Power supply rapid switching circuit for photovoltaic panel bypass diode thermal escape test

Abstract

The utility model discloses a power supply rapid switching circuit for a photovoltaic panel bypass diode thermal escape test, and relates to the technical field of switching circuits. The power supply rapid switching circuit for the photovoltaic panel bypass diode thermal escape test comprises a power supply A and a power supply B which are isolated from each other, and further comprises four parts, namely a K1-change-over switch, a JQ1-double-pole double-throw relay, a JQ2-normally open relay and a JQ3-normally open relay. According to the power supply rapid switching circuit for the photovoltaic panel bypass diode thermal escape test, rapid and reliable switching between the power supply A and the power supply B is ensured, meanwhile, accurate control over the switching process is achieved through logic control of the relay, and when performance tests of a photovoltaic panel under different power supply conditions need to be simulated, the performance of the photovoltaic panel can be simulated through rapid switching of the power supplies. And reliability and stability of the bypass diode can be evaluated conveniently.

Description

Technical Field

[0001] The utility model relates to the technical field of switching circuits, in particular to a power supply fast switching circuit for thermal runaway testing of a photovoltaic panel bypass diode. Background Art

[0002] Power switching tests assess the thermal stability of bypass diodes under extreme conditions such as high temperature and high current. When a diode switches from forward conduction to reverse blocking instantaneously, significant heat is generated internally. If the diode's heat dissipation performance is poor or it cannot withstand this temperature change, thermal runaway may occur.

[0003] In the prior art, the power switching test has a complex structure, high cost, and slow switching speed. Therefore, when performing a thermal runaway test on a photovoltaic panel bypass diode, the test effect on the bypass diode is unstable. The traditional test method requires multiple times and a long time to observe the performance changes of the diode under the condition of rapid power switching. In view of the shortcomings of the prior art, the present invention provides a power fast switching circuit for the thermal runaway test of the photovoltaic panel bypass diode to solve the above problems. Utility Model Content

[0004] In response to the shortcomings of the existing technology, the utility model provides a power fast switching circuit for thermal runaway testing of photovoltaic panel bypass diodes. It has a simple structure and low cost, ensures fast and reliable switching between power supply A and power supply B, and realizes precise control of the switching process through the logic control of the relay. When it is necessary to simulate the performance test of the photovoltaic panel under different power supply conditions, by quickly switching the power supply, the response and performance of the photovoltaic panel under different power supply conditions can be efficiently observed and recorded, thereby evaluating the reliability and stability of the bypass diode.

[0005] To achieve the above objectives, the present invention is implemented through the following technical solutions: a power supply fast switching circuit for thermal runaway test of photovoltaic panel bypass diodes includes two sets of mutually isolated power supplies A and B, and the power supply fast switching circuit also includes four parts, namely K1-switch, JQ1-double-pole double-throw relay, JQ2-normally open relay and JQ3-normally open relay;

[0006] The K1-switching switch is connected to the JQ1-double-pole double-throw relay, and the K1-switching switch controls the coil power-on state of the JQ1-double-pole double-throw relay;

[0007] The JQ1-double-pole double-throw relay is connected to the JQ2-normally open relay, and the JQ2-normally open relay is connected to the JQ3-normally open relay;

[0008] The K1-switching switch is connected between the power supply A and the JQ1-double-pole double-throw relay, the JQ3-normally open relay is connected between the power supply B and the device under test, and the JQ3-normally open relay is connected to the device under test.

[0009] Preferably, the K1-switch includes two states: open and closed.

[0010] Preferably, the JQ1-DPDT relay has a group of normally closed contacts and a group of normally open contacts, and there is a switching function between the normally closed contacts and the normally open contacts. When the JQ1-DPDT relay is energized, the normally closed contacts are disconnected and the normally open contacts are closed.

[0011] Preferably, the JQ2-normally open relay is provided with a contact group, which remains in an open state when the JQ2-normally open relay is not energized, and the contacts are closed when the JQ2-normally open relay is energized.

[0012] Preferably, the JQ3-normally open relay is provided with a normally open contact group, and when the JQ3-normally open relay is energized, the contacts are closed.

[0013] The utility model discloses a power supply fast switching circuit for thermal runaway testing of photovoltaic panel bypass diodes, which has the following beneficial effects:

[0014] This fast power switching circuit for thermal runaway testing of photovoltaic panel bypass diodes has a simple structure and low cost, ensuring fast and reliable switching between power sources A and B. At the same time, precise control of the switching process is achieved through relay logic control. When it is necessary to simulate the performance test of photovoltaic panels under different power conditions, by quickly switching the power supply, the response and performance of the photovoltaic panel under different power conditions can be efficiently observed and recorded, thereby evaluating the reliability and stability of the bypass diode. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0016] Figure 1 This is a schematic diagram of the circuit structure of the utility model. DETAILED DESCRIPTION

[0017] To make the purpose, technical solutions, and advantages of the embodiments of the present invention more clear, the technical solutions in the embodiments of the present invention are clearly and completely described. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making any creative efforts are within the scope of protection of the present invention.

[0018] The embodiment of the present application solves the problem in the prior art that the power switching test has a complex structure, high cost, and slow switching speed by providing a power fast switching circuit for the thermal runaway test of the photovoltaic panel bypass diode. Therefore, when performing the thermal runaway test of the photovoltaic panel bypass diode, the test effect of the bypass diode is unstable. The traditional test method requires multiple times and a long time to observe the performance changes of the diode under the condition of fast power switching.

[0019] In order to better understand the above technical solution, the above technical solution will be described in detail below with reference to the accompanying drawings and specific implementation methods.

[0020] The utility model discloses a power supply fast switching circuit for thermal runaway test of photovoltaic panel bypass diode. Figure 1 As shown, it consists of K1-switch, JQ1-DPDT relay, two normally open relays, and power supply A and power supply B. The two normally open relays are JQ2-normally open relay and JQ3-normally open relay. The following are the specific components and connection methods:

[0021] The circuit consists of the following parts:

[0022] K1-switch is a switch that controls the entire switching process and can be controlled manually or automatically. K1-switch has two states: open and closed.

[0023] JQ1-DPDT relay has two switchable contact groups: one group of normally closed contacts and one group of normally open contacts; when the JQ1-DPDT relay is energized, the normally closed contacts are disconnected and the normally open contacts are closed.

[0024] The JQ2-normally open relay has only one contact group, and this contact group remains open when the JQ2-normally open relay is not energized; when the JQ2-normally open relay is energized, the contacts are closed.

[0025] The JQ3-normally open relay is similar to the JQ2-normally open relay and also has a normally open contact group. When the JQ3-normally open relay is energized, the contacts are closed.

[0026] Power A and Power B represent two different power supplies, used to supply power to the device under test.

[0027] The closed or open state of the K1-switch controls whether the coil of the JQ1-DPDT relay is energized, thereby controlling the energization or release of the JQ1-DPDT relay. When the JQ1-DPDT relay is not energized, the normally closed contact group connects power supply A and the device under test, allowing power supply A to supply power to the device under test. The normally open contact group closes when the JQ1-DPDT relay is energized, providing a current path for the coil of the JQ2-NO relay. When closed, the normally open contact group of the JQ1-DPDT relay connects the coil of the JQ2-NO relay, causing the JQ2-NO relay to energize. When energized, the contact group of the JQ2-NO relay connects the coil of the JQ3-NO relay, causing the JQ3-NO relay to energize. When energized, the contact group of the JQ3-NO relay connects power supply B and the device under test, allowing power supply B to supply power to the device under test.

[0028] The workflow is as follows:

[0029] Initial state: K1-switch is off, JQ1-DPDT relay is not energized, normally closed contacts are closed, and power supply A supplies power to the device under test; JQ2-NO relay and JQ3-NO relay are both not energized, and power supply B is not supplying power.

[0030] Switching process:

[0031] Close the K1-switch, the JQ1-DPDT relay is energized, the normally closed contact is disconnected, and the power supply of power supply A is cut off.

[0032] The normally open contacts of the JQ1-double-pole double-throw relay are closed, providing current to the coil of the JQ2-normally open relay, causing the JQ2-normally open relay to be attracted.

[0033] The contacts of the JQ2-normally open relay are closed, providing current to the coil of the JQ3-normally open relay, causing the JQ3-normally open relay to also be attracted.

[0034] The contacts of the JQ3-normally open relay are closed, allowing Power Supply B to supply power to the device under test.

[0035] Switching completed: Power supply A is cut off and power supply B supplies power to the device under test.

[0036] The rapid power switching circuit for the photovoltaic panel bypass diode thermal runaway test ensures fast and reliable switching between power sources A and B. At the same time, precise control of the switching process is achieved through relay logic control. When it is necessary to simulate the performance test of the photovoltaic panel under different power conditions, by rapidly switching the power supply, the response and performance of the photovoltaic panel under different power conditions can be efficiently observed and recorded, thereby evaluating the reliability and stability of the bypass diode.

[0037] The above shows and describes the basic principles, main features and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The above embodiments and descriptions are merely illustrative of the principles of the present invention. Various changes and improvements may be made to the present invention without departing from the spirit and scope of the present invention. Such changes and improvements are intended to fall within the scope of the present invention. The scope of protection claimed in this invention is defined by the appended claims and their equivalents.

Claims

1. The power supply fast switching circuit for thermal runaway test of photovoltaic panel bypass diodes includes two sets of mutually isolated power supplies A and B, characterized by: The power fast switching circuit also includes 4 parts, which are K1-switch, JQ1-double-pole double-throw relay, JQ2-normally open relay and JQ3-normally open relay; The K1-switching switch is connected to the JQ1-double-pole double-throw relay, and the K1-switching switch controls the coil power-on state of the JQ1-double-pole double-throw relay; The JQ1-double-pole double-throw relay is connected to the JQ2-normally open relay, and the JQ2-normally open relay is connected to the JQ3-normally open relay; The K1-switching switch is connected between the power supply A and the JQ1-double-pole double-throw relay, the JQ3-normally open relay is connected between the power supply B and the device under test, and the JQ3-normally open relay is connected to the device under test.

2. The power fast switching circuit for thermal runaway test of photovoltaic panel bypass diode according to claim 1, characterized in that: The K1-switch includes two states: open and closed.

3. The power fast switching circuit for thermal runaway test of photovoltaic panel bypass diode according to claim 1, characterized in that: The JQ1-DPDT relay has a set of normally closed contacts and a set of normally open contacts. The normally closed contacts and the normally open contacts have a switching function. When the JQ1-DPDT relay is energized, the normally closed contacts are disconnected and the normally open contacts are closed.

4. The power fast switching circuit for thermal runaway test of photovoltaic panel bypass diodes according to claim 3, characterized in that: The JQ2-normally open relay is provided with a contact group, which remains in an open state when the JQ2-normally open relay is not energized, and the contacts are closed when the JQ2-normally open relay is energized.

5. The power fast switching circuit for thermal runaway test of photovoltaic panel bypass diodes according to claim 4, characterized in that: The JQ3-normally open relay is provided with a normally open contact group. When the JQ3-normally open relay is energized, the contacts are closed.

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