Building floor thickness testing device
By introducing support and ball brush assembly into the building floor thickness test device, the friction and wear problems caused by the direct contact between the receiving probe and the floor are solved, and stable slip and precise detection are achieved.
Patent Information
- Application Number
- CN202422468209.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-12
- Publication Date
- 2025-08-15
- Estimated Expiration
- 2034-10-12
AI Technical Summary
In the existing building floor thickness test device, the direct contact between the receiving probe and the floor end surface leads to high friction, affects slippage and is prone to wear, and reduces service life.
A building floor thickness test device is designed, using support members to support the receiving probe to form gap contact with the floor slab, and smooth slipping is ensured through ball and brush components to avoid wear.
The stable slip and detection accuracy of the receiving probe are achieved, extending the service life of the device and avoiding probe wear.
Smart Images
Figure CN223228977U_ABST
Abstract
Description
Technical Field
[0001] The utility model belongs to the technical field of floor slab thickness detection, in particular to a building floor slab thickness testing device. Background Art
[0002] The building floor thickness testing device is a device for detecting the thickness of floor slabs. With the advancement of technology, the thickness detection method has changed from the traditional drilling detection method to the ultrasonic detection method, which can avoid damaging the floor slab itself.
[0003] An ultrasonic detection device generally consists of a transmitting probe and a receiving probe. When in use, the transmitting probe and the receiving probe are placed on two opposite end faces of the floor slab, the transmitting probe is fixed, and then continuously moved to record the received data value. The smallest data value is the thickness of the floor slab; however, in actual use, the receiving probe is in direct contact with the end face of the floor slab, and there is friction between the two. On the one hand, it is not conducive to the overall sliding of the probe. On the other hand, the contact surface of the receiving probe is continuously worn during the overall sliding process, reducing its service life. Utility Model Content
[0004] The present invention addresses the problem in the prior art that the receiving probe is in direct contact with the end surface of the floor slab, resulting in friction between the two. This, on the one hand, is not conducive to the overall sliding of the receiving probe, and on the other hand, the contact surface is constantly worn during the overall sliding of the receiving probe, thus reducing the service life. A device for testing the thickness of building floor slabs is provided. The specific technical solution is as follows:
[0005] The present application provides a device for testing the thickness of building floor slabs, including a receiving probe, wherein the receiving probe includes a probe body and a handle installed above the probe body, a support member is provided on the side of the receiving probe, and the support member includes an "L"-shaped connecting rod connected to the probe body and a spherical cover connected to the other end of the "L"-shaped connecting rod, a supporting ball is rolled in the spherical cover, the lower edge of the supporting ball is higher than the lower edge of the spherical cover, the lower edge of the spherical cover is higher than the lower edge of the receiving probe, and there is a gap between the receiving probe and the floor slab.
[0006] As a further technical solution of the present invention, balls are provided on the inner wall of the spherical cover to roll, and the balls abut against the surface of the supporting ball and make point contact with it. The balls are provided in several groups and distributed along the trajectory of the spherical cover, and the several groups of balls form a spherical surface that supports the supporting ball.
[0007] As a further technical solution of the present invention, four groups of support members are provided, and the four groups of support members are arranged in pairs on any opposite sides of the receiving probe to form a rectangular support surface.
[0008] As a further technical solution of the present invention, a cleaning assembly is also provided outside the receiving probe, and the cleaning assembly includes a frame surrounding the outside of the support member and a brush connected to the bottom of the frame. The inner side of the frame is connected to a cross bar, and the other end of the cross bar is connected to the receiving probe.
[0009] As a further technical solution of the present invention, under normal conditions, the lower edge of the brush is lower than the lower edge of the support member.
[0010] The beneficial effects of the utility model are as follows:
[0011] (1) In the present application, the receiving probe is supported by a support member so that there is a gap between the receiving probe and the floor slab and the receiving probe is indirectly contacted by the support member. Since the height to which the receiving probe is supported by the support member is fixed, the detection result value is obtained by subtracting the height to which the receiving probe is supported. This does not affect the normal use of the device and avoids direct contact between the receiving probe and the floor slab, thereby avoiding wear of the receiving probe.
[0012] (2) In the present application, by surrounding the brush outside the support, the position where the support moves can be cleaned in advance, and obstacles on the moving track of the support can be removed to ensure that the sliding of the support is not disturbed and the detection accuracy is guaranteed. BRIEF DESCRIPTION OF THE DRAWINGS
[0013] Figure 1 Shows a schematic structural diagram of a building floor thickness testing device;
[0014] Figure 2 A schematic structural diagram of a receiving probe and a supporting member is shown;
[0015] Figure 3 A schematic structural diagram of the spherical cover, supporting balls and rolling balls is shown.
[0016] Legend:
[0017] 100, receiving probe; 110, probe body; 120, handle; 200, support member; 210, "L"-shaped connecting rod; 220, spherical cover; 230, supporting ball; 240, ball bearing; 300, cleaning assembly; 310, frame; 320, brush; 330, crossbar. DETAILED DESCRIPTION
[0018] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions of the present invention will be clearly and completely described below in conjunction with the embodiments.
[0019] In view of the problem that in the prior art, the receiving probe is in direct contact with the end face of the floor slab, and there is friction between the two, on the one hand, it is not conducive to the overall sliding of the probe, and on the other hand, the contact surface is constantly worn during the overall sliding of the probe, which reduces the service life; the present application provides a support member to force the receiving probe to indirectly contact the end face of the floor slab, eliminating the possibility of wear on the contact surface of the receiving probe, and at the same time making the support member roll relative to the floor slab surface to reduce the friction during the movement, which is conducive to the overall sliding of the receiving probe.
[0020] Figure 1 Shows a schematic structural diagram of a building floor thickness testing device; Figure 1 In the figure, the building floor thickness testing device includes a transmitting probe (not shown) and a receiving probe 100. The receiving probe 100 includes a probe body 110 and a handle 120 installed above the probe body 110. During use, the worker holds the handle 120 and slides it left and right to drive the overall movement of the receiving probe 100.
[0021] Figure 2 shows a schematic structural diagram of the receiving probe 100 and the support member 200; Figure 3 A schematic structural diagram of the spherical cover 220, the supporting ball 230 and the rolling ball 240 is shown; Figure 2 and Figure 3The spherical cover 220 is connected to the other end of the L-shaped connecting rod 210, and a support ball 230 is provided in the spherical cover 220. The lower edge of the support ball 230 is higher than the lower edge of the spherical cover 220, and the lower edge of the spherical cover 220 is higher than the lower edge of the receiving probe 100, so that there is a gap between the receiving probe 100 and the floor. The receiving probe 100 is supported by the support 200 so that there is a gap between the receiving probe 100 and the floor and indirectly contacted through the support 200. Since the height of the receiving probe 100 supported by the support 200 is fixed, the detection result value is obtained by subtracting the height of the receiving probe 100 being supported, which does not affect the normal use of the device and avoids direct contact between the receiving probe 100 and the floor to avoid wear of the receiving probe; the inner wall of the spherical cover 220 rolls The ball bearings 240 are provided in a movable manner, and the ball bearings 240 abut against the surface of the supporting ball 230 and make point contact with it. The ball bearings 240 are provided in several groups and distributed along the trajectory of the spherical cover 220. The several groups of ball bearings 240 form a spherical surface supporting the supporting ball 230. Through the several groups of ball bearings 240, a spherical supporting surface for supporting the supporting ball 230 can be formed, and the ball bearings 240 can roll relative to the supporting ball 230. When the supporting ball 230 rolls along the floor, it can rotate in any direction, thereby realizing the sliding of the receiving probe 100 in any direction. The support members 200 are provided in four groups, and the four groups of support members 200 are provided in pairs on any opposite sides of the receiving probe 100 and form a rectangular supporting surface. The four groups of support members 200 are distributed in pairs on the left and right sides or the front and back sides of the receiving probe 100. The four groups of support members 200 can form a rectangular supporting surface on the horizontal projection plane to ensure the stability of the receiving probe 100 after being propped up, so that the receiving probe 100 can be parallel to the floor.
[0022] Continue to see Figure 1 A cleaning assembly 300 is also provided outside the receiving probe 100. The cleaning assembly 300 includes a frame 310 surrounding the outside of the support 200 and a brush 320 connected to the bottom of the frame 310. The inner side of the frame 310 is connected to the cross bar 330, and the other end of the cross bar 330 is connected to the receiving probe 100. By surrounding the outside of the support 200, the position where the support 200 moves can be cleaned in advance, and obstacles on the moving trajectory of the support 200 can be removed to ensure that the sliding of the support 200 is not disturbed and the detection accuracy is guaranteed. Under normal circumstances, the lower edge of the brush 320 is lower than the lower edge of the support 200. In this way, in the working state, the brush 320 can be squeezed and bent, and can fully contact the floor slab, thereby ensuring the cleaning effect of the brush 320.
[0023] The above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit the same.
Claims
1. A building floor thickness testing device, comprising a receiving probe (100), wherein the receiving probe (100) comprises a probe body (110) and a handle (120) mounted above the probe body (110), characterized in that: A support member (200) is provided on the side of the receiving probe (100), and the support member (200) includes an "L"-shaped connecting rod (210) connected to the probe body (110) and a spherical cover (220) connected to the other end of the "L"-shaped connecting rod (210). A supporting ball (230) is provided in the spherical cover (220) for rolling. The lower edge of the supporting ball (230) is higher than the lower edge of the spherical cover (220). The lower edge of the spherical cover (220) is higher than the lower edge of the receiving probe (100). There is a gap between the receiving probe (100) and the floor.
2. The building floor thickness testing device according to claim 1, characterized in that: The inner wall of the spherical cover (220) is provided with rolling balls (240), the rolling balls (240) abut against the surface of the supporting ball (230) and make point contact therewith, the rolling balls (240) are provided in a plurality of groups and distributed along the trajectory of the spherical cover (220), and the plurality of groups of the rolling balls (240) form a spherical surface supporting the supporting ball (230).
3. The building floor thickness testing device according to claim 2, characterized in that: The support members (200) are provided in four groups, and the four groups of support members (200) are arranged in pairs on any opposite sides of the receiving probe (100) to form a rectangular support surface.
4. The building floor thickness testing device according to claim 3, characterized in that: A cleaning assembly (300) is also provided outside the receiving probe (100), and the cleaning assembly (300) includes a frame (310) surrounding the outside of the support member (200) and a brush (320) connected to the bottom of the frame (310); the inner side of the frame (310) is connected to a cross bar (330), and the other end of the cross bar (330) is connected to the receiving probe (100).
5. The building floor thickness testing device according to claim 4, characterized in that: Under normal conditions, the lower edge of the brush (320) is lower than the lower edge of the support member (200).