Probe card tip protection device

Abstract

The utility model relates to the technical field of protection devices, in particular to a probe card tip protection device, which comprises a protection frame, a probe card tray mounted in the protection frame, a fixing plate arranged on one side of the protection frame, a fixing frame mounted on one side of the fixing plate, a first spring mounted on one side of the fixing frame, and a sliding block fixedly mounted on one side of the first spring. A first fixing column is installed on one side of the sliding block and penetrates through the fixing frame to extend out of the frame, and a first fixing groove is formed in the bottom of the fixing frame. The probe card tray can be conveniently and rapidly fixed in the protection frame through cooperation of the first spring, the sliding block, the first fixing column, the round rod, the connecting rod, the clamping rod and the clamping plate, when a probe card needs to be taken out, the second fixing column can be pushed to enable the clamping rod and the clamping plate to lose clamping, and then the probe card can be conveniently and rapidly taken out. Compared with a traditional protection device, the protection mode is faster and more effective, adhesive tape residues are avoided, the tip of the probe card is not polluted, and collected data are not affected.

Description

Technical Field

[0001] The utility model relates to a probe card protection device, in particular to a probe card needle tip protection device, belonging to the technical field of protection devices. Background Art

[0002] The probe card is an indispensable part of the wafer testing stage. It is responsible for applying the test signal generated by the tester to the chip under test and transmitting the feedback signal in the chip back to the tester to complete the entire testing process. It can screen out chips with poor performance before packaging and ensure that only qualified chips can enter the subsequent packaging process. This step is of great significance to reducing chip manufacturing costs and improving product qualification rates.

[0003] During transportation, probe cards can easily come into contact with the needle tip, potentially damaging it. Therefore, the needle tip is typically protected. However, existing protective devices are typically secured to the probe card with tape. When removing the probe card, the protective device can damage the probes during assembly and disassembly. Furthermore, the tape can leave adhesive residue, contaminating the probe card tip and potentially erroneously collecting data. This can lead to the incorrect rejection of qualified chips and reduced production yields. Utility Model Content

[0004] In view of the shortcomings of the existing technology, the present invention provides a probe card tip protection device, which can protect the probe card tip while allowing the probe card to be quickly removed through the cooperation of a first spring, a slider, a first fixed column, a round rod, a connecting rod, a clamping rod and a clamping plate.

[0005] The technical solution adopted by the present invention to solve the above technical problems is:

[0006] A probe card needle tip protection device comprises a protection frame, a probe card tray is installed in the protection frame, a fixing plate is provided on one side of the protection frame, a fixing frame is installed on one side of the fixing plate, a first spring is installed on one side of the fixing frame, a slider is fixedly installed on one side of the first spring, a first fixing column is installed on one side of the slider, the first fixing column passes through the fixing frame and extends outside the frame, a first fixing groove is provided at the bottom of the fixing frame, a fixing block passing through the first fixing groove is installed at the bottom of the slider, connecting rods are rotatably connected on both sides of the fixing block, two vertical plates are symmetrically installed at the bottom of the fixing frame, a card rod is rotatably connected between the vertical plates, one side of the card rod is rotatably connected to the connecting rod, a clamping plate adapted to the card rod is installed at the bottom of the probe card tray, a second fixing column is installed on the top of the slider, and a second fixing groove is provided on the protective frame.

[0007] Furthermore, the sliding block is slidably connected to the fixing frame.

[0008] Furthermore, a first locking block is symmetrically installed on one side of the fixed plate, a positioning groove is provided on the surface of the first locking block, a locking groove is provided on one side of the protective frame, and columns are symmetrically installed on the protective frame, a second locking block is installed in the column, and a second spring connected to the top of the column is installed on the outer wall of the second locking block, and one end of the second locking block passes through the column and extends outward.

[0009] Furthermore, a fixed handle is installed on the outer wall of the second engaging block.

[0010] Furthermore, one side of the first engaging block is semicircular and matches the engaging groove.

[0011] Furthermore, fixing grooves are provided on both sides of the probe card tray.

[0012] Furthermore, an easy-to-pull handle is installed on a side of the probe card tray away from the clamping plate.

[0013] Furthermore, an antistatic coating is provided on the inner side of the protection frame and the probe card tray.

[0014] Compared with the prior art, the present invention has the following beneficial effects:

[0015] 1. In the process of protecting the probe card tip, the probe card is first placed in the probe card tray and then pushed into the protection frame until it contacts the first fixed column. Then, the slider presses the first spring inward, causing the locking rod to engage the locking plate under the drive of the connecting rod, thereby completing the protection of the probe card tip.

[0016] 2. The present application can fix the probe card tray in the protective frame conveniently and quickly through the cooperation of the first spring, the slider, the first fixed column, the round rod, the connecting rod, the clamping rod and the clamping plate. When the probe card needs to be removed, the second fixed column can be pushed to make the clamping rod lose the engagement with the clamping plate, so that the probe card can be removed conveniently and quickly. Compared with the traditional protective device, the protection method is faster and more effective and there will be no tape residue, which will not cause pollution to the probe card needle tip and affect the collected data. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 It is an overall schematic diagram of the utility model;

[0018] Figure 2 This is a schematic diagram of the internal structure of the utility model;

[0019] Figure 3 It is a partial structural cross-sectional view of the utility model;

[0020] Figure 4 This is a bottom view schematic diagram of the present utility model;

[0021] Figure 5 It is a partial structural cross-sectional view of the utility model;

[0022] In the figure, 1. protective frame; 2. probe card tray; 3. fixing plate; 4. fixing frame; 5. first spring; 6. slider; 7. first fixing column; 8. first fixing groove; 9. fixing block; 10. fixing groove; 11. connecting rod; 12. easy-pull handle; 13. vertical plate; 14. clamping rod; 15. anti-static coating; 16. clamping plate; 17. second fixing column; 18. second fixing groove; 19. first clamping block; 20. positioning groove; 21. clamping groove; 22. vertical column; 23. second clamping block; 24. second spring; 25. fixing handle. DETAILED DESCRIPTION

[0023] The technical solution of the present invention will be described in further detail below with reference to the accompanying drawings and specific embodiments.

[0024] like Figure 1-Figure 5 As shown, the probe card tip protection device provided in this embodiment includes a protection frame 1, a probe card tray 2 is installed in the protection frame 1, a fixing plate 3 is provided on one side of the protection frame 1, a fixing frame 4 is installed on one side of the fixing plate 3, a first spring 5 is installed on one side of the fixing frame 4, a slider 6 is fixedly installed on one side of the first spring 5, a first fixing column 7 is installed on one side of the slider 6, the first fixing column 7 passes through the fixing frame 4 and extends outside the frame, a first fixing groove 8 is provided at the bottom of the fixing frame 4, a fixing block 9 passing through the first fixing groove 8 is installed at the bottom of the slider 6, connecting rods 11 are rotatably connected on both sides of the fixing block 9, two vertical plates 13 are symmetrically installed at the bottom of the fixing frame 4, and a card rod is rotatably connected between the vertical plates 13. 14, one side of the card rod 14 is rotatably connected to the connecting rod 11, a locking plate 16 adapted to the card rod 14 is installed at the bottom of the probe card tray 2, a second fixing column 17 is installed on the top of the slider 6, and a second fixing groove 18 is opened on the protective frame 1, and the slider 6 is slidably connected to the fixed frame 4; when it is necessary to protect the probe card tip, the probe card can be placed in the probe card tray 2 first, and then pushed into the protective frame 1 until it rests against the first fixing column 7, and then the slider 6 presses the first spring 5 inward, so that the card rod 14 is driven by the connecting rod 11 to lock the locking plate 16, thereby completing the protection of the probe card tip, preventing contamination of the probe card tip, and affecting the collected data.

[0025] Further, if Figure 1-Figure 5As shown, a first locking block 19 is symmetrically installed on one side of the fixed plate 3, and a positioning groove 20 is opened on the surface of the first locking block 19, and a locking groove 21 is opened on one side of the protective frame 1. A column 22 is symmetrically installed on the protective frame 1, and a second locking block 23 is installed in the column 22. The outer wall of the second locking block 23 is installed with a second spring 24 connected to the inner top of the column 22, and one end of the second locking block 23 extends outward through the column 22; a fixed handle 25 is installed on the outer wall of the second locking block 23; one side of the first locking block 19 is semicircular and adapted to the locking groove 21; when the locking mechanism needs to be replaced, the fixed handle 25 can be used to apply force upward to drive the second locking block 23 to move upward, so that it disengages from the locking groove 20, and the first locking block 19 can be disengaged from the locking groove 21 to complete the disassembly of the part mechanism on the fixed plate 3. The disassembly mechanism can quickly expose the internal components of the probe card protection device, so that maintenance personnel can easily inspect, clean, replace or repair it.

[0026] Further, if Figure 1-Figure 5 As shown, fixing grooves 10 are provided on both sides of the probe card tray 2 to make it easier to remove the probe card, improve production efficiency and work speed, and reduce the waiting time and time for taking the probe card; an easy-pull handle 12 is installed on the side of the probe card tray 2 away from the clamping plate 16, so that the placement and removal of the probe card tray 2 becomes easier, and a suitable handle can significantly improve the convenience and efficiency of operation; an anti-static coating 15 is provided on the inner side of the protective frame 1 and the probe card tray 2, which can effectively prevent the current generated by electrostatic discharge from causing huge damage to the electronic components of the probe card, reduce the electromagnetic interference generated by static electricity, and the resulting performance degradation of electronic products. By preventing electrostatic damage, the service life of electronic products can be extended and the cost of replacement and maintenance can be reduced.

[0027] like Figure 1-Figure 5 As shown, the principle of the probe card tip protection device provided in this embodiment is as follows: when the probe card tip needs to be protected, the probe card can be placed in the probe card tray 2 first, and then pushed into the protection frame 1 until it abuts against the first fixed column 7, and then the slider 6 squeezes the first spring 5 inward, so that the clamping rod 14 is driven by the connecting rod 11 to engage with the clamping plate 16, thereby completing the protection of the probe card tip; at the same time, when the probe card needs to be removed, the second fixed column 17 can be pushed to make the clamping rod 14 lose the engagement with the clamping plate 16, so that the probe card can be removed conveniently and quickly.

[0028] The above description shows and describes the preferred embodiments of the present invention. It should be understood that the present invention is not limited to the form disclosed herein. Any changes and modifications made by those skilled in the art without departing from the spirit and scope of the present invention should be within the scope of protection of the claims attached to the present invention.

Claims

1. A probe card needle tip protection device, comprising a protection frame (1), a probe card tray (2) installed in the protection frame (1), and a fixing plate (3) provided on one side of the protection frame (1), characterized in that: A fixing frame (4) is installed on one side of the fixing plate (3), a first spring (5) is installed on one side of the fixing frame (4), a slider (6) is fixedly installed on one side of the first spring (5), a first fixing column (7) is installed on one side of the slider (6), the first fixing column (7) passes through the fixing frame (4) and extends outside the frame, a first fixing groove (8) is provided at the bottom of the fixing frame (4), a fixing block (9) passing through the first fixing groove (8) is installed at the bottom of the slider (6), and connecting rods (11) are rotatably connected on both sides of the fixing block (9), two vertical plates (13) are symmetrically installed at the bottom of the fixing frame (4), a card rod (14) is rotatably connected between the vertical plates (13), and one side of the card rod (14) is rotatably connected to the connecting rod (11), a clamping plate (16) adapted to the card rod (14) is installed at the bottom of the probe card tray (2), a second fixing column (17) is installed on the top of the slider (6), and a second fixing groove (18) is provided on the protective frame (1).

2. The probe card tip protection device according to claim 1, wherein: The sliding block (6) is slidably connected to the fixed frame (4).

3. The probe card tip protection device according to claim 1, wherein: A first engaging block (19) is symmetrically mounted on one side of the fixing plate (3), a positioning groove (20) is provided on the surface of the first engaging block (19), a engaging groove (21) is provided on one side of the protection frame (1), a column (22) is symmetrically mounted on the protection frame (1), a second engaging block (23) is mounted inside the column (22), a second spring (24) connected to the inner top of the column (22) is mounted on the outer wall of the second engaging block (23), and one end of the second engaging block (23) passes through the column (22) and extends outward.

4. The probe card tip protection device according to claim 3, wherein: A fixed handle (25) is mounted on the outer wall of the second engaging block (23).

5. The probe card tip protection device according to claim 3, wherein: One side of the first engaging block (19) is semicircular and matches the engaging groove (21).

6. The probe card tip protection device according to claim 1, wherein: Fixing grooves (10) are provided on both sides of the probe card tray (2).

7. The probe card tip protection device according to claim 1, wherein: An easy-to-pull handle (12) is installed on the side of the probe card tray (2) away from the clamping plate (16).

8. The probe card tip protection device according to claim 1, wherein: An antistatic coating (15) is provided on the inner side of the protection frame (1) and the probe card tray (2).

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