Test structure and test device

Abstract

The utility model provides a test structure and a test device, relates to the technical field of electronic equipment, and is used for solving the problem of low contact reliability between the test device and a test point. Wherein the testing structure comprises a testing needle and a sleeve, and the testing needle is arranged in the sleeve. The test needle can move relative to the sleeve and along the axial direction of the sleeve. And at least partial area of the inner wall of the sleeve abuts against the test needle. The extension direction of the inner wall of the sleeve is consistent with the movement direction of the test needle, at least part of the inner wall of the sleeve abuts against the test needle, the inner wall can limit the axial movement of the test needle along the sleeve, the test needle is prevented from inclining and sideslipping, the test needle can reliably make contact with a test point, and the test efficiency is improved. And the contact reliability between the test needle and the test point is improved.

Description

Technical Field

[0001] The present application relates to the technical field of electronic equipment, and in particular to a test structure and a test device. Background Art

[0002] During the production of electronic devices, printed circuit board assemblies (PCBAs) need to be tested to ensure they function properly. Typically, test points are set on the circuit board, and a testing device contacts the test points to verify that the various functions and parameters of the circuit board are functioning properly. However, existing testing devices suffer from low contact reliability between the testing device and the test points. Utility Model Content

[0003] The embodiments of the present application provide a test structure and a test device for solving the problem of low contact reliability between the test device and the test points.

[0004] To achieve the above objectives, the embodiments of the present application adopt the following technical solutions:

[0005] In a first aspect, a test structure is provided. The test structure includes a test needle and a sleeve, wherein the test needle is disposed within the sleeve. The test needle is movable relative to the sleeve and along the sleeve's axial direction. At least a portion of the sleeve's inner wall abuts the test needle.

[0006] The extension direction of the inner wall of the sleeve is consistent with the movement direction of the test needle. At least part of the inner wall of the sleeve abuts against the test needle. The inner wall can limit the axial movement of the test needle along the sleeve to prevent the test needle from tilting and sliding sideways, so that the test needle can reliably contact the test point, thereby improving the contact reliability between the test needle and the test point.

[0007] In a possible implementation of the first aspect, the test needle is movable relative to the sleeve between a first position and a second position. When the test needle is in the first position, the test needle is separated from the inner wall of the sleeve. When the test needle is in the second position, the test needle abuts against the inner wall of the sleeve.

[0008] When the test needle is in the first position, the test needle is separated from the inner wall of the sleeve. At this time, the test needle does not abut against the inner wall, nor does the test needle abut against the tin pile. When the test needle is in the second position, the test needle abuts against the inner wall of the sleeve. During the movement of the test needle from the first position to the second position, the inner wall limits the test needle, and the inner wall limits the movement of the test needle in the radial direction of the sleeve, so that the test needle does not tilt, thereby achieving stable and reliable movement of the test needle along the axial direction of the sleeve, so that the test needle can stably move to abut against the tin pile, thereby improving the contact reliability between the test needle and the test point.

[0009] In a possible implementation of the first aspect, the test needle includes a main body and a needle tip, wherein the needle tip is fixed to a first end of the main body. When the test needle is in the second position, the main body abuts against a side of the inner wall of the sleeve away from the needle tip.

[0010] During the movement of the test needle from the first position to the second position, the inner wall limits the main body. The inner wall limits the movement of the main body in the radial direction of the sleeve, so that the main body will not tilt, thereby enabling the needle tip to move stably along the axial direction of the sleeve, so that the needle tip can move stably until it abuts against the tin pile, thereby improving the contact reliability between the test needle and the test point.

[0011] In a possible implementation manner of the first aspect, a radial dimension of the main body portion gradually increases along a direction from the main body portion away from the needle tip portion.

[0012] By setting the radial dimension of the main body, which gradually increases in the direction away from the needle tip, the inner wall of the sleeve can cooperate with the main body, limiting the movement distance of the test needle along the axial direction of the sleeve, and making the movement stroke of the test needle between the first position and the second position more reliable.

[0013] In one possible implementation of the first aspect, a plurality of needle tips are provided. The plurality of needle tips are fixed to the first end of the main body and distributed circumferentially around the main body. By distributing the plurality of needle tips circumferentially around the main body, contact reliability between the needle tips and the tin stack is improved. Contact between the test needle and the tin stack is achieved when one of the needle tips abuts the tin stack, thereby improving the fault tolerance of the needle tips.

[0014] In one possible implementation of the first aspect, a dimension of the needle tip portion along the circumference of the main body portion is a width dimension, and the width dimension gradually decreases as the needle tip portion moves away from the main body portion. The width dimension at the end of the needle tip portion away from the main body portion is smaller than the width dimension at the end of the needle tip portion closer to the main body portion. This facilitates insertion of the needle tip portion away from the main body portion into the tin pile, ensuring full contact between the needle tip and the tin pile, and improving contact reliability between the needle tip and the tin pile.

[0015] In one possible implementation of the first aspect, the angle between two adjacent needle tips is greater than or equal to 10°. This provides elastic deformation space between the two adjacent needle tips, allowing the needle tips to elastically deform. During contact between the needle tips and the tin pile, the needle tips will tilt along the surface of the tin pile. This allows the needle tips to more easily penetrate the tin pile and grip the pile, ensuring full contact between the needle tips and the tin pile, compared to when the needle tips are perpendicular to the surface of the tin pile.

[0016] In one possible implementation of the first aspect, when the test needle is in the second position, the needle tip abuts against a side of the sleeve inner wall away from the main body. This side of the sleeve inner wall away from the main body can limit the inclination angle of the needle tip, preventing the needle tip from breaking due to excessive inclination, thereby extending the service life of the needle tip.

[0017] In one possible implementation of the first aspect, the portion of the test needle located within the sleeve abuts against the inner wall of the sleeve. This increases the contact area between the test needle and the inner wall of the sleeve during movement, better retaining the test needle, and preventing the test needle from tilting, thereby further improving contact reliability between the test needle and the test point.

[0018] In one possible implementation of the first aspect, the test needle is spiral-shaped, so that the end of the test needle is inclined relative to the tin pile. This allows the test needle to more easily penetrate the interior of the tin pile, thereby ensuring full contact between the test needle and the tin pile, compared to when the end of the test needle is perpendicular to the surface of the tin pile.

[0019] In one possible implementation of the first aspect, a guide channel is defined on an inner wall of the sleeve, the guide channel extending spirally around the axis of the sleeve, and the test needle is disposed within the guide channel. The guide channel guides the test needle, making its movement toward the tin pile more stable and reliable, thereby improving contact reliability between the test needle and the test point.

[0020] In a possible implementation of the first aspect, the test needle is made of a conductive material, so that the test needle can be electrically connected to the test point.

[0021] In a possible implementation of the first aspect, the sleeve is made of an insulating material, so that even if the sleeve contacts the tin stack or the nickel-gold layer, the sleeve will not be electrically connected to the tin stack or the nickel-gold layer, thereby avoiding impedance interference caused by the conductive connection between the sleeve and the tin stack or the nickel-gold layer.

[0022] In a second aspect, a testing device is also provided. The testing device includes a clamping structure, a driving structure, and the aforementioned testing structure. The clamping structure is used to secure the sleeve. The driving structure is used to drive the testing needle to move relative to the sleeve and along the axial direction of the sleeve.

[0023] The clamping structure is provided to fix the position of the sleeve, making the use of the sleeve more convenient. The driving structure serves as a power source to provide power to drive the test needle to move.

[0024] Since the testing device provided in the present application includes the testing structure of any one of the technical solutions of the first aspect above, the two can solve the same technical problems and achieve the same effects. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] Figure 1 A schematic structural diagram of a circuit board provided in an embodiment of the present application;

[0026] Figure 2 A schematic diagram of the structure of a testing device provided in an embodiment of the present application;

[0027] Figure 3 A schematic diagram of the connection structure between a test pin and a circuit board provided in an embodiment of the present application;

[0028] Figure 4 for Figure 3 Schematic cross-section of the AA section;

[0029] Figure 5 A schematic structural diagram of another circuit board provided in an embodiment of the present application;

[0030] Figure 6 A schematic diagram of another connection structure between a test pin and a circuit board provided in an embodiment of the present application;

[0031] Figure 7 for Figure 6 Schematic cross-section of the middle BB section;

[0032] Figure 8 A schematic diagram of the structure of a test needle in a sliding state provided in an embodiment of the present application;

[0033] Figure 9 for Figure 8 Schematic cross-section of the CC section;

[0034] Figure 10 A schematic diagram of the structure of another test needle in a sliding state provided in an embodiment of the present application;

[0035] Figure 11 for Figure 10 Schematic cross-section of the middle DD section;

[0036] Figure 12 A schematic diagram of the structure of a testing device provided in an embodiment of the present application;

[0037] Figure 13 A schematic diagram of a structure in which a test needle is located in a second position in a test structure provided in an embodiment of the present application;

[0038] Figure 14 for Figure 13 A schematic diagram of a structure in which the test needle is located in the first position;

[0039] Figure 15 A schematic diagram of the structure in which a test needle is located in a second position in another test structure provided in an embodiment of the present application;

[0040] Figure 16 A schematic diagram of a structure in which a test needle is located in a first position in another test structure provided in an embodiment of the present application;

[0041] Figure 17 for Figure 16 A schematic diagram of a structure in which the test needle is located in the second position;

[0042] Figure 18 A schematic diagram of a structure in which a test needle is located in a second position in another test structure provided in an embodiment of the present application;

[0043] Figure 19 A schematic structural diagram of another testing device provided in an embodiment of the present application;

[0044] Figure 20 A schematic diagram of the structure of a test needle provided in an embodiment of the present application;

[0045] Figure 21 A schematic diagram of a structure in which a test needle is located in a first position in another test structure provided in an embodiment of the present application;

[0046] Figure 22 for Figure 21 A schematic diagram of a structure in which the test needle is located in the second position;

[0047] Figure 23 A schematic diagram of a structure in which a test needle is located in a second position in another test structure provided in an embodiment of the present application;

[0048] Figure 24 A schematic diagram of the structure of another test needle provided in an embodiment of the present application;

[0049] Figure 25 A schematic diagram of a structure in which a test needle is located in a first position in another test structure provided in an embodiment of the present application;

[0050] Figure 26 for Figure 25 A schematic diagram of a structure in which the test needle is located in the second position;

[0051] Figure 27 A schematic diagram of a structure in which a test needle is located in a second position in another test structure provided in an embodiment of the present application;

[0052] Figure 28 This is a structural schematic diagram of another test structure provided in an embodiment of the present application in which the test needle is located in the second position. DETAILED DESCRIPTION

[0053] In the embodiments of this application, the terms "first," "second," and "third" are used for descriptive purposes only and should not be understood to indicate or imply relative importance or implicitly specify the number of the technical features indicated. Therefore, a feature specified as "first," "second," or "third" may explicitly or implicitly include one or more of the features.

[0054] In the embodiments of the present application, the terms "comprises," "comprising," or any other variations thereof are intended to encompass non-exclusive inclusion, such that a process, method, article, or apparatus comprising a series of elements includes not only those elements but also other elements not explicitly listed, or elements inherent to such process, method, article, or apparatus. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not preclude the presence of other identical elements in the process, method, article, or apparatus comprising the element.

[0055] Electronic devices are common terminal devices in daily life, for example, electronic devices can be mobile phones, tablets, laptops, etc. In addition, electronic devices have different functional modules and can perform different functions. For example, mobile phones can perform functions such as taking photos and making video calls.

[0056] Among them, different functional modules in the electronic device need to be electrically connected through an internal circuit board, so that the different functional modules can communicate with each other and further achieve collaborative work between the different functional modules.

[0057] For example, when the electronic device is a mobile phone, the camera module and the flash module of the mobile phone cooperate with each other, so that photos can be taken in dimly lit scenes (for example, at night), which is beneficial to improving the user experience.

[0058] Based on this, see Figure 1 , Figure 1 This is a schematic diagram of the structure of a circuit board provided in an embodiment of the present application. To facilitate the following description, an XYZ coordinate system is established, defining the length direction of the circuit board 200 as the X-axis direction, the width direction of the circuit board 200 as the Y-axis direction, and the thickness direction of the circuit board 200 as the Z-axis direction. It can be understood that Figure 1 Only some components of the circuit board 200 are schematically shown, and the actual shape, size, position and structure of these components are not affected by the present invention. Figure 1 restrictions.

[0059] The circuit board 200 may include a substrate 201 and a conductive layer 202 disposed on the substrate 201. The substrate 201 provides structural strength to the circuit board 200, and the conductive layer 202 is used for electrical conduction. Each functional module is electrically connected directly or indirectly to the conductive layer 202, thereby enabling communication between the different functional modules. The functional modules may be directly electrically connected to the conductive layer 202 via soldering, or indirectly electrically connected to the conductive layer 202 via electrical connectors such as springs.

[0060] In one embodiment, please continue to refer to Figure 1 The conductive layer 202 may be made of copper. To prevent oxidation of the conductive layer 202, improve the reliability of the conductive layer 202, and extend the service life of the conductive layer 202, the circuit board 200 may further include an anti-oxidation layer 204. Currently, there are two main types of anti-oxidation layers 204.

[0061] The first anti-oxidation layer 204 is a nickel-gold layer, formed by chemical plating on the surface of the conductive layer 202. Nickel and gold are chemically stable and not easily oxidized. The nickel-gold layer protects the conductive layer 202 from oxidation. However, the process of forming the nickel-gold layer by chemical plating is relatively complex and costly.

[0062] The second anti-oxidation layer 204 is an organic solderability preservative (OSP), hereinafter referred to as the OSP layer. The OSP layer is an organic coating that isolates the conductive layer 202 from air to prevent oxidation. Using the OSP layer to protect the conductive layer 202 from oxidation reduces costs compared to using a nickel-gold layer to protect the conductive layer 202 from oxidation.

[0063] On this basis, during the production process of the circuit board 200, in order to improve its yield rate, it is necessary to test to ensure that the circuit board 200 functions properly. Specifically, the conductive layer 202 may include multiple test points 203. A testing device is used to contact and conduct with the test points 203 to detect parameters such as current and voltage, thereby verifying whether the conductive layer 202 is intact and whether it can perform various functions.

[0064] In some embodiments, see Figure 2 , Figure 2 This is a schematic diagram of the structure of a test device provided in an embodiment of the present application. The test device may include a drive structure 301 and a test structure. The test structure may include a test needle 10, and the drive structure 301 is used to drive the test needle 10 to approach or move away from the test point 203.

[0065] Please refer to Figure 3 and Figure 4 , Figure 3 A schematic diagram of the connection structure between a test pin and a circuit board provided in an embodiment of the present application. Figure 4 for Figure 3 Schematic cross-sectional view of section AA. When the anti-oxidation layer 204 is a nickel-gold layer, the nickel-gold layer has a high surface flatness, allowing the test device 300 to easily contact the nickel-gold layer. Furthermore, the nickel-gold layer has excellent electrical conductivity, and direct contact between the test device 300 and the test point 203 can achieve electrical continuity.

[0066] See also Figure 5 , Figure 5 A schematic diagram of the structure of another circuit board provided in an embodiment of the present application. When the anti-oxidation layer 204 is an OSP layer, since the OSP layer is insulating, a tin pile 205 is formed on the test point 203 by welding. The dimension of the tin pile 205 along the Z-axis is greater than 0.1 mm. Under the high temperature of welding and the action of the flux in the tin pile 205, the OSP layer at the corresponding position of the tin pile 205 is removed, and the tin pile 205 is connected to the surface of the test point 203. The tin pile 205 is capable of conducting electricity, and the test device 300 can achieve electrical continuity between the test device 300 and the test point 203 by contacting the tin pile 205.

[0067] Please refer to Figure 6 and Figure 7 ,in, Figure 6 This is a schematic diagram of another connection structure between a test pin and a circuit board provided in an embodiment of the present application. Figure 7 for Figure 6 The test needle 10 moves in a direction close to the tin pile 205 so that the end of the test needle 10 abuts against the tin pile 205 to achieve conduction between the test needle 10 and the test point 203.

[0068] It is understandable that tin has a relatively low hardness, while the test needle 10 has a relatively high hardness. The test needle 10 can penetrate into the tin pile 205 so that the test needle 10 is in full contact with the tin pile 205 .

[0069] However, the tin pile 205 is hemispherical and has an uneven surface. Therefore, the test pin 10 may slip, tilting, and not contacting the tin pile 205. This results in a loss of electrical continuity between the test pin 10 and the test point 203, and low contact reliability between the test pin 10 and the test point 203.

[0070] The test pin 10 does not abut against the tin stack 205 . At this time, there are two possible situations for the test pin 10 .

[0071] Please refer to Figure 8 and Figure 9 ,in, Figure 8 This is a schematic diagram of the structure of a test needle in a sliding state provided in an embodiment of the present application. Figure 9 for Figure 8 Schematic diagram of the CC section in FIG. In the first case, the test needle 10 slips sideways and does not contact the tin stack 205. Instead, the test needle 10 penetrates the anti-oxidation layer 204 (OSP layer) and does not penetrate the anti-oxidation layer 204 (OSP layer) to contact the test point 203. In other words, the test needle 10 only contacts the anti-oxidation layer 204 (OSP layer), which is insulating. In this case, the test needle 10 cannot conduct electricity to the test point 203.

[0072] Please refer to Figure 10 and Figure 11 ,in, Figure 10 This is a schematic diagram of the structure of another test needle in a sliding state provided in an embodiment of the present application. Figure 11 for Figure 10 In the second case, the test needle 10 slides sideways and does not contact the tin pile 205. Instead, the test needle 10 penetrates the substrate 201. However, the substrate 201 is insulated. In this case, the test needle 10 cannot conduct electricity to the test point 203.

[0073] In order to solve the problem that the test needle tilts and slides, resulting in low contact reliability between the test needle and the test point, the embodiment of the present application provides a test device. Figure 12 , Figure 12 A schematic diagram of the connection structure between a test device and a circuit board provided in an embodiment of the present application.

[0074] For example, a cylindrical test needle 10 has a circular cross-section. The axial direction of the test needle 10 is the length of the test needle 10. In the XYZ coordinate system, the axial direction of the test needle 10 is the Z-axis direction. The circumferential direction of the test needle 10 is the circumferential direction of the cross-section of the test needle 10. The radial direction of the test needle 10 is the diameter or radius of the cross-section of the test needle 10. In the XYZ coordinate system, the radial direction of the test needle 10 is the XY plane.

[0075] It is understood that the test needle 10 may have other shapes, and the cross-section of the test needle 10 may be square, triangular, polygonal, or other shapes. The embodiments of the present application do not limit the shape of the cross-section of the test needle 10. When the cross-section of the test needle 10 has other shapes, the axial direction of the test needle 10 is the length direction of the test needle 10, the circumferential direction of the test needle 10 is the direction along the outer contour of the cross-section of the test needle 10, and the radial direction of the test needle 10 is the direction of a straight line passing through the geometric center of the cross-section of the test needle 10.

[0076] For example, the diameter of the test needle 10 may be greater than or equal to 0.4 mm, so that the test needle 10 has a stronger structural strength. The diameter of the test needle 10 may be 0.4 mm, 0.5 mm, 0.6 mm, 0.7 mm, 0.8 mm, 0.9 mm, or 1 mm.

[0077] Please continue reading Figure 12 The test device 300 also includes a clamping structure 302. The test structure 100 includes a test needle 10 and a sleeve 20. The clamping structure 302 is used to fix the sleeve 20. By setting the clamping structure 302, the position of the sleeve 20 is fixed, making the use of the sleeve 20 more convenient.

[0078] Illustratively, the clamping structure 302 may include a plurality of clamping jaws (not shown), which are close to each other to clamp the sleeve 20 , thereby fixing the position of the sleeve 20 .

[0079] The driving structure 301 is used to drive the test needle 10 to move relative to the sleeve 20 and along the axial direction of the sleeve 20. That is, the driving structure 301 serves as a power source to provide power to drive the test needle 10 to move along the Z-axis direction.

[0080] For example, the drive structure 301 may be a cylinder, which has the advantages of stable driving and high reliability. In other embodiments, the drive structure 301 may also be a motor or other drive member. The specific structure of the drive structure 301 is not limited in this embodiment of the application.

[0081] See also Figure 13 , Figure 13 This is a schematic diagram of a test pin in a second position in a test structure according to an embodiment of the present application. A test pin 10 is disposed within a sleeve 20. The sleeve 20 has a through hole 21 extending axially therethrough, that is, along the Z-axis. The test pin 10 is positioned within the through hole 21.

[0082] The test needle 10 can move relative to the sleeve 20 and along the axial direction of the sleeve 20 . The test needle 10 can move along the axial direction of the sleeve 20 to approach or move away from the test point.

[0083] At least a portion of the inner wall 22 of the sleeve 20 abuts the test needle 10. It is understood that the inner wall 22 of the sleeve 20 is also the wall of the through hole 21. The extension direction of the through hole 21 is consistent with the movement direction of the test needle 10. At least a portion of the inner wall 22 of the sleeve 20 abuts the test needle 10. The inner wall 22 can limit the movement of the test needle 10 along the Z-axis, preventing the test needle 10 from tilting and sliding sideways, allowing the test needle 10 to reliably conduct electricity with the test point, thereby improving the contact reliability between the test needle 10 and the test point.

[0084] Please continue reading Figure 13 When the anti-oxidation layer 204 is an OSP layer, the sleeve 20 can limit the movement of the test needle 10 along the Z-axis direction, preventing the test needle 10 from tilting and sliding sideways with the surface of the tin pile 205, so that the test needle 10 can reliably contact the tin pile 205, thereby achieving conduction between the test needle 10 and the test point 203, and improving the contact reliability between the test needle 10 and the test point 203.

[0085] It is understood that when the anti-oxidation layer 204 is a nickel-gold layer, that is, the tin stack 205 is not required, and the test needle 10 can achieve electrical continuity between the test needle 10 and the test point 203 by simply contacting the anti-oxidation layer 204. The inner wall 22 of the sleeve 20 can also prevent the test needle 10 from tilting relative to the anti-oxidation layer 204 (nickel-gold layer), allowing the test needle 10 to reliably contact the anti-oxidation layer 204 (nickel-gold layer), thereby achieving electrical continuity between the test needle 10 and the test point 203 and improving the contact reliability between the test needle 10 and the test point 203.

[0086] Therefore, when the anti-oxidation layer 204 is an OSP layer, and when the anti-oxidation layer 204 is a nickel-gold layer, the inner wall 22 of the sleeve 20 can limit the test needle 10, prevent the test needle 10 from tilting, and improve the contact reliability between the test needle 10 and the test point 203. For the sake of convenience, the following description is based on the example of the anti-oxidation layer 204 being an OSP layer.

[0087] In some embodiments, please refer to Figure 14 , the test needle 10 is movable relative to the sleeve 20 between a first position and a second position. Figure 14 for Figure 13 Schematic diagram of the structure in which the test needle is located in the first position.

[0088] like Figure 14 As shown, when the test pin 10 is in the first position, the test pin 10 is separated from the inner wall 22 of the sleeve 20. At this time, the test pin 10 does not abut the inner wall 22, nor does it abut the tin stack 205. It is understood that the separation of the test pin 10 from the inner wall 22 of the sleeve 20 can mean that the test pin 10 is located outside the sleeve 20, or that a portion of the test pin 10 is located inside the sleeve 20, but the portion of the test pin 10 located inside the sleeve 20 does not contact the inner wall 22.

[0089] like Figure 13As shown, when the test needle 10 is in the second position, the test needle 10 abuts against the inner wall 22 of the sleeve 20. During the movement of the test needle 10 from the first position to the second position, the inner wall 22 limits the test needle 10. The inner wall 22 restricts the movement of the test needle 10 in the XY plane, preventing the test needle 10 from tilting. This allows the test needle 10 to stably and reliably move along the Z-axis, allowing the test needle 10 to stably move until it abuts against the tin pile 205, thereby improving the contact reliability between the test needle 10 and the test point 203.

[0090] In some embodiments, see Figure 15 , Figure 15 The schematic diagram of another test structure provided by the present invention, wherein the test needle is located at the second position, is shown in FIG.

[0091] Exemplarily, the main body 11 and the needle tip 12 can be integrally formed, that is, the main body 11 and the needle tip 12 are formed through a one-time process, which reduces the assembly steps between the main body 11 and the needle tip 12 and reduces the assembly error between the main body 11 and the needle tip 12.

[0092] When the test needle 10 is in the second position, the main body 11 abuts against the inner wall 22 of the sleeve 20 on the side away from the needle tip 12. As the test needle 10 moves from the first position to the second position, the inner wall 22 limits the main body 11. The inner wall 22 restricts the movement of the main body 11 in the XY plane, preventing the main body 11 from tilting. This allows the needle tip 12 to move stably along the Z-axis, allowing it to stably move until it abuts against the tin stack 205, thereby improving the contact reliability between the test needle 10 and the test point 203.

[0093] In some embodiments, please refer to Figure 15The main body 11 may include a column 112 and a protrusion 113. The protrusion 113 extends along the circumference of the column 112 and is connected to the outer periphery of the column 112. When the test needle 10 is in the second position, the protrusion 113 abuts the inner wall 22 of the sleeve 20 on the side away from the needle tip 12. The protrusion 113 limits the movement of the test needle 10 along the Z-axis. The protrusion 113 prevents the test needle 10 from continuing to move toward the tin pile 205 after reaching the second position, causing the needle tip 12 to pass through the tin pile 205 and directly contact the test point 203. If the needle tip 12 passes through the tin pile 205 and directly contacts the test point 203, the test is terminated. After the test needle 10 is removed, the test point 203 will come into contact with air and oxidize. By providing the protrusion 113 in conjunction with the sleeve 20 to limit the movement of the test needle 10 along the Z-axis, the movement of the test needle 10 between the first and second positions is more reliable.

[0094] In some embodiments, please refer to Figure 16 and Figure 17 , Figure 16 A schematic diagram of a structure in which a test needle is located in a first position in another test structure provided in an embodiment of the present application; Figure 17 for Figure 16 Schematic diagram of the structure in which the test needle is located in the second position.

[0095] The radial dimension of the main body 11 gradually increases in the direction away from the needle tip 12. That is, the radial dimension of the second end 114 of the main body 11 is greater than the radial dimension of the first end 111 of the main body 11. The radial dimension of the inner wall 22 can be kept consistent along the Z-axis direction. That is, the radial dimension of the through hole 21 is consistent along the Z-axis direction. Figure 16 As shown, when the test needle 10 is located in the first position, the needle tip 12 and part of the main body 11 can be located in the sleeve 20 , but the portion of the test needle 10 located in the sleeve 20 does not contact the inner wall 22 .

[0096] like Figure 17As shown, as the test needle 10 moves from the first position to the second position, the radial dimension of the main body 11 corresponding to the side of the inner wall 22 away from the needle tip 12 gradually increases. When the radial dimension of the main body 11 is consistent with the radial dimension of the inner wall 22, the main body 11 abuts the side of the inner wall 22 away from the needle tip 12. The inner wall 22 restricts the main body 11 from further approaching the tin pile 205, allowing the test needle 10 to remain in the second position. When the test needle 10 is in the second position, the main body 11 only contacts the side of the inner wall 22 away from the needle tip 12. In other words, by setting the radial dimension of the main body 11 to gradually increase in the direction away from the needle tip 12, the inner wall 22 of the sleeve 20 can cooperate with the main body 11, limiting the movement distance of the test needle 10 along the Z-axis, making the movement range of the test needle 10 between the first and second positions more reliable.

[0097] In other embodiments, see Figure 18 , Figure 18 This is a schematic diagram of another test structure provided by an embodiment of the present application, showing the test needle in the second position. The radial dimension of the inner wall 22 gradually increases as the main body 11 moves away from the needle tip 12. When the test needle 10 is in the second position, the portion of the main body 11 located within the sleeve 20 abuts against the inner wall 22 of the sleeve 20, increasing the contact area between the main body 11 and the inner wall 22, improving the contact reliability between the main body 11 and the inner wall 22, and enhancing the inner wall 22's ability to limit the main body 11.

[0098] In some other possible embodiments, see Figure 19 , Figure 19 A schematic structural diagram of another test device provided in an embodiment of the present application. The test device 300 may also include a pressure sensor 303, which may be connected to the second end 114 of the main body 11, and the pressure sensor 303 may measure the force applied to the test needle 10. When the needle tip 12 abuts against the tin pile 205, the force applied to the test needle 10 changes, and the pressure sensor 303 detects the change in the force applied to the test needle 10. The pressure sensor 303 sends the force change to the drive structure 301, and the drive structure 301 controls the test needle 10 to stop moving. By cooperating with the pressure sensor 303 and the drive structure 301, the test needle 10 is limited to control the movement distance of the test needle 10 along the Z-axis direction.

[0099] In some embodiments, see Figure 20 , Figure 20This is a schematic diagram of the structure of a test needle provided in an embodiment of the present application. A plurality of needle tips 12 are provided. The plurality of needle tips 12 are fixed to the first end 111 of the main body 11 and are distributed circumferentially around the main body 11. By distributing the plurality of needle tips 12 circumferentially around the main body 11, the contact reliability between the needle tips 12 and the tin pile is improved. When one of the needle tips 12 abuts against the tin pile, the test needle 10 can be connected to the tin pile, thereby improving the fault tolerance of the needle tip 12.

[0100] For example, the number of needle tips 12 can be two, three, four or other numbers. The number of needle tips 12 can be flexibly adjusted according to the radial size of the main body 11. The embodiment of the present application does not limit the specific number of needle tips 12. Figure 20 As shown, the number of needle tips 12 is four.

[0101] In some embodiments, see Figure 21 , Figure 21 This is a schematic diagram of a test needle in a first position in another test structure provided by an embodiment of the present application. The width dimension of the needle tip 12 along the circumference of the main body 11 is a width dimension, and the width dimension gradually decreases as the needle tip 12 moves away from the main body 11. In other words, the width dimension of the needle tip 12 at the end away from the main body 11 is smaller than the width dimension of the needle tip 12 at the end closer to the main body 11. This facilitates the needle tip 12's insertion into the tin pile at the end away from the main body 11, ensuring full contact between the needle tip 12 and the tin pile, and improving the contact reliability between the needle tip 12 and the tin pile.

[0102] In some embodiments, please refer to Figure 21 The angle between two adjacent needle tips 12 is greater than or equal to 10°. Figure 21 As shown, when the test needle 10 is located at the first position, the test needle 10 is separated from the inner wall 22 of the sleeve 20. At this time, the needle tip 12 can extend along the Z-axis direction.

[0103] Please refer to Figure 22 , Figure 22 for Figure 21Schematic diagram of the structure in which the test needle 10 is located in the second position. When the test needle 10 is located in the second position, the main body 11 abuts against the side of the inner wall 22 of the sleeve 20 away from the needle tip 12. Since the angle between the two adjacent needle tips 12 is greater than or equal to 10°, there is space for elastic deformation between the two adjacent needle tips 12, so that the needle tips 12 can produce elastic deformation. The shape of the tin pile 205 is hemispherical. During the contact between the needle tip 12 and the tin pile 205, the needle tip 12 will produce an inclined deformation along the surface of the tin pile 205. Compared with the needle tip 12 being perpendicular to the surface of the tin pile 205, it can make it easier for the needle tip 12 to penetrate into the interior of the tin pile 205 and grasp the tin pile 205, so that the needle tip 12 is in full contact with the tin pile 205.

[0104] For example, the angle between two adjacent needle tips 12 may be less than or equal to 90°, so that the needle tips 12 can recover elastically better, thereby preventing the needle tips 12 from breaking due to excessive tilt angles and extending the service life of the needle tips 12 .

[0105] Illustratively, the angle between two adjacent needle tips 12 may be 10°, 20°, 30°, 40°, 45°, 50°, 60°, 70°, 80° or 90°.

[0106] In some embodiments, see Figure 23 , Figure 23 This is a schematic diagram of another test structure provided by an embodiment of the present application, showing the test needle in the second position. When the test needle 10 is in the second position, the needle tip 12 abuts against the inner wall 22 of the sleeve 20, away from the main body 11. This side of the inner wall 22 of the sleeve 20, away from the main body 11, limits the inclination angle of the needle tip 12, preventing it from breaking due to excessive inclination, thereby extending the service life of the needle tip 12.

[0107] In some embodiments, the portion of the test needle 10 located inside the sleeve 20 abuts against the inner wall 22 of the sleeve 20, so that during the movement of the test needle 10, the contact area between the test needle 10 and the inner wall 22 of the sleeve 20 is larger, and the inner wall 22 has a better limiting effect on the test needle 10 and a better effect of preventing the test needle 10 from tilting, thereby further improving the contact reliability between the test needle 10 and the test point.

[0108] In some embodiments, see Figure 24 , Figure 24 This is a schematic diagram of the structure of another test needle provided in an embodiment of the present application. Figure 24 As shown, the test needle 10 is in a spiral shape.

[0109] Please refer to Figure 25 and Figure 26 , Figure 25A schematic diagram of a structure in which a test needle is located in a first position in another test structure provided in an embodiment of the present application; Figure 26 for Figure 25 The test needle is located in the second position. Figure 25 As shown, Figure 25 The test needle 10 in the sleeve 20 does not move. Figure 26 As shown, Figure 26 The test needle 10 in the sleeve 20 abuts against the tin pile 205, and the portion of the test needle 10 located within the sleeve 20 abuts against the inner wall 22 of the sleeve 20. The test needle 10 is spirally shaped, so that the end of the test needle 10 is arranged at an angle to the tin pile 205. Compared to when the end of the test needle 10 is perpendicular to the surface of the tin pile 205, it is easier for the test needle 10 to penetrate the interior of the tin pile 205, thereby ensuring sufficient contact between the test needle 10 and the tin pile 205.

[0110] like Figure 26 As shown, the end of the sleeve 20 may not abut against the tin stack 205 , and the end of the sleeve 20 is at a distance from the surface of the tin stack 205 .

[0111] In some embodiments, as Figure 27 As shown, Figure 27 This is a schematic diagram of another test structure provided by an embodiment of the present application, showing the test needle in the second position. The end of the sleeve 20 can abut against the tin pile 205, so that the inner wall 22 of the sleeve 20 can better limit the position of the test needle 10, preventing the end of the test needle 10 from escaping from the range of the tin pile 205.

[0112] See also Figure 28 , Figure 28 A schematic diagram of the connection structure between another test structure and a circuit board provided in an embodiment of the present application. A guide channel 23 is provided on the inner wall 22 of the sleeve 20, and the guide channel 23 extends spirally around the axis of the sleeve 20, and the test needle 10 is arranged in the guide channel 23. In other words, the guide channel 23 is also spiral, and the guide channel 23 is consistent with the axis of the spiral extension of the test needle 10. The test needle 10 is connected to the drive structure, and the drive structure drives the test needle 10 to move relative to the sleeve 20 and along the axial direction of the sleeve 20. The test needle 10 will move spirally along the guide channel 23, so that the test needle 10 gradually approaches the tin pile 205 until the end of the test needle 10 is inserted into the tin pile 205. The guide channel 23 can guide the test needle 10, so that the movement process of the test needle 10 approaching the tin pile 205 is more stable and reliable, so as to improve the contact reliability between the test needle 10 and the test point.

[0113] In some embodiments, the test needle 10 is made of a conductive material, so that the test needle 10 contacts the tin pile or the nickel-gold layer, thereby achieving conduction between the test needle 10 and the conductive layer, thereby achieving conduction between the test needle 10 and the test point.

[0114] Exemplarily, the test needle 10 may be made of copper, aluminum, silver, or other materials that can conduct electrical signals.

[0115] In some embodiments, the sleeve 20 is made of insulating material, so that even if the sleeve 20 contacts the tin stack or the nickel-gold layer, the sleeve 20 will not be conductive with the tin stack or the nickel-gold layer, thereby avoiding impedance interference caused by the conductive connection between the sleeve 20 and the tin stack or the nickel-gold layer.

[0116] Exemplarily, the sleeve 20 may be made of plastic, rubber or other insulating materials.

[0117] In the description of this specification, specific features, structures, materials or characteristics may be combined in an appropriate manner in any one or more embodiments or examples.

[0118] The above description is merely a specific embodiment of the present application, but the scope of protection of the present application is not limited thereto. Any changes or substitutions that can be easily conceived by a person skilled in the art within the technical scope disclosed in this application should be included in the scope of protection of the present application. Therefore, the scope of protection of the present application should be based on the scope of protection of the claims.

Claims

1. A test structure, characterized in that: include: Test needle; The test needle is arranged in the sleeve; the test needle can move relative to the sleeve and along the axial direction of the sleeve; at least a part of the inner wall of the sleeve abuts against the test needle.

2. The test structure according to claim 1, characterized in that The test needle is capable of moving between a first position and a second position relative to the sleeve; when the test needle is in the first position, the test needle is separated from the inner wall of the sleeve; when the test needle is in the second position, the test needle abuts against the inner wall of the sleeve.

3. The test structure according to claim 2, characterized in that The test needle includes a main body and a needle tip, wherein the needle tip is fixed to the first end of the main body; when the test needle is located at the second position, the main body abuts against the side of the inner wall of the sleeve away from the needle tip.

4. The test structure according to claim 3, characterized in that The radial dimension of the main body portion gradually increases along a direction in which the main body portion is away from the needle tip portion.

5. The test structure according to claim 3, characterized in that There are multiple needle tips; the multiple needle tips are fixed to the first end of the main body and distributed around the circumference of the main body.

6. The test structure according to claim 5, characterized in that The dimension of the needle tip portion along the circumference of the main body portion is a width dimension, and the width dimension gradually decreases in a direction in which the needle tip portion is away from the main body portion.

7. The test structure according to claim 5 or 6, characterized in that: The angle between two adjacent needle tips is greater than or equal to 10°.

8. The test structure according to claim 5 or 6, characterized in that: When the test needle is located at the second position, the needle tip abuts against a side of the inner wall of the sleeve away from the main body.

9. The test structure according to claim 1, characterized in that The parts of the test needle located in the sleeve are in contact with the inner wall of the sleeve.

10. The test structure according to claim 9, characterized in that The testing needle is spiral-shaped.

11. The test structure according to claim 10, characterized in that: A guide channel is provided on the inner wall of the sleeve. The guide channel spirally extends around the axis of the sleeve. The test needle is arranged in the guide channel.

12. The test structure according to any one of claims 1 to 6, characterized in that: The test needle is made of conductive material.

13. The test structure according to any one of claims 1 to 6, characterized in that: The sleeve is made of insulating material.

14. A testing device, characterized in that: include: A clamping structure, a driving structure, and a test structure according to any one of claims 1 to 13, wherein the clamping structure is used to fix the sleeve, and the driving structure is used to drive the test needle to move relative to the sleeve and along the axial direction of the sleeve.

Images