Durability test fixture for direct-current converter

Abstract

The utility model discloses a DC converter durability test fixture, which comprises a test shell and a test clamping platform arranged in the test shell, the test clamping platform is formed by combining a plurality of cylinders and is provided with at least more than two test clamping positions, a cover body is arranged on one side of the outside of the test shell, and the test clamping positions are arranged on the cover body. The cover body comprises a front surface and a back surface, a copper bar is fixed on the back surface of the cover body, the copper bar corresponds to an electrical connection position of a to-be-tested product in the test card placement position, and a wiring layer electrically connected with the copper bar is arranged on the front surface of the cover body. The wiring layer is directly integrated on the front surface of the cover body and is electrically connected with the copper bar, so that cable-free connection between the to-be-tested product and the external power supply is realized, the complexity of electrical connection in the durability test of the direct-current converter is simplified, the problems of poor contact, abrasion and short circuit possibly caused by a traditional cable are avoided, and the stability and reliability of connection are improved.

Description

Technical Field

[0001] The utility model relates to the technical field of electrical testing equipment, in particular to a DC converter durability testing fixture. Background Art

[0002] In existing technologies, electrical test devices generally rely on traditional cable connections to connect the product under test to an external power supply. However, this approach has several problems in practical applications:

[0003] 1. Traditional cable connections are easily affected by the external environment, especially in high-temperature test environments. The cable sheath contacts the high-temperature outer casing of the test sample, which can easily cause damage to the cable sheath, leading to short circuits and other safety hazards.

[0004] 2. To circumvent this problem, the industry usually avoids direct contact between the cable and the high-temperature casing by adding a thermal insulation layer to the cable or taking additional protective measures during the test process.

[0005] However, these measures not only increase the complexity of design and operation, but also cannot completely eliminate the risk of poor contact or cable wear, which affects test stability and reliability.

[0006] In addition, in order to ensure that the test sample can be effectively tested in the test housing, a fixed structure and complex wiring design are usually adopted, which to some extent limits the flexibility and space utilization efficiency of the test device.

[0007] To address the above issues, the industry has also attempted to increase the adaptability of equipment through modular design and adjustment of test card placement platforms. However, this improvement approach still faces challenges such as complex wiring and difficult maintenance, and cannot fundamentally improve test efficiency and device reliability.

[0008] Therefore, how to simplify the electrical connection in a high temperature environment and improve the reliability of the test device has become a technical problem to be solved by the present utility model. Utility Model Content

[0009] The technical problem solved by the present invention is to provide a DC converter durability test fixture to address the defects in the above-mentioned prior art, so as to solve the problems of cable connection complexity and insufficient test stability proposed in the above-mentioned background technology.

[0010] In order to solve the above technical problems, the technical solutions adopted by the present invention are as follows:

[0011] A DC converter durability test fixture includes a test housing and a test card placement platform disposed within the test housing. The test card placement platform is formed by a combination of multiple columns and has at least two test card placement positions. A cover is disposed on one side of the exterior of the test housing. The cover includes a front surface and a back surface. A copper busbar is fixed to the back surface of the cover. The copper busbar corresponds to an electrical connection position of a product to be tested in the test card placement position. A wiring layer electrically connected to the copper busbar is disposed on the front surface of the cover.

[0012] The electrical connection position of the product to be tested includes a conductive structure that cooperates with the copper busbar, and the conductive structure is electrically connected to the external power supply through the wiring layer on the cover;

[0013] The product to be tested is provided with a clamping hole matched with the column, and the product to be tested is clamped on the test clamping platform through the clamping hole.

[0014] As a further solution of the present invention, the test housing is an aluminum alloy test housing.

[0015] As a further solution of the present invention, the column is a stainless steel column.

[0016] As a further solution of the present invention, the column and the test housing are fixedly connected by a snap connection.

[0017] The DC converter durability test fixture also includes a protective cover, which is fixedly connected to the front side of the cover body. A wiring cavity is formed between the protective cover and the cover body, and the wiring layer is located in the wiring cavity.

[0018] As a further solution of the present invention, the test housing includes a shell cavity, and the test card placement platform is located in the shell cavity.

[0019] Compared with the prior art, the beneficial effects of the present invention are:

[0020] 1. The wiring layer is integrated directly into the front of the cover and electrically connected to the copper busbar, enabling a cable-free connection between the product under test and the external power supply. This design effectively simplifies the electrical connection during testing and eliminates the risk of failure caused by poor contact or wear in traditional cable connections, especially in high-temperature test environments. This cable-free connection not only improves connection stability and reliability, but also significantly reduces test setup time and improves overall test efficiency.

[0021] 2. Since the test fixture of the present invention has a completely cable-free design, no current from the cable will flow in the test cavity during the test, thereby greatly reducing electromagnetic interference in the test environment. This design avoids the signal interference caused by cables in traditional tests, making the test data more stable and accurate, and is particularly suitable for high-precision testing. At the same time, under high-temperature testing conditions, the temperature of the test housing of the product to be tested is high. Since there are no cables inside the fixture, damage caused by contact between the cable and the high-temperature test housing is completely eliminated. This cable-free design effectively avoids failures and safety hazards caused by cable damage, ensures the continuity and safety of the test, and is a significant improvement over the existing technology.

[0022] 3. In high-temperature testing environments, the temperature of the test housing of the product under test often rises significantly. However, the present invention's internal cable-free design completely eliminates the risk of damage caused by contact between the cable and the high-temperature test housing. This design effectively prevents short circuits, safety hazards, and test interruptions caused by melting or damaging the cable sheath due to heat, significantly improving the reliability and safety of the test device and ensuring continuous and stable testing under high-temperature conditions.

[0023] Additional aspects and advantages of the present invention will be given in part in the following description and will become apparent from the following description or learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.

[0025] Figure 1 It is a structural diagram of the present utility model.

[0026] Figure 2 for Figure 1 Schematic diagram of the structure from another perspective.

[0027] Figure 3 for Figure 1 Schematic diagram of the structure from another perspective.

[0028] Figure 4 This is a schematic structural diagram of the copper busbar of the present invention.

[0029] Figure 5 This is a schematic diagram of the location structure of the wiring layer.

[0030] Figure 6This is a structural diagram of the test housing and DC converter of the utility model.

[0031] Figure 7 for Figure 6 Schematic diagram of the structure from another perspective.

[0032] Figure 8 This is a schematic structural diagram of the DC converter of the present utility model.

[0033] Figure 9 It is an enlarged schematic diagram of the column of the utility model.

[0034] The reference numerals and names in the figures are as follows:

[0035] Test housing 1, test card placement platform 2, column 3, cover 4, front 5, back 6, copper bus 7, electrical connection position 8, wiring layer 9, conductive structure 10, test housing internal space 12, air outlet 13, DC converter 14, card hole 15 and shell cavity 16. DETAILED DESCRIPTION

[0036] The following is a clear and complete description of the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only a part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0037] See also Figure 1 —9. In an embodiment of the present invention, a DC converter durability test fixture includes a test shell 1 and a test card placement platform 2 arranged inside the test shell 1, the test card placement platform 2 is formed by a combination of multiple columns 3, and has at least two test card placement positions; a cover body 4 is provided on the outer side of the test shell 1, the cover body 4 includes a front side 5 and a back side 6, a copper bus 7 is fixed to the back side 6 of the cover body 4, the copper bus 7 corresponds to the electrical connection position 8 of the product to be tested in the test card placement position, and the front side 5 of the cover body 4 is provided with a wiring layer 9 electrically connected to the copper bus 7; the electrical connection position 8 of the product to be tested includes a conductive structure 10 that cooperates with the copper bus 7, and the conductive structure 10 is electrically connected to an external power supply through the wiring layer 9 on the cover body 4, so as to achieve stable electrical connection of the product to be tested without using a cable and reduce the risk of cable failure.

[0038] The test housing 1 is constructed of aluminum alloy. The column 3 is constructed of stainless steel. The column 3 is securely connected to the test housing 1 via a snap-fit ​​connection. The DC converter durability test fixture also includes a protective cover, which is securely connected to the front surface 5 of the cover 4. A wiring cavity is formed between the protective cover and the cover 4, and a wiring layer 9 is located within the cavity.

[0039] A method for endurance testing of a DC converter, comprising the following steps:

[0040] Step 1: Provide a test fixture with a modular design, the test fixture comprising a test housing 1, a detachable cover 4, multiple test card placement platforms 2, and at least two or more test card placement positions;

[0041] Step 2: Place the DC converter 14 to be tested on the test card placement position. The electrical connection position 8 of the DC converter 14 to be tested includes a conductive structure 10 that matches the copper bus 7 on the cover 4.

[0042] Step 3: Install the cover 4 onto the test housing 1 to electrically connect the conductive structure 10 to the copper bus 7, and electrically connect the DC converter 14 to the external power supply through the wiring layer 9 on the cover 4, thereby achieving a stable electrical connection of the DC converter 14 to be tested without using any cables.

[0043] Step 4: Based on the position of the test housing interior space 12 and the air outlet 13, the position of the modularly designed test card placement platform 2 is adjusted so that multiple DC converters 14 to be tested can be stacked and placed in the area of ​​the test housing air outlet 13, and each DC converter 14 is connected to the power supply through a fixed power interface.

[0044] Step 5: Perform a durability test on the DC converter 14 under different environmental conditions, including but not limited to normal temperature, low temperature, and high temperature conditions.

[0045] The test fixture's test housing 1 is made of aluminum alloy, and the test card placement platform 2 is composed of a stainless steel column. The column 3 is securely connected to the test housing 1 via a snap-fit ​​connection. After the conductive structure 10 and copper busbar 7 are docked, a wiring cavity formed between the cover 4 and the copper busbar 7 shields the conductive structure 10 and the wiring layer 9, reducing electromagnetic interference and improving test accuracy.

[0046] The test shell 1 of the product to be tested is provided with a card hole 15 that matches the column 3. The number of the card holes 15 can be 4 and they are respectively located at the four corners of the test shell 1, so that when multiple columns 3 are card-connected, a stable use effect can be achieved. At this time, the test card placement platform 2 refers to a combination of multiple columns 3 corresponding to the test shell 1 for carding the test shell 1; the product to be tested is carded on the test card placement platform 2 through the card hole; the test shell includes a shell cavity 16, and the test card placement platform 2 is located in the shell cavity 16.

[0047] Example 1:

[0048] During actual high-temperature testing, this utility model solves many problems with conventional technologies through an innovative electrical connection and testing device. A specific application scenario involves testing electronic products that require electrical performance testing in high-temperature environments. These electronic products must undergo extended high-temperature operation within a test enclosure to verify their electrical performance and stability under extreme conditions.

[0049] Traditional testing solutions typically use cables to connect the product under test to an external power source. However, due to the high temperature environment within the test enclosure, the cable sheath often damages when it comes into contact with the hot outer casing of the test sample, leading to short circuits and other safety hazards. To avoid these problems, the industry often implements additional thermal insulation measures or protective devices. However, these measures increase testing complexity and still cannot completely prevent poor contact and wear of cable connections.

[0050] By integrating the wiring layer 9 directly into the front face 5 of the cover 4 and electrically connecting it to the copper busbar 7, this new design achieves a cable-free connection, reducing the potential for failures caused by poor contact or wear in traditional cable connections. During operation, the electronic product under test is directly connected to the external power supply via its conductive contacts connected to the copper busbar 7, avoiding the inevitable damage to the cable sheath in traditional cable connections. The high temperature environment within the test enclosure no longer poses a threat to the cables, improving the safety and reliability of the test.

[0051] At the same time, the products to be tested can be freely stacked and placed in the air outlet area 13 within the test housing. The modular design of the fixture and the fixed position of the power interface allow the wiring harness to be neatly led out from a fixed position, avoiding contact between the cables and other sample housings. Through this arrangement, the risk of damage to the cables by the high-temperature housing is further avoided, eliminating the hidden danger of short circuits. In addition, this design also improves the utilization rate of the test housing space, allowing multiple samples to be tested simultaneously in a limited space, greatly improving test efficiency.

[0052] Example 2:

[0053] In Example 2 of the present invention, the DC converter durability test was conducted in a high-temperature environment. By integrating the wiring layer directly into the front of the fixture cover and electrically connecting it to the copper busbar, a cable-free electrical access method was achieved. This design greatly simplified the electrical connection during the test and avoided the risk of failure associated with traditional cable connections due to poor contact, wear, and damage to the cable sheath in high-temperature environments.

[0054] For example, in a certain actual test application, multiple DC converters need to undergo long-term durability testing in an environment with a temperature of over 80°C. The traditional method relies on cable connections, which not only requires frequent inspection and maintenance of the cable connection status, but also causes the cable sheath to soften and break due to high temperature, resulting in frequent short circuits and test interruptions. This not only reduces the safety and reliability of the test, but also significantly increases the cost and time of the test. These problems have been thoroughly solved through the cable-free design of the present invention. The direct contact between the conductive structure and the copper busbar not only ensures a stable electrical connection, but also avoids contact between the cable and the high-temperature surface, greatly improving the safety of the test and ensuring the stability of the test process.

[0055] In addition, since there are no cables inside the fixture, there is no cable current flowing in the test cavity, which significantly reduces the source of electromagnetic interference. In high-precision tests, such as testing the voltage fluctuations and current characteristics of the converter under different loads, the electromagnetic interference of the cable often has an adverse effect on the accuracy of the test data. The cable-free design of the present invention ensures the "electromagnetic cleanliness" of the test environment, making the test data more stable and accurate. In a high-precision electrical performance test, compared with the traditional cable connection method, the present invention reduced the data deviation rate by about 30%, significantly improved the credibility of the test results, and provided more reliable data support for subsequent analysis.

[0056] Furthermore, the present invention completely eliminates the problem of cable sheath melting caused by contact between traditional cables and the high-temperature casing of the product under test in extremely high-temperature environments. In one simulated high-temperature environment test, traditional cable connection methods caused the cable sheath to soften and deform significantly when the test casing surface temperature exceeded 120°C, seriously affecting test safety and equipment life. The present invention's cable-free design completely avoids this risk, enabling the test device to operate continuously in a high-temperature environment for over 1,000 hours without any failures or interruptions due to cable damage, significantly improving the equipment's reliability and service life.

[0057] From the above demonstration, it can be seen that the utility model not only optimizes the design of the test equipment and improves the test efficiency, but also greatly improves the test safety and data accuracy, especially achieving better durability test results under high temperature and extreme environments.

[0058] In the present invention, unless otherwise clearly stipulated and limited, the terms "install", "set", "connect", "fix", "screw" and the like should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integrated connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium; it can be the internal connection of two elements or the interaction relationship between two elements. Unless otherwise clearly defined, ordinary technicians in this field can understand the specific meanings of the above terms in the present invention according to the specific circumstances.

[0059] It will be apparent to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above, and that the present invention can be implemented in other specific forms without departing from the spirit or essential features of the present invention. Therefore, the embodiments should be considered in all respects as illustrative and non-restrictive, and the scope of the present invention is defined by the appended claims rather than the foregoing description, and it is intended that all variations that come within the meaning and range of equivalents of the claims be embraced within the present invention.

Claims

1. A DC converter durability test fixture, characterized by: The test card placement device comprises a test housing and a test card placement platform disposed inside the test housing, wherein the test card placement platform is formed by combining a plurality of columns and has at least two or more test card placement positions; A cover is provided on one side of the exterior of the test housing. The cover includes a front and a back. A copper busbar is fixed to the back of the cover. The copper busbar corresponds to the electrical connection position of the product to be tested in the test card placement position. A wiring layer electrically connected to the copper busbar is provided on the front of the cover. The electrical connection position of the product to be tested includes a conductive structure that cooperates with the copper busbar, and the conductive structure is electrically connected to the external power supply through the wiring layer on the cover; The product to be tested is provided with a clamping hole matched with the column, and the product to be tested is clamped on the test clamping platform through the clamping hole.

2. The DC converter durability test fixture according to claim 1, characterized in that: The test housing is an aluminum alloy test housing.

3. The DC converter durability test fixture according to claim 1, characterized in that: The column is a stainless steel column.

4. The DC converter durability test fixture according to claim 1, characterized in that: The column and the test housing are fixedly connected by a snap connection.

5. The DC converter durability test fixture according to claim 1, characterized in that: The DC converter durability test fixture also includes a protective cover, which is fixedly connected to the front side of the cover body. A wiring cavity is formed between the protective cover and the cover body, and the wiring layer is located in the wiring cavity.

6. The DC converter durability test fixture according to claim 1, characterized in that: The test housing comprises a housing cavity, and the test card placement platform is located in the housing cavity.

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