Sample clamp for metallographic microscope observation
By designing a sample fixture for metallographic microscope observation, the problem of difficult stable clamping of the sample fixture under upright and inverted microscopes is solved, efficient sample detection is achieved, and it is suitable for stable observation of samples of various sizes.
Patent Information
- Application Number
- CN202422540380.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-21
- Publication Date
- 2025-09-12
- Estimated Expiration
- 2034-10-21
AI Technical Summary
In the prior art, when observing with a metallographic microscope, it is difficult for the sample fixture to simultaneously meet the requirements of convenient use and stable clamping for both upright and inverted microscopes, resulting in low detection efficiency and easy sample falling off.
A sample fixture for metallographic microscope observation is designed, which includes a clamping frame, a clamping plate and an elastic component. In combination with a flat component and an optional magnet component, the clamping frame and the clamping plate cooperate to achieve stable fixation of the sample, and the inspection surface can be kept stable under both upright and inverted microscopes. The flat component and the magnet component are used to improve the positioning and leveling of the sample.
It achieves a stable sample detection surface under upright and inverted microscopes, avoids repeated focusing, improves detection efficiency, and ensures stable clamping and full exposure of the sample, making it suitable for observation of various sample sizes.
Smart Images
Figure CN223333217U_ABST
Abstract
Description
Technical Field
[0001] The utility model belongs to the technical field of metallographic sample clamps, and more specifically relates to a sample clamp for metallographic microscope observation. Background Art
[0002] Metallographic analysis is an important method for testing and failure analysis in steel production. It is becoming a powerful tool for analyzing and studying the relationship between the microstructure and various properties of steel materials, as well as studying material structural transformations. Observing metallographic samples using a microscope is an essential and key step in metallographic analysis.
[0003] Currently, there are two main types of microscopes: upright and inverted. The advantage of an upright microscope is that the inspection surface is fully exposed to the microscope's observation field of view. However, the disadvantage is that it is difficult to level metallographic samples with irregular inspection surfaces. Observing samples of varying heights requires repeated focusing, which is time-consuming, labor-intensive, and inefficient. The advantage of an inverted microscope is that the inspection surface is always on the same horizontal plane regardless of the sample's height, making focusing easier and improving inspection efficiency. However, the disadvantages are that the inspection surface is easily obscured by the stage, the sample is easily detached if it is too small, and the sample is prone to shaking when the stage is moved. Utility Model Content
[0004] The purpose of the utility model is to provide a sample clamp for metallographic microscope observation in response to the deficiencies in the prior art, so as to solve the problem in the prior art that the sample clamp is difficult to simultaneously meet the requirements of convenient use and stable clamping of samples for both upright microscopes and inverted microscopes when observing metallographic samples with a metallographic microscope.
[0005] In order to achieve the above-mentioned object, the utility model provides a sample holder for metallographic microscope observation, comprising:
[0006] A clamping frame, wherein a clamping chamber with two open ends is formed inside the clamping frame, and end surfaces of the clamping frame adjacent to the two open ends of the clamping chamber are parallel to each other;
[0007] a clamping plate, the clamping plate being movably disposed in the clamping chamber, one side of the clamping plate being connected to the clamping frame via an elastic component, and being capable of forming a sample fixing area on the other side of the clamping plate, the sample fixing area being used to fix the sample;
[0008] A flat plate component has a pair of surfaces parallel to each other, and the end surface of the clamping frame can be placed on the surface of the flat plate component and completely fit with the surface of the flat plate component.
[0009] Optionally, a magnet component is further included, and the magnet component is movably arranged on the outside of the clamping frame and is located on a side close to the sample fixing area and away from the elastic component.
[0010] Optionally, the clamping frame is a rectangular frame structure.
[0011] Optionally, both ends of the clamping plate are slidably connected to a pair of opposite inner walls of the clamping frame.
[0012] Optionally, the elastic component is a spring.
[0013] Optionally, the spring is in a pre-compressed state and applies elastic force to the clamp.
[0014] Optionally, the flat plate component is a glass plate.
[0015] Optionally, the clamping frame is made of a metal that can be adsorbed by the magnet component.
[0016] The present invention provides a sample clamp for metallographic microscope observation, which has the following beneficial effects: the sample clamp for metallographic microscope observation can clamp the sample in the sample fixing area for fixing by the cooperation of the clamping frame, the clamping plate and the elastic component; in the process of fixing the sample, the clamping frame can be placed flat on the upper side of the flat component through the fit of the surface of the flat component and the end face of the clamping frame, and the detection surface of the sample is placed toward the surface of the flat component and fits the surface of the flat component, ensuring that the detection surface of the sample is parallel to the end faces of the two ends of the clamping frame. In this way, after the sample is fixed, the position of the detection surface of the sample is stable, and the existence of the flat component makes it very easy and reliable to level the detection surface of the sample; when using an upright microscope, The clamping frame with the fixed sample can be placed within the observation range of the eyepiece of the upright microscope. This can not only ensure the stable clamping and fixation of the sample, but also ensure that the detection surface of the clamped sample is at the same height each time. Even when facing multiple samples with different heights, there is no need to repeatedly adjust the focus when observing them in sequence, thereby improving the test efficiency. When using an inverted microscope, the stage can be removed and the clamping frame with the fixed sample can be placed on the fixed bracket of the inverted microscope, so that the detection surface is above the eyepiece and within the observation range of the eyepiece. The clamping frame is used to form a support to replace the stage, thereby avoiding the stage blocking the inner circle of the fixed bracket and ensuring that the detection surface of the sample can be fully exposed within the inner circle of the fixed bracket.
[0017] Other features and advantages of the present invention will be described in detail in the subsequent detailed description of the embodiments. BRIEF DESCRIPTION OF THE DRAWINGS
[0018] The above and other objects, features and advantages of the present invention will become more apparent through a more detailed description of exemplary embodiments of the present invention in conjunction with the accompanying drawings, wherein the same reference numerals generally represent the same components in the exemplary embodiments of the present invention.
[0019] Figure 1 The figure shows a schematic diagram of the main structure of a sample holder for metallographic microscope observation according to an embodiment of the present utility model.
[0020] Figure 2 The figure shows a schematic top view of a sample holder for metallographic microscope observation according to an embodiment of the present invention.
[0021] Figure 3 Shown is a schematic structural diagram of the inverted microscope fixing bracket and the stage.
[0022] Figure 4 The figure shows a schematic diagram of a sample holder for metallographic microscope observation according to an embodiment of the present invention when placed on a fixed support of an inverted microscope.
[0023] Description of reference numerals:
[0024] 1. Clamping frame; 2. Clamping plate; 3. Sample fixing area; 4. Flat plate component; 5. Elastic component; 6. Magnetic component; 7. Fixed bracket; 8. Stage; 9. Detection surface. DETAILED DESCRIPTION
[0025] The following describes preferred embodiments of the present invention in greater detail. Although preferred embodiments of the present invention are described below, it should be understood that the present invention can be implemented in various forms and should not be limited by the embodiments described herein. Rather, these embodiments are provided to make the present invention more thorough and complete, and to fully convey the scope of the present invention to those skilled in the art.
[0026] like Figure 1 and Figure 2 As shown, the utility model provides a sample holder for metallographic microscope observation, comprising:
[0027] A clamping frame 1, wherein the interior of the clamping frame 1 forms a clamping chamber with two open ends, and end surfaces of the clamping frame 1 near the two open ends of the clamping chamber are parallel to each other;
[0028] A clamping plate 2 is movably disposed in the clamping chamber. One side of the clamping plate 2 is connected to the clamping frame 1 via an elastic member 5, and a sample fixing area 3 is formed on the other side of the clamping plate 2 for fixing the sample.
[0029] The flat plate component 4 has a pair of surfaces that are parallel to each other, and the end surface of the clamping frame 1 can be placed on the surface of the flat plate component 4 and completely fit with the surface of the flat plate component 4 .
[0030] Specifically, in order to solve the problem in the prior art that the sample clamp is difficult to meet the requirements of convenient use and stable clamping of samples for both upright microscopes and inverted microscopes when observing metallographic samples with a metallographic microscope, the sample clamp for metallographic microscope observation provided by the utility model can clamp the sample in the sample fixing area 3 for fixing through the cooperation of the clamping frame 1, the clamping plate 2 and the elastic component 5. In the process of fixing the sample, the clamping frame 1 can be placed flat on the upper side of the flat component 4 through the fit between the surface of the flat component 4 and the end face of the clamping frame 1, and the detection surface 9 of the sample is placed toward the surface of the flat component 4 and fits with the surface of the flat component 4, ensuring that the detection surface 9 of the sample is parallel to the end faces of the two ends of the clamping frame 1. In this way, after the sample is fixed, the position of the detection surface 9 of the sample is stable, and the existence of the flat component 4 makes the detection surface 9 of the sample Leveling becomes very easy and reliable; when using an upright microscope, the clamping frame 1 with the sample fixed can be placed within the observation range of the eyepiece of the upright microscope, which can not only ensure the stable clamping and fixation of the sample, but also ensure that the detection surface 9 of the clamped and fixed sample is at the same height each time. Even when facing multiple samples of different heights, there is no need to repeatedly focus when observing them in sequence, thereby improving the test efficiency; when using an inverted microscope, the stage 8 can be removed, and the clamping frame 1 with the sample fixed can be placed on the fixed bracket 7 of the inverted microscope, so that the detection surface 9 is above the eyepiece and within the observation range of the eyepiece, and the clamping frame 1 is used to form a support to replace the stage 8, thereby avoiding the stage 8 from blocking the inner circle of the fixed bracket 7, and ensuring that the detection surface 9 of the sample can be fully exposed within the inner circle of the fixed bracket 7.
[0031] Further, such as Figure 3 As shown, the inverted microscope has a fixed bracket 7 and a stage 8 arranged above the fixed bracket 7. The fixed bracket 7 is annular, and a first through hole is formed in the inner circle. The stage 8 is also annular, and a second through hole is formed in the inner circumference which is smaller than the first through hole. Then the stage 8 will inevitably block part of the first through hole. When the detection surface 9 of the sample is large, the second through hole may not be able to completely expose the detection surface 9, affecting the detection effect. The sample clamp for metallographic microscope observation provided by the present invention fixes the sample in the clamping frame 1, such as Figure 4 As shown, the clamping frame 1 can directly play a supporting role and is conveniently placed on the fixed bracket 7, so that the sample stage 8 can be removed and the detection surface 9 can be directly exposed through the second through hole, which is convenient for observing and detecting samples with larger detection surfaces 9.
[0032] Optionally, a magnet component 6 is further included, which is movably arranged on the outside of the clamping frame 1 and is located on a side close to the sample fixing area 3 and away from the elastic component 5 .
[0033] Specifically, the arrangement of the magnet component 6 enables the sample to be further magnetically positioned by the magnet component 6 when it is clamped in the sample fixing area 3, thereby improving the stability of the sample fixation. At the same time, the magnet component 6 is moved along the outer wall of the clamping frame 1. The magnetic attraction of the magnet component 6 on the sample can also drive the sample to be fine-tuned in the direction of the flat plate component 4, so that the detection surface 9 of the sample is more closely attached to the surface of the flat plate component 4, thereby improving the positioning and leveling effect of the detection surface 9; especially for tiny samples, since the sample is small, the clamping force provided by the elastic component 5 is limited. The magnetic attraction effect provided by the magnet component 6 can make the fixation of tiny components more stable and reliable.
[0034] Optionally, the clamping frame 1 is a rectangular frame structure.
[0035] Specifically, the clamping frame 1 adopts a rectangular frame structure, and the opposite outer sides are parallel to each other, so that stability is guaranteed when fixing the sample and placing it on the microscope.
[0036] Optionally, both ends of the clamping plate 2 are slidably connected to a pair of opposite inner walls of the clamping frame 1 .
[0037] Specifically, both ends of the clamping plate 2 are in sliding engagement with the opposite inner walls of the clamping frame 1 , and the inner walls are used to guide the movement of the clamping plate 2 .
[0038] In this embodiment, a slide groove is provided on the inner wall of the clamping frame 1, and sliders protruding outward are provided at both ends of the clamping plate 2, and the guiding effect is improved by the cooperation between the sliders and the slide groove.
[0039] Optionally, the elastic component 5 is a spring.
[0040] Specifically, one end of the spring is fixed to the inner wall of the clamping frame 1 , and the other end of the spring is connected to one side of the clamping plate 2 , providing elastic force for the clamping plate 2 so as to clamp the sample through the clamping plate 2 .
[0041] Optionally, the spring is in a pre-compressed state and applies elastic force to the splint 2 .
[0042] Specifically, in the natural state, the splint 2 is pressed against the inner wall of the clamping frame 1 under the action of the spring. The splint 2 can be manually pulled to enlarge the space of the sample fixing area 3 so as to place the sample. Then, the splint 2 can be released to clamp the sample.
[0043] Optionally, the flat plate component 4 is a glass plate.
[0044] Specifically, a glass plate can be used as the flat plate component 4 , which is easy to obtain and manufacture, and easy to clean, thereby helping to avoid contamination of the detection surface 9 of the sample.
[0045] Optionally, the material of the clamping frame 1 is a metal that can be adsorbed by the magnet component 6 .
[0046] Specifically, the clamping frame 1 can be made of steel, which is easy for the magnetic component 6 to be attracted, and is conducive to fixing the magnetic component 6 after moving on the clamping frame 1.
[0047] In summary, when the sample clamp for metallographic microscope observation provided by the present invention is used, it is taken as an example to observe larger samples with an upright microscope: first, the clamping frame 1 is placed on the flat plate component 4, and the clamping plate 2 is pulled to form a sample fixing area 3; then the sample detection surface 9 is placed downward into the sample fixing area 3, and the clamping plate 2 is loosened so that the clamping plate 2 clamps the sample; then the magnet component 6 is moved, and the general direction is to move the magnet toward the direction close to the flat plate component 4, and the position of the sample is fine-tuned so that the detection surface 9 better fits the surface of the flat plate component 4, and the fixing effect of the sample is improved by the magnetic attraction of the magnet component 6; finally, the clamping frame 1 with the fixed sample is picked up from the flat plate component 4, and the detection surface 9 of the sample is placed upward under the eyepiece of the upright microscope, and the detection surface 9 is within the observation range of the eyepiece, and then the focal length is adjusted to start detection.
[0048] Take the example of the sample holder for metallographic microscope observation in conjunction with an inverted microscope to observe larger samples: first, place the clamping frame 1 on the flat plate part 4, and pull the clamp 2 to form a sample fixing area 3; then place the sample detection surface 9 downward into the sample fixing area 3, loosen the clamp 2, so that the clamp 2 clamps the sample; then move the magnet part 6, roughly in the direction of moving the magnet toward the flat plate part 4, to fine-tune the position of the sample, so that the detection surface 9 better fits the surface of the flat plate part 4, and the magnetic attraction of the magnet part 6 improves the fixing effect of the sample; finally, lift the clamping frame 1 with the sample fixed from the flat plate part 4, and remove the stage 8 on the fixing bracket 7 of the inverted microscope, place the detection surface 9 of the sample downward within the observation range of the eyepiece of the inverted microscope, and then adjust the focal length to start detection.
[0049] Take the sample clamp used for metallographic microscope observation to fix tiny samples as an example: first, place the clamping frame 1 on the flat plate part 4, and pull the clamp 2 to form the sample fixing area 3; then place the sample detection surface 9 downward into the sample fixing area 3, loosen the clamp 2, so that the clamp 2 clamps the sample; then move the magnet part 6, roughly in the direction of moving the magnet toward the flat plate part 4, to fine-tune the position of the sample, so that the detection surface 9 better fits the surface of the flat plate part 4, and the magnetic attraction of the magnet part 6 improves the fixing effect of the sample; finally, pick up the clamping frame 1 with the fixed sample from the flat plate part 4, and place it within the observation range of the eyepiece of an upright microscope or an inverted microscope for observation.
[0050] While various embodiments of the present invention have been described above, the above description is intended to be illustrative, not exhaustive, and not limited to the disclosed embodiments. Many modifications and variations will be apparent to those skilled in the art without departing from the scope and spirit of the described embodiments.
Claims
1. A sample holder for metallographic microscope observation, characterized in that: include: A clamping frame, wherein a clamping chamber with two open ends is formed inside the clamping frame, and end surfaces of the clamping frame adjacent to the two open ends of the clamping chamber are parallel to each other; a clamping plate, the clamping plate being movably disposed in the clamping chamber, one side of the clamping plate being connected to the clamping frame via an elastic component, and being capable of forming a sample fixing area on the other side of the clamping plate, the sample fixing area being used to fix the sample; A flat plate component has a pair of surfaces parallel to each other, and the end surface of the clamping frame can be placed on the surface of the flat plate component and completely fit with the surface of the flat plate component.
2. The sample holder for metallographic microscope observation according to claim 1, characterized in that: The device further comprises a magnet component, which is movably arranged on the outside of the clamping frame and is located on a side close to the sample fixing area and away from the elastic component.
3. The sample holder for metallographic microscope observation according to claim 1, characterized in that: The clamping frame is a rectangular frame structure.
4. The sample holder for metallographic microscope observation according to claim 1, characterized in that: Both ends of the clamping plate are respectively slidably connected to a pair of opposite inner walls of the clamping frame.
5. The sample holder for metallographic microscope observation according to claim 1, characterized in that: The elastic component is a spring.
6. The sample holder for metallographic microscope observation according to claim 5, characterized in that: The spring is in a pre-compressed state and applies elastic force to the clamping plate.
7. The sample holder for metallographic microscope observation according to claim 1, characterized in that: The flat plate component is a glass plate.
8. The sample holder for metallographic microscope observation according to claim 2, characterized in that: The material of the clamping frame is metal that can be adsorbed by the magnet component.