Auxiliary clamping device for grinding transmission electron microscope sample
By designing an auxiliary clamping device for transmission electron microscope samples and using a strong magnet to adsorb the samples for mechanical grinding, the problems of sample flying out and finger abrasions are solved, and the grinding efficiency is improved.
Patent Information
- Application Number
- CN202422779375.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-14
- Publication Date
- 2025-10-03
- Estimated Expiration
- 2034-11-14
AI Technical Summary
In the prior art, transmission electron microscope samples are prone to flying out or causing finger scratches during the grinding process, and manual grinding is inefficient.
An auxiliary clamping device including a sleeve, a pressure plate, a handle rod, a handle, a strong magnet and a base is designed. The sample is adsorbed by the strong magnet and mechanically ground on a metallographic mechanical grinding plate in combination with the sleeve and the pressure plate.
It effectively avoids sample flying out and finger abrasion, improves grinding efficiency, and realizes an efficient sample thickness thinning process.
Smart Images

Figure CN223406741U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to an auxiliary clamping device for grinding transmission electron microscope samples, belonging to the technical field of metallurgical test and sample preparation in the metallurgical industry. Background Art
[0002] During the sample grinding stage of steel transmission electron microscopy (TEM) specimen preparation, the sample thickness is required to be ground from 0.5mm to 0.060mm. Currently, the commonly used grinding method is for the operator to press the sample on coarse sandpaper and grind it manually. Manual grinding is time-consuming and inefficient. If the sample is ground on a metallographic mechanical grinding plate, due to the thin and small sample, directly holding the sample on the grinding plate and grinding it can cause the sample to fly out and cause finger scratches. In order to improve the sample grinding efficiency, it is necessary to design a device for TEM sample grinding that allows the sample to be mechanically ground on the grinding plate. Utility Model Content
[0003] The purpose of the utility model is to provide an auxiliary clamping device for transmission electron microscope sample grinding, which can avoid accidents such as samples flying out and fingers being scratched, improve the transmission sample grinding efficiency, and solve the problems existing in the background technology.
[0004] The technical solution of the utility model is:
[0005] A device for grinding transmission electron microscope samples includes a sleeve, a pressure plate, a handle rod, a handle, a strong magnet, a base and a sample slot. The sleeve is fixed on the base, and a sample slot matching the sample is provided below the base. The pressure plate is arranged in the sleeve, and a strong magnet is provided below the pressure plate. A handle rod is provided above the pressure plate, and a handle is provided on the handle rod.
[0006] The pressure plate is a solid cylinder, and its diameter matches the inner diameter of the sleeve.
[0007] The strong magnet is adhered and adsorbed under the pressure plate.
[0008] The pressure plate, the handle rod and the handle are fixedly connected to form an integrated structure.
[0009] The beneficial effects of the utility model are that the sample can be clamped and ground on the metallographic mechanical grinding plate, which effectively solves the problem of the sample flying out and the finger being scratched, and also improves the transmission sample grinding efficiency. BRIEF DESCRIPTION OF THE DRAWINGS
[0010] Figure 1 This is a schematic diagram of the sample structure of the utility model;
[0011] Figure 2 This is a cross-sectional view of the utility model;
[0012] Figure 3 This is a bottom view of the base of the utility model;
[0013] In the figure: 1. Sleeve, 2. Pressure plate, 3. Handle bar, 4. Handle, 5. Strong magnet, 6. Base, 7. Sample slot. DETAILED DESCRIPTION
[0014] The present invention will be further described below with reference to the accompanying drawings and examples.
[0015] Refer to the attached Figure 1-3 An auxiliary clamping device for transmission electron microscope sample grinding includes a sleeve 1, a pressure plate 2, a handle rod 3, a handle 4, a strong magnet 5, a base 6 and a sample slot 7. The sleeve 1 is fixed on the base 6, and a sample slot 7 that matches the sample is provided under the base 6. The pressure plate 2 is arranged in the sleeve 1, and a strong magnet 5 is provided under the pressure plate 2. A handle rod 3 is provided on the pressure plate 2, and a handle 4 is provided on the handle rod 3.
[0016] In this embodiment, refer to the attached Figure 1-3 The utility model includes a sleeve 1, a pressure plate 2, a handle rod 3, a handle 4, a strong magnet 5, a base 6 and a sample tank, wherein:
[0017] The diameter of the sleeve 1 is 15 mm to 20 mm, and the height is 20 mm to 30 mm.
[0018] The diameter of the sample groove 7 is 5 mm to 15 mm, and the depth includes two types: 0.1 mm to 0.2 mm and 0.04 mm to 0.06 mm.
[0019] The sleeve 1 is made of plastic, while the pressure plate 2 and base 6 are made of steel. The sleeve 1 is fixed to the base 6, and a sample slot 7 is left below the base 6. The pressure plate 2 is a solid cylinder with a strong round magnet 5 attached to the bottom. The top of the pressure plate 2 is connected to the handle bar 3, and the top of the handle bar 3 has a handle 4.
[0020] The use process of this utility model is as follows:
[0021] First, a steel plate is processed into a circular sample with a diameter of 10mm and a thickness of 0.5mm using wire cutting. Then, the pressure plate 2 is pushed into the bottom of the sleeve 1, so that the strong magnet 5 and the base 6 are attracted. The sample is placed in the sample groove 7 with a depth of 0.15mm. The sample is adsorbed on the base 6 by the magnetic force of the strong magnet 5.
[0022] Hold the sleeve 1 and grind the sample on the coarse sandpaper on the metallographic machine grinding plate until the part of the sample extending outside the sample slot 7 is completely ground away;
[0023] Pull out the pressure plate 2, the sample falls off, and the sample is placed in a sample slot 7 with a depth of 0.05 mm. Continue to grind the sample on fine sandpaper on the metallographic mechanical grinding plate until the part of the sample extending outside the sample slot 7 is completely ground away. Remove the sample and measure the thickness of the sample to be 0.052 mm. The sample grinding is completed. The total time from wire cutting to grinding completion is 25 minutes, with high work efficiency.
Claims
1. An auxiliary clamping device for transmission electron microscope sample grinding, characterized by: The invention comprises a sleeve (1), a pressure plate (2), a handle bar (3), a handle (4), a strong magnet (5), a base (6) and a sample slot (7), wherein the sleeve (1) is fixed on the base (6), a sample slot (7) matching the sample is provided below the base (6), the pressure plate (2) is arranged in the sleeve (1), a strong magnet (5) is provided below the pressure plate (2), a handle bar (3) is provided above the pressure plate (2), and a handle (4) is provided on the handle bar (3).
2. The auxiliary clamping device for transmission electron microscope sample grinding according to claim 1, characterized in that: The pressure plate (2) is a solid cylinder, the diameter of which matches the inner diameter of the sleeve (1).
3. The auxiliary clamping device for transmission electron microscope sample grinding according to claim 1, characterized in that: The strong magnet (5) is adhered and adsorbed under the pressure plate (2).
4. The auxiliary clamping device for transmission electron microscope sample grinding according to claim 1, characterized in that: The pressure plate (2), the handle rod (3) and the handle (4) are fixedly connected to form an integrated structure.