Inspection machine capable of being used for chip detection
Through the combination of the vacuum cleaner and the rotating mechanism, the problem that the existing chip detection device cannot detect and clean up dust in all aspects is solved, and high accuracy and all-round chip detection is achieved.
Patent Information
- Application Number
- CN202422337841.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-25
- Publication Date
- 2025-08-05
- Estimated Expiration
- 2034-09-25
AI Technical Summary
The existing chip detection device cannot be fully inspected and cannot clean up dust and impurities, resulting in incorrect detection results.
The combination of a vacuum cleaner, a suction nozzle and a collection box is used to suck out the dust on the chip, and the stable clamping and rotation of the chip is achieved through the coordination of the motor, screw, slider, rotating shaft, fixture and connecting rod, and adapt to different detection devices.
Improve the accuracy and reliability of the inspection, ensure that defects in each perspective and direction are identified, prevent welding slag residue from remaining, and achieve comprehensive inspection.
Smart Images

Figure CN223193070U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of chip detection, in particular to an inspection machine that can be used for chip detection. Background Art
[0002] A chip is a silicon wafer of an integrated circuit, which is widely used in computers, mobile phones, home appliances, etc. It is very small and has many pins connected at the bottom. When it is produced and used, an inspection machine is needed to detect whether it is qualified. Existing devices can usually only detect the chip by scanning, and cannot flip the chip for comprehensive inspection. For example, China has disclosed "an inspection machine that can be used for chip inspection", and its application number is: "CN202320627006.6". It sets up a detection mechanism and uses a card slot. The pins of the core block are inserted into the pin holes in the card slot, which facilitates the placement of the core block and reduces damage to the core block pins. However, it cannot clean the dust on the chip to prevent dust and impurities from interfering with the detection equipment and causing erroneous results. It cannot drive the chip to rotate, adapt to different detection devices, and cannot make the chip rotate at different angles to achieve comprehensive detection. Utility Model Content
[0003] The purpose of the present utility model is to solve at least one of the technical problems existing in the prior art, and to provide an inspection machine that can be used for chip detection. Through the cooperation of a vacuum cleaner, a suction nozzle and a collection box, dust on the chip can be absorbed to prevent dust and impurities from interfering with the detection equipment and causing erroneous results, which can significantly improve the accuracy and reliability of the detection; through the cooperation of a motor, a screw rod, a slider, a rotating shaft, a clamp and a connecting rod, the chip can be stably clamped and driven to rotate, adapting to different detection devices, and the chip can be rotated at different angles, thereby achieving comprehensive detection, ensuring that defects from all angles and directions can be identified, improving the comprehensiveness of the detection, and can be better cleaned to prevent welding slag residue.
[0004] The utility model also provides the above-mentioned inspection machine that can be used for chip detection, comprising: a bottom plate, the upper surface of the bottom plate is fixedly connected to a support frame, the rear surface of the support frame is fixedly connected to a mounting base, the outer surface of the mounting base is fixedly connected to a motor, the output end of the motor is fixedly connected to a screw rod, a slider is threadedly connected to the screw rod, the outer surface of the slider is rotatably connected to a rotating shaft, the outer surface of the rotating shaft is fixedly connected to a connecting rod, the end of the connecting rod away from the rotating shaft is fixedly connected to a clamp, the upper surface of the support frame is fixedly connected to a vacuum cleaner, the input end of the vacuum cleaner is fixedly connected to a suction nozzle, and the upper surface of the support frame is fixedly connected to the upper surface of the support frame. A collection box is fixedly connected to the surface, and a detection device is fixedly connected to the upper surface of the base plate. Through the cooperation of the vacuum cleaner, the suction nozzle and the collection box, the dust on the chip can be absorbed to prevent dust and impurities from interfering with the detection equipment and causing erroneous results, which can significantly improve the accuracy and reliability of the detection; through the cooperation of the motor, the lead screw, the slider, the rotating shaft, the clamp and the connecting rod, the chip can be stably clamped and driven to rotate, adapting to different detection devices, and the chip can be rotated at different angles, thereby realizing comprehensive detection, ensuring that defects from all angles and directions can be identified, improving the comprehensiveness of the detection, and can be better cleaned to prevent welding slag residue.
[0005] According to the inspection machine that can be used for chip detection described in the utility model, a groove is provided on the support frame, and the screw rod is located in the groove, which can effectively protect the screw rod structure and extend the service life.
[0006] According to the inspection machine that can be used for chip detection described in the utility model, a fixed block is fixedly connected in the slot, and the fixed block is rotatably connected to the screw rod, which can ensure the other end of the screw rod and ensure the stability of the screw rod connection structure.
[0007] According to the inspection machine that can be used for chip detection described in the utility model, the output end of the vacuum cleaner is fixedly connected to a conveying pipe, and the other end of the conveying pipe is fixedly connected to a collection box, so that the collected dust can be transported in an orderly manner.
[0008] According to the inspection machine that can be used for chip detection described in the utility model, a drawer is provided in the collection box, and a baffle is fixedly connected to the outer surface of the drawer, which can place collected dust for subsequent cleaning.
[0009] According to the inspection machine for chip detection described in the utility model, the baffle is movably connected to the collection box, and a handle is fixedly connected to the outer surface of the baffle, which can facilitate staff to clean the collected dust.
[0010] According to the inspection machine that can be used for chip detection described in the utility model, the inner top surface of the support frame is fixedly connected with a slot, and the suction nozzle is located in the slot, which can protect the suction nozzle and prevent it from affecting the operation of other equipment.
[0011] According to the inspection machine that can be used for chip detection described in the utility model, the suction nozzle is fixedly connected to the support frame, and the detection device includes an automatic optical detection machine, a probe test machine, and an X-ray detection machine, which can perform more comprehensive detection.
[0012] Beneficial effects
[0013] 1. Compared with the existing technology, this new inspection machine that can be used for chip testing can absorb dust on the chip through the cooperation of the vacuum cleaner, suction nozzle and collection box, preventing dust and impurities from interfering with the detection equipment and causing erroneous results, which can significantly improve the accuracy and reliability of the detection.
[0014] 2. Compared with the existing technology, this new inspection machine that can be used for chip detection can stably clamp the chip and drive it to rotate through the cooperation of the motor, screw, slider, rotating shaft, clamp and connecting rod. It can adapt to different detection devices and can rotate the chip at different angles, thereby achieving comprehensive detection and ensuring that defects from all angles and directions can be identified, improving the comprehensiveness of detection, and can better clean and prevent welding slag residue. BRIEF DESCRIPTION OF THE DRAWINGS
[0015] The present invention will be further described below with reference to the accompanying drawings and embodiments;
[0016] Figure 1 This is a bottom view of the structure of the inspection machine that can be used for chip inspection according to the present invention;
[0017] Figure 2 This is a top view of the structure of the inspection machine that can be used for chip inspection according to the present invention;
[0018] Figure 3 This is a side structural diagram of the inspection machine that can be used for chip inspection according to the present invention;
[0019] Figure 4 The utility model is a testing machine that can be used for chip testing. Figure 1 Enlarged structural diagram at point A in the middle.
[0020] Legend:
[0021] 1. Bottom plate; 2. Support frame; 3. Mounting base; 4. Motor; 5. Screw; 6. Slider; 7. Rotating shaft; 8. Connecting rod; 9. Clamp; 10. Vacuum cleaner; 11. Suction nozzle; 12. Collection box; 13. Detection device. DETAILED DESCRIPTION
[0022] This section will describe in detail the specific embodiments of the present invention. The preferred embodiments of the present invention are shown in the accompanying drawings. The purpose of the accompanying drawings is to supplement the description of the text part of the specification with graphics, so that people can intuitively and vividly understand each technical feature and overall technical solution of the present invention, but it cannot be understood as a limitation on the scope of protection of the present invention.
[0023] Reference Figure 1-4 The present invention provides an inspection machine for chip detection, which includes: a base plate 1 for fixing and supporting the entire device; a support frame 2 is fixedly connected to the upper surface of the base plate 1 for fixing and supporting a partial structure; a mounting base 3 is fixedly connected to the rear surface of the support frame 2 for mounting and fixing a motor 4; a motor 4 is fixedly connected to the outer surface of the mounting base 3 for providing power to a screw rod 5; a screw rod 5 is fixedly connected to the output end of the motor 4 for sliding a slider 6; a slider 6 is threadedly connected to the screw rod 5 for driving a fixture 9 to slide; the outer surface of the slider 6 The surface is rotatably connected to a rotating shaft 7 for rotating a clamp 9, the outer surface of the rotating shaft 7 is fixedly connected to a connecting rod 8 for connecting the rotating shaft 7 and the clamp 9, the end of the connecting rod 8 away from the rotating shaft 7 is fixedly connected to the clamp 9 for fixing and clamping the chip, the upper surface of the support frame 2 is fixedly connected to a vacuum cleaner 10, the input end of the vacuum cleaner 10 is fixedly connected to a suction nozzle 11 for absorbing dust, the upper surface of the support frame 2 is fixedly connected to a collecting box 12 for placing collected dust, and the upper surface of the base plate 1 is fixedly connected to a detection device 13 for detecting the chip.
[0024] A groove is provided on the support frame 2, and the screw rod 5 is located in the groove for protecting the screw rod 5. A fixed block is fixedly connected in the slot, and the fixed block is rotatably connected to the screw rod 5 for supporting the other end of the screw rod 5. The output end of the vacuum cleaner 10 is fixedly connected with a conveying pipe for conveying collected dust, and the other end of the conveying pipe is fixedly connected to the collection box 12 for placing the collected dust. A drawer is provided in the collection box 12 for taking out the collected dust, and the outer surface of the drawer is fixedly connected with a baffle for limiting the position of the drawer, and the baffle is movably connected to the collection box 12. The outer surface of the baffle is fixedly connected with a handle for pulling out the drawer, and the inner top surface of the support frame 2 is fixedly connected with a slot, and the suction nozzle 11 is located in the slot for protecting the suction nozzle 11, and the suction nozzle 11 is fixedly connected to the support frame 2 for fixing the suction nozzle 11. The detection device 13 includes an automatic optical detection machine, a probe testing machine, and an X-ray detection machine.
[0025] Working principle: When in use, the chip is clamped by the clamp 9, and then the motor 4 on the mounting base 3 rotates the screw 5, and then the slider 6 slides on the screw 5, driving the clamp 9 and the chip to move under the suction nozzle 11, and then the rotating shaft 7 rotates the connecting rod 8 to drive the clamp 9 and the chip vertically to remove any welding slag that may exist on the chip, and then the vacuum cleaner 10 absorbs the dust on the chip through the suction nozzle 11, and then the slider 6 slides on the screw 5, driving the chip to the detection device 13 for detection.
[0026] The embodiments of the present invention are described in detail above with reference to the accompanying drawings. However, the present invention is not limited to the above embodiments. Various changes can be made within the scope of knowledge possessed by ordinary technicians in the relevant technical field without departing from the purpose of the present invention.
Claims
1. An inspection machine that can be used for chip testing, characterized in that: include: A base plate (1) is provided, wherein the upper surface of the base plate (1) is fixedly connected to a support frame (2), the rear surface of the support frame (2) is fixedly connected to a mounting base (3), the outer surface of the mounting base (3) is fixedly connected to a motor (4), the output end of the motor (4) is fixedly connected to a screw rod (5), a slider (6) is threadedly connected to the screw rod (5), the outer surface of the slider (6) is rotatably connected to a rotating shaft (7), the outer surface of the rotating shaft (7) is fixedly connected to a connecting rod (8), the end of the connecting rod (8) away from the rotating shaft (7) is fixedly connected to a clamp (9), the upper surface of the support frame (2) is fixedly connected to a vacuum cleaner (10), the input end of the vacuum cleaner (10) is fixedly connected to a suction nozzle (11), the upper surface of the support frame (2) is fixedly connected to a collection box (12), and the upper surface of the base plate (1) is fixedly connected to a detection device (13).
2. The inspection machine for chip detection according to claim 1, characterized in that: The support frame (2) is provided with a groove, and the screw rod (5) is located in the groove.
3. The inspection machine for chip detection according to claim 2, characterized in that: A fixing block is fixedly connected in the groove, and the fixing block is rotationally connected to the screw rod (5).
4. The inspection machine for chip detection according to claim 1, characterized in that: The output end of the vacuum cleaner (10) is fixedly connected to a delivery pipe, and the other end of the delivery pipe is fixedly connected to a collection box (12).
5. The inspection machine for chip inspection according to claim 1, characterized in that: A drawer is provided in the collection box (12), and a baffle is fixedly connected to the outer surface of the drawer.
6. The inspection machine for chip inspection according to claim 5, characterized in that: The baffle is movably connected to the collection box (12), and a handle is fixedly connected to the outer surface of the baffle.
7. The inspection machine for chip inspection according to claim 1, characterized in that: The inner top surface of the support frame (2) is fixedly connected with a slot, and the suction nozzle (11) is located in the slot.
8. The inspection machine for chip inspection according to claim 1, characterized in that: The suction nozzle (11) is fixedly connected to the support frame (2), and the detection device (13) includes an automatic optical detection machine, a probe testing machine, and an X-ray detection machine.
Citation Information
Patent Citations
Inspection machine capable of being used for chip detection
CN219201720U