Multi-channel parallel chip testing device

Abstract

The utility model relates to a multipath parallel chip testing device which comprises an operation table, a conveying belt is arranged in the operation table, fixing blocks are fixedly installed on the left side and the right side of the operation table respectively, a frame is fixedly installed between the tops of the two fixing blocks, and a detection mechanism is arranged on the outer surface of the frame. And placing grooves are formed in the two fixing blocks. According to the multi-path parallel chip testing device, the conveying belt is arranged to achieve conveying with a testing jig, and the driving motor, the rotating rod, the driving bevel gear, the threaded rod, the driven bevel gear and the threaded block are arranged to be matched, so that the threaded rod can be driven to rotate through meshing among the gears under the starting of the driving motor; and the rotation of the threaded rod can drive the threaded block to move left and right, so that the test fixture is transported through the cooperation of the clamping plate, and meanwhile, the test fixture can be clamped and fixed through the design between the circular gear and the toothed plate.

Description

Technical Field

[0001] The utility model relates to the technical field of chip testing, in particular to a multi-channel parallel chip testing device. Background Art

[0002] With the growth of emerging industries such as mobile Internet, cloud computing, Internet of Things, and big data, the electronic information industry has entered a new stage of development; control, communication, human-computer interaction, and network interconnection have integrated a large number of emerging electronic technologies, and equipment functions are becoming more and more complex, and system integration is becoming more and more complex. The development of emerging electronic information technology depends on the continuous promotion of the semiconductor industry. Therefore, as a core technology, the use of chips has become more and more frequent and important.

[0003] After the chip is packaged, it is generally tested to separate good products from defective products, so chip testing equipment is used.

[0004] After searching, according to the use of the new model disclosed in the Chinese application number "CN202020584392.1", the chip test pipeline is set to complete the chip test on the test fixture. The driving mechanism can sort the test fixtures according to the detection results. When the test is good, the driving mechanism can place the test fixture on the good product unloading mechanism through one of the unloading holes, and unload the product through the good product unloading mechanism. When the test is defective, the driving mechanism can place the test fixture on the defective product unloading mechanism through another unloading hole, and unload the defective product. However, the device still has shortcomings. One of them is that the test fixture falls off. When the test jig falls onto the placement plate, it is positioned close to the positioning block, and there is a lack of protection for the test jig. When the test jig falls onto the placement plate, there will be an impact force, and the impact force will cause the test jig to be damaged again, reducing the life of the test jig; secondly, the positioning mechanism, the second bidirectional clamping cylinder, and the second clamping plate set when clamping the test jig in this patent are relatively redundant. The test jig is positioned and clamped by the positioning mechanism, and then the positioning mechanism is moved sideways after the test is completed. The second bidirectional clamping cylinder drives the second clamping movement to clamp the test jig again. This operation method wastes costs and has the disadvantages of repeated operations. Therefore, a multi-channel parallel chip testing device is proposed to solve the above-mentioned problems. Utility Model Content

[0005] In view of the deficiencies in the prior art, the utility model provides a multi-channel parallel chip testing device with convenient operation.

[0006] To achieve the above-mentioned object, the present invention provides the following technical solution: a multi-channel parallel chip testing device, comprising an operating table, a conveyor belt disposed inside the operating table, fixed blocks fixedly mounted on both left and right sides of the operating table, a frame fixedly mounted between the tops of the two fixed blocks, a detection mechanism disposed on the outer surface of the frame, and a placement slot disposed inside the two fixed blocks;

[0007] The detection mechanism includes a groove, a groove is opened inside the frame, a driving motor is fixedly installed on the top outer surface of the frame, a rotating rod is fixedly installed at the output shaft of the driving motor, an active bevel gear is fixedly installed on the outer surface of the rotating rod, a threaded rod is rotatably installed inside the groove, a driven bevel gear is fixedly installed on the outer surface of the threaded rod, a threaded block is threadedly connected to the outer surface of the threaded rod, a hydraulic cylinder is fixedly installed at the bottom of the threaded block, and a function box is fixedly installed at the bottom of the hydraulic cylinder;

[0008] A rotating motor is fixedly installed on the front inner wall of the functional box, a circular gear is fixedly installed on the output shaft of the rotating motor, two tooth plates are meshed on the outer surface of the circular gear, connecting rods are fixedly installed on the opposite sides of the two tooth plates, clamping plates are fixedly installed on the bottom of the two connecting rods, a sensor is fixedly installed at the middle position of the bottom outer surface of the functional box, a horizontal plate is fixedly installed on the front of the functional box, and an elastic probe is installed on the bottom of the horizontal plate.

[0009] Preferably, the driven bevel gear is meshed with the outer surface of the driving bevel gear, a slide groove is provided on the bottom outer surface of the frame, and the bottom of the hydraulic cylinder passes through the slide groove and extends to the outside of the frame.

[0010] Preferably, a slide rail is provided on the inner top wall of the functional box, and pulleys adapted to the slide rail are fixedly mounted on the tops of the two connecting rods.

[0011] Preferably, two rectangular grooves are opened at the bottom of the functional box, and the bottoms of the two connecting rods pass through the rectangular grooves and extend to the outside of the functional box, and protective pads are provided on the opposite sides of the two clamping plates.

[0012] Preferably, the two placement boxes are both on the same vertical level as the placement slot.

[0013] Preferably, the driving motor, the hydraulic cylinder, the rotary motor, the sensor, the elastic probe and the rotary motor are electrically connected via wires.

[0014] Compared with the existing technology, the technical solution of this application has the following beneficial effects:

[0015] 1. The multi-channel parallel chip test device can achieve the transportation of the test fixture by setting up a conveyor belt, and the cooperation of the driving motor, rotating rod, active bevel gear, threaded rod, driven bevel gear and threaded block can drive the threaded rod to rotate through the engagement between the gears when the driving motor is started, and the rotation of the threaded rod can drive the threaded block to move left and right, and then the test fixture is transported by the cooperation of the clamping plate. At the same time, the design between the circular gear and the toothed plate can clamp the test fixture. When the sensor senses the test fixture, the clamping plate clamps the test fixture until the test is good or defective. Then, the clamping plate is moved to the placement slot to sort the test fixture, and only one clamping is required, which can achieve the purpose of convenient operation and improved work efficiency.

[0016] 2. The multi-channel parallel chip test device is equipped with a conveying mechanism. When the test fixture falls into the placement box, the buffer plate can buffer the test fixture to protect the test fixture. At the same time, the placement box can be moved by starting the rotating motor to achieve the purpose of transporting the test fixture after testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 This is a three-dimensional diagram of the structure of the utility model;

[0018] Figure 2 This is a cross-sectional view of the structure of the utility model;

[0019] Figure 3 For this utility model Figure 1 A magnified view of the structure at center A;

[0020] Figure 4 For this utility model Figure 2 Enlarged view of the structure at point B in the middle.

[0021] In the figure: 1. operating table; 2. conveyor belt; 3. fixing block; 4. frame; 5. detection mechanism; 501. groove; 502. driving motor; 503. rotating rod; 504. active bevel gear; 505. threaded rod; 506. driven bevel gear; 507. threaded block; 508. hydraulic cylinder; 509. function box; 510. rotating motor; 511. circular gear; 512. tooth plate; 513. connecting rod; 514. clamping plate; 515. sensor; 516. horizontal plate; 517. elastic probe; 6. placement slot. DETAILED DESCRIPTION

[0022] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0023] See also Figure 1-4 The multi-channel parallel chip testing device in this embodiment includes an operating table 1, a conveyor belt 2 is provided inside the operating table 1, fixed blocks 3 are fixedly installed on the left and right sides of the operating table 1, a frame 4 is fixedly installed between the tops of the two fixed blocks 3, a detection mechanism 5 is provided on the outer surface of the frame 4, and a placement slot 6 is provided inside the two fixed blocks 3. Multi-channel chips are one of the indispensable components in current network equipment. After the chips are packaged, they are generally tested to separate good products from defective products. Therefore, a chip testing device is used.

[0024] The detection mechanism 5 includes a groove 501. The groove 501 is opened inside the frame 4. The top outer surface of the frame 4 is fixedly installed with a driving motor 502. The output shaft of the driving motor 502 is fixedly installed with a rotating rod 503. The outer surface of the rotating rod 503 is fixedly installed with an active bevel gear 504. The inside of the groove 501 is rotatably installed with a threaded rod 505. The outer surface of the threaded rod 505 is fixedly installed with a driven bevel gear 506. The outer surface of the threaded rod 505 is threadedly connected with a threaded block 507. The bottom of the threaded block 507 is fixedly installed with a hydraulic cylinder 508. The bottom of the hydraulic cylinder 508 is fixedly installed with a function box 509, which can drive the function box 509 to move under the drive of the driving motor 502.

[0025] A rotating motor 510 is fixedly installed on the front inner wall of the function box 509, and a circular gear 511 is fixedly installed on the output shaft of the rotating motor 510. Two tooth plates 512 are meshed on the outer surface of the circular gear 511, and connecting rods 513 are fixedly installed on the opposite sides of the two tooth plates 512. A clamping plate 514 is fixedly installed on the bottom of the two connecting rods 513. A sensor 515 is fixedly installed at the middle position of the bottom outer surface of the function box 509, and a horizontal plate 516 is fixedly installed on the front of the function box 509. An elastic probe 517 is installed at the bottom of the horizontal plate 516, and an electric push rod is provided on the top of the elastic probe 517 (not shown in the figure). The elastic probe 517 is electrically connected to the test element through a wire. Through the mutual cooperation between the rotating motor 510, the circular gear 511 and the tooth plate 512, only one clamping is required when testing the test fixture. Compared with CN202020584392.1, the operation and detection are required to be carried out, and the work efficiency is high.

[0026] Two conveying mechanisms are provided at the bottom of the operating table 1, and the two conveying mechanisms both include fixed plates, and the two fixed plates are in contact with the ground. Rotating motors are fixedly installed on the inner walls of the two fixed plates, and screws are fixedly installed on the output shafts of the two rotating motors. The outer surfaces of the two screws are threadedly connected with movable blocks, and vertical rods are fixedly installed on the tops of the two movable blocks. Placement boxes are fixedly installed on the tops of the two vertical rods, and buffer plates are fixedly installed on the inner bottom walls of the two placement boxes. When the test fixture falls into the placement box, the buffer plate can buffer the test fixture and protect the test fixture. At the same time, the placement box is driven to move by starting the rotating motor, so as to achieve the purpose of transporting the test fixture after the test.

[0027] In summary, the multi-channel parallel chip test device is configured to cooperate with each other by setting the groove 501, the drive motor 502, the rotating rod 503, the active bevel gear 504, the threaded rod 505, the driven bevel gear 506 and the threaded block 507. When the chip on the test fixture needs to be tested, the test fixture is placed on the conveyor belt 2, and the conveyor belt 2 is used to transport the test fixture. When the sensor 515 senses the test fixture, the conveyor belt 2 stops running, and then the hydraulic cylinder 508 is started. The hydraulic cylinder 508 drives the function box 509 to move downward, and then the circular gear 511 is driven to rotate by the rotating motor 510. Since the circular gear 511 is engaged with the two tooth plates 512, the two tooth plates 512 are driven when the circular gear 511 rotates. The test jig is then clamped by the movement of the clamping plate 514 and then inspected by the elastic probe 517. When the test is good, the drive motor 502 is started to drive the threaded rod 505 to rotate forward, and the rotation of the threaded rod 505 drives the test jig to move left and right. When it is aligned with the placement slot 6, the clamping plate 514 is released, so that the test jig falls onto the buffer plate. The buffer plate buffers the test jig to protect the test jig. When the test is defective, the drive motor 502 is started to drive the threaded rod 505 to rotate in the opposite direction, and the test jig falls into the placement box on the right. After that, the tested test jigs can be transported separately by the conveying mechanism to achieve the purpose of sorting.

[0028] It should be noted that, in this document, relational terms such as first and second, etc., are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply the existence of any such actual relationship or order between these entities or operations. Moreover, the terms "comprises," "comprising," or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article, or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article, or device. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of other identical elements in the process, method, article, or device comprising the element.

[0029] Although the embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and variations may be made to these embodiments without departing from the principles and spirit of the present invention, and the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A multi-channel parallel chip testing device, comprising an operating table (1), characterized in that: A conveyor belt (2) is provided inside the operating table (1), fixed blocks (3) are fixedly installed on both the left and right sides of the operating table (1), a frame (4) is fixedly installed between the tops of the two fixed blocks (3), a detection mechanism (5) is provided on the outer surface of the frame (4), and a placement groove (6) is provided inside the two fixed blocks (3); The detection mechanism (5) comprises a groove (501), the groove (501) is provided inside the frame (4), a driving motor (502) is fixedly mounted on the top outer surface of the frame (4), a rotating rod (503) is fixedly mounted on the output shaft of the driving motor (502), an active bevel gear (504) is fixedly mounted on the outer surface of the rotating rod (503), a threaded rod (505) is rotatably mounted inside the groove (501), a driven bevel gear (506) is fixedly mounted on the outer surface of the threaded rod (505), a threaded block (507) is threadedly connected to the outer surface of the threaded rod (505), a hydraulic cylinder (508) is fixedly mounted on the bottom of the threaded block (507), and the bottom of the hydraulic cylinder (508) is fixedly mounted. A function box (509) is fixedly installed, a rotating motor (510) is fixedly installed on the front inner wall of the function box (509), a circular gear (511) is fixedly installed on the output shaft of the rotating motor (510), two tooth plates (512) are meshed on the outer surface of the circular gear (511), connecting rods (513) are fixedly installed on opposite sides of the two tooth plates (512), and clamping plates (514) are fixedly installed on the bottoms of the two connecting rods (513), a sensor (515) is fixedly installed at the middle position of the bottom outer surface of the function box (509), a horizontal plate (516) is fixedly installed on the front of the function box (509), and an elastic probe (517) is installed on the bottom of the horizontal plate (516); The two transmission mechanisms (9) each include a rotating motor (901), the inner walls of the two fixed plates (8) are fixedly mounted with the rotating motor (901), the output shafts of the two rotating motors (901) are fixedly mounted with screw rods (902), the outer surfaces of the two screw rods (902) are threadedly connected with movable blocks (903), the tops of the two movable blocks (903) are fixedly mounted with vertical rods (904), the tops of the two vertical rods (904) are fixedly mounted with placement boxes (905), and the inner bottom walls of the two placement boxes (905) are fixedly mounted with buffer plates (906); A test fixture (10) is placed on top of the buffer plate (906) on the left side.

2. The multi-channel parallel chip testing device according to claim 1, characterized in that: The driven bevel gear (506) is meshed with the outer surface of the driving bevel gear (504), a slide groove is provided on the bottom outer surface of the frame (4), and the bottom of the hydraulic cylinder (508) extends through the slide groove to the outside of the frame (4).

3. The multi-channel parallel chip testing device according to claim 1, characterized in that: The inner top wall of the functional box (509) is provided with a slide rail, and pulleys adapted to the slide rail are fixedly mounted on the tops of the two connecting rods (513).

4. The multi-channel parallel chip testing device according to claim 1, wherein: The bottom of the functional box (509) is provided with two rectangular grooves, and the bottoms of the two connecting rods (513) pass through the rectangular grooves and extend to the outside of the functional box (509), and protective pads are provided on opposite sides of the two clamping plates (514).

5. The multi-channel parallel chip testing device according to claim 1, wherein: The two placement boxes (905) are both on the same vertical level as the placement trough (6).

6. The multi-channel parallel chip testing device according to claim 1, characterized in that: The driving motor (502), the hydraulic cylinder (508), the rotating motor (510), the sensor (515), the elastic probe (517) and the rotating motor (901) are electrically connected via wires.

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