Interface device for testing infrared detector

Through the design of spring ejector and conductive contact close to the circuit board, combined with the bracket and fixing plate, the problems of high interface damage rate and poor signal reliability in the infrared detector test device are solved, and stable signal transmission and automatic testing support are achieved.

CN223378461UActive Publication Date: 2025-09-23KUNMING INST OF PHYSICS
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Patent Information

Application Number
CN202422614494.4
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-10-29
Publication Date
2025-09-23
Estimated Expiration
2034-10-29

AI Technical Summary

Technical Problem

Existing infrared detector testing devices have a high damage rate and poor signal transmission reliability when the interfaces are frequently plugged and unplugged, and it is difficult to upgrade the automatic or semi-automatic testing system.

Method used

The system uses spring-loaded pins and conductive contacts close to the circuit board, combined with a bracket and fixed plate design to achieve a stable connection between the infrared detector and the front signal circuit board. The bracket can be flexibly adjusted on a mobile platform to reduce interface damage, improve signal transmission reliability, and support automatic or semi-automatic testing.

Benefits of technology

It reduces the probability of interface damage, improves signal transmission reliability, supports automatic or semi-automatic testing, and improves test efficiency and reliability.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model provides an interface device for testing an infrared detector, which comprises a bracket and a fixed plate connected with the bracket, and is characterized by further comprising a front signal circuit board connected with the bracket, and a first plug plugged with a corresponding jack on the fixed plate is arranged on the front signal circuit board; and the spring ejector pin is in contact with a conductive contact on the proximity circuit board, the proximity circuit board is connected with the connecting frame which is provided with a second plug, the second plug is electrically connected with the proximity circuit board, and the second plug is in plug-in connection with a jack on a Dewar in which an infrared detector to be detected is arranged. The connecting frame and the proximity circuit board on the connecting frame are inserted into a Dewar in which an infrared detector to be detected is arranged through a second plug, then the front signal circuit board is connected to a fixing plate connected with the support, and the support is moved to enable a spring ejector pin on the front signal circuit board to be in contact with a conductive contact on the proximity circuit board. Conventional detection can be carried out without frequent plugging and unplugging of an interface line.
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Description

Technical Field

[0001] The utility model relates to an interface device, in particular to an interface device for testing an infrared detector, belonging to the field of photoelectric technology. Background Art

[0002] Before an infrared detector is officially packaged in a micro-dewar and connected to a refrigerator for use in various scenarios, it undergoes multiple performance tests. During these tests, the infrared detector is typically installed in a removable test dewar, which is then manually connected to the test system for performance testing.

[0003] Traditional testing equipment primarily consists of a test chamber, an interface, wires, a driver, and a computer. The operating principle is as follows: the driver generates and outputs a DC voltage signal and a high-frequency timing signal that enable the infrared detector to operate properly. These signals are input via the wires and interface to the infrared detector in the test chamber. Once the infrared detector is operating properly, it generates a corresponding response signal, which is also transmitted to the driver via the interface and wires. The driver's corresponding program filters, amplifies, and splices these response signals before outputting them to the computer, creating a visual representation of the detection image. The computer also collects these response signals for important performance analysis.

[0004] While this test setup is simple, when testing a large number of infrared detectors, frequent plugging and unplugging of interface cables between the test dewar and the test driver reduces test efficiency and increases the probability of damage to each interface, thereby reducing signal transmission reliability. Furthermore, the driver, as the processing station for all infrared detector operating signals, has a high level of integration and complexity, which increases subsequent maintenance efficiency and cycle time. Furthermore, this testing method relies solely on test leads and test interfaces for signal transmission and interaction, which presents limitations when the test system needs to be optimized and upgraded to automated or semi-automated methods. Therefore, improvements to the existing technology are necessary. Summary of the Invention

[0005] In order to solve the problems of interface damage and reduced signal transmission reliability caused by frequent plugging and unplugging of interfaces in existing infrared detector testing devices, the utility model provides an infrared detector testing interface device.

[0006] The utility model is completed by the following technical solutions: an interface device for testing infrared detectors, comprising a bracket, a fixing plate connected to the bracket, characterized in that it also includes a front signal circuit board connected, the front signal circuit board is provided with a first plug that is plugged into a corresponding jack on the fixing plate, and a spring thimble that touches a conductive contact on a close circuit board, the close circuit board is connected to a connecting frame provided with a second plug, and the second plug is electrically connected to the close circuit board, the second plug is plugged into a jack on a dewar in which an infrared detector to be tested is installed, so that the connecting frame and the close circuit board thereon are connected through the second plug. After the board is plugged into the dewar in which the infrared detector to be tested is installed, the front signal circuit board is connected to the fixed plate connected to the bracket, and the first plug on the front signal circuit board is electrically connected to the external conventional test computer, it is only necessary to move the bracket and make the spring ejector on the front signal circuit board contact the conductive contact on the circuit board, so that the infrared detector to be tested installed in the dewar can be routinely tested. When testing infrared detectors in batches, it is only necessary to replace the infrared detector in the dewar. In this way, many problems such as high damage rate and poor reliability caused by frequent plugging and unplugging of the test interface line can be fundamentally solved.

[0007] The bracket is configured as a frame consisting of a vertical plate and a horizontal plate, wherein the vertical plate is provided with a screw hole, in which a bolt is screwed, and the horizontal plate is provided with a plurality of mutually parallel strip-shaped through slots, each of which is provided with a bolt, so that the horizontal plate of the bracket moved into position can be fixed to a mobile platform for conventional testing by means of bolts, and the bracket and the front signal circuit board thereon are driven to move by the mobile platform until they come into contact with the close-contact circuit board connected to the Dewar, and then the test can be carried out.

[0008] The fixing plate is configured as a vertical flat plate, a rectangular through hole is provided on the upper portion of the fixing plate, and a connecting screw hole is provided in the middle portion of the fixing plate to be screwed to a hand-tightened bolt, so that the front signal circuit board can be installed through the fixing plate, and the fixing plate and the bracket can be quickly connected or disassembled through the connecting screw hole.

[0009] The front signal circuit board is connected to the fixed plate by bolts, a spring ejector is provided on one side of the front signal circuit board, and a first plug is provided on the other side of the front signal circuit board. The first plug is socketed with the rectangular through hole of the fixed plate so as to be electrically connected to an external conventional test computer through the first plug on the front signal circuit board.

[0010] The connecting frame includes a vertically arranged rectangular plate, a groove provided on the back side of the rectangular plate, protrusions extending forward are provided on both sides of the front side of the rectangular plate, a horizontal through groove is provided along the middle of the protrusion, two second plugs are provided and are respectively arranged at the front ends of the protrusions on both sides, the circuit board is arranged in the groove and is connected to the connecting frame by bolts, and the circuit board is electrically connected to the second plug through a wire so that the second plug can be plugged into the slots on both sides of the test dewar through the protrusions on both sides of the rectangular plate, and the horizontal through groove can make the protrusions moderately spread upward and downward to accommodate the installation of the second plug.

[0011] The present invention has the following advantages and effects: by adopting the above-mentioned scheme, the interaction of the infrared detector in the test dewar with the front signal circuit board, the test driver board and the test computer signal is realized by contacting the conductive contacts on the circuit board in close proximity with the spring ejector pins, thereby replacing the frequent plugging and unplugging of the test interface line between the test dewar interface and the test driver circuit board, thereby reducing the probability of damage to each interface and improving the reliability of signal transmission. In addition, because the front signal circuit board is mounted on the bracket, the position of the bracket can be flexibly adjusted by the strip-shaped through-slot and connecting bolts on the bracket, so that the bracket can be installed on various movable platforms, realizing the expansion of automatic or semi-automatic testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0013] Figure 1 This is the main view of the utility model;

[0014] Figure 2 for Figure 1 Exploded view of

[0015] Figure 3 for Figure 2 The enlarged image in ;

[0016] Figure 4 for Figure 2 Magnified image in . DETAILED DESCRIPTION

[0017] The following will be combined with the accompanying drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention. Example

[0018] The infrared detector test interface device provided by the present invention includes a bracket 8, a fixing plate 12 connected to the bracket 8, and a front signal circuit board 7. The front signal circuit board 7 is provided with a first plug 13 that is plugged into a corresponding socket on the fixing plate 12, and a spring ejector pin 6 that contacts a conductive contact 16 on a close circuit board 5. The close circuit board 5 is connected to a connecting frame 4 on which a second plug 2 is provided, and the second plug 2 is electrically connected to the close circuit board 5. The second plug 2 is plugged into a socket on a dewar 1 in which the infrared detector to be tested is installed.

[0019] So that the connecting frame 4 and the close contact circuit board 5 thereon can be plugged into the dewar 1 in which the infrared detector to be tested is installed through the second plug 2, and the front signal circuit board 7 is connected to the fixing plate 12 connected to the bracket 8, and the first plug 13 on the front signal circuit board 7 is electrically connected to the external conventional test computer. Then, it is only necessary to move the bracket 8 and make the spring ejector 6 on the front signal circuit board 7 contact the conductive contact 16 on the close contact circuit board 5, so that the infrared detector to be tested installed in the dewar 1 can be routinely tested. When testing infrared detectors in batches, it is only necessary to replace the infrared detector in the dewar 1, thereby fundamentally solving many problems such as high damage rate and poor reliability caused by frequent plugging and unplugging of test interface cables.

[0020] The bracket 8 is configured as an L-shaped frame consisting of a vertical plate 15 and a horizontal plate 14, wherein the vertical plate 15 is provided with a screw hole, in which a bolt 11 is screwed; the horizontal plate 14 is provided with a plurality of mutually parallel strip-shaped through-slots 9, each of which is provided with a bolt 10, so that the horizontal plate 14 of the bracket 8 moved into position can be fixed to a conventional test mobile platform by the bolt 10, and the bracket 8 and the front signal circuit board 7 thereon can be moved by the mobile platform until they contact the close-contact circuit board 5 connected to the dewar 1, and then the test can be carried out;

[0021] The fixing plate 12 is configured as a vertical flat plate. A rectangular through-hole 18 is provided on the upper portion of the fixing plate 12. A connecting screw hole 19 is provided in the middle portion of the fixing plate 12 to be screwed to the bolt 11, so that the front signal circuit board 7 can be installed through the fixing plate 12. The connecting screw hole 19 can realize the quick connection or removal of the fixing plate 12 and the bracket 8;

[0022] The front signal circuit board 7 is connected to the fixing plate 12 by bolts. A conventional spring ejector pin 6 is provided on one side of the front signal circuit board 7. A first plug 13 is provided on the other side of the front signal circuit board 7. The first plug 13 is socketed with a rectangular through hole 18 of the fixing plate 12 so as to electrically connect the front signal circuit board 7 to an external conventional test computer through the first plug 13 on the front signal circuit board 7.

[0023] The connecting frame 4 includes a vertically arranged rectangular plate, a groove 17 provided on the back of the rectangular plate, protrusions 20 extending forward are provided on both sides of the front of the rectangular plate, a horizontal through-slot 3 is provided along the middle of the protrusion 2, and the second plug 2 is provided in two and is respectively provided at the front end of the protrusions 20 on both sides. The circuit board 5 is provided in the groove 17 and is connected to the connecting frame 4 by bolts. The circuit board 5 is electrically connected to the second plug 2 through a wire so that the second plug 2 can be plugged into the jacks on both sides of the Dewar 1 through the protrusions 20 on both sides of the rectangular plate. The horizontal through-slot 3 can make the protrusions 20 moderately open on the upper and lower sides to adapt to the installation of the second plug 2.

[0024] Throughout this specification, references to terms such as "one embodiment," "example," or "specific example" indicate that a specific feature, structure, material, or characteristic described in conjunction with that embodiment or example is included in at least one embodiment or example of the present invention. In this specification, schematic representations of these terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

[0025] The above shows and describes the basic principles, main features, and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The above embodiments and descriptions are merely illustrative of the principles of the present invention. Various changes and improvements may be made to the present invention without departing from the spirit and scope of the present invention. Such changes and improvements are intended to fall within the scope of the present invention. The scope of protection claimed in this invention is defined by the appended claims and their equivalents.

Claims

1. An interface device for testing an infrared detector, comprising a bracket and a fixing plate connected to the bracket, characterized in that It also includes a front signal circuit board, which is provided with a first plug that is plugged into the corresponding socket on the fixed plate, and a spring pin that touches the conductive contact on the proximity circuit board. The proximity circuit board is connected to a connecting frame with a second plug, and the second plug is electrically connected to the proximity circuit board. The second plug is plugged into the socket on the Dewar in which the infrared detector to be tested is installed.

2. The infrared detector test interface device according to claim 1, characterized in that The bracket is configured as a frame consisting of a vertical plate and a horizontal plate, wherein the vertical plate is provided with a screw hole in which a bolt is screwed, and the horizontal plate is provided with a plurality of parallel strip grooves, each of which is provided with a bolt.

3. The infrared detector test interface device according to claim 1, characterized in that The fixing plate is configured as a vertical flat plate, a rectangular through hole is provided on the upper portion of the fixing plate, and a connecting screw hole screwed to the hand-tightening bolt is provided in the middle portion of the fixing plate.

4. The infrared detector testing interface device according to claim 1, characterized in that The front signal circuit board is connected to the fixing plate by bolts, the spring ejector is arranged on one side of the front signal circuit board, the first plug is arranged on the other side of the front signal circuit board, and the first plug is sleeved with the rectangular through hole of the fixing plate.

5. The infrared detector testing interface device according to claim 1, characterized in that The connecting frame includes a vertically arranged rectangular plate, a groove provided on the back of the rectangular plate, protrusions extending forward are provided on both sides of the front of the rectangular plate, and a horizontal through groove is provided along the middle of the protrusions. Two second plugs are provided and are respectively arranged at the front ends of the protrusions on both sides. The circuit board is arranged in the groove and is connected to the connecting frame by bolts. The circuit board is electrically connected to the second plug through a wire.