Active radio frequency device test system

Abstract

The utility model discloses an active radio frequency device test system, which comprises a plurality of radio frequency switches, a signal generation module, a data processing module and an active radio frequency device to be tested, wherein the signal generation module is connected with a first end of the active radio frequency device to be tested, and the data processing module is connected with a second end of the active radio frequency device to be tested; test equipment in the signal generation module is connected based on a plurality of radio frequency switches; and test equipment in the data processing module is connected based on a plurality of radio frequency switches. According to the utility model, based on the arrangement of the radio frequency switches, a plurality of active radio frequency device testing devices can be arranged in the same environment at the same time, and the devices used for testing the active radio frequency device to be tested can be switched through selective opening or closing of the radio frequency switches. Therefore, the whole active radio frequency device test system can adapt to different test requirements, and the test efficiency of the active radio frequency device is greatly improved.

Description

Technical Field

[0001] The utility model relates to the field of device testing, in particular to an active radio frequency device testing system. Background Art

[0002] Active RF devices are active components in RF signal chains and are used in a wide variety of RF systems. The difference between active and passive RF devices is that testing active RF devices is generally more complex and involves a wider range of test items, necessitating a system that can verify the various performance parameters of active RF devices.

[0003] Currently, testing active RF devices requires multiple tests to be performed separately for different test items by assembling different test equipment. This connection is complex and inconvenient. Furthermore, a single test environment has limited test parameters, requiring multiple manual connections to different test equipment for different performance tests.

[0004] Therefore, there is an urgent need for an active RF device testing system to solve the current problem that active RF devices require frequent changes in the test environment. Utility Model Content

[0005] An embodiment of the present invention provides an active radio frequency device testing system to solve the problem of frequently changing the test environment when testing active radio frequency devices.

[0006] To solve the above-mentioned problem, an embodiment of the present invention provides an active RF device testing system, comprising: a plurality of RF switches, a signal generation module, a data processing module, and an active RF device to be tested; wherein the signal generation module is connected to a first end of the active RF device to be tested, and the data processing module is connected to a second end of the active RF device to be tested; the test devices in the signal generation module are connected based on the plurality of RF switches; and the test devices in the data processing module are connected based on the plurality of RF switches.

[0007] As an improvement to the above solution, the RF switch includes: a first RF switch, a second RF switch, a third RF switch, a fourth RF switch, and a fifth RF switch; the signal generation module includes: a first signal generator, a second signal generator, a power amplifier, a combiner, and a coupler;

[0008] The test equipment in the signal generation module is connected based on several radio frequency switches, including:

[0009] The first signal generator is connected to the first end of the combiner;

[0010] A first end of the first RF switch is connected to the second signal generator, a second end of the first RF switch is connected to the first end of the second RF switch, and a third end of the first RF switch is connected to the first end of the power amplifier;

[0011] The second end of the second RF switch is connected to the second end of the combiner, the third end of the second RF switch is connected to the first end of the third RF switch, and the fourth end of the second RF switch is connected to the first end of the fourth RF switch;

[0012] The second end of the third RF switch is connected to the third end of the combiner, the third end of the third RF switch is connected to the first end of the fifth RF switch, and the fourth end of the third RF switch is connected to the first end of the coupler;

[0013] The second end of the fourth RF switch is connected to the second end of the power amplifier;

[0014] The second end of the fifth RF switch is connected to the third end of the fourth RF switch.

[0015] As an improvement to the above solution, the signal generating module further includes: a low-pass filter;

[0016] The third end of the fourth RF switch is connected to the second end of the fifth RF switch through the low-pass filter.

[0017] As an improvement to the above solution, the signal generating module is connected to the first end of the active RF device to be tested, including: the second end of the coupler is connected to the first end of the active RF device to be tested.

[0018] As an improvement of the above solution, the RF switch further includes: a sixth RF switch, a seventh RF switch, an eighth RF switch, and a ninth RF switch; the data processing module includes: a first attenuator, a second attenuator, a high-pass filter, and a phase shifter;

[0019] The test equipment in the data processing module is connected based on several radio frequency switches, including:

[0020] The second end of the sixth RF switch is connected to the first end of the phase shifter, the third end of the sixth RF switch is connected to the first end of the first attenuator, and the fourth end of the sixth RF switch is connected to the first end of the second attenuator;

[0021] The first end of the seventh RF switch is connected to the second end of the first attenuator, and the second end of the seventh RF switch is connected to the first end of the high-pass filter;

[0022] The first end of the eighth RF switch is connected to the second end of the high-pass filter, and the second end of the eighth RF switch is connected to the first end of the ninth RF switch;

[0023] The third end of the ninth radio frequency switch is connected to the second end of the phase shifter, and the second end of the ninth radio frequency switch is connected to the second end of the second attenuator.

[0024] As an improvement of the above solution, the data processing module further includes: a spectrum analyzer and a communication tester;

[0025] The fourth end of the ninth radio frequency switch is connected to the spectrum analyzer, and the fifth end of the ninth radio frequency switch is connected to the communication tester.

[0026] As an improvement to the above solution, the data processing module is connected to the second end of the active RF device to be tested, including: the first end of the sixth RF switch is connected to the second end of the active RF device to be tested.

[0027] As an improvement to the above solution, the present invention further comprises: a network analyzer, a resistive load and a tenth radio frequency switch;

[0028] The fifth end of the third RF switch is connected to the fifth end of the sixth RF switch through the network analyzer;

[0029] The first end of the tenth RF switch is connected to the third end of the coupler, the second end of the tenth RF switch is connected to the resistive load, and the third end of the tenth RF switch is connected to the sixth end of the ninth RF switch.

[0030] As an improvement of the above solution, the present invention further includes: a temperature control box; wherein the active radio frequency device to be tested is arranged in the temperature control box.

[0031] As an improvement to the above solution, the resistance value of the resistive load is 50Ω.

[0032] As can be seen from the above, the utility model has the following beneficial effects:

[0033] The present invention provides an active RF device testing system, comprising: a plurality of RF switches, a signal generation module, a data processing module, and an active RF device to be tested; wherein the signal generation module is connected to a first end of the active RF device to be tested, and the data processing module is connected to a second end of the active RF device to be tested; the test equipment in the signal generation module is connected based on a plurality of RF switches; and the test equipment in the data processing module is connected based on a plurality of RF switches. Based on the setting of the RF switches, the present invention can simultaneously set up multiple active RF device testing equipment in the same environment. By selectively turning on or off the RF switches, the equipment used to test the active RF device to be tested can be switched, thereby enabling the entire active RF device testing system to adapt to different testing requirements, reducing the time required for users to switch between different test equipment to test different performance parameters, and greatly accelerating the efficiency of active RF device testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] Figure 1 This is a structural diagram of an active radio frequency device testing system provided by an embodiment of the present utility model;

[0035] Figure 2 This is a structural diagram of a radio frequency switch and a signal generation module provided by an embodiment of the present invention;

[0036] Figure 3 This is a structural diagram of a radio frequency switch and a data processing module provided by an embodiment of the present invention;

[0037] Figure 4 This is a structural diagram of an active radio frequency device testing system provided by another embodiment of the present invention. DETAILED DESCRIPTION

[0038] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0039] Example 1

[0040] See also Figure 1 , Figure 1 This is a schematic diagram of the structure of an active radio frequency device testing system provided by an embodiment of the present invention. Figure 1As shown, this embodiment includes: several RF switches 101, a signal generating module 102, a data processing module 103 and an active RF device to be tested 104; wherein the signal generating module is connected to a first end of the active RF device to be tested, and the data processing module is connected to a second end of the active RF device to be tested; the test equipment in the signal generating module is connected based on several RF switches; and the test equipment in the data processing module is connected based on several RF switches.

[0041] To better illustrate the structure of the active RF device test system, see Figure 2 :

[0042] As an improvement to the above solution, the RF switch 101 includes: a first RF switch 201, a second RF switch 202, a third RF switch 203, a fourth RF switch 204, and a fifth RF switch 205; the signal generation module 102 includes: a first signal generator 206, a second signal generator 207, a power amplifier 208, a combiner 209, and a coupler 211;

[0043] The test equipment in the signal generation module is connected based on several radio frequency switches, including:

[0044] The first signal generator is connected to the first end of the combiner;

[0045] A first end of the first RF switch is connected to the second signal generator, a second end of the first RF switch is connected to the first end of the second RF switch, and a third end of the first RF switch is connected to the first end of the power amplifier;

[0046] The second end of the second RF switch is connected to the second end of the combiner, the third end of the second RF switch is connected to the first end of the third RF switch, and the fourth end of the second RF switch is connected to the first end of the fourth RF switch;

[0047] The second end of the third RF switch is connected to the third end of the combiner, the third end of the third RF switch is connected to the first end of the fifth RF switch, and the fourth end of the third RF switch is connected to the first end of the coupler;

[0048] The second end of the fourth RF switch is connected to the second end of the power amplifier;

[0049] The second end of the fifth RF switch is connected to the third end of the fourth RF switch.

[0050] As an improvement of the above solution, the signal generating module further includes: a low-pass filter 210;

[0051] The third end of the fourth RF switch is connected to the second end of the fifth RF switch through the low-pass filter.

[0052] To better illustrate the relationship between the first RF switch 201, the second RF switch 202, the third RF switch 203, the fourth RF switch 204, the fifth RF switch 205, the first signal generator 206, the second signal generator 207, the power amplifier 208, the combiner 209, the low-pass filter 210 and the coupler 211, see Figure 2 .

[0053] In a specific embodiment, a signal generator is used to transmit single-tone or modulated signals of different frequencies and powers; a power amplifier is used to amplify the signal transmitted by the signal generator; a low-pass filter is used to filter out useless signals such as harmonics of the main frequency signal passing through the power amplifier; a coupler is used for power feedback and detects the power of the temperature control box input port; and a combiner is used to combine the signals transmitted by the first signal generator and the second signal generator into one channel.

[0054] As you can understand, the signal generator transmits corresponding LTE signals, single-tone signals, and so on, based on a built-in waveform file. Simultaneously, the power amplifier amplifies the modulated or single-tone signal output by the signal generator, producing a high-power LTE modulated or single-tone signal. The low-pass filter removes harmonic and spurious signals generated by the LTE or single-tone signal, resulting in a single LTE or single-tone modulated signal. The coupler processes the LTE modulated or single-tone signal to produce a coupled LTE modulated or single-tone signal.

[0055] As an improvement to the above solution, the signal generating module is connected to the first end of the active RF device to be tested, including: the second end of the coupler is connected to the first end of the active RF device to be tested.

[0056] As an improvement to the above solution, the RF switch 101 further includes: a sixth RF switch 212, a seventh RF switch 213, an eighth RF switch 214, and a ninth RF switch 215; the data processing module 103 includes: a first attenuator 216, a second attenuator 217, a high-pass filter 218, and a phase shifter 219;

[0057] The test equipment in the data processing module is connected based on several radio frequency switches, including:

[0058] The second end of the sixth RF switch is connected to the first end of the phase shifter, the third end of the sixth RF switch is connected to the first end of the first attenuator, and the fourth end of the sixth RF switch is connected to the first end of the second attenuator;

[0059] The first end of the seventh RF switch is connected to the second end of the first attenuator, and the second end of the seventh RF switch is connected to the first end of the high-pass filter;

[0060] The first end of the eighth RF switch is connected to the second end of the high-pass filter, and the second end of the eighth RF switch is connected to the first end of the ninth RF switch;

[0061] The third end of the ninth radio frequency switch is connected to the second end of the phase shifter, and the second end of the ninth radio frequency switch is connected to the second end of the second attenuator.

[0062] As an improvement of the above solution, the data processing module further includes: a spectrum analyzer 220 and a communication tester 221;

[0063] The fourth end of the ninth radio frequency switch is connected to the spectrum analyzer, and the fifth end of the ninth radio frequency switch is connected to the communication tester.

[0064] As an improvement to the above solution, the data processing module is connected to the second end of the active RF device to be tested, including: the first end of the sixth RF switch is connected to the second end of the active RF device to be tested.

[0065] It can be understood that the first RF switch 201 can be an SPDT switch, which is used to divide the signal of the signal generator into two signals for time-sharing use; the second RF switch 202 can be an SP3T switch, which divides the signal of the signal generator into three signals, which are respectively given to the combiner, the third RF switch, and the fourth RF switch; the third RF switch 203 can be an SP4T switch, which combines the signals from the combiner, the second RF switch, and the fifth RF switch to the coupler end in time-sharing use; the fourth RF switch 204 can be a DP5T switch, which connects the signal transmitted by the power amplifier and the signal output by the second RF switch to the low-pass filter (time-sharing on and off); the fifth RF switch 205 can be an SP5T switch, which combines multiple signals of the low-pass filter to the third RF switch in time-sharing Frequency switch; the sixth RF switch 212: can be an SP4T switch, which divides the output signal of the active RF device to be tested into 4 paths, which are respectively connected to the network analyzer, the phase shifter, the first attenuator and the second attenuator; the seventh RF switch 213: an SP4T switch, which divides the output signal of the first attenuator into 4 signals and connects them to the high-pass filter for time-sharing operation; the eighth RF switch 214: an SP4T switch, which combines the output signals of the 4-path high-pass filters into one path in time-sharing and connects them to the ninth RF switch; the ninth RF switch 215: a DP4T switch, which outputs the output signal of the phase shifter, the output signal of the eighth RF switch, the output signal of the second attenuator, and the output signal of the tenth RF switch to the spectrum analyzer (responsible for testing signal power, etc.) and the communication tester (responsible for signal communication), respectively.

[0066] To better illustrate the connection relationship between the sixth RF switch 212, the seventh RF switch 213, the eighth RF switch 214 and the ninth RF switch 215, the first attenuator 216, the second attenuator 217, the high-pass filter 218, the phase shifter 219, the spectrum analyzer 220 and the communication tester 221, see Figure 3 .

[0067] In a specific embodiment, a spectrum analyzer is used to measure a known single-tone signal; a communication tester is used to measure a known modulated signal; an attenuator is used to attenuate the energy of the signal in the attenuator path; a high-pass filter is used to filter out the main frequency signal; and a phase shifter is used to change the phase of the load end of the temperature control box.

[0068] In a specific embodiment, the spectrum analyzer processes the power of the radio frequency signal, and the attenuator is used to attenuate the power of the radio frequency signal.

[0069] And in Figure 2 Port 1 in Figure 3 Port 1 in corresponds to, Figure 2 Port 2 in the Figure 3 Port 2 in the corresponding, Figure 2 Port 3 in the Figure 3 The ports 3 in the figure correspond to each other, and data are transmitted to each other.

[0070] As an improvement to the above solution, a network analyzer 222, a resistive load 223 and a tenth radio frequency switch 224;

[0071] The fifth end of the third RF switch is connected to the fifth end of the sixth RF switch through the network analyzer;

[0072] The first end of the tenth RF switch is connected to the third end of the coupler, the second end of the tenth RF switch is connected to the resistive load, and the third end of the tenth RF switch is connected to the sixth end of the ninth RF switch.

[0073] In a specific embodiment, a network analyzer is used to measure the scattering parameters of the temperature-controlled box.

[0074] As an improvement of the above solution, it further includes: a temperature control box; wherein the active radio frequency device to be tested is arranged in the temperature control box.

[0075] As an improvement to the above solution, the resistance value of the resistive load is 50Ω.

[0076] In a specific embodiment, the radio frequency switch involved in the present invention includes a multi-terminal switching control switch, which can switch any connected device and equipment according to user selection.

[0077] In a specific embodiment, the testable performance parameters of the present invention include: insertion loss, return loss, isolation, second-order intermodulation, third-order intermodulation, harmonics, reliability test, gain, 1dB compression point, error vector magnitude, adjacent channel leakage ratio, input standing wave ratio, and robustness.

[0078] In another specific embodiment, see Figure 4 , Figure 4 This is a structural diagram of the active radio frequency device testing system provided by the present invention, to illustrate the connection relationship of each component in the system.

[0079] For better explanation, the following test method for an active RF device test system is provided: After performing a two-port calibration on the network analyzer, device parameter verification (such as insertion loss, input standing wave ratio, return loss, and other parameters) is performed;

[0080] The signal generator can be used with a spectrum analyzer and a comprehensive tester to transmit either continuous waves or LTE modulated waves to verify device parameters such as harmonics, intermodulation distortion, error vector amplitude, and adjacent channel leakage ratio.

[0081] At the same time, the active RF device test system involved in the present invention can also perform gain testing: the second signal generator outputs a signal, which passes through the SPDT switch (i.e., the first RF switch described in the present invention), the SP3T switch (i.e., the second RF switch described in the present invention), and the SP4T switch (i.e., the third RF switch described in the present invention), and then reaches the DUT end (i.e., the active RF device to be tested described in the present invention) through the coupler. After being output from the DUT output end, it passes through the SP4T switch (i.e., the sixth RF switch described in the present invention), the second attenuator, and the SP4T switch (i.e., the ninth RF switch described in the present invention) and reaches the spectrum analyzer to measure the corresponding power. At this time, the gain = the input power value of the active RF device to be tested - the output power value of the active RF device to be tested;

[0082] Among them, the SPDT switch is a single-pole double-throw switch, the SP3T switch is a single-pole three-throw switch, and the SP4T switch is a single-pole four-throw switch.

[0083] As can be seen from the above, this embodiment has the following beneficial effects:

[0084] This embodiment provides an active RF device test system, comprising: a plurality of RF switches, a signal generation module, a data processing module, and an active RF device to be tested; wherein the signal generation module is connected to a first end of the active RF device to be tested, and the data processing module is connected to a second end of the active RF device to be tested; the test equipment in the signal generation module is connected based on a plurality of RF switches; and the test equipment in the data processing module is connected based on a plurality of RF switches. Based on the setting of the RF switch, the utility model can simultaneously set up multiple active RF device test equipment in the same environment. By selectively turning on or off the RF switch, the equipment used to test the active RF device to be tested can be switched, thereby enabling the entire active RF device test system to adapt to different testing requirements, reducing the time for users to switch different test equipment to test different performance parameters, and greatly accelerating the efficiency of active RF device testing.

[0085] The above is a preferred embodiment of the present invention. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the principles of the present invention. These improvements and modifications are also considered to be within the scope of protection of the present invention.

Claims

1. An active radio frequency device testing system, characterized in that: include: Several radio frequency switches, signal generation modules, data processing modules and active radio frequency devices to be tested; wherein the signal generation module is connected to a first end of the active radio frequency device to be tested, and the data processing module is connected to a second end of the active radio frequency device to be tested; the test equipment in the signal generation module is connected based on several radio frequency switches; the test equipment in the data processing module is connected based on several radio frequency switches; The radio frequency switch includes: a first radio frequency switch, a second radio frequency switch, a third radio frequency switch, a fourth radio frequency switch, and a fifth radio frequency switch; the signal generation module includes: a first signal generator, a second signal generator, a power amplifier, a combiner, and a coupler; The test equipment in the signal generation module is connected based on several radio frequency switches, including: The first signal generator is connected to the first end of the combiner; A first end of the first RF switch is connected to the second signal generator, a second end of the first RF switch is connected to the first end of the second RF switch, and a third end of the first RF switch is connected to the first end of the power amplifier; The second end of the second RF switch is connected to the second end of the combiner, the third end of the second RF switch is connected to the first end of the third RF switch, and the fourth end of the second RF switch is connected to the first end of the fourth RF switch; The second end of the third RF switch is connected to the third end of the combiner, the third end of the third RF switch is connected to the first end of the fifth RF switch, and the fourth end of the third RF switch is connected to the first end of the coupler; The second end of the fourth RF switch is connected to the second end of the power amplifier; The second end of the fifth RF switch is connected to the third end of the fourth RF switch.

2. The active radio frequency device testing system according to claim 1, characterized in that: The signal generating module further includes: a low-pass filter; The third end of the fourth RF switch is connected to the second end of the fifth RF switch through the low-pass filter.

3. The active radio frequency device testing system according to claim 1, wherein: The signal generating module is connected to the first end of the active radio frequency device to be tested, including: the second end of the coupler is connected to the first end of the active radio frequency device to be tested.

4. The active radio frequency device testing system according to claim 3, characterized in that: The radio frequency switch further includes: a sixth radio frequency switch, a seventh radio frequency switch, an eighth radio frequency switch, and a ninth radio frequency switch; the data processing module includes: a first attenuator, a second attenuator, a high-pass filter, and a phase shifter; The test equipment in the data processing module is connected based on several radio frequency switches, including: The second end of the sixth RF switch is connected to the first end of the phase shifter, the third end of the sixth RF switch is connected to the first end of the first attenuator, and the fourth end of the sixth RF switch is connected to the first end of the second attenuator; The first end of the seventh RF switch is connected to the second end of the first attenuator, and the second end of the seventh RF switch is connected to the first end of the high-pass filter; The first end of the eighth RF switch is connected to the second end of the high-pass filter, and the second end of the eighth RF switch is connected to the first end of the ninth RF switch; The third end of the ninth radio frequency switch is connected to the second end of the phase shifter, and the second end of the ninth radio frequency switch is connected to the second end of the second attenuator.

5. The active radio frequency device testing system according to claim 4, characterized in that: The data processing module also includes: a spectrum analyzer and a communication tester; The fourth end of the ninth radio frequency switch is connected to the spectrum analyzer, and the fifth end of the ninth radio frequency switch is connected to the communication tester.

6. The active radio frequency device testing system according to claim 5, characterized in that: The data processing module is connected to the second end of the active radio frequency device to be tested, including: the first end of the sixth radio frequency switch is connected to the second end of the active radio frequency device to be tested.

7. The active radio frequency device testing system according to claim 6, characterized in that: Also includes: Network analyzer, resistive load and tenth RF switch; The fifth end of the third RF switch is connected to the fifth end of the sixth RF switch through the network analyzer; The first end of the tenth RF switch is connected to the third end of the coupler, the second end of the tenth RF switch is connected to the resistive load, and the third end of the tenth RF switch is connected to the sixth end of the ninth RF switch.

8. The active radio frequency device testing system according to claim 7, characterized in that: Also includes: Temperature control box; wherein the active radio frequency device to be tested is arranged in the temperature control box.

9. The active radio frequency device testing system according to claim 7 or 8, characterized in that: The resistance value of the resistive load is 50Ω.

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