LED lamp bead test fixture

Abstract

The utility model provides an LED lamp bead test fixture which comprises a pneumatic platform, a test board is installed in the middle of the upper surface of the pneumatic platform, a bottom plate is arranged right above the test board, a lamp bead metal support is placed on the bottom plate, and a pressing plate is arranged right above the bottom plate. Positioning supporting columns are arranged at the four corners of the upper surface of the bottom plate and matched with limiting holes in a lamp bead metal support, a plurality of current probes are installed in the middle of the testing table, square grooves for the current probes to pass through are formed in the bottom plate, limiting supporting columns are in sliding fit with the edges of the testing table, and springs are arranged on the limiting supporting columns in a sleeving mode. According to the LED lamp bead test fixture provided by the utility model, the positioning pillars are arranged at the four corners of the upper surface of the pressing plate and are matched with the limiting holes in the lamp bead metal support, so that the pins of the chip on the lamp bead metal support correspond to the current probes, and the test accuracy is improved; and the damage to the glue on the surface of the lamp bead when the pressing plate is pressed down due to mechanical errors is avoided.

Description

TECHNICAL FIELD

[0001] The utility model relates to LED lamp pearl test technical field, specifically is a kind of LED lamp pearl test fixture. BACKGROUND

[0002] In the field of LED packaging manufacturing, in order to monitor the manufacturing process, the reliability of the lamp bead is usually tested after the lamp bead glue solidifies. When testing the LED, the metal support of the lamp bead is pressed by a pressing plate, so that the pins of the chip corresponding to the lamp bead are in contact with the current probe, and then the current is tested for luminous performance. When the traditional pressing plate presses the lamp bead, the probe is not aligned with the pins of the chip due to mechanical error, which leads to inaccurate testing and damage to the lamp bead glue, affecting the subsequent use of the lamp bead. In addition, the test fixture of the same industry tests the lamp beads on the lamp bead metal support one by one, tests the luminous condition of each lamp bead, and the test efficiency is low. UTILITY MODEL CONTENT

[0003] The utility model aims at the shortcoming and problem in the background art for improvement and innovation, provide a kind of LED lamp pearl test fixture.

[0004] A kind of LED lamp pearl test fixture, including pneumatic platform, driving mechanism is arranged in the edge of pneumatic platform, test table is installed in the middle of the upper surface of pneumatic platform, bottom plate is arranged just above test table, lamp bead metal support is placed on bottom plate, pressing plate is arranged just above bottom plate, the middle part of pressing plate is hollow to form first through slot;Positioning pillar is arranged at the corner of the upper surface of bottom plate, the limiting hole on the lamp bead metal support is matched with positioning pillar, a plurality of current probes are installed in the middle of test table, square slot for current probe passing through is opened in bottom plate, limiting pillar is slidably connected at the edge of test table, spring is sleeved on limiting pillar, driving mechanism is used to drive pressing plate to move up and down, detection circuit board is arranged in the inner cavity of pneumatic platform, detection circuit board is electrically connected with current probe by wire.

[0005] Further scheme is, the driving mechanism includes pneumatic cylinder, the telescopic end of pneumatic cylinder is fixedly connected with pneumatic pillar, the top end of pneumatic pillar is connected with the edge of pressing plate.

[0006] Further scheme is, height-limiting column is installed on the upper surface of pneumatic platform, when driving mechanism drives pressing plate to move downwards, the top end of height-limiting column is abutted with the lower surface of pressing plate.

[0007] Further scheme is, anti-glare film is pasted on the upper surface of pressing plate, and the anti-glare film is used to cover the first through slot.

[0008] Further, the bottom end outer surface of the limiting support is clamped with a clamping ring, one end of the spring is fixedly connected with the upper surface of the clamping ring, the other end of the spring is connected with the top wall of the pneumatic platform, and the top end of the limiting support abuts against the lower surface of the bottom plate.

[0009] Further, the bottom end outer surface of the limiting support is clamped with a clamping ring, one end of the spring is fixedly connected with the upper surface of the clamping ring, the other end of the spring is connected with the top wall of the pneumatic platform, and the top end of the limiting support abuts against the lower surface of the bottom plate.

[0010] Further, the bottom end outer surface of the limiting support is clamped with a clamping ring, one end of the spring is fixedly connected with the upper surface of the clamping ring, the other end of the spring is connected with the top wall of the pneumatic platform, and the top end of the limiting support abuts against the lower surface of the bottom plate.

[0011] Compared with the prior art, the LED lamp bead test fixture has the advantages that: the positioning support is arranged at the four corners of the upper surface of the pressing plate, and the positioning support is matched with the limiting hole on the lamp bead metal support, so that the pins of the chip on the lamp bead metal support correspond to the current probe, the accuracy of the test is improved, and the lamp bead surface is not damaged when the pressing plate is pressed down due to mechanical errors; moreover, the pins of the red, yellow, blue and green four primary color chips correspond to the current probe one by one, a plurality of lamp beads with multiple primary colors can be tested at the same time, and the test efficiency is high; in addition, the height limiting column limits the descending height of the pressing plate, and the spring plays a buffering role, so that the pressing plate is prevented from being pressed too hard, and the pins of the current probe and the chip are prevented from being damaged. BRIEF DESCRIPTION OF DRAWINGS

[0012] In order to more clearly illustrate the technical scheme in the embodiments of the present application, the drawings needed in the embodiments will be briefly introduced as follows. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without any creative effort on the basis of these drawings.

[0013] Figure 1 A front view cross-sectional structure schematic view of the LED lamp bead test fixture provided by the embodiments of the present application is shown in the figure.

[0014] Figure 2 A front view cross-sectional structure schematic view of the LED lamp bead test fixture provided by the embodiments of the present application is shown in the figure. Figure 1 A front view cross-sectional structure schematic view of the LED lamp bead test fixture provided by the embodiments of the present application is shown in the figure.

[0015] Figure 3 A structure schematic view of the bottom plate provided by the embodiments of the present application is shown in the figure.

[0016] Signs: pneumatic platform 1, detection circuit board 2, cylinder 3, pneumatic strut 4, pressing plate 5, height limiting column 6, anti-glare film 7, first through slot 8, test table 9, bottom plate 10, square groove 101, lamp bead metal support 11, positioning strut 12, air top strut 13, limiting strut 14, spring 15, current probe 16, second through slot 17. DETAILED DESCRIPTION

[0017] In order to make the purpose, features and advantages of the present application more obvious and easy to understand, the specific embodiments of the present application will be described in detail below with reference to the drawings.

[0018] It should be noted that when an element is referred to as being "fixed" to another element, it can be directly on the other element or there can be an intervening element. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements can be present.

[0019] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in the description of the application herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. As used herein, the term "and / or" includes any and all combinations of one or more of the associated listed items.

[0020] Please refer to Figures 1-3The utility model provides a kind of LED lamp pearl test fixture, including pneumatic platform 1, driving mechanism is arranged in the cavity edge of pneumatic platform 1, the driving mechanism can be cylinder 3 or electric telescopic rod;When driving mechanism is cylinder 3, the telescopic end of cylinder 3 is fixedly connected with pneumatic pillar 4, and the top end of pneumatic pillar 4 is connected with the edge of pressing plate 5;When driving mechanism is electric telescopic rod, the movable end of electric telescopic rod is directly connected with the edge of pressing plate 5.The driving mechanism is used to drive pressing plate 5 to move up and down.The upper surface middle part of pneumatic platform 1 is equipped with test table 9, and the bottom plate 10 is arranged above test table 9, and the limit pillar 14 is slidably connected at the edge of test table 9, the number of limit pillar 14 is four, and the bottom end of limit pillar 14 extends to the inside of pneumatic platform 1 after penetrating the top wall of pneumatic platform 1;And snap ring is connected on the bottom end outer surface of limit pillar 14, spring 15 is sleeved on limit pillar 14, one end of spring 15 is fixedly connected with the upper surface of snap ring, and the other end of spring 15 is connected with the top wall of pneumatic platform 1, so that the top end of limit pillar 14 is abutted with the lower surface of bottom plate 10, and limit pillar 14 plays the role of supporting bottom plate 10.When driving mechanism drives pressing plate 5 to move downwards, pressing plate 5 will press down bottom plate 10, so that bottom plate 10 is close to test table 9, and spring 15 plays the role of buffering at this time;When driving mechanism drives pressing plate 5 to reset upwards, bottom plate 10 will be away from test table 9 under the reset action of spring 15.

[0021] Lamp pearl metal support 11 is placed on bottom plate 10, and lamp pearl chip is arranged on lamp pearl metal support 11.Specifically, positioning pillar 12 is arranged at the four corners of the upper surface of bottom plate 10, and the positioning pillar 12 is matched with the limiting hole on lamp pearl metal support 11.Several current probes 16 are installed in the middle part of test table 9, the second through slot 17 is formed in the middle part of the top wall of pneumatic platform 1, the second through slot 17 is used for the passage of current probe 16, and square slot 101 is formed in bottom plate 10 for the passage of current probe 16.Detection circuit board 2 is installed in the cavity of pneumatic platform 1, and the detection circuit board 2 is electrically connected with current probe 16 through wires.Because positioning pillar 12 is arranged at the four corners of the upper surface of pressing plate 5, and the positioning pillar 12 is matched with the limiting hole on lamp pearl metal support 11, the pin of the chip on lamp pearl metal support 11 can be guaranteed to correspond to the position of current probe 16, the accuracy of test can be guaranteed, and the lamp pearl surface colloid can be prevented from being damaged when pressing plate 5 is pressed down due to mechanical error.It should be noted that the current probe 16 of the present application is four groups for one, and is one-to-one corresponding with the pin of red, yellow, blue and green four primary color chips, can test multiple base color multiple lamp pearls at the same time, and the test efficiency is high.In addition, during the pressing process of pressing plate 5, spring 15 plays the role of buffering, so that the intensity of pressing plate 5 can be limited when pressing downwards, so that current probe 16 and the pin of chip are prevented from being damaged each other.

[0022] Preferably, the middle part of the pressing plate 5 is hollowed out to form a first through slot 8, so that the pressing plate 5 can press the edge of the lamp bead metal support 11 during the pressing process, but will not interfere with the positioning pillar 12, and the middle part of the pressing plate 5 is hollowed out, which is convenient for observing the light-emitting conditions of each chip, thereby facilitating the identification of abnormal chips. Further, an anti-glare film 7 is attached to the upper surface of the pressing plate 5, and the anti-glare film 7 is used to cover the first through slot 8. The anti-glare film 7 plays a role of anti-glare to avoid the light emitted by the chip being too dazzling.

[0023] Preferably, the pneumatic platform 1 is provided with a height limiting column 6 on the upper surface, and two pneumatic pillars 4 are arranged on the two sides of the pneumatic platform 1, and the height limiting column 6 is between the two pneumatic pillars 4. When the driving mechanism drives the pressing plate 5 to move downward, the top end of the height limiting column 6 abuts against the lower surface of the pressing plate 5, and the lower surface of the corresponding pressing plate 5 can be provided with a rubber block. The height limiting column 6 limits the stroke of the downward movement of the pressing plate 5, which can make the current probe 16 in good contact with the pins of the chip, and can also avoid the current probe 16 from being damaged due to excessive extension out of the bottom plate 10 during the test process.

[0024] Preferably, the pneumatic platform 1 is provided with a height limiting column 6 on the upper surface, and two pneumatic pillars 4 are arranged on the two sides of the pneumatic platform 1, and the height limiting column 6 is between the two pneumatic pillars 4. When the driving mechanism drives the pressing plate 5 to move downward, the top end of the height limiting column 6 abuts against the lower surface of the pressing plate 5, and the lower surface of the corresponding pressing plate 5 can be provided with a rubber block. The height limiting column 6 limits the stroke of the downward movement of the pressing plate 5, which can make the current probe 16 in good contact with the pins of the chip, and can also avoid the current probe 16 from being damaged due to excessive extension out of the bottom plate 10 during the test process.

[0025] In the description of the present application, it should be understood that the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, and therefore cannot be understood as indicating or implying that the devices or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as limiting the application.

[0026] In the description of the present application, the description of the terms "one embodiment", "some embodiments", "illustrative embodiment", "example", "specific example" or "some examples" means that the specific features, structures, materials or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present application. In the present application, the illustrative description of the above terms does not necessarily refer to the same embodiment or example.

[0027] It is apparent that the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. In this context, the phrase "embodiments" means that the specific features, structures, or characteristics described in connection with the embodiments can be included in at least one embodiment of the present application. The appearance of the phrase in various places in the specification does not necessarily mean the same embodiment, nor is it independent or alternative to other embodiments. It is apparent to those skilled in the art, explicitly and implicitly, that the embodiments described herein can be combined with other embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor are within the scope of protection of the present application.

[0028] Although the embodiments of the present application have been shown and described, those skilled in the art can understand that various changes, modifications, replacements and variations can be made to these embodiments without departing from the principles and spirits of the present application, and the scope of the present application is defined by the claims and their equivalents.

Claims

1. A LED lamp bead testing fixture, characterized by: The invention comprises a pneumatic platform (1), wherein a driving mechanism is provided at the edge of the pneumatic platform (1), a test bench (9) is installed in the middle of the upper surface of the pneumatic platform (1), a bottom plate (10) is provided just above the test bench (9), a lamp bead metal bracket (11) is placed on the bottom plate (10), a pressing plate (5) is provided just above the bottom plate (10), and the middle of the pressing plate (5) is hollowed out to form a first through groove (8); positioning pillars (12) are provided at the four corners of the upper surface of the bottom plate (10), and the positioning pillars (12) are connected to the lamp bead metal bracket ( The test bench (9) is adapted to the limiting holes on the pneumatic platform (11), a plurality of current probes (16) are installed in the middle of the test bench (9), a square groove (101) for the current probes (16) to pass through is opened on the bottom plate (10), and a limiting support (14) is slidably matched at the edge of the test bench (9), and a spring (15) is sleeved on the limiting support (14). The driving mechanism is used to drive the pressure plate (5) to move up and down, and a detection circuit board (2) is provided in the inner cavity of the pneumatic platform (1), and the detection circuit board (2) is electrically connected to the current probe (16) through a wire.

2. The LED lamp bead testing fixture according to claim 1, characterized in that: The driving mechanism comprises a cylinder (3), the telescopic end of the cylinder (3) is fixedly connected to a pneumatic strut (4), and the top end of the pneumatic strut (4) is connected to the edge of a pressure plate (5).

3. The LED lamp bead testing fixture according to claim 2, characterized in that: A height-limiting column (6) is installed on the upper surface of the pneumatic platform (1). When the driving mechanism drives the pressing plate (5) to move downward, the top end of the height-limiting column (6) abuts against the lower surface of the pressing plate (5).

4. The LED lamp bead testing fixture according to claim 1, characterized in that: An anti-glare film (7) is adhered to the upper surface of the pressing plate (5), and the anti-glare film (7) is used to cover the first through groove (8).

5. The LED lamp bead testing fixture according to claim 1, characterized in that: The outer surface of the bottom end of the limiting pillar (14) is clamped with a clamping ring, one end of the spring (15) is fixedly connected to the upper surface of the clamping ring, the other end of the spring (15) is connected to the top wall of the pneumatic platform (1), and the top end of the limiting pillar (14) is against the lower surface of the bottom plate (10).

6. The LED lamp bead testing fixture according to claim 1, characterized in that: Gas cap struts (13) are installed at the four corners of the lower surface of the base plate (10), and the outer surfaces of the gas cap struts (13) are in sliding engagement with the top wall of the pneumatic platform (1) and the top wall of the test bench (9).

7. The LED lamp bead testing fixture according to claim 1, characterized in that: A second through slot (17) is provided in the middle of the top wall of the pneumatic platform (1), and the second through slot (17) is used for the current probe (16) to pass through.

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