Double-plate function test fixture and double-plate function test equipment

By designing a dual-board functional test fixture, it is possible to test two main boards at the same time, which improves test efficiency and reduces costs. This solves the problems of low efficiency and high cost in existing technologies and ensures the safety of the main boards and the accuracy of code scanning.

CN223389859UActive Publication Date: 2025-09-26LCFC HEFEI ELECTRONICS TECH
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Patent Information

Application Number
CN202422363490.3
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-09-25
Publication Date
2025-09-26
Estimated Expiration
2034-09-25

AI Technical Summary

Technical Problem

In the current electronic testing of the PC industry, motherboard functional testing is inefficient, test fixture costs are high, and manual operation can easily lead to damage to peripheral motherboard parts and scanning errors.

Method used

A dual-board functional test fixture is designed, which includes an upper mold frame and a lower mold frame that can be opened and closed, a built-in dual-board needle implant module and a barcode scanner module. It can test two main boards at the same time, and the barcode scanner is fixed by magnetic parts and fixing parts to achieve quick disassembly and position adjustment. It is equipped with a heat dissipation module to prevent overheating.

Benefits of technology

It improves test efficiency by 50%, reduces fixture costs, reduces code scanning errors, protects motherboard peripheral components, and improves test stability and efficiency.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model provides a double-board function test fixture and double-board function test equipment. A double-board function test jig comprises a jig body, the jig body comprises an upper die frame and a lower die frame, the double-board needling module comprises a carrier plate, a first to-be-tested main board and a second to-be-tested main board, and a second to-be-tested main board and a second to-be-tested main board, the first test needle plate is mounted between the carrier plate and the lower mold frame plate, a plurality of lower mold planting needles are arranged on the first test needle plate, and the lower mold planting needles are used for penetrating through needle holes in the carrier plate to abut against test points of the first to-be-tested mainboard and the second to-be-tested mainboard; and the second test needle plate is installed on the upper mold frame body, a plurality of upper mold planting needles are arranged on the second test needle plate, and the upper mold planting needles are used for abutting against test points of the first mainboard to be tested and the second mainboard to be tested. According to the dual-board function test fixture, the two sets of test needle plates are designed in one fixture, two to-be-tested mainboards can be tested at the same time, and the test efficiency is improved.
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Description

Technical Field

[0001] The present disclosure relates to the technical field of test fixtures, and in particular to a dual-board functional test fixture and a dual-board functional test device. Background Art

[0002] Currently, in electronic testing related to the PC industry, motherboard functional testing is essentially performed manually on a single board or by automated pick-and-place testing. Therefore, existing test fixture designs can only test one motherboard at a time, resulting in low testing efficiency. Furthermore, the single-board testing method requires a large number of test fixtures, resulting in high production costs. Furthermore, since it is a single-board test, the board edges are unprotected, making it easy for manual operation to cause collisions with surrounding motherboard components. Furthermore, manual code scanning testing results in poor efficiency, with frequent scanning errors and the need for repeated code scanning. Utility Model Content

[0003] The present disclosure provides a dual-board functional test fixture and a dual-board functional test device to at least solve one of the technical problems existing in the prior art.

[0004] According to a first aspect of the present disclosure, a dual-board functional test jig is provided, comprising a jig body, the jig body comprising an upper mold frame and a lower mold frame plate that can be opened and closed, and a dual-board needle implanting module, the dual-board needle implanting module comprising:

[0005] A carrier board, the carrier board being used to carry the first mainboard to be tested and the second mainboard to be tested;

[0006] A first test needle board, which is installed between the carrier board and the lower mold frame board and is provided with a plurality of lower mold planting pins, which are used to pass through the pinholes on the carrier board to abut against the test points of the first and second main boards to be tested;

[0007] The second test needle board is installed on the upper mold frame. The second test needle board is provided with a plurality of upper mold planting needles, which are used to abut against the test points of the first and second main boards to be tested.

[0008] In one embodiment, a barcode scanner module is further included, and the barcode scanner module includes:

[0009] A first barcode scanner, which is mounted on the upper mold frame through a barcode scanner fixing module and is arranged corresponding to the position of the first motherboard to be tested;

[0010] A second barcode scanner, which is mounted on the upper mold frame through a barcode scanner fixing module and is arranged corresponding to the position of the second motherboard to be tested;

[0011] The barcode scanner fixing module is configured to fix the corresponding barcode scanner and adjust the position of the corresponding barcode scanner relative to the corresponding mainboard to be tested, so that the corresponding barcode scanner scans the corresponding mainboard to be tested.

[0012] In one embodiment, the first barcode scanner is electrically connected to the first motherboard to be tested through a first USB interface, and the second barcode scanner is electrically connected to the second motherboard to be tested through a second USB interface, wherein the first USB interface and the second USB interface are of different types.

[0013] In one embodiment, the barcode scanner fixing module includes: a module body, a first end of the module body is slidably mounted on the upper mold frame, and a second end is formed with a mounting groove for mounting the barcode scanner;

[0014] A magnetic component is installed at the second end of the module body, and is used to magnetically fix the code scanner in the installation slot.

[0015] In one embodiment, the barcode scanner fixing module further includes a fixing member, which is threadedly connected to the second end of the module body along the vertical direction, and the fixing member is used to fix the barcode scanner in the mounting slot in the vertical direction.

[0016] In one embodiment, it further includes a heat dissipation module, which includes a plurality of heat dissipation elements. The plurality of heat dissipation elements are installed on the second test needle board at intervals, and the plurality of heat dissipation elements are used to dissipate heat for the first motherboard to be tested and the second motherboard to be tested.

[0017] In one possible implementation manner, the heat sink is a heat sink, and the heat sink is used to abut against chips of the first motherboard to be tested and the second motherboard to be tested during testing.

[0018] In one embodiment, the heat dissipation module further includes a heat dissipation fan, which is installed on the upper mold frame and is used to dissipate heat from the heat sink.

[0019] According to a second aspect of the present disclosure, a dual-board functional testing device is provided, comprising a base and a dual-board functional testing fixture according to any one of the embodiments of the first aspect, wherein the dual-board functional testing fixture is installed in the base.

[0020] In one embodiment, a dual-screen support module is further included, and the dual-screen support module includes:

[0021] a first bracket, the first bracket being mounted on the base via a first fixing plate, the first bracket being used to support a first display screen;

[0022] The second bracket is installed on the first bracket through a second fixing plate, and the second bracket is used to support a second display screen.

[0023] Compared with the existing technology, the advantages of this application are: 1) In the dual-board functional test fixture of this application, two sets of test needle boards are designed inside one fixture, which can test two motherboards to be tested (referred to as "mainboards") at the same time, and realize the simultaneous pin implantation and power-on test of two motherboards, which improves the test efficiency by 50%. 2) The fixture of this application can test both single boards and dual boards, and has strong flexible testing capabilities. 3) The barcode scanner fixing module of this application can realize the rapid disassembly and replacement of the barcode scanner, as well as the fine-tuning of the position, thereby improving the scanning rate.

[0024] It should be understood that the contents described in this section are not intended to identify the key or important features of the embodiments of the present disclosure, nor are they intended to limit the scope of the present disclosure. Other features of the present disclosure will become readily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] The above and other objects, features and advantages of the exemplary embodiments of the present disclosure will become readily understood by reading the detailed description below with reference to the accompanying drawings, in which several embodiments of the present disclosure are shown by way of example and not limitation, wherein:

[0026] In the drawings, the same or corresponding reference numerals denote the same or corresponding parts.

[0027] Figure 1 The structure of the double-board functional test fixture in the closed state is shown in FIG. Figure 1 ;

[0028] Figure 2 The structure of the double-board functional test fixture in the closed state is shown in FIG. Figure 2 ;

[0029] Figure 3 The structure of the dual-board functional test fixture in the open state is shown in FIG. Figure 1 ;

[0030] Figure 4 Schematic diagram of the explosion of the double-board functional test fixture of the embodiment of the present disclosure Figure 1 ;

[0031] Figure 5 Schematic diagram of the explosion of the double-board functional test fixture of the embodiment of the present disclosure Figure 2 ;

[0032] Figure 6 Schematic diagram of the explosion of the double-board functional test fixture of the embodiment of the present disclosure Figure 3 ;

[0033] Figure 7 A schematic structural diagram of a barcode scanner fixing module of a dual-board functional test fixture according to an embodiment of the present disclosure is shown;

[0034] Figure 8 A schematic structural diagram of a dual-board functional testing device according to an embodiment of the present disclosure is shown;

[0035] Figure 9 An exploded schematic diagram of a dual-board functional testing device according to an embodiment of the present disclosure is shown.

[0036] Explanation of the numbers in the figure: 1-dual-board functional test fixture, 2-fixture body, 3-dual-board needle implantation module, 4-first main board to be tested, 5-second main board to be tested, 6-barcode scanner module, 7-barcode scanner fixing module, 8-heat dissipation module, 9-dual-board functional test equipment, 21-upper mold frame, 22-lower mold frame, 31-carrier board, 32-first test needle board, 33-second test needle board, 61-first barcode scanner, 62-second barcode scanner, 71-module body, 72-fixing part, 73-magnetic part, 74-mounting slot, 75-slide rail, 81-heat sink, 82-cooling fan, 91-base, 92-dual-screen bracket module, 311-pinhole, 312-guide groove, 313-wiring groove, 321-guide column, 331-guide sleeve, 921-first bracket, 922-second bracket, 923-first display screen, 924-second display screen, 9211-first fixing plate, 9221-second fixing plate. DETAILED DESCRIPTION

[0037] To make the purposes, features, and advantages of the present disclosure more apparent and understandable, the technical solutions in the embodiments of the present disclosure will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present disclosure, not all of them. All other embodiments obtained by those skilled in the art based on the embodiments of the present disclosure without creative work shall fall within the scope of protection of the present disclosure.

[0038] According to one embodiment of the present disclosure, the present utility model provides a dual-board functional test fixture 1. Figure 1-7 As shown, a dual-board functional test fixture 1 includes a fixture body 2, the fixture body 2 includes an upper mold frame 21 and a lower mold frame plate 22 that can be opened and closed, and also includes a dual-board needle implant module 3, the dual-board needle implant module 3 includes:

[0039] A carrier board 31, the carrier board 31 is used to carry the first motherboard to be tested 4 and the second motherboard to be tested 5;

[0040] A first test pin board 32 is installed between the carrier board 31 and the lower mold frame board 22 and is provided with a plurality of lower mold planting pins. These lower mold planting pins are used to pass through the pinholes 311 on the carrier board 31 to abut against the test points of the first and second test motherboards 4 and 5;

[0041] The second test needle plate 33 is installed on the upper mold frame 21. The second test needle plate 33 is provided with a plurality of upper mold planting needles, which are used to abut against the test points of the first motherboard to be tested 4 and the second motherboard to be tested 5.

[0042] like Figure 1-6 As shown, the upper mold frame 21 is a frame structure with openings on both the top and bottom surfaces and a hollow interior, and the lower mold frame plate 22 is a plate-like structure with an opening in the middle. The upper mold frame 21 and the lower mold frame plate 22 are opened or closed by a mounting plate and a rotating shaft.

[0043] Two pinning areas are designed on the first test pin board 32 to accommodate the first and second motherboards under test 4 and 5. These two pinning areas are arranged side by side, and multiple lower mold pins are installed on the pinning areas. The lower mold pins can pass through the pinholes 311 on the carrier board 31 and abut the test points of the first and second motherboards under test 4 and 5. Because the two pinning areas on the first test pin board 32 are seamlessly connected, both motherboards can be tested simultaneously, and the pinning can also accurately and stably test the test points of the motherboards under test.

[0044] The two ends of the first test needle plate 32 and the avoidance needle planting area are installed on the lower mold frame plate 22 by means of fixing parts such as screws; in addition, a guide column 321 is installed on the first test needle plate 32 to avoid the needle planting area, which is used to provide guidance for the installation of the carrier plate 31. A guide groove 312 adapted to the guide column 321 is provided at the corresponding position of the carrier plate 31. The guide groove 312 of the carrier plate 31 is passed through and supported on the guide column 321. The carrier plate 31 is fixedly installed on the first test needle plate 32 by fixing parts such as bolts, and the two are spaced apart. In addition, the first main board 4 to be tested and the second main board 5 to be tested (such as Figure 3 As shown, the first motherboard to be tested 4 and the second motherboard to be tested 5 are simply shown as board structures, and the chips thereon such as CPU are not shown).

[0045] like Figure 3-6As shown, the second test needle plate 33 is fixed to the opening on the bottom surface of the upper mold frame. The second test needle plate 33 is also planned to have two needle planting areas that are compatible with the first main board 4 to be tested and the second main board 5 to be tested. A plurality of upper mold planting needles are installed on the needle planting areas. The surrounding areas of the second test needle plate 33 and the avoidance needle planting area are installed on the upper mold frame 21 through fixing parts. In addition, a guide sleeve 331 that is compatible with the guide column 321 is installed on the avoidance needle planting area of ​​the second test needle plate 33. When the upper mold frame 21 and the lower mold frame plate 22 of the fixture body are closed, the guide sleeve 331 on the second test needle plate 33 is passed through the guide column 321, and the second test needle plate 33 is spaced apart from the carrier plate 31.

[0046] In this application's dual-board functional test fixture 1 (referred to as the "fixture," the same applies hereafter), two sets of test probes are designed into one fixture, allowing for simultaneous testing of two motherboards under test (referred to as the "motherboards"), enabling simultaneous pin implantation and power-on testing of both motherboards, increasing testing efficiency by 50%. Therefore, this fixture can test both single and dual boards, offering greater flexibility.

[0047] In one embodiment, Figure 1-5 As shown, the dual-board functional test fixture of the present application also includes a barcode scanner module 6, which includes:

[0048] A first barcode scanner 61 is mounted on the upper mold frame 21 via a barcode scanner fixing module 7 and is positioned corresponding to the first motherboard to be tested 4;

[0049] The second barcode scanner 62 is mounted on the upper mold frame 21 via the barcode scanner fixing module 7 and is positioned corresponding to the second motherboard to be tested 5;

[0050] The scanner fixing module 7 is configured to simultaneously fix the corresponding scanner and adjust the position of the corresponding scanner relative to the corresponding motherboard under test, so that the corresponding scanner can scan the corresponding motherboard under test. That is, the scanner fixing module corresponding to the first scanner is configured to simultaneously fix the first scanner and adjust the position of the first scanner relative to the first motherboard under test, so that the first scanner can scan the first motherboard under test. The scanner fixing module corresponding to the second scanner is configured to simultaneously fix the second scanner and adjust the position of the second scanner relative to the second motherboard under test, so that the second scanner can scan the second motherboard under test.

[0051] For example, the scanner fixed module 7 includes:

[0052] The module body 71 has a first end slidably mounted on the upper mold frame 21 and a second end formed with a mounting slot 74 for mounting a barcode scanner;

[0053] The magnetic member 73 is installed at the second end of the module body 71 . The magnetic member 73 is used to magnetically fix the barcode scanner in the installation slot 74 .

[0054] Furthermore, the barcode scanner fixing module 7 also includes a fixing member 72, which is threadedly connected to the second end of the module body 71 along the vertical direction. The fixing member 72 is used to fix the barcode scanner in the installation slot 711 in the vertical direction.

[0055] For example, Figure 1 、 Figure 7 As shown, a slide rail 75 is provided along the length of the first end of the module body 71. The slide rail is a long hole-shaped structure. The module body can be slidably installed on the upper mold frame through the slide rail 75 by screws and other fixing parts.

[0056] The barcode scanner fixing module 7 of the present application is mainly fixed to the fixture through fixing parts such as slide rails and screws, and then the barcode scanner is accurately aligned to the scanning area through the adjustable slide rail to realize the scanning function.

[0057] The barcode scanner fixing module can fix two types of barcode scanners by setting fixing parts and magnetic parts, so that the staff can adjust the fixing method of the barcode scanner according to the specifications of the barcode scanner. For example, when a metal barcode scanner or a barcode scanner with too small size is selected, it can be directly fixed with a magnetic part to achieve quick disassembly; when barcode scanners of different sizes are selected, the barcode scanner can be fixed by fixing parts. The barcode scanner can be fine-tuned by setting the slide rail to improve the scanning rate. Therefore, the barcode scanner fixing module of this application can realize the rapid disassembly and replacement of the barcode scanner, as well as the fine-tuning of the position to improve the scanning rate.

[0058] Since the position of the SMT (surface mount technology) laser motherboard barcode on each motherboard test is slightly different each time, the staff needs to disassemble and assemble the barcode scanning equipment. Therefore, in order to achieve quick disassembly and assembly and to accurately obtain the barcode information, this application designs a barcode scanner fixing module. By setting a slide rail at the first end of the module body, the position of the barcode scanner relative to the motherboard can be fine-tuned to improve the scanning rate. In addition, by setting magnetic parts and fixing parts, the staff can quickly disassemble and assemble, and at the same time, multiple sets of fixtures can use one set of barcode scanning devices, saving costs and improving testing efficiency.

[0059] In one embodiment, the first barcode scanner 61 is electrically connected to the first motherboard under test 4 through a first USB interface, and the second barcode scanner 62 is electrically connected to the second motherboard under test 5 through a second USB interface, wherein the first USB interface and the second USB interface are of different types.

[0060] To prevent the scanner from being incorrectly installed during line changes, which could lead to incorrect scanning on the motherboard, the fixture in this application features two USB interfaces. For example, the first USB interface can be a Type A USB 2.0 port, and the second USB interface can be a Type B USB 2.0 port. This prevents the risk of scanner installation errors and improves the fixture's testing efficiency.

[0061] Among them, after the mainboard is turned on, it automatically sends instructions to the corresponding barcode scanner. After the barcode scanner receives the instructions, it starts working. The light source of the barcode scanner is illuminated on the barcode of the mainboard. The barcode scanner converts the optical signal into an analog electrical signal, and then converts it into a digital signal through an analog-to-digital converter and transmits it to the mainboard. The mainboard transmits the digital signal to the background test system. The test system receives the digital signal, analyzes it, and determines the functional test corresponding to the mainboard. Therefore, the fixture design of this application automatically scans to achieve automatic scanning and post-testing by the barcode scanner after the mainboard is turned on.

[0062] In one embodiment, the dual-board functional test fixture of the present application also includes a heat dissipation module 8, which includes multiple heat dissipation components 81. The multiple heat dissipation components 81 are installed on the second test needle board 33 at intervals, and the multiple heat dissipation components 81 are used to dissipate heat for the first motherboard to be tested 4 and the second motherboard to be tested 5.

[0063] For example, the heat sink 81 is a heat sink, which is used to abut against the chips of the first motherboard to be tested and the second motherboard to be tested during testing.

[0064] Furthermore, the heat dissipation module 8 further includes a heat dissipation fan 82, which is mounted on the upper mold frame 21. Specifically, Figure 1-5 As shown, a heat dissipation fan 82 is installed in the opening on the top surface of the upper mold frame 21, and the heat dissipation fan 82 is used to dissipate heat in the heat sink.

[0065] For example, the chip is a miniaturized CPU, GPU, or PCH, and the chip generates heat when working. Therefore, in order to effectively dissipate the heat of the chip, when the upper mold frame and the lower mold frame of the fixture body are closed for testing, the heat sink 81 abuts against the chips of the first motherboard to be tested 4 and the second motherboard to be tested 5.

[0066] In one embodiment, as Figure 8-9 As shown, the present invention further provides a dual-board functional testing device 9 , comprising a base 91 , and also comprising a dual-board functional testing fixture 1 according to any one of the above embodiments, wherein the dual-board functional testing fixture 1 is installed in the base 91 .

[0067] For example, the dual-board functional test equipment of the present application further includes a dual-screen bracket module 92, and the dual-screen bracket module 92 includes:

[0068] A first bracket 921 , which is mounted on the base 91 via a first fixing plate 9211 . The first bracket 921 is used to support a first display screen 923 ;

[0069] The second bracket 922 is mounted on the first bracket 921 via a second fixing plate 9221. The second bracket 922 is used to support the second display screen 924. As can be seen from the figure, the first display screen and the second display screen are staggered in the vertical direction.

[0070] The dual-board functional testing device (hereinafter referred to as the "device") of this application superimposes a first bracket and a second bracket together to form a dual-screen display bracket, thereby enabling compatible use of single and dual screens. When testing a single board, one of the brackets can be removed to form a single-screen display bracket, but the function can still be achieved without removing it. When testing a dual board, the two separate display brackets are superimposed to achieve the dual-screen function.

[0071] This application uses a dual-screen display stand (i.e., a first stand and a second stand) to store the display screen, avoiding having nowhere to put the display screen and causing damage.

[0072] The present application uses the first bracket and the second bracket to realize the independent display of two display screens. The display screen connection wiring scheme is to adopt a milling groove design on the back of the carrier board 31 (such as Figure 6 As shown, a wiring groove 313 is provided on the back of the carrier board 31), which perfectly solves the dual-screen connection problem. The dual screens use independent wiring to avoid people plugging in the wrong place, and prevent the wires from being pressed when the fixture is closed, causing quality problems. This application ensures test stability and pass rate by rationally planning the wire routing. The first bracket and the second bracket of this application adopt a superimposed duplex structure, which solves the problem of placing two display screens with one fixture at the same time. In addition, one set of equipment can be shared by multiple sets of fixtures, improving work efficiency and reducing fixture costs.

[0073] The following is a detailed description of the working process of the device in this application:

[0074] Step 1: The staff can place two motherboards into the fixture at the same time and install the test equipment;

[0075] Step 2: Install the two LCD screens on the brackets respectively;

[0076] Step 3: Install the two barcode scanners to the corresponding positions of the fixture. The scanning area can be fine-tuned according to the barcode position on the mainboard.

[0077] Step 4: The staff presses the power button and the mainboard turns on;

[0078] Step 5: Scanner automatically scans and tests;

[0079] Step 6: After the test is completed, cut off the power supply, open the fixture, remove the test equipment, and take out the motherboard.

[0080] It should be understood that the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of such features. Throughout the present disclosure, "plurality" means two or more, unless otherwise specifically defined.

[0081] The terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise" and the like to indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as limiting the present application.

[0082] The terms "connect," "direct connection," "indirect connection," "fixed connection," "installation," and "assembly" should be understood broadly. For example, they may refer to a fixed connection, a detachable connection, or an integral connection. The terms "installation," "connection," and "fixed connection" may refer to a direct connection, an indirect connection through an intermediate medium, or internal communication between two components. Those skilled in the art will understand the specific meanings of these terms in this utility model based on specific circumstances.

[0083] The terms "one embodiment," "some embodiments," "examples," "specific examples," or "some examples" mean that the specific features, structures, materials, or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present disclosure. Moreover, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. In addition, those skilled in the art may combine and integrate different embodiments or examples described in this specification, as well as features of different embodiments or examples, unless otherwise inconsistent.

[0084] The above description is merely a specific embodiment of the present disclosure, but the scope of protection of the present disclosure is not limited thereto. Any changes or substitutions that can be easily conceived by a person skilled in the art within the technical scope disclosed in this disclosure should be included in the scope of protection of the present disclosure. Therefore, the scope of protection of the present disclosure should be based on the scope of protection of the claims.

Claims

1. A dual-board functional test fixture, comprising a fixture body, wherein the fixture body comprises an upper mold frame and a lower mold frame plate that can be opened and closed, characterized in that: It also includes a double-plate needle implantation module, which includes: A carrier board, the carrier board being used to carry the first mainboard to be tested and the second mainboard to be tested; A first test needle board, which is installed between the carrier board and the lower mold frame board and is provided with a plurality of lower mold planting pins, which are used to pass through the pinholes on the carrier board to abut against the test points of the first and second main boards to be tested; The second test needle board is installed on the upper mold frame. The second test needle board is provided with a plurality of upper mold planting needles, which are used to abut against the test points of the first and second main boards to be tested.

2. The dual-board functional test fixture according to claim 1, characterized in that: It also includes a code scanner module, which includes: A first barcode scanner, which is mounted on the upper mold frame through a barcode scanner fixing module and is arranged corresponding to the position of the first motherboard to be tested; A second barcode scanner, which is mounted on the upper mold frame through a barcode scanner fixing module and is arranged corresponding to the position of the second motherboard to be tested; The barcode scanner fixing module is configured to fix the corresponding barcode scanner and adjust the position of the corresponding barcode scanner relative to the corresponding mainboard to be tested, so that the corresponding barcode scanner scans the corresponding mainboard to be tested.

3. The dual-board functional test fixture according to claim 2, characterized in that: The first barcode scanner is electrically connected to the first motherboard to be tested through a first USB interface, and the second barcode scanner is electrically connected to the second motherboard to be tested through a second USB interface, wherein the first USB interface and the second USB interface are of different types.

4. The dual-board functional test fixture according to claim 2, characterized in that: The barcode scanner fixed module includes: A module body, wherein the first end of the module body is slidably mounted on the upper mold frame, and the second end is formed with a mounting groove for mounting a barcode scanner; A magnetic component is installed at the second end of the module body, and is used to magnetically fix the code scanner in the installation slot.

5. The dual-board functional test fixture according to claim 4, characterized in that: The barcode scanner fixing module also includes a fixing member, which is threadedly connected to the second end of the module body along the vertical direction, and the fixing member is used to fix the barcode scanner in the installation slot in the vertical direction.

6. The dual-board functional test fixture according to claim 1, characterized in that: It also includes a heat dissipation module, which includes multiple heat dissipation elements. The multiple heat dissipation elements are installed on the second test needle board at intervals, and the multiple heat dissipation elements are used to dissipate heat for the first motherboard to be tested and the second motherboard to be tested.

7. The dual-board functional test fixture according to claim 6, characterized in that: The heat sink is a heat sink, and the heat sink is used to abut against the chips of the first motherboard to be tested and the second motherboard to be tested during testing.

8. The dual-board functional test fixture according to claim 7, characterized in that: The heat dissipation module further includes a heat dissipation fan, which is installed on the upper mold frame and is used to dissipate heat from the heat sink.

9. A dual-board functional testing device, comprising a base, characterized in that: It also includes the dual-board functional test fixture according to any one of claims 1 to 8, wherein the dual-board functional test fixture is installed in the base.

10. The dual-board functional testing device according to claim 9, characterized in that: It also includes a dual-screen bracket module, which includes: a first bracket, the first bracket being mounted on the base via a first fixing plate, the first bracket being used to support a first display screen; The second bracket is installed on the first bracket through a second fixing plate, and the second bracket is used to support a second display screen.