Double-stage sampling cutter for single-particle sample

By designing a single-particle sample dual-stage sampling cutter, the inadequate sampling problem caused by the traditional sampler is solved, and the grading acquisition of PM2.5 and coarse particles is achieved, ensuring the accuracy and efficiency of electron microscopy analysis.

CN223307938UActive Publication Date: 2025-09-05HEBEI PROVINCIAL ENVIRONMENTAL MONITORING CENT STATION +1
View PDF 0 Cites 0 Cited by

Patent Information

Application Number
CN202323491413.8
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2023-12-20
Publication Date
2025-09-05
Estimated Expiration
2033-12-20

AI Technical Summary

Technical Problem

The prior art lacks active sampling schemes for atmospheric particulate matter suitable for electron microscopy analysis. The traditional cutter does not classify and leads to insufficient sampling, making it difficult to accurately analyze particulate matter in a specific particle size segment.

Method used

A single-particle sample double-stage sampling cutter is designed, including the intake section, the upper acceleration section, the upper acquisition section, the lower acceleration section, the lower acquisition section and the exhaust section. The grading collection of particles is achieved through the upper and lower spray orifice discs and rotary drive parts, and the sample staples and membranes of predetermined sizes are adapted to ensure sampling uniformity.

Benefits of technology

The grading acquisition of PM2.5 and coarse particles at the set flow rate is realized to ensure sampling uniformity. The samples can be directly used for electron microscopy analysis, which improves the accuracy and efficiency of the analysis.

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure CN223307938U_ABST
    Figure CN223307938U_ABST
Patent Text Reader

Abstract

According to the double-stage sampling cutter for the single-particle sample, an air inlet section is connected above an upper accelerating section, and the upper accelerating section is connected above an upper collecting section; an upper spraying hole disc is arranged in the middle of the upper accelerating section, and an upper sample nail covered with an upper sample film is arranged between the upper accelerating section and the upper collecting section; an upper rotary driving part is arranged in the upper acquisition section; the lower acceleration section is connected below the upper acquisition section, and the lower acquisition section is connected below the lower acceleration section; a lower spraying hole disc is arranged in the middle of the lower accelerating section; a lower sample nail covered with a lower sample film is arranged between the lower accelerating section and the lower collecting section; a lower rotary driving piece is arranged in the lower collecting section; the exhaust section is connected below the lower collection section, and airflow entering from the air inlet section sequentially passes through the upper acceleration section, the upper collection section, the lower acceleration section and the lower collection section to be exhausted from the exhaust section. The particle collection device is uniform in particle collection, is matched with a preset sample nail, can be directly used for electron microscope analysis after sampling, is convenient to use, and is beneficial to ensuring the analysis accuracy.
Need to check novelty before this filing date? Find Prior Art

Description

Technical Field

[0001] The utility model belongs to the technical field of atmospheric particle sampling, and in particular relates to a double-stage sampling cutter for single particle samples. Background Art

[0002] With the rapid development of industrialization and urbanization, understanding and monitoring the concentration and composition of atmospheric particulate matter is crucial for environmental protection and public health. Atmospheric particulate matter sampling provides accurate data to help scientists and environmental protection agencies understand the sources and composition of atmospheric particulate matter. By collecting atmospheric particulate matter samples, their chemical composition and size distribution can be analyzed to identify the sources of particulate matter, such as industrial emissions, traffic exhaust, coal combustion, and biomass burning.

[0003] Currently, there is a lack of an active sampling solution for atmospheric particulate matter suitable for electron microscopy analysis. Traditional cutters typically have a single fixed nozzle and no grading, meaning they can only collect all particles above a specific size point. The area of ​​particles on the diaphragm is very small, and the sampling time is short. Because the particle size of ambient particulate matter spans several orders of magnitude, if the particle sample is not graded, it may result in insufficient sampling of particles in specific size ranges (such as PM2.5), and it will cause inconvenience when using electron microscopy to analyze particles with a larger size range. Utility Model Content

[0004] To this end, the utility model provides a double-stage sampling cutter for single-particle samples, which solves the problem that traditional single-particle sample sampling is insufficient due to non-grading and is difficult to use for electron microscope analysis.

[0005] In order to achieve the above-mentioned object, the utility model provides the following technical solutions: a double-stage sampling and cutting device for single particle samples, comprising an air intake section, an upper acceleration section, an upper collection section, a lower acceleration section, a lower collection section and an exhaust section;

[0006] The air inlet section is connected to the upper part of the upper acceleration section, and the upper acceleration section is connected to the upper part of the upper collection section; an upper orifice disk is provided in the middle of the upper acceleration section, and an upper sample pin covering an upper sample film is provided between the upper acceleration section and the upper collection section; an upper rotary drive member is provided inside the upper collection section;

[0007] The lower acceleration section is connected to the lower side of the upper collection section, and the lower collection section is connected to the lower side of the lower acceleration section; a lower orifice disk is provided in the middle of the lower acceleration section, and a lower sample pin covering the lower sample film is provided between the lower acceleration section and the lower collection section; a lower rotary drive member is provided inside the lower collection section;

[0008] The exhaust section is connected to the lower part of the collecting section. The airflow entering from the air intake section passes through the upper acceleration section, the upper collecting section, the lower acceleration section, and the lower collecting section in sequence and is discharged from the exhaust section.

[0009] As a preferred solution of the double-stage sampling cutter for single particle samples, the lower portion of the air inlet section is provided with a first internal thread, and the upper portion of the upper acceleration section is provided with a first external thread; the first internal thread and the first external thread are screwed together;

[0010] The lower portion of the upper acceleration section is provided with a second internal thread, and the upper portion of the upper collection section is provided with a second external thread; the second internal thread and the second external thread are screwed together.

[0011] As a preferred solution of the double-stage sampling cutter for single particle samples, the upper sample membrane covering the upper sample pin is located below the spray hole of the upper spray hole disk;

[0012] The upper rotary drive member is connected to the interior of the upper collection section through an upper mounting seat, the upper mounting seat is formed with an upper mounting hole, the drive head of the upper rotary drive member is located inside the upper mounting hole, and the lower part of the upper sample nail is connected to the drive head of the upper rotary drive member.

[0013] As a preferred solution of the double-stage sampling and cutting device for single particle samples, the upper acceleration section is funnel-shaped above the upper orifice disk;

[0014] The upper spray hole plate is provided with at least two spray holes; the distance between the two spray holes of the upper spray hole plate is smaller than the diameter of the upper sample film.

[0015] As a preferred solution of the double-stage sampling cutter for single particle samples, the lower portion of the upper collection section is provided with a third internal thread, and the upper portion of the lower acceleration section is provided with a third external thread; the third internal thread and the third external thread are screwed together;

[0016] The lower portion of the lower acceleration section is provided with a fourth internal thread, and the upper portion of the lower collection section is provided with a fourth external thread; the fourth internal thread and the fourth external thread are screwed together.

[0017] As a preferred solution of the double-stage sampling cutter for single particle samples, the lower sample membrane covering the lower sample pin is located below the spray hole of the lower spray hole plate;

[0018] The lower rotary drive member is connected to the interior of the lower collection section through a lower mounting seat, the lower mounting seat is formed with a lower mounting hole, the drive head of the lower rotary drive member is located inside the lower mounting hole, and the lower side of the lower sample nail is connected to the drive head of the lower rotary drive member.

[0019] As a preferred solution of the double-stage sampling cutter for single particle samples, the lower acceleration section is funnel-shaped above the lower orifice disk;

[0020] The lower spray hole plate is provided with at least two spray holes; the distance between the two spray holes of the lower spray hole plate is smaller than the diameter of the lower sample membrane.

[0021] As a preferred solution of the double-stage sampling cutter for single particle samples, the lower portion of the lower collection section is provided with a fifth internal thread, and the upper portion of the exhaust section is provided with a fifth external thread;

[0022] The fifth internal thread and the fifth external thread are screwed together.

[0023] As a preferred solution of the double-stage sampling and cutting device for single particle samples, the upper end of the air inlet section is connected to a particle cutting head with a predetermined flow rate, and the particle cutting head is provided with a protective cap.

[0024] As a preferred solution of the double-stage sampling and cutting device for single particle samples, an air pump is connected below the exhaust section, and the air pump is used to allow the external air flow carrying particles to be introduced into the air intake section through the particle cutting head.

[0025] The beneficial effects of the present invention are as follows: it is provided with an air intake section, an upper acceleration section, an upper collection section, a lower acceleration section, a lower collection section and an exhaust section; the air intake section is connected to the top of the upper acceleration section, and the upper acceleration section is connected to the top of the upper collection section; an upper spray hole disk is provided in the middle part of the upper acceleration section, and an upper sample pin covering the upper sample film is provided between the upper acceleration section and the upper collection section; an upper rotating drive member is provided inside the upper collection section; the lower acceleration section is connected to the bottom of the upper collection section, and the lower collection section is connected to the bottom of the lower acceleration section; a lower spray hole disk is provided in the middle part of the lower acceleration section, and a lower sample pin covering the lower sample film is provided between the lower acceleration section and the lower collection section; a lower rotating drive member is provided inside the lower collection section; the exhaust section is connected to the bottom of the lower collection section, and the airflow entering from the air intake section passes through the upper acceleration section, the upper collection section, the lower acceleration section, and the lower collection section in sequence and is discharged from the exhaust section. The utility model can collect single particle samples from the environment in two particle size grades (PM2.5 and coarse particles) under a set flow rate. The particulate matter is collected evenly and is adapted to predetermined sample pins. After sampling, it can be directly used for electron microscope analysis. It is easy to use and helps to ensure the accuracy of the analysis. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for the embodiments or the description of the prior art. Obviously, the drawings described below are only exemplary, and those skilled in the art can also derive other implementation drawings based on the provided drawings without inventive effort.

[0027] The structures, proportions, sizes, etc. illustrated in this specification are intended solely to complement the contents disclosed herein and to facilitate understanding and reading by persons skilled in the art. They are not intended to limit the conditions under which the present invention may be implemented and therefore have no substantive technical significance. Any structural modifications, changes in proportions, or adjustments in size, provided they do not affect the efficacy and objectives of the present invention, shall remain within the scope of the technical contents disclosed herein.

[0028] Figure 1 A schematic diagram of the structure of a dual-stage sampling and cutting device for single particle samples provided by an embodiment of the utility model;

[0029] Figure 2 A cross-sectional schematic diagram of a dual-stage sampling cutter for single particle samples provided by an embodiment of the present utility model;

[0030] Figure 3 A schematic diagram of a decomposed double-stage sampling cutter for single-particle samples provided by an embodiment of the present invention;

[0031] Figure 4 This is a schematic diagram of the structure of the orifice disk in the double-stage sampling and cutting device for single-particle samples provided by an embodiment of the utility model.

[0032] In the figure, 1, air intake section; 2, upper acceleration section; 3, upper collection section; 4, lower acceleration section; 5, lower collection section; 6, exhaust section; 7, upper spray hole disk; 8, upper sample membrane; 9, upper sample pin; 10, upper rotary drive member; 11, lower spray hole disk; 12, lower sample membrane; 13, lower sample pin; 14, lower rotary drive member; 15, first internal thread; 16, first external thread; 17, second internal thread; 18, second external thread; 19, upper mounting hole; 20, third internal thread; 21, third external thread; 22, fourth internal thread; 23, fourth external thread; 24, lower mounting hole; 25, fifth internal thread; 26, fifth external thread. DETAILED DESCRIPTION

[0033] The following describes the implementation of the present invention through specific embodiments. Those skilled in the art can readily understand the other advantages and benefits of the present invention from the contents disclosed in this specification. Obviously, the embodiments described are only a portion of the embodiments of the present invention, not all of them. All other embodiments derived by persons of ordinary skill in the art based on the embodiments of the present invention without inventive effort are also within the scope of protection of the present invention.

[0034] See also Figure 1 、 Figure 2 and Figure 3, the embodiment of the utility model provides a single particle sample double-stage sampling cutter, comprising an air intake section 1, an upper acceleration section 2, an upper collection section 3, a lower acceleration section 4, a lower collection section 5 and an exhaust section 6;

[0035] The air inlet section 1 is connected to the upper part of the upper acceleration section 2, which is connected to the upper part of the upper collection section 3. An upper nozzle plate 7 is provided in the middle of the upper acceleration section 2. An upper sample pin 9 covering an upper sample film 8 is provided between the upper acceleration section 2 and the upper collection section 3. An upper rotary drive member 10 is provided inside the upper collection section 3.

[0036] The lower acceleration section 4 is connected to the lower portion of the upper collection section 3, and the lower collection section 5 is connected to the lower portion of the lower acceleration section 4. A lower orifice disk 11 is provided in the middle portion of the lower acceleration section 4, and a lower sample pin 13 covering a lower sample membrane 12 is provided between the lower acceleration section 4 and the lower collection section 5. A lower rotary drive member 14 is provided inside the lower collection section 5.

[0037] Among them, the exhaust section 6 is connected to the bottom of the lower collection section 5, and the airflow entering from the intake section 1 passes through the upper acceleration section 2, the upper collection section 3, the lower acceleration section 4, and the lower collection section 5 in sequence and is discharged from the exhaust section 6.

[0038] In this embodiment, the upper end of the air intake section 1 is connected to a particle cutting head with a predetermined flow rate, and the particle cutting head is equipped with a protective cap; the lower end of the exhaust section 6 is connected to an air pump, which is used to allow the external airflow to carry particulate matter into the air intake section 1 through the particle cutting head.

[0039] Specifically, the upper portion of the dual-stage single-particle sampling cutter in this embodiment has an outer diameter of 1 / 2 inch and can be connected to a commercially available pre-cutting head or protective cap of a specific flow rate. A vacuum pump connected to the bottom of the exhaust section 6 draws airflow carrying particles through the particle cutting head into the intake section 1, then sequentially into the upper acceleration section 2, upper collection section 3, lower acceleration section 4, lower collection section 5, and exhaust section 6. The airflow and a small amount of ultrafine particles exit the cutter through the exhaust section 6. The dimensions of each cutter component are rigorously calculated and precision-machined to ensure accurate particle size.

[0040] In this embodiment, a first internal thread 15 is provided at the lower portion of the air intake section 1, and a first external thread 16 is provided at the upper portion of the upper acceleration section 2; the first internal thread 15 and the first external thread 16 are screwed together; a second internal thread 17 is provided at the lower portion of the upper acceleration section 2, and a second external thread 18 is provided at the upper portion of the upper collection section 3; the second internal thread 17 and the second external thread 18 are screwed together.

[0041] Specifically, the air intake section 1 is screwed together with the first internal thread 15 at the bottom and the first external thread 16 at the top of the upper acceleration section 2, and the second internal thread 17 at the bottom of the upper acceleration section 2 is screwed together with the second external thread 18 at the top of the upper collection section 3. In order to ensure the sealing of the interfaces between the air intake section 1 and the upper acceleration section 2, and between the upper acceleration section 2 and the upper collection section 3, O-rings can be configured at the interfaces.

[0042] In this embodiment, the upper sample film 8 covering the upper sample pin 9 is located below the nozzle of the upper nozzle plate 7; the upper rotary drive member 10 is connected to the interior of the upper collection section 3 through an upper mounting seat, and the upper mounting seat is formed with an upper mounting hole 19. The drive head of the upper rotary drive member 10 is located inside the upper mounting hole 19, and the drive head of the upper rotary drive member 10 is connected to the bottom of the upper sample pin 9.

[0043] Specifically, the single-particle sample two-stage sampling cutter of this embodiment is adapted to an upper sample pin 9 of a predetermined size, and the prefabricated upper sample film 8 together with the upper sample pin 9 can be directly placed into the cutter without on-site pasting; the upper sample film 8 after sampling can be directly used for electron microscopy analysis.

[0044] Among them, the particles are accelerated by the airflow of the upper acceleration section 2 and hit the upper sample membrane 8 of the upper sample pin 9 of a predetermined size at a certain speed, which can effectively collect particles in a predetermined particle size range; the upper collection section 3 is preliminarily designed to collect and cut the particle size of 2.5 microns, and the lower collection section 5 is preliminarily designed to collect and cut the particle size of 0.2 microns, so that samples of two different particle size ranges (coarse particles and fine particles PM2.5) can be collected at the same time.

[0045] In this embodiment, the upper acceleration section 2 is funnel-shaped above the upper orifice plate 7 ; the upper orifice plate 7 has at least two orifices; and the distance between the two orifices of the upper orifice plate 7 is smaller than the diameter of the upper sample film 8 .

[0046] Specifically, the funnel-shaped design of the upper orifice plate 7 realizes the acceleration of the airflow, and the orifices of the upper orifice plate 7 just correspond to the upper sample film 8, ensuring that the accelerated airflow can hit the upper sample film 8.

[0047] Driven by the upper rotary drive member 10 , the upper sample film 8 covering the upper sample pin 9 can rotate, thereby ensuring that the airflow can impact the upper sample film 8 more evenly, making the particles more evenly distributed on the upper sample film 8 .

[0048] In this embodiment, a third internal thread 20 is provided at the lower portion of the upper collection section 3, and a third external thread 21 is provided at the upper portion of the lower acceleration section 4; the third internal thread 20 and the third external thread 21 are screwed together; a fourth internal thread 22 is provided at the lower portion of the lower acceleration section 4, and a fourth external thread 23 is provided at the upper portion of the lower collection section 5; the fourth internal thread 22 and the fourth external thread 23 are screwed together.

[0049] Specifically, the upper collection section 3 is screwed together with the third internal thread 20 at the bottom and the third external thread 21 of the lower acceleration section 4, and the fourth internal thread 22 of the lower acceleration section 4 is screwed together with the fourth external thread 23 of the lower collection section 5; in order to ensure the sealing of the interfaces between the upper collection section 3 and the lower acceleration section 4, and the lower acceleration section 4 and the lower collection section 5, O-rings can be configured at the interfaces.

[0050] In this embodiment, the lower sample membrane 12 covering the lower sample pin 13 is located below the nozzle of the lower nozzle plate 11; the lower rotary drive member 14 is connected to the interior of the lower collection section 5 through a lower mounting seat, and the lower mounting seat is formed with a lower mounting hole 24. The drive head of the lower rotary drive member 14 is located inside the lower mounting hole 24, and the drive head of the lower rotary drive member 14 is connected to the bottom of the lower sample pin 13.

[0051] Specifically, the single-particle sample two-stage sampling cutter of this embodiment is adapted to a lower sample pin 13 of a predetermined size, and the prefabricated lower sample membrane 12 together with the lower sample pin 13 can be directly placed into the cutter without on-site pasting; the lower sample membrane 12 after sampling can be directly used for electron microscopy analysis.

[0052] Among them, the air flow flowing in from the lower collection section 5, the particles are accelerated by the air flow of the lower acceleration section 4, and hit the lower sample membrane 12 of the lower sample pin 13 of a predetermined size at a certain speed, which can effectively collect particles in a predetermined particle size range; the lower collection section 5 collects and cuts the particle size at 0.2 microns, and the lower collection section 5 cooperates with the upper collection section 3 to collect samples in two different particle size ranges (coarse particles and fine particles PM2.5).

[0053] In this embodiment, the lower acceleration section 4 is funnel-shaped above the lower orifice plate 11 ; the lower orifice plate 11 has at least two orifices; and the distance between the orifices of the two lower orifice plates 11 is smaller than the diameter of the lower sample membrane 12 .

[0054] Specifically, the funnel-shaped design of the lower orifice plate 11 realizes the acceleration of the airflow, and the orifices of the lower orifice plate 11 just correspond to the lower sample membrane 12 , ensuring that the accelerated airflow can hit the lower sample membrane 12 .

[0055] Driven by the lower rotary drive member 14 , the lower sample film 12 covering the lower sample pin 13 can rotate, thereby ensuring that the airflow can impact the lower sample film 12 more evenly, making the particles more evenly distributed on the lower sample film 12 .

[0056] In this embodiment, a fifth internal thread 25 is provided at the lower portion of the lower collecting section 5 , and a fifth external thread 26 is provided at the upper portion of the exhaust section 6 ; the fifth internal thread 25 and the fifth external thread 26 are screwed together.

[0057] Specifically, the lower collecting section 5 is screwed together with the fifth internal thread 25 at the bottom and the fifth external thread 26 at the top of the exhaust section 6. In order to ensure the sealing performance of the interface between the lower collecting section 5 and the exhaust section 6, an O-ring can be configured at the interface.

[0058] In a possible embodiment, only one set of acceleration sections and collection sections may be installed, so that particles in only one particle size range (full-size particles or coarse particles) can be collected.

[0059] To sum up, the utility model is provided with an air intake section 1, an upper acceleration section 2, an upper collection section 3, a lower acceleration section 4, a lower collection section 5 and an exhaust section 6; the air intake section 1 is connected to the top of the upper acceleration section 2, and the upper acceleration section 2 is connected to the top of the upper collection section 3; an upper spray hole disk 7 is provided in the middle part of the upper acceleration section 2, and an upper sample pin 9 covering an upper sample film 8 is provided between the upper acceleration section 2 and the upper collection section 3; an upper rotary driving member 10 is provided inside the upper collection section 3; the lower acceleration section 4 is connected to the bottom of the upper collection section 3, and the lower collection section 5 is connected to the bottom of the lower acceleration section 4; a lower spray hole disk 11 is provided in the middle part of the lower acceleration section 4, and a lower sample pin 13 covering a lower sample membrane 12 is provided between the lower acceleration section 4 and the lower collection section 5; a lower rotary driving member 14 is provided inside the lower collection section 5; the exhaust section 6 is connected to the bottom of the lower collection section 5, and the airflow entering from the air intake section 1 passes through the upper acceleration section 2, the upper collection section 3, the lower acceleration section 4 and the lower collection section 5 in sequence and is discharged from the exhaust section 6. The upper outer diameter of the double-stage sampling cutter for single-particle samples of the present invention is 1 / 2 inch, and it can be connected to a commercially available front cutting head or protective cap of a specific flow rate. The airflow from the outside, carrying particulate matter, is introduced into the air intake section 1 through the particle cutting head via the vacuum pump connected to the bottom of the exhaust section 6, and then enters the upper acceleration section 2, the upper collection section 3, the lower acceleration section 4, the lower collection section 5 and the exhaust section 6 in sequence. The airflow and a small amount of ultrafine particles are discharged from the cutter from the exhaust section 6, and the dimensions of each component of the cutter have been strictly calculated and precisely processed to ensure the accuracy of the particle cutting size. The double-stage sampling cutter for single-particle samples is adapted to an upper sample pin 9 of a predetermined size, and the prefabricated upper sample film 8 can be directly placed into the cutter together with the upper sample pin 9 without the need for on-site pasting; the upper sample film 8 after sampling can be directly used for electron microscopy analysis. The particles are accelerated by the airflow of the upper acceleration section 2 and collide with the upper sample membrane 8 of the upper sample nail 9 of a predetermined size at a certain speed, which can effectively collect particles in a predetermined particle size range; the upper collection section 3 is preliminarily designed to collect and cut particle sizes of 2.5 microns, and the lower collection section 5 is designed to collect and cut particle sizes of 0.2 microns, so that samples of two different particle size ranges (coarse particles and fine particles PM2.5) can be collected at the same time. The funnel-shaped design of the upper orifice disk 7 realizes the acceleration of the airflow, and the orifices of the upper orifice disk 7 correspond exactly to the upper sample membrane 8, ensuring that the accelerated airflow can collide with the upper sample membrane 8. Driven by the upper rotating drive member 10, the upper sample membrane 8 covering the upper sample nail 9 can rotate, thereby ensuring that the airflow can impact the upper sample membrane 8 more evenly, making the particulate matter more evenly distributed on the upper sample membrane 8. The single particle sample double-stage sampling cutter is adapted to a lower sample pin 13 of a predetermined size. The prefabricated lower sample film 12 together with the lower sample pin 13 can be directly placed into the cutter without on-site pasting; the lower sample film 12 after sampling can be directly used for electron microscopy analysis.The airflow flowing in from the lower collection section 5, the particles are accelerated by the airflow of the lower acceleration section 4, and hit the lower sample membrane 12 of the lower sample nail 13 of a predetermined size at a certain speed, which can effectively collect particles in a predetermined particle size range; the lower collection section 5 collects and cuts the particle size to 0.2 microns. The lower collection section 5 cooperates with the upper collection section 3 to collect samples of two different particle size ranges (coarse particles and fine particles PM2.5). The funnel-shaped design of the lower orifice plate 11 realizes the acceleration of the airflow, and the nozzle of the lower orifice plate 11 corresponds exactly to the lower sample membrane 12, ensuring that the accelerated airflow can hit the lower sample membrane 12. Driven by the lower rotary drive member 14, the lower sample membrane 12 covering the lower sample nail 13 can rotate, thereby ensuring that the airflow can impact the lower sample membrane 12 more evenly, making the particulate matter more evenly distributed on the lower sample membrane 12. The utility model can collect single particle samples from the environment in two particle size grades (PM2.5 and coarse particles) under a set flow rate. The particulate matter is collected evenly and is adapted to predetermined sample pins. After sampling, it can be directly used for electron microscope analysis. It is easy to use and helps to ensure the accuracy of the analysis.

[0060] Using the technical solution of this embodiment, a cutter sample was manufactured and tested in Beijing. First, the cutter's cutting performance was tested, revealing that it could effectively segment ambient particulate matter at a depth of 2.5 microns. Subsequently, ambient particulate matter samples were collected using the cutter and analyzed using an electron microscope. The results showed that the sampling performance fully met the design requirements.

[0061] Although the present invention has been described in detail above using general descriptions and specific embodiments, it will be apparent to those skilled in the art that modifications or improvements may be made to the present invention. Therefore, such modifications or improvements, without departing from the spirit of the present invention, are within the scope of protection claimed herein.

Claims

1. A double-stage sampling cutter for single particle samples, characterized in that: It comprises an air intake section (1), an upper acceleration section (2), an upper collection section (3), a lower acceleration section (4), a lower collection section (5) and an exhaust section (6); The air inlet section (1) is connected to the upper part of the upper acceleration section (2), and the upper acceleration section (2) is connected to the upper part of the upper collection section (3); an upper orifice plate (7) is provided in the middle of the upper acceleration section (2), and an upper sample pin (9) covering an upper sample film (8) is provided between the upper acceleration section (2) and the upper collection section (3); an upper rotary drive member (10) is provided inside the upper collection section (3); The lower acceleration section (4) is connected to the lower portion of the upper collection section (3), and the lower collection section (5) is connected to the lower portion of the lower acceleration section (4); a lower orifice disk (11) is provided in the middle portion of the lower acceleration section (4), and a lower sample pin (13) covering a lower sample film (12) is provided between the lower acceleration section (4) and the lower collection section (5); a lower rotary drive member (14) is provided inside the lower collection section (5); The exhaust section (6) is connected below the lower collecting section (5), and the airflow entering from the air intake section (1) passes through the upper acceleration section (2), the upper collecting section (3), the lower acceleration section (4), and the lower collecting section (5) in sequence and is discharged from the exhaust section (6).

2. The single particle sample dual-stage sampling cutter according to claim 1, characterized in that: The lower portion of the air intake section (1) is provided with a first internal thread (15), and the upper portion of the upper acceleration section (2) is provided with a first external thread (16); the first internal thread (15) and the first external thread (16) are screwed together; The lower portion of the upper acceleration section (2) is provided with a second internal thread (17), and the upper portion of the upper collection section (3) is provided with a second external thread (18); the second internal thread (17) and the second external thread (18) are screwed together.

3. The single particle sample dual-stage sampling cutter according to claim 2, characterized in that: The upper sample film (8) covered on the upper sample nail (9) is located below the spray hole of the upper spray hole plate (7); The upper rotary drive member (10) is connected to the interior of the upper collection section (3) via an upper mounting seat, the upper mounting seat is formed with an upper mounting hole (19), the drive head of the upper rotary drive member (10) is located inside the upper mounting hole (19), and the lower part of the upper sample nail (9) is connected to the drive head of the upper rotary drive member (10).

4. The single particle sample dual-stage sampling cutter according to claim 3, characterized in that: The upper acceleration section (2) is funnel-shaped above the upper spray hole disc (7); The upper spray hole disc (7) is provided with at least two spray holes; the distance between the two spray holes of the upper spray hole disc (7) is smaller than the diameter of the upper sample film (8).

5. The single particle sample dual-stage sampling cutter according to claim 1, characterized in that: The lower portion of the upper collecting section (3) is provided with a third internal thread (20), and the upper portion of the lower accelerating section (4) is provided with a third external thread (21); the third internal thread (20) and the third external thread (21) are screwed together; The lower portion of the lower acceleration section (4) is provided with a fourth internal thread (22), and the upper portion of the lower collection section (5) is provided with a fourth external thread (23); the fourth internal thread (22) and the fourth external thread (23) are screwed together.

6. The single particle sample dual-stage sampling cutter according to claim 5, characterized in that: The lower sample film (12) covering the lower sample nail (13) is located below the spray hole of the lower spray hole plate (11); The lower rotary drive member (14) is connected to the interior of the lower collection section (5) through a lower mounting seat, the lower mounting seat is formed with a lower mounting hole (24), the driving head of the lower rotary drive member (14) is located inside the lower mounting hole (24), and the lower side of the lower sample nail (13) is connected to the driving head of the lower rotary drive member (14).

7. The single particle sample dual-stage sampling cutter according to claim 6, characterized in that: The lower acceleration section (4) is funnel-shaped above the lower spray hole disc (11); The lower spray hole disk (11) is provided with at least two spray holes; the distance between the two spray holes of the lower spray hole disk (11) is smaller than the diameter of the lower sample membrane (12).

8. The single particle sample dual-stage sampling cutter according to claim 6, characterized in that: The lower portion of the lower collecting section (5) is provided with a fifth internal thread (25), and the upper portion of the exhaust section (6) is provided with a fifth external thread (26); The fifth internal thread (25) and the fifth external thread (26) are screwed together.

9. The single particle sample dual-stage sampling cutter according to claim 1, characterized in that: The upper end of the air inlet section (1) is connected to a particle cutting head with a predetermined flow rate, and the particle cutting head is provided with a protective cap.

10. The single particle sample dual-stage sampling cutter according to claim 9, characterized in that: An air pump is connected below the exhaust section (6), and the air pump is used to allow the external air flow carrying particles to be introduced into the air intake section (1) through the particle cutting head.