Integrated circuit aging test device

Abstract

The utility model relates to the technical field of integrated circuit testing, solves the technical problem that which component is aged cannot be determined in time, and particularly relates to an integrated circuit aging testing device which comprises a conveying frame serving as a supporting base, and a centralized detection mechanism for comprehensively detecting an integrated circuit is arranged on the conveying frame. A conveying and fixing mechanism for fixing an integrated circuit to be conveyed is arranged on the conveying frame, and the centralized detection mechanism comprises a detection frame arranged on the outer side of the discharging end of the conveying frame. Due to the arrangement of the centralized detection mechanism, voltage detection can be carried out on a plurality of components on the integrated circuit board at the same time at one time, whether the components are aged or not is judged by comparing detected voltage values with standard values, and comparison values can be stored in the voltage detection terminal so as to facilitate later comparison. The detection efficiency can be improved.

Description

Technical Field

[0001] The utility model relates to the technical field of integrated circuit testing, and in particular to an integrated circuit aging testing device. Background Art

[0002] An integrated circuit is a miniature electronic device or component. Using a specific process, the transistors, resistors, capacitors, inductors, and other components required for a circuit, along with interconnected wiring, are fabricated on one or several small semiconductor wafers or dielectric substrates. These are then packaged in a housing, resulting in a miniature structure that performs the desired circuit function. Semiconductor chips are manufactured by etching and wiring a semiconductor wafer to create a semiconductor device capable of performing a specific function. However, existing integrated circuit aging testers cannot immediately determine which component is degraded when detecting aging in the integrated circuit. Manual testing is required to sequentially test each component on the integrated circuit to determine which component is degraded, reducing testing efficiency. Utility Model Content

[0003] In view of the shortcomings of the existing technology, the utility model provides an integrated circuit aging test device, which solves the technical problem of being unable to promptly determine which component is aging, thereby achieving the purpose of improving the efficiency of detection operations.

[0004] To solve the above technical problems, the present invention provides the following technical solutions: an integrated circuit aging test device, comprising a conveyor frame as a supporting base, the conveyor frame being provided with a centralized detection mechanism for performing comprehensive detection on the integrated circuits, and the conveyor frame being provided with a conveyor fixing mechanism for fixing the integrated circuits to be conveyed;

[0005] The centralized detection mechanism includes a detection frame arranged on the outside of the discharging end of the conveying frame, and a plurality of guide downward pressure slides are respectively provided at both ends of the inner side of the detection frame, and a downward pressure cylinder is installed on the top of the detection frame through the base, and a voltage detection terminal is installed on the top of the detection frame on one side of the downward pressure cylinder through the base, and the inner sides of several of the guide downward pressure slides are slidably connected to parallel cross frames through sliding rods, and the top of the parallel cross frame is connected to the extended end of the downward pressure cylinder, and the bottom end of the parallel cross frame is rotatably connected to a plurality of adjustment slide rails, and the inner sides of several of the adjustment slide rails are slidably connected to two detection touch rods, and one side of several of the adjustment slide rails is penetrated by a limiter slide groove, and the inner sides of the limiter slide grooves are slidably connected to two touch rod limiters.

[0006] Preferably, the touch rod limiter is a bolt limiter, and the two touch rod limiters located on the inner side of the same adjustment slide rail are respectively rotationally connected to the adjacent detection touch rods.

[0007] Preferably, the power output terminals and the power input terminals of the plurality of detection feelers are connected to the power input terminal and the power output terminal of the voltage detection terminal.

[0008] Preferably, the conveying fixing mechanism includes a conveying motor installed on one side of the discharge end of the conveying frame, a conveyor belt is connected to the inner side of the conveying frame through a rotating shaft, and guide downward pressing slide rails are fixedly connected to the top ends of both sides of the conveying frame.

[0009] Preferably, a number of integrated circuit boards are placed equidistantly on the top of the conveyor belt, a support frame is fixedly connected to the top of the feed end of the conveyor frame, and two guide arc plates are fixedly connected to the bottom inner end of the support frame through a connecting rod.

[0010] Preferably, a plurality of fixed blocks are equidistantly fixedly connected to both sides of the top of the conveyor belt, a clamping rod is rotatably connected to the middle of the fixed block, and return springs are connected between the two side ends of the clamping rod and the fixed block.

[0011] By means of the above technical solution, the present invention provides an integrated circuit aging test device, which has at least the following beneficial effects:

[0012] 1. Due to the setting of the centralized detection mechanism, the utility model can perform voltage detection on several components on the integrated circuit board at one time. By comparing the detected voltage value with the standard value, it is determined whether the component has aged. The comparison value will be stored in the voltage detection terminal for later comparison, which can improve the detection efficiency.

[0013] 2. Due to the setting of the conveying and fixing mechanism, the utility model can guide and convey the integrated circuit board, and clamp and fix the integrated circuit board during the conveying, so that the circuit board will not become loose in the later detection stage, which can avoid errors during the detection period and improve the detection accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] The drawings described herein are used to provide further understanding of the present application and constitute a part of the present application. The illustrative embodiments of the present application and their descriptions are used to explain the present application and do not constitute improper limitations on the present application.

[0015] In the attached figure:

[0016] Figure 1 It is a schematic diagram of the three-dimensional structure of the utility model;

[0017] Figure 2 This is a schematic diagram of the installation structure of the voltage detection terminal of the present utility model;

[0018] Figure 3 This is a schematic diagram of the detection touch rod installation structure of the utility model;

[0019] Figure 4 This is a schematic diagram of the installation structure of the guide downward pressure slide rail of the utility model;

[0020] Figure 5 This is a schematic diagram of the installation structure of the guide arc plate of the utility model;

[0021] Figure 6 For this utility model Figure 5 A schematic diagram of the enlarged structure.

[0022] In the figure: 1. Conveyor rack;

[0023] 2. Centralized detection mechanism; 201. Detection frame; 202. Guide downward pressure chute; 203. Downward pressure cylinder; 204. Voltage detection terminal; 205. Parallel cross frame; 206. Adjustment slide rail; 207. Detection contact rod; 208. Stopper chute; 209. Contact rod stopper;

[0024] 3. Conveying and fixing mechanism; 301. Conveying motor; 302. Conveyor belt; 303. Guide and downward pressing slide rail; 304. Integrated circuit board; 305. Support frame; 306. Guide arc plate; 307. Fixing block; 308. Clamping rod; 309. Return spring. DETAILED DESCRIPTION

[0025] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0026] Example 1

[0027] However, one of the existing integrated circuit aging test devices cannot determine which component is aged in time when the integrated circuit is detected to be aged. It is necessary to manually test the components on the integrated circuit one by one through the detection device to determine which component is aged, thereby reducing the efficiency of the detection operation. Figures 1-6 This embodiment provides an integrated circuit aging test device that solves the technical problem of being unable to promptly determine which components are aging. The device includes a conveyor frame 1 as a supporting base. A centralized testing mechanism 2 is mounted on the conveyor frame 1 to perform comprehensive testing on the integrated circuits. A conveyor fixing mechanism 3 is also mounted on the conveyor frame 1 to secure the integrated circuits being conveyed. The conveyor fixing mechanism 3 conveys and secures the integrated circuits, while the centralized testing mechanism 2 performs a unified test on all components of the conveyed integrated circuits.

[0028] In order to uniformly inspect components at different positions in multiple integrated circuits at one time, the centralized inspection mechanism 2 includes an inspection frame 201 arranged outside the discharge end of the conveyor frame 1, a plurality of guide downward pressure chutes 202 are respectively provided at both ends of the inner side of the inspection frame 201, a downward pressure cylinder 203 is installed at the top of the inspection frame 201 through the base, a voltage detection terminal 204 is installed at the top of the inspection frame 201 on one side of the downward pressure cylinder 203 through the base, a parallel cross frame 205 is slidably connected to the inner side of the plurality of guide downward pressure chutes 202 through a sliding rod, the top of the parallel cross frame 205 is connected to the extended end of the downward pressure cylinder 203, and the bottom of the parallel cross frame 205 is rotatably connected to a plurality of adjustment rails 206, the inner sides of the plurality of adjustment rails 206 are slidably connected to two detection feelers 207, and a limiter chute 208 is provided on one side of the plurality of adjustment rails 206, and the inner sides of the limiter chute 208 are slidably connected to two feeler limiters 209.

[0029] In order to adjust the position of the detection rod 207 according to the different positions of the components relative to the integrated circuit, the rod stopper 209 is a bolt stopper, and the two rod stoppers 209 on the inner side of the same adjustment slide 206 are respectively rotatably connected to the adjacent detection rods 207.

[0030] In order to uniformly display the data detected by the detection rods 207 on the voltage detection terminal 204 and determine the degree of aging by detecting the voltage of the components, the power output and power input terminals of the detection rods 207 are connected to the power input and power output terminals of the voltage detection terminal 204.

[0031] First, the operator needs to adjust the position of the detection feeler rod 207 according to the installation position of the components on the integrated circuit. By rotating the adjustment slide 206, the adjustment slide 206 is parallel to the power input and power output terminals of the component. Then, the distance between the two detection feeler rods 207 in the same adjustment slide 206 is adjusted according to the distance between the two. Finally, the two detection feeler rods 207 are fixed by the touch rod limiter 209. Then, the remaining adjustment slides 206 are adjusted in sequence so that each adjustment slide 206 corresponds to a different component. After the transport and fixing mechanism 3 drives the integrated circuit to the bottom of the centralized detection mechanism 2, the downward pressure cylinder 203 is activated. At this time, the downward pressure cylinder 203 will drive the parallel cross frame 205 to slide downward. The parallel cross frame 205 will drive the several adjustment slides 206 connected to the bottom of the rotation to move downward. The adjustment slide 206 will drive the two detection feeler rods 207 slidably connected inside it to move downward until the power input and output terminals of the several components are connected.

[0032] Example 2

[0033] On the basis of Example 1, Example 1 solves the technical problem of not being able to determine which component is aging in time, but there is still the problem that the integrated circuit board needs to be manually positioned. Figures 1-6 As shown, the specific implementation process is as follows: In order to fix and clamp the integrated circuit being conveyed, the conveying and fixing mechanism 3 includes a conveying motor 301 installed on the discharge side of the conveying frame 1. A conveyor belt 302 is sleeved on the inside of the conveying frame 1 via a rotating shaft. Guide downward slide rails 303 are fixedly connected to the top of both sides of the conveying frame 1. A number of fixed blocks 307 are fixedly connected to the top of the conveyor belt 302 at equal intervals. A clamping rod 308 is rotatably connected to the middle of the fixed block 307. Return springs 309 are connected between the ends of the clamping rod 308 and the fixed block 307.

[0034] In order to guide the integrated circuits being transported, a number of integrated circuit boards 304 are placed equidistantly on the top of the conveyor belt 302. A support frame 305 is fixedly connected to the top of the feeding end of the conveyor frame 1. The bottom of the support frame 305 is fixedly connected to two guide arc plates 306 through connecting rods.

[0035] The conveyor belt 302 is driven by the conveying motor 301 for conveying, and then the operator places the integrated circuit board 304 at equal distances on the top of the conveyor belt 302. Then the conveyor belt 302 will drive the integrated circuit board 304 on its top for conveying. During this period, the integrated circuit board 304 will pass through the middle of the guide arc plate 306, and the guide arc plate 306 will guide the integrated circuit board 304 to the middle of the conveyor belt 302. As the conveying continues, the guide downward pressing slide 303 will press down the clamping rod 308 connected to the conveyor belt 302 through the fixed block 307 until the clamping rod 308 is pressed down to clamp and fix the integrated circuit board 304. After the clamping rod 308 is separated from the bottom of the guide downward pressing slide 303, the reset spring 309 connected to the two ends of the clamping rod 308 can reset the clamping rod 308.

[0036] It should be noted that, in this article, the terms "comprises", "includes" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, article or apparatus that includes a series of elements includes not only those elements, but also includes other elements not explicitly listed, or also includes elements that are inherent to such process, method, article or apparatus.

[0037] Although the embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and variations may be made to these embodiments without departing from the principles and spirit of the present invention, and the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. An integrated circuit aging test device, comprising a conveyor frame (1) as a supporting base, characterized in that: The conveying rack (1) is provided with a centralized detection mechanism (2) for performing comprehensive detection on the integrated circuit, and the conveying rack (1) is provided with a conveying fixing mechanism (3) for fixing the integrated circuit to be conveyed; The centralized detection mechanism (2) comprises a detection frame (201) arranged on the outside of the discharge end of the conveying frame (1), a plurality of guide downward pressure chutes (202) are respectively provided at both ends of the inner side of the detection frame (201), a downward pressure cylinder (203) is installed at the top of the detection frame (201) through a base, a voltage detection terminal (204) is installed at the top of the detection frame (201) on one side of the downward pressure cylinder (203) through a base, and the inner sides of the plurality of guide downward pressure chutes (202) are slidably connected to each other through a sliding rod. There is a parallel cross frame (205), the top of the parallel cross frame (205) is connected to the extended end of the downward pressure cylinder (203), the bottom of the parallel cross frame (205) is rotatably connected to a plurality of adjustment slide rails (206), the inner sides of the plurality of adjustment slide rails (206) are slidably connected to two detection touch rods (207), one side of the plurality of adjustment slide rails (206) is penetrated by a limiter slide groove (208), and the inner sides of the limiter slide groove (208) are slidably connected to two touch rod limiters (209).

2. The integrated circuit aging test device according to claim 1, characterized in that: The touch rod limiter (209) is a bolt limiter, and the two touch rod limiters (209) located inside the same adjustment slide rail (206) are respectively rotatably connected to the adjacent detection touch rods (207).

3. The integrated circuit aging test device according to claim 1, characterized in that: The power output ends and power input ends of the plurality of detection touch rods (207) are connected to the power input end and power output end of the voltage detection terminal (204).

4. The integrated circuit aging test device according to claim 1, wherein: The conveying fixing mechanism (3) comprises a conveying motor (301) mounted on one side of the discharge end of the conveying frame (1); a conveying belt (302) is sleeved on the inner side of the conveying frame (1) via a rotating shaft; and guiding downward pressing slide rails (303) are fixedly connected to the top ends of both sides of the interior of the conveying frame (1).

5. The integrated circuit aging test device according to claim 4, characterized in that: A plurality of integrated circuit boards (304) are equidistantly placed on the top of the conveyor belt (302); a support frame (305) is fixedly connected to the top of the feed end of the conveyor frame (1); and two guide arc plates (306) are fixedly connected to the inner bottom end of the support frame (305) via a connecting rod.

6. The integrated circuit aging test device according to claim 4, characterized in that: A plurality of fixed blocks (307) are fixedly connected at equal distances on both sides of the top of the conveyor belt (302), a clamping rod (308) is rotatably connected in the middle of the fixed block (307), and a return spring (309) is connected between the two side ends of the clamping rod (308) and the fixed block (307).

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