Bearing jig for testing integrated circuit

Abstract

The utility model discloses a bearing jig for testing an integrated circuit, which comprises a base provided with a mounting rack; the two adjusting plates are symmetrically connected to the mounting frame, and each adjusting plate is detachably connected with an electric telescopic rod; the fixing plate is connected with one end of the electric telescopic rod; and the testing mechanism is connected with the mounting rack. By controlling the two electric telescopic rods to work, the two fixing plates can be driven to move, the integrated circuit can be stably clamped and fixed, detection is convenient, the distance between the two fixing plates is adjusted through the two electric telescopic rods, integrated circuits of different specifications can be conveniently clamped and fixed, and the detection efficiency is improved. And bolts penetrate through first long kidney-shaped holes, so that the position of the adjusting plate on the mounting frame can be conveniently adjusted, the distance between the two electric telescopic rods can be adjusted, and the adjusting range is widened.

Description

Technical Field

[0001] The utility model relates to the technical field of circuit testing equipment, in particular to a carrier fixture for integrated circuit testing. Background Art

[0002] During the process of testing integrated circuits, a carrier fixture is required to carry the integrated circuit to be tested in order to implement the testing of the integrated circuit. The carrier fixture used for integrated circuit testing has become an indispensable part of integrated circuit testing.

[0003] A Chinese patent with publication number CN211122953U discloses a carrier fixture for integrated circuit testing. However, these patents only place the integrated circuit board on a movable block and tightly clamp the circuit board using the elastic force of a spring. The clamping effect is poor and the circuit board cannot be effectively limited and positioned. During testing, the circuit board is prone to shaking and shifting, which is not conducive to stable testing of the circuit board. Utility Model Content

[0004] The purpose of the present utility model is to solve the shortcomings existing in the prior art, and includes: a base, on which a mounting bracket is provided; an adjusting plate, two adjusting plates are symmetrically connected to the mounting bracket, and each adjusting plate is detachably connected to an electric telescopic rod; a fixing plate, the fixing plate is connected to one end of the electric telescopic rod; a testing mechanism, the testing mechanism is connected to the mounting bracket; a first electric lifting rod, the first electric lifting rod is arranged inside the base, and a placement plate is connected above the first electric lifting rod; a first long waist hole, the first long waist hole is opened on the adjusting plate, and the adjusting plate is detachably connected to the mounting bracket through the first long waist hole.

[0005] As a further description of the above technical solution: the testing mechanism includes a second electric lifting rod, the second electric lifting rod is connected to the mounting frame, a mounting plate is connected below the second electric lifting rod, and the mounting plate is detachably connected to the tester by bolts.

[0006] As a further description of the above technical solution: a limiting slide bar is provided on the mounting frame, and four limiting slide bars are provided.

[0007] As a further description of the above technical solution: a limiting sliding hole adapted to the limiting sliding rod is provided on the mounting plate.

[0008] As a further description of the above technical solution: a second long waist hole is opened on the mounting plate, and the bolt passes through the second long waist hole and is detachably connected to the tester.

[0009] As a further description of the above technical solution: the placement plate is located between two fixed plates.

[0010] As a further description of the above technical solution: a control panel is provided on the base.

[0011] The above technical solution has the following advantages or beneficial effects:

[0012] The utility model controls the operation of two electric telescopic rods to drive the two fixed plates to move, and can stably clamp and fix the integrated circuit, which is convenient for detection. The distance between the two fixed plates is adjusted by the two electric telescopic rods, which is convenient for clamping and fixing integrated circuits of different specifications. The position of the adjustment plate on the mounting frame is conveniently adjusted by passing a bolt through the first long waist hole, and the distance between the two electric telescopic rods can be adjusted, thereby improving the adjustment range. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1 This is a structural diagram of a carrying fixture in one embodiment of the present utility model;

[0014] Figure 2 This is a cross-sectional view of a carrying fixture in one embodiment of the present utility model;

[0015] Figure 3 for Figure 1 Schematic diagram of the structure of the adjustment plate in the load-bearing fixture;

[0016] Figure 4 for Figure 1 Schematic diagram of the structure of the mounting plate in the load-bearing fixture.

[0017] Legend:

[0018] 1. Base; 2. Mounting frame; 3. Adjustment plate; 4. Electric telescopic rod; 5. Fixing plate; 6. Testing mechanism; 7. First electric lifting rod; 8. Placement plate; 9. First long waist hole; 10. Limiting slide bar; 11. Control panel; 61. Second electric lifting rod; 62. Mounting plate; 63. Tester; 64. Limiting slide hole; 65. Second long waist hole; 66. Bolt. DETAILED DESCRIPTION

[0019] The following will be combined with the accompanying drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0020] In the description of the present invention, it should be noted that the terms "vertical", "up", "down", "horizontal", etc. indicating orientations or positional relationships are based on the orientations or positional relationships shown in the accompanying drawings. They are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, they cannot be understood as limitations on the present invention.

[0021] In the description of the present invention, it should also be noted that, unless otherwise expressly specified or limited, the terms "disposed," "arranged," "connected," and "connected" should be understood in a broad sense. For example, they may refer to fixed connections, detachable connections, or integral connections; they may refer to mechanical connections or electrical connections; they may refer to direct connections or indirect connections through an intermediate medium; and they may refer to internal communication between two components. Those skilled in the art will be able to understand the specific meanings of the above terms in the present invention based on specific circumstances.

[0022] like Figure 1-4 As shown, the utility model is a supporting fixture for integrated circuit testing, comprising: a base 1, on which a mounting frame 2 is provided; an adjusting plate 3, two adjusting plates 3 are symmetrically connected to the mounting frame 2, and each adjusting plate 3 is detachably connected to an electric telescopic rod 4; a fixing plate 5, the fixing plate 5 is connected to one end of the electric telescopic rod 4; a testing mechanism 6, which is connected to the mounting frame 2; a first electric lifting rod 7, which is arranged inside the base 1, and a placement plate 8 is connected above the first electric lifting rod 7; a first long waist hole 9, which is opened on the adjusting plate 3, and the adjusting plate 3 is detachably connected to the mounting frame 2 through the first long waist hole 9.

[0023] In this embodiment, by controlling the operation of the two electric telescopic rods 4, the two fixed plates 5 can be driven to move, and the integrated circuit can be stably clamped and fixed, which is convenient for testing. The distance between the two fixed plates 5 is adjusted by the two electric telescopic rods 4, which is convenient for clamping and fixing integrated circuits of different specifications. The position of the adjustment plate 3 on the mounting frame 2 is conveniently adjusted by passing a bolt through the first long waist hole 9, and the distance between the two electric telescopic rods 4 can be adjusted, thereby improving the adjustment range.

[0024] The first electric lifting rod 7 is controlled to work, so as to drive the placement plate 8 to rise, and the integrated circuit after testing is lifted up, so that the integrated circuit after testing can be taken out conveniently.

[0025] like Figure 1 and Figure 2As shown, specifically, the testing mechanism 6 includes a second electric lifting rod 61, the second electric lifting rod 61 is connected to the mounting frame 2, a mounting plate 62 is connected below the second electric lifting rod 61, and the mounting plate 62 is detachably connected to the tester 63 by a bolt 66; by controlling the operation of the second electric lifting rod 61, the mounting plate 62 and the tester 63 can be driven to rise and fall, and the tester 63 is driven to descend by the second electric lifting rod 61, so that the integrated circuit placed on the plate 8 below it can be tested.

[0026] like Figure 2 and Figure 4 As shown, specifically, a limiting slide bar 10 is provided on the mounting frame 2, and there are four limiting slide bars 10. A limiting slide hole 64 adapted to the limiting slide bar 10 is opened on the mounting plate 62; by passing the limiting slide bar 10 through the limiting slide hole 64, the mounting plate 62 can be limited, thereby enhancing the stability of the mounting plate 62 when it is raised or lowered.

[0027] like Figure 1 and Figure 4 As shown, specifically, a second long waist hole 65 is opened on the mounting plate 62, and a bolt 66 passes through the second long waist hole 65 and is detachably connected to the tester 63; by opening the second long waist hole 65 on the mounting plate 62, the position of the bolt 66 can be adjusted to facilitate the fixing of testers 63 of different specifications, facilitate the detection of integrated circuits of different specifications, and enhance the applicability of the device.

[0028] like Figure 1 and Figure 2 As shown, specifically, the placement plate 8 is located between the two fixing plates 5, and a control panel 11 is provided on the base 1; the control panel facilitates the operation of the control device.

[0029] Working principle: By controlling the operation of the two electric telescopic rods 4, the two fixed plates 5 can be driven to move, and the integrated circuit can be stably clamped and fixed, which is convenient for testing. The distance between the two fixed plates 5 can be adjusted by the two electric telescopic rods 4, which is convenient for clamping and fixing integrated circuits of different specifications. The position of the adjustment plate 3 on the mounting frame 2 can be adjusted by passing the bolt through the first long waist hole 9. The distance between the two electric telescopic rods 4 can be adjusted, and the adjustment range is improved. By controlling the operation of the first electric lifting rod 7, the placement plate 8 can be driven to rise, and the integrated circuit that has been tested can be lifted up to facilitate the removal of the integrated circuit that has been tested.

[0030] It should be noted that, in this document, relational terms such as first and second, etc., are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the terms "comprises," "comprising," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that includes a list of elements includes not only those elements but also other elements not explicitly listed, or elements inherent to such process, method, article, or apparatus.

[0031] The preferred embodiments of the present invention disclosed above are intended only to help illustrate the present invention. The preferred embodiments do not describe all details in detail, nor do they limit the present invention to the specific embodiments described. Obviously, many modifications and variations are possible based on the contents of this specification. These embodiments are selected and described in detail in this specification to better explain the principles and practical applications of the present invention, thereby enabling those skilled in the art to better understand and utilize the present invention. The present invention is limited only by the claims and their full scope and equivalents.

Claims

1. A carrier fixture for integrated circuit testing, characterized in that: include: A base (1), wherein a mounting frame (2) is provided on the base (1); An adjustment plate (3), wherein two adjustment plates (3) are symmetrically connected to the mounting frame (2), and each adjustment plate (3) is detachably connected to a motorized telescopic rod (4); A fixing plate (5), wherein the fixing plate (5) is connected to one end of the electric telescopic rod (4); A testing mechanism (6), the testing mechanism (6) being connected to the mounting frame (2); A first electric lifting rod (7), the first electric lifting rod (7) being arranged inside the base (1), and a placement plate (8) being connected above the first electric lifting rod (7); A first long waist hole (9) is provided on the adjustment plate (3), and the adjustment plate (3) is detachably connected to the mounting frame (2) via the first long waist hole (9).

2. The supporting fixture for integrated circuit testing according to claim 1, characterized in that: The testing mechanism (6) comprises a second electric lifting rod (61), the second electric lifting rod (61) being connected to the mounting frame (2), a mounting plate (62) being connected below the second electric lifting rod (61), and the mounting plate (62) being detachably connected to the tester (63) via bolts (66).

3. The supporting fixture for integrated circuit testing according to claim 1, characterized in that: The mounting frame (2) is provided with a limiting slide bar (10), and four limiting slide bars (10) are provided.

4. The supporting fixture for integrated circuit testing according to claim 2, characterized in that: The mounting plate (62) is provided with a limiting sliding hole (64) adapted to the limiting sliding rod (10).

5. The supporting fixture for integrated circuit testing according to claim 2, characterized in that: The mounting plate (62) is provided with a second long waist hole (65), and the bolt (66) passes through the second long waist hole (65) and is detachably connected to the tester (63).

6. The supporting fixture for integrated circuit testing according to claim 1, characterized in that: The placement plate (8) is located between the two fixing plates (5).

7. The supporting fixture for integrated circuit testing according to claim 1, characterized in that: A control panel (11) is provided on the base (1).

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