Probe in double-hemming form
By designing a probe with a double curling structure and a stable outer ring baffle, the problems of poor contact and easy wear of the ICT probe are solved, higher contact stability and signal transmission quality are achieved, and the service life of the probe is extended.
Patent Information
- Application Number
- CN202422674696.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-04
- Publication Date
- 2025-09-16
- Estimated Expiration
- 2034-11-04
AI Technical Summary
The contact end of the needle tube of existing ICT probes is mostly single-layer curled, with a limited contact point area, resulting in poor contact, easy wear, and insufficient stability, which affects the test results.
A double-curled probe is designed, including a first curling groove and a second curling groove at one end of the needle tube to form a double-curled structure, and a stabilizing outer ring baffle is provided on the outer wall of the tip, combined with the extrusion mechanism of the compression spring to enhance the contact stability.
It improves the contact area and stability between the probe and the circuit board, reduces the contact resistance, ensures the accuracy and reliability of signal transmission, extends the service life of the probe, and improves test efficiency.
Smart Images

Figure CN223346929U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of probes, in particular to a double-curled probe. Background Art
[0002] With the rapid development of electronic technology, the requirements for testing electronic components are becoming increasingly higher. As a key tool in electronic testing, the performance of ICT probes directly affects the accuracy and efficiency of testing.
[0003] For example, the Chinese patent publication number CN201993392U (An ICT test probe) includes a needle tube, which is formed into a hollow tube with an axial insertion channel at the front end and a boss at the rear end. The insertion channel accommodates the probe body, which is connected to a detection head. The insertion channel of the needle tube extends through the needle body. The top of the detection head is serrated or triangularly pyramidal. During use, the needle body is inserted into the front end of the needle tube. During testing, the detection head contacts the test point. A wire is connected to the rear of the needle tube, which connects the needle tube to the tester. Different detection heads can be replaced according to the type of test point.
[0004] However, the contact ends of most existing ICT probes are curled in a single layer, resulting in a limited contact area. This can lead to poor contact, easy wear, and insufficient stability during long-term use, thus affecting test results. Therefore, this does not meet existing needs. Therefore, we propose a double-curled probe. Utility Model Content
[0005] The purpose of the present utility model is to provide a probe with double curled edges to solve the problem proposed in the above-mentioned background technology that the contact ends of the needle tubes of the existing ICT probes are mostly single-layer curled, the contact point area is limited, and long-term use will lead to poor contact, easy wear, and insufficient stability, thereby affecting the test results.
[0006] To achieve the above-mentioned purpose, the utility model provides the following technical solution: a double-curled probe, comprising: a needle tube, a needle assembly is provided on one side of the needle tube, a first curling groove is provided at the edge of one end of the needle tube, a second curling groove is provided on one side of the first curling groove, and a circular arc end is provided at the other end of the needle tube, a needle tube groove is provided inside the needle tube, and one end of the needle tube groove is open, a compression spring is provided inside the needle tube groove, and the needle assembly moves along the needle tube groove to squeeze the compression spring.
[0007] Preferably, the needle assembly includes a needle body and a position-limiting movable body, one end of the position-limiting movable body is provided with a sharp tip, and the sharp tip and the position-limiting movable body are an integral structure.
[0008] Preferably, the needle body portion includes a connector and a test head, and the test head and the connector are an integral structure, and the edge of the connecting end between the position-limiting movable body and the connector is an arc edge.
[0009] Preferably, the outer wall of the pointed head is provided with a stabilizing outer ring baffle, and the stabilizing outer ring baffle is fixed to the pointed head by hot melting.
[0010] Preferably, the stabilizing outer ring baffle is made of tungsten-copper alloy material, and the needle tube and needle assembly are both made of tungsten-copper alloy material, and the outer surface is electroplated with gold.
[0011] Preferably, the first curling groove and the second curling groove are formed by turning and electric spark machining.
[0012] Compared with the prior art, the beneficial effects of the present invention are:
[0013] 1. The utility model provides a first curling groove and a second curling groove at one end of the needle tube, and forms a double curling structure through the first curling groove and the second curling groove. This double curling edge design increases the contact area and stability of the probe and the circuit board under test, effectively improves the contact reliability, and ensures accurate signal transmission. When the ICT probe contacts the circuit board under test, the double curling edge structure can better adapt to the unevenness of the circuit board surface, ensure close contact, increase the contact area and stability of the probe and the circuit board, reduce the shaking and displacement of the probe during the test process, reduce the test error caused by poor contact, and improve the accuracy of the test. At the same time, the double curling edge increases the contact area, reduces the contact resistance, and improves the quality of signal transmission. During the test process, the double curling edge structure can also reduce the wear of the probe and extend the service life of the probe. Stable contact and high-quality signal transmission help to improve test efficiency and reduce test time, solving the problem that the contact end of the needle tube of the existing ICT probe is mostly single-layer curled, the contact point area is limited, and poor contact, easy wear, and insufficient stability will occur during long-term use, thereby affecting the test results.
[0014] 2. By setting a stable outer ring baffle on the outer wall of the tip, when the limit moving body squeezes the compression spring, the tip is inserted into the compression spring, which stabilizes the contact between the limit moving body and the compression spring and avoids position deviation. In addition, the contact and extrusion between the stable outer ring baffle and the compression spring further improves stability, avoids deviation between the limit moving body and the compression spring, strengthens stability, and ensures the reliability of the test. BRIEF DESCRIPTION OF THE DRAWINGS
[0015] Figure 1 It is a schematic diagram of the overall structure of the utility model;
[0016] Figure 2 This is a schematic diagram of the internal structure of the needle tube of the present invention from a top view;
[0017] Figure 3 This is a schematic diagram of the connection structure between the needle assembly and the compression spring of the present utility model;
[0018] Figure 4 This is a schematic structural diagram of the needle assembly of the present utility model;
[0019] In the figure: 1. needle tube; 2. needle assembly; 3. first curling groove; 4. second curling groove; 5. arc end; 6. needle tube groove; 7. compression spring; 8. needle body; 9. limiting movable body; 10. test head; 11. arc edge; 12. pointed head; 13. stabilizing outer ring baffle; 14. connector. DETAILED DESCRIPTION
[0020] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments.
[0021] See also Figure 1-4 , the utility model provides an embodiment: a double-curled probe, comprising: a needle tube 1, a needle assembly 2 is provided on one side of the needle tube 1, a first curling groove 3 is provided at the edge of one end of the needle tube 1, a second curling groove 4 is provided on one side of the first curling groove 3, and an arc end 5 is provided at the other end of the needle tube 1, a needle tube groove 6 is provided inside the needle tube 1, and one end of the needle tube groove 6 is in an open form, a compression spring 7 is provided inside the needle tube groove 6, and the needle assembly 2 moves along the needle tube groove 6 to squeeze the compression spring 7, the needle assembly 2 includes a needle body 8 and a limiting movable body 9, a pointed tip 12 is provided at one end of the limiting movable body 9, and the pointed tip 12 and the limiting movable body 9 are an integrated structure, and the first curling groove 3 and the second curling groove 4 are formed by turning and electrospark machining processes.
[0022] The double curling structure formed by the first curling groove 3 and the second curling groove 4 increases the area and stability of the contact point between the probe and the circuit board under test, effectively improves the reliability of the contact, and ensures accurate signal transmission. When the ICT probe contacts the circuit board under test, the double curling structure can better adapt to the unevenness of the circuit board surface, ensure close contact, increase the contact area and stability of the probe and the circuit board, reduce the shaking and displacement of the probe during the test, and ensure the reliability of the test results. At the same time, the double curling increases the contact area, reduces the contact resistance, and improves the quality of signal transmission. During the test process, the double curling structure can also reduce the wear of the probe and extend the service life of the probe. Stable contact and high-quality signal transmission help to improve test efficiency and reduce test time.
[0023] See also Figure 1、 3 The needle body 8 includes a connector 14 and a test head 10, and the test head 10 and the connector 14 are an integrated structure. The edge of the connection end between the limiting movable body 9 and the connector 14 is an arc edge 11. The edge of the connection between the limiting movable body 9 and the connector 14 is an arc edge 11. The arc edge 11 contacts the inner wall of the second curling groove 4. The arc surface is not easily damaged relative to the pointed surface, thereby improving the service life.
[0024] See also Figure 3 、 4 The outer wall of the pointed head 12 is provided with a stabilizing outer ring baffle 13, and the stabilizing outer ring baffle 13 is fixed to the pointed head 12 by hot melt. When the test head 10 is compressed, the compression spring 7 is squeezed, and the pointed head 12 is inserted into the compression spring 7, which stabilizes the contact between the limit moving body 9 and the compression spring 7, avoiding position deviation, and relies on the stabilizing outer ring baffle 13 to contact and squeeze the compression spring 7, further improving stability, avoiding deviation of the limit moving body 9 and the compression spring 7, enhancing stability, and ensuring the reliability of the test.
[0025] It is further introduced that the stabilizing outer ring baffle 13 is made of tungsten-copper alloy material, and the needle tube 1 and the needle assembly 2 are both made of tungsten-copper alloy material, and are electroplated with gold on the outer surface, so that the probe has good conductivity, elasticity and wear resistance. By electroplating gold on the outer surface, the oxidation resistance and corrosion resistance of the probe are improved.
[0026] Working principle: When in use, the compression spring 7 is placed inside the needle tube groove 6 of the needle tube 1, and the limiting movable body 9 is inserted along the open end of the needle tube groove 6, and the edge of the connection end of the needle tube 1 and the limiting movable body 9 is formed by turning and electrospark machining technology to form the first curling groove 3 and the second curling groove 4. Since the limiting movable body 9 and the connecting body 14 have a size difference, the size difference between one end of the needle tube 1 and the inner wall of the needle tube groove 6 after the first curling groove 3 and the second curling groove 4 are formed, thereby limiting the limiting movable body 9, preventing the limiting movable body 9 from falling and improving stability. The edge of the connection between the limiting movable body 9 and the connecting body 14 is an arc edge 11, which relies on the arc edge 11 to contact the inner wall of the second curling groove 4. The arc surface is not easy to be damaged compared to the pointed surface, which improves the service life. The double curling structure formed by the first curling groove 3 and the second curling groove 4 increases the area and stability of the contact point between the probe and the circuit board under test, effectively improves the reliability of the contact, and ensures the accuracy of the signal. Accurate transmission. When the ICT probe contacts the circuit board under test, the double curling structure can better adapt to the unevenness of the circuit board surface, ensure close contact, increase the contact area and stability of the probe and the circuit board, reduce the shaking and displacement of the probe during the test, and ensure the reliability of the test results. At the same time, the double curling increases the contact area, reduces the contact resistance, and improves the quality of signal transmission. During the test process, the double curling structure can also reduce the wear of the probe and extend the service life of the probe. Stable contact and high-quality signal transmission help to improve test efficiency and reduce test time. When the test head 10 is compressed, the compression spring 7 is squeezed, and the pointed head 12 is inserted into the compression spring 7, which stabilizes the contact between the limit movable body 9 and the compression spring 7 and avoids position displacement. It relies on the stable outer ring baffle 13 to contact and squeeze the compression spring 7, further improving stability, avoiding displacement of the limit movable body 9 and the compression spring 7, strengthening stability, and ensuring the reliability of the test.
[0027] It will be apparent to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above and that the present invention can be implemented in other specific forms without departing from the spirit or essential characteristics of the present invention. Therefore, the embodiments should be considered in all respects as illustrative and non-restrictive, and the scope of the present invention is defined by the appended claims, not the foregoing description, and all variations within the meaning and range of equivalents of the claims are intended to be encompassed within the present invention. Any reference sign in a claim should not be construed as limiting the claim to which it relates.
Claims
1. A double-curled probe, comprising a needle tube (1), characterized in that: A needle assembly (2) is provided on one side of the needle tube (1), a first curling groove (3) is provided at the edge of one end of the needle tube (1), a second curling groove (4) is provided on one side of the first curling groove (3), and a circular arc end (5) is provided at the other end of the needle tube (1). A needle tube groove (6) is provided inside the needle tube (1), and one end of the needle tube groove (6) is open. A compression spring (7) is provided inside the needle tube groove (6), and the needle assembly (2) moves along the needle tube groove (6) to squeeze the compression spring (7).
2. A double-curled probe according to claim 1, characterized in that: The needle assembly (2) comprises a needle body (8) and a position-limiting movable body (9); a pointed tip (12) is provided at one end of the position-limiting movable body (9), and the pointed tip (12) and the position-limiting movable body (9) are an integrated structure.
3. The double-curled probe according to claim 2, characterized in that: The needle body portion (8) comprises a connector (14) and a test head (10), and the test head (10) and the connector (14) are an integral structure. The edge of the connection end between the position-limiting movable body (9) and the connector (14) is an arc edge (11).
4. The double-curled probe according to claim 2, characterized in that: The outer wall of the pointed head (12) is provided with a stabilizing outer ring baffle (13), and the stabilizing outer ring baffle (13) is fixed to the pointed head (12) by hot melting.
5. The double-curled probe according to claim 4, characterized in that: The stabilizing outer ring baffle (13) is made of a tungsten-copper alloy material, and the needle tube (1) and the needle assembly (2) are both made of a tungsten-copper alloy material, and the outer surfaces are electroplated with gold.
6. The double-curled probe according to claim 1, characterized in that: The first curling groove (3) and the second curling groove (4) are formed by turning and electric spark machining processes.
Citation Information
Patent Citations
ICT test probe
CN201993392U
Cited By
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