Chip conveying platform suitable for single-chip microcomputer chip testing device

Abstract

The utility model belongs to the technical field of conveying mechanisms, particularly relates to a chip conveying platform suitable for a single-chip microcomputer chip testing device, and overcomes the technical defects that when a chip is replaced by an existing single-chip microcomputer chip testing device, shutdown operation is needed, the chip replacement process is tedious, and the testing efficiency is low. The device comprises a test platform and a feeding mechanism. The feeding mechanism comprises a feeding assembly and a driving assembly, the feeding assembly comprises a transmission wheel, a rotating wheel, a transmission belt, two moving blocks and two sets of connecting assemblies, the transmission wheel and the rotating wheel are used for installing the transmission belt, and the moving blocks are fixedly connected to the transmission belt; the connecting assemblies are respectively connected to the moving blocks, and the connecting assemblies are connected with test plates; the driving assembly is used for driving the rotating wheel to rotate forwards and backwards in a reciprocating manner, and the rotating wheel stops rotating for a certain time when the rotating wheel rotates forwards and backwards alternately, so that the two groups of connecting assemblies are driven by the transmission belt and the moving block to intermittently slide along the moving groove in a reciprocating manner, and the two test plates are alternately fed into the detection port of the test host.

Description

Technical Field

[0001] The utility model relates to the technical field of transmission mechanisms, in particular to a chip transmission platform suitable for a single-chip microcomputer chip testing device. Background Art

[0002] The patent application with publication number CN115326541A, entitled "A Fully Automatic Single-Chip Microcomputer Chip Testing Device and Its Operating Method", includes: a test host, a numerical control center is provided at the front end of the outer wall of the test host, a number of partitions divide the inner cavity of the test host into a number of test benches, a number of groups of pressure test components and chip test boxes are arranged in the test benches in a one-to-one correspondence, the pressure test components are composed of a driving cylinder and a pressure plate, the upper end of the driving cylinder is fixedly connected to the upper end of the inner cavity of the test host, and the lower end of the driving cylinder is fixedly connected to the pressure plate. After placing multiple groups of single-chip microcomputer chips to be tested in the chip test box, the driving cylinder is controlled by the numerical control center to drive the pressure plate to move downward and extend into the chip test box to give the single-chip microcomputer chip a continuously increasing pressure, and the pressure sensor displays the test results through the data display on the numerical control center. After the test is completed, the single-chip microcomputer chip can be taken out of the chip test box.

[0003] However, when implementing the above technical solution, there are the following problems: after the test of the first group of single-chip microcomputer chips is completed, when the single-chip microcomputer chips are replaced, the device needs to be stopped, and the first group of single-chip microcomputer chips need to be taken out and the second group of single-chip microcomputer chips need to be replaced before subsequent testing can be carried out. However, since the space for placing the test device is small, the process of placing and removing the single-chip microcomputer chips will be more inconvenient, which will slow down the test efficiency and affect work efficiency. Utility Model Content

[0004] In order to overcome the technical defects of existing single-chip microcomputer chip testing devices that require shutdown operations when replacing chips, the chip replacement process is cumbersome, and the test efficiency is low, the utility model provides a chip transfer platform suitable for single-chip microcomputer chip testing devices.

[0005] The utility model provides a chip conveying platform suitable for a single-chip microcomputer chip testing device, comprising a testing platform and a feeding mechanism; the testing platform is provided with two parallel moving grooves on the top, a testing host is placed on the testing platform, and a detection port of the testing host is directly opposite to the ends of the two moving grooves; the feeding mechanism comprises a feeding assembly and a driving assembly, the feeding assembly comprises a transmission wheel, a rotating wheel, a transmission belt, two moving blocks and two sets of connecting assemblies, the transmission wheel and the rotating wheel are respectively rotatably connected to the bottom of the testing platform, the transmission wheel and the rotating wheel are used to install the transmission belt, and the transmission belt between the transmission wheel and the rotating wheel is parallel to the transmission belt. The two moving blocks are respectively slidably matched with the two moving grooves, and the moving blocks are fixedly connected to the transmission belts at the corresponding positions; the two groups of connecting components are respectively fixedly connected to the two moving blocks, and the connecting components are connected to a test board, and the test board is provided with a test slot for placing the single-chip microcomputer chip; the driving component is used to drive the rotating wheel to do reciprocating forward and reverse rotation, and the rotating wheel stops for a certain period of time when alternating forward and reverse rotation, so that the two groups of connecting components can slide back and forth intermittently along the moving groove driven by the transmission belt and the moving block, and then the two test boards are alternately sent into the detection port of the test host.

[0006] The test host is a prior art device used to perform performance testing on single-chip microcomputer chips. A data display screen is installed on one side. In the feeding mechanism, the transmission wheel and the rotating wheel are connected by a transmission belt. When the driving component drives the rotating wheel to rotate back and forth, the transmission belt and its fixed moving block also alternately move forward and backward along the moving groove. The moving groove acts as a limiter for the movement of the moving block. During the forward and backward movement of the moving block, the moving block can drive the connecting component to feed the connected test board into the test host. Since the rotating wheel stops for a certain period of time when rotating forward and reverse, after one of the test boards is fed into the test host, the feeding mechanism remains stationary, leaving sufficient time for the test host to test the single-chip microcomputer chip and for the staff to replace the chip. After a certain period of time, the other test board moves toward the test host, and the chip that has been tested moves away from the test host, thereby completing the alternating feeding of the two test boards into the test port of the test host.

[0007] Preferably, the driving assembly includes a driving motor, a driving box body, a driving gear and a driven gear, the driving gear is rotatably connected to the bottom of the test platform through a linkage shaft, the driven gear is fixedly installed on the rotating shaft of the rotating wheel, and the driving gear and the driven gear are meshed; a driving gear, a transmission gear, a linkage disk, a first synchronous gear and a second synchronous gear are provided in the driving box body; the driving gear, the first synchronous gear, the second synchronous gear and the transmission gear are all located in the same plane and are rotatably connected to the driving box body through the rotating shaft respectively, the driving gear, the first synchronous gear, the second synchronous gear and the transmission gear are meshed in sequence, the driving motor is fixed to the bottom of the driving box body, the output shaft of the driving motor is transmission-connected to the rotating shaft of the driving gear, the linkage shaft passes through the driving box body and is fixedly connected to the linkage disk, and the linkage disk is located between the first synchronous gear and the second synchronous gear The top of the driving gear is fixedly connected with a first fixed block and a first driving rod which are staggered, the outer end face of the first fixed block is an arc surface, the outer end face of the first driving rod is connected with a slider, and the top of the transmission gear is fixedly connected with a second fixed block and a second driving rod which are staggered, the outer end face of the second fixed block is an arc surface, and the outer end face of the second driving rod is connected with a slider; two groups of linkage notch grooves are opened radially opposite to each other on the linkage disk, and during the rotation of the driving gear and the transmission gear, the slider on the first driving rod and the slider on the second driving rod can be driven to slide and cooperate with the two groups of linkage notch grooves respectively to make the linkage disk rotate; four arc concave surfaces are evenly arranged on the outer circumference of the linkage disk along its circumference, and during the rotation of the driving gear and the transmission gear, the first fixed block and the second fixed block can be driven to adapt to the arc concave surface through the arc surface to stop the rotation of the linkage disk.

[0008] The driving gear can drive the driven gear to rotate under the drive box body, and the rotation of the driven gear then drives the rotating wheel to rotate. The rotation of the rotating wheel can drive the transmission belt and the transmission wheel to rotate. In the drive box, the driving motor is fixedly connected to the rotating shaft of the driving gear through a coupling. The driving motor is a three-phase asynchronous motor and is connected to the external circuit through wires. When the driving motor drives the driving gear to rotate clockwise, the first synchronous gear rotates counterclockwise, the second synchronous gear rotates clockwise, and the transmission gear rotates counterclockwise. The driving gear drives the first driving rod and the first fixed block fixed thereon to rotate synchronously. As the first driving rod rotates, the slider of the first driving rod slides into one of the linkage notch grooves of the linkage disk and slides in the linkage notch groove. As the slider of the first driving rod moves, the first driving rod will Drive the linkage disk to rotate counterclockwise, the linkage disk is coaxially fixed and connected with the driving gear, so the driving gear also rotates counterclockwise. When the linkage disk and the driving gear rotate 90 degrees counterclockwise synchronously, the slider of the first driving rod will slide out of the notch of the linkage notch groove, and at the same time, the first fixed block rotates to the arc-shaped concave surface on the outer circumference of the linkage disk. The first fixed block continues to rotate with the driving gear, and the arc surface of the first fixed block will continue to move on the arc-shaped concave surface of the linkage disk. At this time, the first fixed block will limit the linkage disk, the linkage disk and the driving gear stop rotating, and the transmission belt also stops rotating. A test plate on one of the connecting rods is located at the test In the detection port of the host, the test plate on the other connecting rod is located at the other end of the moving slot, and the staff can replace the single-chip microcomputer chip; during the above operation, the second driving rod and the second fixed block on the transmission gear do not cooperate with the linkage disk; when the first fixed block moves out from the arc-shaped concave surface of the linkage disk, the transmission gear simultaneously drives the second driving rod to rotate until the slider of the second driving rod enters another set of linkage notch slots of the linkage disk. As the slider of the second driving rod slides in the linkage notch slot, the second driving rod will drive the linkage disk to rotate clockwise, and the driving gear will also rotate clockwise. When the linkage disk and the driving gear rotate clockwise synchronously, After the needle rotates 90°, the slider of the second drive rod will slide out of the notch of the linkage notch groove. At the same time, the second fixed block rotates to the arc-shaped concave surface on the outer surface of the linkage disk. The second fixed block continues to rotate with the transmission gear. The arc surface of the second fixed block will continue to move on the arc-shaped concave surface of the linkage disk. At this time, the second fixed block will limit the linkage disk. The linkage disk and the driving gear stop rotating, and the transmission belt also stops rotating. The test board originally located at the detection port of the test host resets backward to stop moving. The test board originally at the back moves forward to the detection port of the test host. The staff can replace the microcontroller chip that has completed the test. During the above operation process, the first drive rod and the first fixed block on the drive gear do not cooperate with the linkage disk.

[0009] Preferably, two limit grooves are symmetrically opened on the outer sides of the two moving grooves of the test platform, and the limit grooves are arranged along the length direction of the moving groove, and the middle section of the limit groove is displaced outward, and two slide rails parallel to the moving groove are also provided on the test platform; the connecting assembly includes a sliding block, a connecting block, a limit wheel and a connecting rod, the connecting block is slidably installed to the top of the sliding block in the horizontal direction, and the sliding direction of the sliding block is perpendicular to the direction of the slide rail, the limit wheel is located on the outer side of the connecting block and the two are fixedly connected by a support member, the connecting rod is fixedly connected to the inner side of the connecting block, the free end of the connecting rod faces the detection port of the test host, and the test plate is detachably connected to the free end of the connecting rod, the limit wheels in the two groups of connecting assemblies respectively roll with the two limit grooves, the sliding blocks in the two groups of connecting assemblies respectively slide with the two slide rails, and the sliding block is fixedly connected to the moving block corresponding to its position.

[0010] The slide rails limit the sliding block, allowing it to move along the rails. The outward displacement of the middle section of the limit slots can form the two limit slots into a bracket-like shape. When the limit wheel moves along the limit slots, especially when it reaches the middle section, the limit wheel pulls the connecting block and connecting rod outward, preventing the two sets of connecting rods from colliding when they run alternately back and forth. When the two sets of connecting rods are offset, the limit wheel returns to its normal direction along the limit slots to allow the test board to be fed into the detection port of the test host. The connecting block is mounted horizontally and slidingly on top of the sliding block so that when the limit wheel moves along the middle section of the limit slot, the connecting block can translate outward along the sliding block, thereby driving the connecting rod to translate outward.

[0011] Compared with the prior art, the technical solution provided by this utility model has the following technical effects:

[0012] The chip conveying platform described in the present invention is suitable for a single-chip microcomputer chip testing device. By being provided with a feeding mechanism and a driving motor, it is possible to realize the rapid interchange of the positions of two groups of test boards, so that the test boards can slide back and forth intermittently, so that the single-chip microcomputer chips placed in the test slots stop after being moved into the interior of the testing device, which is convenient for subsequent testing operations. At the same time, the staff can replace the single-chip microcomputer chips in the other group of test boards to prepare for the next group of tests, thereby improving work efficiency; and the two groups of connecting components can drive the test boards to avoid collisions when running alternately, thereby improving the safety and reliability of the chip conveying platform during the feeding process. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] The accompanying drawings are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present invention, and together with the description, serve to explain the principles of the present invention.

[0014] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0015] Figure 1 This is a schematic diagram of the external structure of a chip transfer platform suitable for a single-chip microcomputer chip testing device according to an embodiment of the present invention;

[0016] Figure 2 This is a schematic diagram of the bottom structure of the test platform described in a certain embodiment of the present utility model;

[0017] Figure 3 This is a structural diagram of the feeding assembly and the driving assembly in a certain embodiment of the present utility model;

[0018] Figure 4 This is a structural diagram of the connection assembly described in a certain embodiment of the present utility model.

[0019] In the figure: 1. Test platform; 2. Test host; 3. Feeding mechanism; 31. Feeding assembly; 311. Rotating wheel; 312. Transmission belt; 313. Transmission wheel; 314. Moving block; 315. Connecting assembly; 3151. Sliding block; 3152. Connecting block; 3153. Limiting wheel; 3154. Connecting rod; 3155. Support member; 32. Driving assembly; 321. Driving box; 3211. Driving gear; 3212. Transmission gear; 3213. Linkage disk; 32131, linkage notch groove; 32132, arc-shaped concave surface; 3214, first synchronous gear; 3215, second synchronous gear; 3216, first fixed block; 3217, first drive rod; 3218, second fixed block; 3219, second drive rod; 322, drive motor; 323, driving gear; 324, driven gear; 325, linkage shaft; 4, moving slot; 5, limiting slot; 6, test plate; 61, test slot; 7, slide rail. DETAILED DESCRIPTION

[0020] In order to more clearly understand the above-mentioned purpose, features and advantages of the present invention, the scheme of the present invention will be further described below. It should be noted that, in the absence of conflict, the embodiments of the present invention and the features therein can be combined with each other.

[0021] In the description, it should be noted that the terms "first" and "second" are used for descriptive purposes only and should not be understood to indicate or imply relative importance. It should be noted that, unless otherwise expressly specified or limited, the terms "installed," "connected," and "connected" should be understood broadly. For example, they can refer to fixed connections, detachable connections, or integral connections; mechanical connections or electrical connections; direct connections or indirect connections through an intermediate medium; and internal connections between two components. Those skilled in the art will understand the specific meanings of the above terms based on specific circumstances.

[0022] In the following description, many specific details are set forth to facilitate a full understanding of the present invention, but the present invention may also be implemented in other ways different from those described herein; it is obvious that the embodiments in the specification are only part of the embodiments of the present invention, rather than all of the embodiments.

[0023] The specific embodiments of the present invention are described in detail below with reference to the accompanying drawings.

[0024] In one embodiment, Figure 1As shown, a chip conveying platform suitable for a single-chip microcomputer chip testing device includes a test platform 1 and a feeding mechanism 3; the test platform 1 has two parallel moving grooves 4 on its top, the test host 2 is placed on the test platform 1, and the detection port of the test host 2 is facing the ends of the two moving grooves 4; the feeding mechanism 3 includes a feeding component 31 and a driving component 32, the feeding component 31 includes a transmission wheel 313, a rotating wheel 311, a transmission belt 312, two moving blocks 314 and two sets of connecting components 315, the transmission wheel 313 and the rotating wheel 311 are respectively rotatably connected to the bottom of the test platform 1, the transmission wheel 313 and the rotating wheel 311 are used to install the transmission belt 312, and the transmission belt 314 between the transmission wheel 313 and the rotating wheel 311 is connected to the bottom of the test platform 1. 12 are parallel and correspond to the positions of the two movable grooves 4 respectively; two movable blocks 314 are respectively slidably engaged with the two movable grooves 4, and the movable blocks 314 are fixedly connected to the transmission belts 312 at the corresponding positions; two sets of connecting components 315 are respectively fixedly connected to the two movable blocks 314, and the connecting components 315 are connected to the test board 6, and the test board 6 is provided with a test slot 61 for placing the single-chip microcomputer chip; the driving component 32 is used to drive the rotating wheel 311 to reciprocate forward and reverse, and the rotating wheel 311 stops for a certain period of time when alternating forward and reverse, so that the two sets of connecting components 315 are driven by the transmission belts 312 and the movable blocks 314 to slide back and forth intermittently along the movable grooves 4, thereby alternately feeding the two test boards 6 into the detection port of the test host 2. The test host 2 is a prior art and is used to perform performance testing on single-chip microcomputer chips. A data display screen is installed on one side. The cam 314 is rotated to move the check valve 316 back and forth, and the check valve 316 is rotated to move the check valve 316 back and forth, so that the check valve 316 can be turned off.

[0025] Based on the above embodiment, in a preferred embodiment, the drive component

[0026] 32 includes a driving motor 322, a driving box body 321, a driving gear 323 and a driven gear 324. The driving gear 323 is rotatably connected to the bottom of the test platform 1 through a linkage shaft 325. The driven gear 324 is fixedly mounted on the shaft of the rotating wheel 311. The driving gear 323 and the driven gear 324 are meshed; the driving box body 321 is provided with a driving gear 3211, a transmission gear 3212, a linkage plate 3213, a first synchronous gear 3214 and a second synchronous gear 3215; the driving gear 3211, the first synchronous gear 3214, the second synchronous gear 3215 The gear 3215 and the transmission gear 3212 are both located in the same plane and are respectively connected to the drive box body 321 through a rotating shaft. The drive gear 3211, the first synchronous gear 3214, the second synchronous gear 3215 and the transmission gear 3212 are meshed in sequence. The drive motor 322 is fixed to the bottom of the drive box body 321. The output shaft of the drive motor 322 is connected to the rotating shaft of the drive gear 3211. The linkage shaft 325 passes through the drive box body 321 and is fixedly connected to the linkage disk 3213. The linkage disk 3213 is located between the first synchronous gear 3214 and the second synchronous gear 3214. The top of the driving gear 3211 is fixedly connected with a staggered first fixed block 3216 and a first driving rod 3217, the outer end surface of the first fixed block 3216 is an arc surface, and the outer end of the first driving rod 3217 is connected with a slider. The top of the transmission gear 3212 is fixedly connected with a staggered second fixed block 3218 and a second driving rod 3219, the outer end surface of the second fixed block 3218 is an arc surface, and the outer end of the second driving rod 3219 is connected with a slider; the linkage disk 3213 is provided with two sets of linkage notch grooves 32131 along its radial direction. During the rotation of the driving gear 3211 and the transmission gear 3212, the slider on the first driving rod 3217 and the slider on the second driving rod 3219 can be driven to slide with the two sets of linkage notch grooves 32131 respectively, so that the linkage disk 3213 rotates; four arc-shaped concave surfaces 32132 are evenly arranged along the circumference of the outer circular surface of the linkage disk 3213. During the rotation of the driving gear 3211 and the transmission gear 3212, the first fixed block 3216 and the second fixed block 3218 can be driven to adapt to the arc-shaped concave surfaces 32132 through the arc surface, so that the linkage disk 3213 stops rotating.

[0027] Driven by the drive box body 321, the driving gear 323 can drive the driven gear 324 to rotate. The rotation of the driven gear 324 then drives the rotating wheel 311 to rotate. The rotation of the rotating wheel 311 can drive the transmission belt 312 and the transmission wheel 313 to rotate. In the drive box, the driving motor 322 is fixedly connected to the rotating shaft of the driving gear 3211 through a coupling. The driving motor 322 is a three-phase asynchronous motor and is connected to the external circuit through wires. When the driving motor 322 drives the driving gear 3211 to rotate clockwise, the first synchronous gear 3214 rotates counterclockwise, the second synchronous gear 3215 rotates clockwise, and the transmission gear 3212 rotates counterclockwise. The driving gear 3211 drives the first driving rod 3217 and the first fixed block 3217 fixed thereto. 216 rotates synchronously, and as the first driving rod 3217 rotates, the slider of the first driving rod 3217 slides into one of the linkage notch grooves 32131 of the linkage disk 3213 and slides in the linkage notch groove 32131. As the slider of the first driving rod 3217 moves, the first driving rod 3217 drives the linkage disk 3213 to rotate counterclockwise. The linkage disk 3213 is coaxially fixed and connected to the driving gear 323, so the driving gear 323 also rotates counterclockwise. After the driving gear 323 and the first driving rod 3213 rotate counterclockwise by 90 degrees synchronously, the slider of the first driving rod 3217 will slide out of the notch of the linkage notch groove 32131, and at the same time, the first fixing block 3216 rotates to the arc-shaped concave surface 32132 on the outer surface of the linkage disk 3213. The first fixing block 3216 continues to rotate with the driving gear 3211, and the arc surface of the first fixing block 3216 will continue to move on the arc-shaped concave surface 32132 of the linkage disk 3213. At this time, the first fixing block 3216 will contact the linkage disk 3213 acts as a limit, the linkage disk 3213 and the driving gear 323 stop rotating, and the transmission belt 312 also stops rotating. The test board 6 on one connecting rod 3154 is located in the detection port of the test host 2, and the test board 6 on the other connecting rod 3154 is located at the other end of the movable slot 4. The staff can replace the single-chip microcomputer chip. During the above operation, the second driving rod 3219 and the second fixing block 3218 on the transmission gear 3212 do not cooperate with the linkage disk 3213.When the first fixing block 3216 moves out from the arc-shaped concave surface 32132 of the linkage disk 3213, the transmission gear 3212 simultaneously drives the second driving rod 3219 to rotate until the slider of the second driving rod 3219 enters another set of linkage notch grooves 32131 of the linkage disk 3213. As the slider of the second driving rod 3219 slides in the linkage notch groove 32131, the second driving rod 3219 will drive the linkage disk 3213 to rotate clockwise, and the driving gear 323 will also rotate clockwise. When the linkage disk 3213 and the driving gear 323 rotate clockwise synchronously by 90 degrees, the slider of the second driving rod 3219 will slide out from the notch of the linkage notch groove 32131, and the second The fixed block 3218 rotates to the arcuate concave surface 32132 on the outer circumference of the linkage disk 3213. The second fixed block 3218 continues to rotate with the transmission gear 3212. The arcuate surface of the second fixed block 3218 will continue to move on the arcuate concave surface 32132 of the linkage disk 3213. At this time, the second fixed block 3218 will limit the linkage disk 3213, and the linkage disk 3213 and the driving gear 323 will stop rotating. The transmission belt 312 also stops rotating. The test board 6 originally located at the detection port of the test host 2 resets to stop moving. The test board 6, which was originally at the back, moves forward to the detection port of the test host 2. The staff can replace the microcontroller chip that has been tested. During this operation, the first drive rod 3217 and the first fixed block 3216 on the drive gear 3211 do not cooperate with the linkage disk 3213.

[0028] On the basis of the above embodiments, in a preferred embodiment, two limiting grooves 5 are symmetrically opened on the outer sides of the two moving grooves 4 of the test platform 1, and the limiting grooves 5 are arranged along the length direction of the moving groove 4. The middle section of the limiting groove 5 is displaced outward, and two slide rails parallel to the moving groove 4 are also provided on the test platform 1; the connecting assembly 315 includes a sliding block 3151, a connecting block 3152, a limiting wheel 3153 and a connecting rod 3154, and the connecting block 3152 is slidably installed to the top of the sliding block 3151 in the horizontal direction, and the sliding direction of the sliding block 3151 is perpendicular to the direction of the slide rail, and the limiting The limiting wheel 3153 is located on the outer side of the connecting block 3152 and the two are fixedly connected by a support member 3155. The connecting rod 3154 is fixedly connected to the inner side of the connecting block 3152. The free end of the connecting rod 3154 faces the detection port of the test host 2. The test plate 6 is detachably connected to the free end of the connecting rod 3154. The limiting wheels 3153 in the two groups of connecting components 315 respectively roll with the two limiting grooves 5. The sliding blocks 3151 in the two groups of connecting components 315 respectively slide with the two slide rails. The sliding blocks 3151 are fixedly connected to the moving blocks 314 corresponding to their positions.

[0029] The slide rails limit the sliding block 3151, allowing it to move along the rails. The outward displacement of the middle section of the limiting slot 5 causes the two limiting slots 5 to form a bracket-like shape. When the limiting wheel 3153 moves along the limiting slot 5, especially when it reaches the middle section of the limiting slot 5, the limiting wheel 3153 pulls the connecting block 3152 and the connecting rod 3154 outward, preventing the two sets of connecting rods 3154 from colliding when they alternately move forward and backward. When the two sets of connecting rods 3154 have passed each other, the limiting wheel 3153 returns to its normal position along the limiting slot 5, allowing the test board 6 to be delivered to the inspection port of the test host 2. The connecting block 3152 is horizontally slidably mounted on the top of the sliding block 3151 so that when the limiting wheel 3153 moves along the middle section of the limiting slot 5, the connecting block 3152 can translate outward along the sliding block 3151, thereby driving the connecting rod 3154 to translate outward.

[0030] The working process of a chip transfer platform suitable for a single-chip microcomputer chip testing device described in the present invention is as follows: when working, first, the single-chip microcomputer chip is placed in the test slot 61 of the test board 6, and then the drive motor 322 is started. When the drive motor 322 drives the drive gear 3211 to rotate clockwise, the first synchronous gear 3214 rotates counterclockwise, the second synchronous gear 3215 rotates clockwise, and the transmission gear 3212 rotates counterclockwise. The drive gear 3211 drives the first drive rod 3217 and the first fixed block 3216 fixed thereon to rotate synchronously. As the first drive rod 3217 rotates, the slider of the first drive rod 3217 slides into one group of linkage notch grooves 32131 of the linkage disk 3213 and slides in the linkage notch groove 32131. As the slider of the first drive rod 3217 moves, the first drive rod 3217 drives the linkage disk 3213 to rotate counterclockwise. The linkage disk 3213 is coaxially fixed and connected to the driving gear 323, so the driving gear 323 also rotates counterclockwise. The first fixed block 3216 rotates to the arc-shaped concave surface 32132 on the outer surface of the linkage disk 3213, and the first fixed block 3216 continues to rotate with the driving gear 3211, and the first fixed block 3216 continues to rotate with the driving gear 3211. The arcuate surface of a fixed block 3216 will continue to move on the arcuate concave surface 32132 of the linkage disk 3213. At this time, the first fixed block 3216 will limit the linkage disk 3213, and the linkage disk 3213 and the driving gear 323 will stop rotating. The transmission belt 312 will also stop rotating. The test board 6 on one connecting rod 3154 is located in the detection port of the test host 2, and the test board 6 on the other connecting rod 3154 is located at the other end of the movable slot 4. The staff can replace the single-chip microcomputer chip.When the first fixed block 3216 moves out of the arc-shaped concave surface 32132 of the linkage disk 3213, the transmission gear 3212 simultaneously drives the second driving rod 3219 to rotate until the slider of the second driving rod 3219 enters another set of linkage notch grooves 32131 of the linkage disk 3213. As the slider of the second driving rod 3219 slides in the linkage notch groove 32131, the second driving rod 3219 will drive the linkage disk 3213 to rotate clockwise, and the driving gear 323 will also rotate clockwise. When the linkage disk 3213 and the driving gear 323 rotate clockwise synchronously by 90 degrees, the slider of the second driving rod 3219 will slide out from the notch of the linkage notch groove 32131, and the second fixed block 3216 will simultaneously drive the second driving rod 3219 to rotate The fixed block 3218 rotates to the arc-shaped concave surface 32132 on the outer circumferential surface of the linkage disk 3213, and the second fixed block 3218 continues to rotate with the transmission gear 3212. The arc surface of the second fixed block 3218 will continue to move on the arc-shaped concave surface 32132 of the linkage disk 3213. At this time, the second fixed block 3218 will limit the linkage disk 3213, and the linkage disk 3213 and the driving gear 323 stop rotating. The transmission belt 312 also stops rotating. The test board 6 originally located at the detection port of the test host 2 moves backward and resets until it stops moving. The test board 6 originally at the back moves forward to the detection port of the test host 2, and the staff can replace the microcontroller chip that has completed the test. During the above process, the rotating wheel 311 rotates back and forth, and the rotating wheel 311 stops for a certain period of time during the alternating forward and reverse rotations. This allows the two sets of connecting components 315 to slide back and forth intermittently along the movable groove 4 under the drive belt 312 and the movable block 314, thereby alternately feeding the two test boards 6 into the detection port of the test host 2. The drive motor 322 does not need to be stopped, and the two test boards 6 can work rapidly and alternately, thereby improving testing efficiency.

[0031] The above description is only a specific embodiment of the present invention, which enables those skilled in the art to understand or implement the present invention. Although detailed descriptions have been made with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein with equivalents; and such modifications or replacements do not deviate from the essence of the corresponding technical solutions within the scope of the technical solutions of the embodiments, and they should all be covered by the scope of protection of the claims.

Claims

1. A chip transfer platform suitable for a single-chip microcomputer chip testing device, characterized in that: It comprises a testing platform (1) and a feeding mechanism (3); The test platform (1) has two parallel movable grooves (4) on its top, and the test host (2) is placed on the test platform (1), with the detection port of the test host (2) facing the ends of the two movable grooves (4); The feeding mechanism (3) comprises a feeding assembly (31) and a driving assembly (32); the feeding assembly (31) comprises a rotating wheel (311), a transmission belt (312), a transmission wheel (313), two moving blocks (314) and two sets of connecting assemblies (315); the transmission wheel (313) and the rotating wheel (311) are respectively rotatably connected to the bottom of the test platform (1); the transmission wheel (313) and the rotating wheel (311) are used to install the transmission belt (312); the transmission belt (312) between the transmission wheel (313) and the rotating wheel (311) is parallel and corresponds to the position of the two moving grooves (4); the two moving blocks (314) are respectively slidably matched with the two moving grooves (4), and the moving blocks (314) are respectively rotat ... matched with the two moving grooves (4), and the moving blocks (314) are respectively rotatably matched with the two moving grooves (4). The two connecting assemblies (315) are fixedly connected to the two moving blocks (314) at corresponding positions; the two connecting assemblies (315) are respectively fixedly connected to the two moving blocks (314); the connecting assemblies (315) are connected to a test board (6); the test board (6) is provided with a test slot (61) for placing a single-chip microcomputer chip; the driving assembly (32) is used to drive the rotating wheel (311) to do reciprocating forward and reverse rotation, and the rotating wheel (311) stops for a certain period of time when doing the forward and reverse rotation, so that the two connecting assemblies (315) are driven by the transmission belt (312) and the moving block (314) to do reciprocating intermittent sliding along the moving slot (4), thereby alternately sending the two test boards (6) into the detection port of the test host (2).

2. The chip transfer platform suitable for a single-chip microcomputer chip testing device according to claim 1, characterized in that: The driving assembly (32) includes a driving box body (321), a driving motor (322), a driving gear (323) and a driven gear (324), wherein the driving gear (323) is rotatably connected to the bottom of the test platform (1) via a linkage shaft (325), and the driven gear (324) is fixedly mounted on the shaft of the rotating wheel (311), and the driving gear (323) and the driven gear (324) are meshed with each other; the driving box body (321) is provided with a driving gear (3211), a transmission gear (3212), a linkage disk (3213), a first synchronous gear (3214) and a second synchronous gear (3215); the driving gear (3211), the first synchronous gear (3214), the second synchronous gear (3215) and the transmission gear (3212) are all located in the same plane and are respectively connected to the driving box body (321) through the rotating shaft. The driving gear (3211), the first synchronous gear (3214), the second synchronous gear (3215) and the transmission gear (3212) are meshed in sequence. The driving motor (322) is fixed to the bottom of the driving box body (321). The output shaft of the driving motor (322) is connected to the rotating shaft of the driving gear (3211). The linkage rotating shaft (325) passes through the driving box body (321) and is fixedly connected to the linkage disk (3213). The linkage disk (3213) is located between the first synchronous gear ( 3214), and above the second synchronous gear (3215); the top of the driving gear (3211) is fixedly connected with a first fixed block (3216) and a first driving rod (3217) arranged in a staggered manner, the outer end surface of the first fixed block (3216) is an arc surface, and the outer end of the first driving rod (3217) is connected with a slider; the top of the transmission gear (3212) is fixedly connected with a second fixed block (3218) and a second driving rod (3219) arranged in a staggered manner, the outer end surface of the second fixed block (3218) is an arc surface, and the outer end of the second driving rod (3219) is connected with a slider; the linkage disk (3213) is provided with two groups of linkage notch grooves (3214) in a radial direction thereof. 131), during the rotation of the driving gear (3211) and the transmission gear (3212), the slider on the first driving rod (3217) and the slider on the second driving rod (3219) can be driven to slide and cooperate with the two sets of linkage notch grooves (32131) respectively, so as to rotate the linkage disk (3213); four arc-shaped concave surfaces (32132) are evenly arranged on the outer circular surface of the linkage disk (3213) along its circumference, and during the rotation of the driving gear (3211) and the transmission gear (3212), the first fixed block (3216) and the second fixed block (3218) can be driven to adapt to the arc-shaped concave surfaces (32132) through the arc surfaces, so as to stop the rotation of the linkage disk (3213).

3. A chip transfer platform suitable for a single-chip microcomputer chip testing device according to claim 1 or 2, characterized in that: Two limiting grooves (5) are symmetrically opened on the outer sides of the two moving grooves (4) of the test platform (1), and the limiting grooves (5) are arranged along the length direction of the moving grooves (4). The middle section of the limiting grooves (5) is displaced outward. The test platform (1) is also provided with two slide rails parallel to the moving grooves (4); the connecting assembly (315) includes a sliding block (3151), a connecting block (3152), a limiting wheel (3153) and a connecting rod (3154). The connecting block (3152) is slidably installed to the top of the sliding block (3151) in the horizontal direction, and the sliding direction of the sliding block (3151) is perpendicular to the direction of the slide rails. The limiting wheel (3153) is located at the connecting rod (3154). The connecting block (3152) is located on the outer side and the two are fixedly connected by a support member (3155). The connecting rod (3154) is fixedly connected to the inner side of the connecting block (3152). The free end of the connecting rod (3154) faces the detection port of the test host (2). The test plate (6) is detachably connected to the free end of the connecting rod (3154). The limiting wheels (3153) in the two groups of connecting components (315) are respectively in rolling engagement with the two limiting grooves (5). The sliding blocks (3151) in the two groups of connecting components (315) are respectively in sliding engagement with the two slide rails. The sliding blocks (3151) are fixedly connected to the moving blocks (314) corresponding to their positions.

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