Photovoltaic module EL test pressing needle device
By using a pressure pin plate structure in the EL test of photovoltaic modules, the problem of poor contact caused by small pressure block area and film residue is solved, and the test success rate and production efficiency are improved.
Patent Information
- Application Number
- CN202422789606.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-15
- Publication Date
- 2025-09-26
- Estimated Expiration
- 2034-11-15
AI Technical Summary
In existing photovoltaic module EL testing, the small area of the pressing block and the residual adhesive film after lamination lead to poor contact, resulting in a low test success rate.
A pressure pin plate structure is adopted, and multiple spring pressure pins are arranged under the pressure pin plate to ensure that when there is foreign matter on the bus bar, other pressure pins can still be pressed down to the bus bar to ensure good contact.
It improves the success rate of EL testing of photovoltaic modules, reduces the number of retests due to poor contact, and improves production efficiency.
Smart Images
Figure CN223391311U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of photovoltaic component detection, in particular to a photovoltaic component EL test needle pressure device. Background Art
[0002] With the rapid development of the photovoltaic industry, inspection processes during the PV module manufacturing process are crucial to the final yield of finished modules. EL testing, for example, is a 100% inspection component. The principle and process of EL testing involves passing a forward current through the PV module. This process utilizes the electroluminescence principle of crystalline silicon to stimulate electron-hole pairs within the module, generating photons and emitting light. These photons are captured by a high-resolution CCD camera, and the image is transmitted to a computer for processing, ultimately revealing defects such as cold solder joints, hidden cracks, and short circuits. This ultimately ensures the high quality of the module products.
[0003] In the EL test, a certain current is passed through the test block after it is pressed down on the component lead. If the pressing position is deviated or there is foreign matter on the lead causing poor contact, the test will fail and need to be adjusted and retested. In particular, after the component is laminated, there will be a certain amount of film overflow and residue on the lead, which often leads to poor contact after the block is pressed down, resulting in unsuccessful test and retesting affecting production efficiency.
[0004] The EL test block currently used is fixed on the beam by a spring block. The beam is pressed down by the upper and lower cylinders to make the spring block contact with the bus bar, so that the current can be smoothly conducted, thereby achieving the test purpose.
[0005] Disadvantages of existing technical solutions:
[0006] ① The existing solution has a too small pressing block area, which may cause busbar offset or component position deviation during the production process. The probability of not being able to press the busbar is too small.
[0007] ② After lamination, there will be overflow film residue on the component busbar, which will cover part of the busbar surface. The bottom of the pressing block is flat. After the pressing block is pressed down, it is blocked by the residual film and cannot contact the busbar to complete conduction. The probability of failing to complete the test is high, and the success rate of the test is low. Utility Model Content
[0008] The main purpose of the utility model is to provide a photovoltaic module EL test needle device, so as to effectively solve the problem of low test success rate caused by poor contact of the existing EL test pressing block after lamination proposed in the background art.
[0009] To achieve the above-mentioned purpose, the utility model adopts the following technical solution: a photovoltaic module EL test needle device, including a downward pressure cylinder, a long plate-shaped pressure arm fixed on the downward pressure cylinder push rod, and several pressure needle spring seats fixed on the lower side of the pressure arm. A pressure plate spring is provided on the lower side of each pressure needle spring seat, and a pressure needle plate is fixed at the lower end of each pressure plate spring, and a spring pressure needle array is provided on the lower side of the pressure needle plate.
[0010] Preferably, the needle pressing plate is a rectangular plate with a size of 35 mm in width and 51 mm in length.
[0011] Preferably, an array of 96 spring pressure pins is arranged below the pressure pin plate.
[0012] Preferably, the thickness of the needle pressing plate is 5 mm.
[0013] Preferably, the spring pressure pin has a diameter of 3 mm and a spring pressure pin spacing of 1 mm.
[0014] Preferably, the pressure plate spring has a diameter of 10 mm.
[0015] Preferably, the elastic force of the pressure plate spring is greater than the elastic force of the spring pressure pin array.
[0016] The beneficial effect of the present invention is that the structure of the pressure pin array can ensure that when there is foreign matter on the bus bar, the foreign matter only isolates a part of the pressure pins, and the other pressure pins can still continue to press down to the bus bar to ensure good contact, thereby improving the success rate of a test. BRIEF DESCRIPTION OF THE DRAWINGS
[0017] Attachment Figure 1 It is a schematic diagram of the three-dimensional structure of the utility model.
[0018] Attachment Figure 2 This is a schematic diagram of the press needle arrangement of the utility model.
[0019] Attachment Figure 1 、 2 In the figure, there are spring pressure needle 1, pressure needle plate 2, pressure plate spring 3, pressure needle spring seat 4, pressure arm 5, and downward pressure cylinder 6. DETAILED DESCRIPTION
[0020] The following will combine the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention.
[0021] Attachment Figure 1 、 2As shown, a photovoltaic module EL test needle device includes a downward pressing cylinder 6, a long plate-shaped pressing arm 5 fixed on the push rod of the downward pressing cylinder 6, and several pressing needle spring seats 4 are fixed on the lower side of the pressing arm 5. A pressure plate spring 3 is provided on the lower side of each pressing needle spring seat 4, and a pressure needle plate 2 is fixed at the lower end of each pressure plate spring 3. An array of spring pressure needles 1 is provided on the lower side of the pressure needle plate 2.
[0022] The needle pressing plate 2x rectangular plate has a size of 35 mm in width and 51 mm in length.
[0023] An array of 96 spring pressure pins is arranged below the pressure pin plate 2 .
[0024] The thickness of the needle pressing plate 2 is 5 mm.
[0025] The diameter of the spring pressure pin 1 is 3 mm, and the spacing between the spring pressure pins 1 is 1 mm.
[0026] The diameter of the pressure plate spring 3 is 10 mm.
[0027] The elastic force of the pressure plate spring 3 is greater than the elastic force of the spring pressure pin array.
[0028] The beneficial effect of the present invention is that the structure of the pressure pin array can ensure that when there is foreign matter on the bus bar, the foreign matter only isolates a part of the pressure pins, and the other pressure pins can still continue to press down to the bus bar to ensure good contact, thereby improving the success rate of a test.
[0029] Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art can still modify the technical solutions described in the aforementioned embodiments, or make equivalent substitutions for some of the technical features therein. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.
Claims
1. A photovoltaic module EL test needle device, characterized by: It includes a downward pressing cylinder, a long plate-shaped pressing arm fixed on the downward pressing cylinder push rod, several pressing needle spring seats fixed on the lower side of the pressing arm, a pressing plate spring is provided on the lower side of each pressing needle spring seat, a pressing needle plate is fixed at the lower end of each pressing plate spring, and a spring pressing needle array is provided on the lower side of the pressing needle plate.
2. A photovoltaic module EL test needle pressure device according to claim 1, characterized in that: The needle pressing plate is a rectangular plate with a size of 35 mm in width and 51 mm in length.
3. A photovoltaic module EL test needle pressure device according to claim 1, characterized in that: An array of 96 spring pressure needles is arranged below the pressure needle plate.
4. A photovoltaic module EL test needle pressure device according to claim 1, characterized in that: The thickness of the needle pressing plate is 5 mm.
5. The photovoltaic module EL test needle pressure device according to claim 1, characterized in that: The spring pressure pins have a diameter of 3 mm and a spacing of 1 mm between the spring pressure pins.
6. The photovoltaic module EL test needle pressure device according to claim 1, characterized in that: The diameter of the pressure plate spring is 10 mm.
7. The photovoltaic module EL test needle pressure device according to claim 1, characterized in that: The elastic force of the pressure plate spring is greater than the elastic force of the spring pressure pin array.