Camera test fixture and camera test system

Abstract

The utility model discloses a camera test fixture and a camera test system, and belongs to the technical field of camera modules. The camera test fixture comprises a test bottom plate, an ejector pin fixture and a power supply module. And the power supply module is connected to the test bottom plate and is connected with the ejector pin jig so as to take a power supply signal of the test bottom plate, convert the power supply signal and then supply power to the ejector pin jig. The camera test fixture and the camera test system provided by the utility model can control the voltage drop of the power supply signals loaded at the two ends of the to-be-tested product so as to maintain the normal operation of the to-be-tested product.

Description

Technical Field

[0001] The present application belongs to the field of camera module technology, and in particular relates to a camera test fixture and a camera test system. Background Art

[0002] Camera modules are widely used in various smart devices, greatly enriching their functionality. Industrially produced cameras require a testing process to ensure product quality.

[0003] In order to realize the industrial batch testing of camera modules, it is necessary to arrange the connection lines and interface fixtures in batches based on the test host and tooling on the test production line, so as to realize the batch testing of camera modules; during the test, the camera module to be tested is connected to the ejector fixture so that the ejector is electrically connected to the connection circuit in the camera module to be tested, and various test processes are completed under the unified control of the test host.

[0004] However, batch testing also increases the size of intermediate components like transfer lines, increasing the load resistance and voltage divider. This results in excessive voltage drop across the camera module, preventing proper operation. Furthermore, power consumption and current fluctuate rapidly during camera module testing, making it impossible to compensate for this through software on the test host. Summary of the Invention

[0005] This application provides a camera test fixture and camera test system, which aims to at least to some extent solve the technical problem that the intermediate component load of the camera module batch test system is too large, resulting in excessive voltage drop on the camera module and failure to perform normal testing.

[0006] The embodiment of the present application provides a camera test fixture, comprising: a test base plate, an ejector fixture, and a power module;

[0007] The power module is connected to the test base plate and the ejector fixture to obtain the power signal of the test base plate and convert it to supply power to the ejector fixture.

[0008] Furthermore, the power module includes a power chip based on a low voltage dropout linear regulator.

[0009] Furthermore, the power chip is an independently packaged chip.

[0010] Furthermore, the power chip is integrated and printed on the test base board.

[0011] Furthermore, the camera test fixture further includes: a first adapter and an extension circuit;

[0012] The first adapter is electrically connected to the test base plate through the extension circuit.

[0013] Furthermore, the camera test fixture further includes: a second adapter and a third adapter;

[0014] The third adapter is arranged on the test base plate, the second adapter is connected to the extension circuit, and the second adapter and the third adapter are detachably connected.

[0015] Furthermore, the extension line includes a coaxial line.

[0016] A camera testing system comprises: a testing host, a testing tool and the camera testing fixture;

[0017] The test fixture is connected to the test host, and the adapter is connected to the test fixture.

[0018] Furthermore, the test tool is connected to the test host via a data cable.

[0019] Furthermore, the output voltage of the test fixture is 5V, and further, the output voltage of the power module is 1.1.

[0020] The embodiments of the present application have at least the following beneficial effects:

[0021] The camera test fixture and camera test system provided in the embodiments of the present application are equipped with a pin fixture on the test base plate to directly contact and electrically connect and fix the camera module to be tested, and a power module is connected to the test base plate. Therefore, when powered on, the power signal of the test base plate can be converted into a working power signal adapted to the camera module to be tested, directly supplying power at close range, reducing the voltage drop, and maintaining the normal operation of the camera module to be tested, thereby avoiding the large voltage drop caused by the long-distance power supply from the test host and the tooling side to the device to be tested through large-scale connection lines and connector interface structures. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to more clearly illustrate the technical solutions in the embodiments of the present application, a brief introduction will be given below to the drawings required for use in the description of the embodiments. Obviously, the drawings described below are some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0023] Figure 1 A schematic diagram of the structure of the camera test fixture connection tooling in an embodiment of the present application is shown;

[0024] Figure 2 Shown Figure 1 Schematic diagram of the camera test fixture connection tooling;

[0025] Figure 3 Shown Figure 1 Schematic diagram of the structure of the camera test fixture connected to the power module of the tooling.

[0026] Reference numerals:

[0027] 1-Adapter, 2-Coaxial cable, 3-Test base plate, 4-Ejector fixture, 5-Power module, 6-Camera. DETAILED DESCRIPTION

[0028] The following will be combined with the drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0029] In addition, this application may repeat reference numbers and / or reference letters in different examples. This repetition is for the purpose of simplicity and clarity and does not in itself indicate the relationship between the various embodiments and / or settings discussed. In addition, this application provides examples of various specific processes and materials, but those of ordinary skill in the art will recognize the application of other processes and / or the use of other materials.

[0030] The present application is described below with reference to specific embodiments and with reference to the accompanying drawings:

[0031] See also Figure 1 and Figure 2 The embodiments of the present application provide a camera test fixture and a camera test system based on the test fixture. Through the structural setting of close-range power supply, direct close-range power supply is achieved for the camera module to be tested, avoiding the accumulated load voltage division of large-scale connection lines and interface connectors in the batch test production line layout, and the voltage drop at both ends of the camera module to be tested caused by the accumulated voltage division, thereby ensuring that the camera module to be tested is within the normal working power range and ensuring the smooth progress of the test.

[0032] Specifically, the camera test fixture serves as a small device terminal that directly electrically connects to and secures the camera module under test, and has a corresponding circuit structure and a load-bearing and fixing structure. This embodiment is mainly described from the perspective of the circuit structure. The camera test fixture includes: a test base plate 3, a pin fixture 4, and a power module 5.

[0033] The test baseboard 3 is equipped with basic circuitry and connected to an external power source to provide power and communication. The ejector fixture 4 is electrically connected to the camera module 6 via PIN probes to achieve electrical connection and communication. Generally, the ejector fixture 4 is equipped with a probe holder. The PIN probe on the alignment connector of the camera module 6 can be directly matched and plugged into the probe holder of the ejector fixture 4, achieving convenient insertion and installation.

[0034] The power module 5 is connected to the test base board 3 , takes the power signal of the test base board 3 and converts it from high voltage to low voltage signal, and then directly loads it to both ends of the camera module 6 through the ejector fixture 4 .

[0035] Therefore, in the batch test production line layout, high-voltage electrical signals can be output at the output ends of the test host and tooling, and transmitted to the test base plate 3 through intermediate components such as intermediate connecting lines and connector interfaces. Then, the power supply module 5 converts the relatively high-voltage signal into low voltage and loads it on the ejector fixture 4, thereby meeting the working needs of the camera module 6; avoiding the problem in the existing mode that the test host PC and tooling output low-voltage voltage signals, resulting in a large voltage drop after long-distance transmission, and the camera module 6 cannot be driven.

[0036] Take a test system as an example for comparison:

[0037] The test host PC and the fixture are directly powered by a low-voltage 1.1V supply. Testing has shown that the connection resistance of the entire fixture can reach 0.6 ohms. During product testing, the minimum DVDD voltage requirement must be greater than 0.95V. Some high-end chips can have a maximum current of 600mA. At this point, the connection resistance will cause a loss of 0.6A × 0.6Ω = 0.36V. Because the fixture output voltage is set to the maximum value of 1.1V required by the product chip, when the voltage reaches the product chip end, it will be only 0.74V, causing the chip to malfunction.

[0038] The test host PC and the tooling are directly powered by high voltage 5V: the power module 5 is added to the test base plate 3 to directly connect the ejector fixture 4 for power supply. After testing, the input end of the power module 5 has a connection resistance of nearly 0.5 ohms, and the output end has a resistance of about 0.1 ohms. When the power output voltage is 1.1V, the voltage reaching the camera module 6 is still 1.1V-0.1Ω×0.6A=1.04V, which can meet the chip requirements; the 5V voltage is converted into 1.1V by the tooling input. When the camera When the head module requires 600mA current, the power module 5 needs to output 1.1V×0.6A=0.66W of power. In addition, the minimum conversion ratio of the power module 5 is 80%, and the minimum input current of the power module 5 must reach 5 / 0.66 / 0.8=165mA. At this time, the input voltage of the power module 5 is 5V-0.5Ω×0.165A=4.92V. The power module 5 can pull down such a low input voltage and the entire system can work normally.

[0039] That is to say, by arranging a power module 5 on the test base plate 3, the power signal of the test base plate 3 is converted and used to power the camera module 6, which can provide power at a close distance, shorten the intermediate load voltage division, and reduce the terminal voltage drop, thereby ensuring the normal progress of the test; it can also facilitate the implementation of relatively high-voltage power supply on the test host PC and the tooling side, and the voltage drop of large-scale connection lines and interface connectors on the batch test production line is also very small, thereby reducing the transmission voltage drop to a certain extent, thereby improving the stability and reliability of the batch test as a whole.

[0040] See also Figure 2 and Figure 3 The power module 5 provided in the embodiment of the present application mainly converts the power signal of the test base board 3 and provides stable power supply. To this end, the power module 5 can be configured as a power chip based on a low voltage difference linear regulator U1.

[0041] In some embodiments, the power chip can be configured as an independently packaged chip and mounted as a whole on the test base plate 3 , thereby reducing the degree of modification of the test base plate 3 to a certain extent.

[0042] In other embodiments, the power chip can be integrated and printed on the test base plate 3. When preparing the test base plate 3, the power module 5 is formed at the same time, which improves the simplicity and stability of the device structure to a certain extent.

[0043] See also Figure 1 and Figure 2In order to adapt to the layout requirements of the batch test production line, the camera test fixture is also provided with a first adapter 1 and an extension line 2. The first adapter 1 is connected to the test base plate 3 through the extension line 2, and the first adapter 1 can be adapted to be connected to the test host PC and the tooling to realize the test power supply connection of the test base plate 3, so that the test base plate 3 can be set at a farther distance relative to the test host to meet the layout requirements of the batch production line.

[0044] Furthermore, in order to improve the convenience of connection operation, the camera test fixture is also provided with a second adapter and a third adapter. The third adapter is arranged on the test base plate 3, and the second adapter is connected to the extension circuit 2. The second adapter and the third adapter are detachably connected, that is, the extension circuit 2 is set as an independent component, so that the corresponding length specification can be selected according to needs, and then connected to the test base plate 3.

[0045] Generally speaking, the extension line 2 can be set to a coaxial line; of course, other types of cables are not excluded and can be flexibly selected.

[0046] An embodiment of the present application also provides a camera testing system, comprising: a test host PC, a test tool, and the camera testing fixture; the test tool is connected to the test host PC, and the adapter is connected to the test tool.

[0047] Generally speaking, the test host PC is an on-site computer equipped with test software to implement relevant test control. The test fixture connects to the execution terminal of the test host PC, receives test instructions from the test host PC, converts them into various control signals, and sends them to existing equipment. It also receives test feedback signals, which are then converted and sent back to the test host PC. Simultaneously, the test fixture also provides power to downstream equipment.

[0048] Generally speaking, the test fixture uses a relatively high-voltage power supply with a standard output voltage of 5V, which can reduce the voltage drop in the transmission line structure to a certain extent. Accordingly, to meet the operating voltage of the camera module 6 of 1.1V, the output voltage standard of the power module 5 is 1.1V. Of course, this can be flexibly adjusted according to actual testing requirements.

[0049] Typically, the test fixture itself is used to convert the test signal into an electrical signal output. The test fixture can be directly connected to the test host PC via a data cable to obtain the test signal, and transmit it to the test baseboard 3 through the first adapter 1 and the extension line 2.

[0050] The embodiments of the present application have at least the following beneficial effects:

[0051] The camera test fixture and camera test system provided in the embodiments of the present application are equipped with a pin fixture on the test base plate to directly contact and electrically connect and fix the camera module to be tested, and a power module is connected to the test base plate. Therefore, when powered on, the power signal of the test base plate can be converted into a working power signal adapted to the camera module to be tested, directly supplying power at close range, reducing the voltage drop, and maintaining the normal operation of the camera module to be tested, thereby avoiding the large voltage drop caused by the long-distance power supply from the test host and the tooling side to the device to be tested through large-scale connection lines and connector interface structures.

[0052] In this application, unless otherwise expressly specified or limited, a first feature being "above" or "below" a second feature may include the first and second features being in direct contact, or may include the first and second features being in contact not directly but through another feature between them. Moreover, a first feature being "above," "above," and "above" a second feature may include the first feature being directly above or obliquely above the second feature, or may simply mean that the first feature is higher in level than the second feature. A first feature being "below," "below," and "below" a second feature may include the first feature being directly below or obliquely below the second feature, or may simply mean that the first feature is lower in level than the second feature.

[0053] In the description of the present application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise" and "counterclockwise" indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.

[0054] It should be noted that all directional indications in the embodiments of the present application are only used to explain the relative position relationship, movement status, etc. between the components in a certain specific posture. If the specific posture changes, the directional indication will also change accordingly.

[0055] In this application, unless otherwise specified or limited, the terms "connection" and "fixation" should be understood in a broad sense. For example, "fixation" can mean fixed connection, detachable connection, or integration; mechanical connection or electrical connection; direct connection or indirect connection through an intermediate medium; internal communication between two elements or interaction between two elements, unless otherwise specified. For those skilled in the art, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0056] In addition, the terms "first," "second," and so on, used in this application are for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature specified as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of this application, "plurality" means two or more, unless otherwise specifically defined.

[0057] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art can combine and combine different embodiments or examples described in this specification.

[0058] In addition, the technical solutions between the various embodiments can be combined with each other, but they must be based on the fact that ordinary technicians in this field can implement them. When the combination of technical solutions is mutually contradictory or cannot be implemented, it should be deemed that such a combination of technical solutions does not exist and is not within the scope of protection required by this application.

[0059] Although the embodiments of the present application have been shown and described, those skilled in the art will appreciate that various changes, modifications, substitutions, and variations may be made to the embodiments without departing from the principles and intent of the present application, and the scope of the present application is defined by the claims and their equivalents.

Claims

1. A camera test fixture, characterized in that: include: Test base plate, ejector fixture and power module; The power module is connected to the test base plate and the ejector fixture to obtain the power signal of the test base plate and convert it to supply power to the ejector fixture.

2. The camera test fixture according to claim 1, wherein: The power supply module includes a power supply chip based on a low voltage drop linear regulator.

3. The camera test fixture according to claim 2, wherein: The power chip is an independently packaged chip.

4. The camera test fixture according to claim 2, wherein: The power chip is integrated and printed on the test base board.

5. The camera test fixture according to claim 1, wherein: The camera test fixture further includes: a first adapter and an extension circuit; The first adapter is electrically connected to the test base plate through the extension circuit.

6. The camera test fixture according to claim 5, wherein: The camera test fixture further includes: a second adapter and a third adapter; The third adapter is arranged on the test base plate, the second adapter is connected to the extension circuit, and the second adapter and the third adapter are detachably connected.

7. The camera test fixture according to claim 5, wherein: The extension line includes a coaxial line.

8. A camera testing system, characterized in that: include: A test host, a test tool, and a camera test fixture as claimed in claim 5; The test fixture is connected to the test host, and the adapter is connected to the test fixture.

9. The camera testing system according to claim 8, wherein: The test tool is connected to the test host via a data cable.

10. The camera testing system according to claim 8, wherein: The output voltage of the test fixture is 5V, and the output voltage of the power module is 1.1V.

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