Test fixture and test equipment

Abstract

The utility model provides a test fixture and test equipment. The test fixture comprises a circuit board; the communication port is arranged on the end face of one side of the circuit board and is used for being connected with equipment to be tested so as to collect a test signal of the equipment to be tested; and the connecting piece is arranged at the edge of one side of the circuit board, is connected with the communication port, and is also used for being connected with test equipment so as to transmit the test signal acquired from the communication port to the test equipment. Through the above mode, the to-be-tested test signal can be completely acquired, and the situation that the signal acquisition of the to-be-tested equipment is incomplete is effectively avoided, so that the test accuracy of the to-be-tested equipment is improved.

Description

Technical Field

[0001] The present application is applied to the technical field of intelligent communications, and in particular relates to a test fixture and a test device. Background Art

[0002] PCIE (Peripheral Component Interconnect Express) is an advanced interconnect I / O (interface) technology for hard drives, SSDs (solid-state drives), graphics cards, Wi-Fi (mobile networks), and internal Ethernet connections. PCIE comprises a set of fast, scalable, and reliable I / O standards for serial data transmission buses. In the current automotive industry, PCIE signals are primarily used for wireless network data transmission between Wi-Fi modules and the system-on-chip (SoC) in smart cockpits.

[0003] However, existing techniques for signal integrity testing PCIE communications typically employ baseband transmission testing (BASE testing) and card electrical mechanical (CEM) testing. When sampling BASE testing, the test location may not be at the end of the signal transmission link, leading to problems such as signal reflection and high-frequency signal loss, resulting in inaccurate test results. When sampling CEM testing for inter-chip PCIE communication, incomplete test signal acquisition is prone to occur, resulting in poor signal integrity testing results. Utility Model Content

[0004] The present application provides a test fixture to solve the problem of incomplete serial computer wireless signal testing in the prior art.

[0005] In order to solve the above technical problems, the present application provides a test fixture, including: a circuit board; a communication port, the communication port is arranged on one side end face of the circuit board, and is used to connect to the device to be tested to collect the test signal of the device to be tested; a connector, which is arranged on one side edge of the circuit board, connected to the communication port, and is also used to connect to the test device to transmit the test signal collected from the communication port to the test device.

[0006] The communication port includes at least a clock port and a data transmission port, and the communication port collects the test signal of the device to be tested through a coaxial line.

[0007] Wherein, the communication port is a plug-in connector.

[0008] Wherein, the connecting piece includes a plurality of gold fingers arranged side by side.

[0009] The test fixture further includes a power supply circuit, which is arranged on one end surface of the circuit board and is used to be connected to the device to be tested so as to supply power to the circuit board through the device to be tested.

[0010] The power supply circuit includes a switching circuit, which is used for external power supply. The switching circuit includes multiple connecting lines to provide the circuit board with an operating voltage corresponding to the device to be tested when the corresponding connecting lines are connected.

[0011] The switching circuit further includes a jumper cap, and the switching circuit switches the corresponding connection line through the jumper cap; the switching circuit includes a horn socket connector.

[0012] Among them, the power supply circuit also includes a step-down circuit, which is configured to be connected to the device to be tested; a conversion circuit, which is arranged on one end face of the circuit board, and is used for an external power supply and connected to the test device to provide the circuit board and the test device with an operating voltage corresponding to the device to be tested.

[0013] The communication port and the connector are arranged on two opposite edges of the same surface of the circuit board.

[0014] To solve the above problems, the present application further provides a testing device, including: a testing fixture, the testing fixture is arranged in the testing device, and the testing fixture is any one of the above-mentioned testing fixtures.

[0015] The beneficial effects of the present application are as follows: Different from the prior art, the present application completes the testing of the device to be tested by providing a communication port on a circuit board, the communication port collecting the test signal of the device to be tested, converting and transmitting the test signal to a connector, and transmitting the test signal to the test device via the connector. By connecting the device to be tested via the communication port, the test signal to be tested can be fully collected, effectively avoiding the situation where the signal collection of the device to be tested is incomplete, thereby improving the accuracy of the test of the device to be tested. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 This is a structural block diagram of an embodiment of a circuit board of the present application;

[0017] Figure 2 This is a structural block diagram of an embodiment of a communication port of the present application;

[0018] Figure 3 This is a structural diagram of an embodiment of the connection between the test fixture of the present application and the device to be tested;

[0019] Figure 4 This is a structural block diagram of an embodiment of the connection between the circuit board and the step-down circuit of the present application;

[0020] Figure 5This is a structural block diagram of an embodiment of the circuit board and switching circuit of the present application;

[0021] Figure 6 This is a structural block diagram of an embodiment of the switching circuit of the present application. DETAILED DESCRIPTION

[0022] The following will be combined with the drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0023] It should be noted that if the embodiments of the present application involve directional indications (such as up, down, left, right, front, back, etc.), the directional indications are only used to explain the relative position relationship, movement status, etc. between the various components under a certain specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indications will also change accordingly.

[0024] In addition, if there are descriptions involving "first", "second", etc. in the embodiments of the present application, the descriptions of "first", "second", etc. are only for descriptive purposes and cannot be understood as indicating or implying their relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of such features. In addition, the technical solutions between the various embodiments can be combined with each other, but they must be based on the fact that they can be implemented by ordinary technicians in this field. When the combination of technical solutions is contradictory or cannot be implemented, it should be deemed that such a combination of technical solutions does not exist and is not within the scope of protection required by this application.

[0025] See also Figure 1 , Figure 1 This is a structural block diagram of an embodiment of a circuit board provided by this application.

[0026] This application provides a test fixture, such as Figure 1 As shown, the test fixture includes: a circuit board 10, a communication port 20 and a connector 30. Figure 3 As shown, the communication port 20 is provided on one end face of the circuit board 10 and is used to connect to the device under test 40 to collect the test signal of the device under test 40. The connector 30 is provided on one edge of the circuit board 10 and is connected to the communication port 20. It is also used to connect to the test device 50 to transmit the test signal collected from the communication port 20 to the test device 50. The circuit board 10 can be a single-layer board with a circuit layer integrated therein to connect the communication port 20 and the connector 30, or it can be a multi-layer board, which is not specifically limited in this application.

[0027] In an optional embodiment, the communication port 20 is provided at an edge position of an end face of one side of the circuit board 10, so as to facilitate the connection of the device to be tested 40 to the communication port 20, thereby collecting the test signal of the device to be tested 40 through the communication port 20. After the communication port 20 collects the test signal of the device to be tested 40, the collected test signal is transmitted to the connector 30, and the test signal is transmitted to the test device 50 through the connector 30. The test signal is tested by the test device 50 to determine whether the signal transmission of the device to be tested 40 is abnormal. Specifically, there are multiple communication ports 20, so as to receive the test signal of the device to be tested 40 or transmit the test signal to the device to be tested 40. Each communication port 20 is provided with multiple interfaces, so as to facilitate the communication port 20 to receive the multi-path test signal transmitted by the device to be tested 40, and can completely collect the test signals of all paths of the device to be tested 40, thereby preventing the occurrence of incomplete collection of the test signal of the device to be tested 40. In this embodiment, by connecting the device under test 40 via the communication port 20, the communication port 20 can connect to all signal transmission paths of the device under test 40, thereby completing the test of the device under test 40. After the communication port 20 collects the test signal of the device under test 40, the circuit board 10 converts the test signal and transmits the converted test signal to the test device 50 via the connector 30. The test device 50 can test the test signal of the device under test 40, thereby completing the test of the device under test 40.

[0028] In other embodiments, multiple communication ports 20 may be provided, and the connector 30 may be provided corresponding to the communication port 20, so that when the device to be tested 40 is tested through the test fixture, multiple devices to be tested 40 can be tested. This application does not make specific limitations here.

[0029] In a specific application scenario, the test fixture tests the computer and tests the computer's test signal through an oscilloscope. The computer is connected to the communication port 20 of the circuit board 10, and the oscilloscope is connected to the connector 30. The communication port 20 collects the computer's test signal, and converts and transmits the test signal transmitted by the computer to the connector 30 through the circuit board 10, and transmits the test signal to the oscilloscope through the connector 30, so that the test signal transmitted by the computer is tested by the oscilloscope to determine whether the computer signal is in an abnormal state.

[0030] In the above embodiment, by providing a communication port 20 on the circuit board 10, the communication port 20 collects the test signal of the device under test 40, converts the test signal and transmits it to the connector 30, and transmits the test signal to the test device 50 via the connector 30, thereby completing the test of the device under test 40. Connecting the device under test 40 through the communication port 20 can fully collect the test signal to be tested, effectively avoiding the situation where incomplete signal collection of the device under test 40 occurs, thereby improving the accuracy of the test of the device under test 40.

[0031] In an optional embodiment, if Figure 2 As shown, the communication port 20 includes at least a clock port 201 and a data transmission port 202. The communication port 20 collects test signals from the device under test 40 via a coaxial cable. The clock port 201 is used to receive a reference clock signal transmitted by the device under test 40. The data transmission port 202 includes a receiving port 203 and a transmitting port 204. The receiving port 203 on the circuit board 10 is used to receive the test signal from the device under test 40, and the transmitting port 204 is used to feed the signal back to the device under test 40. By providing multiple ports, the test signal from the device under test 40 can be effectively and completely collected, preventing incomplete signal collection during testing of the device under test 40 and improving the accuracy of the test of the device under test 40.

[0032] In this embodiment, when the device to be tested 40 is an RC device (control device or management device), the test fixture tests the RC device, such as a computer. When testing the RC device, the RC device powers the circuit board 10, and the reference clock signal of the RC device is transmitted to the circuit board 10 through the clock port 201, and the crystal test signal is transmitted to the circuit board 10 through the data transmission port 202, and the test signal is transmitted to the test device 50 through the connector 30.

[0033] Among them, the communication port 20 is connected to the device to be tested 40 through a coaxial line, that is, the coaxial line includes a metal signal line, which is used for the communication port 20 to transmit the test signal to the device to be tested 40, that is, the metal signal line is connected to the signal transmission interface of the device to be tested 40. The coaxial line also includes a first insulating layer, a shielding layer and a second insulating layer, the first insulating layer wraps the metal signal line, the shielding layer wraps the first insulating layer, and the second insulating layer wraps the second shielding layer. The shielding layer is a conductor layer. After the communication port 20 is connected to the coaxial line, the metal wire layer at the other end of the coaxial line is connected to the signal transmission interface of the device to be tested 40, and the shielding layer is connected to the ground wire of the device to be tested 40, thereby completing the connection between the communication port 20 and the device to be tested. Using a coaxial line to connect the device to be tested 40 and the communication port 20 can protect the transmitted test signal through the shielding layer, effectively preventing other interference signals from interfering with the transmitted test signal, thereby causing inaccurate signals to be tested.

[0034] In an optional embodiment, the communication port 20 is a plug-in connector. That is, after the coaxial line is connected to the device under test 40, the push-in connector at the other end of the coaxial line is plugged into the plug-in connector of the communication port 20, thereby completing the connection between the test fixture and the device under test 40. The communication port 20 and the connector 30 are disposed on opposite edges of the same surface of the circuit board 10. When the circuit board 10 is connected to the device under test 40 and the test device 50, the device under test 40 is connected to one side of the circuit board 10, and the test device 50 is connected to the other side of the circuit board 10. This facilitates the connection between the device under test 40 and the test device 50 when testing the device under test 40, thereby improving the efficiency of testing the device under test 40.

[0035] In other embodiments, the test device 50 may also be an EP device (terminal device), such as a graphics card, wherein the clock port 201 and the data transmission port 202 may be set to two types, one corresponding to the EP device and the other corresponding to the RC device, or may be set to multiple types, which can be specifically set according to the device to be tested 40. This application does not make any specific limitations here.

[0036] In an optional embodiment, the connector 30 includes a plurality of gold fingers 301 arranged side by side. The plurality of gold fingers 301 arranged side by side can be PCIE gold fingers or PCIE_X16 connector sockets to correspond to the testing of different devices to be tested 40. Other types of gold fingers can also be used, and this application does not make specific limitations here. That is, when it is necessary to test the device to be tested, the clock port 201 and the data transmission port 202 are connected to the device to be tested 40 through the coaxial line, and the test signal of the device to be tested 40 is collected, and the test signal of the device to be tested 40 is converted and transmitted to the plurality of gold fingers 301 arranged side by side through the circuit board 10, and the test signal is transmitted to the test device 50 through the gold fingers 301, thereby completing the test of the device to be tested 40.

[0037] In an optional embodiment, if Figure 4 As shown, when the test fixture is testing an RC device, the test fixture also includes a power supply circuit 60. Power supply circuit 60 is disposed on one end surface of circuit board 10 and is configured to connect to device under test 40, thereby powering circuit board 10 through device under test 40. When testing an RC device, a coaxial cable is connected to device under test 40, and the push-in connector at the other end of the coaxial cable is plugged into the plug-in connector of communication port 20. Power supply circuit 60 is then plugged into the RC device, thereby connecting power supply circuit 60 to the RC device and powering circuit board 10 through the RC device. The RC device transmits a test signal to circuit board 10 via clock port 201 and data transmission port 202. Circuit board 10 converts the test signal and transmits it to connector 30, which then transmits the test signal to test fixture 50.

[0038] In this embodiment, if Figure 4As shown, the power supply circuit 60 also includes a step-down circuit 601, which is configured to connect to the device under test 40. The device under test 40 is an RC device, and the test device 50 is an oscilloscope. That is, when testing the RC device, the step-down circuit 601 is connected to the RC device, which supplies power to the circuit board 10. The step-down circuit 601 also steps down the voltage transmitted by the RC device to prevent excessive voltage from damaging the circuit board 10. After the RC device is connected to the step-down circuit 601 of the circuit board 10, one end of the coaxial cable is connected to the RC device, and the push-in connector at the other end of the coaxial cable is plugged into the plug-in connector of the communication port 20, thereby completing the communication connection between the RC device and the circuit board 10. The multiple gold fingers 301 on the connector 30 are opened and connected to the oscilloscope via a flat cable, thereby completing the communication connection between the circuit board 10 and the oscilloscope. Clock port 201 of circuit board 10 receives a clock signal transmitted by an RC device, while data transmission port 202 of circuit board 10 receives a test signal transmitted by the RC device. Circuit board 10 converts the received test signal and transmits it to connector 30. Multiple, parallel-arranged gold fingers 301 of connector 30 transmit the test signal to an oscilloscope, which then tests the test signal. The provision of step-down circuit 601 effectively prevents voltage damage to circuit board 10 from the RC device, improving the stability and safety of circuit board 10 testing.

[0039] In a specific application scenario, when a test fixture is used to test an RC device, one end of a coaxial cable is connected to the RC device, and the coaxial cable's shield is connected to the RC device's ground wire. The shield protects the test signal transmitted by the RC device, preventing other signals from interfering with the test signal. The push-in connector at the other end of the coaxial cable is plugged into the plug-in connector of the communication port 20, thereby completing the communication connection between the circuit board 10 and the RC device. The step-down circuit 601 on the circuit board 10 is connected to the RC device to power the circuit board 10 through the RC device. The RC device can also establish an electrical connection with the test device 50, thereby powering the test device 50. When testing the RC device, the communication port 20 receives the RC device's test signal via the coaxial cable. The circuit board 10 converts the test signal and transmits it to the connector 30. The gold finger 301 of the connector 30 transmits the test signal to the test device 50, thereby testing the RC device through the test device 50.

[0040] In other embodiments, since the RC device is generally connected to the EP device, when testing the RC device, it is necessary to first remove the EP device connected to the RC device, and then connect the RC device to the communication port 20 of the test fixture.

[0041] In an optional embodiment, if Figure 5As shown, when the test fixture is testing the EP device, for example, terminal devices such as graphics cards. The power supply circuit 60 includes a switching circuit 602, and the switching circuit 602 can be used for an external power supply. Specifically, since the EP device cannot directly provide the required operating voltage for the circuit board 10 when testing the EP device, the external power supply is connected through the switching circuit 602 to power the circuit board 10. After the switching circuit 602 is connected to the external power supply, a communication connection is established between the EP device and the communication port 20 of the circuit board 10 through the coaxial cable. The specific connection method is the same as the above-mentioned RC device and the communication port 20, which will not be described in detail here. Specifically, in combination with Figure 6 As shown, switching circuit 602 includes multiple connecting lines 70. When corresponding connecting lines 70 are connected, they provide circuit board 10 with operating voltages corresponding to test equipment 50. In this embodiment, multiple connecting lines 70 are connected to an external power source, providing the required operating voltages for circuit board 10 and the EP device. Circuit board 10 receives test signals from the EP device via communication port 20 and controls the on / off switching of different connecting lines 70 to configure the voltage and timing requirements for EP device testing.

[0042] In this embodiment, multiple connecting lines 70 of switching circuit 602 are connected to an external power source. The EP device is connected to the communication port 20 of the circuit via a coaxial cable. Switching circuit 602 controls the on / off switching of multiple connecting lines 70 to meet the voltage and timing requirements of the EP device and circuit board 10 during testing. Switching circuit 602 receives test signals from the EP device via communication port 20 and transmits the test signals to testing equipment 50 via connector 30. Specifically, switching circuit 602 includes jumper caps, which connect corresponding connecting lines 70. That is, the jumper caps can be used to switch the connection of different connecting lines 70 to the operating voltage and power-up timing required when circuit board 10 tests the EP device. The switching circuit 602 includes a header connector 701, that is, different interfaces on the header connector 701 are connected through jumper caps, so that the corresponding connecting lines 70 are connected. By adjusting the jumper caps corresponding to the different interfaces connected to the header connector 701, the power-on timing required by the EP device and the circuit board 10 can be controlled, so that the circuit board 10 receives the test signal of the EP device through the communication interface, effectively improving the stability of the circuit board 10 in receiving the test signal of the EP device.

[0043] In an optional embodiment, the power supply circuit 60 further includes a conversion circuit 603, which is disposed on an end surface of the circuit board 10. The conversion circuit 603 is used to connect to an external power source and is connected to the test equipment 50 to provide the circuit board 10 and the test equipment 50 with an operating voltage corresponding to the device under test 40. When the test fixture is testing the EP device, the conversion circuit 603 is disposed on an end surface of the circuit board 10. The conversion circuit 603 and the switching circuit 602 are simultaneously connected to the external power source. The switching circuit 602 is connected to the external power source and can provide the required test voltage and timing requirements for the EP device and the circuit board 10. The conversion circuit 603 is connected to the test equipment 50 to provide power to the test equipment 50 when testing the EP device.

[0044] In a specific application scenario, when testing an EP device using a test fixture, one end of the coaxial cable is connected to the EP device, the coaxial cable's shield is connected to the EP device's ground wire, and the push-in connector at the other end of the coaxial cable is plugged into the plug-in connector of communication port 20, thereby completing the communication connection between circuit board 10 and the EP device. Switching circuit 602 on circuit board 10 is connected to an external power source. Specifically, the header connector 701 of switching circuit 602 is connected via a jumper cap to switch the corresponding connection line 70, thereby providing the required power-up voltage and voltage requirements for different timings for the EP device and circuit board 10. Conversion circuit 603 is connected to an external power source and is connected to test equipment 50 to power test equipment 50 through conversion circuit 603. Test equipment 50 is connected to multiple, parallel-arranged gold fingers 301 of connector 30. When testing the EP device, the communication port 20 obtains the test signal of the EP device through the coaxial cable, the circuit board 10 converts the test signal and transmits it to the connector 30, and the gold finger 301 of the connector 30 transmits the test signal to the test device 50, thereby testing the EP device through the test device 50.

[0045] In other embodiments, since the EP device is generally connected to the RC device, when testing the EP device, it is first necessary to remove the RC device connected to the EP device, and then connect the EP device to the communication port 20 of the test fixture.

[0046] Through the above-mentioned method, the present application sets a communication port 20 on the circuit board 10, and the communication port 20 collects the test signal of the device to be tested 40, converts and transmits the test signal to the connector 30, and transmits the test signal to the test device 50 through the connector 30. In this way, the test signal to be tested can be fully collected, effectively avoiding the situation where the signal collection of the device to be tested 40 is incomplete, thereby improving the accuracy of the test of the device to be tested 40. By setting the communication port 20 as a plug-in connector, it can be connected to the push-in connector at one end of the coaxial line, and the push-in connector is pushed and plugged into the plug-in connector, reducing the steps of testing the device to be tested 40. By setting the connector 30 as a plurality of gold fingers 301 arranged side by side, it is possible to facilitate the transmission of the test signal converted by the circuit board 10 to the test device 50. By setting the power supply circuit 60 as a step-down circuit 601, the test fixture can be connected to the device to be tested 40, and the voltage is stepped down by the step-down circuit 601 to prevent the circuit board 10 from being damaged due to excessive voltage. By providing a switching circuit 602 in the power supply circuit 60 and correspondingly connecting different connection lines 70 via jumper caps, after the test fixture is connected to an external power source, the switching circuit 602 can provide the required operating voltage and the voltage required for different timings to the device to be tested 40 and the circuit board 10, thereby completing the acquisition of the test signal and avoiding the occurrence of incomplete test signal acquisition. By providing a conversion circuit 603 in the power supply circuit 60, the conversion circuit 603 can be used to power the test device 50. By arranging the communication port 20 and the connector 30 on opposite sides of the same surface of the circuit board 10, the connection between the test device 50 and the device to be tested 40 can be simplified, making it easier to test the device to be tested 40.

[0047] The present application also provides a test device 50 , which includes: a test fixture, which is arranged in the test device 50 , and the test fixture is any one of the test fixtures described above.

[0048] The above description is only an implementation method of the present application and does not limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the description and drawings of this application, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. A test fixture, characterized in that: The test fixture comprises: Circuit board; A communication port is provided on one end surface of the circuit board and is used to connect to a device to be tested so as to collect a test signal of the device to be tested; A connector is provided on one side edge of the circuit board, connected to the communication port, and is also used to connect to a test device to transmit the test signal collected from the communication port to the test device.

2. The test fixture according to claim 1, wherein: The communication port includes at least a clock port and a data transmission port, and the communication port collects the test signal of the device to be tested through a coaxial line.

3. The test fixture according to claim 1 or 2, characterized in that: The communication port is a plug-in connector.

4. The test fixture according to claim 1, wherein: The connecting piece includes a plurality of gold fingers arranged side by side.

5. The test fixture according to claim 1 or 4, characterized in that: The test fixture further includes a power supply circuit, which is disposed on one end surface of the circuit board and is used to be connected to the device to be tested so as to supply power to the circuit board through the device to be tested.

6. The test fixture according to claim 5, wherein: The power supply circuit includes a switching circuit, which is used for external power supply. The switching circuit includes multiple connecting lines, so as to provide the circuit board with an operating voltage corresponding to the device to be tested when the corresponding connecting lines are connected.

7. The test fixture according to claim 6, wherein: The switching circuit further includes a jumper cap, and the switching circuit switches the corresponding connection line through the jumper cap; the switching circuit includes a header connector.

8. The test fixture according to claim 5, wherein: The power supply circuit further includes a step-down circuit, and the step-down circuit is configured to be connected to the device under test; A conversion circuit is arranged on one end surface of the circuit board. The conversion circuit is used for an external power supply and is connected to the test equipment to provide the circuit board and the test equipment with an operating voltage corresponding to the device to be tested.

9. The test fixture according to claim 1, wherein: The communication port and the connecting member are arranged on two opposite edges of the same surface of the circuit board.

10. A testing device, characterized in that: The testing equipment includes: A test fixture is provided in the test equipment, and the test fixture is the test fixture according to claims 1-9.

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