.
Patent Information
- Application Number
- CN202421520782.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-06-28
- Publication Date
- 2025-08-05
- Estimated Expiration
- 2034-06-28
AI Technical Summary
In the prior art, EMC testing of electrical devices needs to be carried out in a dedicated site, resulting in tight testing sites, affecting test progress and increasing costs.
The first communication module, a feeding circuit and a processor are arranged in the power consumption device, and are connected to the second communication module and the transceiver antenna of the EMC test device. The EMI signal is detected and processed by the mobile transceiver antenna, and the electromagnetic interference signal is transmitted using the feeding circuit to realize EMC testing.
It realizes convenient EMC testing, shortening design cycles and reducing testing costs.
Smart Images
Figure CN223193034U_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of electromagnetic detection technology, and in particular to an electrical device and an EMC testing device. Background Art
[0002] When powered on, electrical devices such as electrical control boxes may cause electromagnetic interference to the external environment, or they may be subject to electromagnetic interference from the external environment. Therefore, electromagnetic compatibility (EMC) testing is required before mass production and use. In related technologies, electrical devices must be tested at dedicated EMC testing sites. However, the limited availability of testing sites significantly impacts the progress of EMC testing and rectification, significantly lengthens the design cycle, and significantly increases costs. Utility Model Content
[0003] The embodiments of the present application provide an electrical device and an EMC testing device, which can conveniently perform EMC testing on the electrical device, effectively shortening the design cycle and reducing design and testing costs.
[0004] On the one hand, an embodiment of the present application provides an electrical device, comprising a first communication module and a feeding circuit and a processor respectively electrically connected to the first communication module, wherein the first communication module is suitable for communicating with an EMC testing device to input the EMI signal obtained when the EMC testing device detects the electrical device into the processor, or output the feeding signal of the feeding circuit to the EMC testing device so that the EMC testing device transmits an electromagnetic interference signal to the electrical device.
[0005] In some embodiments, the electrical device includes an alarm module, which is electrically connected to the processor. When the EMI signal is greater than a signal threshold, the processor controls the alarm module to alarm; the alarm module includes at least one of a buzzer, a warning light, and a display screen.
[0006] In some embodiments, the first communication module includes a first electrical connection terminal, which is suitable for being detachably electrically connected to the EMC testing device, and the first electrical connection terminal includes a first feeding pin and a first data transmission pin, the first feeding pin electrically connects the feeding circuit and the EMC testing device, and the first data transmission pin electrically connects the processor and the EMC testing device; and / or, the first communication module includes an interactive antenna, which is suitable for wireless communication with the EMC testing device.
[0007] In some embodiments, the electrical device further includes a first current limiting protection resistor, and the first current limiting protection resistor is arranged between the first communication module and the processor.
[0008] In some embodiments, the feeding circuit includes a positive pole, a ground pole, a first filter capacitor and a second filter capacitor. The first filter capacitor and the second filter capacitor are arranged in parallel between the positive pole and the ground pole. The first filter capacitor is a non-polarized capacitor and the second filter capacitor is a polarized capacitor.
[0009] On the other hand, an embodiment of the present application provides an EMC testing device, comprising an electrically connected second communication module and a transceiver antenna, wherein the transceiver antenna is configured to movably detect EMI signals in different areas on the electrical device to be tested, and to transmit electromagnetic interference signals to different areas on the electrical device to be tested when a feed signal is received; the second communication module is suitable for being communicatively connected with the electrical device to be tested so as to output the EMI signal detected by the transceiver antenna to the electrical device to be tested, or to receive the feed signal from the electrical device to be tested.
[0010] In some embodiments, the second communication module includes a second electrical connection terminal, which is suitable for detachably electrically connecting to the electrical device to be tested; and / or, the second communication module includes an interactive antenna, which is suitable for wireless communication with the electrical device to be tested.
[0011] In some embodiments, the EMC testing device includes a second current limiting protection resistor, and the second current limiting protection resistor is arranged between the second communication module and the transceiver antenna.
[0012] In some embodiments, the transceiver antenna is a half-wave dipole antenna.
[0013] In some embodiments, the EMC testing device further includes an antenna protection diode, and the antenna protection diode and the transceiver antenna are connected in series.
[0014] In an embodiment of the present application, a first communication module, a feeding circuit, and a processor are arranged on the electrical device to be tested, and an EMC testing device including a second communication module and a transceiver antenna is provided. The first communication module and the second communication module can be used to communicatively connect the electrical device and the EMC testing device, and then the transceiver antenna is used to movably detect EMI signals in different areas of the electrical device, the processor processes the EMI to determine the degree of electromagnetic interference of the electrical device to the external environment, and the feeding circuit is used to send a feeding signal to the transceiver antenna so that the transceiver antenna transmits an electromagnetic interference signal to the electrical device, thereby completing EMC testing of the electrical device including EMI testing and EMS testing. BRIEF DESCRIPTION OF THE DRAWINGS
[0015] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For those skilled in the art, other drawings can be obtained based on these drawings without creative work.
[0016] Figure 1 This is a diagram showing the connection structure of an electrical device and an EMC testing device provided in some embodiments of the present application;
[0017] Figure 2 This is a circuit schematic diagram of an electrical device and an EMC testing device provided in some embodiments of the present application;
[0018] Figure 3 yes Figure 2 Partial structural diagram of the electrical device;
[0019] Figure 4 yes Figure 2 Circuit structure diagram of the EMC test device.
[0020] Description of main component symbols:
[0021] 1-power consumption device, 11-first communication module, 12-feeding circuit, 13-processor, 2-EMC testing device, 21-second communication module, 22-transceiver antenna. DETAILED DESCRIPTION
[0022] The following will be combined with the drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without making creative efforts are within the scope of protection of this application.
[0023] In the description of the present application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the present application. In addition, the terms "first" and "second" are used for descriptive purposes only and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the said features. In the description of the present application, "multiple" means two or more, unless otherwise clearly and specifically defined.
[0024] “A and / or B” includes the following three combinations: A only, B only, and a combination of A and B.
[0025] The use of "suitable for" or "configured to" in this application is intended to be open and inclusive language, and does not exclude devices that are adapted or configured to perform additional tasks or steps. In addition, the use of "based on" is intended to be open and inclusive, as a process, step, calculation, or other action that is "based on" one or more stated conditions or values may, in practice, be based on additional conditions or values beyond those stated.
[0026] In this application, the word "exemplary" is used to mean "serving as an example, illustration, or illustration." Any embodiment described in this application as "exemplary" is not necessarily to be construed as preferred or advantageous over other embodiments. The following description is given to enable any person skilled in the art to implement and use the present application. In the following description, details are listed for the purpose of explanation. It should be understood that one of ordinary skill in the art can recognize that the present application can be implemented without using these specific details. In other instances, well-known structures and processes are not elaborated in detail to avoid obscuring the description of the present application with unnecessary details. Therefore, the present application is not intended to be limited to the embodiments shown, but is consistent with the widest scope consistent with the principles and features disclosed in this application.
[0027] like Figures 1 to 4As shown, on the one hand, the embodiment of the present application provides an electrical device 1 and an EMC testing device 2, which can conveniently perform EMC testing on the electrical device 1, effectively shortening the design cycle and reducing the design and testing costs. The type of the electrical device 1 can be determined according to actual needs. It can be a basic unit such as a printed circuit board assembly, or a control device such as an electric control box or a control box, or an electronic device such as a smart terminal. The embodiment of the present application is not limited to this. It is understood that the electrical device 1 also includes a main functional circuit module / main electrical components / main electronic devices for realizing its main functions.
[0028] The electrical device 1 includes a first communication module 11, a feeding circuit 12, and a processor 13. The feeding circuit 12 and the processor 13 are respectively electrically connected to the first communication module 11. The first communication module 11 is adapted to communicate with the EMC test device 2 to input the EMI signal obtained when the EMC test device 2 detects the electrical device 1 into the processor 13, or to output the feeding signal of the feeding circuit 12 to the EMC test device 2 so that the EMC test device 2 transmits the electromagnetic interference signal to the electrical device 1.
[0029] Here, the processor 13 can be a main processor 13 on the electrical device 1 for implementing its main functions, or it can be independently provided from the main processor 13 and specifically used for processing EMI signals. The type of processor 13 can be determined according to actual needs, and can be, for example, a microprocessor 13, an IC chip, a single-chip microcomputer, etc., and this embodiment of the application is not limited to this.
[0030] The EMC test device 2 includes a second communication module 21 and a transceiver antenna 22, which are electrically connected. The transceiver antenna 22 can receive and transmit wireless signals and is configured to removably detect EMI signals from different areas of the electrical device 1 under test, and to transmit electromagnetic interference signals to different areas of the electrical device 1 under test when receiving a feed signal. The second communication module 21 is adapted to be communicatively connected to the electrical device 1 under test to output the EMI signals detected by the transceiver antenna 22 to the electrical device 1 under test, or to receive a feed signal from the electrical device 1 under test.
[0031] Here, the first communication module 11 and the second communication module 21 are suitable for communication connection, so that the electrical device 1 can be communicatively connected with the EMC testing device 2. Before performing EMC testing on the electrical device 1 to be tested, the first communication module 11 and the second communication module 21 can be communicatively connected, and the electrical device 1 can be powered on to work. When it is necessary to perform EMI testing on the electrical device 1 to be tested, the transceiver antenna 22 can be moved through different areas of the electrical device 1 to detect EMI signals in different areas of the electrical device 1, and the EMI signals are output to the processor 13 of the electrical device 1 through the second communication module 21 and the first communication module 11. The EMI signals are processed by the processor 13 to determine the degree of electromagnetic interference of the electrical device 1 to the external environment, thereby completing the EMI test. When it is necessary to perform an EMS test on the electrical device 1 to be tested, the feeding circuit 12 can send a feeding signal, which is output to the transceiver antenna 22 through the first communication module 11 and the second communication module 21, so that the transceiver antenna 22 transmits an electromagnetic interference signal to the electrical device 1, thereby testing the radiation immunity of the electrical device 1; here, the transceiver antenna 22 can also be moved to different positions of the electrical device 1 to achieve a comprehensive test of the radiation immunity of the electrical device 1 in different directions.
[0032] Compared with the related art, the embodiment of the present application sets a first communication module 11, a feeding circuit 12 and a processor 13 on the electrical device 1 to be tested, and provides an EMC testing device 2 including a second communication module 21 and a transceiver antenna 22. The first communication module 11 and the second communication module 21 can be used to communicate with the electrical device 1 and the EMC testing device 2, and then the transceiver antenna 22 is used to movably detect EMI signals in different areas of the electrical device 1, the processor 13 processes the EMI to determine the electromagnetic interference degree of the electrical device 1 to the external environment, and the feeding circuit 12 is used to send a feeding signal to the transceiver antenna 22, so that the transceiver antenna 22 transmits an electromagnetic interference signal to the electrical device 1, thereby completing the EMC test of the electrical device 1 including EMI test and EMS test.
[0033] In some embodiments, the electrical device 1 may include an alarm module. The alarm module is electrically connected to the processor 13. When the EMI signal is greater than the signal threshold, the processor 13 controls the alarm module to alarm to prompt that the electromagnetic interference of the electrical device 1 to be tested to the external environment does not meet the standard and needs to be rectified. The alarm mode of the alarm module can be determined according to actual needs, and can adopt types such as sound alarm, light alarm, information display alarm, etc., which are not limited in the embodiments of the present application. In some examples, the alarm module may include at least one of a buzzer, a warning light, and a display screen to achieve the corresponding alarm purpose.
[0034] The communication connection method of the first communication module 11 and the second communication module 21 can be determined according to actual needs, and can adopt types such as wireless communication connection method and wired communication connection method, which are not limited in the embodiments of the present application. In some embodiments, the first communication module 11 and the second communication module 21 can adopt a wired communication connection method; here, the first communication module 11 can include a first electrical connection terminal, which is suitable for detachably electrically connecting to the EMC test device 2; accordingly, the second communication module 21 can include a second electrical connection terminal, which is suitable for detachably electrically connecting to the electrical device to be tested 1, specifically, the first electrical connection terminal. Here, the first electrical connection terminal can include a first feed pin and a first data transmission pin, the first feed pin electrically connecting the feed circuit 12 and the EMC test device 2, and the first data transmission pin electrically connecting the processor 13 and the EMC test device 2. The number of first data transmission pins can be determined according to actual needs, which is not limited in the embodiments of the present application.
[0035] In some examples, the first electrical connection terminal may include an enable signal input pin, which is electrically connected to the EMC test device 2 and the processor 13. When the EMC test device 2 is enabled to perform EMI testing, the enable signal input pin can receive an enable signal and input it to the processor 13, causing the first data transmission pin to begin receiving the EMI signal, thereby implementing switch control. In some examples, the first data transmission pin may be connected to a third filter capacitor C8, with one end of the third filter capacitor C8 connected between the first data transmission pin and the processor 13 and the other end connected to ground.
[0036] In other embodiments, the first communication module 11 and the second communication module 21 can adopt a wireless communication connection method; here, the first communication module 11 may include a first interactive antenna, which is suitable for wireless communication with the EMC testing device 2; accordingly, the second communication module 21 includes a second interactive antenna, which is suitable for wireless communication with the electrical device 1 to be tested, specifically the first interactive antenna.
[0037] In some embodiments, the electrical device 1 may further include first current-limiting protection resistors R80 / R81. These resistors may be disposed between the first communication module 11 and the processor 13 to provide current-limiting protection for the processor 13, preventing overload and damage to the processor 13 caused by excessive EMI signals input from the first communication module 11. When the first electrical connection terminal includes a first data transmission pin, at least one first current-limiting protection resistor R80 / R81 may be disposed between each first data transmission pin and the processor 13.
[0038] In some embodiments, the feed circuit 12 may include a positive electrode, a ground electrode, a first filter capacitor, and a second filter capacitor. The first filter capacitor and the second filter capacitor are arranged in parallel between the positive electrode and the ground electrode for filtering. The types of the first filter capacitor and the second filter capacitor can be determined according to actual needs, and the embodiments of the present application are not limited to this; in some examples, the first filter capacitor can be a non-polarized capacitor C10, and the second filter capacitor can be a polarized capacitor E3, and the positive electrode of the second filter capacitor is connected to the positive electrode of the feed circuit 12.
[0039] In some embodiments, the EMC testing device 2 includes second current-limiting protection resistors, namely R70 / R71. The second current-limiting protection resistors can be disposed between the second communication module 21 and the transceiver antenna 22 to provide current-limiting protection for the transceiver antenna 22, thereby preventing the feed signal input from the second communication module 21 from being excessive and causing overload damage to the processor 13. In some examples, the EMC testing device 2 can include at least two second current-limiting protection resistors, namely R70 and R71, disposed at both ends of the transceiver antenna 22.
[0040] The type of the transceiver antenna 22 can be determined according to actual needs and is not limited in the present embodiment. In some embodiments, the transceiver antenna 22 can be a half-wave dipole antenna.
[0041] In some embodiments, the EMC test device 2 may further include an antenna protection diode D12. The antenna protection diode D12 is connected in series with the transceiver antenna 22 to achieve unidirectional conduction, thereby providing safety protection for the transceiver antenna 22. In some examples, the EMC test device 2 may include a second current-limiting protection resistor. The antenna protection diode D12 may be disposed between the transceiver antenna 22 and the second current-limiting protection resistor, i.e., R70. Exemplarily, the EMC test device 2 may further include a fourth filter capacitor C9, one end of which is connected between the antenna protection diode D12 and the second current-limiting protection resistor, i.e., R70, and the other end of which is grounded.
[0042] The above is a detailed introduction to the electrical device and EMC testing device provided in the embodiments of the present application. Specific examples are used herein to illustrate the principles and implementation methods of the present application. The description of the above embodiments is only used to help understand the method and core idea of the present application. At the same time, for those skilled in the art, based on the ideas of the present application, there may be changes in the specific implementation methods and application scope. In summary, the content of this specification should not be understood as a limitation on the present application.
Claims
1. An electrical device, characterized in that: The device comprises a first communication module and a feeding circuit and a processor respectively electrically connected to the first communication module. The first communication module is suitable for communicating with an EMC testing device to input an EMI signal obtained when the EMC testing device detects the electrical device into the processor, or output a feeding signal of the feeding circuit to the EMC testing device so that the EMC testing device transmits an electromagnetic interference signal to the electrical device.
2. The electrical device according to claim 1, characterized in that: The electrical device includes an alarm module, which is electrically connected to the processor. When the EMI signal is greater than a signal threshold, the processor controls the alarm module to alarm; the alarm module includes at least one of a buzzer, a warning light and a display screen.
3. The electrical device according to claim 1, characterized in that: The first communication module includes a first electrical connection terminal, which is suitable for being detachably electrically connected to the EMC testing device. The first electrical connection terminal includes a first feeding pin and a first data transmission pin. The first feeding pin is electrically connected to the feeding circuit and the EMC testing device, and the first data transmission pin is electrically connected to the processor and the EMC testing device. And / or, the first communication module includes an interactive antenna, which is suitable for wireless communication with the EMC testing device.
4. The electrical device according to claim 1, characterized in that: The electrical device further includes a first current limiting protection resistor, which is arranged between the first communication module and the processor.
5. The electrical device according to claim 1, characterized in that: The feeding circuit includes a positive electrode, a ground electrode, a first filter capacitor and a second filter capacitor. The first filter capacitor and the second filter capacitor are arranged in parallel between the positive electrode and the ground electrode. The first filter capacitor is a non-polarized capacitor and the second filter capacitor is a polarized capacitor.
6. An EMC testing device, characterized in that: It includes an electrically connected second communication module and a transceiver antenna, wherein the transceiver antenna is configured to movably detect EMI signals in different areas of the electrical device to be tested, and to transmit electromagnetic interference signals to different areas of the electrical device to be tested when a feed signal is received; the second communication module is suitable for being communicatively connected with the electrical device to be tested, so as to output the EMI signal detected by the transceiver antenna to the electrical device to be tested, or to receive the feed signal from the electrical device to be tested.
7. The EMC testing device according to claim 6, characterized in that: The second communication module includes a second electrical connection terminal, which is suitable for detachably electrically connecting to the electrical device to be tested; and / or the second communication module includes an interactive antenna, which is suitable for wireless communication with the electrical device to be tested.
8. The EMC testing device according to claim 6, characterized in that: The EMC testing device includes a second current limiting protection resistor, which is arranged between the second communication module and the transceiver antenna.
9. The EMC testing device according to claim 6, characterized in that: The transceiver antenna is a half-wave dipole antenna.
10. The EMC testing device according to claim 6, characterized in that: The EMC testing device further includes an antenna protection diode, and the antenna protection diode and the transceiver antenna are connected in series.